CN107179448A - 电磁错误注入攻击方法及系统 - Google Patents
电磁错误注入攻击方法及系统 Download PDFInfo
- Publication number
- CN107179448A CN107179448A CN201710564194.1A CN201710564194A CN107179448A CN 107179448 A CN107179448 A CN 107179448A CN 201710564194 A CN201710564194 A CN 201710564194A CN 107179448 A CN107179448 A CN 107179448A
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- CN
- China
- Prior art keywords
- electromagnetism
- chip
- tested
- sensitizing range
- error injection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Environmental & Geological Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710564194.1A CN107179448A (zh) | 2017-07-12 | 2017-07-12 | 电磁错误注入攻击方法及系统 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710564194.1A CN107179448A (zh) | 2017-07-12 | 2017-07-12 | 电磁错误注入攻击方法及系统 |
Publications (1)
Publication Number | Publication Date |
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CN107179448A true CN107179448A (zh) | 2017-09-19 |
Family
ID=59837616
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN201710564194.1A Pending CN107179448A (zh) | 2017-07-12 | 2017-07-12 | 电磁错误注入攻击方法及系统 |
Country Status (1)
Country | Link |
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CN (1) | CN107179448A (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107506664A (zh) * | 2017-08-30 | 2017-12-22 | 北京银联金卡科技有限公司 | 芯片错误注入测试中的触发参数调整系统及方法 |
CN112989439A (zh) * | 2021-02-22 | 2021-06-18 | 北京银联金卡科技有限公司 | 错误注入攻击测试用芯片表面空间敏感点搜寻方法及装置 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7020803B2 (en) * | 2002-03-11 | 2006-03-28 | Hewlett-Packard Development Company, Lp. | System and methods for fault path testing through automated error injection |
CN104166119A (zh) * | 2014-09-01 | 2014-11-26 | 国家电网公司 | 一种基于错误注入的智能电能表程序稳定性检测系统 |
CN105095750A (zh) * | 2014-05-15 | 2015-11-25 | 国民技术股份有限公司 | 对智能卡芯片所受攻击的分析方法及装置 |
CN105182207A (zh) * | 2014-05-30 | 2015-12-23 | 国民技术股份有限公司 | 一种芯片错误注入测试方法及装置 |
CN105277871A (zh) * | 2014-06-19 | 2016-01-27 | 新唐科技股份有限公司 | 检测错误注入的方法与装置 |
-
2017
- 2017-07-12 CN CN201710564194.1A patent/CN107179448A/zh active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7020803B2 (en) * | 2002-03-11 | 2006-03-28 | Hewlett-Packard Development Company, Lp. | System and methods for fault path testing through automated error injection |
CN105095750A (zh) * | 2014-05-15 | 2015-11-25 | 国民技术股份有限公司 | 对智能卡芯片所受攻击的分析方法及装置 |
CN105182207A (zh) * | 2014-05-30 | 2015-12-23 | 国民技术股份有限公司 | 一种芯片错误注入测试方法及装置 |
CN105277871A (zh) * | 2014-06-19 | 2016-01-27 | 新唐科技股份有限公司 | 检测错误注入的方法与装置 |
CN104166119A (zh) * | 2014-09-01 | 2014-11-26 | 国家电网公司 | 一种基于错误注入的智能电能表程序稳定性检测系统 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107506664A (zh) * | 2017-08-30 | 2017-12-22 | 北京银联金卡科技有限公司 | 芯片错误注入测试中的触发参数调整系统及方法 |
CN112989439A (zh) * | 2021-02-22 | 2021-06-18 | 北京银联金卡科技有限公司 | 错误注入攻击测试用芯片表面空间敏感点搜寻方法及装置 |
CN112989439B (zh) * | 2021-02-22 | 2024-05-03 | 北京银联金卡科技有限公司 | 错误注入攻击测试用芯片表面空间敏感点搜寻方法及装置 |
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Legal Events
Date | Code | Title | Description |
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PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB03 | Change of inventor or designer information | ||
CB03 | Change of inventor or designer information |
Inventor after: Li Wenbao Inventor after: Huang Tianning Inventor after: Jiang Xiao Inventor after: Su Junheng Inventor after: Li Zengju Inventor after: Shi Ruhui Inventor after: Zhao Penghui Inventor after: Li Haibin Inventor after: Zhang Ce Inventor after: Chen Baishun Inventor after: Wang Yang Inventor after: An Dao Inventor before: Li Wenbao Inventor before: Wang Yang Inventor before: Li Zengju Inventor before: Shi Ruhui Inventor before: Shi Xinling Inventor before: Zhao Penghui Inventor before: Li Haibin Inventor before: Zhang Ce Inventor before: Chen Baishun Inventor before: Wu Xiangfu |
|
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20180117 Address after: 102308 room 701, room 7, courtyard 98, lotus Stone Lake, gate head District, Peking City Applicant after: Beijing wisdom cloud Measuring Technology Co., Ltd. Applicant after: Beijing Intelligent Cloud Measurement Information Technology Co., Ltd. Address before: Room 701, room 7, courtyard No. 98, lotus Stone Lake West Road, Beijing, Beijing Applicant before: Beijing wisdom cloud Measuring Technology Co., Ltd. |
|
RJ01 | Rejection of invention patent application after publication | ||
RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170919 |