CN107024365B - Analysis device and analysis method - Google Patents
Analysis device and analysis method Download PDFInfo
- Publication number
- CN107024365B CN107024365B CN201611089687.6A CN201611089687A CN107024365B CN 107024365 B CN107024365 B CN 107024365B CN 201611089687 A CN201611089687 A CN 201611089687A CN 107024365 B CN107024365 B CN 107024365B
- Authority
- CN
- China
- Prior art keywords
- analysis
- particulate matter
- fine particulate
- trapping
- unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000004458 analytical method Methods 0.000 title claims abstract description 245
- 239000013618 particulate matter Substances 0.000 claims abstract description 157
- 238000005259 measurement Methods 0.000 claims abstract description 21
- 239000000463 material Substances 0.000 claims description 3
- 230000005250 beta ray Effects 0.000 description 12
- 238000000034 method Methods 0.000 description 6
- 239000000126 substance Substances 0.000 description 6
- 230000008569 process Effects 0.000 description 5
- 239000002245 particle Substances 0.000 description 3
- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000012937 correction Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- OKTJSMMVPCPJKN-NJFSPNSNSA-N Carbon-14 Chemical compound [14C] OKTJSMMVPCPJKN-NJFSPNSNSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 238000001237 Raman spectrum Methods 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 239000006229 carbon black Substances 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000004745 nonwoven fabric Substances 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- -1 polyethylene Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000003014 reinforcing effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/10—Devices for withdrawing samples in the liquid or fluent state
- G01N1/14—Suction devices, e.g. pumps; Ejector devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/2202—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
- G01N1/2205—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling with filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
- G01N15/075—Investigating concentration of particle suspensions by optical means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/22—Devices for withdrawing samples in the gaseous state
- G01N1/2202—Devices for withdrawing samples in the gaseous state involving separation of sample components during sampling
- G01N2001/222—Other features
- G01N2001/2223—Other features aerosol sampling devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N2015/0042—Investigating dispersion of solids
- G01N2015/0046—Investigating dispersion of solids in gas, e.g. smoke
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N2021/3595—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using FTIR
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/651—Specific applications or type of materials dust
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Hydrology & Water Resources (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Engineering & Computer Science (AREA)
- Biomedical Technology (AREA)
- Molecular Biology (AREA)
- Sampling And Sample Adjustment (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
An analyzer capable of efficiently collecting and analyzing particulate matter at the same time. The analysis device 100 includes a collection filter 1, a collection unit 3, a collection amount measuring unit 5, a moving unit 11, an analysis unit 7, and an analysis mode switching unit 93. The collection filter 1 has a collection area capable of collecting the fine particulate matter FP. The trap portion 3 traps the fine particulate matter FP contained in the measurement space in the trap area existing at the 1 st position P1. The collected amount measuring unit 5 measures the amount of the fine particulate matter FP collected in the collection area existing at the 1 st position P1. The moving unit 11 moves the trapping filter in the longitudinal direction. The analysis unit 7 analyzes the fine particulate matter trapped in the trapping region moved to the 2 nd position P2. The analysis mode switching unit 93 selects either one of the 1 st analysis mode and the 2 nd analysis mode.
Description
Technical Field
The present invention relates to an analysis apparatus and an analysis method for analyzing particulate matter present in a measurement space.
Background
In recent years, fine particulate matter such as PM2.5 in the atmosphere has become a major environmental problem, and apparatuses for analyzing the concentration and element content of the fine particulate matter have been developed for the purpose of grasping the state of the fine particulate matter.
For example, patent document 1 discloses an analysis device that continuously and automatically analyzes the mass concentration of floating particulate matter in the atmosphere and the kind of element contained therein.
Patent document 1: japanese laid-open patent publication No. 2005-134270
In this analysis apparatus, in order to avoid "clogging" of the trapping filter, if the trapping filter traps a predetermined amount or more of fine particulate matter, the trapping is stopped and the trapping filter is moved in the longitudinal direction, so that the fine particulate matter is newly trapped at a new position.
Conventionally, the above-described operation is performed regardless of whether or not the component analysis is performed at the time of movement of the trapping filter. Therefore, when the movement start time of the trapping filter is in the middle of the execution of the component analysis, the particulate matter that is the object of the component analysis is moved away from the measurement region in the execution of the component analysis.
Disclosure of Invention
The purpose of the present invention is to efficiently achieve both collection and analysis of particulate matter in an analysis device that simultaneously collects and analyzes particulate matter using a single collection filter.
Hereinafter, a plurality of modes will be described as means for solving the problem. These may be combined arbitrarily as required.
An analysis device according to an aspect of the present invention includes a collection filter, a collection unit, a collection amount measurement unit, a movement unit, an analysis unit, and a notification unit. The trapping filter has a trapping region capable of trapping fine particulate matter. The trapping part is provided corresponding to the 1 st position in the longitudinal direction of the trapping filter, and traps the fine particulate matter contained in the measurement space in the trapping region existing at the 1 st position. The collection amount measuring unit measures the collection amount of the fine particulate matter collected in the collection area at the 1 st position.
