CN106646226A - Hall assembly detecting device and method - Google Patents
Hall assembly detecting device and method Download PDFInfo
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- CN106646226A CN106646226A CN201610906250.0A CN201610906250A CN106646226A CN 106646226 A CN106646226 A CN 106646226A CN 201610906250 A CN201610906250 A CN 201610906250A CN 106646226 A CN106646226 A CN 106646226A
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- 238000012360 testing method Methods 0.000 claims description 79
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- 238000007689 inspection Methods 0.000 claims description 4
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- 238000005516 engineering process Methods 0.000 description 6
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/34—Testing dynamo-electric machines
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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Abstract
The invention discloses a Hall assembly detecting device and method. The detecting device comprises a micro-control unit, a collection circuit, a signal PG input interface and a display screen. When a Hall assembly is detected, it is only required to place the detected Hall assembly in a PC board interface and connect the PC board interface with the signal PG input interface, so that the detecting device detects whether the Hall assembly is qualified automatically, and a detection result and output parameters of the detected Hall assembly are displayed in the display screen. Thus, the detecting device realizes automatic detection for the Hall assembly. Compared with the prior art, when the Hall assembly is detected, the operation intensity of detection staff is reduced greatly, misjudgment, caused by number reading errors of the detection staff, of the Hall assembly is avoided effectively, and the detection accuracy of the Hall assembly is improved.
Description
Technical field
The present invention relates to testing techniques of equipment field, in particular, is related to a kind of Hall subassembly detection means and its inspection
Survey method.
Background technology
To ensure the safe and stable operation of motor, generally need to examine each components and parts of motor before Motor Production Test
Survey, and the core of electric machines test be the output parameter to Hall subassembly (including：Voltage, electric current, frequency, dutycycle, cycle, height
Low pulse, capacitance etc.) detected.
It is to the detection method of the output parameter of Hall subassembly at present：5V is provided first by voltage-stabilized power supply to Hall subassembly
Operating voltage, then obtains the output parameter of Hall subassembly using oscillograph and ammeter, and each parameter value is shown, most
Afterwards testing staff recognizes the current value shown on the parameter value and waveform, and ammeter shown on oscillograph with eye observation,
And judge whether tested Hall subassembly is qualified according to each parameter value and waveform, to find out underproof Hall subassembly.
Because testing staff needs daily the quantity of the Hall subassembly for detecting to be up to thousand of, therefore frequently detection operation
And long time continuous working easilys lead to testing staff and feels exhausted, easily occur because reading each parameter value and/or waveform
Miscount and mislead situation about causing to Hall subassembly erroneous judgement.So how to provide a kind of Hall subassembly detection means to reduce testing staff
Manipulation strength, and it is those skilled in the art's problem demanding prompt solution to improve the accuracy in detection of Hall subassembly.
The content of the invention
In view of this, the present invention discloses a kind of Hall subassembly detection means and its detection method, to realize to Hall group
When part is detected, the manipulation strength of testing staff is reduced, and improve the accuracy in detection of Hall subassembly.
A kind of Hall subassembly detection means, including：
Micro-control unit, the micro-control unit has signals collecting port and signal control port；
For gathering the Acquisition Circuit of the output parameter of tested Hall subassembly, the output end of the Acquisition Circuit and the letter
Number collection port connection, the signals collecting port be used for gather the output parameter；
One end is used to be connected with the PG plate interfaces for placing the tested Hall subassembly, and for the tested Hall subassembly electricity is provided
The signal PG input interfaces of source PG signals, the other end of the signal PG input interfaces connects with the input of the Acquisition Circuit
Connect；
It is connected with the signal control port, for the display shown to the output information of the signal control port
Screen, the signal control port is used to export the output parameter of the micro-control unit collection, and according to the output
Whether the described tested Hall subassembly that the comparative result of each parameter value and corresponding parameter threshold scope in parameter is obtained is qualified
Testing result.
