CN106814257A - Chip type identifying system, method and device - Google Patents
Chip type identifying system, method and device Download PDFInfo
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- CN106814257A CN106814257A CN201611119566.1A CN201611119566A CN106814257A CN 106814257 A CN106814257 A CN 106814257A CN 201611119566 A CN201611119566 A CN 201611119566A CN 106814257 A CN106814257 A CN 106814257A
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Abstract
The present invention provides a kind of chip type identifying system, method and device, belongs to field of information security technology.The chip type recognition methods includes：The electromagnetic signal revealed during to chip operation is detected；When the electromagnetic signal for collecting is detected more than the first predetermined threshold value, with current time as starting point, follow-up electromagnetic signal is recorded, untill detecting electromagnetic signal less than the second predetermined threshold value, obtain corresponding target electromagnetic signal record；SVMs based on training in advance, the chip type of chip is determined according to target electromagnetic signal record.The present invention detects that the SVMs based on training in advance determines chip type according to target electromagnetic signal record by the electromagnetic signal that chip is revealed.Method by being then based on machine learning, by the SVMs of training in advance come automatic identification chip type, identification process can be used for any occasion to the electromagnetic signal that will be collected, so that identification process versatility and discrimination are higher.
Description
Technical field
The present invention relates to field of information security technology, more particularly, to a kind of chip type identifying system, method and dress
Put.
Background technology
With the increasingly raising of scientific and technological level, various information security means, such as cryptographic algorithm and safety chip, more and more extensively
It is used for generally in daily life, economic activity and Military Application.Meanwhile, attack for cryptographic algorithm and hardware device and anti-
Shield research is also deepening continuously.Chip can reveal the information in addition to input and output, such as power consumption, electromagnetism spoke in the process of running
Penetrate, bug and timing information etc..Due to using the electromagnetic signal leaked in highly sensitive instrument capture device, according to letting out
The electromagnetic signal of dew obtain information ratio other methods obtain information it is more accurate, reliable, in time, it is continuous and possess preferably
It is disguised and be difficult to be discovered by other side, so as to be domestic and international intelligence agency's acquisition of information using electromagnetic leakage steal confidential information
Important channel.In addition, the content that electromagnetism is intercepted and captured is quite varied, such as military, political and economic information.
Wherein, emi analysis object is mainly various embedded chips.For example, FPGA (Field-Programmable
Gate Array, field programmable gate array), microcontroller, smart card and ASIC (Application Specific
Integrated Circuits, application specific integrated circuit).Because the electromagnetic information leakage produced during chip operation is depended on
The data (i.e. median) processed in chip, and these medians have direct or indirect dependency relation with chip in itself, from
And be based on the theory and can realize precisely attacking after the type for knowing embedded chip.In addition, China manufactures and designs neck in chip
There is larger gap in domain, and research foreign countries relatively in terms of EMP attack N analysis start late, theoretical depth with external
With experimental situation without external ripe.EMP attack N aspect research to chip is less, and the exploration of research is still on the whole
Stage.In addition, present chip technology also causes that most of chip bottom techniques are only merely nuance, so as to increase
The difficulty of chip identification.Therefore, the type of chip how is efficiently identified out, in electromagnetic leakage and EMP attack N field,
By the concern and research of more and more people.
Existing chip type recognition methods is mainly according to chip identification to be identified chip type.
Realize it is of the invention during, find prior art at least there is problems with：By then passing through chip identification
To be identified to chip type, and chip sometimes can be without the mark that identify or cannot obtain chip, and causing can not be right
Chip type is identified.Therefore, the poor universality of chip identification process and discrimination is not high.
The content of the invention
The present invention provide it is a kind of overcome above mentioned problem or the indoor orientation method that solves the above problems at least in part and
Device.
According to the first aspect of the invention, there is provided a kind of chip type identifying system, the system includes：Loading plate, end
End, electromagnetic probe and digital storage oscilloscope；
Loading plate is connected with terminal, and terminal is connected with digital storage oscilloscope, and digital storage oscilloscope is visited with electromagnetism
Head is connected；
Wherein, loading plate is mounted with chip to be identified；Electromagnetic probe is used to gather the electromagnetic signal of loading plate leakage, number
Word storage oscillograph is used to record the electromagnetic signal of electromagnetic probe collection；Terminal is used for according to after being analyzed to electromagnetic signal
As a result, identification chip type.
According to the second aspect of the invention, there is provided a kind of chip type recognition methods, the method includes：
The electromagnetic signal revealed during to chip operation is detected；
When the electromagnetic signal for collecting is detected more than the first predetermined threshold value, with current time as starting point, to follow-up
Electromagnetic signal recorded, until detecting electromagnetic signal less than untill the second predetermined threshold value, obtain corresponding target electromagnetic
Signal record；
SVMs based on training in advance, the chip type of chip is determined according to target electromagnetic signal record.
According to the third aspect of the invention we, there is provided a kind of chip type identifying device, the device includes：
Detection module, the electromagnetic signal revealed during for chip operation is detected；
Logging modle, for when the electromagnetic signal for collecting is detected more than the first predetermined threshold value, being with current time
Starting point, records to follow-up electromagnetic signal, untill detecting electromagnetic signal less than the second predetermined threshold value, obtains right
The target electromagnetic signal record answered；
Determining module, for the SVMs based on training in advance, chip is determined according to target electromagnetic signal record
Chip type.
