CN106646183B - SLD light source test system - Google Patents
SLD light source test system Download PDFInfo
- Publication number
- CN106646183B CN106646183B CN201710104147.9A CN201710104147A CN106646183B CN 106646183 B CN106646183 B CN 106646183B CN 201710104147 A CN201710104147 A CN 201710104147A CN 106646183 B CN106646183 B CN 106646183B
- Authority
- CN
- China
- Prior art keywords
- light source
- sld light
- sld
- current value
- optical fiber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
According to the SLD light source testing system disclosed by the embodiment of the invention, light emitted by an SLD light source to be tested returns in a primary way after passing through the coupler, the polarizer component, the polarization maintaining fiber ring and the sensitive element, and two returned linearly polarized lights interfere; detecting the interference light intensity by a detector, and obtaining an electric signal corresponding to the interference light intensity; the signal processing circuit analyzes the electric signal sent by the detector to obtain a measured current value; the error calculation unit is used for measuring the measuring error introduced by the SLD light source to be measured under the environment according to the reference current value and the measuring current value. Because the transmission mode of the light wave in the system is the same as the light transmission mode in the FOCT, the expression form of the measurement error introduced by the finally obtained SLD light source in the environment can be equivalent to the form of the FOCT measurement error, the scheme can completely and accurately reflect the precision of the SLD light source, and the test result can be directly used for measuring the system performance of the SLD light source in the FOCT and provides effective technical reference for screening the SLD light source in the FOCT.
Description
Technical Field
The invention relates to the technical field of optoelectronic devices, in particular to an SLD light source testing system.
Background
SLD (superluminescent diode) light sources are an essential component of fiber optic current transformers (Fiber Optic Current Transformer, FOCT), and the characteristics of the SLD light sources often play a critical role in the performance of the FOCT.
FOCT is based on Faraday magneto-optical effect and ampere loop law, detects the magnitude of current in a detected conductor through an optical fiber sensitive ring, and specifically comprises the following steps: when current flows through the conductor to be measured, the phase speeds of the left-handed circularly polarized light and the right-handed circularly polarized light transmitted in the optical fiber sensing ring are respectively changed in opposite directions, so that a phase difference (namely Faraday phase shift) proportional to the current is generated, and the optical path characteristic is called nonreciprocal. This phase difference can be measured by interferometry and converted by a photodetector into a voltage signal output. And according to the analysis of the voltage signal, the magnitude of the current in the tested conductor can be obtained.
The multiple characteristic parameters of the SLD light source have an influence on the FOCT measurement accuracy, such as the spectral width of the light source is related to the coherence of the light path, the spectral modulation degree of the light source is related to the coherent noise of the light path, the polarization degree of the light source is related to the direct current component in the interference signal and the polarization noise of the light path, and the power of the light source is related to the optical noise, the dynamic characteristics of the light source, the signal modulation and the system start-up time. In long-term use of the SLD light source, due to the influence of external environment, central wavelength drift, optical power attenuation, light source die temperature change and the like all directly cause drift of the FOCT measurement accuracy. It is therefore necessary to test the performance of the SLD light source.
The traditional SLD light source detection method judges the performance of the SLD light source by measuring parameters such as a P-I curve, a 3dB bandwidth, spectrum ripple, optical power stability, polarization degree and the like, and is characterized in that the SLD light source is independently tested for a certain parameter independently of FOCT, the quality of the SLD light source cannot be completely and accurately reflected, and the test result cannot be directly used for measuring the system performance of the SLD light source in the FOCT, so that a direct and effective technical reference index cannot be provided for screening the SLD light source in the FOCT.
Disclosure of Invention
The embodiment of the invention provides an SLD light source testing system, which is characterized in that an SLD light source is arranged in a FOCT-based light path to test the performance parameters of the SLD light source under the excitation of an external environment, so that the error brought by the SLD light source to the FOCT under the excitation of the external environment can be equivalently expressed in the form of the FOCT measurement error, and a direct and effective technical reference index is provided for the screening of the SLD light source in the FOCT.
