CN106683706A - Testing method of NVDIMM_ADR function - Google Patents
Testing method of NVDIMM_ADR function Download PDFInfo
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- CN106683706A CN106683706A CN201710007589.1A CN201710007589A CN106683706A CN 106683706 A CN106683706 A CN 106683706A CN 201710007589 A CN201710007589 A CN 201710007589A CN 106683706 A CN106683706 A CN 106683706A
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- adr
- nvdimm
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- test
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
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- Techniques For Improving Reliability Of Storages (AREA)
Abstract
The invention discloses a testing method of an NVDIMM-ADR function, relating to the field of data protection test. The method comprises the steps of (1) manufacturing a U disk startup disk of a test system by using an img file; (2) carrying out startup to enter a setup interface, entering a boot menu, setting a first startup item UEFI:Built-in EFI Shell and setting a second startup item as U disk startup; (3) opening an ADR function, entering an efi shell, executing an memmap inquiry address and a memory space of which Unknow-DES-Tydpe address space is NVDIMM; (4) inspecting whether data exists or not and entering U disk startup under the shell; (5) executing nvutil-w, confirming result data writing success, confirming correct writing, abnormally powering off analogue equipment and powering on the equipment again after an interval of a period of time; (6) entering the test system to execute nvutil-r after power-on is completed; and (7) checking a return value, carrying out data comparison and judging whether an ADR function test passes or not.
Description
Technical field
The present invention discloses a kind of function test method, is related to data protection field tests, specifically a kind of NVDIMM_
The method of testing of ADR functions.
Background technology
NVDIMM, Non-Volatile DIMM, Nonvolatile memory bar is that one kind inherits DRAM+ Nonvolatile memories
The memory bar of chip.The result of calculation and information on services of computer system is all temporarily held in internal memory, and these data are being
To lose after system power down, or even the collapse that whole system can be caused.NVDIMM can be solved under system exception power-down conditions, internal memory
The preservation work of data, and can be after system recovery normally runs, the work before continuation preserves complete internal storage data.
It is that NVDIMM can utilize the snapshot functions of virtual machine itself, in the case of system exception, rapid protection is stored in internal memory
Interim snapshot, reach the purpose for protecting whole virtual machine.
Asynchronous DRAM Self-Refresh technologies are that ADR technologies can ensure that CPU washes away cache in powered-off fault, write back cache
Dirty data, then by DRAM arrange enter self-refresh state.Control can be moved by CPU when DRAM is in self-refresh state
Give super internal memory.And NVDIMM be exactly DRAM be in self-refresh state when by CPU control right transfers to NVDIMM itself,
It is that NVDIMM is customized that ADR technologies are exactly.In addition, ADR technologies can selectively when computer craze starts, not to specific
The DRAM of passage is reinitialized, so as to retain DRAM in data.
But currently without the specific method of testing to NVDIMM ADR functions, it is impossible to ensure machine NVDIMM before dispatching from the factory
ADR functions are intact, once and before dispatching from the factory NVDIMM ADR dysfunctions, then be easily caused the loss of data of system, causing need not
The loss wanted.The present invention provides a kind of method of testing of NVDIMM_ADR functions, and system NVDIMM ADR functions are tested,
NVDIMM memory headrooms test coverage is high, effectively improves testing efficiency, and NVDIMM ADR functions are intact when ensureing that machine dispatches from the factory,
Loss of data when preventing system power failure.
The content of the invention
The present invention provides a kind of method of testing of NVDIMM_ADR functions, and system NVDIMM ADR functions are tested,
NVDIMM memory headrooms test coverage is high, effectively improves testing efficiency, and NVDIMM ADR functions are intact when ensureing that machine dispatches from the factory,
Loss of data when preventing system power failure.
A kind of method of testing of NVDIMM_ADR functions, step includes：
1. img files are used, test system USB flash disk boot disk is made；
2. start enters setup interfaces, into boot menus, arranges the first startup item UEFI：Built-in EFI
Shell, arranges the second startup item for USB flash disk startup；
3. ADR functions are opened, into efi shell, memmap inquiries address is performed, Unknow-DES-Tydpe addresses is empty
Between for NVDIMM memory headroom；
4. data presence is checked whether there is, is started into USB flash disk under shell；
5. nvutil-w are performed, confirm that result data write successfully, confirm to write errorless, simulator powered-off fault,
Re-power to equipment after certain interval of time；
6. go up and enter after the completion of electricity test system execution nvutil-r；
7. return value is checked, Data Comparison is carried out, judges whether ADR functional tests pass through.
5. middle result data are written as random data write to the step, and record the data of write.
The step 5. middle simulator powered-off fault, arranges and is less than 1 minute interval time, then goes up again to equipment
Electricity.
A kind of NVDIMM_ADR function test systems, including test system USB flash disk, test main frame,
Test system USB flash disk, using img documentings；
Wherein test main frame start enters setup interfaces, into boot menus, arranges the first startup item UEFI：Built-
In EFI Shell, arrange the second startup item for USB flash disk startup；
ADR functions are opened, into efi shell, memmap inquiries address, Unknow-DES-Tydpe address spaces is performed
For the memory headroom of NVDIMM；
Data presence is checked whether there is, is started into USB flash disk under shell；
Nvutil-w are performed, confirms that result data write successfully, confirm that write is errorless, simulation test main frame falls extremely
Electricity, re-powers after certain interval of time to test main frame；
Test system is entered after the completion of upper electricity perform nvutil-r；
Return value is checked, Data Comparison is carried out, judges whether ADR functional tests pass through.
Result data are written as random data write in the test main frame, and record the data of write.
Arrange and be less than 1 minute interval time, then re-power to the test main frame.
The present invention has an advantageous effect in that compared with prior art：
Using method of testing of the present invention, not tested person environmental effect, USB flash disk starts and carries test system, it is possible to achieve insert
The scheme surveyed, significant increase testing efficiency.Either part is introduced, and screening or the compatibility test of system can be used
Arrive, test transplantability is relatively good.Easy to operate and testing procedure is easily understood, NVDIMM memory headrooms test coverage is high,
Effectively improve testing efficiency.
Description of the drawings
Fig. 1 boot menu startup item interface schematic diagrams；
Fig. 2 NVDIMM configuration interface schematic diagrams；
Fig. 3 enters USB flash disk startup item interface schematic diagram；
Fig. 4 steps flow chart schematic diagrams of the present invention.
Specific embodiment
To make the object, technical solutions and advantages of the present invention become more apparent, below in conjunction with specific embodiment, to this
Bright further description.
The present invention also provides a kind of NVDIMM_ADR function test systems, including test system USB flash disk, test main frame,
Test system USB flash disk, using img documentings；
Wherein test main frame start enters setup interfaces, into boot menus, arranges the first startup item UEFI：Built-
In EFI Shell, arrange the second startup item for USB flash disk startup；
ADR functions are opened, into efi shell, memmap inquiries address, Unknow-DES-Tydpe address spaces is performed
For the memory headroom of NVDIMM；
Data presence is checked whether there is, is started into USB flash disk under shell；
Nvutil-w are performed, confirms that result data write successfully, confirm that write is errorless, simulation test main frame falls extremely
Electricity, re-powers after certain interval of time to test main frame；
Test system is entered after the completion of upper electricity perform nvutil-r；
Return value is checked, Data Comparison is carried out, judges whether ADR functional tests pass through.
Result data are written as random data write in the test main frame, and record the data of write.
Arrange and be less than 1 minute interval time, then re-power to the test main frame.
Using the inventive method, concrete operations are as follows：
With the img documentings for providing into USB flash disk boot disk；
Start enters setup interfaces, and into boot menus, the first startup item is set to UEFI：Built-in EFI
Shell, the second boot settings configuration is USB flash disk startup；Referring to accompanying drawing 1；
Enable ADR->enable,Adr data save mode->NVDIMMs,Check PCH_PM_STS->
Enable, opens ADR functions, refer to the attached drawing 2；
Into efi shell：
Memmap inquiries address is performed, Unknow-DES-Tydpe address spaces are the memory headroom of NVDIMM；
NVDIMM spaces are divided an address space by system, and operating system routine behavior is without the space of NVDIMM, ground
Location space is shielded；With reference to data below：
Mem 3880000000 is performed, data presence is checked whether there is, with reference to data below：
Strike exit under shell to start into USB flash disk,
Refer to the attached drawing 3, and data below：
Nvutil-w are performed, confirms that the data of result 0 write successfully.Write data be random data, the data meeting of write
Record, brings after starting next time and compares；With reference to data below：
Confirm that write is errorless, pull out device power supply (DPS), simulate powered-off fault, re-power to equipment after the 10s of interval；
Test system is entered after the completion of upper electricity perform nvutil-r.Return value is 0, illustrates that Data Comparison is correct, ADR functions
Test passes through.
Specify data in the write of NVDIMM memory headrooms using before the inventive method power down；Power line is pulled out, simulation sets
Standby powered-off fault；To device power, power recovery is simulated；After equipment completes to start, check existing internal storage data with writing data
It is whether consistent.
As a result judge：A) consistent, ADR functional tests pass through；B) inconsistent, test does not pass through.
Claims (6)
1. a kind of method of testing of NVDIMM_ ADR functions, it is characterised in that step includes：
1. img files are used, test system USB flash disk boot disk is made；
2. start enters setup interfaces, into boot menus, arranges the first startup item UEFI：Built-in EFI Shell,
Second startup item is set for USB flash disk startup；
3. ADR functions are opened, into efi shell, memmap inquiries address, Unknow-DES-Tydpe address spaces is performed
For the memory headroom of NVDIMM；
4. data presence is checked whether there is, is started into USB flash disk under shell；
5. nvutil-w are performed, confirms that result data write successfully, confirm to write errorless, simulator powered-off fault,
Re-power to equipment after a period of time；
6. go up and enter after the completion of electricity test system execution nvutil-r；
7. return value is checked, Data Comparison is carried out, judges whether ADR functional tests pass through.
2. a kind of method of testing of NVDIMM_ADR functions according to claim 1, it is characterised in that step 5. middle result
Data are written as random data write, and record the data of write.
3. a kind of method of testing of NVDIMM_ADR functions according to claim 1 or claim 2, it is characterised in that step 5. middle simulation
Unit exception power down, arranges and is less than 1 minute interval time, then re-powers to equipment.
4. a kind of NVDIMM_ADR function test systems, it is characterised in that including test system USB flash disk, test main frame,
Test system USB flash disk, using img documentings；
Wherein test main frame start enters setup interfaces, into boot menus, arranges the first startup item UEFI：Built-in
EFI Shell, arrange the second startup item for USB flash disk startup；
ADR functions are opened, into efi shell, memmap inquiries address is performed, Unknow-DES-Tydpe address spaces are
The memory headroom of NVDIMM；
Data presence is checked whether there is, is started into USB flash disk under shell；
Nvutil-w are performed, confirm that result data write successfully, confirm to write errorless, simulation test main frame powered-off fault,
Re-power to test main frame after certain interval of time；
Test system is entered after the completion of upper electricity perform nvutil-r；
Return value is checked, Data Comparison is carried out, judges whether ADR functional tests pass through.
5. a kind of NVDIMM_ADR function test systems according to claim 4, it is characterised in that result in test main frame
Data are written as random data write, and record the data of write.
6. a kind of NVDIMM_ADR function test systems are stated according to claim 4 or 5, it is characterised in that arrange and do not surpass interval time
1 minute is spent, is then re-powered to test main frame.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201710007589.1A CN106683706A (en) | 2017-01-05 | 2017-01-05 | Testing method of NVDIMM_ADR function |
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| CN201710007589.1A CN106683706A (en) | 2017-01-05 | 2017-01-05 | Testing method of NVDIMM_ADR function |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107807870A (en) * | 2017-10-30 | 2018-03-16 | 郑州云海信息技术有限公司 | A kind of method of testing and system of storage server mainboard power-down protection |
| CN107957936A (en) * | 2017-12-14 | 2018-04-24 | 郑州云海信息技术有限公司 | Stabilization of equipment performance test method and device based on EFI Shell |
| CN110739025A (en) * | 2019-09-30 | 2020-01-31 | 广州妙存科技有限公司 | storage equipment power failure test method, device and system |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101576860A (en) * | 2009-06-11 | 2009-11-11 | 成都市华为赛门铁克科技有限公司 | Detection method and detection system |
| CN101916593A (en) * | 2010-07-15 | 2010-12-15 | 凌阳科技股份有限公司 | Memory test system |
| CN104021093A (en) * | 2014-06-24 | 2014-09-03 | 浪潮集团有限公司 | Power-down protection method for memory device based on NVDIMM (non-volatile dual in-line memory module) |
| CN104268076A (en) * | 2014-09-23 | 2015-01-07 | 浪潮电子信息产业股份有限公司 | Testing method suitable for automatically testing memory bandwidth of each processor platform |
| US20150279463A1 (en) * | 2014-03-31 | 2015-10-01 | Dell Products, L.P. | Adjustable non-volatile memory regions of dram-based memory module |
| CN105511993A (en) * | 2015-12-09 | 2016-04-20 | 浪潮电子信息产业股份有限公司 | UEFI (unified extensible firmware interface) -based server NVME (network video management entity) hard disk backplane function test method |
| CN105550129A (en) * | 2015-12-08 | 2016-05-04 | 浪潮(北京)电子信息产业有限公司 | Power failure protection system and method based on NVDIMM (Non-Volatile Dual In-line Memory Module) |
-
2017
- 2017-01-05 CN CN201710007589.1A patent/CN106683706A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101576860A (en) * | 2009-06-11 | 2009-11-11 | 成都市华为赛门铁克科技有限公司 | Detection method and detection system |
| CN101916593A (en) * | 2010-07-15 | 2010-12-15 | 凌阳科技股份有限公司 | Memory test system |
| US20150279463A1 (en) * | 2014-03-31 | 2015-10-01 | Dell Products, L.P. | Adjustable non-volatile memory regions of dram-based memory module |
| CN104021093A (en) * | 2014-06-24 | 2014-09-03 | 浪潮集团有限公司 | Power-down protection method for memory device based on NVDIMM (non-volatile dual in-line memory module) |
| CN104268076A (en) * | 2014-09-23 | 2015-01-07 | 浪潮电子信息产业股份有限公司 | Testing method suitable for automatically testing memory bandwidth of each processor platform |
| CN105550129A (en) * | 2015-12-08 | 2016-05-04 | 浪潮(北京)电子信息产业有限公司 | Power failure protection system and method based on NVDIMM (Non-Volatile Dual In-line Memory Module) |
| CN105511993A (en) * | 2015-12-09 | 2016-04-20 | 浪潮电子信息产业股份有限公司 | UEFI (unified extensible firmware interface) -based server NVME (network video management entity) hard disk backplane function test method |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107807870A (en) * | 2017-10-30 | 2018-03-16 | 郑州云海信息技术有限公司 | A kind of method of testing and system of storage server mainboard power-down protection |
| CN107957936A (en) * | 2017-12-14 | 2018-04-24 | 郑州云海信息技术有限公司 | Stabilization of equipment performance test method and device based on EFI Shell |
| CN110739025A (en) * | 2019-09-30 | 2020-01-31 | 广州妙存科技有限公司 | storage equipment power failure test method, device and system |
| CN110739025B (en) * | 2019-09-30 | 2021-09-21 | 广州妙存科技有限公司 | Power failure test method, device and system for storage equipment |
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Application publication date: 20170517 |