CN107132395A - Test device for detecting CCD device leakage current - Google Patents
Test device for detecting CCD device leakage current Download PDFInfo
- Publication number
- CN107132395A CN107132395A CN201710282155.2A CN201710282155A CN107132395A CN 107132395 A CN107132395 A CN 107132395A CN 201710282155 A CN201710282155 A CN 201710282155A CN 107132395 A CN107132395 A CN 107132395A
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- China
- Prior art keywords
- module
- ccd
- control module
- relay
- leakage current
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The invention discloses a kind of test device for being used to detect CCD device leakage current, the test device is made up of host computer, ammeter module, multiple relays, control module, CCD plug-in modules and adjustable DC power module;The relay uses single-pole double-throw switch (SPDT) relay;The method have the benefit that:A kind of test device for being used to detect CCD device leakage current is proposed, the test device can carry out efficiently, comprehensively testing to CCD device pin leakage current, it is ensured that product quality.
Description
Technical field
The present invention relates to a kind of CCD fabrication evaluations technology, more particularly to a kind of test for being used to detect CCD device leakage current
Device.
Background technology
With the development of CCD technologies, all kinds of ccd image sensors are widely used in various fields, are full
Wilderness demand of the sufficient engineering circles to ccd image sensor, it is desirable to which production firm can efficiently produce the qualified CCD devices of quality
Part.
Due to being limited to process conditions, the CCD device that prior art is produced is inevitably present pin leakage current and asked
Topic, if pin leakage current is excessive, will have a strong impact on the performance of CCD device, accordingly, it would be desirable in process of production to CCD device
Pin leakage current is detected, to filter out substandard product;To take into account production efficiency and product quality, it is necessary to do not damaging
Under conditions of CCD device, the pin leakage current of CCD device is used for quickly detecting.
In actual production, due to lacking special test device, quality inspection personnel can only carry out pin leakage current survey manually
Examination operation;At present, the number of pin at most 3 of the larger CCD device of yield, 400, few also has 100 roots, for ensure production
Efficiency, quality inspection personnel unlikely all carries out electric leakage current test to every pin, it is common practice to, quality inspection personnel is rule of thumb
Some pins are selected from substantial amounts of pin and carry out electric leakage current test, if by selection to the leakage current index of pin conform to
Ask, be considered as the CCD device and meet the requirements;This mode of operation is less efficient, comprehensive poor, the substandard product appearance of detection
Easily it is missed, particularly when being produced in enormous quantities, the absolute quantity for the substandard product being missed is very surprising.
The content of the invention
The problem of in background technology, the present invention proposes a kind of test device for being used to detect CCD device leakage current,
Its innovation is:The test device by host computer, ammeter module, multiple relays, control module, CCD plug-in modules and
Adjustable DC power module is constituted;The relay uses single-pole double-throw switch (SPDT) relay;
Multiple terminals and multiple jacks are provided with the CCD plug-in modules, multiple terminals and multiple jacks are corresponded
Ground is connected;The jack is used for the pin of grafting CCD device;
The relay includes three incoming ends, and the first incoming end and the multiple terminals of multiple relays connect correspondingly
Connect;Second incoming end of multiple relays is connected with A contacts, and A contacts are connected with the earth terminal of adjustable DC power module, electricity
Flow table module is serially connected on the circuit between A contacts and adjustable DC power module;3rd incoming end of multiple relays with
The voltage output end connection of adjustable DC power module;The control unit of multiple relays is connected with control module, ammeter mould
The detection signal output part of block is connected with control module, and control module is connected with host computer;
The host computer is used for human-computer dialogue, and operating personnel can assign instruction by operating host computer to control module;Institute
The action that control module can be according to the instruction of host computer to relay is stated to be controlled;The relay can control module control
Respective terminal is gated to A contacts or the voltage output end under system;The ammeter module can be to the electric current in respective lines
Value is detected and will detect signal output to control module, and control module can transmit the detection signal received to host computer.
The present invention principle be:Before test, first CCD device to be measured is plugged in the jack of CCD plug-in modules, starts to survey
After examination, host computer assigns instruction according to test order set in advance to control module substep, and control module is according to instruction to each
The action of individual relay is controlled;After control module receives a certain instruction, control module controls each relay according to instruction
The action of device, makes the respective pin in CCD device to be measured be gated respectively with voltage output end and earth terminal, then host computer is to control
The detection signal that molding block is transmitted is sampled and recorded, and the detection signal is leakage current of the CCD device under corresponding state
Numerical value, then, host computer assign next step instruction, action of the control module according to instruction to each relay to control module again
It is adjusted, so as to change respective pin and the strobe state of voltage output end and earth terminal, continues the leakage current to CCD device
Tested;By aforementioned manner, test device to CCD device with regard to that automatical and efficient comprehensively can carry out electric leakage current test;
The step of test order is regulating relay state, by taking 3 relays as an example, by this 3 relays point
Relay 1,3,3 relays of relay 2 and relay are not designated as and correspond to 3 pins respectively, to enter respectively to this 3 pins
Row electric leakage current test, can design following 3 steps for it:Step 1), make relay 1 connect voltage output end, relay 2 be grounded,
Relay 3 is grounded;Step 2), it is grounded relay 1, relay 2 connects voltage output end, relay 3 is grounded;Step 3), make after
Electrical equipment 1 is grounded, relay 2 is grounded, relay 3 connects voltage output end;Foregoing step 1), 2), 3) be respectively formed 3 finger
Order, during test, control module can carry out substep control according to 3 foregoing steps to the action of relay.
In pin leakage current test, typically there are 2 test events, first, being flowed into the Leaked Current of Line to Ground of every pin
Row detection, this test event, it is necessary to a certain pin is connect into voltage, remaining pin ground connection (as described above to 3 pins
Leakage current test mode is carried out respectively), second, being detected leakage current pin, this test event typically need to be by 2
Root or the pin of more than 2 connect voltage simultaneously, remaining pin ground connection, in this case, combinatorial theory that only need to be in mathematics
Calculate corresponding number of combinations and can obtain each testing procedure, such as, if the sum of pin is n, needed in each testing procedure
2 pins are made to connect voltage, the quantity of testing procedure is substantially exactly to appoint the number of combinations for taking 2 elements from n element, single
2 relays that testing procedure will be selected connect voltage, remaining relay ground connection;
When being tested using the present invention, host computer only need to progressively assign instruction to control module according to test order, i.e.,
Test job can be completed, this can just greatly improve the comprehensive of test under conditions of guaranteed efficiency;In addition, the present invention also has
There is the preferable advantage of versatility, when carrying out electric leakage current test to different types of CCD device, only need to change corresponding CCD grafting
Module simultaneously calls corresponding test order.
Preferably, the multiple relay is realized using SPDT relays module.
Preferably, the CCD plug-in modules have multiple, and multiple CCD plug-in modules are integrated on same circuit board.
The method have the benefit that:Propose a kind of test device for being used to detect CCD device leakage current, the survey
Trial assembly is put can carry out efficiently, comprehensively testing to CCD device pin leakage current, it is ensured that product quality.
Brief description of the drawings
Fig. 1, the present invention electronic schematic diagram;
The corresponding title of the mark of each in figure is respectively:Host computer 1, ammeter module 2, SPDT relays module 3, control
Molding block 4, CCD plug-in modules 5, terminal 5-1, jack 5-2, adjustable DC power module 6.
Embodiment
A kind of test device for being used to detect CCD device leakage current, its innovation is:The test device by host computer 1,
Ammeter module 2, multiple relays, control module 4, CCD plug-in modules 5 and adjustable DC power module 6 are constituted;The relay
Device uses single-pole double-throw switch (SPDT) relay;
Multiple terminals and multiple jacks are provided with the CCD plug-in modules 5, multiple terminals and multiple jacks are corresponded
Ground is connected;The jack is used for the pin of grafting CCD device;
The relay includes three incoming ends, and the first incoming end and the multiple terminals of multiple relays connect correspondingly
Connect;Second incoming end of multiple relays is connected with A contacts, and A contacts are connected with the earth terminal of adjustable DC power module 6,
Ammeter module 2 is serially connected on the circuit between A contacts and adjustable DC power module 6;3rd incoming end of multiple relays
Voltage output end with adjustable DC power module 6 is connected;The control unit of multiple relays is connected with control module 4, electricity
The detection signal output part of flow table module 2 is connected with control module 4, and control module 4 is connected with host computer 1;
The host computer 1 is used for human-computer dialogue, and operating personnel can assign instruction by operating host computer 1 to control module 4;
The control module 4 can be according to the instruction of host computer 1 to relay action be controlled;The relay can be in control module
Respective terminal is gated to A contacts or the voltage output end under 4 control;The ammeter module 2 can be in respective lines
Current value detected and will detection signal output to control module 4, control module 4 the detection signal received can be transmitted to
Host computer 1.
Further, the multiple relay is realized using SPDT relays module 3.
Further, the CCD plug-in modules 5 have multiple, and multiple CCD plug-in modules 5 are integrated on same circuit board.
Claims (3)
1. a kind of test device for being used to detect CCD device leakage current, it is characterised in that:The test device by host computer (1),
Ammeter module (2), multiple relays, control module (4), CCD plug-in modules (5) and adjustable DC power module (6) composition;
The relay uses single-pole double-throw switch (SPDT) relay;
Multiple terminals and multiple jacks are provided with the CCD plug-in modules (5), multiple terminals and multiple jacks are correspondingly
Connection;The jack is used for the pin of grafting CCD device;
The relay includes three incoming ends, and the first incoming end of multiple relays is connected correspondingly with multiple terminals;
Second incoming end of multiple relays is connected with A contacts, and A contacts are connected with the earth terminal of adjustable DC power module (6), electricity
Flow table module (2) is serially connected on the circuit between A contacts and adjustable DC power module (6);3rd access of multiple relays
The voltage output end with adjustable DC power module (6) is held to be connected;The control unit of multiple relays connects with control module (4)
Connect, the detection signal output part of ammeter module (2) is connected with control module (4), and control module (4) is connected with host computer (1);
The host computer (1) is used for human-computer dialogue, and operating personnel can assign finger by operating host computer (1) to control module (4)
Order;The control module (4) can be according to the instruction of host computer (1) to relay action be controlled;The relay can be
Respective terminal is gated to A contacts or the voltage output end under the control of control module (4);Ammeter module (2) energy
Current value in respective lines is detected and signal output will be detected to control module (4), control module (4) will can be received
Detection signal transmit to host computer (1).
2. the test device according to claim 1 for being used to detect CCD device leakage current, it is characterised in that:It is the multiple
Relay is realized using SPDT relays module (3).
3. the test device according to claim 1 or 2 for being used to detect CCD device leakage current, it is characterised in that:It is described
CCD plug-in modules (5) have multiple, and multiple CCD plug-in modules (5) are integrated on same circuit board.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201710282155.2A CN107132395A (en) | 2017-04-26 | 2017-04-26 | Test device for detecting CCD device leakage current |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201710282155.2A CN107132395A (en) | 2017-04-26 | 2017-04-26 | Test device for detecting CCD device leakage current |
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Publication Number | Publication Date |
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CN107132395A true CN107132395A (en) | 2017-09-05 |
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CN201710282155.2A Pending CN107132395A (en) | 2017-04-26 | 2017-04-26 | Test device for detecting CCD device leakage current |
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Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5957175A (en) * | 1982-09-27 | 1984-04-02 | Fujitsu Ltd | Measurement of integrated circuit |
JPS63191976A (en) * | 1987-02-05 | 1988-08-09 | Hitachi Electronics Eng Co Ltd | Ic inspecting device |
JPH01119772A (en) * | 1987-11-02 | 1989-05-11 | Mitsubishi Electric Corp | Ic tester |
CN102752623A (en) * | 2011-04-19 | 2012-10-24 | 鸿富锦精密工业(深圳)有限公司 | Signal testing device |
CN202815077U (en) * | 2012-09-20 | 2013-03-20 | 天津亿为特电子科技有限公司 | Multi-channel voltage current tester |
CN103439570A (en) * | 2013-08-30 | 2013-12-11 | 深圳市度信科技有限公司 | Chip leakage current testing system |
CN103698654A (en) * | 2013-12-28 | 2014-04-02 | 珠海全志科技股份有限公司 | Open circuit short circuit test device and test method of chip base pin |
CN205210219U (en) * | 2015-10-30 | 2016-05-04 | 广东利扬芯片测试股份有限公司 | Test panel is surveyed in short circuit of opening a way of chip |
-
2017
- 2017-04-26 CN CN201710282155.2A patent/CN107132395A/en active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5957175A (en) * | 1982-09-27 | 1984-04-02 | Fujitsu Ltd | Measurement of integrated circuit |
JPS63191976A (en) * | 1987-02-05 | 1988-08-09 | Hitachi Electronics Eng Co Ltd | Ic inspecting device |
JPH01119772A (en) * | 1987-11-02 | 1989-05-11 | Mitsubishi Electric Corp | Ic tester |
CN102752623A (en) * | 2011-04-19 | 2012-10-24 | 鸿富锦精密工业(深圳)有限公司 | Signal testing device |
CN202815077U (en) * | 2012-09-20 | 2013-03-20 | 天津亿为特电子科技有限公司 | Multi-channel voltage current tester |
CN103439570A (en) * | 2013-08-30 | 2013-12-11 | 深圳市度信科技有限公司 | Chip leakage current testing system |
CN103698654A (en) * | 2013-12-28 | 2014-04-02 | 珠海全志科技股份有限公司 | Open circuit short circuit test device and test method of chip base pin |
CN205210219U (en) * | 2015-10-30 | 2016-05-04 | 广东利扬芯片测试股份有限公司 | Test panel is surveyed in short circuit of opening a way of chip |
Non-Patent Citations (1)
Title |
---|
王香芬等: "基于漏电流故障模型的集成电路测试方法研究", 《第一届中国微电子计量与测试技术研讨会》 * |
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Application publication date: 20170905 |