CN106771377A - The draw bail and probe rod fixing means of a kind of vertical fixed probe rod - Google Patents
The draw bail and probe rod fixing means of a kind of vertical fixed probe rod Download PDFInfo
- Publication number
- CN106771377A CN106771377A CN201710149681.1A CN201710149681A CN106771377A CN 106771377 A CN106771377 A CN 106771377A CN 201710149681 A CN201710149681 A CN 201710149681A CN 106771377 A CN106771377 A CN 106771377A
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- China
- Prior art keywords
- probe rod
- probe
- conductive plate
- vertical fixed
- end point
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/16—Probe manufacture
Abstract
The invention discloses the draw bail and probe rod fixing means of a kind of vertical fixed probe rod, it includes conductive plate（5）, magnet（18）Absorption is in conductive plate（5）Top, conductive plate（5）With upper adjusting bracket（4）Connection, conductive plate（5）Lower surface be plane, conducting resinl（19）It is coated in conductive plate（5）Lower surface on；The first step：Make one end point long probe rod；Second step：Make carrying magnetic one end point long probe rod；3rd step：It is uniform on the lower surface of conductive plate to apply conducting resinl；4th step：Vertical fixed carrying magnetic one end point long probe rod on the lower surface of conductive plate；The draw bail for solving prior art fixation probe rod is difficult to short probe rod vertically, it is necessary to by instrument, the perpendicularity of probe axis be adjusted by the draw bail of upper adjusting bracket or fixed probe rod, adjustment probe axis perpendicularity is more difficult；The needle point of probe axis out of plumb influence probe influences the needle point of probe to make quality in probe axis.
Description
Technical field
A kind of equipment the present invention relates to make tunneling scanning microscope probe, and in particular to connection of vertical fixed probe rod
Binding structure and probe rod fixing means.
Background technology
The common unit (see Fig. 1) for making tunneling scanning microscope probe includes support, lower adjusting bracket, lower adjusting tray；
Upper adjusting bracket, conductive plate, Probe clip, battery, wire, conducting ring and beaker, wherein, conductive plate and Probe clip composition fix probe
The draw bail of rod；Lower adjusting bracket and upper adjusting bracket are connected with support, and conductive plate couples with upper adjusting bracket, Probe clip with it is conductive
Plate couples；In beaker, there is hole at the center of the conducting ring of stainless steel to conducting ring, and conducting ring is fixed on lower adjusting tray, lowers
Section pallet couples with lower adjusting bracket；The positive and negative electrode of battery distinguishes conductive plate by wire and conducting ring is connected.
When making the probe of PSTM with the common unit for making tunneling scanning microscope probe, short probe rod
Upper end be fixed on conductive plate by Probe clip, NaOH's stretched into the lower end for having the aqueous solution of NaOH, short probe rod in beaker
In the aqueous solution and through the hole on conducting ring, short probe rod is the tungsten filament of 0.1 1.5mm diameters, and conducting ring is in the water-soluble of NaOH
In liquid and near the liquid level of the aqueous solution of NaOH；After short probe rod is through electrolysis, the tungsten filament in conductive annular distance comes to a point, short probe rod
It is changed into one end short probe of point, one end short probe of point is with the obtained scanning of the common unit for making tunneling scanning microscope probe
The probe of tunnel microscope.
In the common unit for making tunneling scanning microscope probe, the draw bail of fixed probe rod is difficult to short spy
Needle bar is vertical, generally requires by instrument, and hanging down for probe axis is adjusted by the draw bail of upper adjusting bracket or fixed probe rod
Straight degree, and the perpendicularity of adjustment probe axis is more difficult；Probe axis out of plumb, influence probe needle point in probe axis,
The needle point of probe is influenceed to make quality.
The content of the invention：
The technical problem to be solved in the present invention is：Draw bail and the probe rod fixation side of a kind of vertical fixed probe rod are provided
Method, for vertical fixed probe rod in the device for making tunneling scanning microscope probe, improves the perpendicularity of probe axis.
Technical solution of the present invention：
A kind of draw bail of vertical fixed probe rod, it includes conductive plate, magnet and conducting resinl, and magnet adsorption is in conductive plate
Top, conductive plate couples with upper adjusting bracket, and the lower surface of conductive plate is plane, and conducting resinl is coated on the lower surface of conductive plate.
The needle point of carrying magnetic one end point long probe rod adsorbs the lower surface in conductive plate, carrying magnetic one end point long probe rod
There is conducting resinl around needle point；Surface magnetic material at needle point, the height a of magnetic material be make probe tungsten filament it is straight
13 times of footpath.
Cone height of the height of conducting resinl less than the needle point of carrying magnetic one end point long probe rod.
A kind of method of the vertical fixed probe rod of draw bail of vertical fixed probe rod, it includes：
The first step：Make one end point long probe rod；
Second step：Make carrying magnetic one end point long probe rod；
3rd step：It is uniform on the lower surface of conductive plate to apply conducting resinl；
4th step：Vertical fixed carrying magnetic one end point long probe rod on the lower surface of conductive plate.
The method for making one end point long probe rod is：Take a straight long probe rod, the material of long probe rod with to make
PSTM probe material it is identical, the probe of the diameter of long probe rod and the PSTM to be made
Diameter it is identical, the length of long probe rod is than meeting 1 5mm, general more than the shortest length of short probe needs of follow-up making one end point
Long probe rod is arranged on the common unit for making tunneling scanning microscope probe and makes one end point long probe rod.
The method for making carrying magnetic one end point long probe rod is：Magnetic material is plated into the spy long of point at one end with electric plating method
At the needle point of needle bar, then the magnetic material magnetization to being plated at needle point, obtain carrying magnetic one end point long probe rod.
The method of uniform painting conducting resinl is on the lower surface of conductive plate：Conducting resinl is evenly coated in the lower surface of conductive plate
On, the cone height of the needle point of the height less than carrying magnetic one end point long probe rod of conducting resinl.
The method of vertical fixed carrying magnetic one end point long probe rod is on the lower surface of conductive plate：By carrying magnetic one end point
The needle point insertion conducting resinl of long probe rod is simultaneously contacted with the lower surface of conductive plate, treats the probe shaft of carrying magnetic one end point long probe rod
After line is vertical, Curing conductive adhesive afterwards, conducting resinl can be increased at the needle point of carrying magnetic one end point long probe rod and is gradually consolidated
Change.
Beneficial effects of the present invention：
The present invention changes the draw bail of fixed probe rod on the basis of the common unit for making tunneling scanning microscope probe
It is the draw bail of vertical fixed probe rod, forms the making scanning tunneling microscopic of the draw bail with vertical fixed probe rod
The device of mirror probe；On the device of the making tunneling scanning microscope probe of the draw bail with vertical fixed probe rod,
Magnet adsorbs in the bottom surface of conductive plate the needle point of carrying magnetic one end point long probe rod, with conducting resinl by carrying magnetic around needle point
One end point long probe rod sticks to the bottom surface of conductive plate, and the needle point of carrying magnetic one end point long probe rod is adsorbed in the bottom surface of conductive plate
Afterwards, the straight attitude of probe axis weight is turned to around needle point under gravity, after conductive adhesive curing, realizes vertical fixed probe
Rod.
The features of the present invention：
1. after vertical fixed probe rod, probe axis are vertical with the liquid level of the aqueous solution of NaOH in ground and beaker, are conducive to electricity
The needle point of solution gained probe is in probe axis.
2. the draw bail of vertical fixed probe rod is simple, during vertical fixed probe rod, it is not necessary to special adjustment probe
The mechanism of rod perpendicular attitude and instrument.
3. in vertical fixed carrying magnetic one end point long probe rod on the lower surface of conductive plate, carrying magnetic one end point long probe
Rod is rotated around needle point under gravity, and the moment of resistance of needle point is small, highly small, the moment of resistance of conducting resinl of the conducting resinl at needle point
It is small, be conducive to improving the perpendicularity of probe axis.
Brief description of the drawings
Fig. 1 is the common unit for making tunneling scanning microscope probe and the schematic diagram for making one end short probe of point；
Fig. 2 is the A-A profiles of Fig. 1；
Fig. 3 is the short probe rod in Fig. 1；
Fig. 4 is one end short probe of point；
Fig. 5 is with making one end point long probe rod on the common unit for making tunneling scanning microscope probe；
Fig. 6 is the long probe rod in Fig. 5；
Fig. 7 is one end point long probe rod；
Fig. 8 is carrying magnetic one end point long probe rod；
Fig. 9 is the making scanning of the draw bail with vertical fixed probe rod and the draw bail with vertical fixed probe rod
The schematic diagram of the device of tunneling microscope probe；
Figure 10 is vertical fixed carrying magnetic one end point long probe rod on the lower surface of conductive plate；
Figure 11 is to make two with the device of the making tunneling scanning microscope probe of the draw bail with vertical fixed probe rod
Hold the schematic diagram of sharp short probe；
Figure 12 is the schematic diagram of the lower section that the two ends short probe of point is vertically fixed on conductive plate；
Figure 13 is that the two ends short probe of point in Figure 12 is bonding with conductive plate；
Figure 14 is the two ends short probe of point in Figure 13.
Specific embodiment：
In Figure of description：1 support；2 times adjusting brackets；3 times adjusting trays；Adjusting bracket on 4；5 conductive plates；6 Probe clips；7 short spies
Needle bar；8 probe axis；9 batteries；10 wires；11 conducting rings；12 beakers；13 electrolyte；14 one end short probe of point；15 long probes
Rod；16 one end point long probe rod；17 carrying magnetic one end point long probe rod；18 magnet；19 conducting resinls；The 20 two ends short probe of point；A magnetic
The height of property material.
In the present invention, the short probe rod, long probe rod, one end point long probe rod and carrying magnetic one end point long probe rod are equal
It is probe rod, the short probe of one end point and the two ends short probe of point are probe.
The common unit and making one end short probe of point of making tunneling scanning microscope probe are as shown in Fig. 14；With making
Making one end point long probe rod is as shown in Fig. 57 on the common unit of tunneling scanning microscope probe；Carrying magnetic one end point is long to be visited
Needle bar is as shown in Figure 8；The system of the draw bail with vertical fixed probe rod and the draw bail with vertical fixed probe rod
The device for making tunneling scanning microscope probe is as shown in Figure 9；Vertical fixed carrying magnetic one end point is long on the lower surface of conductive plate
Probe rod is as shown in Figure 10；With the device of the making tunneling scanning microscope probe of the draw bail with vertical fixed probe rod
The making two ends short probe of point is as shown in Figure 11 14.
In the draw bail and method of vertical fixed probe rod, short probe rod 7, long probe rod 15, one end point long probe
The sharp long probe rod 17 of rod 16 and carrying magnetic one end is probe rod, and the short probe 14 of one end point and the two ends short probe 20 of point are spy
Pin.
In the draw bail and method of vertical fixed probe rod, the making of the draw bail with vertical fixed probe rod
The device (see Fig. 9) of tunneling scanning microscope probe includes support 1, lower adjusting bracket 2, lower adjusting tray 3, upper adjusting bracket 4, conduction
Plate 5, battery 9, wire 10, conducting ring 11, beaker 12, magnet 18 and conducting resinl 19, wherein, conductive plate 5, magnet 18 and conducting resinl
The draw bail of the vertical fixed probe rod of 19 compositions；Lower adjusting bracket 2 and upper adjusting bracket 4 are connected with support 1, and magnet 18 is adsorbed
The top of conductive plate 5, conductive plate 5 couples with upper adjusting bracket 4, and the lower surface of conductive plate 5 is plane, and conducting resinl 19 is coated in conductive plate
On 5 lower surface；There is hole at the center of the conducting ring 11 of stainless steel, and conducting ring 11 is fixed on lower adjusting tray 3, lower adjusting tray
3 couple with lower adjusting bracket 2, and conducting ring 11 is in beaker 12；The positive and negative electrode of battery 9 distinguishes conductive plate 5 and conduction by wire 10
Ring 11 is connected.
In the draw bail and method of vertical fixed probe rod, the needle point absorption of the sharp long probe rod 17 in carrying magnetic one end exists
The lower surface of conductive plate 5, toughness, conductive conducting resinl 19 around the needle point of the sharp long probe rod 17 in carrying magnetic one end；Band magnetic
Property one end point long probe rod 17 be making probe of the one end with needle point tungsten filament, surface magnetic material at needle point and
Band is magnetic, and the height a of magnetic material is 13 times of the tungsten filament diameter for making probe.
In the draw bail and method of vertical fixed probe rod, the height of the conducting resinl 19 of solidification is less than band magnetic for the first time
Property one end point long probe rod 17 needle point cone height.
In the draw bail and method of vertical fixed probe rod, the method and steps of vertical fixed probe rod：
The first step：With making one end point long probe rod on the common unit for making tunneling scanning microscope probe (see Fig. 5).
Take a straight long probe rod 15, the material of long probe rod 15 and the probe of the PSTM to be made
Material is identical, and the diameter of long probe rod 15 is identical with the diameter of the probe of the PSTM to be made, long probe rod 15
Length than meeting 1 5mm more than the shortest length of follow-up making one end short needs of probe 14 of point, long probe rod 15 is arranged on and is made
Make to make the sharp long probe rod 16 in one end on the common unit of tunneling scanning microscope probe.
The probe of the PSTM of the tungsten filament of 0.5mm diameters is such as made, then it is straight to take long probe rod 15
The tungsten filament of 0.5mm diameters, the length of long probe rod 15 is more than meeting the shortest length of the short needs of probe 14 of follow-up making one end point
1.5mm。
Second step：Make carrying magnetic one end point long probe rod.
Magnetic material is plated at the needle point of sharp long probe rod 16 at one end with electric plating method, then the magnetic to being plated at needle point
Property material magnetization, obtain carrying magnetic one end point long probe rod 17 (see Fig. 8).
3rd step：It is uniform on the lower surface of conductive plate to apply conducting resinl (see Fig. 9).
Conducting resinl 19 is evenly coated on the lower surface of conductive plate 5, the height of conducting resinl 19 is long less than carrying magnetic one end point
The cone height of the needle point of the probe rod 17 and height of conducting resinl 19 is as far as possible low.
4th step：Vertical fixed carrying magnetic one end point long probe rod on the lower surface of conductive plate (see Figure 10).
Contacted by the needle point insertion conducting resinl 19 of the sharp long probe rod 17 in carrying magnetic one end and with the lower surface of conductive plate 5, treated
After the probe axis 8 of the sharp long probe rod 17 in carrying magnetic one end are vertical, Curing conductive adhesive 19, this is the conducting resinl of solidification for the first time
19；It it is coupling for enhancing carrying magnetic one end point long probe rod 17 and conductive plate 5, Ke Yi for the first time after the conducting resinl 19 of solidification
Increase conducting resinl 19 at the needle point of the sharp long probe rod 17 in carrying magnetic one end and solidify, can repeatedly in carrying magnetic one end point long probe rod
Increase conducting resinl 19 at 17 needle point and gradually solidify.
After vertical fixed carrying magnetic one end point long probe rod 17 on the lower surface of conductive plate 5, complete with vertical solid
Vertical fixed carrying magnetic one end point long probe on the device of the making tunneling scanning microscope probe for determining the draw bail of probe rod
Rod 17, namely realize vertical fixed probe rod.
After vertical fixed probe rod, can be in the making PSTM of the draw bail with vertical fixed probe rod
Probe is made on the device of probe, its method and steps is as follows：
The first step：Two are made with the device of the making tunneling scanning microscope probe of the draw bail with vertical fixed probe rod
Hold sharp short probe.
The electrolyte 13 of the aqueous solution of NaOH is added in beaker 12, conducting ring is in the electrolyte 13 of the aqueous solution of NaOH
And near the liquid level of the electrolyte 13 of the aqueous solution of NaOH, the lower end of the vertical sharp long probe rod 17 in fixed carrying magnetic one end is stretched
In the electrolyte 13 of the aqueous solution for entering NaOH and through the hole on conducting ring 11, after energization, the connection with vertical fixed probe rod
The device of the making tunneling scanning microscope probe of binding structure makes the two ends short probe 20 of point（See Figure 11）, carrying magnetic one end point length
The sharp long probe rod 17 in carrying magnetic one end in lower end, the hole of conducting ring 11 of probe rod 17 is gradually electrolysed, and forms needle point, carrying magnetic one
The sharp long probe rod 17 in end is changed into the two ends short probe 20 of point, and the two ends short probe 20 of point is vertically fixed on the lower section of conductive plate 5（See figure
12）.
Second step：From the mount board of the making tunneling scanning microscope probe of the draw bail with vertical fixed probe rod
The short probe of upper taking-up two ends point is bonding with conductive plate.
The two ends short probe 20 of point is bonded on conductive plate 5 by conducting resinl 19, forms the short probe of two ends point and conductive plate
Bonding（See Figure 13）, taken out from the device of the making tunneling scanning microscope probe of the draw bail with vertical fixed probe rod
After conductive plate 5, the two ends short probe of point is obtained bonding with conductive plate.
3rd step：The two ends short probe of point is taken out from conductive plate.
The two ends short probe of point is put into organic solvent with the bonding of conductive plate, after conducting resinl 19 dissolves in machine solvent,
The two ends short probe 20 of point is separated with conductive plate 5, obtains the two ends short probe 20 of point（See Figure 14）, conductive plate 5 can reuse.
4th step：One end short probe of point is intercepted from the short probe of point of two ends.
The two ends short probe 20 of the point one end carrying magnetic Nian Jie with conductive plate 5, clips the two ends short upper band magnetic portion of probe 20 of point
Point, obtain one end short probe 14 of point（See Fig. 4）, the probe of the as obtained PSTM of the short probe 14 of one end point.
The operation principle of vertical fixed probe rod：By the needle point insertion conducting resinl 19 of the sharp long probe rod 17 in carrying magnetic one end simultaneously
After being contacted with the lower surface of conductive plate 5, magnet 18 adsorbs at the bottom of conductive plate 5 needle point of the sharp long probe rod 17 in carrying magnetic one end
On face, meanwhile, conducting resinl 19 is be bonded with conductive plate 5 by carrying magnetic one end point long probe rod 17, carrying magnetic one end point long probe rod
17 turn to the vertical attitude of probe axis 8, the moment of resistance very little of needle point, the conducting resinl at needle point around needle point under gravity
19 highly small, the moment of resistance of conducting resinl 19 also very little, makes probe axis 8 have perpendicularity very high；It is real after conducting resinl 18 solidifies
Existing carrying magnetic one end point long probe rod 17 is vertically fixed on the lower section of conductive plate 5, also realizes vertical fixed probe rod；Conducting resinl 19
Conductive, the electric current of conductive plate 5 flows into carrying magnetic by the needle point and conducting resinl 19 of the sharp long probe rod 17 in carrying magnetic one end
The sharp long probe rod 17 in one end.
Claims (8)
1. a kind of draw bail of vertical fixed probe rod, it includes conductive plate（5）, it is characterized in that：Magnet（18）Absorption exists
Conductive plate（5）Top, conductive plate（5）With upper adjusting bracket（4）Connection, conductive plate（5）Lower surface be plane, conducting resinl（19）
It is coated in conductive plate（5）Lower surface on.
2. the draw bail of vertical fixed probe rod according to claim 1, it is characterised in that：Carrying magnetic one end point is long to be visited
Needle bar（17）Needle point adsorb in conductive plate（5）Lower surface, carrying magnetic one end point long probe rod（17）Needle point around lead
Electric glue（19）；Surface magnetic material at needle point, the height a of magnetic material is the 13 of the tungsten filament diameter for making probe
Times.
3. the draw bail of vertical fixed probe rod according to claim 1, it is characterised in that：Conducting resinl（19）Height
Less than carrying magnetic one end point long probe rod（17）Needle point cone height.
4. the method for the vertical fixed probe rod of a kind of draw bail of vertical fixed probe rod, it includes：
The first step：Make one end point long probe rod；
Second step：Make carrying magnetic one end point long probe rod；
3rd step：It is uniform on the lower surface of conductive plate to apply conducting resinl；
4th step：Vertical fixed carrying magnetic one end point long probe rod on the lower surface of conductive plate.
5. the method for the vertical fixed probe rod of the draw bail of a kind of vertical fixed probe rod according to claim 1,
It is characterized in that：The method for making one end point long probe rod is：Take a straight long probe rod（15）, long probe rod（15）Material
Expect, long probe rod identical with the material of the probe of the PSTM to be made（15）Diameter and the scanning tunnel to be made
The diameter of the microscopical probe in road is identical, long probe rod（15）Length ratio meet follow-up making one end short probe of point（14）Need
Many 1 5mm of shortest length, by long probe rod（15）Made on the common unit for making tunneling scanning microscope probe
One end point long probe rod（16）.
6. the method for the vertical fixed probe rod of the draw bail of a kind of vertical fixed probe rod according to claim 1,
It is characterized in that：The method for making carrying magnetic one end point long probe rod is：Magnetic material is plated into point at one end with electric plating method
Long probe rod（16）Needle point at, then the magnetic material magnetization to being plated at needle point obtains carrying magnetic one end point long probe rod（17）.
7. the method for the vertical fixed probe rod of the draw bail of a kind of vertical fixed probe rod according to claim 1,
It is characterized in that：The method of uniform painting conducting resinl is on the lower surface of conductive plate：By conducting resinl（19）It is evenly coated in conductive plate
（2）Lower surface on, and conducting resinl（19）Height less than carrying magnetic one end point long probe rod（17）Needle point cone height.
8. the method for the vertical fixed probe rod of the draw bail of a kind of vertical fixed probe rod according to claim 1,
It is characterized in that：The method of vertical fixed carrying magnetic one end point long probe rod is on the lower surface of conductive plate：By carrying magnetic one
The sharp long probe rod in end（17）Needle point insertion conducting resinl（19）And and conductive plate（5）Lower surface contact, treat carrying magnetic one end point
Long probe rod（17）Probe axis（8）After vertical, Curing conductive adhesive（19）, afterwards, in carrying magnetic one end point long probe rod
（17）Needle point at increase conducting resinl（19）And gradually solidify.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710149681.1A CN106771377B (en) | 2017-03-14 | 2017-03-14 | Connection structure for vertically fixing probe rod and probe rod fixing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710149681.1A CN106771377B (en) | 2017-03-14 | 2017-03-14 | Connection structure for vertically fixing probe rod and probe rod fixing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106771377A true CN106771377A (en) | 2017-05-31 |
| CN106771377B CN106771377B (en) | 2023-07-07 |
Family
ID=58961941
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710149681.1A Active CN106771377B (en) | 2017-03-14 | 2017-03-14 | Connection structure for vertically fixing probe rod and probe rod fixing method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106771377B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20190061489A (en) * | 2017-11-28 | 2019-06-05 | 서강대학교산학협력단 | Method of producing large size of hydrogel prove and hydrogel prove thereof |
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| JP2015161644A (en) * | 2014-02-28 | 2015-09-07 | 国立大学法人秋田大学 | Magnetic force microscope probe and manufacturing method for the same |
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|---|---|---|---|---|
| JPH07253435A (en) * | 1994-03-16 | 1995-10-03 | Fujitsu Ltd | Manufacture of probe |
| JPH1010154A (en) * | 1996-06-20 | 1998-01-16 | Fujitsu Ltd | Manufacture for probe unit |
| US20020008304A1 (en) * | 1999-11-09 | 2002-01-24 | Gunbae Lim | Scanning probe microscope (SPM) probe having field effect transistor channel and method of fabricating the same |
| US20090133171A1 (en) * | 2005-05-10 | 2009-05-21 | The Regents Of The University Of California | Tapered probe structures and fabrication |
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| JP2015161644A (en) * | 2014-02-28 | 2015-09-07 | 国立大学法人秋田大学 | Magnetic force microscope probe and manufacturing method for the same |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20190061489A (en) * | 2017-11-28 | 2019-06-05 | 서강대학교산학협력단 | Method of producing large size of hydrogel prove and hydrogel prove thereof |
| KR102005911B1 (en) * | 2017-11-28 | 2019-07-31 | 서강대학교산학협력단 | Method of producing large size of hydrogel prove and hydrogel prove thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106771377B (en) | 2023-07-07 |
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