CN107138435B - Sorting system and sorting method for power semiconductor devices - Google Patents
Sorting system and sorting method for power semiconductor devices Download PDFInfo
- Publication number
- CN107138435B CN107138435B CN201710564148.1A CN201710564148A CN107138435B CN 107138435 B CN107138435 B CN 107138435B CN 201710564148 A CN201710564148 A CN 201710564148A CN 107138435 B CN107138435 B CN 107138435B
- Authority
- CN
- China
- Prior art keywords
- power semiconductor
- semiconductor device
- performance parameters
- module
- performance parameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/3412—Sorting according to other particular properties according to a code applied to the object which indicates a property of the object, e.g. quality class, contents or incorrect indication
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
- B07C5/362—Separating or distributor mechanisms
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y04—INFORMATION OR COMMUNICATION TECHNOLOGIES HAVING AN IMPACT ON OTHER TECHNOLOGY AREAS
- Y04S—SYSTEMS INTEGRATING TECHNOLOGIES RELATED TO POWER NETWORK OPERATION, COMMUNICATION OR INFORMATION TECHNOLOGIES FOR IMPROVING THE ELECTRICAL POWER GENERATION, TRANSMISSION, DISTRIBUTION, MANAGEMENT OR USAGE, i.e. SMART GRIDS
- Y04S10/00—Systems supporting electrical power generation, transmission or distribution
- Y04S10/50—Systems or methods supporting the power network operation or management, involving a certain degree of interaction with the load-side end user applications
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to the field of semiconductor devices, in particular to a classification system and a classification method of power semiconductor devices. The classification system includes: the distribution module is used for dividing the performance parameters of the power semiconductor device into N sections, wherein N is a natural number greater than 1; the reading module is used for reading the performance parameters recorded on the tag attached to the power semiconductor device; the reading module is in communication connection with the distribution module, and the distribution module correlates the power semiconductor device with the interval to which the performance parameter belongs after receiving the performance parameter given by the reading module. The classification method of the invention comprises the following steps: dividing the performance parameters of the power semiconductor device into N sections, wherein N is a natural number greater than 1; the power semiconductor device and the section to which the performance parameter belongs are correlated with each other according to the performance parameter recorded on the tag attached to the power semiconductor device. The invention improves the correlation between the classification intervals and the efficiency of executing the classification operation.
Description
Technical Field
The invention relates to the field of semiconductor devices, in particular to a classification system and a classification method of power semiconductor devices.
Background
A power semiconductor device, such as an IGBT transistor, a MOS transistor, etc., is a semiconductor device having a capability of handling high voltage, large current, and is generally used for an electric power conversion and electric power control circuit. With the wide application of power semiconductor devices, the parallel connection requirements of various devices are gradually increasing. Because of the performance parameter difference between the power semiconductor device monomers, for example, for an IGBT tube, the conduction voltage drop of the IGBT and the FWD chip is mainly large, and when the turn-on threshold of the IGBT is large, the parallel power semiconductor device has poor current sharing effect, and the local heating is serious or even damaged.
Therefore, the power semiconductor devices are increasingly subjected to screening classification before parallel connection, and the power semiconductor devices with similar performance parameters are selected for parallel connection. The performance parameters of the power semiconductor device are generally taken as the basis of screening and classifying, and the performance parameters are generally obtained by the following two modes: a list of power semiconductor device performance parameters provided by the manufacturer at the time of shipment to the customer, or performance parameter values noted by the manufacturer at the product (e.g., housing, instructions). According to the performance parameters, the clients can manually conduct screening classification or can conduct classification by means of computer assistance.
In the prior art, when the classification is assisted by a computer, the parameter characteristics of all devices and the number of the devices to be connected in parallel need to be input into the computer in advance, and the computer searches the devices with the corresponding number of the closest performance parameters according to an algorithm and gives a result (for example, the serial numbers of the devices). The customer sorts the required power semiconductor devices manually according to the serial numbers for use.
However, since the sorting is randomly performed according to the performance parameters of each lot of devices, there is no interchangeability between groups after each sorting. For example, 25 sets of 100 matches for the first time and 25 sets of 100 matches for the second time, without any correlation, are not interchangeable. But such exchanges and substitutions are sometimes necessary. For example, if a problem occurs with one module in the same group to replace, it is difficult to find a module that matches the performance of the module being used, and only the modules in the same group are discarded or the matching is performed again.
