CN106841236B - Transmission optical element defect testing device and method - Google Patents

Transmission optical element defect testing device and method Download PDF

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CN106841236B
CN106841236B CN201611147850.XA CN201611147850A CN106841236B CN 106841236 B CN106841236 B CN 106841236B CN 201611147850 A CN201611147850 A CN 201611147850A CN 106841236 B CN106841236 B CN 106841236B
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陈永权
段亚轩
赵建科
李坤
聂申
宋琦
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XiAn Institute of Optics and Precision Mechanics of CAS
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Abstract

为了解决传统测试方法耗时耗力、对光学元件内部的疵病测量受限的弊端,本发明提供了一种透射光学元件疵病的测试装置及方法,其中装置包括激光器、准直镜、定焦镜头、CCD、移动机构和采集控制计算机;所述准直镜设置在激光器的输出光路上;所述定焦镜头和CCD刚性连接组成成像系统,成像系统的监视面通过定焦镜头和CCD感光面成共轭关系;所述成像系统固定在移动机构上;所述移动机构与采集控制计算机相连。

Figure 201611147850

In order to solve the disadvantages of traditional testing methods that are time-consuming and labor-intensive, and the measurement of defects inside optical components is limited, the present invention provides a testing device and method for testing defects in transmission optical components, wherein the device includes a laser, a collimator, a fixed Focus lens, CCD, moving mechanism and acquisition control computer; The collimating lens is arranged on the output optical path of the laser; The fixed focus lens and CCD are rigidly connected to form an imaging system, and the monitoring surface of the imaging system is photosensitive through the fixed focus lens and CCD The planes are in a conjugate relationship; the imaging system is fixed on the moving mechanism; the moving mechanism is connected with the acquisition control computer.

Figure 201611147850

Description

透射光学元件疵病测试装置及方法Defect testing device and method for transmission optical element

技术领域technical field

本发明属光学领域,涉及光学元件疵病的测试方法与装置,尤其涉及激光光路中透射式大口径平板与楔板表面、亚表面及内部疵病位置的测试方法与装置。The invention belongs to the field of optics, and relates to a method and a device for testing defects of optical components, in particular to a method and a device for testing the surface, sub-surface and internal defects of a transmissive large-diameter flat plate and wedge in a laser light path.

背景技术Background technique

神光Ⅲ主机装置中大量使用平板与楔板光学元件,平板与楔板疵病会使元件在较低的通量下产生损伤,激光诱发的损伤会使元件的损伤加速,同时引起装置的光束质量变差,影响装置的输出能量和聚焦特性,在后续光路中产生热像,引起新的损伤,使打靶的能量下降,危害极大。因此,装置中平板与楔板中疵病的控制十分重要。The Shenguang III host device uses a large number of flat and wedge optical components. The flat and wedge defects will cause damage to the components at a lower flux. Laser-induced damage will accelerate the damage of the components, and at the same time cause the beam of the device to The deterioration of the quality will affect the output energy and focusing characteristics of the device, generate thermal images in the subsequent optical path, cause new damage, and reduce the energy of shooting, which is extremely harmful. Therefore, the control of defects in the flat plate and wedge in the device is very important.

传统测试方法:Traditional testing methods:

方法1,目视法,借助低倍放大镜观察平板与楔板表面、亚表面及内部的疵病,该方法对大口径的元件进行测试时,人眼长时间观察容易引起视力疲劳,测量置信度较低,该方法耗时耗力,效率低下。Method 1, visual method, with the help of a low-magnification magnifying glass to observe the surface, sub-surface and internal defects of the plate and wedge. When this method is used to test large-caliber components, long-term observation of the human eye is likely to cause visual fatigue, and the measurement confidence Low, this method is time-consuming and labor-intensive, and the efficiency is low.

方法2,显微成像法,采用移动扫描机构承载大口径光学元件,采用LED照明,采用暗场成像,由CCD显微系统测试光学元件的疵病,此方法受显微系统视场和工作距的限制,只能测试光学元件表面或亚表面的疵病,对光学元件内部的疵病测量受限,同时采用显微系统,视场较小,测量时采用扫描方式耗时较长。Method 2, micro-imaging method, using a mobile scanning mechanism to carry large-diameter optical components, using LED lighting, using dark-field imaging, and testing the defects of optical components by a CCD microscopic system. This method is affected by the field of view and working distance of the microscopic system. Due to the limitation of optical components, it can only test the defects on the surface or sub-surface of optical components, and the measurement of defects inside the optical components is limited. At the same time, the microscope system is used, the field of view is small, and the scanning method takes a long time to measure.

