CN106649041A - Device and method for automatically testing storage caching mode - Google Patents
Device and method for automatically testing storage caching mode Download PDFInfo
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- CN106649041A CN106649041A CN201611227027.XA CN201611227027A CN106649041A CN 106649041 A CN106649041 A CN 106649041A CN 201611227027 A CN201611227027 A CN 201611227027A CN 106649041 A CN106649041 A CN 106649041A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/3003—Monitoring arrangements specially adapted to the computing system or computing system component being monitored
- G06F11/3034—Monitoring arrangements specially adapted to the computing system or computing system component being monitored where the computing system component is a storage system, e.g. DASD based or network based
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Abstract
The invention discloses a device for automatically testing a storage caching mode. The device comprises a monitoring module, a mode conversion module and a time generating module, wherein the monitoring module is connected to the mode conversion module and the time generating module respectively. The invention further discloses a method for automatically testing the storage caching mode. The method comprises the steps that the monitoring module tests a caching mode of current storage and inputs state information of the caching mode to the mode conversion module; the mode conversion module judges a next caching mode according to the state information of the caching mode through a mode conversion method; the mode conversion module converts the caching mode of the current storage into the next caching mode; the time generating module generates time intervals, and after the time intervals are out, the monitoring module is triggered to test the next caching mode. The device and method for automatically testing the storage caching mode solve the problem of the storage caching mode that testing needs to be manually switched, and thus the efficiency and the cover degree of storage testing are improved.
Description
Technical field
The present invention relates to server storage technical field, more particularly to a kind of device of automatic test memory buffers pattern
And method.
Background technology
Storage is exactly to store data into certain by taking reasonable, safe and effective mode according to different applied environments
On a little media and effectively access is can guarantee that, can generally include the implication of two aspects：On the one hand it is that data are interim
Or long-term resident physical media；On the other hand, it is mode or the behavior for ensureing the storage of data complete safety.
With the swift and violent growth of information data amount, the growth of data and value become more and more important, thus to store performance, can
Put forward higher requirement by property.In order to meet the requirements at the higher level of storage performance, the effect cached in storage control is not allowed little
Look, various cache modes are devised in current storage system, to reach the performance and data reliability that more optimize.But storage is slow
Deposit pattern various, carry out manual test travel time length, switching complexity, in different business application, the change of memory module is right
The performance of storage, stability suffer from strong influence, and the security to data has very big impact, to data consistency
Greatly test is there is also, so the test of memory buffers pattern has vital meaning for the test of storage system
Justice.
The content of the invention
It is an object of the present invention to provide a kind of device and method of automatic test memory buffers pattern, solves memory buffers mould
The problem of formula manual switching test, so as to improve the efficiency and coverage of storage test.
To achieve these goals, the present invention adopts following technical scheme：
A kind of device of automatic test memory buffers pattern, including：
Monitoring module, for detecting currently stored cache mode；
Mode conversion module, for switching cache mode；
Time generation module, for setting the time interval of cache mode；
The monitoring module is connected respectively with mode conversion module and time generation module.
Preferably, also include：Predefined module, for predefining cache mode status information and patten transformation mode.
Preferably, mode conversion module includes judge module and modular converter；
Judge module, for the cache mode status information being input into according to monitoring module, judges next according to patten transformation mode
Plant cache mode；
Modular converter, for currently stored cache mode to be converted to into a kind of lower cache mode.
The present invention also provides a kind of method of automatic test memory buffers pattern, comprises the following steps：
Monitoring module detects currently stored cache mode, and cache mode status information is inputed to into mode conversion module；
Mode conversion module is according to cache mode status information, a kind of cache mode under judging according to patten transformation mode；
Currently stored cache mode is converted to a kind of lower cache mode by mode conversion module；
Time generation module generates time interval；
After interval time arrives, triggering monitoring module detects a kind of above-mentioned lower cache mode.
Preferably, the patten transformation mode includes random transition mode or order conversion regime.
Preferably, monitoring module detects currently stored cache mode, and cache mode status information is inputed to into pattern
Before modular converter, also include：Predefined cache mode status information and patten transformation mode.
Compared with prior art, the present invention has advantages below：
1. the present invention detects currently stored cache mode by monitoring module, and cache mode status information is inputed to into pattern
Modular converter, mode conversion module according to the cache mode status information of present mode, and under judging according to patten transformation mode
Currently stored cache mode is converted to a kind of lower cache mode by a kind of cache mode, mode conversion module, and the time generates mould
Block generates time interval, after interval time arrives, continues triggering monitoring module and cache mode status information is inputed to into patten transformation
Module.Automatically all cache modes of traversal of the invention storage, and switch between various cache modes, it is ensured that all cachings of storage
The efficient test of pattern, improves the efficiency and coverage of storage test, reduces the time cost of tester.