The embodiment of the invention provides an SLD light source testing system, which comprises:
the first end of the coupler receives light emitted by the SLD light source to be tested, and the second end of the coupler is connected with the detector;
the polarizer component is connected with the third end of the coupler and converts light emitted by the SLD light source to be tested into two linearly polarized light;
the first end of the polarization maintaining fiber ring is connected with the output end of the polarizer component;
the sensing element is used for sensing a reference current value in the conductive body and is connected with the second end of the polarization maintaining optical fiber ring; the two linearly polarized light beams output by the polarizer component return in the original path after passing through the polarization maintaining optical fiber ring and the sensitive element, and the two returned linearly polarized light beams interfere;
the detector detects the interference light intensity output by the second end of the coupler and obtains an electric signal corresponding to the interference light intensity;
the signal processing circuit is used for receiving the electric signal sent by the detector and obtaining a measured current value after analysis;
and the error calculation unit is used for receiving the measured current value sent by the signal processing circuit and obtaining a measurement error introduced by the SLD light source to be measured in the environment according to the reference current value and the measured current value.
Optionally, in the SLD light source testing system, the polarizer assembly includes a polarizer and a straight waveguide modulator, wherein:
the first end of the polarizer is connected with the third end of the coupler;
the first end of the straight waveguide modulator is connected with the second end of the polarizer by adopting a 45-degree counter shaft angle; the second end of the straight waveguide modulator is connected with the first end of the polarization maintaining optical fiber ring by adopting a 0-degree counter-axial angle; an electrical signal input of the straight waveguide modulator receives a modulated signal.
Optionally, in the above SLD light source testing system, the signal processing circuit includes a modulation signal output module, and the modulation signal output module sends a modulation signal to an electrical signal input end of the straight waveguide modulator.
Optionally, in the SLD light source testing system, the polarizer assembly includes a Y-waveguide modulator and a polarization beam combiner, wherein:
the input end of the Y waveguide modulator receives light emitted by the SLD light source to be tested through a coupler, and the electric signal input end of the Y waveguide modulator receives a modulation signal;
one input end of the polarization beam combiner is connected with one output end of the Y waveguide modulator by adopting a 90-degree counter axis angle, and the other input end of the polarization beam combiner is connected with the other output end of the Y waveguide modulator by adopting a 0-degree counter axis angle; the output end of the polarization beam combiner is connected with the first end of the polarization maintaining optical fiber ring by adopting a 0-degree counter shaft angle.
Optionally, in the above SLD light source testing system, the signal processing circuit includes a modulation signal output module, and the modulation signal output module sends a modulation signal to an electrical signal input end of the Y waveguide modulator.
Optionally, in the above SLD light source testing system, the sensing element includes an optical fiber ring, and an optical fiber wave plate and a reflecting mirror respectively disposed at two ends of the optical fiber ring, the optical fiber ring is internally provided with an electrical conductor passing through, and the optical fiber wave plate is connected with the second end of the polarization maintaining optical fiber ring.
Optionally, in the above SLD light source testing system, the SLD light source testing system further includes:
the environment generator is arranged in the SLD light source to be tested, and responds to a control signal of the upper computer to simulate the environment parameters of the SLD light source to be tested.
Optionally, in the above SLD light source testing system, the environmental parameters of the SLD light source to be tested simulated by the environmental generator include: at least one of temperature, humidity, vibration, shock, and irradiation.
Optionally, in the above SLD light source testing system, the SLD light source testing system further includes:
a current generator outputting a preset current to the energized conductor;
and the reference transformer detects the current value of the preset current output by the current generator and is used as the reference current value in the electrified conductor.
Optionally, in the above SLD light source testing system, the error calculating unit obtains a reference current value in the energized conductor detected by the reference transformer and the measured value obtained by analyzing by the signal processing circuit, so as to obtain a measurement error introduced by the SLD light source to be tested in the environment;
and the error calculation unit sends the measurement error to the upper computer.
According to the SLD light source testing system disclosed by the embodiment of the invention, light emitted by an SLD light source to be tested returns in a primary way after passing through the coupler, the polarizer component, the polarization maintaining fiber ring and the sensitive element, and two returned linearly polarized lights interfere; detecting the interference light intensity by a detector, and obtaining an electric signal corresponding to the interference light intensity; the signal processing circuit is used for receiving the electric signal sent by the detector and obtaining a measured current value after analysis; and the error calculation unit is used for receiving the measured current value sent by the signal processing circuit and obtaining a measurement error introduced by the SLD light source to be measured in the environment according to the reference current value and the measured current value. The transmission mode of the light wave in the system is the same as the light transmission mode in the FOCT, so that the finally obtained expression form of the measurement error of the SLD light source to be tested in the environment can be equivalent to the form of the FOCT measurement error.
Drawings
FIG. 1 is a schematic diagram of an SLD light source testing system according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of an SLD light source testing system employing a straight waveguide modulator polarizing assembly according to one embodiment of the present invention;
FIG. 3 is a schematic diagram of an SLD light source testing system employing a Y-waveguide modulator polarizing assembly according to one embodiment of the present invention;
FIG. 4 is a schematic diagram of a sensor according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of an SLD light source testing system according to another embodiment of the invention.
Detailed Description
Embodiments of the present invention will be further described below with reference to the accompanying drawings.
The present embodiment provides an SLD light source testing system, as shown in fig. 1, including:
and a coupler 101, a first end of which receives the light emitted by the SLD light source 100 to be tested, and a second end of which is connected to the detector 102.
And a polarizer assembly 200 connected to the third end of the coupler 101, for converting the light emitted by the SLD light source 100 to be tested into two linearly polarized light beams, and the two linearly polarized light beams are orthogonal.
A polarization maintaining fiber ring 103, a first end of which is connected with the output end of the polarizer assembly 200; two linearly polarized light beams enter the polarization maintaining fiber ring 103 and are respectively transmitted along the fast axis and the slow axis of the polarization maintaining fiber ring.
A sensor 300 for sensing a reference current value in the conductive body and connected to the second end of the polarization maintaining fiber ring 103; the two linearly polarized light beams output by the polarizer assembly 200 return to the original path after passing through the polarization maintaining fiber ring 103 and the sensing element 300, the two returned linearly polarized light beams interfere, and the interference light intensity is output through the second end of the coupler 101.
The detector 102 detects the interference light intensity output by the second end of the coupler 101, and obtains an electrical signal corresponding to the interference light intensity, and the detector 102 can convert the interference light intensity into a corresponding voltage signal.
The signal processing circuit 104 receives the electrical signal sent by the detector 102, and obtains a measured current value after analysis. Since the FOCT detects an error by detecting a current value, the interference light intensity is also converted into a final current value according to the FOCT detection principle in the present embodiment.
An error calculating unit 105, configured to receive the measured current value sent by the signal processing circuit 104, and obtain a measurement error introduced by the SLD light source 100 to be measured in the environment according to the reference current value and the measured current value. The reference current value may be measured by a reference transformer as a reference value in the error calculation unit 105. The measurement error can be obtained by the measurement current value and the reference current value according to a preset calculation model, and the preset calculation model is directly obtained according to the FOCT measurement principle. The environment where the SLD light source 100 to be measured is located is temperature, humidity, irradiance, etc., the SLD light source 100 to be measured can be placed in a laboratory, a box, etc., where each parameter is very stable, and each parameter of the required environment can be measured in advance and stored as known data, so that when a measurement error is obtained, the measurement error can be corresponding to each parameter of the environment.
