CN106501276A - 光学检测中对平板显示屏背光源施加压力的装置和方法 - Google Patents
光学检测中对平板显示屏背光源施加压力的装置和方法 Download PDFInfo
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- CN106501276A CN106501276A CN201610902194.3A CN201610902194A CN106501276A CN 106501276 A CN106501276 A CN 106501276A CN 201610902194 A CN201610902194 A CN 201610902194A CN 106501276 A CN106501276 A CN 106501276A
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
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CN201610902194.3A CN106501276B (zh) | 2016-10-17 | 2016-10-17 | 光学检测中对平板显示屏背光源施加压力的装置和方法 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106932935A (zh) * | 2017-05-17 | 2017-07-07 | 锦湖光电(深圳)有限公司 | 背光源检查装置 |
WO2018086323A1 (en) * | 2016-11-08 | 2018-05-17 | Boe Technology Group Co., Ltd. | Backlight detection apparatus and backlight detection method thereof |
Citations (6)
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JP2004239674A (ja) * | 2003-02-04 | 2004-08-26 | Minato Electronics Inc | フラット液晶ディスプレイにおける表示素子の検査装置および表示素子の検査方法 |
CN101329456A (zh) * | 2008-07-31 | 2008-12-24 | 友达光电股份有限公司 | 检测设备 |
CN203083948U (zh) * | 2013-01-17 | 2013-07-24 | 北京兆维电子(集团)有限责任公司 | 一种应用于平板显示屏自动光学检测的打光装置 |
CN103376059A (zh) * | 2012-04-26 | 2013-10-30 | 技佳唯斯股份有限公司 | 光学检测装置 |
CN203551476U (zh) * | 2013-08-14 | 2014-04-16 | 联策科技股份有限公司 | 检测台及其光学检测装置 |
CN105334229A (zh) * | 2015-10-19 | 2016-02-17 | 浙江欧威科技有限公司 | 一种光学检测仪 |
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2016
- 2016-10-17 CN CN201610902194.3A patent/CN106501276B/zh active Active
Patent Citations (6)
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JP2004239674A (ja) * | 2003-02-04 | 2004-08-26 | Minato Electronics Inc | フラット液晶ディスプレイにおける表示素子の検査装置および表示素子の検査方法 |
CN101329456A (zh) * | 2008-07-31 | 2008-12-24 | 友达光电股份有限公司 | 检测设备 |
CN103376059A (zh) * | 2012-04-26 | 2013-10-30 | 技佳唯斯股份有限公司 | 光学检测装置 |
CN203083948U (zh) * | 2013-01-17 | 2013-07-24 | 北京兆维电子(集团)有限责任公司 | 一种应用于平板显示屏自动光学检测的打光装置 |
CN203551476U (zh) * | 2013-08-14 | 2014-04-16 | 联策科技股份有限公司 | 检测台及其光学检测装置 |
CN105334229A (zh) * | 2015-10-19 | 2016-02-17 | 浙江欧威科技有限公司 | 一种光学检测仪 |
Non-Patent Citations (2)
Title |
---|
史艳琼 等: "液晶显示屏背光源模组表面缺陷自动光学检测系统设计", 《传感技术学报》 * |
王丽红 等: "光源在液晶玻璃基板检测系统中的应用研究", 《玻璃与搪瓷》 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2018086323A1 (en) * | 2016-11-08 | 2018-05-17 | Boe Technology Group Co., Ltd. | Backlight detection apparatus and backlight detection method thereof |
US10657858B2 (en) | 2016-11-08 | 2020-05-19 | Boe Technology Group Co., Ltd. | Backlight detection apparatus and backlight detection method thereof |
CN106932935A (zh) * | 2017-05-17 | 2017-07-07 | 锦湖光电(深圳)有限公司 | 背光源检查装置 |
CN106932935B (zh) * | 2017-05-17 | 2023-11-07 | 江苏大发建设工程有限公司 | 背光源检查装置 |
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Effective date of registration: 20190416 Address after: 241000 Emshan Road, Wuhu High-tech Industrial Development Zone, Anhui Province, 01 Patentee after: Anhui Huadong Photoelectric Technology Research Institute Co., Ltd. Address before: 241000 Huaxia science and Technology Park, Wuhu high tech Industrial Development Zone, Anhui Patentee before: Anhui Huadong Photoelectric Industry Research Institute Co., Ltd. |
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Effective date of registration: 20191108 Address after: 241000 floor 1, workshop 4, high tech Industrial Development Zone, Wuhu City, Anhui Province Patentee after: Anhui Haoxing Photoelectric Technology Co., Ltd. Address before: 241000 Emshan Road, Wuhu High-tech Industrial Development Zone, Anhui Province, 01 Patentee before: Anhui Huadong Photoelectric Technology Research Institute Co., Ltd. |