Summary of the invention
Based on this, the present invention provides a kind of impedance operator test device of capacitive apparatus, eliminates the impedance parameter of p-wire
Influence for test result, to obtain the impedance operator of more accurately capacitive apparatus.
To achieve the above object, the embodiment of the present invention uses following technical scheme:
A kind of impedance operator test device of capacitive apparatus, including impedance analyzer, the first cable, the second cable and electricity
Hold;
One end of the impedance analyzer passes through first cable connection to one end of measured capacitive equipment, the impedance
The other end of analyzer passes through second cable connection to the other end of the measured capacitive equipment;
The capacitor is connected in parallel between first cable and second cable, so that first cable and institute
State the difference of the wave impedance of the second cable and the internal impedance of the impedance analyzer within the set range.
By adjusting the capacitance of capacitor in the embodiment of the present invention, so that the wave impedance of the first cable and second cable,
It is similar with the internal impedance of impedance analyzer, so as to eliminate the error of p-wire inductance introducing during the test, with
The impedance of accurate capacitive apparatus is obtained, measuring accuracy is improved.
Specific embodiment
The contents of the present invention are described in further detail below in conjunction with preferred embodiment and attached drawing.Obviously, hereafter institute
The examples are only for explaining the invention for description, rather than limitation of the invention.Based on the embodiments of the present invention, this field is general
Logical technical staff every other embodiment obtained without making creative work belongs to what the present invention protected
Range.It should be understood that although hereinafter describing various information using term " first ", " second " etc., these letters
Breath should not necessarily be limited by these terms, these terms are only used to for same type of information being distinguished from each other out.For example, not departing from this hair
In the case where bright range, " first " information can also be referred to as " second " information, and similar, " second " information can also be referred to as
" first " information.It also should be noted that only the parts related to the present invention are shown for ease of description, in attached drawing and
Not all content.
Fig. 1 is the structural schematic diagram of the impedance operator test device of capacitive apparatus of the invention in one embodiment, such as
Shown in Fig. 1, the impedance operator test device of the capacitive apparatus in the present embodiment, including impedance analyzer 10, the first cable 21,
Two cables 22 and capacitor 30.Wherein, one end of impedance analyzer 10 is connected to measured capacitive equipment 700 by the first cable 21
One end, the other end of impedance analyzer 10 are connected to the other end of measured capacitive equipment 700 by the second cable 22.Capacitor 30 is simultaneously
Connection is connected between the first cable 21 and the second cable 22, so that the wave impedance of the first cable 21 and the second cable 22 and impedance point
The difference of the internal impedance of analyzer 10 is within the set range.
Above-mentioned setting range takes a lesser range, the in this way capacitance by adjusting capacitor 30, can make first
The wave impedance of cable 21 and the second cable 22 is similar with the internal impedance of impedance analyzer 10.
When the impedance operator test device using the capacitive apparatus in the present embodiment, capacitive apparatus to be measured is measured
When, since the wave impedance of the first cable 21 and the second cable 22 is similar with the internal impedance of impedance analyzer 10, so as to disappear
Except the deviation that p-wire inductance introduces, resolved impedance spectroscopy analyzer when test capacitive apparatus, due to wiring is long, introduce inductance greatly and
Caused by test result inaccuracy problem.
Fig. 2 is the structural schematic diagram of the impedance operator test dress of capacitive apparatus of the invention in another embodiment, such as
Shown in Fig. 2, the first cable 21 includes sequentially connected N sections of single-core cable 210, and the second cable 22 includes sequentially connected N sections single
Core cable 220, the number of capacitor 30 are N-1, and wherein N is the positive integer greater than 1.
Referring to shown in Fig. 2, the first cable 21 has N-1 tie point a, wherein the 1st tie point a is in the first cable 21
The tie point of paragraph 1 single-core cable 210 and the 2nd section of single-core cable 210, the 2nd tie point a are the 2nd section of single-core cable 210 and the
The tie point of 3 sections of single-core cables 210, and so on, the N-1 tie point a is N-1 sections of single-core cables 210 and N sections of singles
The tie point of cable 210.
Similarly, the second cable 22 also has N-1 tie point b, wherein the 1st tie point b is paragraph 1 in the second cable 22
The tie point of single-core cable 220 and the 2nd section of single-core cable 220, the 2nd tie point b are the 2nd section of single-core cable 220 and the 3rd section of list
The tie point of core cable 220, and so on, the N-1 tie point b is N-1 sections of single-core cables 220 and N sections of single-core cables
220 tie point.
Referring to shown in Fig. 2, k-th of capacitor 30 be connected to the first cable k-th of tie point a and k-th of the second cable
Between tie point b, to form ladder network;Wherein, k is positive integer, and 1≤k≤N-1.By adjusting the appearance of each capacitor 30
Value, can make the wave impedance of each ladder and the internal impedance of impedance analyzer in ladder network approximate, i.e., so that the first cable
The wave impedance of single-core cable 210 in 21 and the single-core cable 220 in corresponding second cable 22, it is interior with impedance analyzer
Impedance is approximate.Using the Novel connecting wire that ladder network is constituted as p-wire, impedance analyzer 10 and measured capacitive equipment are connected
700, the deviation of p-wire inductance introducing can be eliminated during the test, improve the accuracy of test result.
In a kind of optional embodiment, the single-core cable in the first cable 21 and the second cable 22 is to be provided with screen
Cover the single-core cable of layer, and the parameter (capacitor of the inductance of unit length, unit length) of single-core cable can consult acquisition.
In a kind of optional embodiment, the length of kth section single-core cable 210 and the second cable 22 in the first cable 21
The length of middle kth section single-core cable 220 is identical, and the length of each section of single-core cable be respectively less than or very equal to wavelength to be measured
One of.
Specifically, wavelength to be measured can be determined according to measured frequency.Single-core cable 210 and second in first cable 21
The length of corresponding single-core cable 220 is identical in cable 22, and the length of each section of single-core cable 210 in the first cable 21
Degree can be different, but cannot be greater than 1/10th of wavelength to be measured.Similarly, each section of single-core cable in the second cable 21
210 length can be different, but cannot be greater than 1/10th of wavelength to be measured.In addition, difficulty when by actual processing
And the limitation of theoretical basis, it is being higher than 30 megahertzs (wavelength i.e. to be measured is less than 10 meters) to measured frequency or is being lower than 2 megahertzs (i.e.
Wavelength to be measured is greater than 150 meters) when, the impedance operator test device measurement accuracy of the capacitive apparatus in the present embodiment is not high enough, because
This, is originally that the impedance operator test device of the capacitive apparatus in embodiment is adapted to wavelength to be measured between 10 meters to 150 meters
Occasion, therefore the length of each section of single-core cable is respectively less than or is equal to 15 meters in the first cable 21 and the second cable 22.
Further, the impedance operator test device of the capacitive apparatus in the present embodiment, may also include screening arrangement, use
The screening arrangement wraps up capacitor 30, plays the role of shielding, can be further improved measuring accuracy.
In a kind of optional embodiment, the capacitance of each capacitor 30 can be determined by the following conditions formula:
Wherein, CkFor the capacitance of k-th of capacitor 30, C is the capacitor of single-core cable unit length, and L is single-core cable unit
The inductance of length, d are the length of kth section single-core cable in the first cable 21, ZDFor the internal resistance of impedance analyzer.By adjusting every
The capacitance of one capacitor, so that the wave impedance of each ladder is approximate with the internal impedance of impedance analyzer in ladder network, thus
The influence of p-wire impedance parameter is eliminated, measuring accuracy is improved.
Each technical characteristic of embodiment described above can be combined arbitrarily, for simplicity of description, not to above-mentioned reality
It applies all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, all should be considered as described in this specification.
The embodiments described above only express several embodiments of the present invention, and the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection of the invention
Range.Therefore, the scope of protection of the patent of the invention shall be subject to the appended claims.