Obviously, the transmission mode of the light waves of the light path constructed in the system is the same as that of the light in the FOCT, so that the finally obtained expression form of the measurement error is equivalent to that of the FOCT, the accuracy of the SLD light source to be tested can be completely and accurately reflected by adopting the scheme provided by the embodiment of the invention, and the test result can be directly used for measuring the system performance of the SLD light source to be tested in the FOCT, and a direct and effective technical reference index is provided for screening the SLD light source to be tested in the FOCT.
In the above scheme, the polarizer assembly may be implemented in a straight waveguide mode or a Y-waveguide mode, specifically:
straight waveguide implementation as shown in fig. 2, the polarizer assembly 200 includes a polarizer 201 and a straight waveguide modulator 202, wherein:
the first end of the polarizer 201 is connected to the third end of the coupler 101, and after the polarized light in the coupler 101 enters the polarizer 201, two linearly polarized light beams are generated.
The first end of the straight waveguide modulator 202 is connected to the second end of the polarizer 201 by a 45-degree axial angle, and two linearly polarized light beams enter the straight waveguide modulator 202. The second end of the straight waveguide modulator 202 is connected with the first end of the polarization maintaining fiber ring 103 by adopting a 0-degree axial angle, so that two beams of linearly polarized light enter the polarization maintaining fiber ring and are respectively transmitted along the fast axis and the slow axis of the polarization maintaining fiber ring, and the electric signal input end of the straight waveguide modulator 202 receives a modulation signal. Since the phase difference between the output signal and the current satisfies the cosine function, a modulator, typically a sine wave signal or a square wave signal, is used to bias the output signal to operate at a point where the response slope is non-zero for high sensitivity. As shown, the modulation signal may be directly provided by the signal processing circuit 104, specifically, the signal processing circuit 104 includes a modulation signal output module, and the modulation signal output module sends the modulation signal to the electrical signal input end of the straight waveguide modulator.
Y waveguide implementation as shown in fig. 3, the polarizer assembly 200 includes a Y waveguide modulator 203 and a polarization combiner 204, wherein:
the input end of the Y waveguide modulator 203 receives the light emitted by the SLD light source 100 to be tested through the coupler 101, the electrical signal input end of the Y waveguide modulator 203 receives a modulation signal, the signal processing circuit 104 includes a modulation signal output module, and the modulation signal output module sends the modulation signal to the electrical signal input end of the Y waveguide modulator.
One input end of the polarization beam combiner 204 is connected with one output end of the Y waveguide modulator 203 by adopting a 90-degree axial angle, two polarized light beams are exchanged in speed axis, and the other input end of the polarization beam combiner 204 is connected with the other output end of the Y waveguide modulator 203 by adopting a 0-degree axial angle; thus, the linearly polarized light entering through the two input ends of the polarization beam combiner 204 has different polarization states. The output end of the polarization beam combiner is connected with the first end of the polarization maintaining optical fiber ring by adopting a 0-degree counter shaft angle.
In the above scheme, as shown in fig. 4, the sensing element 300 includes an optical fiber ring 301, and an optical fiber wave plate 302 and a reflecting mirror 303 respectively disposed at two ends of the optical fiber ring 301, where an electrical conductor passes through the optical fiber ring 301, and the optical fiber wave plate 302 is connected with the second end of the polarization maintaining optical fiber ring 103. The optical fiber wave plate 302 may be a 1/4 optical fiber wave plate, and the reflecting mirror 303 is a faraday mirror, an optical fiber coated reflecting mirror, an optical fiber patch reflecting mirror, or the like. Two light wave columns with mutually orthogonal polarization modes are transmitted in the sensitive element, the light wave columns can be interchanged between a linear polarization state and a circular polarization state through the optical fiber wave plate 302, the circular polarization state of the light wave columns can be interchanged between a left hand and a right hand through the reflecting mirror 303, when no current passes through a conductor, the polarization states experienced by the two light wave columns are completely equivalent to a path, but are different in time sequence (for example, the polarization states experienced by one light wave column from the beginning to the back detection point are respectively fast axis polarization-left hand-right hand-slow axis polarization, and the polarization states experienced by the other light wave column in the same optical path are respectively slow axis polarization-right hand-left hand-fast axis polarization), in this case, the characteristics of the optical path are called reciprocity, when current passes through the conductor, the phase speeds of the left hand and the right hand transmitted in the optical fiber ring 301 are respectively changed in opposite directions, so that phase differences (namely Faraday phase shift) are generated, and the optical path of circularly polarized light transmitted in the current size is called non-proportional phase difference. Therefore, the optical path constructed by the system is completely equivalent to the FOCT optical path, so that the SLD light source is tested by adopting the system, which is equivalent to arranging the SLD light source in the FOCT, so that the measurement result can directly reflect the use performance of the system in the FOCT, and the SLD light source can be directly screened according to the measurement result.
As a preferred solution, further, as shown in fig. 5, the system further includes an environment generator 400, the SLD light source 100 to be tested is disposed inside the environment generator 400, and the environment generator 400 responds to the control signal of the host computer 500 to simulate the environment where the SLD light source 100 to be tested is located. The environment comprises: at least one of temperature, humidity, vibration, shock, and irradiation. For example, the environment generator 400 may simulate a single environment, such as a temperature control box to simulate temperature, a humidifier to control humidity, etc., or an environment control assembly having various environmental parameter adjustment functions. The optoelectronic module is the optoelectronic device in fig. 1 to 3 and is formed by connecting the optoelectronic devices.
In the above aspect, the system may further include a current generator 600 outputting a preset current to the energizing conductor; the reference transformer 700 detects a current value of the current generator 600 outputting a preset current as a reference current value in the energized conductor. The error calculation unit 105 obtains the reference current value in the energized conductor detected by the reference transformer 700 and the current value corresponding to the environment where the SLD light source 100 to be measured is located, which is obtained by analyzing by the signal processing circuit 104, so as to obtain the measurement error; the error calculation unit 105 transmits the measurement error to the host computer 500. The system for detecting the performance of the SLD light source to be detected comprises the following steps:
completing the construction of an SLD light source performance detection system infrastructure, comprising: the output end of the current generator is respectively connected with a reference transformer and an electrified conductor, the output ends of the reference transformer and the signal processing circuit are connected with an error calculation unit, and the output end of the error calculation unit is connected with an upper computer. And completing the connection between the SLD light source to be tested and the coupler. And placing the SLD light source to be tested in the environment generator, and completing connection between the environment generator and the upper computer. Starting the current generator, and calibrating the output current value of the signal processing circuit through the upper computer to enable the output current value to be consistent with the output current value of the reference transformer. I.e. in case the ambient generator does not generate any ambient stimulus, the result obtained by the signal processing unit should be the same as the reference current value. The upper computer controls the environment generator to generate environment excitation, and the upper computer reads and stores the measurement error result output by the error calculation unit, so that the measurement error is obviously introduced by the SLD light source to be measured under the current environment. To avoid additional measurement errors, the above test should be performed in a stable environment except for the environment inside the environment generator.
The core point of the invention is that the characteristic parameter drift of the SLD light source under the excitation of the external environment is detected through the FOCT light path system and is equivalently expressed in the form of the FOCT measurement error, so that the test result can be used as a reference index for measuring the quality of the SLD light source.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. An SLD light source testing system, comprising:
the first end of the coupler receives light emitted by the SLD light source to be detected, and the second end of the coupler is connected with the detector;
the polarizer component is connected with the third end of the coupler and converts light emitted by the SLD light source to be tested into two linearly polarized light;
the first end of the polarization maintaining fiber ring is connected with the output end of the polarizer component;
the sensing element is used for sensing a reference current value in the conductive body and is connected with the second end of the polarization maintaining optical fiber ring; the two linearly polarized light beams output by the polarizer component return in the original path after passing through the polarization maintaining optical fiber ring and the sensitive element, and the two returned linearly polarized light beams interfere;
the detector detects the interference light intensity output by the second end of the coupler and obtains an electric signal corresponding to the interference light intensity;
the signal processing circuit is used for receiving the electric signal sent by the detector and obtaining a measured current value after analysis;
and the error calculation unit is used for receiving the measured current value sent by the signal processing circuit and obtaining a measurement error introduced by the SLD light source to be measured in the environment according to the reference current value and the measured current value.
2. The SLD light source testing system of claim 1, wherein the polarizer assembly comprises a polarizer and a straight waveguide modulator, wherein:
the first end of the polarizer is connected with the third end of the coupler;
the first end of the straight waveguide modulator is connected with the second end of the polarizer by adopting a 45-degree counter shaft angle; the second end of the straight waveguide modulator is connected with the first end of the polarization maintaining optical fiber ring by adopting a 0-degree counter-axial angle; an electrical signal input of the straight waveguide modulator receives a modulated signal.
3. The SLD light source testing system of claim 2 wherein:
the signal processing circuit comprises a modulation signal output module, and the modulation signal output module sends a modulation signal to an electric signal input end of the direct waveguide modulator.
4. The SLD light source testing system of claim 1, wherein the polarizer assembly comprises a Y-waveguide modulator and a polarization beam combiner, wherein:
the input end of the Y waveguide modulator receives light emitted by the SLD light source to be tested through a coupler, and the electric signal input end of the Y waveguide modulator receives a modulation signal;
one input end of the polarization beam combiner is connected with one output end of the Y waveguide modulator BY adopting 90 degrees to an axial angle, and the other input end of the polarization beam combiner is connected with DP1F170250BY/CNSWT/GL of the Y waveguide modulator
The other output end is connected with the shaft angle by 0 DEG; the output end of the polarization beam combiner is connected with the first end of the polarization maintaining optical fiber ring by adopting a 0-degree counter shaft angle.
5. The SLD light source testing system of claim 4 wherein:
the signal processing circuit comprises a modulation signal output module, and the modulation signal output module sends a modulation signal to an electric signal input end of the Y waveguide modulator.
6. The SLD light source testing system according to any one of claims 1-5, wherein:
the sensing element comprises an optical fiber ring, an optical fiber wave plate and a reflecting mirror, wherein the optical fiber wave plate and the reflecting mirror are respectively arranged at two ends of the optical fiber ring, an electrified conductor penetrates through the optical fiber ring, and the optical fiber wave plate is connected with the second end of the polarization maintaining optical fiber ring.
7. The SLD light source testing system of claim 6, further comprising:
the environment generator is arranged in the SLD light source to be tested, and responds to a control signal of the upper computer to simulate the environment parameters of the SLD light source to be tested.
8. The SLD light source testing system of claim 7 wherein:
the environment parameters of the SLD light source to be tested simulated by the environment generator comprise: at least one of temperature, humidity, vibration, shock, and irradiation.
9. The SLD light source testing system of claim 8, further comprising:
a current generator outputting a preset current to the energized conductor;
and the reference transformer detects the current value of the preset current output by the current generator and is used as the reference current value in the electrified conductor.
