CN106526324B - Impedance characteristic testing device of capacitive equipment - Google Patents

Impedance characteristic testing device of capacitive equipment Download PDF

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Publication number
CN106526324B
CN106526324B CN201610986865.9A CN201610986865A CN106526324B CN 106526324 B CN106526324 B CN 106526324B CN 201610986865 A CN201610986865 A CN 201610986865A CN 106526324 B CN106526324 B CN 106526324B
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cable
impedance
core
capacitor
tie point
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CN106526324A (en
Inventor
黄莹
项阳
刘磊
李敏
赵志斌
卢毓欣
辛清明
赵晓斌
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China South Power Grid International Co ltd
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China South Power Grid International Co ltd
Power Grid Technology Research Center of China Southern Power Grid Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The invention relates to an impedance characteristic testing device of capacitive equipment, which comprises an impedance analyzer, a first cable, a second cable and a capacitor, wherein the impedance analyzer is connected with the first cable; one end of the impedance analyzer is connected to one end of the capacitive equipment to be tested through the first cable, and the other end of the impedance analyzer is connected to the other end of the capacitive equipment to be tested through the second cable; the capacitor is connected in parallel between the first cable and the second cable, so that the difference value between the wave impedance of the first cable and the second cable and the internal impedance of the impedance analyzer is within a set range. The invention can eliminate the error introduced by the test line inductance in the test process so as to obtain accurate impedance of the capacitive equipment and improve the test precision.

