CN106802357B - 一种开尔文显微探测二维图像的数字信号处理和分析方法 - Google Patents
一种开尔文显微探测二维图像的数字信号处理和分析方法 Download PDFInfo
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- CN106802357B CN106802357B CN201611159153.6A CN201611159153A CN106802357B CN 106802357 B CN106802357 B CN 106802357B CN 201611159153 A CN201611159153 A CN 201611159153A CN 106802357 B CN106802357 B CN 106802357B
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/30—Scanning potential microscopy
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/002—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the work function voltage
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/20—Design optimisation, verification or simulation
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T5/00—Image enhancement or restoration
- G06T5/70—Denoising; Smoothing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10056—Microscopic image
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20024—Filtering details
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- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Health & Medical Sciences (AREA)
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- Chemical & Material Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Biochemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Evolutionary Computation (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Geometry (AREA)
- Computer Hardware Design (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
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Abstract
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CN201611159153.6A CN106802357B (zh) | 2016-12-15 | 2016-12-15 | 一种开尔文显微探测二维图像的数字信号处理和分析方法 |
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CN201611159153.6A CN106802357B (zh) | 2016-12-15 | 2016-12-15 | 一种开尔文显微探测二维图像的数字信号处理和分析方法 |
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CN106802357A CN106802357A (zh) | 2017-06-06 |
CN106802357B true CN106802357B (zh) | 2019-06-25 |
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Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
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CN107860946A (zh) * | 2017-08-09 | 2018-03-30 | 中国船舶重工集团公司第七二五研究所 | 一种快速大通量筛选和评价金属缓蚀剂的方法 |
CN108195921B (zh) * | 2017-12-13 | 2020-06-23 | 南京邮电大学 | 一种从静电力显微镜探测图像中提取表面电势信号的方法 |
CN112067852A (zh) * | 2020-09-24 | 2020-12-11 | 中国矿业大学(北京) | 一种评价表面活性剂抑尘效果的方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101788572A (zh) * | 2010-01-26 | 2010-07-28 | 中山大学 | 一种开尔文探针力显微镜及其测量方法 |
CN102507988A (zh) * | 2011-10-13 | 2012-06-20 | 中山大学 | 一种开尔文探针力显微镜的间歇接触式测量方法 |
CN102981023A (zh) * | 2012-11-21 | 2013-03-20 | 哈尔滨理工大学 | 一种静电力显微镜测量表面电势的方法 |
CN105809675A (zh) * | 2016-03-03 | 2016-07-27 | 魏晓峰 | 一种二维图像分析方法及系统 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
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US8417688B2 (en) * | 2010-07-23 | 2013-04-09 | International Business Machines Corporation | Converting two-tier resource mapping to one-tier resource mapping |
US8887119B2 (en) * | 2013-03-12 | 2014-11-11 | Analog Devices Technology | Method and apparatus for current limit test for high power switching regulator |
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2016
- 2016-12-15 CN CN201611159153.6A patent/CN106802357B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101788572A (zh) * | 2010-01-26 | 2010-07-28 | 中山大学 | 一种开尔文探针力显微镜及其测量方法 |
CN102507988A (zh) * | 2011-10-13 | 2012-06-20 | 中山大学 | 一种开尔文探针力显微镜的间歇接触式测量方法 |
CN102981023A (zh) * | 2012-11-21 | 2013-03-20 | 哈尔滨理工大学 | 一种静电力显微镜测量表面电势的方法 |
CN105809675A (zh) * | 2016-03-03 | 2016-07-27 | 魏晓峰 | 一种二维图像分析方法及系统 |
Non-Patent Citations (3)
Title |
---|
AFM tip characterization by Kelvin probe force microscopy;C Barth1 et al.;《New Journal of Physics》;20100915;第1-12页 |
Charge transfer of single laser crystallized intrinsic and phosphorus-doped Si-nanocrystals visualized by Kelvin probe force microscopy;Jie Xu et al.;《JOURNAL OF APPLIED PHYSICS》;20141007(第116期);第134309-1-134309-5页 |
基于开尔文探针力显微镜的纳米复合材料次表面成像分析;熊晓洋 等;《纳米技术与精密工程》;20161130;第14卷(第6期);第402-408页 |
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