10. The SLD light source testing system of claim 9 wherein:
the error calculation unit is used for obtaining a reference current value in the electrified conductor detected by the reference transformer and the measured current value obtained by analysis of the signal processing circuit, so as to obtain a measurement error introduced by the SLD light source to be detected in the environment;
and the error calculation unit sends the measurement error to the upper computer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710104147.9A CN106646183B (en) | 2017-02-24 | 2017-02-24 | SLD light source test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710104147.9A CN106646183B (en) | 2017-02-24 | 2017-02-24 | SLD light source test system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106646183A CN106646183A (en) | 2017-05-10 |
| CN106646183B true CN106646183B (en) | 2023-06-02 |
Family
ID=58847709
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710104147.9A Active CN106646183B (en) | 2017-02-24 | 2017-02-24 | SLD light source test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106646183B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107727911A (en) * | 2017-11-15 | 2018-02-23 | 中国电力科学研究院有限公司 | A kind of optical fiber current mutual inductor device and its current measuring method |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07260421A (en) * | 1994-03-22 | 1995-10-13 | Toshihiko Yoshino | Measuring apparatus employing microchip laser and measuring light source |
| CN1412538A (en) * | 2002-07-12 | 2003-04-23 | 天津大学 | Broad-band light source signal detection method and its detector |
| CN102788595A (en) * | 2012-07-27 | 2012-11-21 | 北京航空航天大学 | Optical fiber gyroscope frequency characteristic elevating method and device based on Faraday effect |
| CN206557332U (en) * | 2017-02-24 | 2017-10-13 | 北京世维通光智能科技有限公司 | SLD test of light source systems |
-
2017
- 2017-02-24 CN CN201710104147.9A patent/CN106646183B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07260421A (en) * | 1994-03-22 | 1995-10-13 | Toshihiko Yoshino | Measuring apparatus employing microchip laser and measuring light source |
| CN1412538A (en) * | 2002-07-12 | 2003-04-23 | 天津大学 | Broad-band light source signal detection method and its detector |
| CN102788595A (en) * | 2012-07-27 | 2012-11-21 | 北京航空航天大学 | Optical fiber gyroscope frequency characteristic elevating method and device based on Faraday effect |
| CN206557332U (en) * | 2017-02-24 | 2017-10-13 | 北京世维通光智能科技有限公司 | SLD test of light source systems |
Non-Patent Citations (1)
| Title |
|---|
| 胡蓓 ; 叶国雄 ; 肖浩 ; 李建光 ; 刘博阳 ; .全光纤电流互感器关键状态量及其监控方法.高电压技术.(12),全文. * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106646183A (en) | 2017-05-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106768867B (en) | LiNbO 3 Performance detection system for phase modulator | |
| Vallan et al. | Displacement and acceleration measurements in vibration tests using a fiber optic sensor | |
| CN108918940B (en) | All-fiber current mutual inductance system with temperature compensation and method | |
| CN110411335A (en) | Differential type sinusoidal phase modulation laser interference surface nanometer-displacement device and method | |
| CN206496890U (en) | Polarization maintaining optical fibre time delay ring test system | |
| RU2682514C2 (en) | Optoelectrical measuring device and method for measuring electric current | |
| CN107655599B (en) | Method for measuring micro stress of optical element | |
| Yu et al. | Polarimetric multilongitudinal mode fiber laser for simultaneous measurement of strain and temperature | |
| US20100171960A1 (en) | For path imbalance measurement of the two arms fiber optic interferometer | |
| CN106093599A (en) | A kind of optic probe and electromagnetic field measurements equipment and their measuring method | |
| CN108106817B (en) | Method for improving polarization performance measurement accuracy of Y waveguide device | |
| CN107179431B (en) | Optical fiber current sensing device and method based on birefringence real-time measurement | |
| CN101968507A (en) | Optical fiber voltage sensor and adjustment method thereof | |
| EP0260894A1 (en) | Optical fibre measuring system | |
| EP2363721B1 (en) | Optical fiber type magnetic field sensor and sensing method | |
| Eftimov et al. | A simple fiber optic magnetic field and current sensor with spectral interrogation | |
| CN106646183B (en) | SLD light source test system | |
| CN206556842U (en) | LiNbO3 phase-modulator performance detecting systems | |
| CN206497197U (en) | Optical fiber sensing ring performance detecting system | |
| CN104297598A (en) | Multi-parameter testing device and method of VCSEL | |
| KR100575244B1 (en) | Temperature compensating optical current transformer using fiber bragg grating | |
| CN206557332U (en) | SLD test of light source systems | |
| CN109375137B (en) | 1/4 wave plate phase delay automatic testing device and method for all-fiber current transformer | |
| KR102045831B1 (en) | Apparatus for detecting light temperature using polarization maintaining optical fiber | |
| Yao et al. | Fast optical frequency detection techniques for coherent distributed sensing and communication systems |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |