CN106952859B - 用于处理晶片状物件的表面的装置 - Google Patents

用于处理晶片状物件的表面的装置 Download PDF

Info

Publication number
CN106952859B
CN106952859B CN201610944676.5A CN201610944676A CN106952859B CN 106952859 B CN106952859 B CN 106952859B CN 201610944676 A CN201610944676 A CN 201610944676A CN 106952859 B CN106952859 B CN 106952859B
Authority
CN
China
Prior art keywords
chuck body
chuck
series
wafer
drive ring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201610944676.5A
Other languages
English (en)
Chinese (zh)
Other versions
CN106952859A (zh
Inventor
安德烈亚斯·格雷森纳
迈克尔·布鲁格
托马斯·维恩斯贝格尔
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lam Research Corp
Original Assignee
Lam Research Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lam Research Corp filed Critical Lam Research Corp
Publication of CN106952859A publication Critical patent/CN106952859A/zh
Application granted granted Critical
Publication of CN106952859B publication Critical patent/CN106952859B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7606Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge clamping, e.g. clamping ring
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7608Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of separate clamping members, e.g. clamping fingers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23BTURNING; BORING
    • B23B31/00Chucks; Expansion mandrels; Adaptations thereof for remote control
    • B23B31/02Chucks
    • B23B31/10Chucks characterised by the retaining or gripping devices or their immediate operating means
    • B23B31/12Chucks with simultaneously-acting jaws, whether or not also individually adjustable
    • B23B31/16Chucks with simultaneously-acting jaws, whether or not also individually adjustable moving radially
    • B23B31/16004Jaws movement actuated by one or more spiral grooves
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7611Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by edge profile or support profile
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7614Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of individual support members, e.g. support posts or protrusions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7624Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23BTURNING; BORING
    • B23B2260/00Details of constructional elements
    • B23B2260/10Magnets
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T279/00Chucks or sockets
    • Y10T279/19Radially reciprocating jaws
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T279/00Chucks or sockets
    • Y10T279/19Radially reciprocating jaws
    • Y10T279/1926Spiral cam or scroll actuated

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Jigs For Machine Tools (AREA)
  • Machine Tool Units (AREA)
CN201610944676.5A 2015-11-03 2016-11-02 用于处理晶片状物件的表面的装置 Active CN106952859B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/931,577 US9887120B2 (en) 2015-11-03 2015-11-03 Apparatus for treating surfaces of wafer-shaped articles
US14/931,577 2015-11-03

Publications (2)

Publication Number Publication Date
CN106952859A CN106952859A (zh) 2017-07-14
CN106952859B true CN106952859B (zh) 2020-10-02

Family

ID=58635242

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610944676.5A Active CN106952859B (zh) 2015-11-03 2016-11-02 用于处理晶片状物件的表面的装置

Country Status (5)

Country Link
US (1) US9887120B2 (enExample)
JP (1) JP6792414B2 (enExample)
KR (1) KR102644438B1 (enExample)
CN (1) CN106952859B (enExample)
TW (1) TWI710056B (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7256728B2 (ja) * 2019-10-04 2023-04-12 株式会社荏原製作所 基板ホルダ及び基板処理装置
CN110976933B (zh) * 2019-12-10 2021-10-29 安庆师范大学 一种机械精加工用机床
JP7558043B2 (ja) * 2020-11-30 2024-09-30 株式会社Screenホールディングス 基板処理装置及び基板処理方法
TWI831361B (zh) * 2022-09-06 2024-02-01 天正國際精密機械股份有限公司 檢測元件的承載裝置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3892419A (en) * 1974-06-19 1975-07-01 Gen Motors Corp Balanced floating machine tool chuck
US6394691B1 (en) * 2000-07-21 2002-05-28 George V. Stephan Gripping apparatus
CN104160496A (zh) * 2011-09-09 2014-11-19 朗姆研究公司 用于处理晶片状物品的表面的装置

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2977128A (en) * 1959-03-19 1961-03-28 Judelshon Inc Oscar I Chuck for rotary knife cutting machine
US4222577A (en) * 1978-07-19 1980-09-16 Giffin Brian K Centering and holding devices for potter's wheelhead
AT389959B (de) 1987-11-09 1990-02-26 Sez Semiconduct Equip Zubehoer Vorrichtung zum aetzen von scheibenfoermigen gegenstaenden, insbesondere von siliziumscheiben
US5531549A (en) * 1989-07-28 1996-07-02 Great Bay Tool Corporation Auto-lock drill chuck
EP0611274B1 (de) 1993-02-08 1998-12-02 SEZ Semiconductor-Equipment Zubehör für die Halbleiterfertigung AG Träger für scheibenförmige Gegenstände
US5566466A (en) * 1994-07-01 1996-10-22 Ontrak Systems, Inc. Spindle assembly with improved wafer holder
AT405225B (de) 1995-05-02 1999-06-25 Sez Semiconduct Equip Zubehoer Vorrichtung zum behandeln annähernd runder oder kreisscheibenförmiger gegenstände, insbesondere siliziumwafer
JPH11354617A (ja) * 1998-06-10 1999-12-24 Sumiere Sez Kk 基板処理装置および基板処理方法
US6485531B1 (en) 1998-09-15 2002-11-26 Levitronix Llc Process chamber
US6827092B1 (en) * 2000-12-22 2004-12-07 Lam Research Corporation Wafer backside plate for use in a spin, rinse, and dry module and methods for making and implementing the same
JP4468775B2 (ja) * 2004-09-14 2010-05-26 大日本スクリーン製造株式会社 基板保持回転装置
ITMO20050009A1 (it) * 2005-01-19 2006-07-20 Gino Ferrari Apparato di serraggio.
JP4753832B2 (ja) 2006-10-19 2011-08-24 大日本スクリーン製造株式会社 基板回転保持装置および基板処理装置
TWI348934B (en) * 2007-08-30 2011-09-21 Lam Res Ag Apparatus for wet treatment of plate-like articles
TWI538094B (zh) * 2009-03-31 2016-06-11 蘭研究公司 用以處理盤狀物品的裝置
US9190310B2 (en) * 2010-04-16 2015-11-17 Lam Research Ag Grounded chuck
US8646767B2 (en) * 2010-07-23 2014-02-11 Lam Research Ag Device for holding wafer shaped articles
US20120152069A1 (en) * 2010-12-15 2012-06-21 Mori Seiki Co., Ltd. CNC MACHINES, ADJUSTABLE TOOLS FOR CNC MACHINES, AND METHODS of OPERATING AN ADJUSTABLE TOOL ON A CNC MACHINE
US20120305036A1 (en) * 2011-06-01 2012-12-06 Lam Research Ag Device for treating surfaces of wafer-shaped articles
TWI725067B (zh) * 2015-10-28 2021-04-21 美商應用材料股份有限公司 可旋轉靜電夾盤

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3892419A (en) * 1974-06-19 1975-07-01 Gen Motors Corp Balanced floating machine tool chuck
US6394691B1 (en) * 2000-07-21 2002-05-28 George V. Stephan Gripping apparatus
CN104160496A (zh) * 2011-09-09 2014-11-19 朗姆研究公司 用于处理晶片状物品的表面的装置

Also Published As

Publication number Publication date
US20170125281A1 (en) 2017-05-04
TWI710056B (zh) 2020-11-11
KR102644438B1 (ko) 2024-03-06
CN106952859A (zh) 2017-07-14
JP2017108115A (ja) 2017-06-15
KR20170054279A (ko) 2017-05-17
US9887120B2 (en) 2018-02-06
JP6792414B2 (ja) 2020-11-25
TW201727821A (zh) 2017-08-01

Similar Documents

Publication Publication Date Title
TWI460817B (zh) 晶圓狀物件之固持裝置
TWI538094B (zh) 用以處理盤狀物品的裝置
US10847407B2 (en) Substrate holding apparatus
CN106952859B (zh) 用于处理晶片状物件的表面的装置
TWI607523B (zh) 基板處理裝置
US10121692B2 (en) Substrate holding apparatus
KR102100518B1 (ko) 웨이퍼 형상 물체의 표면을 처리하는 디바이스 및 이 디바이스에서 사용되는 그립핑 핀
TW201838087A (zh) 基板保持旋轉裝置及具備其之基板處理裝置、以及基板處理方法
TW201810524A (zh) 雙層式的膠帶框架的清洗組件
US20170256436A1 (en) Wafer handling assembly
JP2015188010A (ja) 基板処理装置
JP6294121B2 (ja) 基板処理装置
JP2017108115A5 (enExample)
JP7128713B2 (ja) 基板保持装置、および該基板保持装置を動作させる方法
JP2015188009A (ja) 基板処理装置
TWI910536B (zh) 基板保持裝置及具備其之基板處理裝置
CN119230446A (zh) 基板处理装置

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant