CN106908002A - 一种基于光谱干涉装置的测量方法 - Google Patents
一种基于光谱干涉装置的测量方法 Download PDFInfo
- Publication number
- CN106908002A CN106908002A CN201710257791.XA CN201710257791A CN106908002A CN 106908002 A CN106908002 A CN 106908002A CN 201710257791 A CN201710257791 A CN 201710257791A CN 106908002 A CN106908002 A CN 106908002A
- Authority
- CN
- China
- Prior art keywords
- measured
- birefringece crystal
- light source
- polarizer
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003595 spectral effect Effects 0.000 title claims abstract description 17
- 238000000034 method Methods 0.000 title claims abstract description 11
- 239000013078 crystal Substances 0.000 claims abstract description 45
- 238000005259 measurement Methods 0.000 claims abstract description 11
- 238000012545 processing Methods 0.000 claims abstract description 9
- 238000001228 spectrum Methods 0.000 claims description 14
- 230000009466 transformation Effects 0.000 claims description 9
- 230000035945 sensitivity Effects 0.000 claims description 8
- 230000010287 polarization Effects 0.000 abstract description 18
- 230000003287 optical effect Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000005457 optimization Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 230000033228 biological regulation Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710257791.XA CN106908002B (zh) | 2017-04-19 | 2017-04-19 | 一种基于光谱干涉装置的测量方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710257791.XA CN106908002B (zh) | 2017-04-19 | 2017-04-19 | 一种基于光谱干涉装置的测量方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106908002A true CN106908002A (zh) | 2017-06-30 |
CN106908002B CN106908002B (zh) | 2019-10-01 |
Family
ID=59209605
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201710257791.XA Expired - Fee Related CN106908002B (zh) | 2017-04-19 | 2017-04-19 | 一种基于光谱干涉装置的测量方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN106908002B (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107228828A (zh) * | 2017-07-14 | 2017-10-03 | 济南快谱光电技术有限公司 | 晶体光学均匀性的测试方法及其检测装置 |
CN108613794A (zh) * | 2018-07-11 | 2018-10-02 | 安徽光纤光缆传输技术研究所(中国电子科技集团公司第八研究所) | 光缆跳线头内部光纤断点的光谱测量装置和方法 |
CN114964157A (zh) * | 2022-04-26 | 2022-08-30 | 深圳市深视智能科技有限公司 | 倾角测量探头及测量装置 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2254421A (en) * | 1991-04-03 | 1992-10-07 | Otsuka Denshi Kk | Polarimetric measurement of liquid crystal cell thickness |
CN1350155A (zh) * | 2001-11-30 | 2002-05-22 | 中国科学院上海光学精密机械研究所 | 光学波片的检测仪 |
JP2005283534A (ja) * | 2004-03-31 | 2005-10-13 | Seiko Epson Corp | 垂直配向液晶パネルのセル厚測定方法、及び測定装置 |
CN2804796Y (zh) * | 2005-06-07 | 2006-08-09 | 天津市港翼科技发展有限公司 | 自动椭圆偏振测厚仪 |
CN103983609A (zh) * | 2014-05-12 | 2014-08-13 | 复旦大学 | 基于光谱干涉的透明材料折射率及厚度测量装置和测量方法 |
-
2017
- 2017-04-19 CN CN201710257791.XA patent/CN106908002B/zh not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2254421A (en) * | 1991-04-03 | 1992-10-07 | Otsuka Denshi Kk | Polarimetric measurement of liquid crystal cell thickness |
CN1350155A (zh) * | 2001-11-30 | 2002-05-22 | 中国科学院上海光学精密机械研究所 | 光学波片的检测仪 |
JP2005283534A (ja) * | 2004-03-31 | 2005-10-13 | Seiko Epson Corp | 垂直配向液晶パネルのセル厚測定方法、及び測定装置 |
CN2804796Y (zh) * | 2005-06-07 | 2006-08-09 | 天津市港翼科技发展有限公司 | 自动椭圆偏振测厚仪 |
CN103983609A (zh) * | 2014-05-12 | 2014-08-13 | 复旦大学 | 基于光谱干涉的透明材料折射率及厚度测量装置和测量方法 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107228828A (zh) * | 2017-07-14 | 2017-10-03 | 济南快谱光电技术有限公司 | 晶体光学均匀性的测试方法及其检测装置 |
CN108613794A (zh) * | 2018-07-11 | 2018-10-02 | 安徽光纤光缆传输技术研究所(中国电子科技集团公司第八研究所) | 光缆跳线头内部光纤断点的光谱测量装置和方法 |
CN114964157A (zh) * | 2022-04-26 | 2022-08-30 | 深圳市深视智能科技有限公司 | 倾角测量探头及测量装置 |
CN114964157B (zh) * | 2022-04-26 | 2023-11-17 | 深圳市深视智能科技有限公司 | 倾角测量探头及测量装置 |
Also Published As
Publication number | Publication date |
---|---|
CN106908002B (zh) | 2019-10-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN102183360B (zh) | 光学偏振器件偏振消光比的检测方法和检测装置 | |
CN105628343B (zh) | 一种波片检测装置及方法 | |
CN106546411B (zh) | 基于Mach-Zehnder和Michelson干涉仪的保偏光纤Verdet常数测量装置及方法 | |
CN105841928B (zh) | 一种光纤偏振器件的高消光比测量方法 | |
CN105588661B (zh) | 一种利用保偏光纤光栅实现单点及区域温度同时测量的装置 | |
US20060170921A1 (en) | Spectroscopic polarimetry | |
CN106441353B (zh) | 一种光纤陀螺环偏振耦合的对称性评估装置 | |
US6473181B1 (en) | Measurement of waveplate retardation using a photoelastic modulator | |
CN103900680B (zh) | 一种利用光源抑制偏振串音测量噪声的装置及检测方法 | |
CN103712781B (zh) | 双折射光楔光轴方向的多入射角偏振干涉测量装置及方法 | |
JP2008500536A (ja) | 寄生反射を低減する光呼掛け装置および寄生反射を除去する方法 | |
CN106908002A (zh) | 一种基于光谱干涉装置的测量方法 | |
US6678433B2 (en) | Apparatus and method for measuring residual stress and photoelastic effect of optical fiber | |
US7271916B2 (en) | Characterization of optical fiber using Fourier domain optical coherence tomography | |
CN102620907B (zh) | 一种测量光学器件相位延迟角度的方法 | |
EP2078944A2 (en) | Apparatus for measuring residual stress of optical fiber | |
CN107314888B (zh) | 多功能铌酸锂集成器件的偏振性能测量方法 | |
CN114324247A (zh) | 基于量子弱测量的双通道探测的光学测量方法及应用 | |
CN102706809A (zh) | 线性双折射测量装置和测量方法 | |
CN106813901B (zh) | 光学器件相位延迟量的测量装置及其测量方法 | |
CN107121077B (zh) | 一种基于光谱干涉装置的测量系统 | |
CN102636333B (zh) | 波片相位延迟量与快轴方位角的实时测量装置和方法 | |
CN103363905A (zh) | 一种基于光谱分析的保偏光纤长度测量系统及其方法 | |
US20080079941A1 (en) | Differential Geomety-Based Method and Apparatus for Measuring Polarization Mode Dispersion Vectors in Optical Fibers | |
CN103792405A (zh) | 微组装准互易反射式光波导电场或电压传感头 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20190820 Address after: 225300 Hailing Industrial Park, Taizhou City, Jiangsu Province, No. 12 Applicant after: Taizhou law Photoelectric Technology Co.,Ltd. Address before: Room 5, No. 10-1 Xinjingzhong Road, Tang City, Yangshe Town, Zhangjiagang City, Suzhou City, Jiangsu Province Applicant before: ZHANGJIAGANG OUWEI AUTOMATION RESEARCH AND DEVELOPMENT Co.,Ltd. |
|
GR01 | Patent grant | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20220927 Address after: 201306 building C, 888 Huanhu West 2nd Road, Lingang New District, Pudong New Area, Shanghai Patentee after: Shanghai paipin Photoelectric Technology Co.,Ltd. Address before: No. 12, hailing Industrial Park, Taizhou, Jiangsu Province, Jiangsu Patentee before: Taizhou law Photoelectric Technology Co.,Ltd. |
|
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20191001 |