The moving unit moves the collection filter in the longitudinal direction, thereby moving the collection area existing at the 1 st position to the 2 nd position where the collection filter is located in the longitudinal direction and the analysis of the fine particulate matter is performed, and moving the non-collection area where the fine particulate matter is not collected to the 1 st position. The analysis section is provided corresponding to the 2 nd position, and performs analysis on the fine particulate matter trapped in the trapping region moved from the 1 st position to the 2 nd position.
The notification unit outputs a notification signal when it is detected that the amount of the collected fine particulate matter has reached a predetermined amount, and the collection unit stops collection of the fine particulate matter when a reference time preset as a time when collection of the fine particulate matter is completed is reached after collection of the fine particulate matter is started, continues collection of the fine particulate matter until the reference time is reached, and stops collection of the fine particulate matter even before the reference time is reached when the notification signal is output.
Thus, the analysis mode can be appropriately switched to either one of the 1 st analysis mode and the 2 nd analysis mode, and the collection and analysis of the fine particulate matter can be balanced and achieved at the same time.
Preferably, the trapping unit stops trapping of the fine particulate matter each time a reference timing determined based on a predetermined reference is reached, the moving unit then moves the trapping region existing at the 1 st position to the 2 nd position while moving the non-trapping region to the 1 st position, and then the trapping unit starts trapping of the fine particulate matter and the analyzing unit starts analyzing the fine particulate matter.
This enables the collection of the fine particulate matter to be repeatedly performed every time the reference time is reached. As a result, the mass concentration of the fine particulate matter trapped in the trapping region can be calculated every time the reference time is reached.
The analysis device may further include a notification unit. The notification unit outputs a notification signal when detecting that the amount of collected light has reached a predetermined amount. This makes it possible to notify the collection area of the collection of a predetermined amount of fine particulate matter with a notification signal.
Preferably, when the analysis unit continues the analysis of the fine particulate matter by outputting the notification signal, the moving unit moves the trapping region existing at the 1 st position to the 2 nd position and moves the non-trapping region to the 1 st position when the analysis is completed. This enables the analysis unit to reliably perform the analysis.
Preferably, when it is determined that the analysis unit can end the subsequent analysis during the period from the output of the notification signal to the next reference time, the moving unit moves the collection area present at the 1 st position to the 2 nd position immediately after the output of the notification signal, while moving the non-collection area to the 1 st position, and the analysis unit starts the subsequent analysis after the collection area present at the 1 st position is moved to the 2 nd position after the output of the notification signal.
Thus, when it is determined that the analysis can be reliably performed even if the analysis is started immediately after the output of the notification signal, the collection of the fine particulate matter can be started immediately after the output of the notification signal.
Preferably, when it is determined that the analysis unit cannot end the subsequent analysis until the next reference time after the output of the notification signal, the moving unit moves the collection area present at the 1 st position to the 2 nd position at the next reference time, while moving the non-collection area to the 1 st position, and the analysis unit starts the subsequent analysis after the collection area present at the 1 st position after the next reference time has moved to the 2 nd position. Thereby, the subsequent analysis can be reliably performed.
Preferably, the moving unit moves the trapping region existing at the 1 st position to the 2 nd position and moves the non-trapping region to the 1 st position immediately after the output of the notification signal, regardless of whether the analysis unit can end the subsequent analysis during the period from the output of the notification signal to the next reference time. This can give priority to the collection of fine particulate matter.
Preferably, when it is determined that the analysis unit cannot end the subsequent analysis until the next reference time from the output of the notification signal, the analysis unit does not start the subsequent analysis at the time of the output of the notification signal. Thereby, the analysis can be reliably performed.
Preferably, the analysis mode switching unit switches the analysis mode from the 1 st analysis mode to the 2 nd analysis mode when the notification signal is output during execution of the 1 st analysis mode. Thus, the analysis time can be shortened when the amount of the collected fine particulate matter reaches a predetermined amount, and the collection and analysis of the fine particulate matter can be balanced well.
Preferably, the analysis mode switching unit switches the analysis mode from the 2 nd analysis mode to the 1 st analysis mode when the collection area for collecting a smaller amount of the fine particulate matter than the predetermined amount moves to the 2 nd position after the predetermined amount of the fine particulate matter is analyzed in the 2 nd analysis mode. Thus, even when the amount of the collected fine particulate matter is smaller than a predetermined amount, for example, intentional analysis of the fine particulate matter can be performed.
Preferably, the trap unit stops trapping of the fine particulate matter after the notification signal is output. This makes it possible to reduce the amount of fine particulate matter trapped in the trapping filter to a predetermined amount or less.
Preferably, the analysis mode is switched by the analysis mode switching unit when the analysis unit is not executing the analysis. By switching the analysis mode after the analysis is reliably ended, each analysis can be reliably executed.
The trap portion may include a classifier. The classifier classifies the floating particulate matter floating in the measurement space into coarse particulate matter and fine particulate matter according to a predetermined criterion. By removing coarse particulate matter from the floating particulate matter, the fine particulate matter can be collected as a main component in the collection filter.
The analysis device may further include a calculation unit and a display unit. The calculation unit calculates the amount of collection and/or the mass concentration of the fine particulate matter based on the output signal from the collection amount measurement unit, and calculates the analysis result of the fine particulate matter based on the output signal from the analysis unit. The display unit displays the amount of trapping, the mass concentration, and/or the analysis result calculated by the calculation unit.
