CN206431215U - Test equipment and its testing signal generation circuit for microwave communication device - Google Patents
Test equipment and its testing signal generation circuit for microwave communication device Download PDFInfo
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Abstract
The utility model belongs to microwave product technical field of measurement and test, discloses a kind of test equipment and its testing signal generation circuit for microwave communication device.A kind of testing signal generation circuit that the utility model is provided, is built in a test equipment, and for generating test signal, it includes：Voltage regulation unit, voltage signal switch unit, frequency signal generation unit and test signal output unit；Voltage regulation unit is exported to voltage signal switch unit after carrying out voltage stabilizing processing to the output direct current of dc source, to cause voltage signal switch unit to test signal output unit output voltage signal；Frequency signal generation unit generates frequency signal according to operating voltage, and export frequency signal to test signal output unit, test signal output unit exports test signal according to voltage signal and frequency signal, the cost realized and characteristic test is carried out to microwave product is reduced, and causes the generating process of test signal to become simpler.
Description
Technical field
The utility model belongs to microwave product technical field of measurement and test, more particularly to a kind of test for microwave communication device
Equipment and its testing signal generation circuit.
Background technology
Microwave class communicator refers to the device for receiving satellite-signal, for example, tuner (Low Noise
Block, LNB) it is low noise block downconverter, it is used for the satellite-signal for receiving feed transmission, and satellite-signal is amplified
And down coversion, and band signal conversion, then send DVB to through coaxial cable.
At present when carrying out characteristic test to microwave class communicator, supply voltage is typically converted using DVB
Detected with height frequency signal.Although relatively accurate test result can be obtained, need to purchase DVB
Etc. equipment so that cost is too high, and test process is excessively cumbersome.
Therefore, there is testing cost high when realizing to the progress characteristic test of microwave class communicator in the prior art
Problem.
Utility model content
The purpose of this utility model is that providing a kind of test equipment and its test signal for microwave communication device gives birth to
Into circuit, it is intended to which solution when realizing to microwave communication device progress characteristic test, has testing cost high in the prior art
Problem.
The utility model is achieved in that a kind of testing signal generation circuit, is built in a test equipment, described to survey
Trying equipment is used to carry out characteristic test to microwave communication device；The testing signal generation circuit is connected with dc source, and uses
In generation test signal；The test signal is used to test the microwave communication device, the test signal generation electricity
Road includes：Voltage regulation unit, voltage signal switch unit, frequency signal generation unit and test signal output unit；
The voltage input end of the voltage regulation unit is connected with the dc source, the voltage output end of the voltage regulation unit with
The input of the voltage signal switch unit is connected, the control end of the voltage regulation unit and the voltage signal switch unit
Voltage controlled end is connected；The input of the frequency signal generation unit is connected with the dc source, and described for receiving
The operating voltage that dc source is provided；The output end of the voltage signal switch unit and the electricity of the test signal output unit
Signal input part is pressed to be connected, the output end of the frequency signal generation unit and the frequency signal of the test signal output unit
Input is connected, and the signal output part of the test signal output unit is used to export the test signal；
The voltage regulation unit, which to the output direct current of the dc source export after voltage stabilizing processing to the voltage, to be believed
Number switch unit, it is described to cause the voltage signal switch unit to the test signal output unit output voltage signal
The magnitude of voltage of voltage signal follows the voltage switching state of the voltage signal switch unit and determined；
The frequency signal generation unit generates frequency signal according to the operating voltage, and the frequency signal is exported
To the test signal output unit, the test signal output unit is exported according to the voltage signal and the frequency signal
The test signal.
Further, the voltage regulation unit includes：First chip, the first electric capacity and first resistor；
The input of first chip is the voltage input end of the voltage regulation unit, and the output end of first chip is
The voltage output end of the voltage regulation unit, the control end of first chip is the control end of the voltage regulation unit, described first
The first end of electric capacity is connected with the input of first chip, the second end ground connection of first electric capacity, the first resistor
First end be connected with the output end of first chip, the second end of first resistor ground connection.
