CN106525669A - Light momentum-excited nano beam microparticle mass measuring device and method - Google Patents
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Abstract
本发明提供一种光动量激励纳米梁质量测量装置,包括类正弦光动量激励发生装置和微质量检测装置,上激光器和下激光器的单色光分别照射上圆盘和下圆盘通光孔,驱动电动机带动轴旋转,可以产生类似正弦分布光动量激励,激励纳米梁振动,纳米梁在交变光动量激励作用下产生受迫振动,粘贴于纳米梁根部的电阻层电阻阻值发生变化,利用惠斯通电桥电路可以将该信号输出,经信号放大器放大后,可以进行频谱分析,得到振动时域和频域振动信息图像,得到振动幅值和振动频率等振动参数。改变光动量激励发生装置驱动电机转速,光动量激励频率随着发生变化,纳米梁共振时,输出电流信号值最大,测量电压变化峰值可以检测纳米梁的共振振动频率,通过计算得到纳米梁末端粘附的附加质量的大小,达到测量纳微颗粒质量的目的。The invention provides a light momentum excitation nanobeam quality measurement device, including a sinusoidal light momentum excitation generating device and a micro-mass detection device, the monochromatic light of the upper laser and the lower laser illuminates the light holes of the upper disc and the lower disc respectively, Drive the motor to drive the shaft to rotate, which can generate light momentum excitation similar to sinusoidal distribution, and stimulate the nanobeam to vibrate. The Wheatstone bridge circuit can output the signal, and after being amplified by the signal amplifier, the spectrum analysis can be performed to obtain vibration information images in the time domain and frequency domain of vibration, and vibration parameters such as vibration amplitude and vibration frequency. Changing the rotational speed of the drive motor of the photomomentum excitation generating device, the photomomentum excitation frequency changes accordingly. When the nanobeam resonates, the output current signal value is the largest, and the resonance vibration frequency of the nanobeam can be detected by measuring the peak value of the voltage change. Through calculation, the viscosity at the end of the nanobeam is obtained. The size of the attached additional mass achieves the purpose of measuring the mass of nanoparticles.
Description
技术领域technical field
本发明专利是一种纳微质量检测装置,特别是一种用于纳微质量测量装置,属于纳微质量检测领域。The patent of the present invention relates to a nano-micro mass detection device, in particular to a nano-micro mass measurement device, which belongs to the field of nano-micro mass detection.
背景技术Background technique
对于机械谐振器,纳微悬臂梁是用于探测弱力信号的重要装置。为了实现更高的力学灵敏度,需要采用尺寸更小的微振子,然而如何驱动和探测微小谐振子的振动,成为制约测量纳微颗粒质量精度提高的难题之一。基于量子力学的基本原理,在驱动和测量过程中,驱动和测量设备会对被测对象造成扰动和破坏,引入多余的噪声,降低测量的精确度。在纳微谐振器的振动信号提取方面,通常采用检测位移信号的方法,将位移信号转化为光、电、磁等信号,通过测量这些信号,实现高灵敏度的位移测量,然而这些手段对被测机械振子的尺寸和几何形状有着苛刻的要求,难以应用到纳米、亚纳米尺度机械振子的测量,潜在制约了高精度质量的测量工作。光动量驱动是一种无接触驱动方法,作为纳微谐振器的驱动激励源,减少驱动对被测对象的影响,可以激励尺寸更小的微振子,提高纳微质量测量的精确度和测量的分辨率。For mechanical resonators, nanomicrocantilevers are important devices for detecting weak force signals. In order to achieve higher mechanical sensitivity, it is necessary to use smaller micro-oscillators. However, how to drive and detect the vibration of the micro-resonator has become one of the problems that restricts the improvement of the accuracy of measuring the mass of nano-particles. Based on the basic principles of quantum mechanics, in the process of driving and measuring, the driving and measuring equipment will cause disturbance and damage to the measured object, introduce unnecessary noise, and reduce the accuracy of measurement. In terms of vibration signal extraction of nano-micro resonators, the method of detecting displacement signals is usually used to convert displacement signals into optical, electrical, magnetic and other signals. By measuring these signals, high-sensitivity displacement measurement can be realized. The size and geometry of mechanical vibrators have strict requirements, and it is difficult to apply to the measurement of nanometer and sub-nanometer scale mechanical vibrators, which potentially restricts the measurement of high-precision quality. Optical momentum drive is a non-contact driving method. As the driving excitation source of the nano-micro resonator, it reduces the influence of the drive on the measured object, can stimulate the micro-oscillator with a smaller size, and improves the accuracy and accuracy of the nano-micro mass measurement. resolution.