This makes it possible to visually confirm the amount of the collected fine particulate matter, the mass concentration, and/or the analysis result.
Another analysis method according to another aspect of the present invention is a method for analyzing fine particulate matter in an analyzer. The analysis device is provided with a trapping filter having a trapping region capable of trapping fine particulate matter. The analysis method comprises the following steps.
Trapping the fine particulate matter contained in the measurement space in a trapping region existing at the 1 st position in the longitudinal direction of the trapping filter.
Measuring the amount of the collected fine particulate matter collected in the collection area existing at the 1 st position.
The step of moving the collection area existing at the 1 st position to the 2 nd position for performing the analysis of the fine particulate matter at the position in the longitudinal direction of the collection filter by moving the collection filter in the longitudinal direction.
Analyzing the fine particulate matter trapped in the trapping region moving from the 1 st position to the 2 nd position.
The step of stopping the collection of the fine particulate matter when a reference time preset as a time for finishing the collection is reached after the collection of the fine particulate matter is started.
The step of collecting the fine particulate matter is continued until the reference time is reached.
Stopping the collection of the fine particulate matter even before the reference time is reached when it is detected that the collection amount has reached the predetermined amount.
Thus, by appropriately switching the analysis mode to either one of the 1 st analysis mode and the 2 nd analysis mode, it is possible to achieve both trapping and analysis of fine particulate matter in a balanced manner.
The present invention provides an analysis device capable of efficiently collecting and analyzing fine particulate matter at the same time.
Drawings
Fig. 1 is a diagram showing the structure of an analysis device.
Fig. 2 is a diagram showing a configuration of the control unit.
Fig. 3 is a flowchart showing an analysis operation in embodiment 1.
Fig. 4A is a timing chart (1) showing an analysis operation.
Fig. 4B is a timing chart (2) showing the analysis operation.
Fig. 4C is a timing chart (fig. 3) showing the analysis operation.
Fig. 4D is a timing chart (4) showing the analysis operation.
Fig. 5 is an example of a display screen of analysis results in the analysis device according to embodiment 1.
Fig. 6 is a flowchart showing an analysis operation in embodiment 2.
Fig. 7 is a timing chart showing an analysis operation in embodiment 2.
Description of reference numerals:
100 analysis device
1 trapping filter
11 moving part
3 a trap part
31 suction pump
33 grading device
35 discharge part
37 suction part
5 trapped amount measuring unit
51 beta ray source
53 beta ray detector
7 analysis section
71X-ray source
73 detector
9 control part
91 Command control part
911 filter movement control unit
913 the trap control unit
915 trapping amount measurement control unit
917 analysis of composition
93 analysis mode switching part
95 arithmetic unit
97 display part
99 notification unit
Atmosphere A
Detailed Description
1. Embodiment 1
(1) Structure of analyzer
The configuration of the analyzer 100 according to embodiment 1 will be described with reference to fig. 1. The analyzer 100 includes a trapping filter 1, and the trapping filter 1 is formed by laminating a trapping layer (also referred to as a trapping region) made of a porous fluororesin material having pores capable of trapping fine particulate matter FP (for example, particulate matter having a particle diameter of 2.5 μm or less) on a reinforcing layer made of a nonwoven fabric made of a polymer material (polyethylene or the like).
This allows the collection filter 1 to allow gas to flow in the thickness direction of the collection filter 1, and can improve the strength thereof. Further, since the trapping filter 1 can be made less likely to be charged, the trapped particulate matter can be prevented from being diffused by static electricity and being removed from the trapping region.
As the trapping filter 1, for example, another filter such as a 1-layer glass filter or a 1-layer filter made of a fluororesin material may be used.
The analyzer 100 includes a moving unit 11, and the moving unit 11 includes: a winding drum 11a connected to one end of the collection filter 1 in the longitudinal direction and rotating by a motor (not shown) or the like to wind the collection filter 1; the delivery drum 11b of the collection filter 1 is wound up in a state of being connected to the other end of the collection filter 1 in the longitudinal direction. The moving section 11 can move the trapping filter 1 from the delivery drum 11b to the take-up drum 11a in the longitudinal direction thereof (the direction indicated by the thick arrow in fig. 1).
In the present embodiment, the moving unit 11 moves the collection area existing at the 1 st position P1 where the fine particulate matter FP is collected by the collection filter 1 to the 3 rd position P3 which is the midpoint between the 1 st position P1 and the 2 nd position P2 (the position where the analysis of the fine particulate matter FP is performed). At the same time, the collection area present in position 3P 3 has moved to position 2P 2. That is, the amount of movement of the trapping filter 1 per time is half the distance between the 1 st position P1 and the 2 nd position P2. This enables the longitudinal region of the trapping filter 1 to be effectively used.
The analysis device 100 includes a trap unit 3, and the trap unit 3 is provided so as to correspond to the 1 st position P1 in the longitudinal direction of the trap filter 1, and traps the fine particulate matter FP contained in the atmosphere a (an example of a measurement space) in a trap area existing at the 1 st position P1. Since the fine particulate matter FP and the coarse particulate matter are usually mixed in the floating particulate matter floating in the atmosphere a, the coarse particulate matter in the atmosphere a is removed in the trap portion 3.
