CN106556349A - Water film thickness measuring instrument - Google Patents
Water film thickness measuring instrument Download PDFInfo
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- CN106556349A CN106556349A CN201510615231.8A CN201510615231A CN106556349A CN 106556349 A CN106556349 A CN 106556349A CN 201510615231 A CN201510615231 A CN 201510615231A CN 106556349 A CN106556349 A CN 106556349A
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- film thickness
- water film
- confocal displacement
- measuring instrument
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Abstract
The invention discloses a kind of water film thickness measuring instrument, wherein, including installation frame, confocal displacement measuring head is set in the installation frame, the top of the confocal displacement measuring head arranges and refers to glass, and the lower section of the confocal displacement measuring head arranges XY detection benchmark table tops.The water film thickness measuring instrument that the present invention is provided, solves the measurement of water film thickness in larger scope from 1 micron to 1000 microns.
Description
Technical field
The present invention relates to a kind of thickness measurement equipment, more particularly to a kind of water film thickness measuring instrument that water film thickness is measured in the research such as aerodynamicss, nuclear science, environmental science.
Background technology
In prior art, measurement water film thickness adopts water film thickness measuring instrument.Accompanying drawing 1 is the spectrogram that aqueous solution is absorbed to near-infrared ripple, it can be seen that in 2.96 mu m wavebands, aqueous solution has significant absorbtivity, and is hardly absorbed in 2.55 mu m wavebands.For this purpose, the former is set to measuring section, the latter is set to reference field, and water film thickness measuring instrument is made according to the difference of both wave reflections.Using ultrared absorption spectrum, the thickness of moisture film can be calculated with following equation：
In (io/i)=kbc；
In formula, i0 is incident intensity, and i is transmitted intensity, and k is constant, and b is water film thickness, and c is solution density.Accompanying drawing 2 is the absorption curve of the moisture film to infrared spectrum of different-thickness.Curve a represents dry printing plate, and curve b represents the moisture film amount of 0.4g/m2, and curve c represents the moisture film amount of 1.48g/m2.
The principle of water film thickness measuring instrument is：The light alternating of 2.96 μm and 2.55 μm of wavelength is irradiated on the printing plate of offset press using a rotating filtering mirror wheel, two beam infrared ray are reflected by printing plate through after moisture film.Wherein a branch of infrared ray is not weakened by moisture film when passing through moisture film, and another beam infrared ray is as the thickening of water is by strong absorption.Therefore, the infrared ray that anti-body is returned from the space of a whole page, the intensity having nothing in common with each other.The infrared ray of varying strength is by a photocell detection, and Jing special impulse circuit, is converted into the thickness of moisture film.
Water film thickness measuring instrument, is also infrared photometer, is German fogra printings Research Institute, provides testing tool for accurate measurement moisture film, already installed on roland vltrt machines.If different using absorption of the ink film of different-thickness to infrared spectrum, infrared photometer, it is also possible to for determining the thickness of printing plate areas ink film.Additionally, the space of a whole page is irradiated with laser, determining its volume reflection or applying alternating voltage against damping roller, determine its electricity the moon value, the method for then trying to achieve water film thickness again is also tried out on offset press.But, the management of digitization is accomplished to the water yield on printing plate, in addition it is also necessary on the basis of theoretical research is improved, manufactures experimently accurate water testing instrument, improve method of testing.Tradition carries out water film thickness measurement with the mode of infrared absorption spectroscopy, can only typically measure the moisture film of 2.5-8 micron thickness, then thick or thin be again all hardly accessible for measurements.
Different from, in prior art, the present invention proposes a kind of water film thickness measuring instrument, it is devoted to solving the measurement of 1 micron to 1000 microns water film thickness in larger scope.
The content of the invention
The technical scheme that the present invention is adopted to solve above-mentioned technical problem is to provide a kind of water film thickness measuring instrument, wherein：
Including installation frame, confocal displacement measuring head is set in the installation frame, the top of the confocal displacement measuring head arranges and refers to glass.
Above-mentioned water film thickness measuring instrument, wherein, the lower section of the confocal displacement measuring head arranges XY detection benchmark table tops.
Above-mentioned water film thickness measuring instrument, wherein, the confocal displacement measuring head is controlled by confocal displacement meter controller, and the confocal displacement meter is connected by confocal displacement meter optical fiber with confocal displacement meter controller.
Above-mentioned sapphire thickness measurement equipment, wherein, the confocal displacement meter controller connecting secondary instrument, the secondary meter are used to calculate water film thickness to be measured.
The present invention is had the advantages that relative to prior art：
With the glass of one piece of known thickness as the supporting body for carrying moisture film while as reference thickness.There is spectral dispersion by dispersion camera lens in confocal displacement measuring head, form the monochromatic light of different wave length, each one distance value to testee of wavelength correspondence.Measurement light is mapped to body surface and is reflected back, and the upper and lower surface position of only glass can meet confocal condition, and reflected light can be sensed by spectrogrph by aperture.Moisture film is attached to glass surface, and the surface of moisture film can be identified as confocal displacement measuring head the surface of glass, and by the wavelength for calculating the light for being sensed the reflection of glass upper and lower surface, conversion obtains distance value, and the difference of glass upper and lower surface distance value is both thickness value.The add water thickness that deducts with reference to glass of gross thickness of film of the glass that measurement is obtained is both water film thickness value.The present invention solves the measurement of water film thickness in larger scope from 1 micron to 1000 microns.
Description of the drawings
Fig. 1 is the spectrogram that aqueous solution is absorbed to near-infrared ripple.
Absorption curve figure of the moisture film of Fig. 2 different-thickness to infrared spectrum.
The structural representation of the water film thickness measuring instrument that Fig. 3 is provided for the present invention.
Fig. 4 is moisture film enlarged diagram.
The structural representation of the water film thickness measuring instrument that Fig. 5 is provided for the present invention.
The structural representation of the water film thickness measuring instrument that Fig. 6 is provided for the present invention.
The practical principle figure of the water film thickness measuring instrument that Fig. 7 is provided for the present invention.
1 XY detection benchmark table top, 2 confocal displacement measuring head 3 refers to glass
4 moisture film, 5 installation frame 6 amplifies moisture film
7 distance, one 8 distance two
Specific embodiment
The invention will be further described with reference to the accompanying drawings and examples.
First relevant technical terms in the present invention are explained：
Confocal displacement meter：Confocal displacement meter is the non-contact optical displacement measuring instrument of a kind of new superhigh precision and ultrastability, the polychromatic light (white) of one beam of broad spectrum is projected by light source, there is spectral dispersion by dispersion camera lens, a series of monochromatic light of different wave lengths is formed on an axis, the corresponding distance value to testee of each wavelength.Irradiation light is reflected by body surface, is filtered by copolymerization Jiao's aperture, is only met the monochromatic light of confocal condition, can be sensed by spectrogrph by aperture.By calculating the wavelength being sensed, conversion obtains distance value.
The water film thickness measuring instrument that the present invention is provided, its concrete structure is：Including installation frame 1, confocal displacement measuring head 2 is set in the installation frame 1, the top of the confocal displacement measuring head 2 is arranged with reference to glass 3.The lower section of the confocal displacement measuring head 2 arranges XY detection benchmark table top 1.The confocal displacement measuring head 2 is controlled by confocal displacement meter controller, and the confocal displacement meter is connected by confocal displacement meter optical fiber with confocal displacement meter controller.The confocal displacement meter controller connecting secondary instrument, the secondary meter are used to calculate water film thickness to be measured.
Fig. 7 is implementation principle figure of the present invention, as shown in Figure 7,4 thickness of moisture film=distance, two 2- distances 1-and with reference to 3 glass thickness of glass.The supporting body of moisture film is carried the most while as reference thickness with the glass of one piece of known thickness.There is spectral dispersion by dispersion camera lens in confocal displacement meter, form the monochromatic light of different wave length, each one distance value to testee of wavelength correspondence.Measurement light is mapped to body surface and is reflected back, and the upper and lower surface position of only glass can meet confocal condition, and reflected light can be sensed by spectrogrph by aperture.Moisture film 4 is attached to glass surface, and the surface of moisture film 4 can be identified as confocal displacement meter the surface of glass, and by the wavelength for calculating the light for being sensed the reflection of glass upper and lower surface, conversion obtains distance value, and the difference of glass upper and lower surface distance value is both thickness value.The add water thickness that deducts with reference to glass of gross thickness of film of the glass that measurement is obtained is both water film thickness value.
Although the present invention is disclosed as above with preferred embodiment; so which is not limited to the present invention, any those skilled in the art, without departing from the spirit and scope of the present invention; when a little modification and perfect, therefore protection scope of the present invention can be made when by being defined that claims are defined.
Claims (4)
1. a kind of water film thickness measuring instrument, it is characterised in that：Including installation frame, the installing frame
Confocal displacement measuring head is set in frame, and the top of the confocal displacement measuring head arranges and refers to glass.
2. water film thickness measuring instrument as claimed in claim 1, it is characterised in that：The confocal position
The lower section for moving measuring head arranges XY detection benchmark table tops.
3. water film thickness measuring instrument as claimed in claim 2, it is characterised in that：The confocal position
Move measuring head to control by confocal displacement meter controller, the confocal displacement meter is controlled with confocal displacement meter
Device is connected by confocal displacement meter optical fiber.
4. sapphire thickness measurement equipment as claimed in claim 3, it is characterised in that：It is described confocal
Displacement meter controller connecting secondary instrument, the secondary meter are used to calculate water film thickness to be measured.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201510615231.8A CN106556349A (en) | 2015-09-24 | 2015-09-24 | Water film thickness measuring instrument |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201510615231.8A CN106556349A (en) | 2015-09-24 | 2015-09-24 | Water film thickness measuring instrument |
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| CN106556349A true CN106556349A (en) | 2017-04-05 |
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| CN201510615231.8A Pending CN106556349A (en) | 2015-09-24 | 2015-09-24 | Water film thickness measuring instrument |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107702656A (en) * | 2017-10-26 | 2018-02-16 | 长沙理工大学 | A kind of detection method of ore water film thickness |
| CN110006620A (en) * | 2019-02-18 | 2019-07-12 | 中国空气动力研究与发展中心低速空气动力研究所 | A kind of moisture film measuring system |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107702656A (en) * | 2017-10-26 | 2018-02-16 | 长沙理工大学 | A kind of detection method of ore water film thickness |
| CN110006620A (en) * | 2019-02-18 | 2019-07-12 | 中国空气动力研究与发展中心低速空气动力研究所 | A kind of moisture film measuring system |
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