CN106093599A - A kind of optic probe and electromagnetic field measurements equipment and their measuring method - Google Patents
A kind of optic probe and electromagnetic field measurements equipment and their measuring method Download PDFInfo
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- CN106093599A CN106093599A CN201610466416.1A CN201610466416A CN106093599A CN 106093599 A CN106093599 A CN 106093599A CN 201610466416 A CN201610466416 A CN 201610466416A CN 106093599 A CN106093599 A CN 106093599A
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/28—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with deflection of beams of light, e.g. for direct optical indication
- G01D5/30—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with deflection of beams of light, e.g. for direct optical indication the beams of light being detected by photocells
Abstract
The invention discloses a kind of optic probe and electromagnetic field measurements equipment and their measuring method.Optic probe includes collimator, the polarizer, quartz wave-plate, electro-optic crystal, high reflectance dieelctric sheet, incident optical and quartz glass tube.Being assembled in successively in quartz glass tube according to the order of collimator, the polarizer, quartz wave-plate, electro-optic crystal and high reflectance dieelctric sheet, incident optical is connected to collimator and is fixed on glass tubing tube wall.The present invention has that volume is little, integrated level is high, little to the tested interference of electromagnetic field, capacity of resisting disturbance is strong, spatial resolution is high, dynamic range is big, in response to belt is roomy, dynamic range is big, sensitivity can design the advantages such as regulation as required.The measuring method that invention additionally discloses described optic probe, the electromagnetic field measurements equipment with described optic probe, the measuring method of described electromagnetic field measurements equipment.
Description
Technical field
The present invention relates to a kind of optic probe and electromagnetic field measurements equipment and their measurement thereof in electromagnetic field measurements field
Method, particularly relate to the adjustable optic probe for electromagnetic field measurements of a kind of sensitivity, the measuring method of described optic probe,
There is the electromagnetic field measurements equipment of described optic probe, the measuring method of described electromagnetic field measurements equipment.
Background technology
Electromagnetic field measurements is all a key component in various science and technology field, process control, the electric field of Medical Equipment
Monitoring, trajectory control, electromagnetic compatibility measurement, microwave integrated circuit test, measuring high electric field etc. are all answering of emf sensor
Use field.Traditional electromagnetic field measuring system generally uses active Metal to pop one's head in, and this can upset tested electromagnetic field thus cause surveying
Accuracy of measurement declines, and this kind of sensor is especially sensitive to electromagnetic noise simultaneously, at aspects such as bandwidth, capacity of resisting disturbance and invasives
There is obvious defect and deficiency.Optically measuring electromagnetic field and have its exclusive advantage, this is owing to optical signal exists
Being little affected by the impact of external electromagnetic ripple during propagation, have the strongest capacity of resisting disturbance, asking so can solve electromagnetic compatibility
Topic, simultaneously because the wavelength of light is extremely short, very high frequency so that it is little, lightweight and empty that the optical device of measurement electromagnetic field has size
Between resolution high.
Patent CN 102472785 and patent CN 103105541B all disclose a kind of method for electromagnetic field measurements and
Device, utilizes laser to enter into the spy that the refractive index of material and material changes along with the change of the intensity of tested electromagnetic field
Property, then by the measurement of laser signal and analysis being obtained the information of electromagnetic field.This technology has that invasive is little, spatial discrimination
The big advantages such as rate bandwidth high, big, electromagnetism interference, have a extensive future.But above two technology is brilliant just with electric light
Body, as sensor probe, needs external Polarization Controller, optical analyser etc. to separate optical device, and just with electro-optic crystal
The acquisition reflected signal of fault plane reflection, thus its reflected signal light light intensity is affected by external disturbance compared with little Yi.This technology simultaneously
The polarization state of incident laser is not controlled, it is impossible to ensure that probe is operated in best operating point and the need according to workplace
Ask the selection realized probe sensitivity, it is proposed that a kind of integrated level is higher, stability is more preferable, sensitivity adjustable for
The micro-optical probe of electromagnetic field measurements is the most necessary.
Summary of the invention
It is an object of the invention to, it is provided that the adjustable optic probe for electromagnetic field measurements of a kind of sensitivity, described
The measuring method of optic probe, there is the electromagnetic field measurements equipment of described optic probe, the measurement of described electromagnetic field measurements equipment
Method, described optic probe has that volume is little, integrated level is high, little to the tested interference of electromagnetic field, capacity of resisting disturbance strong, spatial discrimination
Rate is high, dynamic range is big, in response to belt is roomy, dynamic range is big, sensitivity can design the advantages such as regulation as required.
The present invention is achieved through the following technical solutions: the adjustable optic probe for electromagnetic field measurements of a kind of sensitivity,
It includes collimator, the polarizer, quartz wave-plate, electro-optic crystal, high reflectance dieelctric sheet, incident optical and quartz glass tube；
Quartz glass it is assembled in successively according to the order of collimator, the polarizer, quartz wave-plate, electro-optic crystal and high reflectance dieelctric sheet
Guan Zhong, incident optical is connected to collimator and is fixed on glass tubing tube wall.As the further improvement of such scheme, incident illumination
Fibre is fixed on glass tubing tube wall by a glue；Collimator, the polarizer, quartz wave-plate, electro-optic crystal and high reflectance medium
Sheet is integrated in quartz glass tube admittedly by glue.
As the further improvement of such scheme, it is at 45 ° that the fast axle of quartz wave-plate and the polarization of the polarizer lead to optical axis included angle.
The present invention also provides for the measuring method of the adjustable optic probe for electromagnetic field measurements of above-mentioned any sensitivity, logical
Cross the polarization state that the laser of electro-optic crystal is incided in quartz wave-plate regulation, recycle electro-optic crystal bubble Ke Er in electromagnetic field
This effect changes the polarization state of the light beam of transmission in electromagnetic field so that carry from the optical signalling of high reflectance dieelctric sheet reflection
There is the amplitude information of electromagnetic field, thus by optical signalling being demodulated the information obtaining tested electromagnetic field.
As the further improvement of such scheme, incident optical is connected to collimator and incident laser is focused collimation；
Laser after collimation is through the polarizer and quartz wave-plate, by selecting the initial polarization of the type adjustment incident laser of quartz wave-plate
State；Laser light incident is to electro-optic crystal afterwards, and electro-optic crystal, under the effect of tested electromagnetic field, produces electrooptic effect, and its optics is rolled over
Penetrate rate distribution to change, cause the polarization characteristic of the laser transmitted wherein to change along with tested electromagnetic field, thus tested electricity
The electric field signal in magnetic field is loaded on laser beam；Laser beam is reflected through high reflectance dieelctric sheet again, swashing after reflection
Light can again pass by the electro-optic crystal modulation to its polarization state；Afterwards quartz wave-plate and the polarizer by tested electromagnetic field signal to swashing
The polarization state modulation of light light beam is converted into the change of light intensity signal, thus the optical signal exported through probe by opto-electronic conversion and divides
The information of tested electromagnetic field is obtained after analysis detection.
Further, optic probe is according to the dynamic range of electromagnetic field field intensity tested in practical application and sensitivity
The quartz wave-plate that design alternative is different, regulation is needed to incide the polarization state of the laser of electro-optic crystal so that tested electromagnetic field
Laser is in different modulation operating points so that the measurement sensitivity of optic probe is different.
The present invention also provides for a kind of electromagnetic field measurements equipment, and it includes spectrum analyzer, photodetector, laser instrument, light
Circulator, optic probe；Optic probe is the adjustable optic probe for electromagnetic field measurements of above-mentioned any sensitivity: laser instrument
The laser launched is entered to the optic probe being in tested electromagnetic field by optical circulator, and optic probe is tested by being loaded with after modulation
The laser-bounce of electromagnetic field, after reflection, laser enters into photodetector through optical circulator again, is photoelectrically converted to radio frequency letter
Spectrum analyzer is entered into after number.
The present invention also provides for the measuring method of above-mentioned electromagnetic field measurements equipment, incides electric light by quartz wave-plate regulation brilliant
The polarization state of the laser of body, recycling electro-optic crystal bubble Ke Ersi effect in electromagnetic field changes transmission in electromagnetic field
The polarization state of light beam so that carry the amplitude information of electromagnetic field from the optical signalling of high reflectance dieelctric sheet reflection, thus logical
Cross and optical signalling is demodulated the information obtaining tested electromagnetic field.
