CN106707062B - Test equipment for microwave communication device and test signal generation circuit thereof - Google Patents
Test equipment for microwave communication device and test signal generation circuit thereof Download PDFInfo
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- CN106707062B CN106707062B CN201611239087.3A CN201611239087A CN106707062B CN 106707062 B CN106707062 B CN 106707062B CN 201611239087 A CN201611239087 A CN 201611239087A CN 106707062 B CN106707062 B CN 106707062B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D30/00—Reducing energy consumption in communication networks
- Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks
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Abstract
The invention belongs to the technical field of microwave product testing, and discloses testing equipment for a microwave communication device and a testing signal generating circuit thereof. The invention provides a test signal generating circuit which is arranged in a test device and used for generating a test signal, and comprises: the device comprises a voltage stabilizing unit, a voltage signal switching unit, a frequency signal generating unit and a test signal output unit; the voltage stabilizing unit carries out voltage stabilizing treatment on the output direct current of the direct current power supply and then outputs the direct current to the voltage signal switching unit so that the voltage signal switching unit outputs a voltage signal to the test signal output unit; the frequency signal generating unit generates a frequency signal according to the working voltage and outputs the frequency signal to the test signal output unit, and the test signal output unit outputs a test signal according to the voltage signal and the frequency signal, so that the cost for realizing the characteristic test of the microwave product is reduced, and the generation process of the test signal is simpler.
Description
Technical Field
The invention belongs to the technical field of microwave product testing, and particularly relates to testing equipment for a microwave communication device and a testing signal generating circuit thereof.
Background
A microwave-type communication device refers to a device for receiving satellite signals, for example, a Low Noise Block (LNB) which is a Low Noise down converter for receiving satellite signals transmitted from a feed source, amplifying and down converting the satellite signals, converting band signals, and transmitting the converted band signals to a satellite receiver via a coaxial cable.
At present, when a microwave communication device is subjected to characteristic test, a satellite receiver is generally adopted to convert power supply voltage and high-low frequency signals for detection. Although relatively accurate test results can be obtained, equipment such as satellite receivers and the like need to be purchased, so that the cost is too high, and the test process is too complicated.
Therefore, in the prior art, when the characteristic test is performed on the microwave communication device, the problem of high test cost exists.
Disclosure of Invention
The invention aims to provide test equipment for a microwave communication device and a test signal generation circuit thereof, and aims to solve the problem of high test cost when the characteristic test of the microwave communication device is realized in the prior art.
The invention is realized in such a way that a test signal generating circuit is built in a test device for performing a characteristic test on a microwave communication device; the test signal generating circuit is connected with the direct-current power supply and is used for generating a test signal; the test signal is used for testing the microwave communication device, and the test signal generating circuit comprises: the device comprises a voltage stabilizing unit, a voltage signal switching unit, a frequency signal generating unit and a test signal output unit;
the voltage input end of the voltage stabilizing unit is connected with the direct current power supply, the voltage output end of the voltage stabilizing unit is connected with the input end of the voltage signal switching unit, and the control end of the voltage stabilizing unit is connected with the voltage controlled end of the voltage signal switching unit; the input end of the frequency signal generating unit is connected with the direct current power supply and is used for receiving the working voltage provided by the direct current power supply; the output end of the voltage signal switching unit is connected with the voltage signal input end of the test signal output unit, the output end of the frequency signal generating unit is connected with the frequency signal input end of the test signal output unit, and the signal output end of the test signal output unit is used for outputting the test signal;
the voltage stabilizing unit carries out voltage stabilizing treatment on the output direct current of the direct current power supply and then outputs the output direct current to the voltage signal switching unit so that the voltage signal switching unit outputs a voltage signal to the test signal output unit, and the voltage value of the voltage signal is determined according to the voltage switching state of the voltage signal switching unit;
the frequency signal generating unit generates a frequency signal according to the working voltage and outputs the frequency signal to the test signal output unit, and the test signal output unit outputs the test signal according to the voltage signal and the frequency signal.
Further, the voltage stabilizing unit includes: the first chip, the first capacitor and the first resistor;
the input end of the first chip is the voltage input end of the voltage stabilizing unit, the output end of the first chip is the voltage output end of the voltage stabilizing unit, the control end of the first chip is the control end of the voltage stabilizing unit, the first end of the first capacitor is connected with the input end of the first chip, the second end of the first capacitor is grounded, the first end of the first resistor is connected with the output end of the first chip, and the second end of the first resistor is grounded.
Further, the voltage signal switching unit includes: a first switch, a second resistor and a third resistor;
the fixed end of the first switch is the input end of the voltage signal switching unit, the first movable end of the first switch is connected with the first end of the second resistor, the second movable end of the first switch is connected with the first end of the third resistor, the second end of the second resistor is connected with the second end of the third resistor, the second end of the second resistor is the voltage controlled end of the voltage signal switching unit, and the second end of the third resistor is the output end of the voltage signal switching unit.
Further, the frequency signal generating unit includes: the second chip, the second switch, the second capacitor, the first switch tube, the first diode, the fourth resistor, the fifth resistor, the sixth resistor, the seventh resistor and the eighth resistor;
the first end of the fourth resistor is the output end of the frequency signal generating unit, the second end of the fourth resistor is connected with the high potential end of the first switch tube, the low potential end of the first switch tube is grounded, the controlled end of the first switch tube is connected with the first end of the fifth resistor, the second end of the fifth resistor is connected with the output control end of the second chip, the first end of the second switch is the input end of the frequency signal generating unit, the second end of the second switch is connected with the first end of the sixth resistor, the second end of the sixth resistor is connected with the first end of the second capacitor, the first end of the first diode is grounded together with the second end of the first diode, the first end of the seventh resistor is connected with the first end of the first diode together with the power input end of the second chip, the second end of the second resistor is connected with the second end of the eighth resistor, the second end of the eighth resistor is grounded together with the first end of the eighth resistor, and the eighth resistor is connected with the second end of the eighth resistor.
Further, the test signal output unit includes: the second diode, the third diode, the second switching tube, the third capacitor, the first inductor, the ninth resistor and the tenth resistor;
the first end of the second diode is a voltage signal input end of the test signal output unit, the second end of the second diode and the first end of the ninth resistor are commonly connected with the low potential end of the second switch tube, the second end of the ninth resistor is grounded, the controlled section of the second switch tube is a frequency signal input end of the test signal output unit, the low potential end of the second switch tube is connected with the first end of the third diode, the second end of the third diode and the high potential end of the second switch tube are commonly connected with the first end of the tenth resistor, the second end of the tenth resistor is grounded, the first end of the third capacitor and the first end of the tenth resistor are commonly connected with the first end of the first inductor, and the second end of the first inductor is a signal output end of the test signal output unit.
Further, the first switching tube is a triode, an IGBT tube or an IGBT tube with a body diode.
Further, the first switching tube is an NPN-type triode, an emitter of the NPN-type triode is a low potential end of the first switching tube, a collector of the NPN-type triode is a high potential end of the first switching tube, and a base of the NPN-type triode is a controlled end of the first switching tube.
Further, the second switching tube is a triode, an IGBT tube or an IGBT tube with a body diode.
Further, the second switching tube is a PNP type triode, an emitter of the PNP type triode is a low potential end of the second switching tube, a collector of the PNP type triode is a high potential end of the second switching tube, and a base of the PNP type triode is a controlled end of the second switching tube.
Another object of the present invention is to provide a test apparatus for a microwave communication device, which includes a dc power supply and is used for performing a characteristic test on the microwave communication device, the test apparatus further including the test signal generating circuit as described above.
The invention provides a test signal generating circuit which is arranged in a test device, wherein the test device is used for testing the characteristics of a microwave communication device; the test signal generating circuit is connected with the direct-current power supply and is used for generating a test signal; the test signal is used for testing the microwave communication device, and the test signal generating circuit comprises: it comprises the following steps: the device comprises a voltage stabilizing unit, a voltage signal switching unit, a frequency signal generating unit and a test signal output unit; the voltage stabilizing unit carries out voltage stabilizing treatment on the output direct current of the direct current power supply and then outputs the direct current to the voltage signal switching unit so that the voltage signal switching unit outputs a voltage signal to the test signal output unit, and the voltage value of the voltage signal is determined according to the voltage switching state of the voltage signal switching unit; the frequency signal generating unit generates a frequency signal according to the working voltage and outputs the frequency signal to the test signal output unit, and the test signal output unit outputs a test signal according to the voltage signal and the frequency signal, so that the cost for realizing characteristic test of the microwave communication device is reduced, and the generation process of the test signal is simpler.
Drawings
FIG. 1 is a schematic diagram of a test signal generating circuit according to an embodiment of the present invention;
FIG. 2 is a circuit diagram of a test signal generating circuit according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a test apparatus for a microwave communication device according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
The invention aims to provide test equipment for a microwave communication device and a test signal generation circuit thereof, and aims to solve the problem of high test cost when the characteristic test of the microwave communication device is realized in the prior art.
It should be noted that, in all embodiments of the present invention, the microwave communication device may be a Low Noise Block (LNB), that is, a Low Noise down converter, for receiving satellite signals transmitted by the feed source, amplifying and down converting the satellite signals, and converting band signals, and transmitting the signals to the satellite receiver via the coaxial cable.
The implementation of the invention is described in detail below with reference to the specific drawings:
fig. 1 is a schematic structural diagram of a test signal generating circuit according to an embodiment of the present invention, and for convenience of explanation, only the parts related to the embodiment are shown, and the details are as follows:
as shown in fig. 1, a test signal generating circuit 100 is built in a test device for performing a characteristic test on a microwave communication device; the test signal generating circuit 100 is connected to a dc power supply 110 and is configured to generate a test signal; the test signal is used for testing the microwave communication device, and comprises the following components: a voltage stabilizing unit 10, a voltage signal switching unit 20, a frequency signal generating unit 30, and a test signal outputting unit 40.
The voltage input end of the voltage stabilizing unit 10 is connected with the direct current power supply 110, the voltage output end of the voltage stabilizing unit 10 is connected with the input end of the voltage signal switching unit 20, and the control end of the voltage stabilizing unit 10 is connected with the voltage controlled end of the voltage signal switching unit 20; the input end of the frequency signal 30 generating unit is connected with the direct current power supply 110 and is used for receiving the working voltage provided by the direct current power supply 110; the output end of the voltage signal switching unit 20 is connected to the voltage signal input end of the test signal output unit 40, the output end of the frequency signal generating unit 30 is connected to the frequency signal input end of the test signal output unit 40, and the signal output end of the test signal output unit 40 is used for outputting a test signal.
The voltage stabilizing unit 10 performs voltage stabilizing processing on the output dc of the dc power supply 110, and outputs the processed output dc to the voltage signal switching unit 20, so that the voltage signal switching unit 20 outputs a voltage signal to the test signal output unit 40, and a voltage value of the voltage signal is determined according to a voltage switching state of the voltage signal switching unit 20.
The frequency signal generating unit 30 generates a frequency signal according to the operating voltage and outputs the frequency signal to the test signal output unit 40, and the test signal output unit 40 outputs a test signal according to the voltage signal and the frequency signal.
After the voltage stabilizing unit 10 stabilizes the voltage output by the dc power supply 110, the voltage signal switching unit 20 divides the voltage after the voltage stabilization, so as to obtain a voltage signal, where the voltage signal may include a first voltage signal or a second voltage signal. The frequency signal generating unit 30 generates a frequency signal from the voltage output from the dc power supply 110, and the frequency signal may include: the test signal output unit 40 integrates the voltage signal output from the voltage signal switching unit 20 with the frequency signal output from the frequency signal generating unit 30, and outputs a corresponding test signal.
It can be understood that the voltage stabilizing unit 10 stabilizes the output voltage of the dc power supply 110 and outputs the stabilized voltage to the voltage signal switching unit 20, so that the voltage signal switching unit 20 outputs the first voltage signal or the second voltage signal to the test signal output unit 40.
When the frequency signal generating unit 30 receives the operating voltage, the frequency signal generating unit 30 outputs a first frequency signal to the test signal output unit 40, and the test signal output unit 40 outputs a first test signal according to the first voltage signal and the first frequency signal, or the test signal output unit 40 outputs a second test signal according to the second voltage signal and the first frequency signal.
When the frequency signal generating unit 30 does not receive the operating voltage, the frequency signal generating unit 30 outputs a second frequency signal to the test signal output unit 40, the test signal output unit 40 outputs a third test signal according to the first voltage signal and the second frequency signal, or the test signal output unit 40 outputs a fourth test signal according to the second voltage signal and the second frequency signal.
Fig. 2 shows a specific circuit diagram of a test signal generating circuit according to an embodiment of the present invention.
As shown in fig. 2, the voltage stabilizing unit 10 includes: the first chip U1, the first capacitor C1 and the first resistor R1.
The input end IN of the first chip U1 is a voltage input end of the voltage stabilizing unit 10, the output end OUT of the first chip U1 is a voltage output end of the voltage stabilizing unit 10, the control end ADJ of the first chip U1 is a control end of the voltage stabilizing unit 10, the first end of the first capacitor C1 is connected with the input end ON of the first chip U1, the second end of the first capacitor C1 is grounded, the first end of the first resistor R1 is connected with the output end OUT of the first chip U1, and the second end of the first resistor R1 is grounded.
As shown in fig. 2, the voltage signal switching unit 20 includes: a first switch SW1, a second resistor R2 and a third resistor R3.
The fixed end of the first switch SW1 is an input end of the voltage signal switching unit 20, the first movable end of the first switch SW1 is connected with the first end of the second resistor R2, the second movable end of the first switch SW1 is connected with the first end of the third resistor R3, the second end of the second resistor R2 is connected with the second end of the third resistor R3, the second end of the second resistor R2 is a voltage controlled end of the voltage signal switching unit 20, and the second end of the third resistor R3 is an output end of the voltage signal switching unit 20.
In the present embodiment, the resistance of the second resistor R2 is not equal to the resistance of the third resistor R3. In practical applications, the specifications of the second resistor R2 or the third resistor R3 can be adjusted according to the voltage signals required by different test signals.
It can be understood that when the first active end of the first switch SW1 is turned on, the second resistor R2 divides the stabilized voltage, and then outputs the first voltage signal to the test signal output unit. When the second active end of the first switch SW1 is turned on, the voltage after the voltage stabilization is divided by the third resistor R3, and then the second voltage signal is output to the test signal output unit.
As shown in fig. 2, the frequency signal generating unit 30 includes: the second chip U2, the second switch SW2, the second capacitor C2, the first switch tube Q1, the first diode D1, the fourth resistor R4, the fifth resistor R5, the sixth resistor R6, the seventh resistor R7 and the eighth resistor R8.
The first end of the fourth resistor R4 is an output end of the frequency signal generating unit 30, the second end of the fourth resistor R4 is connected to the high potential end of the first switch tube Q1, the low potential end of the first switch tube Q1 is grounded, the controlled end of the first switch tube Q1 is connected to the first end of the fifth resistor R5, the second end of the fifth resistor R5 is connected to the output control end Q of the second chip U2, the first end of the second switch SW2 is an input end of the frequency signal generating unit 30, the second end of the second switch SW2 is connected to the first end of the sixth resistor R6, the second end of the sixth resistor R6 is connected to the first end of the second capacitor C2, the first end of the first diode D1 is grounded, the first end of the seventh resistor R7 is commonly connected to the first end of the first diode D1, the first end of the seventh resistor R7 is commonly connected to the power input end of the second chip U2, the first end of the seventh resistor R7 is commonly connected to the first end of the first chip U2, the first end of the eighth resistor R8 is connected to the first end of the second chip U2, and the second end of the eighth resistor R8 is connected to the first end of the second chip U2 is connected to the ground, the first end of the eighth resistor R8 is connected to the first end of the second resistor R2 is connected to the first end of the second chip of the second resistor U2.
When the second switch SW2 is turned on, the frequency signal generating unit 30 receives the operating voltage, the frequency signal generating unit 30 outputs a first frequency signal to the test signal output unit 40, the test signal output unit 40 outputs a first test signal according to the first voltage signal and the first frequency signal, or the test signal output unit 40 outputs a second test signal according to the second voltage signal and the first frequency signal. When the second switch SW2 is turned off, the frequency signal generating unit 30 does not receive the operating voltage, the frequency signal generating unit 30 outputs a second frequency signal to the test signal output unit 40, the test signal output unit 40 outputs a third test signal according to the first voltage signal and the second frequency signal, or the test signal output unit 40 outputs a fourth test signal according to the second voltage signal and the second frequency signal.
As shown in fig. 2, the test signal output unit 40 includes: the second diode D2, the third diode D3, the second switching tube Q2, the third capacitor C3, the first inductor L1, the ninth resistor R9, and the tenth resistor R10.
The first end of the second diode D2 is a voltage signal input end of the test signal output unit 40, the second end of the second diode D2 and the first end of the ninth resistor R9 are commonly connected with the low potential end of the second switch tube D2, the second end of the ninth resistor R9 is grounded, the controlled section of the second switch tube Q2 is a frequency signal input end of the test signal output unit 40, the low potential end of the second switch tube Q2 is connected with the first end of the third diode D3, the second end of the third diode D3 and the high potential end of the second switch tube Q2 are commonly connected with the first end of the tenth resistor R10, the second end of the tenth resistor R10 is grounded, the first end of the third capacitor C3 and the first end of the tenth resistor R10 are commonly connected with the first end of the first inductor L1, and the second end of the first inductor L1 is a signal output end of the test signal output unit 40.
In all embodiments of the present invention, the first switching tube and the second switching tube may be a triode, an IGBT tube, or an IGBT tube with a body diode.
As a preferred embodiment, the first switching transistor Q1 is an NPN-type transistor Q1, an emitter of the NPN-type transistor Q1 is a low potential end of the first switching transistor Q1, a collector of the NPN-type transistor Q1 is a high potential end of the first switching transistor Q1, and a base of the NPN-type transistor Q1 is a controlled end of the first switching transistor Q1.
As a preferred embodiment, the second switching transistor Q2 is a PNP type transistor Q2, the emitter of the PNP type transistor Q2 is the low potential end of the second switching transistor Q2, the collector of the PNP type transistor Q2 is the high potential end of the second switching transistor Q2, and the base of the PNP type transistor Q2 is the controlled end of the second switching transistor Q2.
The working principle of the test signal generating circuit provided by the invention is described in detail below with reference to fig. 2.
As shown in fig. 2, the dc power supply 110 also inputs an operating voltage to the first end of the second switch SW1 in the frequency signal generating unit 30. The first chip U1 in the voltage stabilizing unit 10 receives the dc power output from the dc power supply 110, and performs voltage stabilizing processing on the dc power. The first switch SW1 in the voltage signal switching unit 20 performs voltage division on the dc voltage after voltage stabilization to different extents by switching different conducting ends. When the first active end of the first switch SW1 is turned on, the second resistor R2 divides the stabilized voltage, and generates a first voltage signal to be output to the test signal output unit 40; or when the second active end of the first switch SW1 is turned on, the stabilized voltage is divided by the third resistor R3, and a second voltage signal is generated and output to the test signal output unit 40.
When the second switch SW2 is turned on, the power input terminal VCC of the second chip U2 in the frequency signal generating unit 30 receives the operating voltage through the sixth resistor R6, and the second chip U2 outputs the first frequency signal to the test signal output unit 40 through the output control terminal Q, the fifth resistor R5, the first switching tube Q1 and the fourth resistor R4; when the second switch SW2 is turned off, the power input terminal VCC of the second chip U2 cannot receive the operating voltage, and the frequency signal generating unit 30 outputs the second frequency signal to the test signal output unit 40.
The voltage signal switching unit 20 may generate different voltage signals according to the difference of the on active ends of the first switch SW1, and the first voltage signal and the second voltage signal output from the voltage signal switching unit 20 to the test signal output unit 40 are respectively stabilized at different voltage values, for example, the voltage value of the first voltage signal is 13V, and the voltage value of the first voltage signal is 18V. The frequency signal generating unit 30 outputs a first frequency signal or a second frequency signal to the test signal output unit 40 according to an on or off state of the second switch SW1, wherein the frequency signal generating unit 30 outputs the first frequency signal, which may be 22KHz, to the test signal output unit 40 when the second switch SW1 is on, and the frequency signal generating unit 30 outputs the second frequency signal, which may be 0KHz, to the test signal output unit 40 when the second switch SW1 is off.
For example, the test signal output unit 40 outputs a first test signal (13V, 22 KHz) according to the first voltage signal (13V) and the first frequency signal (22 KHz) through the second terminal of the first inductor L1. Or the test signal output unit 40 outputs a second test signal (18V, 22 KHz) according to the second voltage signal (18V) and the first frequency signal (22 KHz) through the second end of the first inductor L1.
For another example, the test signal output unit 40 outputs a third test signal (13V, 0 KHz) according to the first voltage signal (13V) and the second frequency signal (0 KHz) through the second terminal of the first inductor L1. Or the test signal output unit 40 outputs a fourth test signal (18V, 0 KHz) according to the second voltage signal (18V) and the second frequency signal (0 KHz) through the second end of the first inductor L1.
Fig. 3 shows a schematic structural diagram of a test apparatus for a microwave communication device according to an embodiment of the present invention, and as shown in fig. 3, a test apparatus 200 for a microwave communication device according to the present embodiment includes a dc power supply 110, and is used for performing a characteristic test on the microwave communication device, and a test apparatus 200 for a microwave product includes a test signal generating circuit 100 as described above.
It should be noted that, the characteristic test of the microwave product may specifically be a simulation test of the microwave product, or a capability of the microwave product to receive or transmit information.
Since the specific implementation manner and the working principle related to the present invention of the testing device for microwave products provided in the present embodiment are described in the foregoing embodiments and in detail, the description thereof is omitted herein.
The embodiment of the invention provides a test signal generating circuit which is arranged in a test device, wherein the test device is used for testing the characteristics of a microwave communication device; the test signal generating circuit is connected with the direct-current power supply and is used for generating a test signal; the test signal is used for testing the microwave communication device, and the test signal generating circuit comprises: it comprises the following steps: the device comprises a voltage stabilizing unit, a voltage signal switching unit, a frequency signal generating unit and a test signal output unit; the voltage stabilizing unit carries out voltage stabilizing treatment on the output direct current of the direct current power supply and then outputs the direct current to the voltage signal switching unit so that the voltage signal switching unit outputs a voltage signal to the test signal output unit, and the voltage value of the voltage signal is determined according to the voltage switching state of the voltage signal switching unit; the frequency signal generating unit generates a frequency signal according to the working voltage and outputs the frequency signal to the test signal output unit, and the test signal output unit outputs a test signal according to the voltage signal and the frequency signal, so that the cost for realizing characteristic test of the microwave communication device is reduced, and the generation process of the test signal is simpler.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, and alternatives falling within the spirit and principles of the invention.
Claims (8)
1. A test signal generating circuit which is arranged in a test device, wherein the test device is used for testing the characteristics of a microwave communication device; the test signal generating circuit is connected with the direct-current power supply and is used for generating a test signal; the test signal is used for testing the microwave communication device, and is characterized in that the test signal generating circuit comprises: the device comprises a voltage stabilizing unit, a voltage signal switching unit, a frequency signal generating unit and a test signal output unit;
the voltage input end of the voltage stabilizing unit is connected with the direct current power supply, the voltage output end of the voltage stabilizing unit is connected with the input end of the voltage signal switching unit, and the control end of the voltage stabilizing unit is connected with the voltage controlled end of the voltage signal switching unit; the input end of the frequency signal generating unit is connected with the direct current power supply and is used for receiving the working voltage provided by the direct current power supply; the output end of the voltage signal switching unit is connected with the voltage signal input end of the test signal output unit, the output end of the frequency signal generating unit is connected with the frequency signal input end of the test signal output unit, and the signal output end of the test signal output unit is used for outputting the test signal;
the voltage stabilizing unit carries out voltage stabilizing treatment on the output direct current of the direct current power supply and then outputs the output direct current to the voltage signal switching unit so that the voltage signal switching unit outputs a voltage signal to the test signal output unit, and the voltage value of the voltage signal is determined according to the voltage switching state of the voltage signal switching unit;
the frequency signal generating unit generates a frequency signal according to the working voltage and outputs the frequency signal to the test signal output unit, and the test signal output unit outputs the test signal according to the voltage signal and the frequency signal;
the frequency signal generation unit includes: the second chip, the second switch, the second capacitor, the first switch tube, the first diode, the fourth resistor, the fifth resistor, the sixth resistor, the seventh resistor and the eighth resistor;
the first end of the fourth resistor is an output end of the frequency signal generating unit, the second end of the fourth resistor is connected with a high potential end of the first switch tube, a low potential end of the first switch tube is grounded, a controlled end of the first switch tube is connected with a first end of the fifth resistor, the second end of the fifth resistor is connected with an output control end of the second chip, the first end of the second switch is an input end of the frequency signal generating unit, the second end of the second switch is connected with a first end of the sixth resistor, the second end of the sixth resistor is connected with a first end of the second capacitor, the first end of the first diode is connected with a first end of the second capacitor, the second end of the second capacitor is commonly grounded with a second end of the first diode, the first end of the seventh resistor is commonly connected with a power input end of the second chip, the second end of the seventh resistor is commonly grounded with a second end of the eighth chip, and the eighth resistor is connected with a second end of the eighth chip;
the test signal output unit includes: the second diode, the third diode, the second switching tube, the third capacitor, the first inductor, the ninth resistor and the tenth resistor;
the first end of the second diode is a voltage signal input end of the test signal output unit, the second end of the second diode and the first end of the ninth resistor are commonly connected with the low potential end of the second switch tube, the second end of the ninth resistor is grounded, the controlled section of the second switch tube is a frequency signal input end of the test signal output unit, the low potential end of the second switch tube is connected with the first end of the third diode, the second end of the third diode and the high potential end of the second switch tube are commonly connected with the first end of the tenth resistor, the second end of the tenth resistor is grounded, the first end of the third capacitor and the first end of the tenth resistor are commonly connected with the first end of the first inductor, and the second end of the first inductor is a signal output end of the test signal output unit.
2. The test signal generating circuit according to claim 1, wherein the voltage stabilizing unit includes: the first chip, the first capacitor and the first resistor;
the input end of the first chip is the voltage input end of the voltage stabilizing unit, the output end of the first chip is the voltage output end of the voltage stabilizing unit, the control end of the first chip is the control end of the voltage stabilizing unit, the first end of the first capacitor is connected with the input end of the first chip, the second end of the first capacitor is grounded, the first end of the first resistor is connected with the output end of the first chip, and the second end of the first resistor is grounded.
3. The test signal generating circuit according to claim 1, wherein the voltage signal switching unit includes: a first switch, a second resistor and a third resistor;
the fixed end of the first switch is the input end of the voltage signal switching unit, the first movable end of the first switch is connected with the first end of the second resistor, the second movable end of the first switch is connected with the first end of the third resistor, the second end of the second resistor is connected with the second end of the third resistor, the second end of the second resistor is the voltage controlled end of the voltage signal switching unit, and the second end of the third resistor is the output end of the voltage signal switching unit.
4. The test signal generating circuit of claim 1, wherein the first switching tube is a triode or an IGBT tube.
5. The test signal generating circuit according to claim 4, wherein the first switching tube is an NPN-type transistor, an emitter of the NPN-type transistor is a low potential end of the first switching tube, a collector of the NPN-type transistor is a high potential end of the first switching tube, and a base of the NPN-type transistor is a controlled end of the first switching tube.
6. The test signal generating circuit of claim 1, wherein the second switching tube is a triode or an IGBT tube.
7. The test signal generating circuit according to claim 6, wherein the second switching transistor is a PNP transistor, an emitter of the PNP transistor is a low potential end of the second switching transistor, a collector of the PNP transistor is a high potential end of the second switching transistor, and a base of the PNP transistor is a controlled end of the second switching transistor.
8. A test apparatus for a microwave communication device, comprising a direct current power supply, and for performing a characteristic test on the microwave communication device, characterized in that the test apparatus further comprises a test signal generating circuit according to any one of claims 1 to 7.
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