The beneficial effect brought of technical scheme that the application is proposed is：
The electromagnetic signal revealed during by chip operation is detected.When detecting the electromagnetic signal that collects more than the
During one predetermined threshold value, with current time as starting point, follow-up electromagnetic signal is recorded, it is small until detecting electromagnetic signal
Untill the second predetermined threshold value, corresponding target electromagnetic signal record is obtained.SVMs based on training in advance, according to mesh
Mark electromagnetic signal recordings determine the chip type of chip.Method by being then based on machine learning, the electromagnetic signal that will be collected
By the SVMs of training in advance come automatic identification chip type, identification process can be used for any occasion, so as to recognize
Journey versatility and discrimination are higher.In addition, the number of electromagnetic leakage curve is less needed for SVMs, i.e., required collecting sample
Negligible amounts.As SVMs constantly learns, the accuracy of identification and robustness of system can also be gradually stepped up.
Finally, due to when by gather leakage electromagnetic signal come realize chip type recognize, whole process is noncontact
Property and the normal work that does not interfere with chip so that whole identification process is disguised very well, the information for being obtained is also more accurate
It is really in time and continuous reliable.
Brief description of the drawings
Fig. 1 is a kind of structural design drawing of base plate of the embodiment of the present invention；
Fig. 2 is a kind of structural design drawing of core board of the embodiment of the present invention；
Fig. 3 is a kind of structural design drawing of pinboard of the embodiment of the present invention；
Fig. 4 is a kind of structural representation of chip type identifying system of the embodiment of the present invention；
Fig. 5 is a kind of schematic flow sheet of chip type recognition methods of the embodiment of the present invention；
Fig. 6 is a kind of schematic flow sheet of chip type recognition methods of the embodiment of the present invention；
Fig. 7 is the effect diagram before a kind of Data Dimensionality Reduction of the embodiment of the present invention；
Fig. 8 is the effect diagram after a kind of Data Dimensionality Reduction of the embodiment of the present invention；
Fig. 9 is the effect diagram after a kind of Data Dimensionality Reduction of the embodiment of the present invention；
Figure 10 is a kind of structural representation of chip type identifying device of the embodiment of the present invention.
Specific embodiment
With reference to the accompanying drawings and examples, specific embodiment of the invention is described in further detail.Hereinafter implement
Example is not limited to the scope of the present invention for illustrating the present invention.
Existing chip type identification process is mainly identified by chip identification to chip, do not identify when chip or
When person cannot obtain chip identification, then chip type can not be identified.Therefore, the poor universality of said chip identification process
And discrimination is not high.
For the problems of the prior art, a kind of chip type identifying system is present embodiments provided.The system includes：Dress
Support plate, terminal, electromagnetic probe and digital storage oscilloscope；Loading plate is connected with terminal, terminal and digital storage oscilloscope phase
Connection, digital storage oscilloscope is connected with electromagnetic probe.Specifically, loading plate can be by the FPGA/CPLD of Altera
(Complex Programmable Logic Device, CPLD) download program cable USB Blaster
It is connected with terminal.Terminal can be connected by USB interface with digital storage oscilloscope, and the present embodiment is not to above-mentioned connected mode
Make specific restriction.
Wherein, loading plate is mounted with chip to be identified；Electromagnetic probe is used to gather the electromagnetic signal of loading plate leakage, number
Word storage oscillograph is used to record the electromagnetic signal of electromagnetic probe collection；Terminal is used for according to after being analyzed to electromagnetic signal
As a result, identification chip type.In addition, terminal can be also used for controlling the configuration of whole collecting devices, the electromagnetism that storage is collected
Signal, the present embodiment is not especially limited to this.
It should be noted that above-mentioned loading plate major function is to load chip to be identified, in actual implementation process
The concrete form of loading plate can be FPGA development boards or the actually located mainboard of chip to be identified, and the present embodiment is not made to this
It is specific to limit.In addition, for the ease of that can check the electromagnetic signal for collecting, above-mentioned digital storage oscilloscope will can be collected
Electromagnetic signal shown that the present embodiment is not especially limited to this in the form of magnitude of voltage.Wherein, each sampled point is adopted
Electromagnetic signal one magnitude of voltage of correspondence of sample.Above-mentioned terminal can be computer or the processing equipment with processing function, sheet
Embodiment is not especially limited to this.
System provided in an embodiment of the present invention, the electromagnetic signal revealed during by electromagnetic probe to chip operation is examined
Survey.Then the electromagnetic signal for being collected by terminal-pair is analyzed.Specifically, it is more than when detecting the electromagnetic signal that collects
During the first predetermined threshold value, with current time as starting point, follow-up electromagnetic signal is recorded, until detecting electromagnetic signal
Untill less than the second predetermined threshold value, corresponding target electromagnetic signal record is obtained.SVMs based on training in advance, according to
Target electromagnetic signal record determines the chip type of chip.Method by being then based on machine learning, the electromagnetism letter that will be collected
Number by the SVMs of training in advance come automatic identification chip type, identification process can be used for any occasion, so as to recognize
Process versatility and discrimination are higher.In addition, the number of electromagnetic leakage curve is less needed for SVMs, i.e., required collection sample
This negligible amounts.As SVMs constantly learns, the accuracy of identification and robustness of system can also be gradually stepped up.
Finally, due to when by gather leakage electromagnetic signal come realize chip type recognize, whole process is noncontact
Property and the normal work that does not interfere with chip so that whole identification process is disguised very well, the information for being obtained is also more accurate
It is really in time and continuous reliable.
Due to generally only several millivolts of the electromagnetic signal for collecting, for the ease of subsequently processing electromagnetic signal, can
Electromagnetic signal to collecting is amplified.Accordingly, as a kind of alternative embodiment, said system also includes preposition amplification
Device；
Preamplifier is connected with electromagnetic probe and digital storage oscilloscope respectively；Preamplifier is used to visit electromagnetism
The electromagnetic signal that head is collected is amplified.
Because loading plate needs power supply to power in test process, so as to power supply, this reality can also be included in said system
Example is applied to be not especially limited this.Loading plate can be connected by current supply circuit with power supply, so that power supply can power for loading plate.
Further, since power supply can also produce electromagnetic signal, in order to reduce the electromagnetic signal when institute of the electromagnetic signal to acquisition chip of power supply
The interference of generation, used as a kind of alternative embodiment, above-mentioned power supply can be voltage-stabilized power supply.Wherein, power supply can be by increasing LDO
(Low Dropout Regulator, low pressure difference linear voltage regulator) forms voltage-stabilized power supply, and the present embodiment do not make specific limit to this
It is fixed.Compared to the power supply mode by conventional male prongs grafting, being powered by voltage-stabilized power supply can reduce the interference of ground signal, from
And can further ensure to collect the accuracy of electromagnetic signal.In addition, power consumption can also be reduced.
Used as a kind of alternative embodiment, above-mentioned loading plate includes core board and base plate；Core board is used to load to be identified
Chip, base plate is used to load core board.By way of core board is combined with base plate and is loaded chip on the core board, can
Core board is easily dismantled from base plate such that it is able to be easy to recognize different chips on same base plate.Wherein, base plate is wherein
One layer of PCB (Printed Circuit Board, printed circuit board) design can be as shown in figure 1, wherein one layer of core board
PCB design can be as shown in Figure 2.In addition, for the ease of realizing being seamlessly connected with base plate, the I/O interfaces of core board can be used
2.54mm spacing row's pin is drawn, and the present embodiment is not especially limited to this.
In view of in identification chip, it is also possible to need some data to chip internal to store, such as encryption of chip
Key, so as to used as a kind of alternative embodiment, loading plate also includes Flash chip and pinboard；Above-mentioned base plate is used to load and turns
Fishplate bar, pinboard is used to load the Flash chip of different capabilities.It should be noted that Flash chip can be encapsulated using sop8
It is pluggable to realize, can be easy to switch the chip of different capabilities by pinboard.Wherein, the PCB of wherein one layer of pinboard sets
Meter can be as shown in Figure 3.
Interference during in order to further reduce powered electromagnetic signal to collection electromagnetic signal, as a kind of optional implementation
Example, each power pins is connected with the decoupling capacitor of default size in loading plate.Wherein, the size of decoupling capacitor can be
0.1uf, the present embodiment is not especially limited to this.
Preferably, the structure of chip type identifying system can be as shown in Figure 4.
Above-mentioned all optional technical schemes, can form alternative embodiment of the invention, herein no longer using any combination
Repeat one by one.
Based on the chip type identifying system that above-mentioned Fig. 4 correspondence embodiments are provided, one kind is the embodiment of the invention provides
Chip type recognition methods.Referring to Fig. 5, the method flow that the present embodiment is provided includes：The electricity revealed when the 501st, to chip operation
Magnetic signal is detected；502nd, when detect the electromagnetic signal for collecting more than the first predetermined threshold value when, with current time for
Initial point, records to follow-up electromagnetic signal, untill detecting electromagnetic signal less than the second predetermined threshold value, obtains correspondence
Target electromagnetic signal record；503rd, the SVMs based on training in advance, chip is determined according to target electromagnetic signal record
Chip type.
Method provided in an embodiment of the present invention, the electromagnetic signal revealed during by chip operation is detected.Work as detection
When being more than the first predetermined threshold value to the electromagnetic signal for collecting, with current time as starting point, follow-up electromagnetic signal is carried out
Record, untill detecting electromagnetic signal less than the second predetermined threshold value, obtains corresponding target electromagnetic signal record.Based on pre-
The SVMs first trained, the chip type of chip is determined according to target electromagnetic signal record.By being then based on machine learning
Method, the electromagnetic signal that will be collected is by the SVMs of training in advance come automatic identification chip type, identification process
Can be used for any occasion, so that identification process versatility and discrimination are higher.In addition, electromagnetic leakage curve needed for SVMs
Number it is less, i.e., required collecting sample negligible amounts.As SVMs constantly learns, the accuracy of identification of system and Shandong
Rod can also be gradually stepped up.
Finally, due to when by gather leakage electromagnetic signal come realize chip type recognize, whole process is noncontact
Property and the normal work that does not interfere with chip so that whole identification process is disguised very well, the information for being obtained is also more accurate
It is really in time and continuous reliable.
Used as a kind of alternative embodiment, the SVMs based on training in advance determines according to target electromagnetic signal record
Before the chip type of chip, also include：
SVMs is trained according to the electromagnetic signal that all kinds chip is operationally collected, is instructed
SVMs after white silk.
As a kind of alternative embodiment, the electromagnetic signal operationally collected according to all kinds chip to support to
Amount machine is trained, and before the SVMs after being trained, also includes：
The electromagnetic signal recordings that collection each type chip is operationally revealed；
The electromagnetic signal recordings that each type chip is collected are pre-processed；
SVMs is trained according to the electromagnetic signal that all kinds chip is operationally collected, is instructed
SVMs after white silk, including：
According to all kinds chip pretreated parameter of correspondence, SVMs is trained, after being trained
SVMs.
As a kind of alternative embodiment, the electromagnetic signal recordings that each type chip is collected are pre-processed, wrapped
Include：
For the electromagnetic signal recordings that any kind chip is collected, when the quantity of electromagnetic signal recordings is for multiple,
On the basis of any electromagnetic signal recordings, remaining each electromagnetic signal recordings are shifted；
With the degree of correlation between any electromagnetic signal recordings after being shifted according to remaining each electromagnetic signal recordings, will be remaining
Each electromagnetic signal recordings alignd with any electromagnetic signal recordings；
Based on data component parser, according to alignment after each electromagnetic signal recordings extract corresponding characteristic parameter.
As a kind of alternative embodiment, based on data component parser, according to alignment after each electromagnetic signal recordings
Before extracting corresponding characteristic parameter, also include：
Each electromagnetic signal recordings after by alignment carry out frequency-domain analysis, each electromagnetic signal recordings institute after being alignd
Corresponding spectrum value record；
Based on data component parser, according to alignment after each electromagnetic signal recordings extract corresponding characteristic parameter,
Including：
Based on data component parser, corresponding characteristic parameter is extracted according to each spectrum value record.
Used as a kind of alternative embodiment, data component parser is pivot analysis of components or independent component analysis.
As a kind of alternative embodiment, by alignment after each electromagnetic signal recordings carry out frequency-domain analysis, after being alignd
Each electromagnetic signal recordings corresponding to spectrum value record before, also include：
Each electromagnetic signal recordings after by alignment carry out time-domain analysis.
Used as a kind of alternative embodiment, the SVMs based on training in advance determines according to target electromagnetic signal record
Before the chip type of chip, also include：
Target electromagnetic signal record is pre-processed；
SVMs based on training in advance, the chip type of chip is determined according to target electromagnetic signal record, including：
Resulting parameter is input into the SVMs of training in advance after target electromagnetic signal record is pre-processed,
Obtain corresponding chip type.
Above-mentioned all optional technical schemes, can form alternative embodiment of the invention, herein no longer using any combination
Repeat one by one.
Due to chip operationally, it is different, and different types of to do the electromagnetic signal that different type computing revealed
The electromagnetic signal that chip is revealed when the computing of same type is done is also different, that is, make the electromagnetism letter that certain computing is revealed
Number a certain chip type is can be mapped to, the electromagnetic signal revealed during such that it is able to using chip operation is known to chip type
Not.According to above-mentioned theory, chip type identifying system and Fig. 5 correspondence embodiments that embodiment is provided are corresponded to based on above-mentioned Fig. 4
The chip type recognition methods of offer, the embodiment of the invention provides a kind of chip type recognition methods.Referring to Fig. 6,601, right
The electromagnetic signal revealed during chip operation is detected；602nd, it is more than the first predetermined threshold value when detecting the electromagnetic signal that collects
When, with current time as starting point, follow-up electromagnetic signal is recorded, preset less than second until detecting electromagnetic signal
Untill threshold value, corresponding target electromagnetic signal record is obtained；603rd, the electricity operationally collected according to all kinds chip
Magnetic signal is trained to SVMs, the SVMs after being trained；604th, the supporting vector based on training in advance
Machine, the chip type of chip is determined according to target electromagnetic signal record.
The electromagnetic signal revealed when wherein, 601, to chip operation is detected.
When being detected to electromagnetic signal, chip can be revealed by electromagnetic probe in the corresponding systems of above-mentioned Fig. 4
Electromagnetic signal is detected.In addition, for the ease of subsequently processing electromagnetic signal, can also be by the corresponding systems of Fig. 4
Middle preamplifier is amplified to electromagnetic signal, and the present embodiment is not especially limited to this.It should be noted that in this step
Chip can be chip to be identified under any monitoring of environmental, the present embodiment is not especially limited to this.
Wherein, 602, when the electromagnetic signal for collecting is detected more than the first predetermined threshold value, with current time for initial
Point, records to follow-up electromagnetic signal, untill detecting electromagnetic signal less than the second predetermined threshold value, obtains corresponding
Target electromagnetic signal record.
Produced electromagnetic signal is eager to excel during due to the operationally produced electromagnetic signal of chip typically than not working, from
And whether the electromagnetic signal that can be collected by detection judges whether chip starts working more than the first predetermined threshold value, pass through
Whether the detection electromagnetic signal that collects judges whether chip is stopped less than the second predetermined threshold value, the present embodiment to this not
Make specific restriction.
Recorded by the electromagnetic signal in this period, a target electromagnetic signal recordings can be obtained.Need
Illustrate, the target electromagnetic signal record bar number that this step is collected can be one, or a plurality of, the present embodiment pair
This is not especially limited.In addition, the electromagnetic signal recordings reflection for collecting is in Fig. 4 correspondence systems during digital storage oscilloscope,
It is a string of magnitudes of voltage of sampled point.It is mainly corresponding to electromagnetic signal in subsequent step when processing electromagnetic signal
Magnitude of voltage is processed, and the present embodiment is not especially limited to this.
Wherein, 603 the electromagnetic signal for, operationally being collected according to all kinds chip is instructed to SVMs
Practice, the SVMs after being trained.
Due to subsequently needing to be identified chip type according to the SVMs of training in advance, so as in this step
In SVMs can be obtained by training.It should be noted that this step is intended merely to describe the training of SVMs
Journey.When reality is identified to chip type, the content of this step should be the work being already prepared in advance, and be not used in every
The content of this step is repeated during secondary identification chip type.
Before this step is performed, the electromagnetic signal recordings that each type chip is operationally revealed, this reality can be first gathered
Example is applied to be not especially limited this.Specifically when electromagnetic signal recordings are gathered, can be by the corresponding chip type identifying systems of Fig. 4
It is acquired, the present embodiment is not especially limited to this.Specifically, different types of chip is loaded on loading plate in systems,
Each type chip can be collected by electromagnetic probe, preamplifier and digital storage oscilloscope operationally to reveal
Electromagnetic signal recordings.It should be noted that from above-mentioned steps 602, when being acquired to electromagnetic signal, can by
Detection electromagnetic signal is recorded after being more than the first predetermined threshold value to electromagnetic signal, until electromagnetic signal is less than the second predetermined threshold value
Untill, so as to intercept out one section of electromagnetic signal recordings.Correspondingly, this step is operationally revealed in collection each type chip
During electromagnetic signal recordings, it is also possible to be acquired by this way.
Preferably, in order to the electromagnetic signal recordings collected under Training Support Vector Machines environment are more accurate, can lead to
Cross and particular electrical circuit is set on loading plate, allow chip to export a high level by the I/O interfaces of loading plate when starting working, this
Embodiment is not especially limited to this.Because high level correspond to high-voltage value, so that digital storage oscilloscope here just can be with
According to the high-voltage value for detecting, it is easy to judge that chip is started working in ground.Correspondingly, it is same when chip power cut-off
A high level can be exported by the I/O interfaces of loading plate, the present embodiment is not especially limited to this.After said process terminates, two
Content between individual high-voltage value is and intercepts out electromagnetic signal recordings.It should be noted that when in Training Support Vector Machines,
If using the corresponding mode of above-mentioned high level during sampling electromagnetic signal, above-mentioned steps 602 are in the electricity to chip to be identified
When magnetic signal is sampled, electromagnetic signal recordings also can be in the same way intercepted, the present embodiment is not especially limited to this.
In order to expand the sample for collecting, for each type of chip, a plurality of chip electricity operationally can be gathered
Magnetic signal is recorded, and the present embodiment is not especially limited to this.Further, since electromagnetic signal recordings are actual being adopted by many sampled points
The magnitude of voltage that sample is arrived, such that it is able to pass through to set larger sample rate, allows comprising more sampled point in electromagnetic signal recordings, this
Embodiment is not especially limited to this.If for example, the corresponding every electricity for acquiring 200 times, collecting of a type of chip
There are 1999 sampled points in magnetic signal record, so that the data dimension that such cake core correspondence is collected is 200*1999.
From said process, the data dimension for collecting is generally very big.In addition, correlation between acquired electromagnetic data
Greatly, compared with redundancy, this causes to calculate and analyze data is all relatively difficult for information.In order to reduce the difficulty and workload of subsequent treatment,
Can be after the electromagnetic signal recordings that each type chip is operationally revealed be collected, the electricity collected to each type chip
Magnetic signal record is pre-processed, and the present embodiment is not especially limited to this.
Correspondingly, after being pre-processed to electromagnetic signal, when this step is performed, can be according to all kinds chip correspondence
Pretreated parameter is trained to SVMs, the SVMs after being trained, and the present embodiment is not made to have to this
Body is limited.
Now the process to electromagnetic signal recordings pretreatment is illustrated, on the electromagnetism collected to each type chip
The mode that signal record is pre-processed, the present embodiment is not especially limited to this, including but not limited to：For any sort core
The electromagnetic signal recordings that piece is collected, when the quantity of electromagnetic signal recordings is for multiple, with any electromagnetic signal recordings as base
Remaining each electromagnetic signal recordings are shifted by standard；With any electricity after being shifted according to remaining each electromagnetic signal recordings
The degree of correlation between magnetic signal record, remaining each electromagnetic signal recordings are alignd with any electromagnetic signal recordings；Base
In data component parser, according to alignment after each electromagnetic signal recordings extract corresponding characteristic parameter.
For any kind chip, when a plurality of electromagnetic signal recordings have been collected, due to every electromagnetic signal recordings phase
Time delay being might have for other electromagnetic signal recordings or being shifted to an earlier date, this can influence the accuracy of subsequent treatment result.In order to go
The interference on time dimension is removed, so as to can be alignd to electromagnetic signal recordings as procedure described above.For example, any sort core
The electromagnetic signal recordings that piece is collected have 200, remaining 199 articles can be alignd with the 1st article on the basis of the 1st article.
I.e. on time dimension, with the degree of correlation as reference frame, by remaining each electromagnetic signal recordings to moving forward or be moved back by,
Until the degree of correlation meets certain condition, so as to realize being alignd with the 1st article of electromagnetic signal recordings.
The present embodiment not to according to after remaining each electromagnetic signal recordings displacement between any electromagnetic signal recordings
The degree of correlation, specific restriction, bag are made by the mode that remaining each electromagnetic signal recordings are alignd with any electromagnetic signal recordings
Include but be not limited to：Calculate after remaining each electromagnetic signal recordings are shifted every time with the phase between any electromagnetic signal recordings
Guan Du；Maximum relation degree is selected from all degrees of correlation being calculated, using the corresponding shift result of maximum relation degree as surplus
Under each electromagnetic signal recordings alignd with any electromagnetic signal recordings after result.
For example, on the basis of the 1st article of electromagnetic signal recordings, electromagnetic signal recordings to be shifted are for as a example by the 3rd article.In the time
It is 0.4 to the 0.2 corresponding degree of correlation of reach if the 3rd article is 0.5 to the 0.1 corresponding degree of correlation of reach in dimension, is moved back by 0.1
The corresponding degree of correlation is 0.8.From the above results, maximum relation degree is 0.8, so that on time dimension, can be by the 3rd article of electricity
Magnetic signal record is moved back by 0.1, the result after being alignd with the 1st article of electromagnetic signal recordings as the 3rd article of electromagnetic signal recordings.
It should be noted that the displacement number of attempt of remaining each electromagnetic signal recordings can be for more than once, this reality
Apply example and specific restriction is not made to displacement number of attempt.In addition, the algorithm for calculating the degree of correlation can sample, any existing degree of correlation is calculated
Method, the present embodiment is also not especially limited to this.
For the electromagnetic signal recordings that any kind chip is collected, when all electromagnetic signals note to such cake core
After record is alignd, data component parser can be based on, according to alignment after each electromagnetic signal recordings extract corresponding spy
Levy parameter.
It is also information-related with frequency, phase etc. because electromagnetic signal is not only changed over time, exist to embody electromagnetic signal
Feature on frequency domain, based on data component parser, according to alignment after each electromagnetic signal recordings extract corresponding spy
Before levying parameter, can also by alignment after each electromagnetic signal recordings carry out frequency-domain analysis, each electromagnetism after being alignd
Spectrum value record corresponding to signal record, the present embodiment is not especially limited to this.Correspondingly, can be analyzed based on data component
Algorithm, corresponding characteristic parameter is extracted according to each spectrum value record.Wherein, frequency domain point can be carried out by Fast Fourier Transform (FFT)
Analysis, the present embodiment is not especially limited to this.
Similarly, in order to embody feature of the electromagnetic signal in time domain, before frequency-domain analysis is carried out, can first to electromagnetic signal
Record carries out time-domain analysis, then the electromagnetic signal recordings after time-domain analysis is carried out with frequency-domain analysis, and the present embodiment is not made to have to this
Body is limited.It should be noted that compare with pure time-domain analysis, sampling combine time-domain analysis can be follow-up with the mode of frequency-domain analysis
Discrimination and accuracy rate higher is obtained during identification.
By said process, for any kind chip, after all spectrum values for obtaining such cake core are recorded, can base
In data component parser, corresponding characteristic parameter is extracted according to each spectrum value record.Wherein, data component parser
Can be PCA (Principal Component Analysis, pivot analysis of components), or ICA (Independent
Component Correlation Algorithm, independent component analysis), the present embodiment is not especially limited to this.Need
Bright, the present embodiment is processed data using data component parser, primarily to dimensionality reduction, will above-mentioned 200*
The data of 1999 dimensions are reduced to relatively low dimension.
Wherein, when data component analysis is carried out using PCA, main composition contribution rate 85% to 90% can be set.For example, working as
When main composition contribution rate is set to 87%, the data of 200*1999 dimensions can be reduced to 200*136, so that after can greatly reducing
The continuous difficulty calculated with analysis.In addition, when carrying out data analysis using PCA, factor of influence less data can also be removed, subtract
Few information redundance, that is, remove contribution degree less data during to follow-up identification chip type.Data Dimensionality Reduction is carried out by PCA,
Can be as shown in fig. 7, the dimensionality reduction effect after dimensionality reduction can be as shown in Figure 8 before dimensionality reduction.
Compared to PCA is by initial data dimensionality reduction and extracts incoherent attribute, ICA is by initial data dimensionality reduction and carries
Take out separate attribute.When data component analysis is carried out using ICA, the number and dimensionality reduction dimension of independent component can be set
Parameter, so as to realize Data Dimensionality Reduction.Data Dimensionality Reduction is carried out by ICA, dimensionality reduction effect can be as shown in Figure 9.
The process of pretreatment more than, can obtain each type chip pretreated parameter of correspondence.By to pre- place
Parameter after reason carries out features training and analysis identification, the SVMs after being trained.Wherein, SVM (Support
Vector Machine, SVMs) be by a Nonlinear Mapping p, by sample space be mapped to a higher-dimension or even
In infinite dimensional feature space (such as Hilbert spaces) so that in original sample space Nonlinear separability problem
The problem of the linear separability in feature space can be converted into.Wherein, the present embodiment is used by Taiwan Univ. Chih-Chung
The libsvm tool boxes that Chang and Chih-Jen Lin write.It is of course also possible to use other types of SVM tool boxes, this reality
Example is applied to be not especially limited this.
It should be noted that due to being that linear learning machine is set up in high-dimensional feature space, so that compared with linear model,
Not only hardly increase the complexity of calculating, and avoid " dimension disaster " to a certain extent.
Wherein, 604, the SVMs based on training in advance, the chip of chip is determined according to target electromagnetic signal record
Type.
Based on the content in above-mentioned steps 603, before this step is performed, first target electromagnetic signal record can be carried out
Pretreatment, the present embodiment is not especially limited to this.Specific preprocessing process refers to the content in above-mentioned steps 603, herein
Repeat no more.
Correspondingly, resulting parameter is input into the branch of training in advance after target electromagnetic signal record can be pre-processed
Vector machine is held, is recognized by the judgement of SVMs, so as to can obtain corresponding chip type.
Method provided in an embodiment of the present invention, the electromagnetic signal revealed during by chip operation is detected.Work as detection
When being more than the first predetermined threshold value to the electromagnetic signal for collecting, with current time as starting point, follow-up electromagnetic signal is carried out
Record, untill detecting electromagnetic signal less than the second predetermined threshold value, obtains corresponding target electromagnetic signal record.Based on pre-
The SVMs first trained, the chip type of chip is determined according to target electromagnetic signal record.By being then based on machine learning
Method, the electromagnetic signal that will be collected is by the SVMs of training in advance come automatic identification chip type, identification process
Can be used for any occasion, so that identification process versatility and discrimination are higher.In addition, electromagnetic leakage curve needed for SVMs
Number it is less, i.e., required collecting sample negligible amounts.As SVMs constantly learns, the accuracy of identification of system and Shandong
Rod can also be gradually stepped up.
Finally, due to when by gather leakage electromagnetic signal come realize chip type recognize, whole process is noncontact
Property and the normal work that does not interfere with chip so that whole identification process is disguised very well, the information for being obtained is also more accurate
It is really in time and continuous reliable.
A kind of chip type identifying device is the embodiment of the invention provides, the device is used to perform above-mentioned Fig. 5 or Fig. 6 correspondences
Embodiment provided in chip type recognition methods.Referring to Figure 10, the device includes：
Detection module 1001, the electromagnetic signal revealed during for chip operation is detected；
Logging modle 1002, for when detect the electromagnetic signal for collecting more than the first predetermined threshold value when, with it is current when
It is starting point to carve, and follow-up electromagnetic signal is recorded, and untill detecting electromagnetic signal less than the second predetermined threshold value, is obtained
To corresponding target electromagnetic signal record；
Determining module 1003, for the SVMs based on training in advance, core is determined according to target electromagnetic signal record
The chip type of piece.
Used as a kind of alternative embodiment, the device also includes：
Training module, the electromagnetic signal for operationally being collected according to all kinds chip is entered to SVMs
Row training, the SVMs after being trained.
Used as a kind of alternative embodiment, the device also includes：
Acquisition module, for gathering the electromagnetic signal recordings that each type chip is operationally revealed；
First pretreatment module, for being pre-processed to the electromagnetic signal recordings that each type chip is collected；
Above-mentioned training module, for according to all kinds chip pretreated parameter of correspondence, being carried out to SVMs
Training, the SVMs after being trained.
As a kind of alternative embodiment, the first pretreatment module, including：
Shift unit, for the electromagnetic signal recordings collected for any kind chip, when electromagnetic signal recordings
When quantity is for multiple, on the basis of any electromagnetic signal recordings, remaining each electromagnetic signal recordings are shifted；
Alignment unit, for according to after remaining each electromagnetic signal recordings displacement between any electromagnetic signal recordings
The degree of correlation, remaining each electromagnetic signal recordings are alignd with any electromagnetic signal recordings；
Extraction unit, for based on data component parser, according to alignment after each electromagnetic signal recordings extract right
The characteristic parameter answered.
Used as a kind of alternative embodiment, the first pretreatment module also includes：
Frequency-domain analysis unit, carries out frequency-domain analysis, after being alignd for each electromagnetic signal recordings after by alignment
Spectrum value record corresponding to each electromagnetic signal recordings；
Said extracted unit, for based on data component parser, corresponding spy being extracted according to each spectrum value record
Levy parameter.
Used as a kind of alternative embodiment, data component parser is pivot analysis of components or independent component analysis.
Used as a kind of alternative embodiment, the first pretreatment module also includes：
Time-domain analysis unit, time-domain analysis is carried out for each electromagnetic signal recordings after by alignment.
Used as a kind of alternative embodiment, the device also includes：
Second pretreatment module, for being pre-processed to target electromagnetic signal record；
Above-mentioned determining module 1003, for target electromagnetic signal record to be pre-processed after resulting parameter be input into
The SVMs of training in advance, obtains corresponding chip type.
Device provided in an embodiment of the present invention, the electromagnetic signal revealed during by chip operation is detected.Work as detection
When being more than the first predetermined threshold value to the electromagnetic signal for collecting, with current time as starting point, follow-up electromagnetic signal is carried out
Record, untill detecting electromagnetic signal less than the second predetermined threshold value, obtains corresponding target electromagnetic signal record.Based on pre-
The SVMs first trained, the chip type of chip is determined according to target electromagnetic signal record.By being then based on machine learning
Method, the electromagnetic signal that will be collected is by the SVMs of training in advance come automatic identification chip type, identification process
Can be used for any occasion, so that identification process versatility and discrimination are higher.In addition, electromagnetic leakage needed for SVMs is bent
The number of line is less, i.e., required collecting sample negligible amounts.As SVMs constantly learns, the accuracy of identification of system and
Robustness can also be gradually stepped up.
Finally, due to when by gather leakage electromagnetic signal come realize chip type recognize, whole process is noncontact
Property and the normal work that does not interfere with chip so that whole identification process is disguised very well, the information for being obtained is also more accurate
It is really in time and continuous reliable.
Finally, the present processes are only preferably embodiment, are not intended to limit the scope of the present invention.It is all
Within the spirit and principles in the present invention, any modification, equivalent substitution and improvements made etc. should be included in protection of the invention
Within the scope of.
Claims (10)
1. a kind of chip type identifying system, it is characterised in that the system includes：Loading plate, terminal, electromagnetic probe and numeral
Storage oscillograph；
The loading plate is connected with the terminal, and the terminal is connected with the digital storage oscilloscope, and the numeral is deposited
Storage oscillograph is connected with the electromagnetic probe；
Wherein, the loading plate is mounted with chip to be identified；The electromagnetic probe is used to gather the electricity of the loading plate leakage
Magnetic signal, the digital storage oscilloscope is used to record the electromagnetic signal of the electromagnetic probe collection；The terminal is used for basis
Result after being analyzed to electromagnetic signal, identification chip type.
2. system according to claim 1, it is characterised in that the loading plate includes core board and base plate；The core
Plate is used to load chip to be identified, and the base plate is used to load the core board.
3. system according to claim 1, it is characterised in that the loading plate also includes Flash chip and pinboard；Institute
State base plate is used to load the Flash chip of different capabilities for loading the pinboard, the pinboard.
4. a kind of chip type recognition methods, it is characterised in that methods described includes：
The electromagnetic signal revealed during to chip operation is detected；
When the electromagnetic signal for collecting is detected more than the first predetermined threshold value, with current time as starting point, to follow-up electricity
Magnetic signal is recorded, and untill detecting electromagnetic signal less than the second predetermined threshold value, obtains corresponding target electromagnetic signal
Record；
SVMs based on training in advance, the chip type of the chip is determined according to target electromagnetic signal record.
5. method according to claim 4, it is characterised in that the SVMs based on training in advance, according to institute
Before stating the chip type that target electromagnetic signal record determines the chip, also include：
SVMs is trained according to the electromagnetic signal that all kinds chip is operationally collected, after being trained
SVMs.
6. method according to claim 5, it is characterised in that described operationally to be collected according to all kinds chip
Electromagnetic signal SVMs is trained, before the SVMs after being trained, also include：
The electromagnetic signal recordings that collection each type chip is operationally revealed；
The electromagnetic signal recordings that each type chip is collected are pre-processed；
The electromagnetic signal operationally collected according to all kinds chip is trained to SVMs, is instructed
SVMs after white silk, including：
According to all kinds chip pretreated parameter of correspondence, SVMs is trained, the support after being trained
Vector machine.
7. method according to claim 6, it is characterised in that the electromagnetic signal collected to each type chip
Record is pre-processed, including：
For the electromagnetic signal recordings that any kind chip is collected, when the quantity of electromagnetic signal recordings is for multiple, to appoint
On the basis of one electromagnetic signal recordings, remaining each electromagnetic signal recordings are shifted；
With the degree of correlation between any electromagnetic signal recordings after being shifted according to remaining each electromagnetic signal recordings, will be remaining
Each electromagnetic signal recordings alignd with any electromagnetic signal recordings；
Based on data component parser, according to alignment after each electromagnetic signal recordings extract corresponding characteristic parameter.
8. method according to claim 7, it is characterised in that described based on data component parser, after alignment
Each electromagnetic signal recordings extract corresponding characteristic parameter before, also include：
Each electromagnetic signal recordings after by alignment carry out frequency-domain analysis, corresponding to each electromagnetic signal recordings after being alignd
Spectrum value record；
It is described based on data component parser, according to alignment after each electromagnetic signal recordings extract corresponding characteristic parameter,
Including：
Based on data component parser, corresponding characteristic parameter is extracted according to each spectrum value record.
9. the method according to any claim in claim 4 to 8, it is characterised in that described based on training in advance
SVMs, before determining the chip type of the chip according to target electromagnetic signal record, also includes：
Target electromagnetic signal record is pre-processed；
The SVMs based on training in advance, the chip type of the chip is determined according to target electromagnetic signal record,
Including：
Resulting parameter is input into the SVMs of training in advance after target electromagnetic signal record is pre-processed, and is obtained
Corresponding chip type.
10. a kind of chip type identifying device, it is characterised in that described device includes：
Detection module, the electromagnetic signal revealed during for chip operation is detected；
Logging modle, for being starting with current time when the electromagnetic signal for collecting is detected more than the first predetermined threshold value
Point, records to follow-up electromagnetic signal, untill detecting electromagnetic signal less than the second predetermined threshold value, obtains corresponding
Target electromagnetic signal record；
Determining module, for the SVMs based on training in advance, the chip is determined according to target electromagnetic signal record
Chip type.
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