In addition, in the computer-aided classification process in the prior art, the number of devices to be connected in parallel needs to be known in advance. However, the number of parallel devices is often changed by the replacement of the platform. The situations of single, two parallel connection, three parallel connection and the like can possibly occur at any time, so that each situation needs to be adjusted in real time according to the requirements. However, according to the above prior art, the selection of three parallel connections cannot be used for four parallel connections, and the selection of four parallel connections for three parallel connections results in one more device. Therefore, the versatility and flexibility of this classification method are both insufficient.
Disclosure of Invention
The invention relates to a classification system and a classification method of a power semiconductor device, which improve the correlation between classification intervals and the efficiency of performing classification operation.
In order to solve the above technical problems, the present invention provides a classification system of power semiconductor devices, including:
the distribution module is used for dividing the performance parameters of the power semiconductor device into N sections, wherein N is a natural number greater than 1;
the reading module is used for reading the performance parameters recorded on the tag attached to the power semiconductor device;
the reading module is in communication connection with the distribution module, and the distribution module correlates the power semiconductor device with the interval to which the performance parameter belongs after receiving the performance parameter given by the reading module.
The invention also provides a classification method of the power semiconductor device, which comprises the following steps:
dividing the performance parameters of the power semiconductor device into N sections, wherein N is a natural number greater than 1;
the power semiconductor device and the section to which the performance parameter belongs are correlated with each other according to the performance parameter recorded on the tag attached to the power semiconductor device.
The invention can classify the performance parameters of the power semiconductor devices and select the power semiconductor devices with similar performance parameters to be used in parallel, thereby ensuring the current sharing effect of the power semiconductor devices after being connected in parallel. Compared with the prior art, the invention divides the performance parameters of the power semiconductor device into N sections, and can ensure that the performance of the power semiconductor device in the same section is similar, so that the power semiconductor devices in the same section have correlation. Since the performance parameters of the power semiconductor devices are only related to the associated intervals and are not related to the measurement batches of power semiconductor devices, the power semiconductor devices belonging to different measurement batches can also be interchanged. In addition, the number of the devices to be connected in parallel does not need to be known in advance during classification, and the parallel devices can be adapted no matter how many are needed, so that the universality and the flexibility of the system are improved.
Preferably, the classification system of power semiconductor devices further includes: the identification module is used for setting a unique identification code for the power semiconductor device;
the measuring module is used for measuring the performance parameters of the power semiconductor device;
the unique identification code set by the identification module and the performance parameter measured by the measurement module are recorded on a tag attached to the power semiconductor device.
In response to this, the method for classifying power semiconductor devices further includes, before the step of associating the power semiconductor device with the section to which the performance parameter belongs, according to the performance parameter recorded on the tag attached to the power semiconductor device, the steps of:
setting a unique identification code for the power semiconductor device;
measuring performance parameters of the power semiconductor device;
the unique identification code and performance parameter of the same power semiconductor device are recorded on a tag attached to the power semiconductor device.
The unique identification code and the performance parameters of the power semiconductor device are recorded on the tag of the power semiconductor device, so that the uniqueness of the power semiconductor device can be ensured, the tag can be identified conveniently, and meanwhile, the automation level is improved.
Further, as a preferable mode, the classification system of the power semiconductor device records the unique identification code and the information of the performance parameter in the same two-dimensional code together; the reading module comprises a two-dimensional code scanner, and the two-dimensional code scanner is used for scanning the two-dimensional code to read the unique identification code and the information of the performance parameters.
When classifying the power semiconductor devices, the unique identification code and the performance parameter of the same power semiconductor device are recorded on a tag attached to the power semiconductor device, and the information of the unique identification code and the performance parameter is recorded in the same two-dimensional code together. And reading the unique identification code and the information of the performance parameters of the power semiconductor device by scanning the two-dimensional code.
The two-dimensional code has a smaller graphic area and can transmit larger information quantity, and because the two-dimensional code adopts high-density coding, the information capacity of the two-dimensional code is tens of times of that of a common bar code. In addition, compared with a common bar code and a two-dimensional code, the digital information such as pictures, sounds, signatures and the like can be encoded, the recording mode of performance parameters can be enriched in a wider encoding range, and the error rate of performance parameters in recording is reduced.
The two-dimension code scanning reading mode is convenient to operate, and can integrate the operation of classifying scanning and product warehousing scanning, so that the operation procedure is simplified and the efficiency is improved while the classification of the power semiconductor devices is realized.
Still further, preferably, the sorting system for power semiconductor devices further includes a sorting mechanism for sorting the power semiconductor devices belonging to different sections to different areas.
After the step of correlating the power semiconductor device and the section to which it belongs according to the performance parameter recorded on the tag attached to the power semiconductor device, the power semiconductor device classification method further includes the steps of:
the power semiconductor devices belonging to different zones are sorted into different regions.
Sorting mechanism can sort the power semiconductor device that belongs to different interval to different regions, has improved efficiency compared with manual sorting, is difficult for producing the mistake, is particularly useful for the scene of mass production manufacturing.
In addition, it is preferable that a plurality of performance parameters are set and sections having different fixed numerical ranges are set according to the performance parameters.
Different intervals set according to various performance parameters enable classification to be finer, any one interval can comprise the performance parameters, correlation of the intervals is improved, and interchange of power semiconductor devices is facilitated. In addition, any one power semiconductor device can also belong to a plurality of sections, and the number of the power semiconductor devices in any section can be unlimited, so that the power semiconductor devices can be singly connected in parallel, connected in parallel in two, three or the like, the operation flexibility is improved, and a user can select the power semiconductor devices in different sections according to different requirements.
Drawings
Fig. 1 is a schematic structural view of a classification system of power semiconductor devices according to a first embodiment of the present invention;
fig. 2 is a flowchart of a classification method of power semiconductor devices according to a second embodiment of the present invention.
Reference numerals illustrate:
1-an allocation module; 2-a reading module; 3-an identification module; 4-a measurement module; 5-a sorting mechanism; 5 a-cylinder; 5 b-push rod; 5 c-sorting opening; 6-a conveyor belt; 7-a goods inlet.
Detailed Description
Embodiment one
A first embodiment of the present invention provides a classification system of power semiconductor devices. Referring to fig. 1, the method comprises:
the distribution module 1 is used for dividing the performance parameters of the power semiconductor device into N sections, wherein N is a natural number greater than 1;
a reading module 2 for reading performance parameters recorded on a tag attached to the power semiconductor device;
the reading module 2 is in communication connection with the distribution module 1, and the distribution module 1 correlates the power semiconductor device with the interval to which the performance parameter belongs after receiving the performance parameter given by the reading module 2.
Among other things, the performance parameters may be selected from a variety of choices, and in particular, the performance parameters may include electrical performance parameters of the power semiconductor device, such as voltage, current, and the like.
In the following, only the case of the present embodiment will be described as an example of a possible operation of the classification system of power semiconductor devices. It should be noted that the operation modes described below are not exclusive, and may be modified and replaced within the experience of those skilled in the art according to the needs.
Taking an IGBT device employing 1in1 as an example, the device has 2 characteristic parameters in total, namely Vsat-C1 (saturation voltage drop) and VF-C1 (forward voltage drop).
In this embodiment, the Vsat-C1 is used as the classification basis, and the VF-C1 parameter is ignored. Then the interval division is performed with 10 units as the interval in the range of the value of the Vsat-C1 parameter, namely, in the range of 150-250, as follows:
150-160；160-170；170-180；180-190；190-200；200-210；210-220；220-230；230-240；240-250。
n=10, and the total of 10 sections, the opening and closing conditions of the sections are selected according to actual use, and are not described herein.
After the allocation module 1 is set, the reading module 2 reads the performance parameters recorded on the tag attached to the power semiconductor device, so that the power semiconductor device can be divided into corresponding sections.
For example, the Vsat-C1 parameter for a certain power semiconductor device is 173, which will be divided into groups of 170-180. Other power semiconductor devices of the same group are also located within this interval.
Furthermore, when considering the VF-C1 parameters, the two parameters can be arranged and combined, or the sections meeting the working requirements are selected in a key way, and other sections are managed as defective sections in a unified way.
Obviously, when the performance parameters used as the basis of classification are more or the interval between the set classification intervals is smaller, the generated intervals are increased, so that more sorting is needed to complete matching, but the IGBT modules in the same group can have more approximate performance parameters.
Those of ordinary skill in the art are able to trade off the interval settings for these performance parameters according to actual needs and personal experience.
When the 100 IGBT devices need to be 4-matched (parallel connection), the reading module 2 may read the performance parameters of the 100 devices, and then divide the 4 devices with similar performance parameters into 25 groups according to an algorithm by a computer, where each group includes 4 IGBT devices.