Specifically, the atmosphere a is taken into the classifier 33 by the suction force of the suction pump 31 and moved to the discharge unit 35. Meanwhile, coarse particulate matter having a particle diameter larger than 2.5 μm was removed from the atmosphere A, and classified atmosphere A1 in which the proportion of fine particulate matter FP (PM2.5) having a particle diameter of 2.5 μm was 50% or more was produced.
The classified atmosphere a1 is discharged from the discharge unit 35, and the fine particulate matter FP is trapped in the trapping region at the 1 st position P1 until the atmosphere passes through the trapping filter 1 and is sucked by the suction unit 37.
The collection unit 3 switches between collection and stop of the fine particulate matter FP by opening and closing the gas flow between the suction pump 31 and the suction unit 37 or by operating and stopping the suction pump 31 in response to output/output stop of a collection command described later.
The analyzer 100 includes a collected amount measuring unit 5, and the collected amount measuring unit 5 includes: a beta ray source 51 (for example, carbon 14 (b)) provided in the opening 35a of the discharge part 3514C) And a beta-ray detector 53 (e.g., a photomultiplier tube including a scintillator) provided in the opening 37a of the suction unit 37 so as to face the beta-ray source 51.
The collected amount measuring unit 5 measures the amount of the collected fine particulate matter FP collected in the measurement area at the 1 st position P1 based on the β -ray intensity (β -ray detection signal) that is emitted from the β -ray source 51 and passed through the fine particulate matter FP collected in the measurement area at the 1 st position P1 and detected by the β -ray detector 53.
The analyzer 100 includes an analyzer 7, and the analyzer 7 is provided so as to correspond to the 2 nd position P2 in the longitudinal direction of the trapping filter 1, and analyzes the fine particulate matter FP trapped in the trapping region existing at the 2 nd position P2.
In the present embodiment, the analyzer 7 analyzes the components of the fine particulate matter FP by irradiating X-rays generated from the X-ray source 71 (for example, a device that generates X-rays by irradiating a metal such as palladium with electron beams) onto the fine particulate matter FP existing at the 2 nd position P2 and measuring fluorescent X-rays generated from the fine particulate matter FP by the detector 73 (for example, a silicon semiconductor detector or a silicon drift detector).
The analyzer 100 includes a control unit 9, and the control unit 9 is a computer system having a cpu (central Processing unit), a storage device such as a RAM or a ROM, a display unit 97 (e.g., a liquid crystal display or the like) (fig. 2), various interfaces, and the like. The functions of the following components of the control unit 9 may be realized by a program that is executable by a computer system and stored in a storage device.
Specifically, as shown in fig. 2, the control unit 9 includes a control command unit 91, an analysis mode switching unit 93, a calculation unit 95, the display unit 97, and a notification unit 99. The control command unit 91 includes a filter movement control unit 911 for controlling the trapping filter 1, a trapping control unit 913 for controlling the trapping unit 3, a trapping amount measurement control unit 915 for controlling the β -ray source 51 of the trapping amount measurement unit 5, and a component analysis unit 917 for controlling the X-ray source 71 of the analysis unit 7.
The analysis mode switching unit 93 selects either one of the 1 st analysis mode and the 2 nd analysis mode as an analysis mode for analyzing the fine particulate matter FP. The 1 st analysis mode is an analysis mode in which the analysis time of the fine particulate matter FP in the analysis unit 7 is set to 1 st time (for example, 1000 seconds). On the other hand, the 2 nd analysis mode is an analysis mode in which the analysis time is set to the 2 nd time (for example, 1/2 time (500 seconds) of the 1 st time).
The calculation unit 95 calculates the amount and/or mass concentration of the collected particulate matter based on the output signal from the collected amount measurement unit 5. Further, the analysis result of the fine particulate matter FP is calculated based on the output signal from the analysis portion 7. The display unit 97 displays the collection amount, the mass concentration, and/or the analysis result calculated by the calculation unit 95. The notification unit 99 outputs a notification signal when detecting that the amount of the fine particulate matter FP collected in the collection region at the 1 st position P1 has reached a predetermined amount.
(2) Analysis actions in an analysis device
Next, an analysis operation in the analysis device 100 according to embodiment 1 will be described with reference to the flowchart of fig. 3.
After zero point correction and/or span correction is performed on the analysis device 100 as necessary, first, the analysis mode is set to the 1 st analysis mode. Subsequently, β rays are irradiated from the β -ray source 51 to the 1 st position P1, and X rays are irradiated from the X-ray source 71 to the 2 nd position P2. Further, the fine particulate matter FP starts to be collected in the collection area existing at the 1 st position P1.
Subsequently, the arithmetic unit 95 acquires the β -ray detection signal and the pulse signal output from the intensity of the fluorescent X-ray as analysis data, and calculates the amount of the collected fine particulate matter FP and the kind and amount of the elements contained in the fine particulate matter FP (step S1).
In the execution of the collection and analysis of the fine particulate matter FP, the control unit 9 determines whether or not the current time calculated by, for example, a timer function or a clock count of a clock signal is a reference time (step S2). The reference time may be arbitrarily determined based on a reference defined in each country, for example, every 1 hour, every 1 day, or the like.