Description

The impedance operator test device of capacitive apparatus
Technical field
The present invention relates to power equipment configured transmission testing fields, survey more particularly to a kind of impedance operator of capacitive apparatus Trial assembly is set.
Background technique
The configured transmission of power equipment is for the power circuit electricity in the case of accurately calculating lightning stroke, operation or fault overvoltage Pressure and electric current branch are of great significance.But since power equipment volume is larger, each terminal distance farther out, is directed to capacitive and sets Standby impedance operator, traditional test method are in test using longer conducting wire connection Devices to test and impedance analyzer. But the impedance parameter of longer wire lead will lead to the inaccuracy of test result, and for capacitive apparatus to be measured, in some instances it may even be possible to because Resonance effect and the case where cause test result to deviate significantly from actual result.
Summary of the invention
Based on this, the present invention provides a kind of impedance operator test device of capacitive apparatus, eliminates the impedance parameter of p-wire Influence for test result, to obtain the impedance operator of more accurately capacitive apparatus.
To achieve the above object, the embodiment of the present invention uses following technical scheme:
A kind of impedance operator test device of capacitive apparatus, including impedance analyzer, the first cable, the second cable and electricity Hold;
One end of the impedance analyzer passes through first cable connection to one end of measured capacitive equipment, the impedance The other end of analyzer passes through second cable connection to the other end of the measured capacitive equipment;
The capacitor is connected in parallel between first cable and second cable, so that first cable and institute State the difference of the wave impedance of the second cable and the internal impedance of the impedance analyzer within the set range.
By adjusting the capacitance of capacitor in the embodiment of the present invention, so that the wave impedance of the first cable and second cable, It is similar with the internal impedance of impedance analyzer, so as to eliminate the error of p-wire inductance introducing during the test, with The impedance of accurate capacitive apparatus is obtained, measuring accuracy is improved.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the impedance operator test device of capacitive apparatus of the invention in one embodiment;
Fig. 2 is the structural schematic diagram of the impedance operator test dress of capacitive apparatus of the invention in another embodiment.
Specific embodiment
The contents of the present invention are described in further detail below in conjunction with preferred embodiment and attached drawing.Obviously, hereafter institute The examples are only for explaining the invention for description, rather than limitation of the invention.Based on the embodiments of the present invention, this field is general Logical technical staff every other embodiment obtained without making creative work belongs to what the present invention protected Range.It should be understood that although hereinafter describing various information using term " first ", " second " etc., these letters Breath should not necessarily be limited by these terms, these terms are only used to for same type of information being distinguished from each other out.For example, not departing from this hair In the case where bright range, " first " information can also be referred to as " second " information, and similar, " second " information can also be referred to as " first " information.It also should be noted that only the parts related to the present invention are shown for ease of description, in attached drawing and Not all content.
Fig. 1 is the structural schematic diagram of the impedance operator test device of capacitive apparatus of the invention in one embodiment, such as Shown in Fig. 1, the impedance operator test device of the capacitive apparatus in the present embodiment, including impedance analyzer 10, the first cable 21, Two cables 22 and capacitor 30.Wherein, one end of impedance analyzer 10 is connected to measured capacitive equipment 700 by the first cable 21 One end, the other end of impedance analyzer 10 are connected to the other end of measured capacitive equipment 700 by the second cable 22.Capacitor 30 is simultaneously Connection is connected between the first cable 21 and the second cable 22, so that the wave impedance of the first cable 21 and the second cable 22 and impedance point The difference of the internal impedance of analyzer 10 is within the set range.
Above-mentioned setting range takes a lesser range, the in this way capacitance by adjusting capacitor 30, can make first The wave impedance of cable 21 and the second cable 22 is similar with the internal impedance of impedance analyzer 10.
When the impedance operator test device using the capacitive apparatus in the present embodiment, capacitive apparatus to be measured is measured When, since the wave impedance of the first cable 21 and the second cable 22 is similar with the internal impedance of impedance analyzer 10, so as to disappear Except the deviation that p-wire inductance introduces, resolved impedance spectroscopy analyzer when test capacitive apparatus, due to wiring is long, introduce inductance greatly and Caused by test result inaccuracy problem.
Fig. 2 is the structural schematic diagram of the impedance operator test dress of capacitive apparatus of the invention in another embodiment, such as Shown in Fig. 2, the first cable 21 includes sequentially connected N sections of single-core cable 210, and the second cable 22 includes sequentially connected N sections single Core cable 220, the number of capacitor 30 are N-1, and wherein N is the positive integer greater than 1.
Referring to shown in Fig. 2, the first cable 21 has N-1 tie point a, wherein the 1st tie point a is in the first cable 21 The tie point of paragraph 1 single-core cable 210 and the 2nd section of single-core cable 210, the 2nd tie point a are the 2nd section of single-core cable 210 and the The tie point of 3 sections of single-core cables 210, and so on, the N-1 tie point a is N-1 sections of single-core cables 210 and N sections of singles The tie point of cable 210.
Similarly, the second cable 22 also has N-1 tie point b, wherein the 1st tie point b is paragraph 1 in the second cable 22 The tie point of single-core cable 220 and the 2nd section of single-core cable 220, the 2nd tie point b are the 2nd section of single-core cable 220 and the 3rd section of list The tie point of core cable 220, and so on, the N-1 tie point b is N-1 sections of single-core cables 220 and N sections of single-core cables 220 tie point.
Referring to shown in Fig. 2, k-th of capacitor 30 be connected to the first cable k-th of tie point a and k-th of the second cable Between tie point b, to form ladder network;Wherein, k is positive integer, and 1≤k≤N-1.By adjusting the appearance of each capacitor 30 Value, can make the wave impedance of each ladder and the internal impedance of impedance analyzer in ladder network approximate, i.e., so that the first cable The wave impedance of single-core cable 210 in 21 and the single-core cable 220 in corresponding second cable 22, it is interior with impedance analyzer Impedance is approximate.Using the Novel connecting wire that ladder network is constituted as p-wire, impedance analyzer 10 and measured capacitive equipment are connected 700, the deviation of p-wire inductance introducing can be eliminated during the test, improve the accuracy of test result.
In a kind of optional embodiment, the single-core cable in the first cable 21 and the second cable 22 is to be provided with screen Cover the single-core cable of layer, and the parameter (capacitor of the inductance of unit length, unit length) of single-core cable can consult acquisition.
In a kind of optional embodiment, the length of kth section single-core cable 210 and the second cable 22 in the first cable 21 The length of middle kth section single-core cable 220 is identical, and the length of each section of single-core cable be respectively less than or very equal to wavelength to be measured One of.
Specifically, wavelength to be measured can be determined according to measured frequency.Single-core cable 210 and second in first cable 21 The length of corresponding single-core cable 220 is identical in cable 22, and the length of each section of single-core cable 210 in the first cable 21 Degree can be different, but cannot be greater than 1/10th of wavelength to be measured.Similarly, each section of single-core cable in the second cable 21 210 length can be different, but cannot be greater than 1/10th of wavelength to be measured.In addition, difficulty when by actual processing And the limitation of theoretical basis, it is being higher than 30 megahertzs (wavelength i.e. to be measured is less than 10 meters) to measured frequency or is being lower than 2 megahertzs (i.e. Wavelength to be measured is greater than 150 meters) when, the impedance operator test device measurement accuracy of the capacitive apparatus in the present embodiment is not high enough, because This, is originally that the impedance operator test device of the capacitive apparatus in embodiment is adapted to wavelength to be measured between 10 meters to 150 meters Occasion, therefore the length of each section of single-core cable is respectively less than or is equal to 15 meters in the first cable 21 and the second cable 22.
Further, the impedance operator test device of the capacitive apparatus in the present embodiment, may also include screening arrangement, use The screening arrangement wraps up capacitor 30, plays the role of shielding, can be further improved measuring accuracy.
In a kind of optional embodiment, the capacitance of each capacitor 30 can be determined by the following conditions formula:
Wherein, CkFor the capacitance of k-th of capacitor 30, C is the capacitor of single-core cable unit length, and L is single-core cable unit The inductance of length, d are the length of kth section single-core cable in the first cable 21, ZDFor the internal resistance of impedance analyzer.By adjusting every The capacitance of one capacitor, so that the wave impedance of each ladder is approximate with the internal impedance of impedance analyzer in ladder network, thus The influence of p-wire impedance parameter is eliminated, measuring accuracy is improved.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited In contradiction, all should be considered as described in this specification.
The embodiments described above only express several embodiments of the present invention, and the description thereof is more specific and detailed, but simultaneously It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection of the invention Range.Therefore, the scope of protection of the patent of the invention shall be subject to the appended claims.

Claims (6)

1. a kind of impedance operator test device of capacitive apparatus, which is characterized in that including impedance analyzer, the first cable, second Cable and capacitor;
One end of the impedance analyzer passes through first cable connection to one end of measured capacitive equipment, the impedance analysis The other end of instrument passes through second cable connection to the other end of the measured capacitive equipment;
The capacitor is connected in parallel between first cable and second cable, so that the wave impedance of first cable With the internal resistance of the difference of the internal impedance of the impedance analyzer and the wave impedance of second cable and the impedance analyzer Anti- difference is within the set range.
2. the impedance operator test device of capacitive apparatus according to claim 1, which is characterized in that the first cable packet Sequentially connected N sections of single-core cable is included, second cable includes sequentially connected N sections of single-core cable, and the capacitor is N-1 A, N is the positive integer greater than 1;
K-th of capacitance connection between k-th of tie point of first cable and k-th of tie point of the second cable, To form ladder network;K-th of tie point of first cable is the kth section single-core cable and kth+1 of first cable The tie point of section single-core cable, k-th of tie point of second cable are the kth section single-core cable and the of second cable The tie point of k+1 sections of single-core cables;K is positive integer, and 1≤k≤N-1.
3. the impedance operator test device of capacitive apparatus according to claim 2, which is characterized in that first cable and Single-core cable in second cable is the single-core cable for being provided with shielded layer.
4. the impedance operator test device of capacitive apparatus according to claim 2, which is characterized in that in first cable The length of kth section single-core cable is identical as the length of kth section single-core cable in second cable, and each section of single-core cable Length is respectively less than or equal to 1/10th of wavelength to be measured.
5. the impedance operator test device of capacitive apparatus according to claim 1 or 2, which is characterized in that further include shielding Device, the screening arrangement wrap up the capacitor.
6. the impedance operator test device of capacitive apparatus according to claim 2, which is characterized in that the capacitance of the capacitor Are as follows:
Wherein, CkFor the capacitance of k-th of capacitor, C is the capacitor of the single-core cable unit length, and L is the single-core cable unit The inductance of length, d are the length of kth section single-core cable in first cable, ZDFor the internal resistance of the impedance analyzer.
CN201610986865.9A 2016-11-09 2016-11-09 Impedance characteristic testing device of capacitive equipment Active CN106526324B (en)

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CN109991478B (en) * 2017-12-29 2021-07-13 致茂电子(苏州)有限公司 Inductance measuring device and inductance measuring method

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JP2008157906A (en) * 2006-12-25 2008-07-10 Adtec Plasma Technology Co Ltd Output impedance detection method and impedance sensor using this method, electric power monitor in load side connected high frequency electric source and control device for high frequency electric source
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CN203012053U (en) * 2012-12-18 2013-06-19 清华大学 Testing device for impedance characteristics of high-voltage power equipment port
CN105318901A (en) * 2014-08-02 2016-02-10 软控股份有限公司 Surface acoustic wave resonator type impedance sensor and surface acoustic wave resonator type impedance detection system
CN204439721U (en) * 2015-03-12 2015-07-01 华北电力大学(保定) A kind of capacitive divider wideband impedance measurement system of Excavation Cluster Based on Network Analysis instrument
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Address after: 510700 3rd, 4th and 5th floors of building J1 and 3rd floor of building J3, No.11 Kexiang Road, Science City, Luogang District, Guangzhou City, Guangdong Province

Patentee after: China South Power Grid International Co.,Ltd.

Address before: 510080 water Donggang 8, Dongfeng East Road, Yuexiu District, Guangzhou, Guangdong.

Patentee before: China South Power Grid International Co.,Ltd.

Patentee before: POWER GRID TECHNOLOGY RESEARCH CENTER. CHINA SOUTHERN POWER GRID

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