CN106769504A - A kind of detection means and method of flexible composite film deformation of surface - Google Patents
A kind of detection means and method of flexible composite film deformation of surface Download PDFInfo
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- CN106769504A CN106769504A CN201611107158.4A CN201611107158A CN106769504A CN 106769504 A CN106769504 A CN 106769504A CN 201611107158 A CN201611107158 A CN 201611107158A CN 106769504 A CN106769504 A CN 106769504A
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- 239000002131 composite material Substances 0.000 title claims abstract description 27
- 238000001514 detection method Methods 0.000 title claims abstract description 27
- 238000000034 method Methods 0.000 title abstract description 10
- 238000003384 imaging method Methods 0.000 claims abstract description 54
- 239000007788 liquid Substances 0.000 claims abstract description 30
- 238000012545 processing Methods 0.000 claims abstract description 21
- 230000005540 biological transmission Effects 0.000 claims abstract description 5
- 230000000903 blocking effect Effects 0.000 claims description 6
- 238000006243 chemical reaction Methods 0.000 claims description 5
- 230000009471 action Effects 0.000 claims description 2
- 238000007789 sealing Methods 0.000 claims description 2
- 238000012360 testing method Methods 0.000 abstract description 7
- 239000010408 film Substances 0.000 description 79
- 239000000523 sample Substances 0.000 description 45
- 230000000694 effects Effects 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 5
- 239000012530 fluid Substances 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 230000005693 optoelectronics Effects 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical group O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 239000000741 silica gel Substances 0.000 description 3
- 229910002027 silica gel Inorganic materials 0.000 description 3
- 230000036541 health Effects 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000003491 array Methods 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000013068 control sample Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000012634 optical imaging Methods 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000005622 photoelectricity Effects 0.000 description 1
- 239000000126 substance Chemical group 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
- G01N3/10—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces generated by pneumatic or hydraulic pressure
- G01N3/12—Pressure testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/02—Details
- G01N3/06—Special adaptations of indicating or recording means
- G01N3/068—Special adaptations of indicating or recording means with optical indicating or recording means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/003—Generation of the force
- G01N2203/0042—Pneumatic or hydraulic means
- G01N2203/0048—Hydraulic means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/0069—Fatigue, creep, strain-stress relations or elastic constants
- G01N2203/0075—Strain-stress relations or elastic constants
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/0641—Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/06—Indicating or recording means; Sensing means
- G01N2203/067—Parameter measured for estimating the property
- G01N2203/0682—Spatial dimension, e.g. length, area, angle
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
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- General Health & Medical Sciences (AREA)
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- Investigating Or Analysing Biological Materials (AREA)
Abstract
The present invention relates to a kind of detection means and method of flexible composite film deformation of surface, the device includes sample cell, and upper end has the mounting hole of laminated film, is connected with liquid storage tank through liquid transmission pipeline, and pressure controller and Micropump are set on liquid transmission pipeline;Microspur imaging device, the deformation projected image of laminated film is transported to image collection processing system on sample cell side, collection sample cell;Light source, in sample cell opposite side, emitting parallel light is irradiated on laminated film, realizes forming film projection on microspur imaging device;Parallel baffle plate is may move, the directional light projected on microspur imaging device is blocked by movement;Image collection processing system obtains film deformation contour curve to projected image treatment, calculates corresponding relation between pressure and film deformation curvature.The present invention can effectively obtain the corresponding relation between contour curve and pressure after laminated film deformation and film deformation curvature, it is achieved thereby that the test of the deformation to laminated film.
Description
Technical field
The invention belongs to the detection technique field of composite and flexible material deformation of surface, and in particular to a kind of flexible composite film
The detection means and method of deformation of surface.
Background technology
In recent years, flexible electronic technology is just applied to the fields such as information, the energy, medical treatment and national defence by leaps and bounds.It was predicted that
The market of flexible electronic product will increase to 69,000,000,000 U.S. dollars of 2026 from 26,500,000,000 U.S. dollars of 2016.As flexible electronic
Important component in technology, flexible sensor is the popular domain in scientific research in recent years.Functionally, flexible sensing
Device has used very thin piezoelectric, semi-conducting material, organic material and metal material, realizes implanted or wearable people
The application of the aspects such as body health detection, automotive electronics and robot sensor.In photoelectric sensor field, flexible electronic technology
There is substantial amounts of application.The appearance of these flexible optoelectronic sensors is indicated and minimized optical imaging system and in arbitrary surfaces
Realize integrated active demand.But the flexible optoelectronic sensor of the above does not have ductility, it is impossible to conformably cover any
Complicated curved surface.Flexible extending electronic device provides new direction for the development of new generation of semiconductor device.It is flexible extending
Electronic device has many important and emerging application, such as flexible display, hemispherical electronic eyes digital camera, intelligent surgical
Gloves, health monitoring equipment and flexible solar battery.It is achieved that arbitrarily complicated curved surface integrated also need to can by flexibility
The photoelectric sensor of extension.
Different measuring units are connected into flexible optoelectronic sensor the netted knot of complexity using extendable plain conductor
Structure.These flexible optoelectronic sensor arrays are listed in and processing are completed in rigid plane substrate, and it is soft to be transferred to plane by the method for transferring
In property substrate., by mechanically deform, such as curvature using liquid filling change substrate or the method using pre-stretching will drawing for substrate
The curved surface release for being stretched flat face obtains original curved form.Although the extending sensor of curve flexibility achieves and exciting enters
Step, but its some problem for still facing, need further to be explored, and can just be finally applied to more need minute yardstick optics
In the application of detection.
Particularly the flexible extending photodiode array sensor of curved surface MULTILAYER COMPOSITE, is by the photoelectricity two of Multilayer ultrathin
Pole pipe array and extendable connection circuit are overlapped mutually, and interlayer fills non-conductive insulating liquid, between diode and connection circuit
The method of the local cold welding aided in using silica gel and chemical bond is formed.Because sensor array is based in ultra thin silica gel substrate,
In the case that sandwich construction is overlapped mutually, still it is required to keep flexible and ductility well, and its thickness is 1mm, institute
With in order to allow the flexible extending photodiode array sensor of curved surface MULTILAYER COMPOSITE can succeed and be conveniently used in information,
In each complicated field such as the energy, medical treatment and national defence, it is necessary to which its deformation parameter is detected, to be entered according to deformation parameter
The corresponding design of row, but it is filled with detection THIN COMPOSITE currently without a kind of detection of convenient flexible composite film deformation of surface
The deformation of film.
The content of the invention
A kind of inspection of flexible composite film deformation of surface is provided it is an object of the invention to solve above-mentioned technical problem
Survey apparatus and method.
To achieve the above object, the present invention is adopted the following technical scheme that:
A kind of detection means of flexible composite film deformation of surface, including
Sample cell, is placed on two-dimentional micro- objective table, and its upper end has the mounting hole of laminated film, and defeated by liquid
Send pipeline to be connected with liquid storage tank, pressure controller and Micropump are provided with liquid transmission pipeline;
Microspur imaging device, is located at the side of sample cell, is connected with image collection processing system, and sample is arranged on for gathering
The deformation projected image of the laminated film on product pond is simultaneously transported in image collection processing system;
Adjustable light source, is located at the opposite side of sample cell, relative with the microspur imaging device, is put down for launching one group
Row illumination is mapped on the laminated film on sample cell, to realize that film deformation is formed on microspur imaging device to be projected;
Moveable parallel baffle plate, between sample cell and microspur imaging device, microspur is projected to for blocking
The directional light not being irradiated on laminated film on imaging device;
Image collection processing system, for processing the projected image that microspur imaging device is gathered, obtains THIN COMPOSITE
Film deformation contour curve, and calculate the corresponding relation between pressure and film deformation curvature.
The pressure controller is PID pressure controllers, and the microspur imaging device is CCD camera heads.
Adjustable light source is arranged on Height Adjustable triangular support bracket with microspur imaging device.
The moveable baffle plate is arranged on guide rail and is moved by Serve Motor Control, and the limit is provided with the guide rail
Position limiter.
The pressure controller, Micropump and servomotor are by control system control action.
The present invention also aims to provide a kind of detection side of the detection means of the flexible composite film deformation of surface
Method, comprises the following steps:
S1:Laminated film is arranged at the mounting hole of sample cell and sealing is kept;
S2:Regulation light source, microspur imaging device highly, make light source, sample cell, microspur imaging device three level height one
Cause;
S3:Regulation Micropump, through pressure controller to liquid is injected in sample cell, increases liquid pressure in sample cell, makes multiple
Close the convex deformation of film;
S4:The regulation intensity of light source, projects with making laminated film complete display on microspur imaging device;
S5:The height of controllable register, makes baffle plate move down the part light for gradually blocking and projecting on microspur imaging device
Source, and intersection point is formed with the image in irradiation laminated film direct projection to microspur imaging device, on image capturing system successively
Depict these intersection points;
S6:Image capturing system is depicted more by the binary conversion treatment to projected image on image capturing system
Point, be sequentially connected the plurality of point and obtain the contour curve after laminated film deformation;
S7:Image capturing system calculates the curvature of contour curve, and using the pressure in known sample cell, obtains sample
The corresponding relation between pressure and film deformation curvature in pond.
The detection means of flexible composite film deformation of surface of the invention, it is possible to achieve control is obtained by microspur imaging device
The strain image of laminated film on sample cell under fluid pressure and air pressure effect, and by image capturing system to collection
Image processed, so as to obtain the contour curve after laminated film deformation, it is possible to the pressure in known sample cell, obtain
The corresponding relation between the pressure and film deformation curvature in sample cell is obtained, it is achieved thereby that the survey of the deformation to laminated film
Examination so that test data is accurate, for the foundation that the deformation phenomenon for studying laminated film is provided.
Brief description of the drawings
Fig. 1 is the structure principle chart of the detection means of flexible composite film deformation of surface of the invention;
In figure:1- control systems;2- tripods;3- light sources;4- sample cells;5- screws;6- laminated films;7- baffle plates;8-
Guide rail;9- extreme position limiters;10- microspur imaging devices;The micro- objective table of 11- two dimensions;12- image collection processing systems;
13- liquid storage tanks;14- Micropumps;15- pressure controllers.
Specific embodiment
Below, substantive distinguishing features of the invention and advantage are further described with reference to example, but the present invention not office
It is limited to listed embodiment.
It is shown in Figure 1, a kind of detection means of flexible composite film deformation of surface, including:
Sample cell 4, is placed on two-dimentional micro- objective table 11, and its upper end has the mounting hole of laminated film 6, and by liquid
Body transfer pipeline is connected with liquid storage tank 14, and pressure controller 15 and Micropump 14 are provided with liquid transmission pipeline;
Microspur imaging device 10, is located at the side of sample cell, is connected with image collection processing system 12, is installed for gathering
The deformation projected image of the laminated film on sample cell is simultaneously transported in image collection processing system 12;
Adjustable light source 3, is located at the opposite side of sample cell, relative with the microspur imaging device 10, for launching one
Group directional light is irradiated on the laminated film 6 on sample cell, to realize that film deformation is formed on microspur imaging device 10 to be projected,
By the image of the acquired projections of microspur imaging device 10;
Moveable parallel baffle plate 7, between sample cell 4 and microspur imaging device 10, projects to for blocking
The directional light not being irradiated on laminated film on microspur imaging device 10;
Image collection processing system, for processing the projected image that microspur imaging device is gathered, obtains THIN COMPOSITE
Film deformation contour curve, and calculate the corresponding relation between pressure and film deformation curvature.
Apparatus of the present invention, inject sample cell, and lead to through pressure controller 15 by controlling Micropump 14 by liquid in liquid storage tank
The pressure of over-pressed force controller 15 sets the pressure change in control sample cell, in liquid pressure and the collective effect of atmospheric pressure
Under so that laminated film 6 realizes the change of concave surface-planar-convex, then by opening adjustable light source 3 from as shown in Figure 1
Left side launch one group of directional light be irradiated on laminated film 6, so as to realize forming laminated film on microspur imaging device 10
Deformation projection, by adjusting the position of parallel baffle plate 7, as shown in figure 1, moving down, block what is launched from left side
Part light source, will directional light top be not irradiated to photo-electric switch on laminated film, with the irradiation direct projection of laminated film 6 to microspur into
As the image on device 10 forms intersection point, these intersection points are depicted successively on image capturing system 12;Repeat above-mentioned step
Suddenly, institute on laminated film deformation rear profile curve can gradually be depicted a little, it is bent so as to depict laminated film deformation profile
Line.
Specifically, in the present invention, the surrounding of the laminated film 6 is fixed on sample by circular pad and screw 5
At the film mounting hole of the upper end in pond, the seal for ensureing its surrounding is produced.
In the present invention, adjustable light source 3 can control light intensity parameter by outside control system.Institute
It can be special intensity of light source controller, or control computer as shown in Figure 1 to state external control system, or other
Light source control device is realized.
The pressure controller 15 and Micropump 14 are used to adjust the pressure of liquid in sample cell, can prevent in experimentation
Laminated film 6 is destroyed due to other reasonses.And, it is necessary to protect laminated film deformation during film deformation is gathered
Hold.
It should be noted that in the present invention, the pressure controller is existing available fluid pressure controller, such as PID
Pressure controller, can be connected by with external pressure control system, realize the setting of pressure controling parameter, it is ensured that pressure control
In corresponding scope, the Micropump 14 can control unlatching and stopping etc. to system by peripheral control unit, so as to realize liquid storage
Liquid in pond is sent to sample cell by liquid delivery tube, is full of the liquid of sample cell, then makes sample by pressure controller
Fluid pressure in pond is maintained in the pressure limit of setting, so that there is corresponding different deformation in laminated film,
Can shown in Fig. 1, be connected with control system 1, the control to Micropump 14 and pressure controller 15 is realized by control system 1
And the setting of control parameter.
In the present invention, the control system 1 can be a control computer, can be real by installing corresponding control module
Now to the setting and control of Micropump 14 and the operational factor of pressure controller 15.
In the present invention, adjustable light source 3 can be arranged on 2 on adjustable A-frame, real by A-frame 2
The position adjustments of existing light source, equally, the microspur imaging device 10 can also be installed on a same A-frame 2, realized
The regulation of position, so that the directional light of light source can be irradiated on the laminated film of deformation and project to microspur imaging device 10
On.
In the present invention, the baffle plate 7 be may be mounted on guide rail 8, and extreme position limiter 9 is provided with the bottom of guide rail 8, with
Baffle plate is set to stop when moving into place.
The extreme position limiter 9 can be one it is spacing open the light, the baffle plate can be by swashplate servo driving machine
Structure, such as Serve Motor Control are moved, and the servomotor control computer can be controlled as shown in Figure 1, when moving limit position limit
During the position of position device 9, after the signal of barrier driving authorities to limit switch, stopping movement being automatically controlled, should be on guide rail
Spacing mobile technology is prior art, and the present invention is no longer described in detail.
It should be noted that, in the present invention, due to the laminated film of the directional light launched when light source 3 after irradiating deformation
6 project on microspur imaging device 10 when, the illumination that top is not irradiated on laminated film has been mapped on microspur imaging device,
Along with the light intensity transmitted through laminated film so that outline projection of the laminated film on microspur imaging device is unintelligible, because drawing
The present invention has added a set of with the baffle plate by swashplate servo driving mechanisms control for blocking light source effect on the top of sample cell.
Specifically, can drive swashplate servo mechanism by control system 1 so that baffle plate is moved on guide rail 8, works as gear
When plate is moved down, gradually block the part light source projected on microspur imaging device 10, and with the irradiation direct projection of laminated film 6
Image on to microspur imaging device 10 forms intersection point, depicts these points successively on image collection processing system 12, passes through
The control of servo-actuating device, repeats above-mentioned steps, can gradually depict the institute on laminated film deformation rear profile curve
A little, so as to depict laminated film deformation contour curve.
In the present invention, the microspur imaging device 10 can be realized using CCD camera heads.
In the present invention, binary conversion treatment and contour curve of the described image acquisition processing system 12 to deformation projected image
Extraction, it is possible to obtain the contour feature curve after laminated film deformation, then reprocess the contour curve, while by
The pressure in sample cell known, it is also possible to obtain the corresponding relation between pressure and multiple film deformation curvature.
Described image acquisition processing system can be able to be a computer with 12, be provided with image processing module, be capable of achieving
Binary conversion treatment is carried out to deformation projected image and contour curve is extracted, the contour feature after laminated film deformation is obtained bent
Line, then reprocesses the contour curve, bent curvature of a curve is obtained, while by the pressure in known sample cell, it is also possible to obtain
Obtain the corresponding relation between the pressure in sample cell and multiple film deformation curvature.
As can be seen that the detection means of flexible composite film deformation of surface of the invention, it is possible to achieve control by microspur into
As strain image of the laminated film on device acquisition sample cell under fluid pressure and air pressure effect, and by IMAQ
System is processed the image for gathering, so as to obtain the contour curve after laminated film deformation, it is possible to known sample cell
Interior pressure, obtains the corresponding relation between the pressure and film deformation curvature in sample cell, it is achieved thereby that to laminated film
Deformation test so that test data is accurate, for the foundation that the deformation phenomenon for studying laminated film is provided.
The present invention also aims to provide a kind of detection side of the detection means of the flexible composite film deformation of surface
Method, comprises the following steps:
S1:Placement control system 1, pressure controller 15, Micropump 14, light source 3, two-dimentional micro- objective table 11, sample cell 4,
Laminated film 6, baffle plate 7, microspur imaging device 10, image collection processing system 12, and make baffle plate 7 in vertical direction and sample
Pond misplaces;
S2:Regulation light source 3, the height of microspur imaging device 10, make light source 3, sample cell 4, the three's water of microspur imaging device 10
It is flat highly consistent, all experiment original papers are debugged, make its working properly;
S3:Regulation Micropump 14, through pressure controller 15 to liquid is injected in sample cell, increases liquid pressure in sample cell,
So as to obtain the convex deformation of laminated film 6;
S4:The regulation intensity of light source 3, projects with making the complete display of silica gel thin film 6 on microspur imaging device;
S5:The height of controllable register 7, baffle plate is moved down, and gradually blocks the part projected on microspur imaging device 10
Light source, and intersection point is formed with the image in the irradiation direct projection of laminated film 6 to microspur imaging device 10, in image capturing system 12
On depict these points successively;
S6:Image capturing system 12 is depicted by the binary conversion treatment to projected image on image capturing system 12
More point, is sequentially connected the plurality of point, obtains the contour curve after the deformation of laminated film 6;
S7:Image capturing system 12 calculates the curvature of contour curve, and using the pressure in known sample cell, obtains sample
The corresponding relation between pressure and laminated film deformation curvature in product pond.
S8:Repeat step S3-S7, the deformation to multilayer flexible material curved surface under different liquid pressure Parameter Conditions is carried out
Test.
The detection method of flexible composite film deformation of surface of the invention, using above-mentioned detection means, by corresponding
The control of parameter, it is possible to achieve control is by the laminated film on microspur imaging device acquisition sample cell in fluid pressure and air pressure
Strain image under power effect, and the image for gathering is processed by image capturing system, so as to obtain laminated film deformation
Contour curve afterwards, it is possible to the pressure in known sample cell, between the pressure and film deformation curvature in acquisition sample cell
Corresponding relation, be research laminated film it is achieved thereby that the test of the deformation to laminated film so that test data is accurate
The foundation that deformation phenomenon is provided.
The above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, under the premise without departing from the principles of the invention, some improvements and modifications can also be made, these improvements and modifications also should
It is considered as protection scope of the present invention.
Claims (6)
1. a kind of detection means of flexible composite film deformation of surface, it is characterised in that including:
Sample cell, is placed on two-dimentional micro- objective table, and its upper end has the mounting hole of laminated film, and by liquid delivery tube
Road is connected with liquid storage tank, and pressure controller and Micropump are provided with liquid transmission pipeline;
Microspur imaging device, is located at the side of sample cell, is connected with image collection processing system, and sample cell is arranged on for gathering
On laminated film deformation projected image and be transported in image collection processing system;
Adjustable light source, is located at the opposite side of sample cell, relative with the microspur imaging device, for launching one group of directional light
It is irradiated on the laminated film on sample cell, to realize that film deformation is formed on microspur imaging device to be projected;
Moveable parallel baffle plate, between sample cell and microspur imaging device, microspur imaging is projected to for blocking
The directional light not being irradiated on laminated film on device;
Image collection processing system, for processing the projected image that microspur imaging device is gathered, obtains laminated film shape
Become contour curve, and calculate the corresponding relation between pressure and film deformation curvature.
2. the detection means of flexible composite film deformation of surface according to claim 1, it is characterised in that the Stress control
Device is PID pressure controllers, and the microspur imaging device is CCD camera heads.
3. the detection means of flexible composite film deformation of surface according to claim 1 or claim 2, it is characterised in that described adjustable
The light source of section is arranged on Height Adjustable triangular support bracket with microspur imaging device.
4. the detection means of flexible composite film deformation of surface according to claim 3, it is characterised in that described moveable
Baffle plate is arranged on guide rail and is moved by Serve Motor Control, and extreme position limiter is provided with the guide rail.
5. the detection means of flexible composite film deformation of surface according to claim 4, it is characterised in that the Stress control
Device, Micropump and servomotor are by control system control action.
6. the detection method of the detection means of flexible composite film deformation of surface described in a kind of any one of claim 1-5, it is special
Levy and be, comprise the following steps:
S1:Laminated film is arranged at the mounting hole of sample cell and sealing is kept;
S2:Regulation light source, microspur imaging device highly, make light source, sample cell, microspur imaging device three's level height consistent;
S3:Regulation Micropump, through pressure controller to liquid is injected in sample cell, increases liquid pressure in sample cell, makes THIN COMPOSITE
The convex deformation of film;
S4:The regulation intensity of light source, projects with making laminated film complete display on microspur imaging device;
S5:The height of controllable register, makes baffle plate move down the part light source for gradually blocking and projecting on microspur imaging device, and
And intersection point is formed with the image in irradiation laminated film direct projection to microspur imaging device, depicted successively on image capturing system
These intersection points;
S6:Image capturing system depicts more point by the binary conversion treatment to projected image on image capturing system,
It is sequentially connected the plurality of point and obtains the contour curve after laminated film deformation;
S7:Image capturing system calculates the curvature of contour curve, and using the pressure in known sample cell, obtains in sample cell
Pressure and film deformation curvature between corresponding relation.
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107830815A (en) * | 2017-12-01 | 2018-03-23 | 天津商业大学 | A kind of MULTILAYER COMPOSITE fexible film deformation of surface detection means and detection method |
CN108180859A (en) * | 2018-03-02 | 2018-06-19 | 天津商业大学 | One kind is based on binocular stereo vision composite and flexible film deformation of surface detection device and method |
CN111175137A (en) * | 2019-10-19 | 2020-05-19 | 安徽磐彩装饰工程有限公司 | Porous thermal insulation material pressure test device |
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