CN106646939B - A kind of Mura defects method for detecting - Google Patents
A kind of Mura defects method for detecting Download PDFInfo
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- CN106646939B CN106646939B CN201611022333.XA CN201611022333A CN106646939B CN 106646939 B CN106646939 B CN 106646939B CN 201611022333 A CN201611022333 A CN 201611022333A CN 106646939 B CN106646939 B CN 106646939B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- General Physics & Mathematics (AREA)
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- Testing Of Optical Devices Or Fibers (AREA)
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Abstract
The present invention discloses a kind of Mura defects method for detecting, comprising the following steps: the rectangle inspection area of liquid crystal display panel is moved to the correspondence defective locations of panel according to the type of actual defects manually, concurrently sets inspection area size；The inspection area moved is divided into several block of cells manually according to the type of actual defects；After having divided block, the brightness value of each CCD in each block is acquired, then calculates the average luminance value of each block, luminance maximum value, luminance minimum value, luminance standard deviation value this four parameters；The block of anomaly parameter is detected after after calculating above-mentioned parameter, as the elaborate position where defect.The present invention solves the problems, such as the missing inspection of ambiguity in liquid crystal display panel manufacturing industry, irregular Mura and the bad this kind of defect of Mura of burst, and detection effect is obvious in practical applications, improves Mura Detection capability, more efficient accurate.
Description
Technical field
The invention belongs to liquid crystal display panel detection techniques, and in particular to a kind of Mura defects method for detecting.
Background technique
Mura defects are a kind of common defects of vision in TFT-LCD, show as low contrast, non-uniform brightness region,
Edge blurry, typically larger than a pixel, can bring visual discomfort to observer.Simultaneously Mura defects be also in the defects of vision most
For complexity and it is most difficult to detection, generallys use the testing staff by professional training in industry at present according to limit sample human eye
The method of comparison is detected, and the factors such as subjective mind are inevitably introduced, and is easy to produce insecure judgement as a result, and imitating
Rate is lower.In recent years, researcher, which begins one's study using machine vision, replaces human eye to detect, most using closing on
The method of region luminance comparison.
As shown in Figure 1, in the prior art, the region C is fixed with upper and lower than in pair radius respectively when detecting Mura defects
The region A&B carry out luminance ratio pair, thus find out difference detection defect.
White Mura detection:
Black Mura detection:
But above-mentioned existing method is only applicable to the Mura detection of rule, due to being limited by than pair radius, the technology pair
Ambiguity, irregular Mura and the bad this kind of defect of Mura of burst can not preferably compare out difference, and this kind of Mura is caused to lack
Sunken missing inspection.
Summary of the invention
Goal of the invention: it is an object of the invention to solve the deficiencies in the prior art, a kind of Mura defects inspection is provided
Method out overcomes irregular, the unsetting Mura occurred in liquid crystal display panel manufacturing industry and the bad this kind of defect of Mura of burst
The missing inspection problem of type.
A kind of technical solution: Mura defects method for detecting of the present invention, comprising the following steps:
(1) the rectangle inspection area of liquid crystal display panel is moved to the correspondence of panel substantially according to the type of actual defects manually
Defective locations, while the size of inspection area is set according to actual needs, size setting in inspection area is without corresponding rule, according to reality
Border defect type sets itself；
(2) inspection area moved is divided by several block of cells according to the type of actual defects manually, is examined simultaneously
The block number for looking into region transverse and longitudinal direction can be adjusted arbitrarily, and defect is preferably locked in fixed block and is checked；
(3) after having divided block, the brightness that each CCD camera in each block is acquired after CCD camera shooting liquid crystal display panel is utilized
Angle value, then calculate this four average luminance value, luminance maximum value, luminance minimum value, luminance standard deviation value ginsengs of each block
Number；
(4) it calculates after above-mentioned parameter according to actual defects type, chooses suitable parameter and be compared, under normal conditions
More using standard deviation value, it reflects the luminance fluctuation situation an of block, and fluctuation is bigger to illustrate that brightness value is uneven, must
Fixed defective presence, detects the block of anomaly parameter after, as the elaborate position where defect.
Further, in the step (1),；When actual defects are corner stain Mura, then inspection area is moved to
The corner location of liquid crystal display panel.
Further, in the step (2), when defect shape is to happen suddenly bad i.e. oblique line shape Mura, then by test zone
Domain is laterally divided into 1*8 block, which is concentrated in a block.If other defect shape, then in the light of actual conditions and
It is fixed, inspection area is divided into several block of cells, substantially defective locations is preferably locked in fixed block and is examined
It looks into.
Further, in the step (3)
Average luminance value:
Luminance maximum value: xmax=max (x1、x2、x3、x4…xk)；
Luminance minimum value: xmin=min (x1、x2、x3、x4…xk)；
Standard deviation value:
Wherein,For average luminance value；x1、x2、x3、x4…xkRespectively refer to the brightness value of each CCD camera；K is CCD in block
The number of camera, value range are the number in actual block；xmaxFor luminance maximum value；xminFor luminance minimum value；S is standard
Deviation；xiRefer to the brightness value of each CCD camera.
Beneficial effect compared with prior art, the invention has the following advantages that
(1) present invention proposes a kind of novel detection side to the irregular Mura defects occurred in liquid crystal display panel manufacturing industry
Method can effectively be directed to ambiguity, irregular Mura and the bad this kind of defect of Mura of burst and effectively be detected.
(2) the liquid crystal display panel inspection area in the present invention can be moved to any position of panel according to actual defects type,
The size of inspection area can arbitrarily be set simultaneously, so that checking Mura defects more targeted.
(3) the liquid crystal display panel inspection area in the present invention can be divided into several blocks, while transverse and longitudinal direction number of blocks can
It arbitrarily adjusts, defect is preferably locked in fixed block by guarantee, then by comparing average luminance value, the luminance between each block
Maximum value, luminance minimum value, luminance standard deviation value are detected.
In conclusion the present invention solves ambiguity in liquid crystal display panel manufacturing industry, irregular Mura and the bad Mura of burst
The missing inspection problem of this kind of defect, and detection effect is obvious in practical applications, improves Mura Detection capability, more efficient essence
It is quasi-.
Detailed description of the invention
Fig. 1 is defects detection schematic diagram in background technique；
Fig. 2 is inspection area figure when actual defects type is edge arcuation in the present invention；
Fig. 3 is inspection area figure when actual defects type is corner stain in the present invention；
Fig. 4 is inspection area subregion schematic diagram when defect shape is oblique line shape in the present invention；
Each region brightness value schematic diagram in Fig. 5 present invention；
The testing process schematic diagram of Fig. 6 embodiment.
Specific embodiment
Technical solution of the present invention is described in detail below, but protection scope of the present invention is not limited to the implementation
Example.
As shown in Figures 2 to 5, a kind of Mura defects method for detecting of the present invention, comprising the following steps:
(1) the rectangle inspection area of liquid crystal display panel is moved to any position of panel according to actual defects type manually,
The size of inspection area is set according to actual needs simultaneously；
When actual defects are edge arcuation Mura, then inspection area is moved to the top half of liquid crystal display panel；Work as reality
When border defect is corner stain Mura, then inspection area is moved to the corner location of liquid crystal display panel；
(2) inspection area moved is divided by several block of cells according to the shape type of defect manually, is examined simultaneously
The block number for looking into region transverse and longitudinal direction can be adjusted arbitrarily, and defect is preferably locked in fixed block and is checked；
When defect shape is to happen suddenly bad i.e. oblique line shape Mura, then inspection area is laterally divided into 1*8 block, this is lacked
It falls into and concentrates in a block of bottom；
(3) after having divided block, the brightness value of each CCD camera in each block is acquired using CCD camera, then is calculated each
The average luminance value of block, luminance maximum value, luminance minimum value, luminance standard deviation value this four parameters；
Average luminance value:
Luminance maximum value: xmax=max (x1、x2、x3、x4…xk)；
Luminance minimum value: xmin=min (x1、x2、x3、x4…xk)；
Standard deviation value:
Wherein,For average luminance value；x1、x2、x3、x4…xkRespectively refer to the brightness value of each CCD camera；K is CCD in block
The number of camera, value range are the number in actual block；xmaxFor luminance maximum value；xminFor luminance minimum value；S is standard
Deviation；xiRefer to the brightness value of each CCD camera.
(4) it calculates after above-mentioned parameter according to actual defects type, chooses suitable parameter and be compared that (parameter calculates
Afterwards, which parameter is in the presence of obvious poor between four parameters of block and four parameters of other zero defect blocks where comparing defect
Different, so that one or more parameters are chosen to be to the setup parameter of the defect, and as suitable parameter), make under normal conditions
More with luminance standard deviation value, it reflects the luminance fluctuation situation an of block, and fluctuation is bigger to illustrate that brightness value is uneven,
Defective must exist, detect the block of anomaly parameter after, as the position where defect.
Embodiment 1:
By taking edge Mura as an example, the inspection area of liquid crystal display panel is set in the upper half of liquid crystal display panel for the Mura type
Part, then the inspection area is divided into 9 blocks, so that defect be concentrated in the block of the upper left corner, calculate separately out 9 areas
Four parameters of block are compared by each parameter it can be found that average luminance value, luminance maximum value, luminance minimum value this 3 parameters
Defect area and area free from defect no significant difference, and 35.39 (upper left corners) of block are bright where luminance standard deviation value defect
Aobvious to be greater than other 8 blocks, the defect can be detected by comparing standard deviation value thus.What standard deviation value had differences
Block is defect position.
Claims (3)
1. a kind of Mura defects method for detecting, it is characterised in that: the following steps are included:
(1) the rectangle inspection area of liquid crystal display panel is moved to the correspondence defective bit of panel according to the type of actual defects manually
It sets, while the size of inspection area is set according to actual needs；
(2) inspection area moved is divided by several block of cells, while test zone according to the type of actual defects manually
The block number in domain transverse and longitudinal direction can be adjusted arbitrarily, and defect is preferably locked in fixed block and is checked；
(3) after having divided block, the brightness value of each CCD camera in each block is acquired after shooting liquid crystal display panel using CCD camera,
The average luminance value of each block, luminance maximum value, luminance minimum value, luminance standard deviation value this four parameters are calculated again；
(4) it calculates after above-mentioned parameter according to actual defects type, chooses suitable parameter and be compared, luminance standard deviation value
The luminance fluctuation situation an of block is reflected, fluctuation is bigger to illustrate that brightness value is uneven, defective must exist, by comparing
The block of anomaly parameter is detected later, as the elaborate position where defect；
Wherein, suitable parameter refers to: after four parameters are calculated in step (3), four of block where comparing defect
Between parameter and four parameters of other zero defect blocks, the parameter there are notable difference is found out, so that relevant parameter is chosen to be
The setup parameter of the defect, as suitable parameter；
In the step (3)
Average luminance value:
Luminance maximum value: xmax=max (x1、x2、x3、x4…xk)；
Luminance minimum value: xmin=min (x1、x2、x3、x4…xk)；
Standard deviation value:
Wherein,For average luminance value；x1、x2、x3、x4…xkRespectively refer to each CCD brightness value；K is CCD number in block, value model
It encloses for the number in actual block；xmaxFor luminance maximum value；xminFor luminance minimum value；S is standard deviation value；xiRefer to each
CCD brightness value.
2. Mura defects method for detecting according to claim 1, it is characterised in that: in the step (1), work as actual defects
When for edge arcuation Mura, then inspection area is moved to the top half of liquid crystal display panel；When actual defects are corner stain
When Mura, then inspection area is moved to the corner location of liquid crystal display panel.
3. Mura defects method for detecting according to claim 1, it is characterised in that: in the step (2), work as actual defects
Shape is when happening suddenly bad i.e. oblique line shape Mura, then inspection area to be laterally divided into 1*8 block, which is concentrated on bottom
A block in.
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| CN107203056B (en) * | 2017-05-22 | 2019-12-24 | 深圳市华星光电技术有限公司 | Mura processing method for ultrahigh-resolution panel |
| CN107328791B (en) * | 2017-07-31 | 2020-06-30 | 京东方科技集团股份有限公司 | Defect detection method and device |
Citations (3)
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| JP3618713B2 (en) * | 2001-12-04 | 2005-02-09 | 三菱電機株式会社 | Display screen inspection method and display screen inspection apparatus |
| CN1920539A (en) * | 2005-08-26 | 2007-02-28 | 精工爱普生株式会社 | Defect detecting method and defect detecting device |
| CN105158942A (en) * | 2015-09-24 | 2015-12-16 | 昆山龙腾光电有限公司 | Automatic Mura detection method and system |
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| CN1553172A (en) * | 2003-05-26 | 2004-12-08 | 由田新技股份有限公司 | Testing method with disorder level of light intensity distribution as displaying quality of electronic displaying device |
| US7911498B2 (en) * | 2005-12-12 | 2011-03-22 | Novatek Microelectronics Corp. | Compensation device for non-uniform regions in flat panel display and method thereof |
| JP5093539B2 (en) * | 2009-01-09 | 2012-12-12 | 株式会社島津製作所 | Liquid crystal array inspection apparatus and signal processing method for liquid crystal array inspection apparatus |
| CN104166250A (en) * | 2013-05-20 | 2014-11-26 | 冠捷投资有限公司 | Flat panel display panel uniformity detection method and system |
| CN106054421B (en) * | 2016-07-28 | 2019-06-18 | 京东方科技集团股份有限公司 | A kind of detection method and device of liquid crystal display panel defect |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3618713B2 (en) * | 2001-12-04 | 2005-02-09 | 三菱電機株式会社 | Display screen inspection method and display screen inspection apparatus |
| CN1920539A (en) * | 2005-08-26 | 2007-02-28 | 精工爱普生株式会社 | Defect detecting method and defect detecting device |
| CN105158942A (en) * | 2015-09-24 | 2015-12-16 | 昆山龙腾光电有限公司 | Automatic Mura detection method and system |
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Effective date of registration: 20170509 Address after: A city road Nanjing city Jiangsu province 210033 Qixia Xianlin University No. 7 Applicant after: Nanjing Huadong Electronics Information Technology Co.,Ltd. Applicant after: Nanjing CLP panda flat panel display technology Co., Ltd. Address before: A city road Nanjing city Jiangsu province 210033 Qixia Xianlin University No. 7 Applicant before: Nanjing Huadong Electronics Information Technology Co.,Ltd. |
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Effective date of registration: 20200901 Address after: No.7 Tianyou Road, Qixia District, Nanjing City, Jiangsu Province Patentee after: NANJING CEC PANDA LCD TECHNOLOGY Co.,Ltd. Address before: A city road Nanjing city Jiangsu province 210033 Qixia Xianlin University No. 7 Co-patentee before: NANJING CEC PANDA FPD TECHNOLOGY Co.,Ltd. Patentee before: Nanjing East China Electronic Information Technology Co.,Ltd. |
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