本发明可以广泛应用于细菌、病毒检测,大气污染物检测等领域纳微粒子检测工作,甚至可以用于单分子或者原子质量检测。The invention can be widely used in the detection of nano-particles in the fields of bacteria, virus detection, air pollutant detection and the like, and can even be used for single molecule or atomic mass detection.
发明内容Contents of the invention
本发明针对纳微颗粒质量难以测量的现状,提出一种纳微颗粒质量测量装置与方法。Aiming at the current situation that it is difficult to measure the quality of nano and micro particles, the invention proposes a device and method for measuring the quality of nano and micro particles.
本发明解决其技术问题所采用的方案是:所述的光动量激励纳米梁质量测量装置,包括类正弦光动量激励发生装置和微质量检测装置,其特征在于:The solution adopted by the present invention to solve the technical problem is: the optical momentum excitation nano-beam mass measurement device includes a sinusoidal optical momentum excitation generating device and a micro-mass detection device, which is characterized in that:
所述光动量激励发生装置由两个固定在同一个轴上的上圆盘、下圆盘、上激光器、下激光器、轴、上轴承、下轴承、驱动电动机和固定端组成,轴的上端和下端分别安装一个轴承,轴下端铰接一个驱动电动机,驱动电动机带动轴旋转;上圆盘和下圆盘半径均为12mm,上圆盘和下圆盘盘面沿着距离轴心等距离开等面积正方形的通光孔,正方形的通光孔边长为5μm,边长远大于光的波长,以半径为10mm的圆周线为中心线布置,相邻两通光孔间距离相等,相邻两个通光孔间距离为通光孔宽度的四倍,上圆盘和下圆盘相邻两通光孔间距离为通光孔宽度的两倍。上激光器和下激光器固定在底座上,当上激光器和下激光器的单色光分别照射通光孔,驱动电动机带动轴旋转,可以产生类似正弦分布光动量激励,激励纳米梁振动。The photomomentum excitation generating device consists of two upper disks, lower disks, upper lasers, lower lasers, shafts, upper bearings, lower bearings, drive motors and fixed ends fixed on the same shaft. The upper end of the shaft and A bearing is respectively installed at the lower end of the shaft, and a driving motor is hinged at the lower end of the shaft, and the driving motor drives the shaft to rotate; the radius of the upper disc and the lower disc are both 12mm, and the upper disc and the lower disc are equal-area squares along the distance from the axis. The square light hole has a side length of 5 μm, and the side length is much longer than the wavelength of light. It is arranged with a circle line with a radius of 10mm as the center line. The distance between the holes is four times the width of the light hole, and the distance between the two adjacent light holes of the upper disk and the lower disk is twice the width of the light hole. The upper laser and the lower laser are fixed on the base. When the monochromatic light of the upper laser and the lower laser irradiates the light hole respectively, the drive motor drives the shaft to rotate, which can generate light momentum excitation similar to a sinusoidal distribution, and excite the nanobeam to vibrate.
所述微质量检测装置由纳米梁、电阻层电阻、惠斯通电桥和需要测量的纳微颗粒组成,其特征在于:The micro-mass detection device is composed of nano-beams, resistance layer resistance, Wheatstone bridge and nano-particles to be measured, and is characterized in that:
所述纳米梁一端固定,另一端自由,纳米梁用硅单晶材料制作,长度、宽度和高度分别为40μm、5μm和0.8μm,纳米梁宽度小于正方形通光孔的边长,被测量纳微颗粒安放在纳米梁末端,正弦光激励作用于纳米梁离末端四分之一处附近。One end of the nano-beam is fixed and the other end is free. The nano-beam is made of silicon single crystal material. The length, width and height are 40 μm, 5 μm and 0.8 μm respectively. The width of the nano-beam is smaller than the side length of the square light hole. The particles are placed at the end of the nano-beam, and the sinusoidal light excitation acts on the nano-beam near a quarter of the end.
