CN106886501A - A kind of method of the MTP fast writings of pipeline-type - Google Patents

A kind of method of the MTP fast writings of pipeline-type Download PDF

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Publication number
CN106886501A
CN106886501A CN201710001807.0A CN201710001807A CN106886501A CN 106886501 A CN106886501 A CN 106886501A CN 201710001807 A CN201710001807 A CN 201710001807A CN 106886501 A CN106886501 A CN 106886501A
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CN
China
Prior art keywords
data
mtp
burning
writings
fast
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710001807.0A
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Chinese (zh)
Inventor
黎永健
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chipsea Technologies Shenzhen Co Ltd
Original Assignee
Chipsea Technologies Shenzhen Co Ltd
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Filing date
Publication date
Application filed by Chipsea Technologies Shenzhen Co Ltd filed Critical Chipsea Technologies Shenzhen Co Ltd
Priority to CN201710001807.0A priority Critical patent/CN106886501A/en
Publication of CN106886501A publication Critical patent/CN106886501A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38Information transfer, e.g. on bus
    • G06F13/40Bus structure
    • G06F13/4063Device-to-bus coupling
    • G06F13/4068Electrical coupling
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38Information transfer, e.g. on bus
    • G06F13/42Bus transfer protocol, e.g. handshake; Synchronisation
    • G06F13/4282Bus transfer protocol, e.g. handshake; Synchronisation on a serial bus, e.g. I2C bus, SPI bus
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00Arrangements for software engineering
    • G06F8/60Software deployment
    • G06F8/61Installation
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2213/00Indexing scheme relating to interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F2213/0002Serial port, e.g. RS232C

Abstract

The invention discloses a kind of method of the MTP fast writings of pipeline-type, using a data lines and a clock line, data interaction is carried out with serial manner, the method treats the data of burning by external clock CLK and data DATA serial inputs first, treating the data buffer storage of burning in internal buffer, MTP needs the data of burning from buffer receive data evidence.The present invention realizes method and can reduce the call duration time of transmission order, address and data, and the test of other modules can be synchronously carried out during MTP burnings, saves burning and the testing time of whole chip.

