CN106662487B - 集中取得型光检测装置和光检测方法 - Google Patents
集中取得型光检测装置和光检测方法 Download PDFInfo
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- CN106662487B CN106662487B CN201580035678.6A CN201580035678A CN106662487B CN 106662487 B CN106662487 B CN 106662487B CN 201580035678 A CN201580035678 A CN 201580035678A CN 106662487 B CN106662487 B CN 106662487B
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
- G01J2001/1678—Comparing time separated signals, i.e. chopped
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4238—Pulsed light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J2001/4242—Modulated light, e.g. for synchronizing source and detector circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4406—Plural ranges in circuit, e.g. switchable ranges; Adjusting sensitivity selecting gain values
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Optical Communication System (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014-139223 | 2014-07-05 | ||
| JP2014139223A JP6296609B2 (ja) | 2014-07-05 | 2014-07-05 | 一括取得型光検出装置及び光検出方法 |
| PCT/JP2015/065892 WO2016006367A1 (ja) | 2014-07-05 | 2015-06-02 | 一括取得型光検出装置及び光検出方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106662487A CN106662487A (zh) | 2017-05-10 |
| CN106662487B true CN106662487B (zh) | 2019-07-05 |
Family
ID=55064009
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201580035678.6A Active CN106662487B (zh) | 2014-07-05 | 2015-06-02 | 集中取得型光检测装置和光检测方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10090918B2 (ja) |
| EP (1) | EP3165887B1 (ja) |
| JP (1) | JP6296609B2 (ja) |
| CN (1) | CN106662487B (ja) |
| WO (1) | WO2016006367A1 (ja) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10014955B1 (en) * | 2015-04-24 | 2018-07-03 | Vencore Labs, Inc. | Signal processing circuit with optical local oscillator signal |
| US10715259B1 (en) * | 2018-01-24 | 2020-07-14 | Inphi Corporation | Impairment compensation techniques for high performance coherent optical transceivers |
| DE102018133443A1 (de) * | 2018-12-21 | 2020-06-25 | Leica Microsystems Cms Gmbh | Impulsdetektor |
| JP7196995B2 (ja) * | 2019-03-26 | 2022-12-27 | 日本電気株式会社 | 波長多重光伝送システム、波長多重光伝送方法及びプログラム |
| CN111786674B (zh) * | 2020-07-09 | 2022-08-16 | 北京大学 | 一种模数转换系统模拟带宽扩展的方法及系统 |
| US11664898B2 (en) * | 2020-07-15 | 2023-05-30 | Oewaves, Inc. | Photonic processing of RF signals using polychromatic coherent optical source |
| CN112737673B (zh) * | 2020-12-28 | 2023-11-03 | 重庆邮电大学 | 一种噪声下瞬态微弱微波信号频谱光学检测方法及装置 |
| CN112910563B (zh) * | 2021-01-26 | 2023-05-02 | 中国科学院半导体研究所 | 信号产生装置及方法 |
| CN113315582B (zh) * | 2021-05-24 | 2022-09-23 | 中国人民解放军国防科技大学 | 微波光子双光频率梳ofdm发射装置及发射方法 |
| CN114205001B (zh) * | 2021-11-29 | 2023-07-11 | 武汉邮电科学研究院有限公司 | 一种低复杂度的波长标签生成与检测方法及系统 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0868045A2 (en) * | 1997-03-25 | 1998-09-30 | Lucent Technologies Inc. | Time delay device for optical signals |
| JP2006029821A (ja) * | 2004-07-12 | 2006-02-02 | Optical Comb Institute Inc | 光周波数測定システム |
| CN103424194A (zh) * | 2013-08-13 | 2013-12-04 | 中国航空工业集团公司北京长城计量测试技术研究所 | 一种飞秒激光频率梳频率稳定性的测量方法及装置 |
| CN103633537A (zh) * | 2013-11-13 | 2014-03-12 | 中国科学院物理研究所 | 一种载波包络相移频率可控的低噪声光纤激光频率梳装置 |
| CN103794980A (zh) * | 2014-01-27 | 2014-05-14 | 华东师范大学 | 用高功率光纤光学频率梳测量光频率的方法及其装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4959540A (en) * | 1989-05-15 | 1990-09-25 | International Business Machines Corporation | Optical clock system with optical time delay means |
| JPH0862051A (ja) * | 1994-08-25 | 1996-03-08 | Anritsu Corp | 繰り返し光波形生成装置 |
| US7009759B2 (en) * | 2000-05-24 | 2006-03-07 | The Board Of Trustees Of The Leland Stanford Junior University | Multiple channel optical frequency mixers for all-optical signal processing |
| JP4771216B2 (ja) | 2006-03-15 | 2011-09-14 | 独立行政法人情報通信研究機構 | 超平坦光周波数コム信号発生器 |
| JPWO2010100745A1 (ja) * | 2009-03-05 | 2012-09-06 | オリンパス株式会社 | 光検出装置および光検出方法、並びに、顕微鏡および内視鏡 |
-
2014
- 2014-07-05 JP JP2014139223A patent/JP6296609B2/ja active Active
-
2015
- 2015-06-02 WO PCT/JP2015/065892 patent/WO2016006367A1/ja active Application Filing
- 2015-06-02 EP EP15818667.6A patent/EP3165887B1/en active Active
- 2015-06-02 CN CN201580035678.6A patent/CN106662487B/zh active Active
- 2015-06-02 US US15/323,728 patent/US10090918B2/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0868045A2 (en) * | 1997-03-25 | 1998-09-30 | Lucent Technologies Inc. | Time delay device for optical signals |
| JP2006029821A (ja) * | 2004-07-12 | 2006-02-02 | Optical Comb Institute Inc | 光周波数測定システム |
| CN103424194A (zh) * | 2013-08-13 | 2013-12-04 | 中国航空工业集团公司北京长城计量测试技术研究所 | 一种飞秒激光频率梳频率稳定性的测量方法及装置 |
| CN103633537A (zh) * | 2013-11-13 | 2014-03-12 | 中国科学院物理研究所 | 一种载波包络相移频率可控的低噪声光纤激光频率梳装置 |
| CN103794980A (zh) * | 2014-01-27 | 2014-05-14 | 华东师范大学 | 用高功率光纤光学频率梳测量光频率的方法及其装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3165887A1 (en) | 2017-05-10 |
| EP3165887B1 (en) | 2019-03-27 |
| US10090918B2 (en) | 2018-10-02 |
| US20170141844A1 (en) | 2017-05-18 |
| JP2016017781A (ja) | 2016-02-01 |
| EP3165887A4 (en) | 2018-03-21 |
| JP6296609B2 (ja) | 2018-03-20 |
| CN106662487A (zh) | 2017-05-10 |
| WO2016006367A1 (ja) | 2016-01-14 |
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