所述纳米梁上层靠近固定端部分通过氩离子溅射,形成一薄层电阻层电阻,氩离子溅射深度10-50nm,该电阻层电阻值随着纳米梁的变形而发生变化,电阻层长度变长时,电阻变大,相反则变小,电阻层电阻初始电阻15kΩ,惠斯通电桥其它电阻均为15kΩ。The upper layer of the nanobeam near the fixed end is sputtered by argon ions to form a thin layer of resistance layer resistance, the depth of argon ion sputtering is 10-50nm, the resistance value of the resistance layer changes with the deformation of the nanobeam, and the length of the resistance layer When it becomes longer, the resistance becomes larger, and vice versa, it becomes smaller. The initial resistance of the resistance layer resistance is 15kΩ, and the other resistances of the Wheatstone bridge are all 15kΩ.
所述惠斯通电桥接在电阻层电阻两端,惠斯通电桥另外两个端子接恒定外电压,电压源电压为5伏特;所述正弦光动量激励作用在纳米梁上、下表面,光子运动动量驱动纳米梁的振动,纳米梁振动时与纳米梁电阻层电阻阻值发生变化,电阻变化引起惠斯通电桥电路中电流信号发生变化,检测电流信号的变化,可以检测纳米梁的振动频率。The Wheatstone bridge is connected to both ends of the resistance layer resistance, the other two terminals of the Wheatstone bridge are connected to a constant external voltage, and the voltage source voltage is 5 volts; the sinusoidal light momentum excitation acts on the upper and lower surfaces of the nanobeam, and the photon moves Momentum drives the vibration of the nanobeam. When the nanobeam vibrates, the resistance value of the resistive layer of the nanobeam changes. The resistance change causes the current signal in the Wheatstone bridge circuit to change. By detecting the change of the current signal, the vibration frequency of the nanobeam can be detected.
纳米梁在交变光动量激励作用下产生受迫振动,粘贴于纳米梁根部的电阻层电阻阻值发生变化,利用惠斯通电桥电路可以将该信号输出,经信号放大器放大后,可以进行频谱分析,得到振动时域和频域振动信息图像,得到振动幅值和振动频率等振动参数。改变光动量激励发生装置驱动电机转速,光动量激励频率随着发生变化,纳米梁共振时,输出电流信号值最大,测量电压变化峰值可以检测纳米梁的共振振动频率,通过计算得到纳米梁末端粘附的附加质量的大小,达到测量纳微颗粒质量的目的。The nanobeams are forced to vibrate under the excitation of alternating light momentum, and the resistance value of the resistance layer pasted on the root of the nanobeams changes. The Wheatstone bridge circuit can be used to output the signal, and after being amplified by the signal amplifier, the frequency spectrum can be obtained. Through the analysis, the vibration time domain and frequency domain vibration information images are obtained, and vibration parameters such as vibration amplitude and vibration frequency are obtained. Changing the rotational speed of the drive motor of the photomomentum excitation generating device, the photomomentum excitation frequency changes accordingly. When the nanobeam resonates, the output current signal value is the largest, and the resonance vibration frequency of the nanobeam can be detected by measuring the peak value of the voltage change. Through calculation, the viscosity at the end of the nanobeam is obtained. The size of the attached additional mass achieves the purpose of measuring the mass of nanoparticles.
单色光垂直照射于纳米梁的上表面,光辐射通过通光孔产生的光动量激励力为式中,P为穿过通光孔的入射光的功率,α为入射光的作用力效率,n为周围介质的折射率,c为光速,k为圆盘上通光孔个数,ω为圆盘转速。Monochromatic light is irradiated vertically on the upper surface of the nanobeam, and the light momentum excitation force generated by the light radiation passing through the aperture is In the formula, P is the power of the incident light passing through the light hole, α is the force efficiency of the incident light, n is the refractive index of the surrounding medium, c is the speed of light, k is the number of light holes on the disk, and ω is Disc speed.
纳米梁发生共振时,测量得到共振时圆盘转速ω数值,纳微颗粒的质量为其中,ρ为纳米梁的线密度,E为纳米梁的弹性模量,l为纳米梁的长度,b纳米梁的宽度,h为纳米梁的高度。When the nano-beam resonates, the value of the disk speed ω at the time of resonance is measured, and the mass of the nano-particles is in, ρ is the linear density of the nanobeam, E is the modulus of elasticity of the nanobeam, l is the length of the nanobeam, b is the width of the nanobeam, and h is the height of the nanobeam.
本发明与现有技术相比具有如下优点:Compared with the prior art, the present invention has the following advantages:
1.光动量驱动是一种无接触驱动方法,不会产生机械式噪声,测量干扰因素少,测量灵敏度高。1. Light momentum driving is a non-contact driving method, which does not generate mechanical noise, has fewer measurement interference factors, and has high measurement sensitivity.
2.双盘透光装置能产生类似正弦分布光动量激励,激励纳米梁振动,进行扫频测量。2. The double-disk light-transmitting device can generate light momentum excitation similar to a sinusoidal distribution, excite the vibration of the nano-beam, and perform frequency-sweeping measurement.
附图说明Description of drawings
图1纳米梁纳微颗粒检测装置;Figure 1 Nano-beam nano-particle detection device;
图2通光盘光动量激励开关图;Fig. 2 optical momentum excitation switch diagram through the optical disk;
图3光动量激励演示示意图。Fig. 3 Schematic diagram of photomomentum excitation demonstration.
图中,1、固定端 2、上轴承 3、上圆盘 4、下圆盘 5、纳微颗粒 6、下激光器 7、轴8、驱动电动机 9、下轴承 10、单色光 11、底座 12、纳米梁 13、电阻层电阻 14、惠斯通电桥15、电压源 16、信号放大器 17、上激光器 18、通光孔 19、光动量激励In the figure, 1, fixed end 2, upper bearing 3, upper disk 4, lower disk 5, nanoparticle 6, lower laser 7, shaft 8, drive motor 9, lower bearing 10, monochromatic light 11, base 12 , nanobeam 13, resistive layer resistance 14, Wheatstone bridge 15, voltage source 16, signal amplifier 17, upper laser 18, optical hole 19, light momentum excitation
具体实施方式detailed description
以下结合附图做作进一步详述:Below in conjunction with accompanying drawing, make further detailed description:
本实施例的主体结构包括类正弦光动量激励19发生装置和微质量检测装置。所述光动量激励19发生装置由两个固定在同一个轴7上的上圆盘3、下圆盘4、上激光器17、下激光器6、轴7、上轴承2、下轴承9、驱动电动机8和固定端1组成,轴7的上端和下端分别安装一个轴承,轴7下端铰接一个驱动电动机8,驱动电动机8带动轴7旋转;上圆盘3和下圆盘4半径均为12mm,上圆盘3和下圆盘4盘面沿着距离轴心等距离开等面积正方形的通光孔18,正方形的通光孔18边长为5μm,边长远大于光的波长,以半径为10mm的圆周线为中心线布置,相邻两通光孔18间距离相等,相邻两个通光孔18间距离为通光孔18宽度的四倍,上圆盘和下圆盘相邻两通光孔间距离为通光孔宽度的两倍。上激光器17和下激光器6固定在底座11上,当上激光器17和下激光器6的单色光10分别照射通光孔18,驱动电动机8带动轴7旋转,可以产生类似正弦分布光动量激励19,激励纳米梁振动。The main structure of this embodiment includes a sinusoidal light momentum excitation 19 generating device and a micro-mass detection device. The photomomentum excitation 19 generating device consists of two upper discs 3, lower discs 4, upper laser 17, lower laser 6, shaft 7, upper bearing 2, lower bearing 9, and drive motor fixed on the same shaft 7. 8 and the fixed end 1, the upper end and the lower end of the shaft 7 are respectively equipped with a bearing, the lower end of the shaft 7 is hinged with a drive motor 8, and the drive motor 8 drives the shaft 7 to rotate; the radius of the upper disc 3 and the lower disc 4 are both 12mm, and the upper Disc 3 and lower disc 4 have square light holes 18 of equal area along the same distance from the axis. The side length of square light hole 18 is 5 μm, and the side length is much longer than the wavelength of light. A circle with a radius of 10 mm The line is the center line, the distance between two adjacent light holes 18 is equal, the distance between two adjacent light holes 18 is four times the width of the light hole 18, and the upper disc and the lower disc are adjacent to each other. The distance between them is twice the width of the clear aperture. The upper laser 17 and the lower laser 6 are fixed on the base 11. When the monochromatic light 10 of the upper laser 17 and the lower laser 6 illuminates the light hole 18 respectively, the drive motor 8 drives the shaft 7 to rotate, which can generate light momentum excitation 19 similar to a sinusoidal distribution. , to excite the nanobeams to vibrate.