发明内容Contents of the invention

为了解决传统测试方法耗时耗力、对光学元件内部的疵病测量受限的弊端,本发明提出了一种透射光学元件疵病测试方法及装置,能对大口径透射式光学元件表面及内部疵病进行快速检测。In order to solve the shortcomings of traditional testing methods that are time-consuming and labor-intensive, and the measurement of internal defects of optical components is limited, the present invention proposes a method and device for testing defects of transmission optical components, which can test the surface and interior of large-diameter transmission optical components Rapid detection of defects.

本发明的技术解决方案如下:Technical solution of the present invention is as follows:

透射光学元件疵病的测试装置,其特殊之处在于:包括激光器、准直镜、定焦镜头、CCD、移动机构和采集控制计算机;所述准直镜设置在激光器的输出光路上;所述定焦镜头和CCD刚性连接组成成像系统,成像系统的监视面通过定焦镜头和CCD感光面成共轭关系;所述成像系统固定在移动机构上;所述移动机构与采集控制计算机相连。The test device for flaws in transmission optical components is special in that it includes a laser, a collimating mirror, a fixed-focus lens, a CCD, a moving mechanism, and an acquisition control computer; the collimating mirror is set on the output optical path of the laser; the The fixed-focus lens and CCD are rigidly connected to form an imaging system, and the monitoring surface of the imaging system forms a conjugate relationship with the CCD photosensitive surface through the fixed-focus lens; the imaging system is fixed on a moving mechanism; the moving mechanism is connected with an acquisition control computer.

为提高检测效率,实现自动化测试,上述测试装置还包括载物台和扫描机构;所述载物台用于放置和固定待测光学元件;所述扫描机构用于整体移动载物台和待测光学元件;所述扫描机构与所述采集控制计算机相连。In order to improve detection efficiency and realize automatic testing, the above test device also includes a stage and a scanning mechanism; the stage is used to place and fix the optical element to be tested; the scanning mechanism is used to move the stage and the An optical element; the scanning mechanism is connected with the acquisition control computer.

采用上述测试装置检测透射光学元件疵病的方法,其特殊之处在于:包括以下步骤:The method for using the above-mentioned testing device to detect defects in transmission optical elements is special in that it includes the following steps:

1)开启激光器1,将激光注入准直镜进行准直;1) Turn on the laser 1 and inject the laser into the collimating mirror for collimation;

2)使准直后的激光束照射被测光学元件的某一待测试区域;2) Make the collimated laser beam irradiate a certain area to be tested of the optical element under test;

3)观察成像系统的图像,若出现衍射图样,则表明被测光学元件当前被照射区域处有疵病,进入步骤4);3) Observe the image of the imaging system, if there is a diffraction pattern, it indicates that there is a defect in the currently irradiated area of the optical element under test, and proceed to step 4);

4)沿轴向调整移动机构的位置使衍射环由大变小直至衍射环消失,此时成像系统的监视面与被测光学元件的疵病位置重合;4) Adjust the position of the moving mechanism along the axial direction so that the diffraction ring changes from large to small until the diffraction ring disappears. At this time, the monitoring surface of the imaging system coincides with the defect position of the optical element under test;

5)移动被测光学元件,使激光束通过被测光学元件口径的下一个测试区域,采用步骤3)~4)相同的方法对该区域进行测试;5) Move the optical component under test so that the laser beam passes through the next test area of the aperture of the optical component under test, and use the same method as steps 3) to 4) to test this area;

6)重复步骤3)至步骤5),直至完成整个光学元件所有区域的测试;6) Repeat step 3) to step 5), until the test of all areas of the entire optical element is completed;

7)将所有测试区域中存在疵病的位置数据进行拼接,得到整个光学元件的空间缺陷信息。7) Splicing the position data of defects in all test areas to obtain the spatial defect information of the entire optical element.

上述步骤5)中将待测光学元件放置在载物台上,采用扫描机构整体移动载物台和待测光学元件。In the above step 5), the optical element to be tested is placed on the stage, and the scanning mechanism is used to move the stage and the optical element to be tested as a whole.

本发明的优点在于:The advantages of the present invention are:

1、本发明将激光器、准直镜、载物台、扫描机构、定焦镜头、CCD、移动机构和采集控制计算机组合,利用激光的衍射特性与物像共轭成像关系,通过扫描实现对大口径光学元件的疵病检测,能够检测到整个光学元件的表面、亚表面和内部缺陷信息,对光学元件内部的疵病测量不受限,且检测效率高,同时,由于疵病经激光照射时,即使尺度在亚微米量级,也可产生清晰的衍射条纹,因此系统测量精度高。1. The present invention combines a laser, a collimating mirror, a stage, a scanning mechanism, a fixed-focus lens, a CCD, a moving mechanism and an acquisition control computer, utilizes the diffraction characteristics of the laser and the conjugate imaging relationship of the object image, and realizes large-scale The defect detection of aperture optical components can detect the surface, sub-surface and internal defect information of the entire optical component, and the measurement of defects inside the optical component is not limited, and the detection efficiency is high. , even if the scale is on the submicron scale, it can produce clear diffraction fringes, so the system has high measurement accuracy.

2、本发明自动化程度高,适合光学元件疵病的无损非接触精密测量。2. The invention has a high degree of automation and is suitable for non-destructive non-contact precision measurement of optical element defects.

附图说明Description of drawings

图1是本发明的机构示意图;Fig. 1 is a mechanism schematic diagram of the present invention;

图中,1-激光器、2-准直镜、3-载物台、4-扫描机构、5-定焦镜头、6-CCD、7-移动机构、8-采集控制计算机、9-待测光学元件。In the figure, 1-laser, 2-collimating mirror, 3-stage, 4-scanning mechanism, 5-fixed focus lens, 6-CCD, 7-moving mechanism, 8-acquisition control computer, 9-optics to be tested element.

具体实施方式Detailed ways

本发明所提供的透射光学元件疵病的测试装置包括激光器1、准直镜2、载物台3、扫描机构4、定焦镜头5、CCD 6、移动机构7和采集控制计算机8。The test device for defects in transmission optical elements provided by the present invention includes a laser 1, a collimating mirror 2, a stage 3, a scanning mechanism 4, a fixed-focus lens 5, a CCD 6, a moving mechanism 7 and an acquisition control computer 8.

准直镜2设置在激光器1的输出光路上,将激光器的输出激光准直后输出平行光束。The collimating mirror 2 is arranged on the output optical path of the laser 1, and collimates the output laser light of the laser to output a parallel beam.

载物台3用于放置待测光学元件,并保证待测光学元件位于准直镜2的输出光路上,使平行光束通过待测光学元件的某一个测试区域。The stage 3 is used to place the optical element to be tested, and ensure that the optical element to be tested is located on the output optical path of the collimating mirror 2, so that the parallel light beam passes through a certain test area of the optical element to be tested.

扫描机构4安装在载物台3的下端,用于整体移动载物台3和放置在载物台3上的待测光学元件,使激光束通过待测光学元件口径的下一个测试区域。The scanning mechanism 4 is installed at the lower end of the stage 3, and is used for moving the stage 3 and the optical element to be tested placed on the stage 3 as a whole, so that the laser beam passes through the next test area of the optical element to be tested.

定焦镜头5和CCD 6刚性连接,组成成像系统。整个成像系统固定在移动机构7上,成像系统的监视面通过定焦镜头5和CCD 6感光面成共轭关系。成像系统用于测试待测光学元件当前测试区域是否存在疵病。The fixed-focus lens 5 and the CCD 6 are rigidly connected to form an imaging system. Whole imaging system is fixed on the moving mechanism 7, and the monitoring surface of imaging system becomes conjugate relationship by fixed-focus lens 5 and CCD 6 photosensitive surfaces. The imaging system is used to test whether there are defects in the current test area of the optical component to be tested.

扫描机构4、成像系统以及移动机构7均与采集控制计算机8相连;The scanning mechanism 4, the imaging system and the moving mechanism 7 are all connected to the acquisition control computer 8;

采集控制计算机8有三个功能:Acquisition control computer 8 has three functions:

1、控制扫描机构和移动机构的移动步长;1. Control the moving steps of the scanning mechanism and the moving mechanism;

2、采集数据:包括成像系统的监视面的位置信息、被测光学元件被照射区域信息;2. Data collection: including the position information of the monitoring surface of the imaging system and the irradiated area information of the optical element under test;

3、处理数据:将被测光学元件存在疵病的各个区域位置进行拼接,得到整个光学元件的空间缺陷信息。3. Data processing: splicing the position of each area where the optical element under test has defects, and obtaining the spatial defect information of the entire optical element.

基于上述测试装置,本发明同时提供了一种透射光学元件疵病的测试方法,包括以下步骤:Based on the above test device, the present invention also provides a method for testing defects in transmission optical elements, comprising the following steps:

1)开启激光器1,将激光注入准直镜2后,准直成平行光束,将被测光学元件固定在载物台3上,使平行光束照射被测光学元件的某一待测区域;准直的平行光经被测光学元件透射后,进入由定焦镜头5和CCD 6所组成的成像系统。1) Turn on the laser 1, inject the laser into the collimating mirror 2, collimate it into a parallel beam, fix the optical element under test on the stage 3, and make the parallel beam irradiate a certain area of the optical element under test; The straight parallel light enters the imaging system composed of fixed-focus lens 5 and CCD 6 after being transmitted by the optical element under test.

2)若成像系统上出现衍射图样,则表明被测光学元件被照射区域处有疵病,进入步骤3)。2) If a diffraction pattern appears on the imaging system, it indicates that there is a defect in the irradiated area of the optical element under test, and proceed to step 3).

3)沿轴向(与准直镜的轴向平行)调整移动机构7的位置,当成像系统上的衍射图样逐渐变小时,表明成像系统的监视面逐渐靠近被测光学元件的疵病位置;继续调整移动机构7的位置,当衍射环消失时,满足像传递原理,说明此时成像系统的监视面与被测光学元件的疵病位置重合。3) Adjust the position of the moving mechanism 7 along the axial direction (parallel to the axial direction of the collimating mirror). When the diffraction pattern on the imaging system gradually becomes smaller, it indicates that the monitoring surface of the imaging system is gradually approaching the defect position of the optical element under test; Continue to adjust the position of the moving mechanism 7. When the diffraction ring disappears, the principle of image transfer is satisfied, which means that the monitoring surface of the imaging system coincides with the defect position of the optical element under test at this time.

4)整体移动载物台3和被测光学元件,使激光束通过被测光学元件口径的下一个测试区域,采用步骤2)~3)相同的方法对该区域进行测试。4) Move the stage 3 and the optical element under test as a whole, so that the laser beam passes through the next test area of the aperture of the optical element under test, and use the same method as steps 2) to 3) to test this area.

5)重复步骤2)至步骤4),直至完成整个光学元件的测试。5) Repeat step 2) to step 4) until the test of the entire optical element is completed.

6)将所有测试区域的存在疵病的位置数据进行拼接,得到整个光学元件的空间缺陷信息。6) Splicing the defect position data of all test areas to obtain the spatial defect information of the entire optical element.

这里步骤6)中的具体拼接方法是本领域技术人员数据处理的常用技术手段,本发明在此不再赘述。The specific splicing method in step 6) here is a common technical means for data processing by those skilled in the art, and the present invention will not repeat them here.

Claims (2)

1. A method of detecting a transmission optical element defect, comprising:
the adopted testing device for the defects of the transmission optical element comprises a laser, a collimating mirror, a fixed-focus lens, a CCD (charge coupled device), a moving mechanism and an acquisition control computer; the collimating lens is arranged on an output light path of the laser; the fixed-focus lens and the CCD are rigidly connected to form an imaging system, and a monitoring surface of the imaging system is in conjugate relation with a CCD photosurface through the fixed-focus lens; the imaging system is fixed on the moving mechanism; the moving mechanism is connected with an acquisition control computer;
the method comprises the following steps:
1) Starting a laser, and injecting laser into a collimating mirror for collimation;
2) Irradiating a certain to-be-tested area of the tested optical element by the collimated laser beam;
3) Observing an image of the imaging system, if a diffraction pattern appears, indicating that a defect exists in the currently irradiated area of the optical element to be detected, and entering the step 4);
4) Adjusting the position of the moving mechanism along the axial direction to make the diffraction ring gradually smaller until the diffraction ring disappears, wherein the monitoring surface of the imaging system is superposed with the defect position of the measured optical element;
5) Moving the optical element to be tested, enabling the laser beam to pass through the next test area of the caliber of the optical element to be tested, and testing the area by adopting the same method of the steps 3) -4);
6) Repeating the steps 3) to 5) until the test of all the areas of the whole optical element is finished;
7) And splicing the position data with the defects in all the test areas to obtain the spatial defect information of the whole optical element.
2. A method of detecting transmission optical element defects according to claim 1, characterized in that: the method comprises the following steps: and 5) placing the optical element to be measured on the objective table, and integrally moving the objective table and the optical element to be measured by adopting a scanning mechanism.
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