2. present invention achieves testing memory buffers pattern automatically, it is not necessary to human intervention, testing efficiency is improve, reduced
Human cost.
Description of the drawings
Fig. 1 is a kind of one of structural representation of device of automatic test memory buffers pattern of the present invention；
Fig. 2 is a kind of one of schematic flow sheet of method of automatic test memory buffers pattern of the present invention；
Fig. 3 is the two of a kind of structural representation of the device of automatic test memory buffers pattern of the present invention；
Fig. 4 is the two of a kind of schematic flow sheet of the method for automatic test memory buffers pattern of the present invention.
Specific embodiment
With reference to the accompanying drawings and examples, the specific embodiment of the present invention is described in further detail：
Embodiment one：A kind of device of automatic test memory buffers pattern of the present invention as shown in figure 1, including predefined module 11,
Monitoring module 12, judge module 13, modular converter 14 and time generation module 15；The predefined module 11 successively order and prison
Control module 12, judge module 13 are connected with modular converter 14, time generation module 15 respectively with modular converter 14 and monitor mould
Block 12 is connected.
Predefined module 11 is used to predefine cache mode status information and patten transformation mode；Monitoring module 12 is used to examine
Currently stored cache mode is surveyed, and the cache mode status information of the pattern is inputed to into judge module 13；Judge module 13
For the cache mode status information being input into according to monitoring module 12, judge lower a kind of slow according to predefined patten transformation mode
Deposit pattern；Modular converter 14 is used to for currently stored cache mode to be converted to a kind of lower cache mode；Time generation module 15
For setting the time interval of cache mode.
Embodiment two：A kind of method of automatic test memory buffers pattern of the present invention is as shown in Fig. 2 comprise the following steps：
Step S201, predefines cache mode status information and patten transformation mode, and patten transformation mode can be turned using order
Change mode or random transition mode.
Step S202, monitoring module detects currently stored cache mode, and corresponding cache mode status information is defeated
Enter to mode conversion module.
Step S203, all cache modes of mode conversion module write storage, is respectively defined as first mode, the second mould
Formula, the 3rd pattern etc.；Mode conversion module judges next according to the cache mode status information of input according to patten transformation mode
Cache mode is planted, for example, a kind of lower cache mode is first mode.
Currently stored cache mode is converted to first mode by step S204, mode conversion module.
Step S205, time generation module automatically generates a time interval, such as 10s, the time interval can be controlled in
Within the scope of one, can change, such as 0～60s.
Step S206, first mode is kept after 10s, continues to trigger monitoring module detection first mode, and by first mode
Status information input to mode conversion module.
Step S207, mode conversion module judges next according to the status information of first mode according to patten transformation mode
Cache mode is planted, for example, a kind of lower cache mode is second mode；
First mode is converted to second mode by step S208, mode conversion module；The rest may be inferred.
All cache modes of storage are preserved in mode conversion module, the present invention can automatically travel through all caching moulds
Formula, mode conversion module automatically switches to a kind of lower cache mode and carries out according to cache mode status information and patten transformation mode
Test, so as to improve the testing efficiency and coverage of memory buffers pattern.
Embodiment three：The device of another kind of memory buffers pattern of test automatically of the invention is as shown in figure 3, including monitoring module
31st, mode conversion module 32 and time generation module 33；The monitoring module 31 is given birth to respectively with mode conversion module 32 and time
It is connected into module 33.
Monitoring module 31 is used to detect currently stored cache mode, and the cache mode status information of the pattern is input into
To mode conversion module 32；All cache modes of the write storage of mode conversion module 32, read the slow of the input of monitoring module 31
Mode state information is deposited, and switches cache mode；Time generation module 33 is used to set the time interval of cache mode.
Example IV：The method of another kind of memory buffers pattern of test automatically of the invention is as shown in figure 4, including following step
Suddenly：
Step S401, monitoring module detects currently stored cache mode, and cache mode status information is inputed to into pattern turn
Mold changing block；
Step S402, mode conversion module judges a kind of lower caching according to cache mode status information according to patten transformation mode
Pattern；
Currently stored cache mode is converted to a kind of lower cache mode by step S403, mode conversion module；
Step S404, time generation module generates time interval；
Step S405, after interval time arrives, triggering monitoring module detects a kind of above-mentioned lower cache mode.
The present invention is cut by mode conversion module automatic switchover cache mode, the automatic traversal for realizing various cache modes
Change, execution efficiency is high, coverage is high.
Illustrated above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, under the premise without departing from the principles of the invention, some improvements and modifications can also be made, these improvements and modifications also should
It is considered as protection scope of the present invention.
Claims (6)
1. a kind of device of automatic test memory buffers pattern, it is characterised in that include：
Monitoring module, for detecting currently stored cache mode；
Mode conversion module, for switching cache mode；
Time generation module, for setting the time interval of cache mode；
The monitoring module is connected respectively with mode conversion module and time generation module.
2. the device of automatic test memory buffers pattern according to claim 1, it is characterised in that also include：
Predefined module, for predefining cache mode status information and patten transformation mode.
3. the device of automatic test memory buffers pattern according to claim 2, it is characterised in that mode conversion module bag
Include judge module and modular converter；
Judge module, for the cache mode status information being input into according to monitoring module, judges next according to patten transformation mode
Plant cache mode；
Modular converter, for currently stored cache mode to be converted to into a kind of lower cache mode.
4. a kind of method of automatic test memory buffers pattern, it is characterised in that comprise the following steps：
Monitoring module detects currently stored cache mode, and cache mode status information is inputed to into mode conversion module；
Mode conversion module is according to cache mode status information, a kind of cache mode under judging according to patten transformation mode；
Currently stored cache mode is converted to a kind of lower cache mode by mode conversion module；
Time generation module generates time interval；
After interval time arrives, triggering monitoring module detects a kind of above-mentioned lower cache mode.
5. the method for automatic test memory buffers pattern according to claim 4, it is characterised in that the patten transformation side
Formula includes random transition mode or order conversion regime.
6. the method for automatic test memory buffers pattern according to claim 4, it is characterised in that monitoring module detection is worked as
The cache mode of front storage, and cache mode status information is inputed to before mode conversion module, also include：Predefined caching
Mode state information and patten transformation mode.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201611227027.XA CN106649041A (en) | 2016-12-27 | 2016-12-27 | Device and method for automatically testing storage caching mode |
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| CN201611227027.XA CN106649041A (en) | 2016-12-27 | 2016-12-27 | Device and method for automatically testing storage caching mode |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114630175A (en) * | 2022-03-14 | 2022-06-14 | 网络通信与安全紫金山实验室 | Cache management method, device, equipment and storage medium |
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| US7421540B2 (en) * | 2005-05-03 | 2008-09-02 | International Business Machines Corporation | Method, apparatus, and program to efficiently calculate cache prefetching patterns for loops |
| CN101706740A (en) * | 2009-10-28 | 2010-05-12 | 太仓市同维电子有限公司 | Cache mode self-adaptive system and method for data interaction |
| CN103150264A (en) * | 2013-01-18 | 2013-06-12 | 浪潮电子信息产业股份有限公司 | Extension Cache Coherence protocol-based multi-level consistency simulation domain verification and test method |
| WO2014094306A1 (en) * | 2012-12-21 | 2014-06-26 | 华为技术有限公司 | Method and device for setting working mode of cache |
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2016
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| US7421540B2 (en) * | 2005-05-03 | 2008-09-02 | International Business Machines Corporation | Method, apparatus, and program to efficiently calculate cache prefetching patterns for loops |
| CN101236530A (en) * | 2008-01-30 | 2008-08-06 | 清华大学 | High speed cache replacement policy dynamic selection method |
| CN101706740A (en) * | 2009-10-28 | 2010-05-12 | 太仓市同维电子有限公司 | Cache mode self-adaptive system and method for data interaction |
| WO2014094306A1 (en) * | 2012-12-21 | 2014-06-26 | 华为技术有限公司 | Method and device for setting working mode of cache |
| CN104321754A (en) * | 2012-12-21 | 2015-01-28 | 华为技术有限公司 | Method and device for setting working mode of Cache |
| CN103150264A (en) * | 2013-01-18 | 2013-06-12 | 浪潮电子信息产业股份有限公司 | Extension Cache Coherence protocol-based multi-level consistency simulation domain verification and test method |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114630175A (en) * | 2022-03-14 | 2022-06-14 | 网络通信与安全紫金山实验室 | Cache management method, device, equipment and storage medium |
| CN114630175B (en) * | 2022-03-14 | 2023-08-22 | 网络通信与安全紫金山实验室 | Cache management method, device, equipment and storage medium |
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