When the current time is the reference time, as shown in fig. 4A, at the reference time T1, the collection of the fine particulate matter FP is stopped by the collection unit 3, and the acquisition of the analysis data is stopped by the calculation unit 95 (step S3).
Subsequently, it is determined whether or not the currently selected analysis mode is the 2 nd analysis mode (step S4), and if the currently selected analysis mode is the 1 st analysis mode, the collection and analysis of the fine particulate matter FP is resumed after the collection area is moved while maintaining the 1 st analysis mode (step S12 to step S14). Thus, the collection of the fine particulate matter FP is repeatedly performed every time the reference timing is reached, and the mass concentration of the fine particulate matter FP can be calculated. Further, the amount of the collected substance per unit time may be defined as the mass concentration.
On the other hand, when the 2 nd analysis mode is selected, it is determined whether or not the amount of fine particulate matter FP that is expected to move to the 2 nd position P2 is smaller than the predetermined amount, based on whether or not the fine particulate matter FP is continuously collected during the period from the collection start after the previous reference time arrives to the arrival of the previous reference time (step S5).
When the amount of the collected substance is equal to or larger than the predetermined amount, the analysis mode is maintained in the 2 nd analysis mode. On the other hand, when the amount of trapping is smaller than the predetermined amount, the analysis mode is switched to the 1 st analysis mode (step S6), and after the analysis mode is maintained or switched, the analysis process proceeds to steps S12 to S14.
On the other hand, when the current time is not the reference time, it is determined whether or not the collection amount of the fine particulate matter FP is detected to reach the predetermined amount, and a notification signal is output (step S7). Further, whether or not the amount of the fine particulate matter FP collected has reached the predetermined amount may be detected by whether or not the suction flow rate of the atmosphere a2 after collection by the suction pump 31 has reached the predetermined flow rate or less.
When the notification signal is not output, the collection and analysis of the fine particulate matter FP are continued (step S2). On the other hand, when the notification signal is output, the trap portion 3 stops the trapping of the fine particulate matter FP (step S8).
After the collection is stopped by the output of the notification signal, it is determined whether or not the acquisition of the analysis data from the detector 73 is continued to analyze the fine particulate matter FP (step S9). When the analysis is continued, the system stands by until the analysis is completed.
For example, as shown in fig. 4B, when the acquisition of the analysis data is continued at the time T3 at which the notification signal is output, the trapping filter 1 is not moved at the time T3, and the trapping filter 1 is moved after the time T4 at which the analysis ends, and new trapping and analysis are performed.
After the notification signal is output and the analysis to be continued is completed, the analysis mode is switched from the 1 st analysis mode to the 2 nd analysis mode (step S10).
By switching from the 1 st analysis mode to the 2 nd analysis mode, the analysis time of the fine particulate matter FP is shortened, and the collection area existing at the 1 st position P1 can be replaced with the non-collection area in a short span. As a result, even if the output frequency of the notification signal is high, it is possible to ensure a large amount of time for collecting the fine particulate matter FP, and to achieve both collection and analysis in a balanced and efficient manner. In addition, by switching the analysis mode after the 1 st analysis mode is completed, analysis before and after switching the analysis mode can be reliably performed.
After the analysis mode is switched, it is determined whether or not the analysis of the fine particulate matter FP can be ended during the period from the output of the notification signal to the next reference time (step S11).
As shown in FIG. 4C, when it is determined that the time Δ T from the time T3 at which the notification signal is output to the next reference time T1 is the time Δ T1Time 2 Δ t which is the execution time of the 2 nd analysis mode2If the analysis of the next round of the fine particulate matter FP cannot be completed by the next reference time T1, the trapping filter 1 is moved at the next reference time T1.
On the other hand, after the next reference time T1 passes, the arithmetic unit 95 starts to acquire analysis data after the collection area to be analyzed moves from the 3 rd position P3 to the 2 nd position P2 (time T2). Thereby, the next round of analysis of the fine particulate matter FP can be reliably performed.
On the other hand, as shown in FIG. 4D, at time Δ t1Is the 2 nd time Deltat2As described above, even if the next analysis is started after the trap filter 1 is moved at the time T3, when the analysis is ended at the time T7 before the next reference time T1, the trap filter 1 can be moved at the time T3 immediately after the notification signal is output. The calculation unit 95 starts the next analysis at time T6 when the movement of the trapping filter 1 is completed.
This enables the collection and analysis of the fine particulate matter FP to be started only when a short time has elapsed after the output of the notification signal.
When the current time reaches the time to move the trapping filter 1, the trapping region of the trapping filter 1 is moved in the longitudinal direction (step S12). Thereby, the trapping region existing at the 1 st position P1 is moved to the 3 rd position P3, while the non-trapping region (new trapping region) is moved to the 1 st position P1. Subsequently, the output of the notification signal is stopped (step S13).
Next, the trap portion 3 starts to trap the fine particulate matter FP in a new non-trap region that has reached the 1 st position P1. On the other hand, the arithmetic unit 95 starts acquisition of the analysis data of the fine particulate matter FP newly moved to the 2 nd position P2 (step S14).
For example, after the stop button is pressed or an abnormality of the apparatus is detected, the analysis apparatus 100 stops the above-described analysis process, and otherwise, the above-described steps S2 to S14 are repeatedly executed (step S15).
