CN106503285B - A kind of circuit irradiation effect modeling method based on VHDL-AMS - Google Patents
A kind of circuit irradiation effect modeling method based on VHDL-AMS Download PDFInfo
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- G06F30/36—Circuit design at the analogue level
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Abstract
The modeling method for the circuit irradiation effect based on VHDL-AMS that the invention discloses a kind of reacts variation of the electronic device by electrical characteristics after irradiation effect in circuit by injecting different irradiation doses；Behavioral scaling modeling is carried out to power supply apparatus using equivalent circuit, the behavior of complicated circuit is abstracted into the circuit formed with the primary element of resistance, capacitor and controlled source；It is emulated using VHDL-AMS language description, carries out the hybrid modeling of digital and analog circuit.The present invention carries out the hybrid modeling of digital and analog circuit, can react and describe the concrete property of electric current and voltage in circuit；Behavioral scaling models the difficulty for substantially reducing artificial circuit, carries out fast verification in a short time；The influence to electronic device is irradiated, is characterized by way of electrical characteristics, it is intuitive easy；Using the modeling method of black-box model, the insufficient defect of device behavioral trait information is avoided；The use of numerical model analysis modeling language keeps simulation process easy and more perfect.
Description
Technical field
The invention belongs to power supply apparatus modeling technique field more particularly to a kind of circuit irradiation effects based on VHDL-AMS
Modeling method.
Background technique
In the case where irradiating various dose, electronic device is influenced the change for leading to its electrical characteristics by ionising radiation,
Showed by the voltage and current variation in circuit.In system-level modeling, the manufacturer of power supply apparatus can't be mentioned
For internal circuit configuration.In this case, the databook of product is also only to provide the general specification of practical application, if it is desired to
Power supply class behavior characteristic is modeled, production firm can't provide internal circuit configuration, will not provide the white of power supply class device
BOX Model can not obtain enough information from databook.And there is no the simulation models of irradiation effect at present.
Summary of the invention
The circuit irradiation effect modeling method based on VHDL-AMS that the purpose of the present invention is to provide a kind of, it is intended to solve spoke
The problem of according to circuit behavior characteristic model is established by emulation under environment.
The invention is realized in this way a kind of modeling method of the circuit irradiation effect based on VHDL-AMS, described to be based on
VHDL-AMS irradiate model modeling method due to the relationship of nuclear radiation environment and electronic technology it is more and more closer, integrated circuit
Characteristic size constantly reduces, and radiation damage effects are more significant, in order to improve electronic component Antiradiation ability, to electricity
It is imperative that road device carries out computer simulation under radiation environment, by irradiating different dosage, reaction electronic device by
The variation of electrical characteristics after to irradiation effect, i.e., the variation of Current Voltage in circuit；It is gone using equivalent circuit to power supply apparatus
For grade modeling, the behavior of complicated circuit is abstracted into the circuit formed with the primary element of resistance, capacitor and controlled source, is simplified
Circuit model reduces the complexity of circuit, under the premise of reaching circuit effect same, improves simulation efficiency；Use VHDL-
AMS Language Modeling carries out the hybrid modeling of digital and analog circuit, and advantage is to can be widely applied for mixed signal circuit,
In simulation and the description of mixed signal, the final language level description for realizing analog circuit and Digital Analog Hybrid Circuits, emulation and comprehensive
It closes, preferably supports top-down design philosophy, and library function is more comprehensive.
Further, irradiation is added, input terminal is carried out respectively at different dosages to the irradiation of power supply injection various dose
Step experiment and the experiment of output end step；It collects under various dose, input voltage, output voltage, exports electric current at input current
Sampled value.
Further, input voltage, input current, output voltage, export electric current sampled value design method include:
Preliminary test: in estimation two-port network inputs admittance Yi, inverse current gain Hi, forward voltage gain GoWith it is defeated
Impedance Z outoBefore the transmission function of four parameters, according to formula Kirchhoff's second law and Kirchhoff's current law (KCL) to upper
It states two-port network and carries out circuit analysis, obtain about input voltage Vi, input current Ii, output voltage VoWith output electric current Io
Relational expression such as (1) (2)；Each parameter is analyzed for the independence of input voltage and output electric current or linear；Test result
Be it is linear, black-box model use formula (3)-(6)；Nonlinear parameter, using including several small signal-wire time-invariant models
Polyhedral structure replace the transmission function of parameter；
Ii=YiVi+HiIo (1)
Vo=GoVi-ZoIo (2)
As Δ IoWhen=0,
As Δ IoWhen=0,
As Δ ViWhen=0,
As Δ ViWhen=0,
Further, for different electronic device characteristics, in the autoregression model (ARX) that band is outer plus inputs, with additional defeated
The autoregressive moving-average model (ARMAX) entered, output error models (OE) select estimation in Box-Jenkins (BJ) model
Model；And the quantity of the multinomial order of the model structure, time delay is set；
According to the Approach For Identification of Model Structure model transfer function parameter of selection；
The transmission function of model is subjected to Laplace transform, discrete system transmission function is converted to the biography of continuous system
Delivery function；
The validity and adaptability of testing model；The amplitude-frequency characteristic for comparing various dose drag obtains Bode figure, assessment
Influence situation of the dosage difference to model.
Further, the model emulation is described using VHDL-AMS language, and obtains electrical characteristics curve, i.e., input voltage,
Input current, output voltage, the curve graph for exporting electric current；Influence of the irradiation to electrical characteristics under various dose is summarized in observation.
Another object of the present invention is to provide a kind of modelings using the circuit irradiation effect based on VHDL-AMS
The two-port network model, such as power supply apparatus model etc. with single-input single-output that method is established.
Provided by the invention to be described using VHDL-AMS Language Simulation, the mixing that can carry out digital and analog circuit is built
Mould can react and describe the concrete property of electric current and voltage in circuit.Wherein, the behavior of numerical portion is retouched with concurrent statement
It states, the behavior of model part is described with simultaneous sentence, and the two combines the behavior or structure of one design of description；Behavioral scaling is built
Mould is a kind of thought for effectively improving breadboardin and verifying speed, by describing relatively simple equivalent model come generation
It is described for original large-scale complicated circuit, the difficulty of solving circuit is substantially reduced, thus in a short time to the function of circuit
Fast verification is carried out with performance, so that the design scheme to circuit is improved in time.Behavioral scaling modeling is carried out to power supply apparatus,
Using equivalent circuit method, equivalent circuit method is that the behavior of a complicated circuit is abstracted into resistance, capacitor and controlled source
The circuit of equal primary elements composition；The influence to electronic device is irradiated, is characterized by way of electrical characteristics, it is intuitive easy；
Using the modeling method of black-box model, the insufficient defect of device behavioral trait information is avoided；The use of numerical model analysis modeling language,
Keep simulation process easy and more perfect, makes it easy to obtain the influence irradiated to power supply class model electrical characteristics.
Detailed description of the invention
Fig. 1 is the modeling method provided in an embodiment of the present invention based on VHDL-AMS irradiation model
Fig. 2 is the flow chart of embodiment 1 provided in an embodiment of the present invention.
Fig. 3 is the basic circuit schematic diagram of power source model provided in an embodiment of the present invention.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to embodiments, to the present invention
It is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not used to
Limit the present invention.
At different dosages, influence of the irradiation effect to electronic device leads to circuital current voltage change；Establish power supply class
The black-box model of model recognizes the black-box model transmission function under various dose；Use VHDL-AMS numerical model analysis simulation modeling
Language builds power source model, embodies influence of the irradiation effect to power supply.
Application principle of the invention is explained in detail with reference to the accompanying drawing.
As shown in Figure 1, the modeling method of the circuit irradiation effect provided in an embodiment of the present invention based on VHDL-AMS includes
Following steps:
S101: being added irradiation, gradually increases irradiation since irradiation dose is 0 to the irradiation of power supply injection various dose
Dosage compare experiment；
S102: data acquisition obtains pumping signal and training data；At different dosages, input terminal step is carried out respectively
Experiment and the experiment of output end step；It collects under various dose, input voltage, input current, output voltage, the sampling for exporting electric current
Value；
S103: data prediction, the data for identification are needed by data processing, this processing claims before identification
For data prediction；Inputoutput data usually all contains flip-flop or radio-frequency component, or since data use not same amount
Guiding principle may cause the identification result of mistake.Therefore, to be affected by these factors recognized model not, it is necessary to data
It is pre-processed, to improve the precision of identification and the availability of identification model.Preprocessing process is carried out to collected data, i.e.,
Go mean value and resampling.Mean value is gone to remove the interference of big signal；Resampling filters high fdrequency component；
S104: the selection of model structure；For different device properties, add the autoregression model (ARX) of input outside in band,
Autoregressive moving-average model (ARMAX) with additional input, output error models (OE), in Box-Jenkins (BJ) model
The suitable estimation model of selection.And the parameter value of the model structure is set, such as quantity of polynomial order, time delay；
S105: model parameter estimation, according to the Approach For Identification of Model Structure model transfer function parameter of selection；
S106: the transmission function of model is carried out Laplace transform, by discrete system transmission function by translation of transfer function
Be converted to the transmission function of continuous system；
S107: model evaluation, the validity and adaptability of testing model；The amplitude-frequency characteristic of various dose drag is compared,
Bode figure is obtained, influence situation of the dosage difference to model is assessed；
S108: simulation modeling describes the model emulation using VHDL-AMS language, and obtains electrical characteristics curve, i.e., defeated
Enter voltage, input current, output voltage, the curve graph for exporting electric current；The shadow irradiated under various dose to electrical characteristics is summarized in observation
It rings.
Application principle of the invention is further described combined with specific embodiments below.
Embodiment 1；
The modeling method of circuit irradiation effect provided in an embodiment of the present invention based on VHDL-AMS specifically includes following step
It is rapid:
(1) irradiation effect is injected
Since irradiation dose is 0, irradiation dose is gradually increased to the power unit in experimental circuit, observes various dose
The variation of lower circuit electrical characteristics.It is respectively 0Gy, 1000Gy, 2000Gy, 3000Gy, 5000Gy to power supply apparatus with irradiation dose
It is irradiated.The variation that electrical characteristics are acquired under different irradiation doses, carries out subsequent experimental procedure.
(2) data -- LTSpice is acquired
The System Discrimination of black-box model needs to acquire multiple groups voltage and current value simultaneously.Therefore need to establish power circuit mould
Type, and simulation waveform is obtained, collect input voltage, input current, the multi-group data of output voltage and output electric current.Together
When, which is also used for the waveform comparison of the black-box model artificial circuit figure after being estimated, to verify identification black box mould
Whether the process and result of type are correct.Linear Tech provides simulation software LTSpice, contains all SPICE models
Modeling for power source model.Modeling of the power source model in LTSpice is as shown in figure 3, by taking LT1963A as an example.
(3) initial data, including input voltage exciting test and output current excitation test are obtained.Reference formula (1),
When input voltage exciting test, change input voltage, output circuit is kept to immobilize.Meanwhile when carrying out output current excitation
When test, input voltage is remained unchanged, and output electric current is changed.Based on both the above exciting test, the process quilt of data is collected
It is divided into two kinds of test experiments: preliminary test and transient test.
Preliminary test: in estimation two-port network inputs admittance Yi, inverse current gain Hi, forward voltage gain GoWith it is defeated
Impedance Z outoBefore the transmission function of four parameters, according to formula Kirchhoff's second law and Kirchhoff's current law (KCL) to upper
It states two-port network and carries out circuit analysis, obtain about input voltage Vi, input current Ii, output voltage VoWith output electric current Io
Relational expression such as (1) (2)；Each parameter is analyzed for the independence of input voltage and output electric current or linear；Test result
Be it is linear, black-box model use formula (3)-(6)；Nonlinear parameter, using including several small signal-wire time-invariant models
Polyhedral structure replace the transmission function of parameter；
Ii=YiVi+HiIo (1)
Vo=GoVi-ZoIo (2)
As Δ IoWhen=0,
As Δ IoWhen=0,
As Δ ViWhen=0,
As Δ ViWhen=0,
(4) System Discrimination -- MATLAB/System Identification Toolbox
Before System Discrimination, need to pre-process the initial data that LTSpice is collected into MATLAB.Firstly, needing
It will be to data resampling, to generate the data sequence of uniform sampling rate.Meanwhile if the data being collected into have noise, adopt again
Sample can remove radio-frequency component.
Then, the mean value of resampling data is removed.Purpose is to ensure that ssystem transfer function is identified just for power supply
Small-signal behaviour, rather than big Signal's behavior.Certainly, when the mean value of power supply be removed after, in last black-box model
Steady-state value is added back in power source model again.
Finally, carrying out System Discrimination, System Discrimination mainly includes two processes.One, after completing initial activation test, two
The transmission function structure of port network has determined.If parameter is linear, so that it may be arrived using single transmission function (3)
(6).If parameter be it is nonlinear, replaced with polyhedral structure, polyhedral structure constant mould when being by many small signal-wires
Type composition, each linearly invariant model has specific operating point.Two, System Discrimination is used based on transient test result
Method estimated transfer function.During System Discrimination, suitable model structure is selected, suitable model parameter is set, first
Polynomial model is selected, then to export the setting of fault model.Each parameter of two-port network has oneself transmission function, when
After all transmission functions are estimated, the two-port network of final black-box model modeling method can be simulated.
(5) modeling and simulating -- System Vision
In order to which whether the estimation for verifying above-mentioned black-box model is correct, the transmission function that will be obtained is needed to be brought into numerical model analysis
In modeling, two-port network model is established, and obtains the simulation curve figure of Current Voltage, and most start in LTSpice
Simulation waveform is compared, in error range, both it is believed that the estimation method is correct.
Then, it is added after the influence of irradiation effect, by irradiating the lower available irradiation of voltage and current simulation curve figure
The performance of influence to circuit.