所述微质量检测装置由纳米梁12、电阻层电阻13、惠斯通电桥14和需要测量的纳微颗粒5组成。所述纳米梁12一端固定,另一端自由,纳米梁12用硅单晶材料制作,长度、宽度和高度分别为40μm、5μm和0.8μm,纳米梁12宽度小于正方形通光孔18的边长,被测量纳微颗粒5安放在纳米梁12末端,正弦光激励作用于纳米梁12离末端四分之一处附近。The micro-mass detection device is composed of a nano-beam 12, a resistance layer resistance 13, a Wheatstone bridge 14 and nano-micro particles 5 to be measured. One end of the nanobeam 12 is fixed and the other end is free. The nanobeam 12 is made of silicon single crystal material, and its length, width and height are 40 μm, 5 μm and 0.8 μm respectively. The width of the nanobeam 12 is smaller than the side length of the square light hole 18, The nanoparticle 5 to be measured is placed at the end of the nanobeam 12, and the sinusoidal light excitation acts on the quarter of the nanobeam 12 from the end.
所述纳米梁12上层靠近固定端部分通过氩离子溅射,形成一薄层电阻层电阻13,氩离子溅射深度10-50nm,该电阻层电阻值随着纳米梁12的变形而发生变化,电阻层长度变长时,电阻变大,相反则变小,电阻层电阻13初始电阻15kΩ,惠斯通电桥14其它电阻均为15kΩ。The upper layer of the nano-beam 12 near the fixed end is sputtered by argon ions to form a thin-layer resistance layer resistance 13, the depth of argon ion sputtering is 10-50nm, and the resistance value of the resistance layer changes with the deformation of the nano-beam 12, When the length of the resistance layer becomes longer, the resistance becomes larger, and on the contrary, it becomes smaller. The initial resistance of the resistance layer resistance 13 is 15kΩ, and the other resistances of the Wheatstone bridge 14 are all 15kΩ.
所述惠斯通电桥14接在电阻层电阻13两端,惠斯通电桥14另外两个端子接恒定外电压,电压源15电压为5伏特;所述正弦光动量激励19作用在纳米梁12上、下表面,光子运动动量驱动纳米梁12的振动,纳米梁12振动时与纳米梁电阻层电阻13阻值发生变化,电阻变化引起惠斯通电桥14电路中电流信号发生变化,检测电流信号的变化,可以检测纳米梁12的振动频率。The Wheatstone bridge 14 is connected to both ends of the resistance layer resistor 13, the other two terminals of the Wheatstone bridge 14 are connected to a constant external voltage, and the voltage of the voltage source 15 is 5 volts; the sinusoidal light momentum excitation 19 acts on the nanobeam 12 On the upper and lower surfaces, the photon movement momentum drives the vibration of the nanobeam 12. When the nanobeam 12 vibrates, the resistance value of the resistance layer 13 of the nanobeam changes. The resistance change causes the current signal in the Wheatstone bridge 14 circuit to change, and the current signal is detected. The change of the vibration frequency of the nanobeam 12 can be detected.
纳米梁12在交变光动量激励19作用下产生受迫振动,粘贴于纳米梁12根部的电阻层电阻13阻值发生变化,利用惠斯通电桥14电路可以将该信号输出,经信号放大器16放大后,可以进行频谱分析,得到振动时域和频域振动信息图像,得到振动幅值和振动频率等振动参数。改变光动量激励19发生装置驱动电机8转速,光激励频率随着发生变化,纳米梁12共振时,输出电流信号值最大,测量电压变化峰值可以检测纳米梁12的共振振动频率,通过计算得到纳米梁12末端粘附的附加质量的大小,达到测量分子质量的目的。The nanobeam 12 is forced to vibrate under the action of the alternating light momentum excitation 19, and the resistance value of the resistance layer resistance 13 pasted on the root of the nanobeam 12 changes, and the signal can be output by using the Wheatstone bridge 14 circuit, and the signal is passed through the signal amplifier 16 After zooming in, spectrum analysis can be performed to obtain vibration time domain and frequency domain vibration information images, and vibration parameters such as vibration amplitude and vibration frequency. Change the light momentum excitation 19 generating device to drive the motor 8 speed, and the light excitation frequency changes accordingly. When the nanobeam 12 resonates, the output current signal value is the largest, and the resonance vibration frequency of the nanobeam 12 can be detected by measuring the peak value of the voltage change, and the nanometer beam 12 can be obtained by calculation. The size of the additional mass attached to the end of the beam 12 achieves the purpose of measuring the molecular mass.
单色光垂直照射于纳米梁12的上表面,光辐射通过通光孔18产生的光动量激励力为式中,P为穿过通光孔18的入射光的功率,α为入射光的作用力效率,n为周围介质的折射率,c为光速,k为圆盘上通光孔个数,ω为圆盘转速。The monochromatic light is vertically irradiated on the upper surface of the nanobeam 12, and the light momentum excitation force generated by the light radiation passing through the light hole 18 is In the formula, P is the power of the incident light passing through the light hole 18, α is the force efficiency of the incident light, n is the refractive index of the surrounding medium, c is the speed of light, k is the number of light holes on the disk, ω is the rotation speed of the disc.
纳米梁12发生共振时,测量得到共振时圆盘转速ω数值,纳微颗粒的质量为其中,ρ为纳米梁12的线密度,E为纳米梁12的弹性模量,l为纳米梁12的长度,b纳米梁12的宽度,h为纳米梁12的高度。When the nano-beam 12 resonates, the disc speed ω value is measured when the resonance is obtained, and the quality of the nano-particles is in, ρ is the linear density of the nanobeam 12, E is the modulus of elasticity of the nanobeam 12, l is the length of the nanobeam 12, b is the width of the nanobeam 12, and h is the height of the nanobeam 12.
实例1:单色光垂直照射于纳米梁12的上表面,穿过通光孔18的入射光的功率P为1×10-6w,入射光的作用力效率α为0.8,周围介质的折射率n为1,光速c为3×108m/s,圆盘上通光孔个数k为1256,纳米梁12的线密度为9.32×10-9kg/m,纳米梁12的弹性模量E为170GPa,纳米梁12的长度l为40μm,纳米梁12的宽度b为5μm,纳米梁12的高度为h为0.8μm。光辐射通过通光孔18产生的光动量激励力幅值为2.0×10-3nN。Example 1: Monochromatic light is irradiated vertically on the upper surface of the nanobeam 12, the power P of the incident light passing through the light hole 18 is 1×10 -6 w, the force efficiency α of the incident light is 0.8, and the refraction of the surrounding medium The rate n is 1, the speed of light c is 3×10 8 m/s, the number k of light holes on the disk is 1256, the linear density of the nanobeam 12 is 9.32×10 -9 kg/m, and the elastic mode of the nanobeam 12 is The volume E is 170 GPa, the length l of the nanobeam 12 is 40 μm, the width b of the nanobeam 12 is 5 μm, and the height h of the nanobeam 12 is 0.8 μm. The amplitude of the excitation force generated by the light momentum generated by the light radiation passing through the aperture 18 is 2.0×10 −3 nN.
纳米梁12发生共振时,测量得到共振时圆盘转速为1700转每秒,纳微颗粒5的质量为2.7358×10-15kg。When the nanobeam 12 resonates, it is measured that the rotation speed of the disk is 1700 revolutions per second, and the mass of the nanoparticle 5 is 2.7358×10 −15 kg.
以上所述仅为本发明的较佳实施例而已,并非用于限定本发明的保护范围。凡在本发明的精神和原则之内,所作的任何修改、等同替换以及改进,均应包含在本发明所述的保护范围之内。The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the protection scope of the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention shall be included within the protection scope of the present invention.
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