CN106841870A - 一种信号异常辅助定位电路及方法 - Google Patents
一种信号异常辅助定位电路及方法 Download PDFInfo
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- CN106841870A CN106841870A CN201710078446.XA CN201710078446A CN106841870A CN 106841870 A CN106841870 A CN 106841870A CN 201710078446 A CN201710078446 A CN 201710078446A CN 106841870 A CN106841870 A CN 106841870A
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- 230000002159 abnormal effect Effects 0.000 title claims abstract description 37
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- 238000004458 analytical method Methods 0.000 claims abstract description 18
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- 230000005574 cross-species transmission Effects 0.000 claims description 4
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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CN201710078446.XA CN106841870B (zh) | 2017-02-14 | 2017-02-14 | 一种信号异常辅助定位电路及方法 |
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CN201710078446.XA CN106841870B (zh) | 2017-02-14 | 2017-02-14 | 一种信号异常辅助定位电路及方法 |
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CN106841870A true CN106841870A (zh) | 2017-06-13 |
CN106841870B CN106841870B (zh) | 2019-05-07 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116778839A (zh) * | 2023-08-22 | 2023-09-19 | 联士光电(深圳)有限公司 | 一种微显示面板显示信号检测电路 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10332783A (ja) * | 1997-06-05 | 1998-12-18 | Fujitsu Ltd | 回路試験装置 |
CN1332529A (zh) * | 2000-07-10 | 2002-01-23 | 国际商业机器公司 | 用于确定一个数字信号的质量的设备与方法 |
US20100169045A1 (en) * | 2008-12-30 | 2010-07-01 | Woo-Chol Shin | Measurement apparatus for improving performance of standard cell library |
US8031447B2 (en) * | 2007-10-09 | 2011-10-04 | Schweitzer Engineering Laboratories, Inc. | Transformer through-fault current monitor |
CN102687114A (zh) * | 2009-09-24 | 2012-09-19 | 辛奥普希斯股份有限公司 | 具有行为特征的硬件设计的并发仿真 |
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2017
- 2017-02-14 CN CN201710078446.XA patent/CN106841870B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10332783A (ja) * | 1997-06-05 | 1998-12-18 | Fujitsu Ltd | 回路試験装置 |
CN1332529A (zh) * | 2000-07-10 | 2002-01-23 | 国际商业机器公司 | 用于确定一个数字信号的质量的设备与方法 |
US8031447B2 (en) * | 2007-10-09 | 2011-10-04 | Schweitzer Engineering Laboratories, Inc. | Transformer through-fault current monitor |
US20100169045A1 (en) * | 2008-12-30 | 2010-07-01 | Woo-Chol Shin | Measurement apparatus for improving performance of standard cell library |
CN102687114A (zh) * | 2009-09-24 | 2012-09-19 | 辛奥普希斯股份有限公司 | 具有行为特征的硬件设计的并发仿真 |
Non-Patent Citations (1)
Title |
---|
张东庄 等: "LN8254-可编程计数(间隔)定时器逻辑分析", 《微处理机》 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN116778839A (zh) * | 2023-08-22 | 2023-09-19 | 联士光电(深圳)有限公司 | 一种微显示面板显示信号检测电路 |
CN116778839B (zh) * | 2023-08-22 | 2023-11-07 | 联士光电(深圳)有限公司 | 一种微显示面板显示信号检测电路 |
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Effective date of registration: 20190410 Address after: No. 1036, Shandong high tech Zone wave road, Ji'nan, Shandong Applicant after: INSPUR GROUP Co.,Ltd. Address before: 250100 First Floor of R&D Building 2877 Kehang Road, Sun Village Town, Jinan High-tech Zone, Shandong Province Applicant before: JINAN INSPUR HIGH-TECH TECHNOLOGY DEVELOPMENT Co.,Ltd. |
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Effective date of registration: 20230420 Address after: 250000 building S02, No. 1036, Langchao Road, high tech Zone, Jinan City, Shandong Province Patentee after: Shandong Inspur Scientific Research Institute Co.,Ltd. Address before: No. 1036, Shandong high tech Zone wave road, Ji'nan, Shandong Patentee before: INSPUR GROUP Co.,Ltd. |
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