Preferably, the Acquisition Circuit includes：
For gathering the voltage collection circuit of the output voltage parameter of tested Hall subassembly, the voltage collection circuit it is defeated
Enter end to be connected with the signal PG input interfaces, the output end of the voltage collection circuit is connected with the signals collecting port,
The signals collecting port is used to gather the output voltage parameter；
For gathering the frequency collection circuit of the output frequency parameter of the tested Hall subassembly, the frequency collection circuit
Input be connected with the signal PG input interfaces, the output end of the frequency collection circuit connects with the signals collecting port
Connect, the signals collecting port is used to gather the output frequency parameter；
For gathering the waveform acquisition circuit of the output current wave parameter of the tested Hall subassembly, the waveform acquisition
The input of circuit is connected with the signal PG input interfaces, output end and the signal acquisition terminal of the waveform acquisition circuit
Mouth connection, the signals collecting port is used to gather the output current wave parameter；
For gathering the electric capacity Acquisition Circuit of the output capacitance parameter of the tested Hall subassembly, the electric capacity Acquisition Circuit
Input be connected with the signal PG input interfaces, the output end of the electric capacity Acquisition Circuit connects with the signals collecting port
Connect, the signals collecting port is used to gather the output capacitance parameter.
Preferably, also include：
It is connected with the signal control port, for the memory cell stored to the output information.
Preferably, also include：
It is connected with the signal control port, during for including alarm control signal in the output information, according to
The alarm that the alarm control signal is reported to the police.
Preferably, the alarm includes：Voice guard.
Preferably, the alarm includes：
For the button warning circuit for instructing ability stop alarm in the stop alarm for receiving user input.
A kind of Hall subassembly detection method, is applied to Hall subassembly detection means described above, the detection method bag
Include：
Obtain the output parameter of tested Hall subassembly；
Each parameter value in the output parameter and corresponding parameter threshold scope are compared, to the tested Hall
Whether component is qualified to be detected, and obtains testing result；
Output simultaneously shows the output parameter and the testing result in display screen.
Preferably, the output parameter includes：Output parameter of the tested Hall subassembly in static test and
Output parameter during dynamic test.
Preferably, each parameter value by the output parameter and corresponding parameter threshold scope are compared, right
Whether the tested Hall subassembly is qualified to be detected, and is obtained testing result and included：
Each parameter value and corresponding parameter threshold scope are compared, judge all parameter values whether in corresponding ginseng
In number threshold range；
If all parameter values are in the range of corresponding parameter threshold, the qualified conduct of the tested Hall subassembly will be judged
The testing result；
If there is parameter value of the numerical value not in the range of corresponding parameter threshold, the tested Hall subassembly will be judged not
It is qualified as the testing result.
Preferably, after judging that the tested Hall subassembly is unqualified, also include：
Parameter value not in the range of corresponding parameter threshold is labeled, and is shown in the display screen.
Preferably, when the Hall subassembly detection means also includes alarm, the tested Hall subassembly is being judged not
After qualified, also include：
Generate alarm control signal；
The alarm control signal is exported to the alarm, the alarm equipment alarm is controlled.
Preferably, after judging that the tested Hall subassembly is qualified, also include：
Generate power down control signal；
The power down control signal is exported to signal PG input interfaces, the signal PG input interfaces is controlled and is stopped to institute
State tested Hall subassembly out-put supply PG signals.
Preferably, it is described obtain testing result after, also include：
Judge the type of the testing result, close when the type of the testing result characterizes the tested Hall subassembly detection
During lattice, add one to the first count value；When the type of the testing result characterize the tested Hall subassembly it is unqualified when, to second
Count value adds one, and the initial value of first technical value and second count value is zero.
Preferably, when the Hall subassembly detection means also includes memory cell, it is described obtain testing result after,
Also include：
The output parameter and the testing result are exported to the memory cell and is preserved.
Knowable to above-mentioned technical scheme, the invention discloses a kind of Hall subassembly detection means and its detection method, inspection
Surveying device includes micro-control unit, Acquisition Circuit, signal PG input interfaces and display screen, when detecting to tested Hall subassembly
When, only tested Hall subassembly need to be placed on PC plate interface, then PC plate interface is connected with signal PG input interfaces, detection dress
Putting whether qualified to tested Hall subassembly will carry out automatic detection, and show testing result and tested Hall group in display screen
The output parameter of part.It follows that detection means disclosed by the invention realizes the automatic detection to Hall subassembly, compare existing
For technology, the present invention greatly reduces the manipulation strength of testing staff when detecting to Hall subassembly, while also effective
Situation about causing because of testing staff's error in reading to Hall subassembly erroneous judgement is avoided, the detection to Hall subassembly is improve accurate
Degree.
Description of the drawings
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
The accompanying drawing to be used needed for having technology description is briefly described, it should be apparent that, drawings in the following description are only this
Inventive embodiment, for those of ordinary skill in the art, on the premise of not paying creative work, can be with basis
Disclosed accompanying drawing obtains other accompanying drawings.
Fig. 1 is a kind of structural representation of Hall subassembly detection means disclosed in the embodiment of the present invention；
Fig. 2 is the structural representation of another kind of Hall subassembly detection means disclosed in the embodiment of the present invention；
Fig. 3 is a kind of method flow diagram of Hall subassembly detection method disclosed in the embodiment of the present invention.
Specific embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation is described, it is clear that described embodiment is only a part of embodiment of the invention, rather than the embodiment of whole.It is based on
Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under the premise of creative work is not made
Embodiment, belongs to the scope of protection of the invention.
The embodiment of the invention discloses a kind of Hall subassembly detection means and its detection method, to realize to Hall subassembly
When being detected, the manipulation strength of testing staff is reduced, and improve the accuracy in detection of Hall subassembly.
Referring to Fig. 1, a kind of structural representation of Hall subassembly detection means disclosed in the embodiment of the present invention, the detection means
Including：Micro-control unit (Microcontroller Unit, MCU) 10, Acquisition Circuit 20, signal PG input interfaces 30 and display
Screen 40.
Wherein：
MCU10 has signals collecting port and signal control port.
One end of signal PG input interfaces 30 is used to be connected with the PG plate interfaces for placing tested Hall subassembly, think it is tested suddenly
You provide power supply PG signals by component, and the other end of signal PG input interfaces 30 is connected with the input of Acquisition Circuit 20.
It should be noted that power supply PG signals are the abbreviations of power supply Power Good signals, it is VD detection
The logic of signal and AC-input voltage detection signal, with TTL (Transistor Transistor Logic, transistor) letters
Number compatibility.In the present invention, power supply PG signals are used to provide power supply signal for tested Hall subassembly, wherein, when power supply PG signal bags
Containing PG signals and PG signals sequential it is correct when, could be used as the power supply signal of tested Hall subassembly.
The output end of Acquisition Circuit 20 is connected with the signals collecting port of MCU10, Acquisition Circuit 20 be used for gather it is tested suddenly
The output parameter of your component, and exported to MCU10 by signals collecting port.
Wherein, the output parameter of tested Hall subassembly includes：Electric current, the cycle, frequency, high impulse, low pulse, dutycycle,
Capacitance etc..
Display screen 40 is connected with the signal control port of MCU10, and display screen 40 is used for the output to signal control port to be believed
Cease and shown, wherein, signal control port is used to export the output parameter of MCU10 collections, and according in output parameter
The whether qualified testing result of tested Hall subassembly that the comparative result of each parameter value and corresponding parameter threshold scope is obtained.
For convenience of understanding, the invention also discloses the detection using Hall subassembly detection means to tested Hall subassembly
Journey, it is specific as follows：
(1) by the power end 50 of Hall subassembly detection means and AC220V power on, make at Hall subassembly detection means
In open state；
It should be noted that Hall subassembly detection means be in open state after, can show on display screen 40 it is tested suddenly
The each detected parameter of your component, so can facilitate inspection personnel check each detected parameter whether with tested Hall subassembly
Model correspondence, so as to be prevented effectively from because of each detected parameter and the not corresponding and caused erroneous judgement of the model of tested Hall subassembly.
(2) higher limit and lower limit of each measured parameter of tested Hall subassembly are set, the parameter of each measured parameter is obtained
Threshold range, now Hall subassembly detection means is in normal operating conditions；
(3) the PG plate interfaces for being placed with tested Hall subassembly are inserted into signal PG input interfaces 30 and (may be considered detection
Seat), Hall subassembly detection means to tested Hall subassembly will carry out static test automatically, and the static test is mainly included to tested
Output parameter of the Hall subassembly at static test (including static resistance and capacitor loop detection) is detected.When to it is tested suddenly
After the completion of your component static test, tested Hall subassembly is arranged in motor, and in the case where motor works, to it is tested suddenly
You carry out dynamic test by component, and the dynamic test mainly includes that the output parameter to tested Hall subassembly in dynamic test is (main
If waveform parameter) detected.
(4) each parameter value and corresponding parameter threshold in the output parameter that MCU10 passes through the tested Hall subassembly that will be obtained
Value scope is compared, and judges whether tested Hall subassembly is qualified, and obtains corresponding testing result.
Wherein, when all parameter values of tested Hall subassembly are in the range of corresponding parameter threshold, obtain characterizing quilt
Survey the qualified testing result of Hall subassembly；Parameter threshold is not being corresponded to when in all parameter values of tested Hall subassembly, there is numerical value
During the parameter value of value scope, obtain characterizing the underproof testing result of tested Hall subassembly.
(5) output parameter and testing result of tested Hall subassembly are shown in display screen 40, so as to testing staff
Check.
In summary, Hall subassembly detection means disclosed by the invention is only needed when detecting to tested Hall subassembly
Tested Hall subassembly is placed on into PC plate interface, is then connected PC plate interface with signal PG input interfaces 30, detection means is just
Automatic detection whether qualified to tested Hall subassembly can be carried out, and testing result and tested Hall subassembly are shown in display screen 40
Output parameter.It follows that detection means disclosed by the invention realizes the automatic detection to Hall subassembly, existing skill is compared
For art, the present invention greatly reduces the manipulation strength of testing staff, while also effectively keeping away when detecting to Hall subassembly
Exempt to cause the situation to Hall subassembly erroneous judgement because of testing staff's error in reading, improve the detection to Hall subassembly accurate
Degree.
In addition, detecting that the present invention by being examined automatically to Hall subassembly for Hall subassembly manually compared to existing technology
Survey also improves the detection efficiency to Hall subassembly.
It should be noted that the Hall subassembly detection means in the present invention is also equipped with power-failure memory function.
Preferably, display screen 40 can adopt the higher ranked 60*80 display screens of anti-interference intensity, effectively to reduce because surveying
The phenomenons such as the display mess code that examination interference is caused.
Preferably, it is sampling precision of the raising to the output waveform parameter of tested Hall subassembly, MCU10 can be using at a high speed
Single-chip microcomputer, such MCU10 can reach 0.01us to the acquisition precision of the output waveform parameter of tested Hall subassembly.
For further optimization above-described embodiment, referring to Fig. 2, a kind of Hall subassembly disclosed in another embodiment of the present invention is detected
The structural representation of device, from unlike embodiment illustrated in fig. 1, Acquisition Circuit 20 is specifically included：Voltage collection circuit 21, frequency
Rate Acquisition Circuit 22, waveform acquisition circuit 23 and electric capacity Acquisition Circuit 24.
Wherein：
The input of voltage collection circuit 21 is connected with signal PG input interfaces 30, the output end of voltage collection circuit 21 with
The signals collecting port connection of MCU10, voltage collection circuit 21 is used to gather the output voltage parameter of tested Hall subassembly, and leads to
Cross signals collecting port output voltage parameter to be exported to MCU10.
The input of frequency collection circuit 22 is connected with signal PG input interfaces 30, the output end of frequency collection circuit 22 with
The signals collecting port connection of MCU10, frequency collection circuit 22 is used to gather the output frequency parameter of tested Hall subassembly, and leads to
Cross signals collecting port output frequency parameter to be exported to MCU10.
The input of waveform acquisition circuit 23 is connected with signal PG input interfaces 30, the output end of waveform acquisition circuit 23 with
The signals collecting port connection of MCU10, waveform acquisition circuit 23 is used to gather the output current wave parameter of tested Hall subassembly,
And output current wave parameter is exported to MCU10 by signals collecting port.
It should be noted that the output current wave parameter of the tested Hall subassembly of the collection of waveform acquisition circuit 23 is to quilt
Survey Hall subassembly carries out current waveform parameter during dynamic test, and according to the output current wave parameter tested Hall can be obtained
The output current of component, cycle, dutycycle, frequency, high impulse and low pulse.
Wherein, in actual applications, output current wave parameter can dynamic be aobvious on display screen 40 according to preset ratio
Show, Hall subassembly detection means can be 2000 times/second to the sample rate of electric current.
The input of electric capacity Acquisition Circuit 24 is connected with signal PG input interfaces 30, the output end of electric capacity Acquisition Circuit 24 with
The signals collecting port connection of MCU10, electric capacity Acquisition Circuit 24 is used to gather the output capacitance parameter of tested Hall subassembly, and leads to
Cross signals collecting port output capacitance parameter to be exported to MCU10.
Wherein, the measurement range of each parameter, precision and parameter threshold scope can in the output parameter of tested Hall subassembly
Referring to the numerical value illustrated in table 1, these numerical value can modify in actual applications according to actual conditions, and table 1 is specific as follows：
Table 1
It should be noted that voltage collection circuit 21, frequency collection circuit 22, waveform acquisition circuit 23 and electric capacity collection electricity
Road 24 can be connected to the same signals collecting port of MCU10, it is also possible to connect the signal acquisition terminal of a MCU10 respectively
Mouthful, depending on concrete foundation is actually needed, here of the present invention is not limited.
Further to optimize above-described embodiment, Hall subassembly detection means can also include：Memory cell 60；
Memory cell 60 is connected with the signal control port of MCU10, for storing to the output information of MCU10.
Those skilled in the art are well known that, MCU10 itself has store function, can to MCU10 operation programs when
Required data are stored, but, the limited storage space of MCU10 itself, if while MCU10 data storages itself are excessive,
The speed of service of MCU10 will be affected, therefore, the present invention by increase memory cell 60 to share MCU10 in data storage,
To improve the speed of service of MCU10.
Further to optimize above-described embodiment, Hall subassembly detection means can also include：Alarm 70；
Alarm 70 is connected with the signal control port of MCU10, for including control of reporting to the police in the output information of MCU10
During signal processed, reported to the police according to the alarm control signal.
When Hall subassembly detection means is detected in the output parameter of tested Hall subassembly, there is numerical value not in correspondence parameter
During the parameter of threshold range, show that tested Hall subassembly is unqualified, in this case, Hall subassembly detection means can be adopted
The form of warning informs testing staff.
Alarm 70 can select voice guard, such as phonetic alarm.
The parameter that parameter threshold scope is unsatisfactory in tested Hall subassembly is checked for convenience of testing staff, it is disclosed by the invention
Hall subassembly detection means can be carried out instead to be marked to the parameter for being unsatisfactory for parameter threshold scope, for example to the parameter
Aobvious blackening, and the parameter after mark is shown in display screen 40.
To avoid Hall subassembly detection means from detecting after unqualified Hall subassembly, testing staff because of some reasons (for example
Leave detection scene) non-audible alarm sound, and underproof Hall subassembly is referred in qualified Hall subassembly by mistake, this
Alarm 70 in bright also includes button warning circuit.
After Hall subassembly detection means detects underproof Hall subassembly, alarm 70 can be constantly in warning shape
State, only testing staff press the button the corresponding button of warning circuit, and warning just can be released, so as to effectively prevent testing staff
Underproof Hall subassembly is referred to mistake the generation of this case that qualified Hall subassembly.
When the detection of tested Hall subassembly is qualified, the present invention is to avoid after the completion of tested Hall subassembly is tested, because heat is inserted
Pull out tested Hall subassembly and cause the situation of tested Hall subassembly damage, Hall subassembly detection means is testing tested Hall subassembly
After qualified, a power down control signal can be also generated, by the way that the power down control signal is exported to signal PG input interfaces 30, control
Signal PG input interfaces 30 processed stop to tested Hall subassembly out-put supply PG signals.
Further, since the Hall subassembly for needing detection daily is up to thousand of, therefore the qualified Hall subassembly of convenient statistics
Quantity and unqualified Hall subassembly quantity, Hall subassembly detection means disclosed by the invention be also equipped with to qualified Hall subassembly and
The tally function of unqualified Hall subassembly.
Specifically, when MCU10 judges that the tested Hall subassembly detection of the type sign of testing result is qualified, count to first
Value Jia one；When MCU10 judges that the tested Hall subassembly detection of testing result type sign is unqualified, add one to the second calculated value,
Wherein, the initial value of the first count value and the second count value is zero.
Wherein, Hall subassembly detection means disclosed by the invention can judge waveform with the waveform shown according to display screen 40
Jittering characteristic, concrete decision process can be found in the decision process that oscillograph is shaken to waveform in prior art, and here is omitted.
It is corresponding with said apparatus embodiment, the invention also discloses a kind of Hall subassembly detection method.
Referring to Fig. 3, a kind of method flow diagram of Hall subassembly detection method disclosed in the embodiment of the present invention, the detection method
The Hall subassembly detection means being applied in above-described embodiment, concrete application and MCU10, the detection method includes step：
Step S11, the output parameter for obtaining tested Hall subassembly；
It should be noted that the output parameter of tested Hall subassembly includes：Tested Hall subassembly is defeated in static test
Go out parameter and the output parameter in dynamic test, output parameter is specifically included：Electric current, cycle, frequency, height pulse, account for
Empty ratio, capacitance etc..
Step S12, each parameter value in the output parameter and corresponding parameter threshold scope are compared, to described
Whether tested Hall subassembly is qualified to be detected, and obtains testing result；
Step S13, output simultaneously show the output parameter and the testing result in display screen 40.
In summary, the present invention is by by each parameter value in the output parameter of the tested Hall subassembly of collection and corresponding
Parameter threshold scope be compared, realize automatic detection to tested Hall subassembly, compared to existing technologies, the present invention exists
When detecting to Hall subassembly, the manipulation strength of testing staff is greatly reduced, while also effectively prevent because of testing staff
Error in reading and cause to Hall subassembly erroneous judgement situation, so as to improve the accuracy in detection to Hall subassembly.
In addition, detecting that the present invention by being examined automatically to Hall subassembly for Hall subassembly manually compared to existing technology
Survey also improves the detection efficiency to Hall subassembly.
Further to optimize above-described embodiment, step S12 can specifically include step：
Each parameter value and corresponding parameter threshold scope are compared, judge all parameter values whether in corresponding ginseng
In number threshold range；
If all parameter values are in the range of corresponding parameter threshold, the qualified conduct of the tested Hall subassembly will be judged
The testing result；
If there is parameter value of the numerical value not in the range of corresponding parameter threshold, the tested Hall subassembly will be judged not
It is qualified as the testing result.
In summary, as long as tested Hall subassembly has a parameter value not in the range of corresponding parameter threshold, then judge
Tested Hall subassembly is unqualified.
For convenience of the unqualified parameter that testing staff checks tested Hall subassembly, when Hall subassembly detection means judges current
Detection tested Hall subassembly it is unqualified after, can also to being labeled to the parameter value not in the range of corresponding parameter threshold,
And show in display screen 40.
Wherein, depending on can be according to being actually needed to the labeling form of unqualified parameter, for example, unqualified parameter be carried out
Anti- aobvious blackening, specifically can be according to being actually needed depending on.
When Hall subassembly detection means is detected in the output parameter of tested Hall subassembly, there is numerical value not in correspondence parameter
During the parameter of threshold range, show that tested Hall subassembly is unqualified, in this case, Hall subassembly detection means can be adopted
The form of warning informs testing staff.
Therefore, after step judges that tested Hall subassembly is unqualified, detection method can also include step：
Generate alarm control signal；
The alarm control signal is exported to alarm 70, control alarm 70 is reported to the police.
When the detection of tested Hall subassembly is qualified, the present invention is to avoid after the completion of tested Hall subassembly is tested, because heat is inserted
Pull out Hall subassembly and cause the situation of tested Hall subassembly damage, after step judges that tested Hall subassembly is qualified, detection method
Step can also be included：
Generate power down control signal；
The power down control signal is exported to signal PG input interfaces 30, control signal PG input interface 30 stops to institute
State tested Hall subassembly out-put supply PG signals.
Further, since the Hall subassembly for needing detection daily is up to thousand of, therefore the qualified Hall subassembly of convenient statistics
Quantity and unqualified Hall subassembly quantity, Hall subassembly detection means disclosed by the invention be also equipped with qualified Hall subassembly with not
The tally function of qualified Hall subassembly.
Therefore, after step s 12, detection method can also include step：
Judge the type of the testing result, close when the type of the testing result characterizes the tested Hall subassembly detection
During lattice, add one to the first count value；When the type of the testing result characterize the tested Hall subassembly it is unqualified when, to second
Count value adds one, and the initial value of first technical value and second count value is zero.
The Hall subassembly for detecting before is subsequently checked for convenience of testing staff, after step s 12, detection method can be with
Including step：
The output parameter of tested Hall subassembly and the testing result are exported to memory cell 60 and is preserved.
Finally, in addition it is also necessary to explanation, herein, such as first and second or the like relational terms be used merely to by
One entity or operation make a distinction with another entity or operation, and not necessarily require or imply these entities or operation
Between there is any this actual relation or order.And, term " including ", "comprising" or its any other variant meaning
Covering including for nonexcludability, so that a series of process, method, article or equipment including key elements not only includes that
A little key elements, but also including other key elements being not expressly set out, or also include for this process, method, article or
The intrinsic key element of equipment.In the absence of more restrictions, the key element for being limited by sentence "including a ...", does not arrange
Except also there is other identical element in including the process of the key element, method, article or equipment.
Each embodiment is described by the way of progressive in this specification, and what each embodiment was stressed is and other
The difference of embodiment, between each embodiment identical similar portion mutually referring to.
The foregoing description of the disclosed embodiments, enables professional and technical personnel in the field to realize or using the present invention.
Various modifications to these embodiments will be apparent for those skilled in the art, as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the present invention.Therefore, the present invention
The embodiments shown herein is not intended to be limited to, and is to fit to and principles disclosed herein and features of novelty phase one
The most wide scope for causing.
Claims (14)
1. a kind of Hall subassembly detection means, it is characterised in that include：
Micro-control unit, the micro-control unit has signals collecting port and signal control port；
For gathering the Acquisition Circuit of the output parameter of tested Hall subassembly, the output end of the Acquisition Circuit is adopted with the signal
Collection port connection, the signals collecting port is used to gather the output parameter；
One end is used to be connected with the PG plate interfaces for placing the tested Hall subassembly, and for the tested Hall subassembly power supply PG is provided
The signal PG input interfaces of signal, the other end of the signal PG input interfaces is connected with the input of the Acquisition Circuit；
It is connected with the signal control port, for the display screen shown to the output information of the signal control port,
The signal control port is used to export the output parameter of the micro-control unit collection, and according to the output parameter
In each parameter value and corresponding parameter threshold scope the whether qualified inspection of the described tested Hall subassembly that obtains of comparative result
Survey result.
2. Hall subassembly detection means according to claim 1, it is characterised in that the Acquisition Circuit includes：
For gathering the voltage collection circuit of the output voltage parameter of tested Hall subassembly, the input of the voltage collection circuit
It is connected with the signal PG input interfaces, the output end of the voltage collection circuit is connected with the signals collecting port, described
Signals collecting port is used to gather the output voltage parameter；
For gathering the frequency collection circuit of the output frequency parameter of the tested Hall subassembly, the frequency collection circuit it is defeated
Enter end to be connected with the signal PG input interfaces, the output end of the frequency collection circuit is connected with the signals collecting port,
The signals collecting port is used to gather the output frequency parameter；
For gathering the waveform acquisition circuit of the output current wave parameter of the tested Hall subassembly, the waveform acquisition circuit
Input be connected with the signal PG input interfaces, the output end of the waveform acquisition circuit connects with the signals collecting port
Connect, the signals collecting port is used to gather the output current wave parameter；
For gathering the electric capacity Acquisition Circuit of the output capacitance parameter of the tested Hall subassembly, the electric capacity Acquisition Circuit it is defeated
Enter end to be connected with the signal PG input interfaces, the output end of the electric capacity Acquisition Circuit is connected with the signals collecting port,
The signals collecting port is used to gather the output capacitance parameter.