Further, the voltage signal switch unit includes：First switch, second resistance and 3rd resistor；
The fixing end of the first switch is the input of the voltage signal switch unit, the first of the first switch
Movable end is connected with the first end of the second resistance, the second movable end of the first switch and the first of the 3rd resistor
End is connected, and the second end of the second resistance is connected with the second end of the 3rd resistor, and the second end of the second resistance is
The voltage controlled end of the voltage signal switch unit, the second end of the 3rd resistor is the voltage signal switch unit
Output end.
Further, the frequency signal generation unit includes：Second chip, second switch, the second electric capacity, first switch
Pipe, the first diode, the 4th resistance, the 5th resistance, the 6th resistance, the 7th resistance and the 8th resistance；
The first end of 4th resistance is the output end of the frequency signal generation unit, the second of the 4th resistance
End is connected with the hot end of the first switch pipe, the cold end ground connection of the first switch pipe, the first switch pipe
Controlled end be connected with the first end of the 5th resistance, the second end of the 5th resistance and the output control of second chip
End processed is connected, and the first end of the second switch is the input of the frequency signal generation unit, and the of the second switch
Two ends are connected with the first end of the 6th resistance, the second end of the 6th resistance and the first end phase of second electric capacity
Even, the first end of first diode is connected with the first end of second electric capacity, the second end of second electric capacity and institute
The second end for stating the first diode is grounded altogether, and the first end of the 7th resistance meets institute altogether with the first end of first diode
The power input of the second chip is stated, the second end of the 7th resistance connects described second altogether with the first end of the 8th resistance
The discharge end of chip, the second end of the 8th resistance is connected with the thresholding end of second chip, second chip touch
Originator is connected with the second end of the 8th resistance, the ground terminal ground connection of second chip.
Further, the test signal output unit includes：Second diode, the 3rd diode, second switch pipe,
Three electric capacity, the first inductance, the 9th resistance and the tenth resistance；
The first end of second diode is the voltage signal inputs of the test signal output unit, described second
The first end of second end of diode and the 9th resistance connects the cold end of the second switch pipe, the 9th resistance altogether
The second end ground connection, controlled section of the second switch pipe be the test signal output unit frequency signal input end, institute
The cold end for stating second switch pipe is connected with the first end of the 3rd diode, the second end of the 3rd diode and institute
The hot end for stating second switch pipe connects the first end of the tenth resistance altogether, and the second end ground connection of the tenth resistance is described
The first end of 3rd electric capacity and the first end of the tenth resistance connect the first end of first inductance altogether, first inductance
Second end is the signal output part of the test signal output unit.
Further, the first switch pipe is triode, IGBT pipes or the IGBT pipes for carrying body diode.
Further, the first switch pipe is NPN type triode, the transmitting of the NPN type triode extremely described the
The cold end of one switching tube, the hot end of the extremely described first switch pipe of current collection of the NPN type triode, the NPN
The base stage of type triode is the controlled end of the first switch pipe.
Further, the second switch pipe is triode, IGBT pipes or the IGBT pipes for carrying body diode.
Further, the second switch pipe is PNP type triode, the transmitting of the PNP type triode extremely described the
The cold end of two switching tubes, the hot end of the extremely described second switch pipe of current collection of the PNP type triode, the PNP
The base stage of type triode is the controlled end of the second switch pipe.
Another object of the present utility model is a kind of test equipment for microwave communication device of offer, and it includes direct current
Power supply, and for carrying out characteristic test to the microwave communication device, the test equipment also includes test letter as described above
Number generative circuit.
A kind of testing signal generation circuit that the utility model is provided, is built in a test equipment, test equipment is used for
Characteristic test is carried out to microwave communication device；Testing signal generation circuit is connected with dc source, and for generating test signal；
Test signal is used to test microwave communication device, and testing signal generation circuit includes：It includes：Voltage regulation unit, voltage
Signal switch unit, frequency signal generation unit and test signal output unit；Output of the voltage regulation unit to dc source is straight
Stream electricity is exported to voltage signal switch unit after carrying out voltage stabilizing processing, to cause voltage signal switch unit to be exported to test signal
Unit output voltage signal, the magnitude of voltage of voltage signal follows the voltage switching state of voltage signal switch unit and determined；Frequently
Rate signal generation unit generates frequency signal according to operating voltage, and frequency signal is exported to test signal output unit, surveys
Trial signal output unit exports test signal according to voltage signal and frequency signal, reduces realization and microwave communication device is carried out
The cost of characteristic test, and cause the generating process of test signal to become simpler.
Brief description of the drawings
Fig. 1 is a kind of structural representation for testing signal generation circuit that the utility model embodiment is provided；
Fig. 2 is a kind of physical circuit figure for testing signal generation circuit that the utility model embodiment is provided；
Fig. 3 is a kind of structural representation for test equipment for microwave communication device that the utility model embodiment is provided
Figure.
Embodiment
In order that the purpose of this utility model, technical scheme and advantage are more clearly understood, below in conjunction with accompanying drawing and implementation
Example, the utility model is further elaborated.It should be appreciated that specific embodiment described herein is only to explain
The utility model, is not used to limit the utility model.
The purpose of this utility model is that providing a kind of test equipment and its test signal for microwave communication device gives birth to
Into circuit, it is intended to which solution when realizing to microwave communication device progress characteristic test, has testing cost high in the prior art
Problem.
It should be noted that in all embodiments of the present utility model, microwave communication device can be tuner (Low
Noise Block, LNB), i.e. low noise block downconverter, the satellite-signal for receiving feed transmission, and carried out to satellite-signal
Amplification and down coversion, and band signal conversion, then send DVB to through coaxial cable.
Realization of the present utility model is described in detail below in conjunction with specific accompanying drawing：
Fig. 1 shows a kind of structural representation for testing signal generation circuit that the utility model embodiment is provided, and is
It is easy to explanation, the part related to embodiment is only shown, details are as follows：
As shown in figure 1, a kind of testing signal generation circuit 100, is built in a test equipment, test equipment is used for micro-
Wave communication device carries out characteristic test；The testing signal generation circuit 100 is connected with dc source 110, and for generating test
Signal；Test signal is used to test microwave communication device, and it includes：Voltage regulation unit 10, voltage signal switch unit 20,
Frequency signal generation unit 30 and test signal output unit 40.
The voltage input end of voltage regulation unit 10 is connected with dc source 110, the voltage output end and voltage of voltage regulation unit 10
The input of signal switch unit 20 is connected, the control end of voltage regulation unit 10 and the voltage controlled end of voltage signal switch unit 20
It is connected；The input of the generation unit of frequency signal 30 is connected with dc source 110, and for receiving the offer of dc source 110
Operating voltage；The output end of voltage signal switch unit 20 is connected with the voltage signal inputs of test signal output unit 40,
The output end of frequency signal generation unit 30 is connected with the frequency signal input end of test signal output unit 40, and test signal is defeated
Going out the signal output part of unit 40 is used to export test signal.
Voltage regulation unit 10, which to the output direct current of dc source 110 export after voltage stabilizing processing to voltage signal, switches list
Member 20, to cause voltage signal switch unit 20 to the output voltage signal of test signal output unit 40, the voltage of voltage signal
Value follows the voltage switching state of voltage signal switch unit 20 and determined.
Frequency signal generation unit 30 generates frequency signal according to operating voltage, and frequency signal is exported to test signal
Output unit 40, test signal output unit 40 exports test signal according to voltage signal and frequency signal.
It should be noted that the voltage that voltage regulation unit 10 is exported to dc source 110 is carried out after voltage stabilizing, cut by voltage signal
Change unit 20 and partial pressure is carried out to the voltage after voltage stabilizing, and then obtain voltage signal, the voltage signal can include first voltage letter
Number or second voltage signal.The voltage that frequency signal generation unit 30 is exported according to dc source 110 generates frequency signal, the frequency
Rate signal can include：First frequency signal or second frequency signal, test signal output unit 40 switch voltage signal
The frequency signal that the output voltage signal of unit 20 is exported with frequency signal generation unit 30 is integrated, and exports corresponding test
Signal.
It is understood that voltage regulation unit 10 carries out voltage stabilizing to the output voltage of dc source 110, and by the electricity after voltage stabilizing
Pressure output is to voltage signal switch unit 20, to cause voltage signal switch unit 20 to the output of test signal output unit 40 the
One voltage signal or second voltage signal.
When frequency signal generation unit 30 receives operating voltage, frequency signal generation unit 30 is exported to test signal
Unit 40 exports first frequency signal, and test signal output unit 40 is according to first voltage signal and first frequency signal output the
One test signal, or test signal output unit 40 are tested according to second voltage signal and first frequency signal output second and believed
Number.
When frequency signal generation unit 30 does not receive operating voltage, frequency signal generation unit 30 is defeated to test signal
Go out the output second frequency signal of unit 40, test signal output unit 40 is according to first voltage signal and second frequency signal output
3rd test signal, or test signal output unit 40 are tested according to second voltage signal and second frequency signal output the 4th
Signal.
Fig. 2 shows a kind of physical circuit figure for testing signal generation circuit that the utility model embodiment is provided.
As shown in Fig. 2 voltage regulation unit 10 includes：First chip U1, the first electric capacity C1 and first resistor R1.
First chip U1 input IN is the voltage input end of voltage regulation unit 10, and the first chip U1 output end OUT is
The voltage output end of voltage regulation unit 10, the first chip U1 control end ADJ is the control end of voltage regulation unit 10, the first electric capacity C1's
First end is connected with the first chip U1 input ON, the first electric capacity C1 the second end ground connection, first resistor R1 first end with
First chip U1 output end OUT is connected, first resistor R1 the second end ground connection.
As shown in Fig. 2 voltage signal switch unit 20 includes：First switch SW1, second resistance R2 and 3rd resistor
R3。
First switch SW1 fixing end is the input of voltage signal switch unit 20, first switch SW1 the first activity
End is connected with second resistance R2 first end, and first switch SW1 the second movable end is connected with 3rd resistor R3 first end, the
Two resistance R2 the second end is connected with 3rd resistor R3 the second end, and second resistance R2 the second end is voltage signal switch unit
20 voltage controlled end, 3rd resistor R3 the second end is the output end of voltage signal switch unit 20.
It should be noted that in the present embodiment, second resistance R2 resistance and 3rd resistor R3 resistance is unequal.
In practical application, the voltage signal according to needed for different test signals can be to second resistance R2 or 3rd resistor R3 specification
It is adjusted.
It is understood that when first switch SW1 the first movable end conducting, by second resistance R2 to the electricity after voltage stabilizing
Pressure carries out partial pressure, and then exports first voltage signal to test signal output unit.When first switch SW1 the second movable end is led
When logical, partial pressure is carried out to the voltage after voltage stabilizing by 3rd resistor R3, and then believe to test signal output unit output second voltage
Number.
As shown in Fig. 2 frequency signal generation unit 30 includes：Second chip U2, second switch SW2, the second electric capacity C2,
One switching tube Q1, the first diode D1, the 4th resistance R4, the 5th resistance R5, the 6th resistance R6, the electricity of the 7th resistance R7 and the 8th
Hinder R8.
4th resistance R4 first end is the output end of frequency signal generation unit 30, the 4th resistance R4 the second end and the
One switching tube Q1 hot end is connected, first switch pipe Q1 cold end ground connection, first switch pipe Q1 controlled end and the
Five resistance R5 first end is connected, and the 5th resistance R5 the second end is connected with the second chip U2 output control terminal Q, second switch
SW2 first end is the input of frequency signal generation unit 30, second switch SW2 the second end and the first of the 6th resistance R6
End is connected, and the 6th resistance R6 the second end is connected with the second electric capacity C2 first end, the first diode D1 first end and second
Electric capacity C2 first end is connected, and the second electric capacity C2 the second end and the first diode D1 the second end are grounded altogether, the 7th resistance R7
First end and the first diode D1 first end meet the second chip U2 power input VCC, the second of the 7th resistance R7 altogether
End and the 8th resistance R8 first end meet the second chip U1 discharge end DIS, the 8th resistance R8 the second end and the second chip altogether
U2 thresholding end THR is connected, and the second chip U2 triggering end TRIG is connected with the 8th resistance R8 the second end, the second chip U2's
Ground terminal GND is grounded.
It should be noted that when second switch SW2 is turned on, frequency signal generation unit 30 receives operating voltage, frequency
Rate signal generation unit 30 exports first frequency signal to test signal output unit 40, and test signal output unit 40 is according to the
One voltage signal and the test signal of first frequency signal output first, or test signal output unit 40 are believed according to second voltage
Number with the test signal of first frequency signal output second.When second switch SW2 disconnects, frequency signal generation unit 30 is not received
To operating voltage, frequency signal generation unit 30 exports second frequency signal to test signal output unit 40, and test signal is defeated
Go out unit 40 according to first voltage signal and the test signal of second frequency signal output the 3rd, or test signal output unit 40
According to second voltage signal and the test signal of second frequency signal output the 4th.
As shown in Fig. 2 test signal output unit 40 includes：Second diode D2, the 3rd diode D3, second switch pipe
Q2, the 3rd electric capacity C3, the first inductance L1, the 9th resistance R9 and the tenth resistance R10.
Second diode D2 first end is the voltage signal inputs of test signal output unit 40, the second diode D2
The second end and the 9th resistance R9 first end connect second switch pipe D2 cold end, the 9th resistance R9 the second termination altogether
Ground, controlled section of second switch pipe Q2 is the frequency signal input end of test signal output unit 40, and second switch pipe Q2's is low
Potential end is connected with the 3rd diode D3 first end, the 3rd diode D3 the second end and second switch pipe Q2 hot end
The tenth resistance R10 first end, the tenth resistance R10 the second end ground connection, the 3rd electric capacity C3 first end and the tenth resistance are connect altogether
R10 first end connects the first inductance L1 first end altogether, and the first inductance L1 the second end is the letter of test signal output unit 40
Number output end.
In all embodiments of the present utility model, first switch pipe and second switch pipe can be triode, IGBT
Manage or carry the IGBT pipes of body diode.
As a preferred embodiment, first switch pipe Q1 is NPN type triode Q1, NPN type triode Q1 emitter stage
For first switch pipe Q1 cold end, NPN type triode Q1 current collection extremely first switch pipe Q1 hot end, NPN type
Triode Q1 base stage is first switch pipe Q1 controlled end.
As a preferred embodiment, second switch pipe Q2 is PNP type triode Q2, PNP type triode Q2 emitter stage
For second switch pipe Q2 cold end, PNP type triode Q2 current collection extremely second switch pipe Q2 hot end, positive-negative-positive
Triode Q2 base stage is second switch pipe Q2 controlled end.
Operation principle below in conjunction with Fig. 2 testing signal generation circuits provided the utility model is described in detail.
As shown in Fig. 2 second switch SW1 of the dc source 110 also into frequency signal generation unit 30 first end is defeated
Enter operating voltage.The first chip U1 in voltage regulation unit 10 receives the direct current that dc source 110 is exported, and carries out voltage stabilizing to it
Processing.Conduction terminals different by switching first switch SW1 in voltage signal switch unit 20 is realized to the direct current after voltage stabilizing
Electricity carries out different degrees of partial pressure.Wherein, when first switch SW1 the first movable end conducting, by second resistance R2 to voltage stabilizing
Voltage afterwards carries out partial pressure, and generates first voltage signal output to test signal output unit 40；Or as first switch SW1
The conducting of the second movable end when, partial pressure is carried out to the voltage after voltage stabilizing by 3rd resistor R3, and second voltage signal output is generated
To test signal output unit 40.
When second switch SW2 is turned on, the power input VCC of the second chip U2 in frequency signal generation unit 30 leads to
Cross the 6th resistance R6 and receive operating voltage, the second chip U2 passes through output control terminal Q, the 5th resistance R5, first switch pipe Q1
And the 4th resistance R4 to test signal output unit 40 export first frequency signal；When second switch SW2 disconnects, in
Two chip U2 power input VCC can not receive operating voltage, and frequency signal generation unit 30 exports single to test signal
Member 40 exports second frequency signal.
It should be noted that voltage signal switch unit 20 is different according to the movable end of first switch SW1 conducting, generation
Voltage signal it is also different, be embodied in voltage signal switch unit 20 to test signal output unit 40 export first electricity
Pressure signal and second voltage signal are stablized on different magnitudes of voltage respectively, for example, the magnitude of voltage of first voltage signal is 13V,
The magnitude of voltage of first voltage signal is 18V.Frequency signal generation unit 30 according to the second switch SW1 state that is turned on or off,
First frequency signal or second frequency signal are exported to test signal output unit 40, wherein, when second switch SW1 is turned on,
Frequency signal generation unit 30 exports first frequency signal to test signal output unit 40, and the frequency of the first frequency signal can
Think 22KHz, when second switch SW1 disconnects, frequency signal generation unit 30 exports second to test signal output unit 40
Frequency signal, the frequency of the second frequency signal can be 0KHz.
For example, test signal output unit 40 is exported according to first voltage signal (13V) and first frequency signal (22KHz)
First test signal (13V, 22KHz), is exported by the first inductance L1 the second end.Or the basis of test signal output unit 40
Second voltage signal (18V) exports the second test signal (18V, 22KHz) with first frequency signal (22KHz), passes through the first electricity
Feel L1 the second end output.
For another example test signal output unit 40 is defeated according to first voltage signal (13V) and second frequency signal (0KHz)
Go out the 3rd test signal (13V, 0KHz), exported by the first inductance L1 the second end.Or test signal output unit 40
The 4th test signal (18V, 0KHz) is exported according to second voltage signal (18V) and second frequency signal (0KHz), passes through the first electricity
Feel L1 the second end output.
Fig. 3 shows that a kind of structure for test equipment for microwave communication device that the utility model embodiment is provided is shown
It is intended to, as shown in figure 3, a kind of test equipment 200 for microwave communication device that the present embodiment is provided, it includes dc source
110, and for carrying out characteristic test to microwave communication device, the test device 200 of microwave product includes examination letter as described above
Number generative circuit 100.
Simulation test is carried out to microwave product it should be noted that carrying out characteristic test to microwave product and being specifically as follows,
Or test microwave product receives or sent the ability of information.
Due to the test device of the microwave product provided in the present embodiment specific embodiment party relevant with the utility model
Formula and operation principle in the above-described embodiments and are elaborated, and therefore, here is omitted.
The utility model embodiment provides a kind of testing signal generation circuit, is built in a test equipment, test is set
It is ready for use on and characteristic test is carried out to microwave communication device；Testing signal generation circuit is connected with dc source, and is surveyed for generating
Trial signal；Test signal is used to test microwave communication device, and testing signal generation circuit includes：It includes：Voltage stabilizing list
Member, voltage signal switch unit, frequency signal generation unit and test signal output unit；Voltage regulation unit is to dc source
Output direct current is exported to voltage signal switch unit after carrying out voltage stabilizing processing, to cause voltage signal switch unit to believe to test
Number output unit output voltage signal, the magnitude of voltage of voltage signal follows the voltage switching state of voltage signal switch unit and true
It is fixed；Frequency signal generation unit generates frequency signal according to operating voltage, and frequency signal is exported into single to test signal output
Member, test signal output unit exports test signal according to voltage signal and frequency signal, reduces realization and microwave communication is filled
The cost for carrying out characteristic test is put, and causes the generating process of test signal to become simpler.
Preferred embodiment of the present utility model is the foregoing is only, it is all at this not to limit the utility model
Any modifications, equivalent substitutions and improvements made within the spirit and principle of utility model etc., should be included in the utility model
Protection domain within.
Claims (10)
1. a kind of testing signal generation circuit, is built in a test equipment, the test equipment is used for microwave communication device
Carry out characteristic test；The testing signal generation circuit is connected with dc source, and for generating test signal；The test letter
Number be used for the microwave communication device is tested, it is characterised in that the testing signal generation circuit includes：Voltage stabilizing list
Member, voltage signal switch unit, frequency signal generation unit and test signal output unit；
The voltage input end of the voltage regulation unit is connected with the dc source, the voltage output end of the voltage regulation unit with it is described
The input of voltage signal switch unit is connected, the control end of the voltage regulation unit and the voltage of the voltage signal switch unit
Controlled end is connected；The input of the frequency signal generation unit is connected with the dc source, and for receiving the direct current
The operating voltage that power supply is provided；The output end of the voltage signal switch unit and the voltage of the test signal output unit are believed
Number input is connected, and the output end of the frequency signal generation unit and the frequency signal of the test signal output unit are inputted
End is connected, and the signal output part of the test signal output unit is used to export the test signal；
The voltage regulation unit to the output direct current of the dc source export to the voltage signal after voltage stabilizing processing and cut
Unit is changed, to cause the voltage signal switch unit to the test signal output unit output voltage signal, the voltage
The magnitude of voltage of signal follows the voltage switching state of the voltage signal switch unit and determined；
The frequency signal generation unit generates frequency signal according to the operating voltage, and the frequency signal is exported to institute
Test signal output unit is stated, the test signal output unit is according to the voltage signal and frequency signal output
Test signal.
2. testing signal generation circuit as claimed in claim 1, it is characterised in that the voltage regulation unit includes：First chip,
First electric capacity and first resistor；
The input of first chip is the voltage input end of the voltage regulation unit, and the output end of first chip is described
The voltage output end of voltage regulation unit, the control end of first chip is the control end of the voltage regulation unit, first electric capacity
First end be connected with the input of first chip, the second end of first electric capacity ground connection, the of the first resistor
One end is connected with the output end of first chip, the second end ground connection of the first resistor.
3. testing signal generation circuit as claimed in claim 1, it is characterised in that the voltage signal switch unit includes：
First switch, second resistance and 3rd resistor；
The fixing end of the first switch is the input of the voltage signal switch unit, the first activity of the first switch
End is connected with the first end of the second resistance, the second movable end of the first switch and the first end phase of the 3rd resistor
Even, the second end of the second resistance is connected with the second end of the 3rd resistor, and the second end of the second resistance is described
The voltage controlled end of voltage signal switch unit, the second end of the 3rd resistor is the output of the voltage signal switch unit
End.
4. testing signal generation circuit as claimed in claim 1, it is characterised in that the frequency signal generation unit includes：
Second chip, second switch, the second electric capacity, first switch pipe, the first diode, the 4th resistance, the 5th resistance, the 6th resistance,
7th resistance and the 8th resistance；
The first end of 4th resistance be the frequency signal generation unit output end, the second end of the 4th resistance with
The hot end of the first switch pipe is connected, the cold end ground connection of the first switch pipe, the first switch pipe by
Control end is connected with the first end of the 5th resistance, the second end of the 5th resistance and the output control terminal of second chip
It is connected, the first end of the second switch is the input of the frequency signal generation unit, the second end of the second switch
It is connected with the first end of the 6th resistance, the second end of the 6th resistance is connected with the first end of second electric capacity, institute
The first end for stating the first diode is connected with the first end of second electric capacity, the second end of second electric capacity and described first
Second end of diode is grounded altogether, and the first end of the 7th resistance connects described second altogether with the first end of first diode
The power input of chip, the second end of the 7th resistance connects second chip altogether with the first end of the 8th resistance
Discharge end, the second end of the 8th resistance is connected with the thresholding end of second chip, the triggering end of second chip with
Second end of the 8th resistance is connected, the ground terminal ground connection of second chip.
5. testing signal generation circuit as claimed in claim 1, it is characterised in that the test signal output unit includes：
Second diode, the 3rd diode, second switch pipe, the 3rd electric capacity, the first inductance, the 9th resistance and the tenth resistance；
The first end of second diode is the voltage signal inputs of the test signal output unit, the two or two pole
The first end of second end of pipe and the 9th resistance connects the cold end of the second switch pipe altogether, and the of the 9th resistance
Two ends are grounded, controlled section of the second switch pipe be the test signal output unit frequency signal input end, described the
The cold end of two switching tubes is connected with the first end of the 3rd diode, the second end of the 3rd diode and described the
The hot end of two switching tubes connects the first end of the tenth resistance, the second end ground connection of the tenth resistance, the described 3rd altogether
The first end of electric capacity and the first end of the tenth resistance connect the first end of first inductance, the second of first inductance altogether
Hold as the signal output part of the test signal output unit.
6. testing signal generation circuit as claimed in claim 4, it is characterised in that the first switch pipe be triode,
IGBT manages or carried the IGBT pipes of body diode.
7. testing signal generation circuit as claimed in claim 6, it is characterised in that the first switch pipe is the pole of NPN type three
Pipe, the cold end of the extremely described first switch pipe of transmitting of the NPN type triode, the colelctor electrode of the NPN type triode
For the hot end of the first switch pipe, the base stage of the NPN type triode is the controlled end of the first switch pipe.
8. testing signal generation circuit as claimed in claim 5, it is characterised in that the second switch pipe be triode,
IGBT manages or carried the IGBT pipes of body diode.
9. testing signal generation circuit as claimed in claim 8, it is characterised in that the second switch pipe is the pole of positive-negative-positive three
Pipe, the cold end of the extremely described second switch pipe of transmitting of the PNP type triode, the colelctor electrode of the PNP type triode
For the hot end of the second switch pipe, the base stage of the PNP type triode is the controlled end of the second switch pipe.
10. a kind of test equipment for microwave communication device, it includes dc source, and for the microwave communication device
Carry out characteristic test, it is characterised in that the test equipment is also included as described in any one of claim 1 to 9 claim
Testing signal generation circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621462569.0U CN206431215U (en) | 2016-12-28 | 2016-12-28 | Test equipment and its testing signal generation circuit for microwave communication device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201621462569.0U CN206431215U (en) | 2016-12-28 | 2016-12-28 | Test equipment and its testing signal generation circuit for microwave communication device |
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| Publication Number | Publication Date |
|---|---|
| CN206431215U true CN206431215U (en) | 2017-08-22 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201621462569.0U Expired - Fee Related CN206431215U (en) | 2016-12-28 | 2016-12-28 | Test equipment and its testing signal generation circuit for microwave communication device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106707062A (en) * | 2016-12-28 | 2017-05-24 | 华讯方舟科技（湖北）有限公司 | Test equipment for microwave communication device and test signal generation circuit thereof |
-
2016
- 2016-12-28 CN CN201621462569.0U patent/CN206431215U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106707062A (en) * | 2016-12-28 | 2017-05-24 | 华讯方舟科技（湖北）有限公司 | Test equipment for microwave communication device and test signal generation circuit thereof |
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Effective date of registration: 20211104 Address after: 518000 418, floor 4, building 37, chentian Industrial Zone, Baotian 1st Road, Xixiang street, Bao'an District, Shenzhen, Guangdong Patentee after: SHENZHEN HUAXUN FANGZHOU SATELLITE INDUSTRIAL TECHNOLOGY Co.,Ltd. Address before: 434020 shacen Road (Zhuqiao Industrial Park), Jingzhou Development Zone, Jingzhou City, Hubei Province Patentee before: CHINA COMMUNICATION TECHNOLOGY(HUBEI) Co.,Ltd. |
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Granted publication date: 20170822 |