With the above-described analysis process, the analysis apparatus 100 can efficiently perform both the collection and the analysis even if the amount of the collected fine particulate matter FP varies, as shown in the example of the analysis result shown in fig. 5. In addition, meaningful analysis data can be obtained regardless of the amount of the collected fine particulate matter FP.
2. Embodiment 2
When the fine particulate matter FP is to be trapped preferentially in the trapping region, the trapping filter 1 can be moved immediately after the output of the notification signal regardless of whether the next analysis round can be completed before the next reference time.
Specifically, as shown in fig. 6, steps S1 to S10 are the same as in embodiment 1, but the trapping region is moved immediately after the switching of the analysis mode in step S10 (step S11').
Specifically, as shown in fig. 7, in embodiment 2, even at time Δ t1At time Δ t of 22If it is small, the collection filter 1 is moved from the time T3 to the time T8, the output of the notification signal is stopped at the time T8 (step S12'), and the collection of the fine particulate matter FP is performed from the time T8 to the next reference time T1.
In embodiment 2, for example, as shown in fig. 7, the time Δ T from the time T8 to the next reference time T13At time Δ t of 22If small, the collection of the fine particulate matter FP is started without starting the acquisition of the analysis data (step S14'). This makes it possible to reliably perform analysis and preferentially trap the fine particulate matter FP.
On the other hand, at slave timeTime Δ T from the moment T8 to the next reference moment T13Is the 2 nd time Deltat2In the above case, both the collection of the fine particulate matter FP and the acquisition of the analysis data are started at the time T8 (step S15').
Further, step S16 'executed after execution of step S15' is the same as step S15 of embodiment 1, and therefore, description is omitted.
3. Other embodiments
Although the present invention has been described in the embodiments, the present invention is not limited to the embodiments described above, and various modifications can be made without departing from the scope of the present invention. In particular, the plurality of embodiments and modifications described in the present specification can be arbitrarily combined as necessary.
(A) Other embodiments of analyzing actions
In the analysis device 100, the user can select which of the analysis operation in embodiment 1 and the analysis operation in embodiment 2 is to be performed.
The 1 st time and the 2 nd time may be set arbitrarily. Alternatively, only the 1 st time may be set, and the 2 nd time may be automatically determined to be 1/2, for example, of the 1 st time.
Further, the above steps S4 and S5 of the analysis operation may be omitted. Step S9 described above may be omitted.
(B) Other embodiments of the analysis section
The analyzer 7 may be configured to measure the amount of radiation emitted from the fine particulate substance FP, measure the content of carbon black as the fine particulate substance FP, measure a raman spectrum of the fine particulate substance FP, measure fourier transform infrared spectroscopy (FTIR) of the fine particulate substance FP, and the like.
(C) Other embodiments of the measurement object
The analyzer 100 may acquire exhaust gas, process gas, and the like discharged from an incineration plant or a flue of a plant, and perform mass density and component analysis of the fine particulate matter FP contained in the exhaust gas or the process gas.
Industrial applicability
The present invention can be widely applied to an analysis device that analyzes particulate matter present in a measurement space.
Claims (14)
1. An analysis apparatus, comprising:
a trapping filter having a trapping region capable of trapping fine particulate matter;
a trapping portion provided corresponding to a1 st position in a longitudinal direction of the trapping filter and configured to trap the fine particulate matter contained in the measurement space in a trapping region existing at the 1 st position;
a collected matter amount measuring unit that measures a collected amount of the fine particulate matter collected in the collection area at the 1 st position;
a moving unit that moves the trapping filter in a longitudinal direction, thereby moving the trapping region existing at the 1 st position to a2 nd position where the trapping filter is located in the longitudinal direction and the fine particulate matter is analyzed, and moving an uncaptured region where the fine particulate matter is not trapped to the 1 st position;
an analyzing section configured to perform analysis on the fine particulate matter trapped in the trapping region moved from the 1 st position to the 2 nd position, in correspondence with the 2 nd position; and
a notification unit that outputs a notification signal when it is detected that the amount of collected material has reached a predetermined amount,
the trapping unit stops the trapping of the fine particulate matter when a reference time preset as a time for finishing the trapping is reached after the trapping of the fine particulate matter is started, continues the trapping of the fine particulate matter until the reference time is reached, and stops the trapping of the fine particulate matter even before the reference time is reached when the notification signal is output.
2. The analysis device according to claim 1,
each time at the reference time instant,
the trapping portion stops trapping of the fine particulate matter, the moving portion then moves the trapping region existing at the 1 st position to the 2 nd position, while moving the non-trapping region to the 1 st position, and subsequently the trapping portion starts trapping of the fine particulate matter and the analyzing portion starts analyzing the fine particulate matter.
3. The analyzer according to claim 1 or 2, wherein when the analyzer continues the analysis of the fine particulate matter while the notification signal is output, the moving unit moves the trapping region existing at the 1 st position to the 2 nd position and moves the non-trapping region to the 1 st position at the end of the analysis.
4. The analysis device according to claim 3,
when it is determined that the analysis unit can end the next round of analysis until the next reference time from the output of the notification signal,
the moving unit moves the trapping region existing at the 1 st position to the 2 nd position immediately after the output of the notification signal, and moves the non-trapping region to the 1 st position,
the analysis unit starts the next analysis after the collection area present at the 1 st position has moved to the 2 nd position after the output of the notification signal.
5. The analysis device according to claim 3,
when it is determined that the analysis unit cannot end the next analysis round until the next reference time from the output of the notification signal,
the moving unit moves the collection area existing at the 1 st position to the 2 nd position at the next reference time, and moves the non-collection area to the 1 st position,
the analysis unit starts the next analysis after the collection area present at the 1 st position after the next reference time has moved to the 2 nd position.
6. The analyzer according to claim 3, wherein the moving unit moves the trapping region existing at the 1 st position to the 2 nd position and moves the non-trapping region to the 1 st position immediately after the output of the notification signal, regardless of whether the analyzer can end the next analysis round from the time when the notification signal is output to the next reference time.
7. The analysis device according to claim 6, wherein when it is determined that the analysis unit cannot end the next round of analysis until a next reference time from the output of the notification signal, the analysis unit does not start the next round of analysis at the time of the output of the notification signal.
8. The analyzer according to claim 1, further comprising an analysis mode switching unit configured to select, as an analysis mode for analyzing the fine particulate matter, either a1 st analysis mode in which an analysis time of the fine particulate matter in the analyzer is set to a1 st time or a2 nd analysis mode in which the analysis time of the fine particulate matter in the analyzer is set to a2 nd time shorter than the 1 st time.
9. The analysis device according to claim 8, wherein the analysis mode switching unit switches the analysis mode from the 1 st analysis mode to the 2 nd analysis mode when the notification signal is output during execution of the 1 st analysis mode.
10. The analysis device according to claim 8, wherein the analysis mode switching unit switches the analysis mode from the 2 nd analysis mode to the 1 st analysis mode when a collection area where the fine particulate matter smaller than the predetermined amount is collected moves to the 2 nd position after the predetermined amount of the fine particulate matter is analyzed in the 2 nd analysis mode.
11. The analysis device according to claim 8, wherein the switching of the analysis mode in the analysis mode switching section is performed when the analysis section is not performing analysis.
12. The analyzer according to claim 1, wherein the trap portion includes a classifier that classifies the floating particulate matter floating in the measurement space into coarse particulate matter and the fine particulate matter on a predetermined basis.
13. The analysis device according to claim 1,
further provided with:
a calculation unit that calculates the amount of collection and/or the mass concentration of the fine particulate matter based on an output signal from the collection amount measurement unit, and calculates an analysis result of the fine particulate matter based on an output signal from the analysis unit; and
and a display unit that displays the amount of trapping, the mass concentration, and/or the analysis result calculated by the calculation unit.
14. An analysis method for analyzing fine particulate matter in an analysis device provided with a trapping filter having a trapping region capable of trapping the fine particulate matter, the analysis method comprising:
a step of trapping the fine particulate matter contained in the measurement space in a trapping region present at a1 st position in a longitudinal direction of the trapping filter;
a step of measuring a trapping amount of the fine particulate matter trapped in the trapping region existing at the 1 st position;
a step of moving the trapping region existing at the 1 st position to a2 nd position in a longitudinal direction of the trapping filter and for performing analysis of the fine particulate matter by moving the trapping filter in the longitudinal direction;
analyzing the fine particulate matter trapped in the trapping region moved from the 1 st position to the 2 nd position;
stopping the collection of the fine particulate matter when a reference time preset as a time for finishing the collection is reached after the collection of the fine particulate matter is started;
continuing the collection of the fine particulate matter until the reference time is reached; and
and stopping the collection of the fine particulate matter even before the reference time is reached when it is detected that the collection amount has reached the predetermined amount.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015-242527 | 2015-12-11 | ||
JP2015242527A JP6655971B2 (en) | 2015-12-11 | 2015-12-11 | Analysis apparatus, analysis method, and program |
Publications (2)
Publication Number | Publication Date |
---|---|
CN107024365A CN107024365A (en) | 2017-08-08 |
CN107024365B true CN107024365B (en) | 2021-04-02 |
Family
ID=58773288
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201611089687.6A Active CN107024365B (en) | 2015-12-11 | 2016-11-30 | Analysis device and analysis method |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6655971B2 (en) |
CN (1) | CN107024365B (en) |
DE (1) | DE102016123704A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20200355837A1 (en) * | 2017-12-15 | 2020-11-12 | Horiba, Ltd. | Silicon drift detection element, silicon drift detector, and radiation detection device |