3. Hall subassembly detection means according to claim 1, it is characterised in that also include：
It is connected with the signal control port, for the memory cell stored to the output information.
4. Hall subassembly detection means according to claim 1, it is characterised in that also include：
It is connected with the signal control port, during for including alarm control signal in the output information, according to described
The alarm that alarm control signal is reported to the police.
5. Hall subassembly detection means according to claim 4, it is characterised in that the alarm includes：Audible alarm
Device.
6. Hall subassembly detection means according to claim 4, it is characterised in that the alarm includes：
For the button warning circuit for instructing ability stop alarm in the stop alarm for receiving user input.
7. a kind of Hall subassembly detection method, it is characterised in that the Hall subassembly detection means being applied to described in claim 1,
The detection method includes：
Obtain the output parameter of tested Hall subassembly；
Each parameter value in the output parameter and corresponding parameter threshold scope are compared, to the tested Hall subassembly
It is whether qualified to be detected, and obtain testing result；
Output simultaneously shows the output parameter and the testing result in display screen.
8. Hall subassembly detection method according to claim 7, it is characterised in that the output parameter includes：The quilt
Survey output parameter of the Hall subassembly in static test and the output parameter in dynamic test.
9. Hall subassembly detection method according to claim 7, it is characterised in that it is described will be each in the output parameter
Whether parameter value and corresponding parameter threshold scope are compared, qualified to the tested Hall subassembly to detect, and obtain
Testing result includes：
Each parameter value and corresponding parameter threshold scope are compared, judge all parameter values whether in corresponding parameter threshold
In the range of value；
If all parameter values are in the range of corresponding parameter threshold, will judge described in the qualified conduct of the tested Hall subassembly
Testing result；
If there is parameter value of the numerical value not in the range of corresponding parameter threshold, will judge that the tested Hall subassembly is unqualified
As the testing result.
10. Hall subassembly detection method according to claim 9, it is characterised in that judging the tested Hall subassembly
After unqualified, also include：
Parameter value not in the range of corresponding parameter threshold is labeled, and is shown in the display screen.
11. Hall subassembly detection methods according to claim 9, it is characterised in that when the Hall subassembly detection means
When also including alarm, after judging that the tested Hall subassembly is unqualified, also include：
Generate alarm control signal；
The alarm control signal is exported to the alarm, the alarm equipment alarm is controlled.
12. Hall subassembly detection methods according to claim 9, it is characterised in that judging the tested Hall subassembly
After qualified, also include：
Generate power down control signal；
The power down control signal is exported to signal PG input interfaces, the signal PG input interfaces is controlled and is stopped to the quilt
Survey Hall subassembly out-put supply PG signals.
13. Hall subassembly detection methods according to claim 7, it is characterised in that it is described obtain testing result after,
Also include：
Judge the type of the testing result, detect qualified when the type of the testing result characterizes the tested Hall subassembly
When, add one to the first count value；When the type of the testing result characterize the tested Hall subassembly it is unqualified when, count to second
Numerical value adds one, and the initial value of first technical value and second count value is zero.
14. Hall subassembly detection methods according to claim 7, it is characterised in that when the Hall subassembly detection means
When also including memory cell, it is described obtain testing result after, also include：
The output parameter and the testing result are exported to the memory cell and is preserved.
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| CN206147064U (en) * | 2016-10-18 | 2017-05-03 | 重庆凯邦电机有限公司 | Hall assembly detection device |
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| JP2012150003A (en) * | 2011-01-19 | 2012-08-09 | Asahi Kasei Electronics Co Ltd | Hall voltage detecting device |
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