CN106504797A - The automatic mode of RAID IO LED lamps in test memory - Google Patents

The automatic mode of RAID IO LED lamps in test memory Download PDF

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Publication number
CN106504797A
CN106504797A CN201610883379.4A CN201610883379A CN106504797A CN 106504797 A CN106504797 A CN 106504797A CN 201610883379 A CN201610883379 A CN 201610883379A CN 106504797 A CN106504797 A CN 106504797A
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CN
China
Prior art keywords
test
memory
led
raid
automatic mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610883379.4A
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Chinese (zh)
Inventor
戈文龙
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Zhengzhou Yunhai Information Technology Co Ltd
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Zhengzhou Yunhai Information Technology Co Ltd
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Priority to CN201610883379.4A priority Critical patent/CN106504797A/en
Publication of CN106504797A publication Critical patent/CN106504797A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56004Pattern generation
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C29/56016Apparatus features
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G11C2029/5606Error catch memory

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  • Debugging And Monitoring (AREA)

Abstract

The automatic mode of RAID IO LED lamps in open test memory of the present invention, it is related to memory test technology, the automatized script that is write using perl language under linux, light on and off and the flashing state for assigning instruction control LED to IO by IO serial ports, carries out the led functional tests of RAID IO.The present invention reduces unnecessary interactive process, test operation is simple and convenient, high-volume can also test simultaneously, save the resources such as test manpower, time, cost, improve testing efficiency and accuracy, there is high test coverage, any defective product can all be blocked and be accurately positioned problem, it is ensured that product turnout quality again.

Description

The automatic mode of RAID IO LED lamps in test memory
Technical field
The present invention relates to memory test technology, specifically in test memory, RAID IO LED lamps is automatic Change method.
Background technology
Memory(Memory)It is to be used for protecting stored memory device in modern information technologies.Its concept is very wide, has very At many levels, in digital display circuit, as long as can preserve binary data can be memory;In integrated circuits, one does not have The circuit with store function for having physical form is also memory, such as RAM, FIFO etc.;In systems, with physical form Storage device is also memory, such as memory bar, TF cards etc..Full detail in computer, the initial data, computer including input Program, middle operation result and final operation result are all preserved in memory.It is stored according to the position that controller is specified and Taking-up information.There are memory, computer just to have memory function, just can guarantee that normal work.Memory in computer is by use Way memory can be divided into main storage(Internal memory)And additional storage(External memory).
Now with the continuous development of IT field technology, main flow product of the memory as the big data epoch, also with relating to Sufficient field is gradually increased, and market accessor demand gradually increases.Company's memory shipment amount is increasing, can be on time The punctual shipment of production deploying is reached, the prestige for being not only related to company also represents the production capacity of a company, while also affecting The satisfaction of client.Enterprise focuses on also requiring that quality is secure while speed of production, for the test of research and development and production will Seek more and more higher.The either research and development section or test of production line, the test of product can be efficiently completed it is critical that One link.
At present to when RAID IO LED functions are tested in most of memories, needing a large amount of manual operations to participate in Come in, this error caused due to human factor just inevitably occurs, cause test inaccurate, it is impossible to produce problem in time Product are intercepted so as to affecting whole product quality.Meanwhile, a large amount of manual testings operation causes that testing efficiency is high, test is covered Lid rate is relatively low, does not reach the requirement of product test efficiency and effect.Therefore, it is badly in need of RAID IO in a kind of test memory of exploitation The automatic mode of LED lamp, improves testing efficiency and test coverage.
Content of the invention
Demand and weak point of the present invention for the development of current technology, there is provided RAID IO LED lamps in test memory Automatic mode.
The automatic mode of RAID IO LED lamps in test memory of the present invention, solves above-mentioned technical problem and adopts Technical scheme as follows:The automatic mode of RAID IO LED lamps in the test memory, using perl language under linux The automatized script that writes, light on and off and the flashing state for assigning instruction control LED to IO by IO serial ports, carries out RAID IO Led functional tests.
Preferably, the IO serial ports of memory is connected to from server end using a Serial Port Line;Server end installs institute State automatized script.
Preferably, automatized script is executed under Linux system, and first in scanning memory, the sequence number of I/O, judges I/O Type automatically loading I/O drivings;Then, hardware detection, automated log on IO serial ports are carried out;Finally, test LED is lighted, and is surveyed Examination LED is extinguished, and completes LED flicker tests.
Preferably, each testing procedure has test log to produce, and test log is printed upon terminal, while being also stored in Server end.
What in test memory of the present invention, the automatic mode of RAID IO LED lamps had compared with prior art has Beneficial effect is:The present invention writes automatized script by perl language, and the LED function for IO is tested, whole process All it is to be executed by automatized script, reduces unnecessary interactive process, test operation is simple and convenient, it is also possible to while big Batch testing, saves test manpower, time, the resource such as cost, simple to operate also can complete associative operation without the need for experience, improve Testing efficiency and accuracy, but with high test coverage, any defective product can all be blocked and be accurately positioned Problem, it is ensured that product turnout quality;Preservation is printed to testing log simultaneously, allows test to have absolute guarantee.
Description of the drawings
Flow chart of the accompanying drawing 1 for the automatic mode of RAID IO LED lamps in the test memory.
Specific embodiment
For making the object, technical solutions and advantages of the present invention become more apparent, below in conjunction with specific embodiment, to this In the bright test memory, the automatic mode of RAID IO LED lamps is further described.
Embodiment:
In test memory described in the present embodiment, the automatic mode of RAID IO LED lamps, is compiled using perl language under linux The automatized script that writes, light on and off and the flashing state for assigning instruction control LED to IO by IO serial ports, carries out RAID IO's Led functional tests;And the test log that will be produced(Daily record)Terminal is printed upon, while also preserving on the server, allows test to have absolutely To guarantee.
The automatic mode of RAID IO LED lamps in test memory described in the present embodiment, as shown in Figure 1, which is concrete Implementation process is as follows:
1st, test environment is built:The IO serial ports that memory is connected to from server end using a Serial Port Line;Server end is installed The automatized script of good test(Carry USB flash disk mount/dev/sdb4/mnt;Replicating can cp/mnt/led/usr/ local/bin/Neptune/);
2nd, automatized script is executed under Linux system(Plus execute authority chmod+x led;Execute order ./led);
3rd, in scanning memory I/O sequence number, test log and can write on automatically in the file that is named with the time, path can be with Oneself is specified by configuration file;Automatized script interrupts log and terminates automatically;
print "Please scan uiom sn[]: ";
chomp($uiom_sn=<STDIN>);
my $output_filename = "20160806portchk_led_res.log";
4th, judge I/O types and loading I/O drives automatically, loading successfully test and continuing, loading unsuccessfully prints error, processes different Automatized script is re-executed after often;
sub load_driver;
If ($ fc) { `modprobe mptfc` } -- the I/O of FC types
If ($ sas) { `modprobe mptsas` } --- the I/O of SAS types;
5th, hardware detection, automatized script capture the connection status of information, automatic decision server and memory by SAS lines, And the state in place of modules(Including HDD, SAS line connection status, the state of IO), if modules are in good condition certainly Dynamicization script is continued to run with, if judging, memory end and server end have exception, is reported an error " test fail " in terminal, with When print error information, continue to retest after queueing problem;
sub get_device
my ($encl) = @_;
my @sg_map = `sg_map -x -i`;
The IP of upper and lower I/O is set;I/O is restarted after success under setting system;
6th, automated log on IO serial ports;
Step on serial ports:
@MCports = ();
@FUports = ();
for (1..$expectedUUTs) {
my $slot = $_;
for (A,B) {
my $ctrl = $_;
my $mc = getConfig("uut$slot.ctrltest.ctrl$ctrl.com2");
my $fu = getConfig("uut$slot.ctrl$ctrl.fu");
push @MCports, $mc;
push @FUports, $fu;
7th, test LED is lighted(All colours are lighted successively), proceed by if if test;In terminal if test crash Report an error " test fail ", while printing error information, continues to retest after queueing problem;
8th, test LED is extinguished(All colours extinguish successively), proceed by if if test, in terminal if test crash Report an error " test fail ", while printing error information, continues to retest after queueing problem;
9th, LED flickers test, tests pass end print test pass by if if test, and test terminates;If test crash Report an error " test fail " in terminal, while printing error information, continue to retest after queueing problem;
Led lamp inspections are surveyed:
if ( $LED_check eq "y" || $LED_check eq "Y" ) {
print("\n PASS !!!\n\n");
$ctrl_PF[$ctrl] = "PASS";
# exit special debug interface
for ( $loop = 0 ; $loop <= 1 ; $loop++ ){
if ( $loop == 0 ) { $ctrl = "a" ; $mc = $mc_a ; $sc = $sc_a }
if ( $loop == 1 ) { $ctrl = "b" ; $mc = $mc_b ; $sc = $sc_b }
$CS::COMPORT = "/dev/tty" . $sc ;
$COMPORT = "/dev/tty" . $sc ;
$CMD = serial( "q", ">" );
sleep 1 ;
$CMD = serial( "q", ">" );
sleep 1 ;
}.
In test memory described in the present embodiment, the automatic mode of RAID IO LED lamps, tests used automation Script is as follows:
if ( $LED_check eq "y" || $LED_check eq "Y" ) {
print("\n PASS !!!\n\n");
$ctrl_PF[$ctrl] = "PASS";
# exit special debug interface
for ( $loop = 0 ; $loop <= 1 ; $loop++ ){
if ( $loop == 0 ) { $ctrl = "a" ; $mc = $mc_a ; $sc = $sc_a }
if ( $loop == 1 ) { $ctrl = "b" ; $mc = $mc_b ; $sc = $sc_b }
$CS::COMPORT = "/dev/tty" . $sc ;
$COMPORT = "/dev/tty" . $sc ;
$CMD = serial( "q", ">" );
sleep 1 ;
$CMD = serial( "q", ">" );
sleep 1 ;
}
}
else {
$ctrl = "a" ; $mc = $mc_a ; $sc = $sc_a ;
$LED_check = CS::get_yorn("\nAre controller $ctrl status LEDs lit?");
if ( $LED_check eq "y" || $LED_check eq "Y" ) {
print"\n PASS $ctrl !!! \n";
$ctrl_PF[$ctrl] = "PASS";
$CS::COMPORT = "/dev/tty" . $sc ;
$COMPORT = "/dev/tty" . $sc ;
$CMD = serial( "q", ">" );
sleep 1 ;
#LED lamp tests
sub load_driver {
#fill something
if($fc) {`modprobe mptfc`}
if($sas){`modprobe mptsas`}
@lsmod_out=`lsmod | grep mptsas`;
until(@lsmod_out) {
printout("both","SAS driver not loaded\n");
printout("both","loading SAS driver...\n");
system("modprobe mptsas");
sleep 5;
@lsmod_out=`lsmod | grep mptsas`;
}
# loads the driving of IO
$CS::failSub=\&serialWarn;
$tmpUUTs=0;
$CS::no_close = 0;
# calls packet, enters serial ports.
It can be seen that, the present invention is under linux to test RAID IO LED lamp functions in memory, carries out memory I O SAS Port bandwidth test, can simultaneously large batch of test, and have test log to produce in each testing procedure, be easy to ask Topic analysis and positioning, all processes automation are carried out, and testing efficiency is high, and test accuracy is high, it can be ensured that product quality;Avoid The mistake that is likely to occur during artificial configuration testing, leakage etc., easy to operate, practicality is stronger.
Above-mentioned specific embodiment be only the present invention concrete case, the present invention scope of patent protection include but is not limited to Above-mentioned specific embodiment, any person of an ordinary skill in the technical field that meet claims of the present invention and any The appropriate change or replacement done by which, should all fall into the scope of patent protection of the present invention.

Claims (4)

1. the automatic mode of RAID IO LED lamps in memory is tested, it is characterised in that using perl language under linux The automatized script that writes, light on and off and the flashing state for assigning instruction control LED to IO by IO serial ports, carries out RAID IO Led functional tests.
2. the automatic mode of RAID IO LED lamps in memory is tested according to claim 1, it is characterised in that used A piece Serial Port Line is connected to the IO serial ports of memory from server end;Server end installs the automatized script.
3. the automatic mode of RAID IO LED lamps in memory is tested according to claim 2, it is characterised in that Automatized script is executed under Linux system, and first in scanning memory, the sequence number of I/O, judges I/O types and load automatically I/ O drives;Then, hardware detection, automated log on IO serial ports are carried out;Finally, test LED is lighted, and test LED is extinguished, and completes LED flicker tests.
4. the automatic mode of RAID IO LED lamps in memory is tested according to claim 3, it is characterised in that each Testing procedure has test log to produce, and test log is printed upon terminal, while being also stored in server end.
CN201610883379.4A 2016-10-10 2016-10-10 The automatic mode of RAID IO LED lamps in test memory Pending CN106504797A (en)

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Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107145415A (en) * 2017-05-05 2017-09-08 郑州云海信息技术有限公司 A kind of method of the batch testing HDD LED under Linux system
CN107423177A (en) * 2017-06-30 2017-12-01 郑州云海信息技术有限公司 The method of testing and device of a kind of SAS link
CN107480021A (en) * 2017-08-18 2017-12-15 郑州云海信息技术有限公司 A kind of method and system based on test Expander backboard hard disk indication lamps under linux system
CN109586977A (en) * 2018-12-27 2019-04-05 郑州云海信息技术有限公司 Automatically the method for network interface positioning lamp is lighted and extinguished under a kind of Linux system

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US6313655B1 (en) * 1997-08-14 2001-11-06 Infineon Technologies Ag Semiconductor component and method for testing and operating a semiconductor component
CN1854742A (en) * 2005-04-21 2006-11-01 鸿富锦精密工业(深圳)有限公司 System and method for testing light-emitting diodes light and its tie wire of computer panel
CN101727989B (en) * 2008-10-16 2013-11-27 杭州华澜微科技有限公司 NAND FLASH memory chip test system
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107145415A (en) * 2017-05-05 2017-09-08 郑州云海信息技术有限公司 A kind of method of the batch testing HDD LED under Linux system
CN107423177A (en) * 2017-06-30 2017-12-01 郑州云海信息技术有限公司 The method of testing and device of a kind of SAS link
CN107480021A (en) * 2017-08-18 2017-12-15 郑州云海信息技术有限公司 A kind of method and system based on test Expander backboard hard disk indication lamps under linux system
CN109586977A (en) * 2018-12-27 2019-04-05 郑州云海信息技术有限公司 Automatically the method for network interface positioning lamp is lighted and extinguished under a kind of Linux system

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Application publication date: 20170315

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