CN106646226B - Hall assembly detection device and detection method thereof - Google Patents
Hall assembly detection device and detection method thereof Download PDFInfo
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- CN106646226B CN106646226B CN201610906250.0A CN201610906250A CN106646226B CN 106646226 B CN106646226 B CN 106646226B CN 201610906250 A CN201610906250 A CN 201610906250A CN 106646226 B CN106646226 B CN 106646226B
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Abstract
The invention discloses a Hall assembly detection device and a detection method thereof, wherein the detection device comprises a micro control unit, an acquisition circuit, a signal PG input interface and a display screen, when the detected Hall assembly is detected, the detected Hall assembly is only required to be placed on a PC board interface, then the PC board interface is connected with the signal PG input interface, and the detection device can automatically detect whether the detected Hall assembly is qualified or not and display a detection result and output parameters of the detected Hall assembly on the display screen. Therefore, compared with the prior art, the detection device disclosed by the invention has the advantages that the automatic detection of the Hall assembly is realized, the operation intensity of detection personnel is greatly reduced when the Hall assembly is detected, meanwhile, the situation of misjudgment of the Hall assembly caused by the error reading of the detection personnel is effectively avoided, and the detection accuracy of the Hall assembly is improved.
Description
Technical Field
The invention relates to the technical field of equipment detection, in particular to a Hall assembly detection device and a detection method thereof.
Background
In order to ensure safe and stable operation of the motor, each component of the motor is usually required to be detected before the motor leaves the factory, and the core of motor detection is to detect output parameters (including voltage, current, frequency, duty ratio, period, high-low pulse, capacitance value and the like) of the Hall assembly.
The current detection method for the output parameters of the Hall assembly is as follows: firstly, a regulated power supply is used for providing 5V working voltage for a Hall assembly, then an oscilloscope and an ammeter are used for obtaining output parameters of the Hall assembly, and each parameter value is displayed, finally, a detector observes and identifies the parameter value and waveform displayed on the oscilloscope and the current value displayed on the ammeter by eyes, and judges whether the tested Hall assembly is qualified or not according to each parameter value and waveform, so that the unqualified Hall assembly is found out.
Because the number of the Hall components which need to be detected by the detection personnel every day is up to thousands of, frequent detection operation and long-time continuous work easily lead to physical and mental exhaustion of the detection personnel, and the situation of misjudgment on the Hall components due to the error of reading the values and/or waveforms of various parameters is easy to occur. How to provide a hall assembly detection apparatus to reduce the operation intensity of the detection personnel and improve the detection accuracy of the hall assembly is a problem to be solved by those skilled in the art.
Disclosure of Invention
In view of the above, the present invention discloses a hall assembly detection device and a detection method thereof, so as to reduce the operation intensity of a detection personnel and improve the detection accuracy of the hall assembly when detecting the hall assembly.
A hall assembly detection apparatus, comprising:
the micro control unit is provided with a signal acquisition port and a signal control port;
the acquisition circuit is used for acquiring output parameters of the tested Hall assembly, the output end of the acquisition circuit is connected with the signal acquisition port, and the signal acquisition port is used for acquiring the output parameters;
one end of the signal PG input interface is used for being connected with a PG board interface for placing the tested Hall assembly and providing a power PG signal for the tested Hall assembly, and the other end of the signal PG input interface is connected with the input end of the acquisition circuit;
the signal control port is used for outputting the output parameters acquired by the micro control unit and detecting results of whether the tested Hall assembly is qualified or not according to comparison results of parameter values in the output parameters and corresponding parameter threshold ranges.