CN116324371A (en) * | 2020-09-25 | 2023-06-23 | 株式会社堀场制作所 | Analysis device, analysis system, analysis method, correction method, and program |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003042978A (en) * | 2001-07-30 | 2003-02-13 | Rigaku Industrial Co | X-ray fluorescent analytical equipment |
JP2003114204A (en) * | 2001-10-03 | 2003-04-18 | Canon Inc | State detection device, state detection method, scanning type analytical device and elementary analysis method |
CN1470862A (en) * | 2002-06-28 | 2004-01-28 | 株式会社堀场制作所 | Apparatus for measuring concentration of micro particle like matter and filtering band for sand measuring |
CN1539543A (en) * | 2003-04-16 | 2004-10-27 | ������������ʽ���� | Filtering membrane for traping granular substance and sampler using same and analyzer for granular substance |
CN103759988A (en) * | 2014-01-16 | 2014-04-30 | 深圳市华测检测技术股份有限公司 | Atmospheric particulate collection device |
CN104260445A (en) * | 2004-12-28 | 2015-01-07 | 纳幕尔杜邦公司 | Filtration Media For Filtering Particulate Material From Gas Streams |
CN204346781U (en) * | 2015-01-04 | 2015-05-20 | 深圳睿境环保科技有限公司 | Particulate collection pick-up unit |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005134270A (en) * | 2003-10-31 | 2005-05-26 | Horiba Ltd | Particulate matter analyzer |
JP4590367B2 (en) * | 2006-03-20 | 2010-12-01 | 株式会社堀場製作所 | Airborne particulate matter measurement filter |
JP2008261712A (en) * | 2007-04-11 | 2008-10-30 | Kimoto Denshi Kogyo Kk | System for measuring suspended particular substance |
JP2015219198A (en) * | 2014-05-20 | 2015-12-07 | 株式会社堀場製作所 | Analyzer and calibration method |
JP2015219200A (en) * | 2014-05-21 | 2015-12-07 | 株式会社堀場製作所 | Analysis device and calibration method |
JP6412340B2 (en) * | 2014-05-20 | 2018-10-24 | 株式会社堀場製作所 | Analysis apparatus and calibration method |
JP6325338B2 (en) * | 2014-05-20 | 2018-05-16 | 株式会社堀場製作所 | Analysis apparatus and calibration method |
-
2015
- 2015-12-11 JP JP2015242527A patent/JP6655971B2/en active Active
-
2016
- 2016-11-30 CN CN201611089687.6A patent/CN107024365B/en active Active
- 2016-12-07 DE DE102016123704.3A patent/DE102016123704A1/en not_active Withdrawn
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003042978A (en) * | 2001-07-30 | 2003-02-13 | Rigaku Industrial Co | X-ray fluorescent analytical equipment |
JP2003114204A (en) * | 2001-10-03 | 2003-04-18 | Canon Inc | State detection device, state detection method, scanning type analytical device and elementary analysis method |
CN1470862A (en) * | 2002-06-28 | 2004-01-28 | 株式会社堀场制作所 | Apparatus for measuring concentration of micro particle like matter and filtering band for sand measuring |
CN1539543A (en) * | 2003-04-16 | 2004-10-27 | ������������ʽ���� | Filtering membrane for traping granular substance and sampler using same and analyzer for granular substance |
CN104260445A (en) * | 2004-12-28 | 2015-01-07 | 纳幕尔杜邦公司 | Filtration Media For Filtering Particulate Material From Gas Streams |
CN103759988A (en) * | 2014-01-16 | 2014-04-30 | 深圳市华测检测技术股份有限公司 | Atmospheric particulate collection device |
CN204346781U (en) * | 2015-01-04 | 2015-05-20 | 深圳睿境环保科技有限公司 | Particulate collection pick-up unit |
Also Published As
Publication number | Publication date |
---|---|
CN107024365A (en) | 2017-08-08 |
JP6655971B2 (en) | 2020-03-04 |
JP2017106873A (en) | 2017-06-15 |
DE102016123704A1 (en) | 2017-06-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6325338B2 (en) | Analysis apparatus and calibration method | |
CN107024365B (en) | Analysis device and analysis method | |
CN100491957C (en) | Filtering membrane for trapping granular substance and sampler using same and analyzer for granular substance | |
US9460901B2 (en) | Data-processing system for chromatograph mass spectrometry | |
EP2988317A1 (en) | Mass spectrometer | |
EP2956748B1 (en) | Measurement of raman radiation | |
JP7229221B2 (en) | Techniques for Monitoring Analytical Devices Containing Multiple Liquid Chromatography Streams | |
Szlachetko et al. | Communication: The electronic structure of matter probed with a single femtosecond hard x-ray pulse | |
CN105637352A (en) | X-ray fluorescence analysis method and x-ray fluorescence analysis device | |
JP5164621B2 (en) | Mass spectrometer, mass spectrometry method, and mass spectrometry program | |
EP3030894B1 (en) | Method and portable ion mobility spectrometer for the detection of an aerosol | |
JP2015219198A (en) | Analyzer and calibration method | |
US11435286B2 (en) | Pathogen detection apparatus and pathogen detection method | |
JP6412340B2 (en) | Analysis apparatus and calibration method | |
JP2017102008A (en) | Microparticulate substance analysis device | |
JP2015219200A (en) | Analysis device and calibration method | |
WO2023197586A1 (en) | Device and method for monitoring virus in aerosol in real time by using discharge spectral imaging | |
US20080008293A1 (en) | Energy dispersion type radiation detecting system and method of measuring content of object element | |
CN111830114B (en) | Method for controlling MASS filter in mixed IMS/MS system | |
CN115298531A (en) | Diluter, analysis system and analysis method | |
JP2005134270A (en) | Particulate matter analyzer | |
CN102983056A (en) | Mass spectrum ion tuning method | |
EP3157044A1 (en) | Ms/ms-type mass spectrometry method and ms/ms-type mass spectrometer | |
JP7340511B2 (en) | Inspection method, inspection system and processing equipment | |
JP2010008176A (en) | X-ray analyzer |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |