CN1071253A - Complementary light beam wave surface detector - Google Patents
Complementary light beam wave surface detector Download PDFInfo
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- CN1071253A CN1071253A CN 91107496 CN91107496A CN1071253A CN 1071253 A CN1071253 A CN 1071253A CN 91107496 CN91107496 CN 91107496 CN 91107496 A CN91107496 A CN 91107496A CN 1071253 A CN1071253 A CN 1071253A
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- light
- cutting element
- wave surface
- complementary
- light beam
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- 230000000295 complement effect Effects 0.000 title claims abstract description 21
- 238000000034 method Methods 0.000 claims description 9
- 230000004907 flux Effects 0.000 claims description 7
- 230000003068 static effect Effects 0.000 claims description 3
- 230000001788 irregular Effects 0.000 claims description 2
- 238000012544 monitoring process Methods 0.000 claims description 2
- 230000005540 biological transmission Effects 0.000 abstract description 2
- 230000003321 amplification Effects 0.000 abstract 1
- 238000003199 nucleic acid amplification method Methods 0.000 abstract 1
- 230000003287 optical effect Effects 0.000 description 31
- 238000010521 absorption reaction Methods 0.000 description 6
- 230000009021 linear effect Effects 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000009022 nonlinear effect Effects 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 229930002868 chlorophyll a Natural products 0.000 description 1
- ATNHDLDRLWWWCB-AENOIHSZSA-M chlorophyll a Chemical compound C1([C@@H](C(=O)OC)C(=O)C2=C3C)=C2N2C3=CC(C(CC)=C3C)=[N+]4C3=CC3=C(C=C)C(C)=C5N3[Mg-2]42[N+]2=C1[C@@H](CCC(=O)OC\C=C(/C)CCC[C@H](C)CCC[C@H](C)CCCC(C)C)[C@H](C)C2=C5 ATNHDLDRLWWWCB-AENOIHSZSA-M 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000005622 photoelectricity Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
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Abstract
The detector uses a special beam-splitting element containing total transmission light region and total reflection light region to split the incident beam into two beams of light which are transmitted and reflected and are mutually complementary in space, and the two beams of light are respectively received by two detectors connected to differential circuit and addition circuit, and then passed through amplification circuit and displayed on display system.
Description
The present invention is a kind of optical wave-front detector.
The optical wave-front detector occupies extremely important status in classical optics instrument testing and Modern Nonlinear optical measurement.It can be used for checking the deviation on the actual optical wave-front relative ideal of optical instrument corrugated, thereby make people be improved the design and the process of optical instrument, it can also be checked in optical system and change owing to increasing some optical elements or optical element itself corrugated that influence caused to optical wave-front equally, analyze by some simple mathematical, can calculate many physical quantitys that other need be measured from the variable quantity on corrugated, make its optical wave-front detector also can be used for measuring indirectly.
In the detection technique of existing corrugated, detect micro-displacement or length (as: U.S. Patent No. 3720471) with reference corrugated and tested corrugated interferometric method, detect small angle (as United States Patent (USP) NO.SU-811-070), detect coherence's (as: U.S. Patent No. 4536089).But the past few people detect optical wave-front and are used for the high-precision optical nonlinear measurement, and people such as M.Sheik-Bakae (Qpt.Lett, Vd.14, P.955,1989) the non-property line that adopts the corrugated detection method to measure material is analysed the rate of penetrating recently.
But in people's such as M.Sheik-Bahae the method, when the corrugated changes, be that the corrugated that changes is incided on the smallcolumn diaphragm, use orifice method, observe or measure the variation of transmitance, in actual measurement, the initial value of transmitance is not when promptly the corrugated on inciding smallcolumn diaphragm changes, the transmitance of aperture can not be zero, therefore when changing on the corrugated, record at every turn be the initial value of transmitance and variable quantity and, so this is to the very big restriction of dynamic range generation of transmitance variable quantity, make measuring accuracy be difficult to improve, in this measuring method, have only when the size of aperture goes to zero simultaneously, sensitivity is just the highest.Obviously can't increase sensitivity by the unbounded size system ground that changes aperture, because regularly be difficult to find more highly sensitive photodetector to one when aperture is little.
The objective of the invention is in order to improve the measuring accuracy of dynamic optical corrugated variable quantity, it both can measure the dynamic subtle change on corrugated, can measure the variation of incident optical power or the measured optical unit dynamic modulation again to luminous power, also can measure the nonlinear refractive index of optical sample, and non-linear and linear absorption coefficient etc.
Fig. 1 has provided the structural representation of complementary beam wave surface detector.It is made of three parts, and first is a light source.Preferably monochromatic coherent light selects laser instrument as light source usually; Second portion is a core of the present invention.Constitute by a beam cutting element and a convergent lens, disperse incide the beam convergence of lens from light source after, be divided into two-beam complementary on the locus by beam cutting element then, wherein a branch of is folded light beam, and another bundle is transmitted light beam: third part is that photoelectricity receives and data processing one display system.It is by three photodetector D
1, D
2And D
3, difference channel, adder circuit, amplifying circuit and display system combine.
Concrete formation is to be divided into folded light beam and transmitted light beam from the laser that the laser instrument as light source sends behind spectroscope, and folded light beam is used as monitoring beam through lens L
3Converge to photodetector D
3On; Transmitted light beam is through condenser lens L
2(focal length is f in the back
3) assemble and a beam cutting element to be arranged after dispersing again, it is divided into transmission and reflection two bundle spatial complementary light beams with light beam, respectively by photodetector D
1And D
2Receive photodetector D
1And D
2Output receive simultaneously on difference channel and the adder circuit, the output of difference and addition two circuit is connected with amplifying circuit respectively, the output of amplifying circuit is sent on the display system.As shown in Figure 1.
Said display system can be an oscillograph, or carries out connecing digital indicator after the A/D conversion through the A/D translation circuit, or handles and export after directly sending microcomputer digital signal.
In original state, when promptly the corrugated was invariable, the difference channel output signal was zero, because the luminous flux of transmitted light beam and folded light beam equates.When the corrugated changed, differential signal no longer was zero, and this moment, the luminous flux of two complementary beams was also just no longer equal, can measure the variation on corrugated thus.
The core of instrument of the present invention is a beam cutting element, its structure is different from common light beam splitter fully, it is divided into two-beam to incident beam, and a branch of is transmitted light beam, and another bundle is folded light beam, be because on its element two zones are arranged, one is total transmissivity light district, and one is the total reflection light district, and two zones by a closed curve separately, the shape of this closed curve is according to the difference of incident beam and difference can be ellipse or rectangle or irregular closed curve.But it always with incide beam cutting element on the boundary line of the hot spot that cut out by this plane, beam cutting element place of light beam similar.For example incide on the beam cutting element is that the most general a branch of round symmetry is dispersed (or assemble) light beam (can certainly be directional light), when then cut mutually with light beam on plane, beam cutting element place, the boundary line of the full hot spot that obtains was an ellipse (as shown in Figure 2).The boundary line in hence one can see that the beam cutting element center is total transmissivity light district and the total reflection light district around its also is a little ellipse, and the length semiaxis of the little ellipse obviously length semiaxis than full hot spot ellipse is little, and both are proportional.The minor axis of little ellipse can be determined that beam cutting element will make light beam have identical luminous flux by the transmitted light that forms after it with reflected light when initial static state by following condition, and this can accurately describe with following equation:
∫
∞ bIRdR＝∫
b oIRdR
R＝（x
2+y
2）
1/2
I is the light intensity at Z=0 place, is (x, function y), under the situation of circle symmetry is the function of R, (x, y, z) be air coordinates, axes of coordinates is so selected, is the direction of z axle along the optical axis direction of transmitted light beam, beam cutting element is centered close on the optical axis, be decided to be origin of coordinate 0, (x, z) plane is plane shown in Figure 1, the y axle is perpendicular to plane shown in Figure 1, when then being p for incident optical power:
∫
∞ bIRdR＝P-∫
b oIRdR
Can get 1/P ∫ thus
b oIRdR=1/2 can calculate the occurrence of minor axis b when light intensity I is known, also can calculate major axis a simultaneously
a＝b/sinβ
Wherein β is the angle of plane, beam cutting element place and optical axis.If β=30 °, then a=2b.
When sample 14 original position are to place away from lens L
8The focus place, as shown in Figure 3 then because the optical power density on the sample is smaller, and the optical non-linear effect of generation is very little, minimum can the ignoring of variation on light beam corrugated during, [(D at this moment by sample
1-D
2)/D
3D in the]=0(formula
1, D
2, D
3Be respectively photodetector D
1, D
2, D
3The light signal that is received), when sample during more and more near focus, the luminous energy that then incides on the unit area on the sample just more and more becomes big, and the nonlinear effect of generation also just begins obviously, from the optical wave-front of sample outgoing obvious variation, [(D is at this moment just arranged
1-D
2)/D
3] ≠ 0.Incide on the beam cutting element according to light, form a branch of transmitted light and a branch of reflected light, wherein transmitted light beam and folded light beam and optical nonlinear refraction rate n from the sample outgoing
2The relation theoretical analysis that can separately carry out, incide detector D
1On transmitted light, its transmitance can be calculated as:
D
1max-D
1min～0.34kn
2I
oL
eff
D wherein
1max-be photodetector D
1The maximal value that receives, D
1min-be photodetector D
1Received minimum value, I
oBe the light intensity at sample place on the optical axis, L
EffBe sample thickness.Because what produce on the beam cutting element is two bundle complementary light, luminous flux equates when initial, and is complementary in dynamic process, so
D
2max-D
2min＝-（D
1max-D
1min）
Can draw thus:
△D＝[（D
1-D
2）
max-（D
1-D
2）
min]/D
3
＝2（D
1max-D
2min）/D
3
～0.68kn
2I
oL
eff
n
2＝η△D/0.68kI
oL
eff
η is and the enlargement factor of amplifying circuit and a relevant instrument constant of splitting ratio of spectroscope 11 in the formula.
From top analysis as can be seen, people such as complementary beam wave surface detector of the present invention and M.Sheik-Bahae adopt orifice method to detect the technology that the corrugated changes and have compared many advantages:
Measuring accuracy at least can than orifice method Senior Three doubly more than, can survey λ/800 or littler dynamic corrugated changes.
If when initial time or static state, make the luminous fluxes of two bundle complementary beams equate that then this moment, differential signal was zero, to have only when the corrugated of incident beam before beam cutting element changes, the output of differential signal ability is non-vanishing.This is just provided the foundation for the amplifying circuit that adopts high multiple amplifies signal, therefore limit initial background that precision improves in complementary beam wave surface detector by cancellation.
2. can directly measure the dynamic modulation of detected element to luminous power.This just can be directly used in measures the loss that optical element (or nonlinear material) is gone up luminous energy.
In output signal, the variation of luminous power after complementary beam wave surface detector has provided the variable power of light signal and passed through detected element, this is because detector D
1And D
2The signal of output is transfused to adder circuit, and what provide is two signal sums, the i.e. optical power value of light beam.If light beam is by behind the sample, the variation of luminous power is due to the absorption of sample, then can obtain the absorption coefficient of sample, when linear absorption and non-linear absorption coexistence, can utilize the power excursion of light source, tell both sizes from the output signal of complementary beam wave surface detector simultaneously.
Description of drawings:
Fig. 1 complementary beam wave surface detector structural representation:
The 1-beam cutting element;
2-photodetector D
1;
The 3-difference channel;
4-amplifying circuit A
1;
The 5-adder circuit;
6-amplifying circuit A
2;
7-photodetector D
2;
8,9,10-convergent lens L
1, L
2, L
3;
The 11-spectroscope;
12-photodetector D
3;
The 13-display system;
Fig. 2 beam cutting element floor map, among the figure:
14-total transmissivity light district;
15-total reflection light district;
The boundary line in 16-transmission and two zones of reflection;
Sample and system architecture relative position synoptic diagram when Fig. 3 complementary beam wave surface detector is used for the optical nonlinearity measurement.
The 17-sample
Typical measurement result of Fig. 4.
Embodiment:
Measure the optical nonlinear refraction rate n of biological organic material with complementary beam wave surface detector
2As shown in Figure 3.
Light source: YAG laser instrument, the frequency doubled light of 1.06 μ m are 0.53 μ m, and pulsewidth is 12ns, and pulse repetition rate 1Hz is to 10Hz, single pulse energy 20mj;
The reflectivity of spectroscope 11 is 10%;
Lens L
2Focal length be 30mm;
The separatrix in total transmissivity light district and total reflection light district is oval on the beam cutting element, and minor axis is 5mm, and major axis is 5
Mm, the angle β of beam cutting element and optical axis is 45 °;
Photodetector D
1, D
2, D
3All adopt the 3DU5C phototriode;
Difference channel adopts operational amplifier LM118 to constitute, and adder circuit adopts operational amplifier μ A772 to constitute and two amplifying circuits adopt general analogue signal amplifying circuit, enlargement factor β=10
3
Display system constitutes by the A/D converter plate with the general-purpose interface and the IBM microcomputer of IBM microcomputer.
Sample is the compound high-molecular organic material that is mixed with chlorophyll a, and thickness of sample is 1.0mm, linear absorption coefficient α=1.29cm
-1, when sample at lens L
2Focus on the time, on the axle point irradiation light intensity I
oBe 400MW/cm
2, gained △ D=2.9 * 10
2, η=10
-3, can calculate n according to formula (1)
2=-4.9 * 10
-8Esu.
Claims (4)
1, a kind of complementary beam wave surface detector contains light source, lens, detector and display system, it is characterized in that the light beam from light emitted, is divided into two-beam through a spectroscope, a branch of light as monitoring beam through a lens L
3By a photodetector D
3Receive; The poly-after a while lens L of another Shu Guangjing
2After convergence is dispersed, a beam cutting element is arranged again, be partitioned into transmitted light beam and folded light beam, respectively by photodetector D
1, D
2Receive photodetector D
1And D
2Output receive simultaneously on difference channel and the adder circuit, difference and addition two circuit are connected to amplifying circuit, signal is amplified to output on the display system.
2, a kind of complementary beam wave surface detector according to claim 1 is characterized in that on the beam cutting element dividing that total transmissivity light district and total reflection light district, the boundary line in two zones are arranged is a closed curve.
3, according to claim 1,2 described a kind of complementary beam wave surface detectors, it is characterized in that beam cutting element is divided into transmitted light beam and folded light beam, when initial static, the luminous flux of two light beams equates, in dynamic process, the luminous flux of two light beams be complementation.
4,, it is characterized in that the boundary closed curve between the total transmissivity light district and total reflection light district can be ellipse, rectangle, irregular closed curve on the beam cutting element according to claim 1,2 described a kind of complementary beam wave surface detectors.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 91107496 CN1030543C (en) | 1991-09-25 | 1991-09-25 | Complementary light beam wave surface detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 91107496 CN1030543C (en) | 1991-09-25 | 1991-09-25 | Complementary light beam wave surface detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1071253A true CN1071253A (en) | 1993-04-21 |
| CN1030543C CN1030543C (en) | 1995-12-20 |
Family
ID=4908833
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 91107496 Expired - Fee Related CN1030543C (en) | 1991-09-25 | 1991-09-25 | Complementary light beam wave surface detector |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1030543C (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100470193C (en) * | 2007-06-08 | 2009-03-18 | 中国科学院上海光学精密机械研究所 | Device and method for measuring thickness of quartz wave plate |
| CN101031788B (en) * | 2005-09-22 | 2011-06-15 | 日本电信电话株式会社 | Method, device and program for measuring wavelength dispersion of optical waveguide |
| CN114280733A (en) * | 2020-09-27 | 2022-04-05 | 青岛海信宽带多媒体技术有限公司 | Optical module |
-
1991
- 1991-09-25 CN CN 91107496 patent/CN1030543C/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101031788B (en) * | 2005-09-22 | 2011-06-15 | 日本电信电话株式会社 | Method, device and program for measuring wavelength dispersion of optical waveguide |
| CN100470193C (en) * | 2007-06-08 | 2009-03-18 | 中国科学院上海光学精密机械研究所 | Device and method for measuring thickness of quartz wave plate |
| CN114280733A (en) * | 2020-09-27 | 2022-04-05 | 青岛海信宽带多媒体技术有限公司 | Optical module |
| CN114280733B (en) * | 2020-09-27 | 2023-08-08 | 青岛海信宽带多媒体技术有限公司 | Optical module |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1030543C (en) | 1995-12-20 |
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