CN107024488A - 一种玻璃缺陷检测方法 - Google Patents
一种玻璃缺陷检测方法 Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
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Abstract
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CN107024488A true CN107024488A (zh) | 2017-08-08 |
CN107024488B CN107024488B (zh) | 2019-08-13 |
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Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107782741A (zh) * | 2017-10-26 | 2018-03-09 | 德清晨英电子科技有限公司 | 一种通过光线判定气泡的装置 |
CN108844494A (zh) * | 2018-06-25 | 2018-11-20 | 新视界视光健康产业(南京)有限公司 | 基于光学方法检测眼镜曲面曲率参数的方法 |
CN109211920A (zh) * | 2018-09-04 | 2019-01-15 | 东旭科技集团有限公司 | 用于载板玻璃的紫外光透过率测试装置及设备 |
CN109297991A (zh) * | 2018-11-26 | 2019-02-01 | 深圳市麓邦技术有限公司 | 一种玻璃表面缺陷检测系统及方法 |
CN109406542A (zh) * | 2017-08-16 | 2019-03-01 | 旺矽科技股份有限公司 | 光学检测系统 |
CN110031481A (zh) * | 2019-05-05 | 2019-07-19 | 苏州天准科技股份有限公司 | 一种基于偏振的方波结构光照明实现方法 |
CN110057841A (zh) * | 2019-05-05 | 2019-07-26 | 电子科技大学 | 一种基于透射结构光的缺陷检测方法 |
CN110715931A (zh) * | 2019-10-29 | 2020-01-21 | 上海御微半导体技术有限公司 | 一种透明样品缺陷自动检测方法和检测装置 |
CN111158131A (zh) * | 2019-12-31 | 2020-05-15 | 杭州电子科技大学 | 一种基于傅里叶叠层成像的led矩阵校正方法 |
CN111213029A (zh) * | 2018-09-27 | 2020-05-29 | 合刃科技(深圳)有限公司 | 检测透明/半透明材料缺陷的方法、装置及系统 |
CN111290660A (zh) * | 2020-01-21 | 2020-06-16 | 上海悦易网络信息技术有限公司 | 屏幕坐标转换为触笔坐标的方法及设备 |
CN112750113A (zh) * | 2021-01-14 | 2021-05-04 | 深圳信息职业技术学院 | 基于深度学习和直线检测的玻璃瓶缺陷检测方法及装置 |
CN113554636A (zh) * | 2021-07-30 | 2021-10-26 | 西安电子科技大学 | 一种基于生成对抗网络和计算全息的芯片缺陷检测方法 |
CN118010637A (zh) * | 2024-04-09 | 2024-05-10 | 江苏迪莫工业智能科技有限公司 | 一种生产工具用螺母检测系统及其检测方法 |
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CN1756949A (zh) * | 2003-03-05 | 2006-04-05 | 康宁股份有限公司 | 用于检测透明基片中的缺陷的检测装置 |
CN102865832A (zh) * | 2012-09-18 | 2013-01-09 | 西安电子科技大学 | 基于相位恢复的4f镜面检测成像系统及其方法 |
CN105066904A (zh) * | 2015-07-16 | 2015-11-18 | 太原科技大学 | 基于相位梯度阈值的流水线产品三维面型检测方法 |
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2017
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CN1756949A (zh) * | 2003-03-05 | 2006-04-05 | 康宁股份有限公司 | 用于检测透明基片中的缺陷的检测装置 |
CN102865832A (zh) * | 2012-09-18 | 2013-01-09 | 西安电子科技大学 | 基于相位恢复的4f镜面检测成像系统及其方法 |
CN105066904A (zh) * | 2015-07-16 | 2015-11-18 | 太原科技大学 | 基于相位梯度阈值的流水线产品三维面型检测方法 |
Non-Patent Citations (2)
Title |
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K.FEDUS等: "Experimental techniques using 4f coherent imaging system for measuring nonlinear refraction", 《OPTICS COMMUNICATIONS》 * |
吴元昊等: "用傅里叶相移特性估计位移", 《光电工程》 * |
Cited By (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109406542A (zh) * | 2017-08-16 | 2019-03-01 | 旺矽科技股份有限公司 | 光学检测系统 |
CN107782741A (zh) * | 2017-10-26 | 2018-03-09 | 德清晨英电子科技有限公司 | 一种通过光线判定气泡的装置 |
CN108844494A (zh) * | 2018-06-25 | 2018-11-20 | 新视界视光健康产业(南京)有限公司 | 基于光学方法检测眼镜曲面曲率参数的方法 |
CN109211920A (zh) * | 2018-09-04 | 2019-01-15 | 东旭科技集团有限公司 | 用于载板玻璃的紫外光透过率测试装置及设备 |
CN111213029A (zh) * | 2018-09-27 | 2020-05-29 | 合刃科技(深圳)有限公司 | 检测透明/半透明材料缺陷的方法、装置及系统 |
CN109297991A (zh) * | 2018-11-26 | 2019-02-01 | 深圳市麓邦技术有限公司 | 一种玻璃表面缺陷检测系统及方法 |
CN109297991B (zh) * | 2018-11-26 | 2019-12-17 | 深圳市麓邦技术有限公司 | 一种玻璃表面缺陷检测系统及方法 |
CN110031481A (zh) * | 2019-05-05 | 2019-07-19 | 苏州天准科技股份有限公司 | 一种基于偏振的方波结构光照明实现方法 |
CN110057841A (zh) * | 2019-05-05 | 2019-07-26 | 电子科技大学 | 一种基于透射结构光的缺陷检测方法 |
CN110715931A (zh) * | 2019-10-29 | 2020-01-21 | 上海御微半导体技术有限公司 | 一种透明样品缺陷自动检测方法和检测装置 |
CN111158131A (zh) * | 2019-12-31 | 2020-05-15 | 杭州电子科技大学 | 一种基于傅里叶叠层成像的led矩阵校正方法 |
CN111158131B (zh) * | 2019-12-31 | 2021-09-28 | 杭州电子科技大学 | 一种基于傅里叶叠层成像的led矩阵校正方法 |
CN111290660A (zh) * | 2020-01-21 | 2020-06-16 | 上海悦易网络信息技术有限公司 | 屏幕坐标转换为触笔坐标的方法及设备 |
CN112750113A (zh) * | 2021-01-14 | 2021-05-04 | 深圳信息职业技术学院 | 基于深度学习和直线检测的玻璃瓶缺陷检测方法及装置 |
CN113554636A (zh) * | 2021-07-30 | 2021-10-26 | 西安电子科技大学 | 一种基于生成对抗网络和计算全息的芯片缺陷检测方法 |
CN113554636B (zh) * | 2021-07-30 | 2024-06-28 | 西安电子科技大学 | 一种基于生成对抗网络和计算全息的芯片缺陷检测方法 |
CN118010637A (zh) * | 2024-04-09 | 2024-05-10 | 江苏迪莫工业智能科技有限公司 | 一种生产工具用螺母检测系统及其检测方法 |
CN118010637B (zh) * | 2024-04-09 | 2024-06-07 | 江苏迪莫工业智能科技有限公司 | 一种生产工具用螺母检测系统及其检测方法 |
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Inventor after: Yan Chenggang Inventor after: Lv Binbin Inventor after: Wu Jiamin Inventor after: Wang Jiachen Inventor after: Song Jiayin Inventor before: Lv Binbin Inventor before: Yan Chenggang Inventor before: Wu Jiamin Inventor before: Wang Jiachen Inventor before: Song Jiayin |
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