When a certain IGBT device in a certain group needs replacement, a new IGBT device in the same group as the IGBT device can be selected by the reading module 2. Is very convenient.
In this embodiment, in order to facilitate the overall operation of the sorting system for power semiconductor devices and to improve automation and work efficiency, the distribution module 1 and the reading module 2 may be disposed along the conveyor belt 6 as shown in fig. 1.
For facilitating identification of the tag, referring to fig. 1, the classification system of the power semiconductor device further includes:
an identification module 3 for setting a unique identification code for the power semiconductor device;
a measurement module 4 for measuring a performance parameter of the power semiconductor device;
the unique identification code set by the identification module 3 and the performance parameter measured by the measurement module 4 are recorded on a tag attached to the power semiconductor device. The unique identification code and the performance parameters of the power semiconductor device are recorded on the tag of the power semiconductor device, so that the uniqueness of the power semiconductor device can be ensured, the tag can be identified conveniently, and meanwhile, the automation level is improved.
Of course, the unique identification code and the performance parameter may be recorded in advance in the computer according to actual needs to generate a two-dimensional code described below, in which case the identification module 3 and the measurement module 4 may not be provided.
Similarly, in the present embodiment, the identification module 3 and the measurement module 4 are integrally connected by the conveyor belt 6, so that the automation rate is further improved. Specifically, the recognition module 3 and the measurement module 4 integrally connected may be provided at the side of the conveyor belt 6. When the device passes through, the setting of the unique identification code and the measurement of the measurement performance parameters can be completed simultaneously. However, the requirements of the present invention can be substantially satisfied without the conveyor belt 6.
In this embodiment, the unique identification code and the information of the performance parameter are recorded together in the same two-dimensional code;
the reading module 2 comprises a two-dimensional code scanner, and the two-dimensional code scanner is used for scanning the two-dimensional code to read the unique identification code and the information of the performance parameters.
In this embodiment, an automatic labeling machine may be used to generate a label and attach the label to a corresponding device, so as to improve the automation degree of the power semiconductor device classification system. The two-dimensional code has smaller graphic area but can transmit larger information quantity, can accommodate 2710 numbers or 1108 bytes, and has information capacity which is tens of times of that of a common bar code because the two-dimensional code adopts high-density coding. In addition, compared with a common bar code and a two-dimensional code, the digital information such as pictures, sounds, signatures and the like can be encoded, the recording mode of performance parameters can be enriched in a wider encoding range, and the error rate of performance parameters in recording is reduced.
The two-dimension code scanning reading mode is convenient to operate, and can integrate the operation of classifying scanning and product warehousing scanning, so that the operation procedure is simplified and the efficiency is improved while the classification of the power semiconductor devices is realized. Since two-dimensional code scanners are known in the art, they are not described in detail herein. The classification based on the performance parameters of the modules is performed by the computer classifying the performance parameters after scanning the labels, for example, placing the modules with the performance parameters of 1-5 in group A, placing the modules with the performance parameters of 6-10 in group B, placing the modules with the performance parameters of 11-15 in group C, and so on.
The sorting system of power semiconductor devices may further comprise a sorting mechanism 5, the sorting mechanism 5 being adapted to sort power semiconductor devices belonging to different intervals to different areas.
It is worth mentioning that the reading module 2 may be communicatively connected to the sorting mechanism 5, so as to enable simultaneous reading and sorting to be performed; the reading module 2 can also execute operations with the sorting mechanism 5 successively, the computer stores information after the reading module 2 reads the performance parameters, and the sorting mechanism 5 is controlled to execute operations when sorting demands exist.
The sorting mechanism 5 according to the present invention is not particularly limited in structure, and thus may be various sorting mechanisms 5 in the prior art. For example, typically, referring to fig. 1, a plurality of cylinders 5a may be provided as a power source, and a push rod 5b connected to the cylinders 5a can push the power semiconductor device to move in a horizontal direction, thereby sorting the power semiconductor device to a corresponding sorting port 5c. Alternatively, the sorting mechanism 5 may comprise a robotic arm for performing a sorting action. Preferably, the mechanical arm may be a four-axis mechanical arm or a six-axis mechanical arm. It is also possible to sort the power semiconductor devices to the corresponding sorting openings 5c by using a plurality of cylinders 5a and push rods 5b in cooperation. It is worth mentioning that the selection of the specific type of sorting mechanism 5 and affecting the achievement of the technical purpose of the present invention may be chosen according to the actual use requirements and economical capabilities, the selection of the sorting mechanism 5 or the addition of necessary structures.
Through sorting mechanism 5 can sort the power semiconductor device that belongs to different interval to different regions, compare in manual sorting and improve efficiency, be difficult for producing the mistake, the scene of specially adapted mass production manufacturing. While the side of the conveyor belt 6 may also be provided with a plurality of sorting apertures 5c corresponding to the respective sections when the power semiconductor devices are conveyed by the conveyor belt 6. In addition, sorting mechanism 5 may be communicatively connected to distribution module 1 and obtain the section associated with the current power semiconductor device from distribution module 1.
In the present embodiment, as shown in fig. 1, the power semiconductor device may be transported to the loading port 7 by the conveyor belt 6.
This embodiment gives one possible operation procedure, specifically as follows:
(1) The identification module 3 sets an identification code for the power semiconductor device;
(2) The measuring module 4 measures performance parameters of the power semiconductor device;
(3) The distribution module 1 divides the performance parameters into N intervals, wherein N is a natural number greater than 1;
(4) The identification module 3 and the measurement module 4 respectively send the set identification code and the measured performance parameter to an automatic labeling machine;
(5) Generating a label according to the received data by the automatic labeling machine and attaching the label to a corresponding power semiconductor device;
(6) The reading module 2 reads the performance parameters recorded on the power semiconductor device label and sends the performance parameters to the sorting mechanism 5;
(7) The sorting mechanism 5 conveys the power semiconductor devices to the corresponding sorting ports 5c according to the received data, and completes the sorting operation.
The dispensing module 1 can be arranged in the same housing as the reading module 2, and can even be arranged integrally with the automatic labelling machine. Alternatively, the reading module 2 may be provided on the sorting mechanism 5 to increase the level of integration of the power semiconductor device sorting system.
The specific configuration of each module mentioned in the above embodiment, for example, the distribution module 1, the reading module 2, and the like, may be constituted by a simple logic circuit or the like, with the understanding of the functions realized.
The invention can classify the performance parameters of the power semiconductor devices and select the power semiconductor devices with similar performance parameters to be used in parallel, thereby ensuring the current sharing effect of the power semiconductor devices after being connected in parallel. Compared with the prior art, the invention divides the performance parameters of the power semiconductor device into N sections, and can ensure that the performance of the power semiconductor device in the same section is similar, so that the power semiconductor devices in the same section have correlation. Since the performance parameters of the power semiconductor devices are only related to the associated intervals and are not related to the measurement batches of power semiconductor devices, the power semiconductor devices belonging to different measurement batches can also be interchanged. In addition, the number of the devices to be connected in parallel does not need to be known in advance during classification, and the parallel devices can be adapted no matter how many are needed, so that the universality and the flexibility of the system are improved.
Second embodiment
A second embodiment of the present invention provides a method for classifying power semiconductor devices, as shown in fig. 2, including the steps of:
setting a unique identification code for the power semiconductor device;
measuring performance parameters of the power semiconductor device;
the unique identification code and performance parameter of the same power semiconductor device are recorded on a tag attached to the power semiconductor device. Wherein, the information of the unique identification code and the performance parameter is recorded in the same two-dimensional code together;
reading the unique identification code and the information of the performance parameters of the power semiconductor device by scanning the two-dimensional code;
dividing the performance parameters of the power semiconductor device into N sections, wherein N is a natural number greater than 1;
correlating the power semiconductor device with a section to which the performance parameter belongs according to the performance parameter recorded on a tag attached to the power semiconductor device;
the power semiconductor devices belonging to different zones are sorted into different regions.
In the present embodiment, various performance parameters may be set, and different sections may be set according to the performance parameters. Different intervals set according to various performance parameters enable classification to be finer, any one interval can comprise the performance parameters, therefore the relevance of the intervals is improved, and interchange of power semiconductor devices is facilitated. In addition, any one power semiconductor device can also belong to a plurality of sections, and the number of the power semiconductor devices in any section can be unlimited, so that the power semiconductor devices can be singly connected in parallel, connected in parallel in two, three or the like, the operation flexibility is improved, and a user can select the power semiconductor devices in different sections according to different requirements.
Obviously, when the performance parameters used as the basis of classification are more or the interval between the set classification intervals is smaller, the generated intervals are increased, so that more sorting is needed to complete matching, but the IGBT modules in the same group can have more approximate performance parameters.
Those of ordinary skill in the art are able to trade off the interval settings for these performance parameters according to actual needs and personal experience.
When the 100 IGBT devices are required to be 4-matched (connected in parallel), the performance parameters of the 100 devices can be read, and then the 4 devices with similar performance parameters are divided into 25 groups by a computer according to an algorithm, wherein each group comprises 4 IGBT devices.
When one IGBT device in one group needs to be replaced, a new IGBT device in the same group with the IGBT device can be selected, and convenience is brought.
The unique identification code and the performance parameters of the power semiconductor device are recorded on the tag of the power semiconductor device, so that the uniqueness of the power semiconductor device can be ensured, the tag can be identified conveniently, and meanwhile, the automation level is improved. Compared with the prior art, the invention can classify the performance parameters of the power semiconductor devices and select the power semiconductor devices with similar performance parameters to be used in parallel, thereby ensuring the current sharing effect after the power semiconductor devices are connected in parallel.
In the invention, the performance parameters of the power semiconductor device are divided into N sections, so that the performance of the power semiconductor device in the same section can be ensured to be similar, and the power semiconductor devices in the same section have correlation. Since the performance parameters of the power semiconductor devices are only related to the associated intervals and are not related to the measurement batches of power semiconductor devices, the power semiconductor devices belonging to different measurement batches can also be interchanged. In addition, the number of the devices to be connected in parallel does not need to be known in advance during classification, and the parallel devices can be adapted no matter how many are needed, so that the universality and the flexibility of the system are improved.
In this embodiment, in order to facilitate the overall operation of the classification system of the power semiconductor device, to improve automation and work efficiency, the power semiconductor device may be transported by the conveyor belt 6, and an automatic labeling machine may be used to generate a label and attach the label to a corresponding device, so as to improve the degree of automation of the classification system of the power semiconductor device. When the power semiconductor devices are conveyed by the conveyor belt 6, the side of the conveyor belt 6 may also be provided with a plurality of sorting apertures 5c corresponding to the respective sections. Sorting action may be performed by a robotic arm, or the power semiconductor devices may be pushed into the corresponding sorting apertures 5c using the air cylinders 5 a.
Those skilled in the art will appreciate that in the foregoing embodiments, numerous technical details have been set forth in order to provide a thorough understanding of the present invention. However, the technical solutions claimed in the claims of the present invention can be basically implemented without these technical details and various changes and modifications based on the above embodiments. Accordingly, in actual practice, various changes may be made in the form and details of the above-described embodiments without departing from the spirit and scope of the invention.
Claims (2)
1. A classifying and warehousing method of power semiconductor devices comprises the following steps:
dividing the performance parameters of the power semiconductor device into N intervals, wherein N is a natural number greater than 1;
correlating a power semiconductor device with a section to which the performance parameter belongs according to the performance parameter recorded on a tag attached to the power semiconductor device;
before the step of correlating the power semiconductor device with the interval to which the performance parameter belongs according to the performance parameter recorded on the tag attached to the power semiconductor device, the method further comprises the following steps:
setting a unique identification code for the power semiconductor device;
measuring performance parameters of the power semiconductor device;
recording unique identification codes and performance parameters of the same power semiconductor device on a tag attached to the power semiconductor device;
setting a plurality of the performance parameters and setting intervals with different fixed numerical ranges according to the performance parameters;
in the step of recording the unique identification code and the performance parameter of the same power semiconductor device on a tag attached to the power semiconductor device;
the unique identification code and the information of the performance parameters are recorded in the same two-dimensional code together;
after the step of recording the unique identification code and the performance parameter of the same power semiconductor device on the tag attached to the power semiconductor device, before the step of correlating the power semiconductor device with the interval to which the performance parameter belongs according to the performance parameter recorded on the tag attached to the power semiconductor device, the method further comprises the following steps:
reading the unique identification code and the information of the performance parameters of the power semiconductor device by scanning the two-dimensional code;
after the step of correlating the power semiconductor device and the section to which it belongs according to the performance parameter recorded on the tag attached to the power semiconductor device, the method further comprises the steps of:
the power semiconductor devices belonging to different zones are sorted into different regions.
2. A sort binning system for power semiconductor devices, comprising:
the distribution module (1) is used for dividing the performance parameters of the power semiconductor device into N sections, wherein N is a natural number larger than 1;
a reading module (2) for reading performance parameters recorded on a tag attached to the power semiconductor device;
the reading module (2) is in communication connection with the distribution module (1), and the distribution module (1) correlates the power semiconductor device with the interval to which the performance parameter given by the reading module (2) belongs after receiving the performance parameter;
an identification module (3) for setting a unique identification code for the power semiconductor device;
a measuring module (4) for measuring a performance parameter of the power semiconductor device;
the unique identification code set by the identification module (3) and the performance parameter measured by the measurement module (4) are recorded on a tag attached to the power semiconductor device;
the measuring module (4) measures a plurality of the performance parameters and sets intervals with different fixed numerical ranges according to the performance parameters;
the unique identification code and the information of the performance parameters are recorded in the same two-dimensional code together;
the reading module (2) comprises a two-dimensional code scanner, wherein the two-dimensional code scanner is used for scanning the two-dimensional code to read the unique identification code and the information of the performance parameters;
the power semiconductor device sorting device further comprises a sorting mechanism (5), wherein the sorting mechanism (5) is used for sorting the power semiconductor devices belonging to different zones to different areas.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710564148.1A CN107138435B (en) | 2017-07-12 | 2017-07-12 | Sorting system and sorting method for power semiconductor devices |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710564148.1A CN107138435B (en) | 2017-07-12 | 2017-07-12 | Sorting system and sorting method for power semiconductor devices |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107138435A CN107138435A (en) | 2017-09-08 |
| CN107138435B true CN107138435B (en) | 2023-08-08 |
Family
ID=59775623
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710564148.1A Active CN107138435B (en) | 2017-07-12 | 2017-07-12 | Sorting system and sorting method for power semiconductor devices |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107138435B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019066399A (en) * | 2017-10-04 | 2019-04-25 | 三菱電機株式会社 | Semiconductor device classification system and semiconductor device |
| JP2020086419A (en) * | 2018-11-28 | 2020-06-04 | 雄二 橋本 | Adjustment method and adjustment system for obtaining uniformity of plural control objects and conveyer device and adjusted equipment |
| CN113492114B (en) * | 2021-09-08 | 2021-11-16 | 苏州贝克微电子有限公司 | Semiconductor chip testing method and device for integrated circuit |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2618270A1 (en) * | 1987-07-17 | 1989-01-20 | Telemecanique Electrique | CIRCUIT AND APPARATUS FOR PROTECTED LOAD POWER SUPPLY USING STATIC AND ELECTROMECHANICAL SWITCHES. |
| FR2763716A1 (en) * | 1997-05-20 | 1998-11-27 | Samsung Electronics Co Ltd | CONTROL SYSTEM AND METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT TEST OPERATION |
| CN101456020A (en) * | 2008-11-07 | 2009-06-17 | 科威（肇庆）半导体有限公司 | Sorter for automatically testing quality of semiconductor packaging chip |
| CN103212538A (en) * | 2013-03-19 | 2013-07-24 | 常州机电职业技术学院 | Mechanical part quality test sorting device and method |
| CN103372542A (en) * | 2012-04-18 | 2013-10-30 | 未来产业株式会社 | Semiconductor component sorting system |
| CN104376482A (en) * | 2014-11-28 | 2015-02-25 | 天津联云网络技术有限公司 | Fast moving consumer goods marketing method and system based on two-dimension code labels |
| DE102014007178B3 (en) * | 2014-05-15 | 2015-08-20 | Diehl Aerospace Gmbh | Method for sorting test light-emitting diodes into a color class |
| CN105223486A (en) * | 2014-06-17 | 2016-01-06 | 无锡纳旭测控科技有限公司 | A kind of IGBT module parallel pairing proving installation and method of testing |
| CN105609442A (en) * | 2015-12-28 | 2016-05-25 | 光为绿色新能源股份有限公司 | Novel test and grading method for crystal silicon solar cell |
| CN106096977A (en) * | 2016-06-03 | 2016-11-09 | 武汉铁锚焊接材料股份有限公司 | A kind of flux-cored wire manufacturing parameter retroactive method based on Quick Response Code and system |
| CN206935830U (en) * | 2017-07-12 | 2018-01-30 | 富士电机（中国）有限公司 | The categorizing system of power semiconductor |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4734002B2 (en) * | 2005-03-16 | 2011-07-27 | 株式会社東芝 | Inspection system and semiconductor device manufacturing method |
| US20090065568A1 (en) * | 2007-09-07 | 2009-03-12 | Elliott Grant | Systems and Methods for Associating Production Attributes with Products |
-
2017
- 2017-07-12 CN CN201710564148.1A patent/CN107138435B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2618270A1 (en) * | 1987-07-17 | 1989-01-20 | Telemecanique Electrique | CIRCUIT AND APPARATUS FOR PROTECTED LOAD POWER SUPPLY USING STATIC AND ELECTROMECHANICAL SWITCHES. |
| FR2763716A1 (en) * | 1997-05-20 | 1998-11-27 | Samsung Electronics Co Ltd | CONTROL SYSTEM AND METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT TEST OPERATION |
| CN101456020A (en) * | 2008-11-07 | 2009-06-17 | 科威（肇庆）半导体有限公司 | Sorter for automatically testing quality of semiconductor packaging chip |
| CN103372542A (en) * | 2012-04-18 | 2013-10-30 | 未来产业株式会社 | Semiconductor component sorting system |
| CN103212538A (en) * | 2013-03-19 | 2013-07-24 | 常州机电职业技术学院 | Mechanical part quality test sorting device and method |
| DE102014007178B3 (en) * | 2014-05-15 | 2015-08-20 | Diehl Aerospace Gmbh | Method for sorting test light-emitting diodes into a color class |
| CN105223486A (en) * | 2014-06-17 | 2016-01-06 | 无锡纳旭测控科技有限公司 | A kind of IGBT module parallel pairing proving installation and method of testing |
| CN104376482A (en) * | 2014-11-28 | 2015-02-25 | 天津联云网络技术有限公司 | Fast moving consumer goods marketing method and system based on two-dimension code labels |
| CN105609442A (en) * | 2015-12-28 | 2016-05-25 | 光为绿色新能源股份有限公司 | Novel test and grading method for crystal silicon solar cell |
| CN106096977A (en) * | 2016-06-03 | 2016-11-09 | 武汉铁锚焊接材料股份有限公司 | A kind of flux-cored wire manufacturing parameter retroactive method based on Quick Response Code and system |
| CN206935830U (en) * | 2017-07-12 | 2018-01-30 | 富士电机（中国）有限公司 | The categorizing system of power semiconductor |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107138435A (en) | 2017-09-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107138435B (en) | Sorting system and sorting method for power semiconductor devices | |
| EP2140365B1 (en) | Message routing scheme | |
| CN101080642A (en) | Remote test facility with wireless interface to local test facilities | |
| JP5863922B1 (en) | Injection molding system | |
| CN103592898B (en) | A kind of electronic product manufacture automatic control system and method | |
| CN101071156B (en) | Multi-connecting board bad-product detecting device and method | |
| CN104281830A (en) | Two-dimension code identification method and device | |
| CN1217287C (en) | Fingerprint identifying method and system | |
| CN103199041A (en) | Management system of wafer acceptable test procedure and application method thereof | |
| CN104361864B (en) | LED modules and its port controlling method and LED display system | |
| CN107977813A (en) | A kind of Picking System and goods sorting method | |
| Zhu et al. | Multi-objective sequence optimization of PCB component assembly with GA based on the discrete Fréchet distance | |
| CN112818180A (en) | Storage and query method of wafer processing historical data and process control system | |
| CN106713908B (en) | Device and control method for the test of multichannel CCD camera | |
| CN105575947A (en) | Display substrate, a display device and identity recognition method of display device | |
| CN110191259A (en) | Sensing system, information processing unit, Method of Sensor Management | |
| CN108492048A (en) | material tracking method and device | |
| EP3989058A1 (en) | Optimization method, optimization system for computer programming code and electronic device using the same | |
| CN108940902A (en) | A kind of intelligent control method of test machine | |
| CN104794508B (en) | A kind of quick identification protocol of label reported in time for washing system information | |
| CN109979536B (en) | Species identification method based on DNA bar code | |
| CN108322485A (en) | Free switching method and device based on NB-IoT networks | |
| CN111178376B (en) | Automatic classification device, automatic classification method, and computer-readable storage medium | |
| US10707138B1 (en) | High yield package assembly technique | |
| CN116701300B (en) | Computer file management system based on Internet |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |