CN106847954A - A kind of self-driven solar blind UV electric explorer face battle arrays of vertical stratification ZnMgO and preparation method thereof - Google Patents

A kind of self-driven solar blind UV electric explorer face battle arrays of vertical stratification ZnMgO and preparation method thereof Download PDF

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CN106847954A
CN106847954A CN201710039053.8A CN201710039053A CN106847954A CN 106847954 A CN106847954 A CN 106847954A CN 201710039053 A CN201710039053 A CN 201710039053A CN 106847954 A CN106847954 A CN 106847954A
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郑清洪
陈礼辉
黄六莲
欧阳新华
杨海洋
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Fujian Agriculture and Forestry University
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Abstract

The present invention discloses self-driven solar blind UV electric explorer face battle arrays of a kind of vertical stratification ZnMgO and preparation method thereof, specifically refers to grow on a transparent substrate the doping Zn of one layer of ultra-wide band gap, high carrier concentrationxMg1‑xO films are used as electrically conducting transparent Window layer;One layer of regrowth day blind band gap, the doping Zn of low carrier concentrationyMg1‑yO films are used as n-layer;And then grow layer of NizMg1‑zO films are used as p-type layer;Etch away sections p-type layer and n-layer, exposed portion electrically conducting transparent Window layer;N-shaped annular common electrode is prepared in the electrically conducting transparent Window layer exposed, p-type array electrode is prepared in p-type layer;It is final to obtain the self-driven solar blind UV electric explorer face battle arrays of vertical stratification ZnMgO.The present invention utilizes ZnyMg1‑yO/NizMg1‑zO heterogenous pn junctions realize the self-driven detection of day blind UV signal;The photoelectric properties of device are greatly improved using the bright conducting window layer of ultra wide band effusion;Detector is vertical stratification, can realize the preparation of face battle array by preparing common electrode and array electrode, and be applied to the imaging and tracking of day blind UV signal.

Description

A kind of self-driven solar blind UV electric explorer face battle arrays of vertical stratification ZnMgO and its system Preparation Method
Technical field
The present invention relates to a kind of solar blind UV electric explorer face battle array and preparation method thereof, more particularly, to a kind of vertical junction Self-driven solar blind UV electric explorer face battle arrays of structure ZnMgO and preparation method thereof.
Background technology
Atmosphere claims to the light that the sunshine of 200-280 nm ultraviolet bands has strong absorption, 200-280nm wave bands It is solar blind UV.The detection that is absorbed as artificial day blind UV signal of the atmosphere to solar blind UV provides a kind of natural low Backdrop window.Solar blind UV electric explorer refers to have characteristic response to the solar blind light of 200-280nm, and to 280-800nm Ultraviolet light and the ultraviolet detector that is not responding to of visible ray(Rikiya Suzuki, Shinji Nakagomi, and Yoshihiro Kokubuna, Appllied Physics Letters, 2011, 98:131114).At present, day is blind ultraviolet Detector has been widely used in the fields such as missile warning, high-voltage line corona detection, medical diagnosis, near-earth secure communication.
In recent years, ZnMgO alloy firms are widely used in various types of solar blind UV transmission photodetector unit devices Preparation, including metal-semiconductor-metal solar blind UV electric explorer(Z. G. Ju, C. X. Shan, D. Y. Jiang, J. Y. Zhang, B. Yao, D. X. Zhao, D. Z. Shen and X. W. Fan, Applied Physics Letters, 2008, 93:173505)With Schottky diode structure solar blind UV electric explorer(H. Endo, M. Sugibuchi, K. Takahashi, S. Goto, K. Hane and Y. Kashiwaba, physica status solidi (c), 2008, 5:3119).However, the detector of both structures, due to the problem of electrode connection, It is not suitable for the preparation of face battle array device, the report of the ZnMgO solar blind ultraviolet detectors face battle array device of current few both structures Road.
P-n junction diode feature detector has vertical stratification and self-driven characteristic.On the one hand, vertical stratification is applied to Integrated photodetector array, this is necessary photoelectric imaging technology;On the other hand, self-driven performance photodiode can be with Driven without external power source, with good adaptability and sustainability(Hongyu Chen, Kewei Liu, Linfeng Hu, Ahmed A. Al-Ghamdi and Xiaosheng Fang, Materials Today, 2015, 18:493).Cause This is expected to prepare high performance solar blind UV electric explorer face battle array device.However, how to prepare the p-type zno-based material of stabilization Material is still a larger problem(J. S. Liu, C. X. Shan, H. Shen, B. H. Li, Z. Z. Zhang, L. Liu, L. G. Zhang, and D. Z. Shen, Applied Physics Letters, 2012, 101: 011106).
The NiMgO ternary alloy films of undoped, due to the presence in Ni rooms, show p-type electric-conducting characteristic(Yanmin Guo, Liping Zhua, Jie Jiang, Yaguang Li, Liang Hu, Hongbin Xu, Zhizhen Ye, Thin Solid Films, 2014, 558:311).Therefore, researcher prepares n-Zn in the recent period0.8Mg0.2O/p- Ni0.8Mg0.2O heterogenous pn junctions(Yan-Min Guo,Li-Ping Zhu, Wen-Zhe Niu, Xiang-Yu Zhang and Zhi-Zhen Ye, Applied physics A, 2014, 118:239).By properly increasing ZnyMg1-yO and NizMg1-zO Mg components in alloy firm(1-y)With(1-z), the band gap width of this double-layer films can be increased, make their energy gap Reach non-solar-blind band, it is possible to prepare the solar blind UV electric explorer of the heterogeneous pn vertical stratifications of n-ZnMgO/p-NiMgO.
Additionally, it is also well known that increase of the ZnMgO ternary alloy films with Mg components, its carrier concentration rapid decrease, Therefore its electric conductivity reduction(J.S. Liu, C.X.Shan, S.P.Wang, B.H.Li, Z.Z Zhang and D.Z.Shen, Journal of Crystal Growth, 2012, 347:95).By adding ultra-wide band gap, high carrier The doping Zn of concentrationxMg1-xO films can effectively improve the collection efficiency of photo-generated carrier as electrically conducting transparent Window layer, significantly The performance of enhancing face battle array device.
Therefore, using n-ZnyMg1-yO/p-NizMg1-zThe self-powered dynamic characteristic of O heterogenous pn junctions, with reference to ultra-wide band gap, current-carrying high The doping Zn of sub- concentrationxMg1-xO films can prepare the vertical stratification ZnMgO of excellent performance as electrically conducting transparent Window layer Self-driven solar blind UV electric explorer face battle array device.
The content of the invention
Low it is an object of the invention to be directed to p-type ZnMgO stability of material, pn-junction type ZnMgO solar blind UVs electrical resistivity survey is surveyed Device prepares difficult problem, replaces p-type ZnMgO materials using p-type NiMgO materials, there is provided a kind of vertical stratification ZnMgO is self-driven Solar blind UV electric explorer face battle array and preparation method thereof.
The technical scheme is that with ultra-wide band gap, the doping Zn of high carrier concentrationxMg1-xO films are led as transparent Electric Window layer;With day blind band gap, the doping Zn of low carrier concentrationyMg1-yO films are used as n-layer;With NizMg1-zO film conducts P-type layer;N-shaped annular common electrode and p-type array electrode are prepared, vertical stratification ZnMgO self-driven days is finally prepared blind ultraviolet Photodetector face battle array.
The present invention is comprised the following steps:
1)One layer of ultra-wide band gap, doping Zn of high carrier concentration are grown in transparent substrates 1xMg1-xO films, lead as transparent Electric Window layer 2;2)On electrically conducting transparent Window layer 2 grow one layer day blind band gap, the doping Zn of low carrier concentrationyMg1-yO Film, as n-layer 3;3)Layer of Ni is grown on n-layer 3zMg1-zO films, as p-type layer 4;4)Using mask After the p-type layer 4 and n-layer 3 of the method etch away sections of etching, exposed portion electrically conducting transparent Window layer 2;5)In conjunction with light Mask and vacuum coating method are carved in step 4)N-shaped annular common electrode 5 is prepared in the electrically conducting transparent Window layer 2 exposed, in p-type P-type array electrode 6 is prepared on layer 4;It is final to prepare the self-driven solar blind UV electric explorer face battle arrays of vertical stratification ZnMgO.
Above-mentioned steps 1)Transparent substrates 1 be magnesia, aluminum oxide or quartz substrate.
Above-mentioned steps 1)The ultra-wide band gap of growth, the doping Zn of high carrier concentrationxMg1-xO films, the impurity of its doping Element is Al, Ga or In, and band gap is more than 5.0eV, and carrier concentration is more than 1 × 1019/cm3;Growth doping ZnxMg1-xO films Method is magnetron sputtering coating method or pulsed laser deposition film plating process;The doping ZnxMg1-xZn elemental constituents in O films X is less than 0.50 more than 0.
Above-mentioned steps 2)Growth day blind band gap, the doping Zn of low stream concentrationyMg1-yO films, the impurity unit of its doping Element is Al, Ga or In, and band gap is less than 5.0eV more than 4.3eV, and carrier concentration is more than 1 × 1017/cm3Less than 5 × 1018/cm3; Growth doping ZnyMg1-yThe method of O films is magnetron sputtering coating method or pulsed laser deposition film plating process;The doping ZnyMg1-yZn elemental constituents y is less than 0.60 more than 0.50 in O films.
Above-mentioned steps 3)The Ni of growthzMg1-zO films, its band gap is less than 5.0eV more than 4.3eV;Growth NizMg1-zO films Method be magnetron sputtering coating method or pulsed laser deposition film plating process;The NizMg1-zNi elemental constituents z in O films 0.50 is less than more than 0.40.
Above-mentioned steps 4)The doping Ni of etch away sectionszMg1-zThe doping Zn of O films and low carrier concentrationyMg1-yO films Lithographic method be chemical attack, ion beam etching or plasma etching.
Above-mentioned steps 5)In vacuum coating method for magnetron sputtering coating method, electron beam evaporation deposition method or heat steam Hair film plating process.
The above-mentioned preparation method of the present invention is obtained the self-driven solar blind UV electric explorer face battle arrays of vertical stratification ZnMgO.
Compared with existing ZnMgO solar blind UVs electric explorer, the present invention has the advantages that following prominent:
1)The present invention replaces p-type ZnMgO materials using p-type NiMgO materials, and the p-type ZnMgO materials preparation for solving stabilization is difficult Problem, prepare ZnyMg1-yO/NizMg1-zO heterojunction structure pn-junctions, realize that the self-powered of ZnMgO solar blind UV electric explorers is started building Make.
2)Zn prepared by the present inventionyMg1-yO/NizMg1-zO heterojunction structures pn-junction be vertical stratification, better than traditional metal- The two-dimension plane structure of SEMICONDUCTOR-METAL, the solar blind UV electric explorer of vertical stratification can realize common electrode and array electrode Preparation, therefore can prepare ZnMgO solar blind UV electric explorers face battle array device.
3)The present invention is using ultra-wide band gap, the doping Zn of high carrier concentrationxMg1-xO thin-film transparents are used as conductive window Layer, can effectively improve the collection efficiency of photo-generated carrier, greatly enhance solar blind UV transmission photodetector unit and face battle array device Performance.
4)Existing ZnMgO solar blind UVs transmission photodetector unit device, can be only applied to solar blind UV electric signal strong Weak detection, and the imaging of solar blind UV electric signal cannot be realized, followed the trail of.ZnMgO solar blind UVs electricity prepared by the present invention Detector array device can realize the imaging and tracking to solar blind UV electric signal.
Brief description of the drawings
Fig. 1 is the self-driven solar blind UV electric explorer face battle array schematic diagrames of vertical stratification ZnMgO.
In figure marked as:Transparent substrates 1;The doping Zn of ultra-wide band gap, high carrier concentrationxMg1-xO films are used as saturating Bright conducting window layer 2;Day blind band gap, the doping Zn of low carrier concentrationyMg1-yO films are used as n-layer 3;NizMg1-zO films are made It is p-type layer 4;N-shaped annular common electrode 5;P-type array electrode 6.
Fig. 2 prepares the vertical stratification ZnMgO specific mistakes of self-driven solar blind UV electric explorer face battle array for the embodiment of the present invention Cheng Tu.
In figure marked as:Transparent substrates 1;The doping Zn of ultra-wide band gap, high carrier concentrationxMg1-xO films are used as saturating Bright conducting window layer 2;Day blind band gap, the doping Zn of low carrier concentrationyMg1-yO films are used as n-layer 3; NizMg1-zO films As p-type layer 4;N-shaped annular common electrode 5;P-type array electrode 6.
Specific embodiment
Illustrated below by specific embodiment, with the substantive distinguishing features that the present invention is furture elucidated and marked improvement.
Embodiment 1
Referring to accompanying drawing 2, one layer of ultra-wide band gap, high carrier concentration are grown in quartz substrate 1 using magnetron sputtering coating method Doping ZnxMg1-xUsed as electrically conducting transparent Window layer 2, the impurity element of doping is Al to O films, using ZnO target, MgO targets and Al2O3Target is respectively Zn sources, Mg sources and Al doped sources, and sputtering power is respectively 50W, 100W and 30W, the Zn that growth is obtainedxMg1- xO films are obtained as electrically conducting transparent Window layer 2 through experiment:X values are 0.48 in formula, and band gap width is 5.1eV, carrier concentration It is 2 × 1019/cm3(The process a seen in Fig. 2);Continue with magnetron sputtering coating method grow one layer day blind band gap, low current-carrying The doping Zn of sub- concentrationyMg1-yUsed as n-layer 3, the impurity element of doping is Al to O films, using ZnO target, MgO targets and Al2O3Target Respectively Zn sources, Mg sources and Al doped sources, sputtering power are respectively 55W, 100W and 20W, the Zn that growth is obtainedyMg1-yO films n Type layer 3, obtains through experiment:Y values are 0.52 in formula, and its band gap width is 4.6eV, and carrier concentration is 3 × 1017/cm3(See Fig. 2 In process b);And then grow layer of Ni using magnetron sputtering coating methodzMg1-zO films as p-type layer 4, using NiO targets and MgO targets are respectively Ni sources and Mg sources, and sputtering power is respectively 100W and 110W, the Ni that growth is obtainedzMg1-zO films, through experiment Obtain:Z values are 0.45 in formula, and its band gap width is 4.5eV(The process c seen in Fig. 2);The spin coating photoetching on the multilayer film of growth Glue, and using the photoresist of etched portions is needed on photoetching development technology removal multilayer film, etched away using chemical corrosion method The doping Ni of non-lithographic glue Mask portionzMg1-zThe doping Zn of O films and low carrier concentrationyMg1-yThe n-layer 3 of O films, dew The doping Zn of excess of export broad-band gap, high carrier concentrationxMg1-xThe electrically conducting transparent Window layer 2 of O films, residual photoetching is removed with acetone Glue(The process d seen in Fig. 2);Further spin coating photoresist on multilayer film after etching, and utilization photoetching development technology is revealing The doping Zn of excess of export broad-band gap, high carrier concentrationxMg1-xAnnular common electrode is prepared in the electrically conducting transparent Window layer 2 of O films Litho pattern, N-shaped annular common electrode 5 is prepared using electron beam evaporation deposition method, and residual photoresist is removed with acetone(See Fig. 2 In process e);The further spin coating photoresist on the multilayer film for having prepared N-shaped annular common electrode, and utilization photoetching development technology In NizMg1-zThe litho pattern of array electrode is prepared in the p-type layer 4 of O films, p-type is prepared using electron beam evaporation deposition method Array electrode 6, residual photoresist is removed with acetone(The process f seen in Fig. 2).It is final to obtain vertical stratification ZnMgO self-driven days Blind UV electric explorer face battle array device is as shown in figure 1, in Fig. 1:Transparent substrates 1;The doping of ultra-wide band gap, high carrier concentration ZnxMg1-xO films are used as electrically conducting transparent Window layer 2;Day blind band gap, the doping Zn of low carrier concentrationyMg1-yO films are used as N-shaped Layer 3;NizMg1-zO films are used as p-type layer 4;N-shaped annular common electrode 5;P-type array electrode 6.
Embodiment 2
Referring to accompanying drawing 2, one layer of ultra-wide band gap, current-carrying high are grown in alumina substrate 1 using pulsed laser deposition film plating process The doping Zn of sub- concentrationxMg1-xUsed as electrically conducting transparent Window layer 2, the impurity element of doping is In to O films, using ZnO target, MgO Target and In2O3Target is respectively Zn sources, Mg sources and In doped sources, and the energy density of pulsed laser source is respectively 1.7 J/cm2、2.0J/ cm2And 0.7J/cm2, the Zn that growth is obtainedxMg1-xO films are obtained as electrically conducting transparent Window layer 2 through experiment:X values are in formula 0.45, its band gap width is 5.3eV, and carrier concentration is 1.5 × 1019/cm3(The process a seen in Fig. 2);Continue with pulse Laser deposition film plating process grow one layer day blind band gap, the doping Zn of low carrier concentrationyMg1-yO films are mixed as n-layer 3 Miscellaneous impurity element is In, using ZnO target, MgO targets and In2O3Target is respectively Zn sources, Mg sources and In doped sources, pulsed laser source Energy density be respectively 1.9J/cm2、2.0J/cm2And 0.5J/cm2, the Zn that growth is obtainedyMg1-yO films, obtain through experiment: Y values are 0.53 in formula, and its band gap width is 4.5eV, and carrier concentration is 5 × 1017/cm3(The process b seen in Fig. 2);And then profit Layer of Ni is grown with pulsed laser deposition film plating processzMg1-zO films are respectively Ni as p-type layer 4 using NiO targets and MgO targets Source and Mg sources, the energy density of pulsed laser source are respectively 1.8J/cm2、2.0J/cm2, the Ni that growth is obtainedzMg1-zO films, warp Experiment is obtained:Z values are 0.47 in formula, and its band gap width is 4.4eV(The process c seen in Fig. 2);The spin coating on the multilayer film of growth Photoresist, and using the photoresist of etched portions is needed on photoetching development technology removal multilayer film, using ion beam etching method Etch away the Ni of non-lithographic glue Mask portionzMg1-zThe p-type layer 4 of O films and the doping Zn of low carrier concentrationyMg1-yO films N-layer 3, exposes the doping Zn of ultra-wide band gap, high carrier concentrationxMg1-xThe electrically conducting transparent Window layer 2 of O films, is gone with acetone Except residual photoresist(The process d seen in Fig. 2);The photoetching of further spin coating photoresist on multilayer film after etching, and utilization shows Shadow technology is exposing the doping Zn of ultra-wide band gap, high carrier concentrationxMg1-xRing is prepared on the conducting window layer 2 of O thin-film transparents The litho pattern of shape common electrode, N-shaped annular common electrode 5 is prepared using magnetron sputtering coating method, and residual photoetching is removed with acetone Glue(The process e seen in Fig. 2);Further the spin coating photoresist on the multilayer film for having prepared N-shaped annular common electrode, and utilizes photoetching Developing technique is in NizMg1-zThe litho pattern of array electrode is prepared in the p-type layer 4 of O films, using magnetron sputtering coating method system Standby p-type array electrode 6, residual photoresist is removed with acetone(The process f seen in Fig. 2).It is final to obtain vertical stratification ZnMgO self-powereds Dynamic solar blind UV electric explorer face battle array device.It is final to obtain the self-driven solar blind UV electric explorer faces of vertical stratification ZnMgO Battle array device is as shown in figure 1, in Fig. 1:Transparent substrates 1;The doping Zn of ultra-wide band gap, high carrier concentrationxMg1-xO films are used as saturating Bright conducting window layer 2;Day blind band gap, the doping Zn of low carrier concentrationyMg1-yO films are used as n-layer 3;NizMg1-zO films are made It is p-type layer 4;N-shaped annular common electrode 5;P-type array electrode 6.
Embodiment 3
Referring to accompanying drawing 2, one layer of ultra-wide band gap, high carrier are grown in alumina substrate 1 using magnetron sputtering coating method dense The doping Zn of degreexMg1-xUsed as electrically conducting transparent Window layer 2, the impurity element of doping is Ga to O films, using ZnO target, MgO targets and Ga2O3Target is respectively Zn sources, Mg sources and Ga doped sources, and sputtering power is respectively 45W, 100W and 30W, the Zn that growth is obtainedxMg1- xO films are obtained as electrically conducting transparent Window layer 2 through experiment:X values are 0.44 in formula, and its band gap width is 5.4eV, and carrier is dense Spend is 1.1 × 1019/cm3(The process a seen in Fig. 2);Continue with magnetron sputtering coating method grow one layer day blind band gap, low The doping Zn of carrier concentrationyMg1-yUsed as n-layer 3, the impurity element of doping is Ga to O films, using ZnO target, MgO targets and Ga2O3Target is respectively Zn sources, Mg sources and Al doped sources, and sputtering power is respectively 52W, 100W and 20W, the Zn that growth is obtainedyMg1- yO films n-layer 3, obtains through experiment:Y values are 0.51 in formula, and its band gap width is 4.7 eV, and carrier concentration is 1 × 1018/ cm3(The process b seen in Fig. 2);And then grow layer of Ni using magnetron sputtering coating methodzMg1-zO films are adopted as p-type layer 4 Ni sources and Mg sources are respectively with NiO targets and MgO targets, sputtering power is respectively 100W and 120W, the Ni that growth is obtainedzMg1-zO is thin Film, obtains through experiment:Z values are 0.43 in formula, and its band gap width is 4.7eV(The process c seen in Fig. 2);In the multilayer film of growth Upper spin coating photoresist, and using the photoresist of etched portions is needed on photoetching development technology removal multilayer film, using plasma Lithographic method etches away the Ni of non-lithographic glue Mask portionzMg1-zThe doping of the p-type layer 4 and low carrier concentration of O films ZnyMg1-yThe n-layer 3 of O films, exposes the doping Zn of ultra-wide band gap, high carrier concentrationxMg1-xThe electrically conducting transparent window of O films Layer 2, residual photoresist is removed with acetone(The process d seen in Fig. 2);Further spin coating photoresist on multilayer film after etching, And exposing the doping Zn of ultra-wide band gap, high carrier concentration using photoetching development technologyxMg1-xThe electrically conducting transparent window of O films The litho pattern of annular common electrode is prepared on layer 2, N-shaped annular common electrode 5 is prepared using thermal evaporation film plating process, removed with acetone Residual photoresist(The process e seen in Fig. 2);Further prepared N-shaped annular common electrode multilayer film on spin coating photoresist, and Using photoetching development technology in NizMg1-zThe litho pattern of array electrode is prepared in O films p-type layer 4, using thermal evaporation plated film side Method prepares p-type array electrode 6, and residual photoresist is removed with acetone(The process f seen in Fig. 2).It is final to obtain vertical stratification ZnMgO Self-driven solar blind UV electric explorer face battle array device.The final self-driven solar blind UV electrical resistivity surveys of vertical stratification ZnMgO that obtain are surveyed Device face battle array device is as shown in figure 1, in Fig. 1:Transparent substrates 1;The doping Zn of ultra-wide band gap, high carrier concentrationxMg1-xO films are made It is electrically conducting transparent Window layer 2;Day blind band gap, the doping Zn of low carrier concentrationyMg1-yO films are used as n-layer 3;NizMg1-zO is thin Film is used as p-type layer 4;N-shaped annular common electrode 5;P-type array electrode 6.
The foregoing is only presently preferred embodiments of the present invention, all impartial changes done according to scope of the present invention patent with Modification, should all belong to covering scope of the invention.

Claims (8)

1. the preparation method of a kind of vertical stratification ZnMgO self-driven solar blind UV electric explorer faces battle array, it is characterised in that including Following steps:1)One layer of ultra-wide band gap, doping Zn of high carrier concentration are grown in transparent substrates 1xMg1-xO films, as Electrically conducting transparent Window layer 2;2)On electrically conducting transparent Window layer 2 grow one layer day blind band gap, the doping of low carrier concentration ZnyMg1-yO films, as n-layer 3;3)Layer of Ni is grown on n-layer 3zMg1-zO films, as p-type layer 4;4)Using light Carve mask combine etching method etch away sections p-type layer 4 and n-layer 3 after, exposed portion electrically conducting transparent Window layer 2;5)Again With reference to mask and vacuum coating method in step 4)N-shaped annular common electrode is prepared in the electrically conducting transparent Window layer 2 exposed 5, p-type array electrode 6 is prepared in p-type layer 4;The final self-driven solar blind UV electrical resistivity surveys of vertical stratification ZnMgO that prepare are surveyed Device face battle array.
2. the preparation side of the self-driven solar blind UV electric explorer face battle arrays of a kind of vertical stratification ZnMgO as claimed in claim 1 Method, it is characterised in that step 1)Transparent substrates 1 be magnesia, aluminum oxide or quartz substrate.
3. the preparation side of the self-driven solar blind UV electric explorer face battle arrays of a kind of vertical stratification ZnMgO as claimed in claim 1 Method, it is characterised in that step 1)The ultra-wide band gap of growth, the doping Zn of high carrier concentrationxMg1-xO films, the impurity of its doping Element is Al, Ga or In, and band gap is more than 5.0eV, and carrier concentration is more than 1 × 1019/cm3;Growth doping ZnxMg1-xO films Method is magnetron sputtering coating method or pulsed laser deposition film plating process;The doping ZnxMg1-xZn elemental constituents in O films X is less than 0.50 more than 0.
4. the preparation side of the self-driven solar blind UV electric explorer face battle arrays of a kind of vertical stratification ZnMgO as claimed in claim 1 Method, it is characterised in that step 2)Growth day blind band gap, the doping Zn of low stream concentrationyMg1-yO films, the impurity unit of its doping Element is Al, Ga or In, and band gap is less than 5.0eV more than 4.3eV, and carrier concentration is more than 1 × 1017/cm3Less than 5 × 1018/cm3; Growth doping ZnyMg1-yThe method of O films is magnetron sputtering coating method or pulsed laser deposition film plating process;The doping ZnyMg1-yZn elemental constituents y is less than 0.60 more than 0.50 in O films.
5. the preparation side of the self-driven solar blind UV electric explorer face battle arrays of a kind of vertical stratification ZnMgO as claimed in claim 1 Method, it is characterised in that step 3)The Ni of growthzMg1-zO films, its band gap is less than 5.0eV more than 4.3eV;Growth NizMg1-zO is thin The method of film is magnetron sputtering coating method or pulsed laser deposition film plating process;The NizMg1-zNi elemental constituents in O films Z is less than 0.50 more than 0.40.
6. the preparation side of the self-driven solar blind UV electric explorer face battle arrays of a kind of vertical stratification ZnMgO as claimed in claim 1 Method, it is characterised in that step 4)The doping Ni of etch away sectionszMg1-zThe doping Zn of O films and low carrier concentrationyMg1-yO is thin The lithographic method of film is chemical attack, ion beam etching or plasma etching.
7. the preparation side of the self-driven solar blind UV electric explorer face battle arrays of a kind of vertical stratification ZnMgO as claimed in claim 1 Method, it is characterised in that step 5)In vacuum coating method be magnetron sputtering coating method, electron beam evaporation deposition method or heat Evaporation coating method.
8. the self-driven solar blind UV electrical resistivity surveys of vertical stratification ZnMgO obtained in any described preparation methods of claim 1-7 are surveyed Device face battle array.
CN201710039053.8A 2017-01-18 2017-01-18 A kind of self-driven solar blind UV electric explorer face battle arrays of vertical stratification ZnMgO and preparation method thereof Expired - Fee Related CN106847954B (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107768458A (en) * 2017-10-30 2018-03-06 河南科技大学 A kind of preparation method of semiconductor devices
CN113088907A (en) * 2021-03-26 2021-07-09 哈尔滨工业大学 Preparation method of MgGaZnO film with deep ultraviolet detection function
CN114784134A (en) * 2022-03-07 2022-07-22 山东大学 Self-driven solar blind photoelectric detector based on p-type cuprous indium oxide single crystal film and preparation method thereof

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101286535A (en) * 2008-06-04 2008-10-15 长春理工大学 Sun blind region ultraviolet detector with pn junction MgxZn1-xO film
CN101533868A (en) * 2009-04-03 2009-09-16 中国科学院上海硅酸盐研究所 Heterogenous pn junction solar blind ultraviolet detector
CN101887925A (en) * 2010-06-21 2010-11-17 中国科学院苏州纳米技术与纳米仿生研究所 Ultraviolet probe based on magnesium-zinc oxide film and preparation method thereof
US20120067421A1 (en) * 2010-09-22 2012-03-22 First Solar, Inc Photovoltaic device with a zinc magnesium oxide window layer
CN103943720A (en) * 2014-03-27 2014-07-23 中国科学院长春光学精密机械与物理研究所 Self-driven oxygen zinc magnesium ultraviolet detector and preparing method thereof

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101286535A (en) * 2008-06-04 2008-10-15 长春理工大学 Sun blind region ultraviolet detector with pn junction MgxZn1-xO film
CN101533868A (en) * 2009-04-03 2009-09-16 中国科学院上海硅酸盐研究所 Heterogenous pn junction solar blind ultraviolet detector
CN101887925A (en) * 2010-06-21 2010-11-17 中国科学院苏州纳米技术与纳米仿生研究所 Ultraviolet probe based on magnesium-zinc oxide film and preparation method thereof
US20120067421A1 (en) * 2010-09-22 2012-03-22 First Solar, Inc Photovoltaic device with a zinc magnesium oxide window layer
CN103943720A (en) * 2014-03-27 2014-07-23 中国科学院长春光学精密机械与物理研究所 Self-driven oxygen zinc magnesium ultraviolet detector and preparing method thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107768458A (en) * 2017-10-30 2018-03-06 河南科技大学 A kind of preparation method of semiconductor devices
CN113088907A (en) * 2021-03-26 2021-07-09 哈尔滨工业大学 Preparation method of MgGaZnO film with deep ultraviolet detection function
CN114784134A (en) * 2022-03-07 2022-07-22 山东大学 Self-driven solar blind photoelectric detector based on p-type cuprous indium oxide single crystal film and preparation method thereof

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