Preferably, the acquisition circuit includes:
the voltage acquisition circuit is used for acquiring output voltage parameters of the tested Hall assembly, the input end of the voltage acquisition circuit is connected with the signal PG input interface, the output end of the voltage acquisition circuit is connected with the signal acquisition port, and the signal acquisition port is used for acquiring the output voltage parameters;
the frequency acquisition circuit is used for acquiring output frequency parameters of the tested Hall assembly, the input end of the frequency acquisition circuit is connected with the signal PG input interface, the output end of the frequency acquisition circuit is connected with the signal acquisition port, and the signal acquisition port is used for acquiring the output frequency parameters;
the waveform acquisition circuit is used for acquiring output current waveform parameters of the tested Hall assembly, the input end of the waveform acquisition circuit is connected with the signal PG input interface, the output end of the waveform acquisition circuit is connected with the signal acquisition port, and the signal acquisition port is used for acquiring the output current waveform parameters;
the capacitance acquisition circuit is used for acquiring output capacitance parameters of the tested Hall assembly, the input end of the capacitance acquisition circuit is connected with the signal PG input interface, the output end of the capacitance acquisition circuit is connected with the signal acquisition port, and the signal acquisition port is used for acquiring the output capacitance parameters.
Preferably, the method further comprises:
and the storage unit is connected with the signal control port and used for storing the output information.
Preferably, the method further comprises:
and the alarm is connected with the signal control port and used for alarming according to the alarm control signal when the output information contains the alarm control signal.
Preferably, the alarm includes: an audible alarm.
Preferably, the alarm includes:
and the key alarm circuit is used for stopping alarm after receiving an alarm stopping instruction input by a user.
The Hall component detection method is applied to the Hall component detection device, and comprises the following steps:
obtaining output parameters of a measured Hall assembly;
comparing each parameter value in the output parameters with a corresponding parameter threshold range, detecting whether the tested Hall assembly is qualified or not, and obtaining a detection result;
and outputting and displaying the output parameters and the detection results on a display screen.
Preferably, the output parameters include: and the output parameters of the tested Hall assembly are output during static test and output parameters during dynamic test.
Preferably, the comparing each parameter value in the output parameter with the corresponding parameter threshold range, detecting whether the detected hall assembly is qualified, and obtaining a detection result includes:
comparing each parameter value with the corresponding parameter threshold range, and judging whether all the parameter values are in the corresponding parameter threshold range;
if all the parameter values are in the corresponding parameter threshold ranges, judging that the tested Hall assembly is qualified as the detection result;
if the parameter value with the numerical value not in the corresponding parameter threshold value range exists, the failure of the tested Hall assembly is judged to be the detection result.
Preferably, after determining that the measured hall assembly is not qualified, the method further includes:
and marking the parameter values which are not in the corresponding parameter threshold range, and displaying the parameter values on the display screen.
Preferably, when the hall assembly detection apparatus further includes an alarm, after determining that the detected hall assembly is failed, the hall assembly detection apparatus further includes:
generating an alarm control signal;
and outputting the alarm control signal to the alarm to control the alarm to alarm.
Preferably, after determining that the measured hall assembly is qualified, the method further includes:
generating a power-off control signal;
and outputting the power-off control signal to a signal PG input interface, and controlling the signal PG input interface to stop outputting a power PG signal to the tested Hall assembly.
Preferably, after the detection result is obtained, the method further includes:
judging the type of the detection result, and adding one to a first count value when the type of the detection result represents that the detected Hall assembly is qualified in detection; and when the type of the detection result represents that the detected Hall assembly is unqualified, adding one to a second count value, wherein the initial values of the first technical value and the second count value are zero.
Preferably, when the hall assembly detection apparatus further includes a storage unit, after the detection result is obtained, the hall assembly detection apparatus further includes:
and outputting the output parameters and the detection result to the storage unit for storage.
As can be seen from the above technical scheme, the invention discloses a hall assembly detection device and a detection method thereof, wherein the detection device comprises a micro control unit, an acquisition circuit, a signal PG input interface and a display screen, when the hall assembly to be detected is detected, the hall assembly to be detected is only required to be placed on a PC board interface, then the PC board interface is connected with the signal PG input interface, the detection device can automatically detect whether the hall assembly to be detected is qualified or not, and the detection result and the output parameters of the hall assembly to be detected are displayed on the display screen. Therefore, compared with the prior art, the detection device disclosed by the invention has the advantages that the automatic detection of the Hall assembly is realized, the operation intensity of detection personnel is greatly reduced when the Hall assembly is detected, meanwhile, the situation of misjudgment of the Hall assembly caused by the error reading of the detection personnel is effectively avoided, and the detection accuracy of the Hall assembly is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are only embodiments of the present invention, and that other drawings can be obtained according to the disclosed drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic structural diagram of a hall assembly detection apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a Hall assembly detection device according to another embodiment of the present invention;
fig. 3 is a flowchart of a method for detecting a hall element according to an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The embodiment of the invention discloses a Hall assembly detection device and a detection method thereof, which are used for reducing the operation intensity of detection personnel and improving the detection accuracy of a Hall assembly when the Hall assembly is detected.
Referring to fig. 1, a schematic structural diagram of a hall assembly detection apparatus according to an embodiment of the present invention is disclosed, where the detection apparatus includes: a micro control unit (Microcontroller Unit, MCU) 10, a collection circuit 20, a signal PG input interface 30 and a display screen 40.
Wherein:
the MCU10 has a signal acquisition port and a signal control port.
One end of the signal PG input interface 30 is used for being connected with a PG board interface for placing the tested hall assembly, so as to provide a power PG signal for the tested hall assembly, and the other end of the signal PG input interface 30 is connected with the input end of the acquisition circuit 20.
The Power PG signal is simply called a Power Good signal, is a logic of a dc output voltage detection signal and an ac input voltage detection signal, and is compatible with a TTL (Transistor Transistor Logic, transistor) signal. In the invention, the power PG signal is used for providing the power signal for the tested Hall assembly, wherein the power PG signal can be used as the power signal of the tested Hall assembly when the power PG signal contains the PG signal and the time sequence of the PG signal is correct.
The output end of the acquisition circuit 20 is connected with a signal acquisition port of the MCU10, and the acquisition circuit 20 is used for acquiring output parameters of the tested Hall assembly and outputting the output parameters to the MCU10 through the signal acquisition port.
The output parameters of the measured Hall assembly comprise: current, period, frequency, high pulse, low pulse, duty cycle, capacitance, etc.
The display screen 40 is connected with a signal control port of the MCU10, and the display screen 40 is used for displaying output information of the signal control port, wherein the signal control port is used for outputting output parameters collected by the MCU10 and detecting results of whether the tested Hall assembly is qualified or not according to comparison results of parameter values in the output parameters and corresponding parameter threshold ranges.
For facilitating understanding, the invention also discloses a detection process of the detected Hall assembly by adopting the Hall assembly detection device, which comprises the following steps:
(1) The power end 50 of the Hall assembly detection device is connected with an AC220V power supply, so that the Hall assembly detection device is in a starting state;
it should be noted that, after the hall assembly detection device is in the on state, each detected parameter of the detected hall assembly is displayed on the display screen 40, so that it is convenient for an inspector to check whether each detected parameter corresponds to the model of the detected hall assembly, thereby effectively avoiding erroneous judgment caused by that each detected parameter does not correspond to the model of the detected hall assembly.
(2) Setting an upper limit value and a lower limit value of each measured parameter of the measured Hall assembly to obtain a parameter threshold range of each measured parameter, wherein the Hall assembly detection device is in a normal working state;
(3) The PG board interface with the tested hall assembly is inserted into the signal PG input interface 30 (which can be considered as a detection seat), and the hall assembly detection device automatically performs static test on the tested hall assembly, wherein the static test mainly comprises detection of output parameters of the tested hall assembly during static test (including static resistance and capacitance loop detection). When the static test of the tested Hall assembly is completed, the tested Hall assembly is installed in the motor, and under the condition that the motor works, the dynamic test is carried out on the tested Hall assembly, and the dynamic test mainly comprises the detection of the output parameters (mainly waveform parameters) of the tested Hall assembly during the dynamic test.
(4) The MCU10 compares each parameter value in the obtained output parameters of the tested hall assembly with the corresponding parameter threshold range to determine whether the tested hall assembly is qualified, and obtains the corresponding detection result.
When all parameter values of the tested Hall assembly are in the corresponding parameter threshold ranges, a qualified detection result representing the tested Hall assembly is obtained; and when the parameter values of which the values are not in the corresponding parameter threshold range exist in all the parameter values of the tested Hall assembly, obtaining a detection result representing that the tested Hall assembly is unqualified.
(5) The output parameters of the hall assembly to be tested and the detection result are displayed on the display screen 40 so as to be checked by the detection personnel.
As can be seen from the above, when the hall assembly detection device disclosed by the invention detects the hall assembly to be detected, the hall assembly to be detected is only required to be placed on the PC board interface, and then the PC board interface is connected with the signal PG input interface 30, so that the detection device can automatically detect whether the hall assembly to be detected is qualified or not, and display the detection result and the output parameters of the hall assembly to be detected on the display screen 40. Therefore, compared with the prior art, the detection device disclosed by the invention has the advantages that the automatic detection of the Hall assembly is realized, the operation intensity of detection personnel is greatly reduced when the Hall assembly is detected, meanwhile, the situation of misjudgment of the Hall assembly caused by the error reading of the detection personnel is effectively avoided, and the detection accuracy of the Hall assembly is improved.
In addition, compared with the manual detection of the Hall assembly in the prior art, the automatic detection device and the automatic detection method of the Hall assembly further improve the detection efficiency of the Hall assembly through automatic detection of the Hall assembly.
It should be noted that the hall component detection device of the present invention also has a power-down memory function.
Preferably, the display screen 40 may be a 60×80 display screen with a higher anti-interference intensity level, so as to effectively reduce display disorder caused by test interference.
Preferably, in order to improve the sampling precision of the output waveform parameters of the tested Hall assembly, the MCU10 can adopt a high-speed single-chip microcomputer, so that the acquisition precision of the MCU10 on the output waveform parameters of the tested Hall assembly can reach 0.01us.
In order to further optimize the foregoing embodiment, referring to fig. 2, a schematic structural diagram of a hall assembly detection apparatus according to another embodiment of the present invention is disclosed, and unlike the embodiment shown in fig. 1, the acquisition circuit 20 specifically includes: a voltage acquisition circuit 21, a frequency acquisition circuit 22, a waveform acquisition circuit 23 and a capacitance acquisition circuit 24.
Wherein:
the input end of the voltage acquisition circuit 21 is connected with the signal PG input interface 30, the output end of the voltage acquisition circuit 21 is connected with the signal acquisition port of the MCU10, and the voltage acquisition circuit 21 is used for acquiring the output voltage parameters of the tested Hall assembly and outputting the output voltage parameters to the MCU10 through the signal acquisition port.
The input end of the frequency acquisition circuit 22 is connected with the signal PG input interface 30, the output end of the frequency acquisition circuit 22 is connected with the signal acquisition port of the MCU10, and the frequency acquisition circuit 22 is used for acquiring the output frequency parameters of the tested Hall assembly and outputting the output frequency parameters to the MCU10 through the signal acquisition port.
The input end of the waveform acquisition circuit 23 is connected with the signal PG input interface 30, the output end of the waveform acquisition circuit 23 is connected with the signal acquisition port of the MCU10, and the waveform acquisition circuit 23 is used for acquiring the output current waveform parameters of the tested Hall assembly and outputting the output current waveform parameters to the MCU10 through the signal acquisition port.
It should be noted that, the output current waveform parameter of the tested hall assembly collected by the waveform collection circuit 23 is a current waveform parameter when the tested hall assembly is dynamically tested, and according to the output current waveform parameter, the output current, the period, the duty cycle, the frequency, the high pulse and the low pulse of the tested hall assembly can be obtained.
In practical application, the output current waveform parameter can be dynamically displayed on the display screen 40 according to a preset proportion, and the sampling rate of the hall component detection device to the current can be 2000 times/second.
The input end of the capacitance acquisition circuit 24 is connected with the signal PG input interface 30, the output end of the capacitance acquisition circuit 24 is connected with the signal acquisition port of the MCU10, and the capacitance acquisition circuit 24 is used for acquiring the output capacitance parameters of the tested Hall assembly and outputting the output capacitance parameters to the MCU10 through the signal acquisition port.
The measurement range, the precision and the parameter threshold range of each parameter in the output parameters of the measured hall assembly can be referred to the values shown in table 1, and these values can be modified according to the actual situation in practical application, and table 1 specifically includes the following:
TABLE 1
It should be noted that, the voltage acquisition circuit 21, the frequency acquisition circuit 22, the waveform acquisition circuit 23 and the capacitance acquisition circuit 24 may be connected to the same signal acquisition port of the MCU10, or may be respectively connected to a signal acquisition port of one MCU10, which is specific to the actual needs, and the invention is not limited herein.
To further optimize the above embodiment, the hall assembly detection apparatus may further include: a storage unit 60;
the storage unit 60 is connected to a signal control port of the MCU10, and is used for storing output information of the MCU10.
As is well known to those skilled in the art, the MCU10 itself has a storage function, and is capable of storing data required when the MCU10 runs a program, however, the storage space of the MCU10 itself is limited, and if the MCU10 itself stores too much data, the running speed of the MCU10 will be affected, so the present invention increases the running speed of the MCU10 by adding the storage unit 60 to share the stored data in the MCU10.
To further optimize the above embodiment, the hall assembly detection apparatus may further include: an alarm 70;
the alarm 70 is connected to a signal control port of the MCU10, and is configured to alarm according to an alarm control signal when the output information of the MCU10 includes the alarm control signal.
When the Hall component detection device detects that the output parameters of the detected Hall component have parameters with values which are not in the range of the corresponding parameter threshold values, the detected Hall component is indicated to be unqualified, and in this case, the Hall component detection device can inform detection personnel in an alarm mode.
The alarm 70 may be an audible alarm such as a voice alarm.
In order to facilitate a inspector to check parameters which do not meet the parameter threshold range in the tested Hall assembly, the Hall assembly detection device disclosed by the invention can also mark the parameters which do not meet the parameter threshold range, for example, the parameters are subjected to inverse display blackening, and the marked parameters are displayed in the display screen 40.
To avoid that after the hall element detection apparatus detects a defective hall element, the detection personnel does not hear the alarm sound for some reason (for example, leaves the detection site), and mistakenly classifies the defective hall element into the defective hall element, the alarm 70 in the present invention further includes a button alarm circuit.
After the hall assembly detection device detects the unqualified hall assembly, the alarm 70 is always in an alarm state, and the alarm can be released only when a detection person presses a button corresponding to the button alarm circuit, so that the situation that the detection person wrongly classifies the unqualified hall assembly into the qualified hall assembly is effectively avoided.
When the detected hall assembly is detected to be qualified, in order to avoid the situation that the detected hall assembly is damaged due to hot plug of the detected hall assembly after the detected hall assembly is detected, the hall assembly detection device also generates a power-off control signal after the detected hall assembly is detected to be qualified, and the power-off control signal is output to the signal PG input interface 30, so that the control signal PG input interface 30 stops outputting the power PG signal to the detected hall assembly.
In addition, as the number of the Hall assemblies to be detected every day is up to thousands, the number of qualified Hall assemblies and the number of unqualified Hall assemblies are conveniently counted.
Specifically, when the MCU10 determines that the type of the detection result indicates that the detected hall element is detected to be qualified, adding one to the first count value; when the MCU10 judges that the detection result type represents that the detected Hall assembly is unqualified, the second calculated value is added by one, wherein the initial values of the first count value and the second count value are both zero.
The hall component detection apparatus disclosed in the present invention may further determine waveform jitter characteristics according to the waveform displayed on the display screen 40, and the specific determination process may refer to the determination process of the oscillograph on waveform jitter in the prior art, which is not described herein.
Corresponding to the embodiment of the device, the invention also discloses a Hall assembly detection method.
Referring to fig. 3, a method flowchart of a hall assembly detection method disclosed in an embodiment of the present invention is applied to the hall assembly detection apparatus in the above embodiment, and specifically applied to the MCU10, and the detection method includes the steps of:
s11, obtaining output parameters of a measured Hall assembly;
it should be noted that, the output parameters of the measured hall assembly include: the output parameters of the tested Hall assembly in static test and in dynamic test specifically comprise: current, period, frequency, high and low pulses, duty cycle, capacitance, etc.
Step S12, comparing each parameter value in the output parameters with a corresponding parameter threshold range, detecting whether the tested Hall assembly is qualified or not, and obtaining a detection result;
and step S13, outputting and displaying the output parameters and the detection results on a display screen 40.
In summary, according to the invention, through comparing each parameter value in the acquired output parameters of the tested Hall assembly with the corresponding parameter threshold range, the automatic detection of the tested Hall assembly is realized.
In addition, compared with the manual detection of the Hall assembly in the prior art, the automatic detection device and the automatic detection method of the Hall assembly further improve the detection efficiency of the Hall assembly through automatic detection of the Hall assembly.
To further optimize the above embodiment, step S12 may specifically include the steps of:
comparing each parameter value with the corresponding parameter threshold range, and judging whether all the parameter values are in the corresponding parameter threshold range;
if all the parameter values are in the corresponding parameter threshold ranges, judging that the tested Hall assembly is qualified as the detection result;
if the parameter value with the numerical value not in the corresponding parameter threshold value range exists, the failure of the tested Hall assembly is judged to be the detection result.
In summary, if only one parameter value of the measured hall component is not in the corresponding parameter threshold value range, the measured hall component is judged to be unqualified.
In order to facilitate the inspection of unqualified parameters of the hall assembly to be inspected, when the hall assembly inspection device determines that the currently inspected hall assembly to be inspected is unqualified, parameter values which are not in the corresponding parameter threshold range are marked and displayed on the display screen 40.
The labeling form of the unqualified parameters can be determined according to actual needs, for example, the unqualified parameters are subjected to inverse display blackening, and the labeling form can be determined according to actual needs.
When the Hall component detection device detects that the output parameters of the detected Hall component have parameters with values which are not in the range of the corresponding parameter threshold values, the detected Hall component is indicated to be unqualified, and in this case, the Hall component detection device can inform detection personnel in an alarm mode.
Therefore, after the step of determining that the measured hall element is not qualified, the detection method may further include the steps of:
generating an alarm control signal;
the alarm control signal is output to the alarm 70 to control the alarm 70 to alarm.
When the detected Hall assembly is qualified, the detection method can further comprise the following steps of:
generating a power-off control signal;
the power-off control signal is output to the signal PG input interface 30, and the control signal PG input interface 30 stops outputting the power PG signal to the hall device under test.
In addition, as the number of the Hall assemblies to be detected every day is up to thousands, the number of the qualified Hall assemblies and the number of the unqualified Hall assemblies are conveniently counted.
Thus, after step S12, the detection method may further include the steps of:
judging the type of the detection result, and adding one to a first count value when the type of the detection result represents that the detected Hall assembly is qualified in detection; and when the type of the detection result represents that the detected Hall assembly is unqualified, adding one to a second count value, wherein the initial values of the first technical value and the second count value are zero.
In order to facilitate the inspector to view the hall assembly detected before, after step S12, the detection method may further include the steps of:
and outputting the output parameters of the tested Hall assembly and the detection result to the storage unit 60 for storage.
Finally, it is further noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
In the present specification, each embodiment is described in a progressive manner, and each embodiment is mainly described in a different point from other embodiments, and identical and similar parts between the embodiments are all enough to refer to each other.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (12)
1. A hall assembly detection apparatus, comprising:
the micro control unit is provided with a signal acquisition port and a signal control port;
the acquisition circuit is used for acquiring output parameters of the tested Hall assembly, the output end of the acquisition circuit is connected with the signal acquisition port, and the signal acquisition port is used for acquiring the output parameters;
one end of the signal PG input interface is used for being connected with a PG board interface for placing the tested Hall assembly and providing a power PG signal for the tested Hall assembly, and the other end of the signal PG input interface is connected with the input end of the acquisition circuit; when the PG signal of the power supply contains the PG signal and the time sequence of the PG signal is correct, providing a power supply signal for the tested Hall assembly;
the signal control port is used for outputting the output parameters acquired by the micro control unit and a detection result of whether the tested Hall assembly is qualified or not, wherein the detection result is obtained according to comparison results of each parameter value in the output parameters and a corresponding parameter threshold range;
the Hall component detection device generates a power-off control signal after judging that the detected Hall component is qualified; outputting the power-off control signal to a signal PG input interface, and controlling the signal PG input interface to stop outputting a power PG signal to the tested Hall assembly;
wherein, the acquisition circuit includes:
the voltage acquisition circuit is used for acquiring output voltage parameters of the tested Hall assembly, the input end of the voltage acquisition circuit is connected with the signal PG input interface, the output end of the voltage acquisition circuit is connected with the signal acquisition port, and the signal acquisition port is used for acquiring the output voltage parameters;
the frequency acquisition circuit is used for acquiring output frequency parameters of the tested Hall assembly, the input end of the frequency acquisition circuit is connected with the signal PG input interface, the output end of the frequency acquisition circuit is connected with the signal acquisition port, and the signal acquisition port is used for acquiring the output frequency parameters;
the waveform acquisition circuit is used for acquiring output current waveform parameters of the tested Hall assembly, the input end of the waveform acquisition circuit is connected with the signal PG input interface, the output end of the waveform acquisition circuit is connected with the signal acquisition port, and the signal acquisition port is used for acquiring the output current waveform parameters; the output current waveform parameters of the tested Hall assembly, which are acquired by the waveform acquisition circuit, are current waveform parameters when the tested Hall assembly is dynamically tested, and the output current, period, duty ratio, frequency, high pulse and low pulse of the tested Hall assembly are obtained according to the output current waveform parameters;
the output current waveform parameters can be dynamically displayed on a display screen according to a preset proportion, and the sampling rate of the Hall component detection device to the current is 2000 times/second; the capacitance acquisition circuit is used for acquiring output capacitance parameters of the tested Hall assembly, the input end of the capacitance acquisition circuit is connected with the signal PG input interface, the output end of the capacitance acquisition circuit is connected with the signal acquisition port, and the signal acquisition port is used for acquiring the output capacitance parameters.
2. The hall assembly detection apparatus of claim 1, further comprising:
and the storage unit is connected with the signal control port and used for storing the output information.
3. The hall assembly detection apparatus of claim 1, further comprising:
and the alarm is connected with the signal control port and used for alarming according to the alarm control signal when the output information contains the alarm control signal.
4. A hall assembly sensing device according to claim 3, wherein the alarm comprises: an audible alarm.
5. A hall assembly sensing device according to claim 3, wherein the alarm comprises:
and the key alarm circuit is used for stopping alarm after receiving an alarm stopping instruction input by a user.
6. A hall element detection method, applied to the hall element detection apparatus of claim 1, comprising:
obtaining output parameters of a measured Hall assembly;
comparing each parameter value in the output parameters with a corresponding parameter threshold range, detecting whether the tested Hall assembly is qualified or not, and obtaining a detection result;
and outputting and displaying the output parameters and the detection results on a display screen.
7. The hall assembly detection method of claim 6, wherein the output parameters include: and the output parameters of the tested Hall assembly are output during static test and output parameters during dynamic test.