Due to being modeled using numerical model analysis, so using System Vision software, it is imitative using VHDL-AMS numerical model analysis
True modeling language.Hierarchy type, the Analogous Integrated Electronic Circuits of structuring and hybrid digital-analog integrated circuit can be carried out by VHDL-AMS
Modeling.The behavioral scaling model of the system can be established by VHDL-AMS.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.
Claims (2)
1. a kind of modeling method of the circuit irradiation effect based on VHDL-AMS, which is characterized in that described based on VHDL-AMS's
Circuit irradiation effect modeling method reacts electronic device by electrical characteristics after irradiation effect by injecting different irradiation doses
Variation, i.e., the variation of Current Voltage in circuit；Behavioral scaling modeling is carried out to power supply apparatus using equivalent circuit, by complicated circuit
Behavior is abstracted into the circuit formed with the primary element of resistance, capacitor and controlled source；Using VHDL-AMS Language Modeling, counted
The hybrid modeling of word and analog circuit；
At different dosages, the experiment of input terminal step and the experiment of output end step are carried out respectively；It collects under various dose, input electricity
Pressure, input current, output voltage, the sampled value for exporting electric current；
Input voltage, input current, output voltage, export electric current sampled value design method include:
Preliminary test: in estimation two-port network inputs admittance Yi, inverse current gain Hi, forward voltage gain GoIt is hindered with output
Anti- ZoBefore the transmission function of four parameters, according to formula Kirchhoff's second law and Kirchhoff's current law (KCL) to above-mentioned two
Port network carries out circuit analysis, obtains about input voltage Vi, input current Ii, output voltage VoWith output electric current IoPass
It is formula such as (1) (2)；Each parameter is analyzed for the independence of input voltage and output electric current or linear；Test result is line
Property, black-box model uses formula (3)-(6)；Nonlinear parameter, using including the more of several small signal-wire time-invariant models
Face body structure replaces the transmission function of parameter；
Ii=YiVi+HiIo (1)
Vo=GoVi-ZoIo (2)
As Δ IoWhen=0,
As Δ IoWhen=0,
As Δ ViWhen=0,
As Δ ViWhen=0,
For different electronic device characteristics, in the autoregression model that band is outer plus inputs, the autoregression sliding with additional input is flat
Equal model, output error models, selection estimation model in Box-Jenkins model；And the order of a polynomial of the model structure is set
Secondary, time delay quantity；
According to the Approach For Identification of Model Structure model transfer function parameter of selection；
The transmission function of model is subjected to Laplace transform, discrete system transmission function is converted to the transmitting letter of continuous system
Number；
The validity and adaptability of testing model；The amplitude-frequency characteristic for comparing various dose drag obtains Bode figure, assesses dosage
Influence situation of the difference to model；
The model emulation is modeled using VHDL-AMS language, and obtains electrical characteristics curve, is i.e. input voltage, input current, defeated
The curve graph of voltage, output electric current out；Influence of the irradiation to electrical characteristics under various dose is summarized in observation.
2. a kind of two-port net that the modeling method using the circuit irradiation effect described in claim 1 based on VHDL-AMS is established
Network model system.
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101833603A (en) * | 2010-04-26 | 2010-09-15 | 杨磊 | Sigma-delta fraction N frequency comprehensive device behavior level modeling method |
| CN102564584A (en) * | 2011-11-25 | 2012-07-11 | 华东师范大学 | Modeling method for equivalent circuit of high-sensitivity quantum effect photodetector |
| CN103217638A (en) * | 2013-05-05 | 2013-07-24 | 西安电子科技大学 | Method for testing performance of GaAs HBT component after gamma irradiation |
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| Publication number | Priority date | Publication date | Assignee | Title |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101833603A (en) * | 2010-04-26 | 2010-09-15 | 杨磊 | Sigma-delta fraction N frequency comprehensive device behavior level modeling method |
| CN102564584A (en) * | 2011-11-25 | 2012-07-11 | 华东师范大学 | Modeling method for equivalent circuit of high-sensitivity quantum effect photodetector |
| CN103217638A (en) * | 2013-05-05 | 2013-07-24 | 西安电子科技大学 | Method for testing performance of GaAs HBT component after gamma irradiation |
Non-Patent Citations (2)
| Title |
|---|
| 基于VHDL-AMS的运算放大器和DC-DC的仿真建模及验证分析;强凯;《中国优秀硕士学位论文全文数据库 信息科技辑》;20141115(第11期);I135-198 |
| 硅VDMOS辐照特性研究及应用;陶晓峰;《中国优秀硕士学位论文全文数据库 信息科技辑》;20100115(第1期);I135-94 |
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