CN106908716A - 一种用于线性传感器的测试方法 - Google Patents
一种用于线性传感器的测试方法 Download PDFInfo
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- CN106908716A CN106908716A CN201710176066.XA CN201710176066A CN106908716A CN 106908716 A CN106908716 A CN 106908716A CN 201710176066 A CN201710176066 A CN 201710176066A CN 106908716 A CN106908716 A CN 106908716A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2837—Characterising or performance testing, e.g. of frequency response
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Abstract
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Priority Applications (1)
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CN201710176066.XA CN106908716B (zh) | 2017-03-23 | 2017-03-23 | 一种用于线性传感器的测试方法 |
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CN201710176066.XA CN106908716B (zh) | 2017-03-23 | 2017-03-23 | 一种用于线性传感器的测试方法 |
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CN106908716A true CN106908716A (zh) | 2017-06-30 |
CN106908716B CN106908716B (zh) | 2019-05-31 |
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Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07162762A (ja) * | 1993-12-02 | 1995-06-23 | Sony Tektronix Corp | しきい値算出装置 |
JPH11111795A (ja) * | 1997-10-07 | 1999-04-23 | Ricoh Co Ltd | 撮像素子の検査装置 |
CN1295255A (zh) * | 1999-10-27 | 2001-05-16 | 三洋电机株式会社 | 影像信号处理装置及像素缺陷的检测方法 |
CN101000881A (zh) * | 2006-01-09 | 2007-07-18 | 三星电子株式会社 | 图像传感器测试方法和装置 |
CN101210890A (zh) * | 2006-12-28 | 2008-07-02 | 夏普株式会社 | 缺陷检测装置及方法、图像传感器器件和模块 |
US20090011524A1 (en) * | 2007-07-06 | 2009-01-08 | Advanced Micro Devices, Inc. | Method for determining suitability of a resist in semiconductor wafer fabrication |
CN101365050A (zh) * | 2007-08-06 | 2009-02-11 | 联发科技股份有限公司 | 检测与校正缺陷像素的方法及装置 |
JP2009079983A (ja) * | 2007-09-26 | 2009-04-16 | Seiko Epson Corp | 点欠陥検出装置、および点欠陥検出方法 |
CN101895786A (zh) * | 2010-07-15 | 2010-11-24 | 杭州海康威视软件有限公司 | 一种图像传感器的检测方法及装置 |
CN101952949A (zh) * | 2007-11-28 | 2011-01-19 | 豪威科技有限公司 | 一种检测图像传感器晶片中像素缺陷的装置和方法 |
CN103444164A (zh) * | 2010-12-21 | 2013-12-11 | 立那工业股份有限公司 | 垂直结构的被动像素阵列及其制造方法 |
CN103558543A (zh) * | 2013-11-20 | 2014-02-05 | 太仓思比科微电子技术有限公司 | 一种对cis芯片的量产测试方法 |
US20160064450A1 (en) * | 2014-08-26 | 2016-03-03 | Renesas Electronics Corporation | Manufacturing method of semiconductor device |
CN105424324A (zh) * | 2015-12-17 | 2016-03-23 | 哈尔滨工业大学 | 一种用于对cmos图像传感器进行非线性参数实时测试的装置 |
-
2017
- 2017-03-23 CN CN201710176066.XA patent/CN106908716B/zh active Active
Patent Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07162762A (ja) * | 1993-12-02 | 1995-06-23 | Sony Tektronix Corp | しきい値算出装置 |
JPH11111795A (ja) * | 1997-10-07 | 1999-04-23 | Ricoh Co Ltd | 撮像素子の検査装置 |
CN1295255A (zh) * | 1999-10-27 | 2001-05-16 | 三洋电机株式会社 | 影像信号处理装置及像素缺陷的检测方法 |
CN101000881A (zh) * | 2006-01-09 | 2007-07-18 | 三星电子株式会社 | 图像传感器测试方法和装置 |
CN101210890A (zh) * | 2006-12-28 | 2008-07-02 | 夏普株式会社 | 缺陷检测装置及方法、图像传感器器件和模块 |
US20090011524A1 (en) * | 2007-07-06 | 2009-01-08 | Advanced Micro Devices, Inc. | Method for determining suitability of a resist in semiconductor wafer fabrication |
CN101365050A (zh) * | 2007-08-06 | 2009-02-11 | 联发科技股份有限公司 | 检测与校正缺陷像素的方法及装置 |
JP2009079983A (ja) * | 2007-09-26 | 2009-04-16 | Seiko Epson Corp | 点欠陥検出装置、および点欠陥検出方法 |
CN101952949A (zh) * | 2007-11-28 | 2011-01-19 | 豪威科技有限公司 | 一种检测图像传感器晶片中像素缺陷的装置和方法 |
CN101895786A (zh) * | 2010-07-15 | 2010-11-24 | 杭州海康威视软件有限公司 | 一种图像传感器的检测方法及装置 |
CN103444164A (zh) * | 2010-12-21 | 2013-12-11 | 立那工业股份有限公司 | 垂直结构的被动像素阵列及其制造方法 |
CN103558543A (zh) * | 2013-11-20 | 2014-02-05 | 太仓思比科微电子技术有限公司 | 一种对cis芯片的量产测试方法 |
US20160064450A1 (en) * | 2014-08-26 | 2016-03-03 | Renesas Electronics Corporation | Manufacturing method of semiconductor device |
CN105424324A (zh) * | 2015-12-17 | 2016-03-23 | 哈尔滨工业大学 | 一种用于对cmos图像传感器进行非线性参数实时测试的装置 |
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Publication number | Publication date |
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CN106908716B (zh) | 2019-05-31 |
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Effective date of registration: 20190426 Address after: 518000 No. 3039 Baoan North Road, Luohu District, Shenzhen, Guangdong. Applicant after: Zhao Jie Address before: Room 5, No. 10-1 Xinjingzhong Road, Tang City, Yangshe Town, Zhangjiagang City, Suzhou City, Jiangsu Province Applicant before: Zhangjiagang Ou micro automation R & D Co., Ltd. |
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Effective date of registration: 20220615 Address after: 518100 rooms 805-806, 813-816 and 818-830, building 4, tus Xiexin, No. 333, Longfei Avenue, huanggekeng community, Longcheng street, Longgang District, Shenzhen City, Guangdong Province Patentee after: SHENZHEN HAINA MICROSENSOR TECHNOLOGY Co.,Ltd. Address before: 518000 No. 3039 Baoan North Road, Luohu District, Shenzhen, Guangdong. Patentee before: Zhao Jie |
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