Description

A kind of method of the MTP fast writings of pipeline-type
Technical field
The invention belongs to the technical field of integrated circuit, more particularly to the burning side of the memory element that can repeatedly program Method.
Background technology
MTP(Multiple-Time Programmable:Time-after-time programmable memory ") be at present one in programming technique Plant and apply more extensive memory, it is typically what is applied with reference to MCU memories.
As MTP memory areas increasingly connect small, and the advantage that can repeatedly program, MCU memories are widely used in, And DRAM and SRAM mass storages are backed up.The capacity of MTP is also increasing, and the time of burning will necessarily be increasingly It is long, then to improve the quantity of CD writers burning simultaneously, equivalent to the cost for reducing user.
For using MTP as the MCU of memory, it is necessary to a burning interface.Can burning simultaneously in order to improve CD writers The quantity of MCU, it is general to use a data lines and a clock line, data interaction is carried out with serial manner, such as the institute of accompanying drawing 1 Show, CD writers by power vd D, (VSS), tetra- lines of clock CLK and data DATA, communicated with MCU, complete burning and Read data., it is necessary to first send order, address and data when CD writers carry out burning, could start after MCU receives these Burning, receives order, address and data and takes certain hour.
The content of the invention
To solve the above problems, it is an object of the invention to provide a kind of method of the MTP fast writings of pipeline-type, should Method can reduce the call duration time for sending order, address and data, and other moulds can be synchronously carried out during MTP burnings The test of block, saves burning and the testing time of whole chip.
It is another object of the present invention to provide a kind of method of the MTP fast writings of pipeline-type, the method can be with Using existing digital integrated electronic circuit, it is easy to accomplish, control is simple, and cost of implementation is cheap.
To achieve the above object, technical scheme is as follows.
The method of the MTP fast writings of a kind of pipeline-type, using a data lines and a clock line, with serial side Formula carries out data interaction, it is characterised in that the method treats burning by external clock CLK and data DATA serial inputs first Data, treating the data buffer storage of burning in internal buffer, MTP needs the data of burning from buffer receive data evidence.
In order to support can be carried out during MTP burnings the test of other modules, the present invention also proposes a kind of specific logical Letter agreement makes the test between each module not interfere with each other mutually to the transmission of burning data.Specifically its feature of communication protocol exists In include command bit (CMD), state (STATUS), data (DATA), verification (CRC).
Further, shown CMD orders include configuration address, read MTP, write internal buffer, RAMBIST, SCAN test, The order, CD writers such as OSC tests and RESET are ordered no matter what sends, and can obtain inner buffer number to control feeding Data.CRC (verification) is used for ensureing communication.
Further, current operation will not be stopped because other orders are input into after each order is opened, except non-input RESET Order, all tests will be stopped.
Further, STATUS needs to reflect the Pass/Fail marks of current test event, Done marks and writes in MTP The number of portion's caching.
Further, the method also includes interrupt mechanism:Data DATA line has internal pull-up resistor, when internal buffer is low In after certain byte number, in the non-communicating stage, 0 and 1 level is ceaselessly sent, wherein 0 level is by chip internal phase inverter Output, 1 level is that inside does not drive, and 1 is put by internal pull-up resistor.
Further, the method also includes Busy testing mechanisms:CD writers transmit data, it is necessary to detect PAD, if detection To low level, represent that this stage is chip Busy stages or output stage, it is impossible to transmit data, after high level is detected Can start to transmit data.
The MTP fast writing methods based on streamline that the present invention is realized, can reduce transmission order, address and data Call duration time, and the test of other modules can be synchronously carried out during MTP burnings, save the burning and survey of whole chip The examination time.
Brief description of the drawings
Fig. 1 is the burning interface diagram that prior art is implemented.
Fig. 2 is the communications protocol format schematic diagram that the present invention is implemented.
Fig. 3 be the present invention realized with pull-up resistor when communications protocol structure chart.
Fig. 4 is the structure chart that the present invention realizes burning module.
Specific embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, it is right below in conjunction with drawings and Examples The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and It is not used in the restriction present invention.
It is MTP method for burn-recording of the institute of the invention realization based on streamline, using a data lines and a clock line, with string Capable mode carries out data interaction, treats the data of burning by external clock CLK and data DATA serial inputs first, waiting to burn To in internal buffer, MTP needs the data of burning from buffer receive data evidence to the data buffer storage of record.
Wherein, the method is incorporated into specific communication protocol, it is desirable to which the test between each module does not interfere with each other mutually, Ke Yijin Row concurrent testing.Specific communication protocol it is characterized in that include command bit (CMD), state (STATUS), data (DATA), Verification (CRC).As shown in Fig. 2 specifying that CMD is 6Bit in following example, 64 instructions are supported, STATUS is 8Bit, data DATA is 16Bit, and communications protocol format is as shown in Table 1 below.CMD instructions include configuration address, read MTP, write internal slow substantially The orders such as storage, RAMBIST, SCAN test, OSC tests, test result query statement and RESET.After each order unlatching not Current operation can be stopped because of other orders of input, except non-input RESET orders, all tests will be stopped.STATUS It is 8Bit, specific data form is as shown in table 1.
Table 1
Wherein, BIT7 is OSC_EN, and representing internal equal to 1 is carrying out OSC tests, terminates equal to 0 expression OSC tests.
BIT6 is SCAN_EN, and representing internal equal to 1 is carrying out SCAN tests, is over equal to 0 expression SCAN tests.
BIT5 is RAMBIST_EN, and representing internal equal to 1 is carrying out RAMBIST tests, represents that RAMBIST is tested equal to 0 It is over.
BIT4 is MTP_WR, and representing internal equal to 1 is carrying out MTP write operations, represents MTP write operations after tested equal to 0.
BIT3-BIT0 is the number for representing remaining MTP cachings to be written.
BIT4~BIT7 can be 1 with one or more, when multiple for 1 expression is carrying out concurrent testing.Each test As a result Pass or Fail, is inquired about by test result instruction.
Data DATA line is, it is necessary to be designed to internal pull-up, pull-up resistor design example uses 30K ohm.Work as internal damping Device, in the non-communicating stage, ceaselessly sends 0 and 1 level less than after 2 bytes, and the duration of 0 and 1 level requires more than one Fix time, be in this example 100us, as shown in Figure 3.Wherein 0 level is exported by chip internal phase inverter, 1 level It is that inside does not drive, 1 is put by internal pull-up resistor, it is a slow process for rising to jump to 1 from 0.External burning device is detected There is 0 and 1 saltus step on to data DATA line, represent inner buffer early warning.Cd-rom recorder sends writes internal buffer order feeding data. CD writers detect DATA line for 0 when, it is impossible to send order, CD writers transmission data, it is necessary to detect PAD, if detected low Level, represents that this stage is chip Busy stages or output stage, it is impossible to transmit data, can just be opened after high level is detected Begin transmission data.
Shown in Fig. 4, burning module includes command analysis, data transmit-receive module and parallel control module, wherein command analysis Module is mainly responsible for order and the parsing of state, and transmitting-receiving control is carried out according to different orders.If writing internal buffer Instruction, then the data of feeding are stored in internal buffer;If setting address instruction, then the data of feeding are control MTP Read/write address.Parallel control module, 4 kinds of tests are tested to OSC tests, SCAN tests, RAMBIST tests and MTP write operations Parallel state control is carried out, unaffected each other, every kind of test can produce respective complement mark and Pass/Fail to mark Will.Cd-rom recorder can read 4 kinds of marks of test by test result query statement.
Buffer Buffer and MTP Read-write Catrol modules, complete the management to buffer Buffer, and during MTP read-writes The generation of sequence, after buffer Buffer is less than two bytes, produces a pre-warning mark to send 0 and 1 for data transmit-receive module The interrupt mechanism of level;RAMBIST modules, OSC_TEST modules and SCAN_TEST modules control RAMBIST to test respectively, OSC Test and the sequential of SCAN tests, output complement mark and Pass/Fail indicate.
Because the time of one byte of MTP burnings is more long, typically can be in 0.4ms, after a MTP burnings complete data, can Reading next byte from buffer with horse back carries out burning.Life is consumed when as a whole, except first character section burning Make, the call duration time of address and data, other bytes all do not consume call duration time.After buffer has put enough data, can To test other modules parallel, the testing time of whole chip is saved.
Presently preferred embodiments of the present invention is the foregoing is only, is not intended to limit the invention, it is all in essence of the invention Any modification, equivalent and improvement made within god and principle etc., should be included within the scope of the present invention.

Claims (7)

1. a kind of method of the MTP fast writings of pipeline-type, using a data lines and a clock line, uses serial manner Carry out data interaction, it is characterised in that the method treats the number of burning by external clock CLK and data DATA serial inputs first According to treating the data buffer storage of burning in internal buffer, MTP needs the data of burning from buffer receive data evidence.
2. the method for the MTP fast writings of pipeline-type as claimed in claim 1, it is characterised in that the method is by specific Communication protocol to burning data transmission, the specific communication protocol include have command bit (CMD), state (STATUS), Data (DATA), verification (CRC).
3. the method for the MTP fast writings of pipeline-type as claimed in claim 2, it is characterised in that shown CMD orders include Configuration address, read MTP, write internal buffer, RAMBIST, SCAN test, OSC tests and the order such as RESET, CRC is used for ensureing Communication.
4. the method for the MTP fast writings of pipeline-type as claimed in claim 3, it is characterised in that each order open after not Current operation can be stopped because of other orders of input, except non-input RESET orders, all tests will be stopped.
5. the method for the MTP fast writings of pipeline-type as claimed in claim 2, it is characterised in that STATUS needs reflection to work as The Pass/Fail marks of preceding test event, Done indicate and write the number of MTP inner buffers.
6. the method for the MTP fast writings of pipeline-type as claimed in claim 2, it is characterised in that during the method is also included Off line system:Data DATA line has internal pull-up resistor, after internal buffer is less than certain byte number, in the non-communicating stage, no The level of transmission 0 and 1 for stopping, wherein 0 level is exported by chip internal phase inverter, 1 level is that inside does not drive, by inside Pull-up resistor puts 1.
7. the method for the MTP fast writings of pipeline-type as claimed in claim 2, it is characterised in that the method is also included Busy testing mechanisms:CD writers transmit data, it is necessary to detect PAD, if detecting low level, represent that this stage is chip Busy Stage or output stage, it is impossible to transmit data, could start to transmit data after high level is detected.
CN201710001807.0A 2017-01-03 2017-01-03 A kind of method of the MTP fast writings of pipeline-type Pending CN106886501A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113035267A (en) * 2021-03-25 2021-06-25 长江存储科技有限责任公司 Semiconductor testing device, data processing method, equipment and storage medium

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105843768A (en) * 2016-04-20 2016-08-10 芯海科技(深圳)股份有限公司 Single-wire communication MTP (multiple-time programmable) burn protocol and burn device based on same
CN106201962A (en) * 2016-07-08 2016-12-07 深圳市博巨兴实业发展有限公司 A kind of can be as the high pressure burning I/O circuit of GPIO

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105843768A (en) * 2016-04-20 2016-08-10 芯海科技(深圳)股份有限公司 Single-wire communication MTP (multiple-time programmable) burn protocol and burn device based on same
CN106201962A (en) * 2016-07-08 2016-12-07 深圳市博巨兴实业发展有限公司 A kind of can be as the high pressure burning I/O circuit of GPIO

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113035267A (en) * 2021-03-25 2021-06-25 长江存储科技有限责任公司 Semiconductor testing device, data processing method, equipment and storage medium

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Application publication date: 20170623