As the further improvement of such scheme, incident optical is connected to collimator and incident laser is focused collimation；
Laser after collimation is through the polarizer and quartz wave-plate, by selecting the initial polarization of the type adjustment incident laser of quartz wave-plate
State；Laser light incident is to electro-optic crystal afterwards, and electro-optic crystal, under the effect of tested electromagnetic field, produces electrooptic effect, and its optics is rolled over
Penetrate rate distribution to change, cause the polarization characteristic of the laser transmitted wherein to change along with tested electromagnetic field, thus tested electricity
The electric field signal in magnetic field is loaded on laser beam；Laser beam is reflected through high reflectance dieelctric sheet again, swashing after reflection
Light can again pass by the electro-optic crystal modulation to its polarization state；Afterwards quartz wave-plate and the polarizer by tested electromagnetic field signal to swashing
The polarization state modulation of light light beam is converted into the change of light intensity signal, thus the optical signal exported through probe by opto-electronic conversion and divides
The information of tested electromagnetic field is obtained after analysis detection.
Further, optic probe is according to the dynamic range of electromagnetic field field intensity tested in practical application and sensitivity
The quartz wave-plate that design alternative is different, regulation is needed to incide the polarization state of the laser of electro-optic crystal so that tested electromagnetic field
Laser is in different modulation operating points so that the measurement sensitivity of optic probe is different.
It is an advantage of the current invention that: described miniature optical probes have size little, low to tested antenna element invasive,
The advantages such as capacity of resisting disturbance is strong, spatial resolution is high, dynamic range is big, in response to belt is roomy, dynamic range is big, and multiple discrete light
Learning components and parts to be integrated in optic probe, integrated level is high, and reflected signal is strong, works more reliable and more stable, and can be according to institute
The occasion of application designs corresponding sensitivity and the optic probe of operating dynamic range.
Accompanying drawing explanation
The structural representation of the electromagnetic field measurements equipment that Fig. 1 provides for present pre-ferred embodiments.
Fig. 2 is the structure of the adjustable optic probe for electromagnetic field measurements of the sensitivity of electromagnetic field measurements equipment in Fig. 1
Schematic diagram.
Detailed description of the invention
Below in conjunction with embodiment, the present invention is further elaborated.Should be appreciated that concrete reality described herein
Execute example only in order to explain the present invention, do not limit the present invention.
Refer to the structural representation of the electromagnetic field measurements equipment that Fig. 1, Fig. 1 provide for present pre-ferred embodiments, namely
The working method schematic diagram that the adjustable micro-optical for electromagnetic field measurements of sensitivity of electromagnetic field measurements equipment is popped one's head in.Electromagnetism
Field measurement equipment includes spectrum analyzer 1, photodetector 2, laser instrument 3, optical circulator 4, optic probe 5.Optic probe 5 is
The adjustable optic probe for electromagnetic field measurements of sensitivity.The laser that laser instrument 3 is launched is entered into by optical circulator 4 and is in
Optic probe 5 in tested electromagnetic field, optic probe 5 will be loaded with the laser-bounce of tested electromagnetic field, this laser warp again after modulation
Cross optical circulator 4 and enter into photodetector 2, enter into spectrum analyzer 1 after being photoelectrically converted to radiofrequency signal, thus obtain
With the electrical signal of tested electromagnetic field magnitude proportion relation, just can obtain tested by analyzing and processing this electrical signal
The information of electromagnetic field.
The structure of the adjustable micro-optical probe 5 for electromagnetic field measurements of described sensitivity is as shown in Figure 2.Optic probe
5 mainly by collimator 8, the polarizer 9, quartz wave-plate 10, electro-optic crystal 11, incident optical 13, high reflectance dieelctric sheet 12 and
Quartz glass tube 6 grade forms.The polarizer 9, quartz wave-plate 10, electro-optic crystal 11 and high reflectance dieelctric sheet 12 are by accurate
Optics cuts, and according to collimator 8, the polarizer 9, quartz wave-plate 10, electro-optic crystal 11 and high reflectance dieelctric sheet 12
Order carries out pasting combination successively, and glue is integrated in quartz glass tube 6 admittedly, and incident optical 13 is connected to collimator 8, and passes through
Point glue 7 is fixed on glass tubing 6 tube wall, plays the effect of protection buffering.
Incident optical 13 is connected to collimator 8 and incident laser is focused collimation, and the laser after collimation is through the polarizer 9
With quartz wave-plate 10, and the fast axle of fixing quartz wave-plate 10 and the polarization of the polarizer 9 to lead to optical axis included angle at 45 °, by selecting stone
The original state of polarization of the type adjustment incident laser of English wave plate 10.Laser light incident exists to electro-optic crystal 11, electro-optic crystal 11 afterwards
Under the effect of tested electromagnetic field, producing electrooptic effect, the distribution of its light refractive index changes, thus cause transmitting wherein
The polarization characteristic of laser changes along with tested electromagnetic field, thus the electric field signal of tested electromagnetic field is loaded on laser beam.Swash
Light light beam is reflected through high reflectance dieelctric sheet 12 again, and the laser after reflection can again pass by electro-optic crystal 11 to its polarization state
Modulation, the polarization state of laser beam is modulated and is converted into light by quartz wave-plate 10 and the polarizer 9 by tested electromagnetic field signal afterwards
The change of strong signal, thus tested electromagnetic field can be obtained after the optical signal of probe output passes through opto-electronic conversion and analyzes detection
Information.
The measuring method of the optic probe 5 of the present invention is: setting incident laser its electric field intensity after the polarizer 9 can represent
For matrix [E0,0]T, then backtracking is reflected also through high reflectance dieelctric sheet 12 again through quartz wave-plate 10 and electro-optic crystal 11
The electric field intensity of polarized light of output can be expressed as by Jones matrix (setting the reflectance of high reflectance dieelctric sheet as 1):
In formula, θ is that the fast axle of quartz wave-plate 10 leads to optical axis included angle with the polarization of the polarizer 9, and θ ' is the sense of electro-optic crystal 11
The polarization of axle and the polarizer 9 soon should lead to optical axis included angle, δ be that laser passes through electro-optic crystal 11 at two under tested electromagnetic field effect
The phase contrast produced on sensing main shaft.Select θ=45 °, then the electric field intensity of the Output of laser of optic probe 5 can be expressed as:
And then the light intensity of laser from optic probe output can be obtained can be expressed as:
Wherein, I0For incident laser light intensity after the polarizer 9.Select θ '=45 °, then the output of optic probe 5 swashs
The electric field intensity of light can be expressed as:
From above formula it is found that the selection of the described optic probe 5 output intensity under tested electromagnetic field and quartz wave-plate
Relevant, owing to δ is much smaller than 1, when tested electromagnetic field is the least, selecting quartz wave-plate is 1/8 wave plate, and above formula is carried out approximate calculation
And omit δ2Can obtain after higher order term:
From above formula, the phase contrast produced due to electrooptic effect that tested electromagnetic field causes because of electro-optic crystal and incident illumination
Strong I0Becoming once linear relationship, now optic probe 5 is higher to the electric field sensitivity of tested electromagnetic field, in this case, and institute
State optic probe 5 and be suitable for the measurement of light current magnetic field environment.
When tested electromagnetic field is bigger, selection quartz wave-plate is quarter wave plate, and above formula is carried out approximate calculation can obtain:
From above formula, when selected quartz wave-plate is quarter wave plate, the output intensity of optic probe 5 is brilliant with electric light
Square one-tenth once linear relationship of the phase contrast δ that the electrooptic effect that body causes due to tested electromagnetic field produces, owing to δ is less, light
Learn probe 5 relatively low to the electric field sensitivity of tested electromagnetic field, be quite suitable for the high-strength magnetic field environment of Larger Dynamic scope
Measure.Therefore according to the size of tested electromagnetic field field intensity, select suitable quartz wave-plate 10, can realize from weak electric field to high forceful electric power
The measurement of numerous application scenarios, field.
In sum, the micro-optical probe of the present invention mainly by collimator, the polarizer, quartz wave-plate, electro-optic crystal with
And the optics such as high reflectance dieelctric sheet composition, its measuring method may be summarized to be: incides electricity by quartz wave-plate regulation
The polarization state of the laser of luminescent crystal, the bubble Ke Ersi effect change in electromagnetic field of the recycling electro-optic crystal is transmitted wherein
The polarization state of light beam so that carry the amplitude information of electromagnetic field from the optical signalling of probe reflection, such that it is able to by light
The demodulation learning signal obtains the information of tested electromagnetic field.
The above-mentioned polarizer, quartz wave-plate, electro-optic crystal and high reflectance dieelctric sheet are cut by accurate optics, and
And carry out successively pasting group according to the order of collimator, the polarizer, quartz wave-plate, electro-optic crystal and high reflectance dieelctric sheet
Close, and glue is integrated in quartz glass tube, admittedly to improve integrated level and the mechanical strength of optic probe.
Above-mentioned quartz wave-plate is according to the dynamic range of electromagnetic field field intensity tested in practical application and the needs of sensitivity
The quartz wave-plate that design alternative is different, the polarization state of the laser of electro-optic crystal is incided in regulation so that tested electromagnetic field is to swashing
Light is in different modulation operating points so that the measurement sensitivity of optic probe is different, thus ensures that described optic probe is permissible
Meet the demand of different application occasion, it is achieved from weak electric field occasions such as electromagnetic exposure to the quilt launching the high-strength electric field occasions such as antenna
Survey the measurement of electromagnetic field.
The foregoing is only presently preferred embodiments of the present invention, not in order to limit the present invention, all essences in the present invention
Any amendment, equivalent and the improvement etc. made within god and principle, should be included within the scope of the present invention.
Claims (10)
1. the adjustable optic probe for electromagnetic field measurements of sensitivity；It is characterized in that: it includes collimator (8), rises
Device (9), quartz wave-plate (10), electro-optic crystal (11), high reflectance dieelctric sheet (12), incident optical (13) and quartz glass partially
Glass pipe (6)；According to collimator (8), the polarizer (9), quartz wave-plate (10), electro-optic crystal (11) and high reflectance dieelctric sheet
(12) order is assembled in quartz glass tube (6) successively, and incident optical (13) is connected to collimator (8) and is fixed on glass tubing
(6) on tube wall.
2. the adjustable optic probe for electromagnetic field measurements of sensitivity as claimed in claim 1, it is characterised in that: incident illumination
Fine (13) are fixed on glass tubing (6) tube wall by a glue (7)；Collimator (8), the polarizer (9), quartz wave-plate (10), electric light
Crystal (11) and high reflectance dieelctric sheet (12) are integrated in quartz glass tube (6) admittedly by glue.
3. the adjustable optic probe for electromagnetic field measurements of sensitivity as claimed in claim 1, it is characterised in that: quartz ripple
It is at 45 ° that the fast axle of sheet (10) and the polarization of the polarizer (9) lead to optical axis included angle.
4. the adjustable optic probe for electromagnetic field measurements of the sensitivity as described in any one in claims 1 to 3
Measuring method, it is characterised in that: incided the polarization state of laser of electro-optic crystal (11) by quartz wave-plate (10) regulation,
Recycling electro-optic crystal (11) bubble Ke Ersi effect in electromagnetic field changes the polarization state of the light beam of transmission in electromagnetic field, makes
Derive from the optical signalling that high reflectance dieelctric sheet (12) reflects and carry the amplitude information of electromagnetic field, thus by optical signalling
Demodulation obtain tested electromagnetic field information.
5. the measuring method of the adjustable optic probe for electromagnetic field measurements of sensitivity as claimed in claim 4, its feature
It is: incident optical (13) is connected to collimator (8) and incident laser is focused collimation；Laser after collimation is through the polarizer
(9) and quartz wave-plate (10), by selecting the original state of polarization of the type adjustment incident laser of quartz wave-plate (10)；Laser afterwards
Inciding electro-optic crystal (11), electro-optic crystal (11), under the effect of tested electromagnetic field, produces electrooptic effect, its light refractive index
Distribution changes, and causes the polarization characteristic of the laser transmitted wherein to change along with tested electromagnetic field, thus tested electromagnetic field
Electric field signal be loaded on laser beam；Laser beam is reflected through high reflectance dieelctric sheet (12) again, swashing after reflection
Light can again pass by the electro-optic crystal (11) modulation to its polarization state；Quartz wave-plate (10) and the polarizer (9) are by tested electricity afterwards
The polarization state of laser beam is modulated the change being converted into light intensity signal by field signal, thus the optical signal exported through probe passes through
The information of tested electromagnetic field is obtained after opto-electronic conversion and analysis detection.
6. the measuring method of the adjustable optic probe for electromagnetic field measurements of sensitivity as claimed in claim 5, its feature
It is: optic probe needs design alternative according to the dynamic range of electromagnetic field field intensity tested in practical application and sensitivity
Different quartz wave-plates, the polarization state of laser of electro-optic crystal (11) is incided in regulation so that tested electromagnetic field to laser at
In different modulation operating points so that the measurement sensitivity of optic probe is different.
7. an electromagnetic field measurements equipment, it includes spectrum analyzer (1), photodetector (2), laser instrument (3), optical circulator
(4), optic probe (5)；It is characterized in that: optic probe (5) is the sensitivity as described in any one in claims 1 to 3
The adjustable optic probe for electromagnetic field measurements: the laser that laser instrument (3) is launched by optical circulator (4) enter into be in by
Surveying the optic probe (5) in electromagnetic field, optic probe (5), by being loaded with the laser-bounce of tested electromagnetic field after modulation, swashs after reflection
Light enters into photodetector (2) through optical circulator (4) again, enters into spectrum analyzer after being photoelectrically converted to radiofrequency signal
(1)。
8. the measuring method of an electromagnetic field measurements equipment as claimed in claim 7, it is characterised in that: pass through quartz wave-plate
(10) polarization state of the laser inciding electro-optic crystal (11), recycling electro-optic crystal (11) bubble gram in electromagnetic field are regulated
Your this effect changes the polarization state of the light beam of transmission in electromagnetic field so that the optics letter reflected from high reflectance dieelctric sheet (12)
Number carry the amplitude information of electromagnetic field, thus by optical signalling being demodulated the information obtaining tested electromagnetic field.
9. the measuring method of electromagnetic field measurements equipment as claimed in claim 8, it is characterised in that: incident optical (13) is connected to
Collimator (8) is focused collimation to incident laser；Laser after collimation, through the polarizer (9) and quartz wave-plate (10), passes through
Select the original state of polarization of the type adjustment incident laser of quartz wave-plate (10)；Laser light incident is to electro-optic crystal (11), electricity afterwards
Luminescent crystal (11), under the effect of tested electromagnetic field, produces electrooptic effect, and the distribution of its light refractive index changes, and causes at it
The polarization characteristic of the laser of middle transmission changes along with tested electromagnetic field, thus the electric field signal of tested electromagnetic field is loaded into laser light
Shu Shang；Laser beam is reflected through high reflectance dieelctric sheet (12) again, and the laser after reflection can again pass by electro-optic crystal
(11) modulation to its polarization state；Afterwards quartz wave-plate (10) and the polarizer (9) by tested electromagnetic field signal to laser beam
Polarization state modulation is converted into the change of light intensity signal, thus after the optical signal of probe output passes through opto-electronic conversion and analyzes detection
Obtain the information of tested electromagnetic field.
10. the measuring method of electromagnetic field measurements equipment as claimed in claim 9, it is characterised in that: optic probe is according to reality
In application scenario the dynamic range of tested electromagnetic field field intensity and sensitivity need the different quartz wave-plate of design alternative, regulate into
It is mapped to the polarization state of the laser of electro-optic crystal (11) so that tested electromagnetic field is in different modulation operating points to laser, makes
The measurement sensitivity obtaining optic probe is different.
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| CN201610466416.1A CN106093599B (en) | 2016-06-21 | 2016-06-21 | Optical probe and electromagnetic field measuring equipment and measuring method thereof |
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| CN201610466416.1A CN106093599B (en) | 2016-06-21 | 2016-06-21 | Optical probe and electromagnetic field measuring equipment and measuring method thereof |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109709361A (en) * | 2018-05-18 | 2019-05-03 | 浙江大学 | A kind of method of electromagnetic field near field measurement device and production electromagnetic probe |
| CN109839545A (en) * | 2019-03-19 | 2019-06-04 | 浙江大学 | Rotary electric field sensor of optic fibre and rotary optical electric-field sensor measuring system |
| CN109839546A (en) * | 2019-03-19 | 2019-06-04 | 浙江大学 | The fixation device of sonde configuration in a kind of reflective micro-optical electric-field sensor |
| CN110161295A (en) * | 2019-04-30 | 2019-08-23 | 浙江大学 | A kind of probe and its Method of Adjustment of reflection type optical fiber electric-field sensor |
| CN110632509A (en) * | 2019-10-10 | 2019-12-31 | 湖北航天技术研究院计量测试技术研究所 | Hall switch test tool and test method |
| CN111239500A (en) * | 2020-02-20 | 2020-06-05 | 云南电网有限责任公司电力科学研究院 | Transformer inner space electric field measurement system |
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| CN110161295B (en) * | 2019-04-30 | 2020-05-22 | 浙江大学 | Probe of reflective optical fiber electric field sensor and assembling and adjusting method thereof |
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