8. The method of claim 6, wherein comparing each parameter value in the output parameter with a corresponding parameter threshold range, detecting whether the detected hall element is acceptable, and obtaining a detection result includes:
comparing each parameter value with the corresponding parameter threshold range, and judging whether all the parameter values are in the corresponding parameter threshold range;
if all the parameter values are in the corresponding parameter threshold ranges, judging that the tested Hall assembly is qualified as the detection result;
if the parameter value with the numerical value not in the corresponding parameter threshold value range exists, the failure of the tested Hall assembly is judged to be the detection result.
9. The hall assembly inspection method of claim 8, further comprising, after determining that the hall assembly under test is unacceptable:
and marking the parameter values which are not in the corresponding parameter threshold range, and displaying the parameter values on the display screen.
10. The hall assembly detection method of claim 8, wherein when the hall assembly detection apparatus further includes an alarm, after determining that the hall assembly under test is not acceptable, further comprising:
generating an alarm control signal;
and outputting the alarm control signal to the alarm to control the alarm to alarm.
11. The hall assembly detection method of claim 6, further comprising, after said obtaining the detection result:
judging the type of the detection result, and adding one to a first count value when the type of the detection result represents that the detected Hall assembly is qualified in detection; and when the type of the detection result represents that the detected Hall assembly is unqualified, adding one to a second count value, wherein the initial values of the first count value and the second count value are zero.
12. The hall-element detection method according to claim 6, wherein when the hall-element detection apparatus further includes a storage unit, after the detection result is obtained, further comprising:
and outputting the output parameters and the detection result to the storage unit for storage.
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101710812A (en) * | 2009-12-30 | 2010-05-19 | 卧龙电气集团股份有限公司 | Method and device for detecting Hall speedometer |
| JP2012150003A (en) * | 2011-01-19 | 2012-08-09 | Asahi Kasei Electronics Co Ltd | Hall voltage detecting device |
| CN103439679A (en) * | 2013-08-28 | 2013-12-11 | 国家电网公司 | Absolute time delay detection device and method of intelligent substation mutual inductor data collection system |
| CN203705513U (en) * | 2014-01-24 | 2014-07-09 | 广西电网公司电力科学研究院 | Hall sensor output signal processing circuit |
| CN203772888U (en) * | 2014-02-24 | 2014-08-13 | 比亚迪股份有限公司 | Device used for acquiring detection signals of two-wire Hall sensor |
| CN105577047A (en) * | 2014-10-14 | 2016-05-11 | 北京谊安医疗系统股份有限公司 | Monitoring circuit and monitoring method for hall device signal of brushless direct-current motor |
| CN206147064U (en) * | 2016-10-18 | 2017-05-03 | 重庆凯邦电机有限公司 | Hall assembly detection device |
-
2016
- 2016-10-18 CN CN201610906250.0A patent/CN106646226B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101710812A (en) * | 2009-12-30 | 2010-05-19 | 卧龙电气集团股份有限公司 | Method and device for detecting Hall speedometer |
| JP2012150003A (en) * | 2011-01-19 | 2012-08-09 | Asahi Kasei Electronics Co Ltd | Hall voltage detecting device |
| CN103439679A (en) * | 2013-08-28 | 2013-12-11 | 国家电网公司 | Absolute time delay detection device and method of intelligent substation mutual inductor data collection system |
| CN203705513U (en) * | 2014-01-24 | 2014-07-09 | 广西电网公司电力科学研究院 | Hall sensor output signal processing circuit |
| CN203772888U (en) * | 2014-02-24 | 2014-08-13 | 比亚迪股份有限公司 | Device used for acquiring detection signals of two-wire Hall sensor |
| CN105577047A (en) * | 2014-10-14 | 2016-05-11 | 北京谊安医疗系统股份有限公司 | Monitoring circuit and monitoring method for hall device signal of brushless direct-current motor |
| CN206147064U (en) * | 2016-10-18 | 2017-05-03 | 重庆凯邦电机有限公司 | Hall assembly detection device |
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|---|---|
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