CN106468852A - For testing lamp box and its assemble method of camera module - Google Patents
For testing lamp box and its assemble method of camera module Download PDFInfo
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- CN106468852A CN106468852A CN201510515014.1A CN201510515014A CN106468852A CN 106468852 A CN106468852 A CN 106468852A CN 201510515014 A CN201510515014 A CN 201510515014A CN 106468852 A CN106468852 A CN 106468852A
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- test mark
- test
- installation portion
- pattern
- lamp box
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Abstract
The invention discloses one is used for testing the lamp box of camera module, it includes a lamp house casing, one light source and multiple test mark plate, described light source is arranged at described lamp house casing, each described test mark plate is arranged at described lamp house casing along depth direction, wherein each described test mark plate is respectively provided with least one test pattern, and the described test pattern of described test pattern test described with the others mark plate of any one of test mark plate is not overlapping in described depth direction, and the light that described light source produces passes through each described test mark plate radiation.
Description
Technical field
The present invention relates to the field tests of optical imaging device, it is used for testing the lamp box of camera module particularly to one
And its assemble method.
Background technology
In recent years, the carrier extending as human vision for the camera module obtaining image, has been increasingly becoming electricity
The standard configuration of sub- equipment, especially in the field of portable electronic apparatus with smart mobile phone, panel computer etc. as representative,
Camera module is even more widely used.With user, the requirement of the image quality of camera module is got over
Come harsher, the correlation technique of camera module industry has also obtained the development of formula of advancing by leaps and bounds, and camera module
Industry also constantly develops the automation equipment needing there is difference in functionality, participate in camera module production and
Testing process.
For example, can be using to tester table, wherein tester table offer when testing the image quality of camera module
It is provided with the test mark version of test pattern, during camera module is tested, be fixed in test machine
The camera module of platform passes through to shoot the image of the image acquisition test image of test mark version.It is traditionally used for providing and survey
The lamp box of test-object version includes a test mark version, obtains the process of the test pattern of test mark version in camera module
In, need the position change camera module along the direction dollying module perpendicular to test mark version and test mark
The distance of version, so that camera module obtains the shadow of the test pattern with different depth respectively in different positions
Ring, such mode, do not only result in the testing efficiency to camera module lowly, but also can affect to shooting mould
The test result of group.In order to solve this problem, present inventor takes off in the patent of invention of earlier application
Reveal a kind of three-dimensional test mark version, this three-dimensional test mark version is provided with multiple test mark versions along depth direction
Layer, and each test mark plate is respectively equipped with least one test pattern, and its neutral body test mark version allows to take the photograph
As module is just obtained in that the test pattern with different depth a position and by shooting at least one times
Impact, such mode greatly increases the quasi- beep of the testing efficiency to camera module and test result
Beep.Due to the structure of three-dimensional test mark version completely different with the structure of traditional test mark version so that the applicant
The lamp box of the three-dimensional test mark version of invention is complete with the structure of the lamp box of traditional test mark version and manufacture method
Different.
The assembling flow path being traditionally used for testing the lamp box of mark version is, by test platform, every layer of test is marked version
Test pattern corresponds to each coordinate points, then in every layer of test mark version between layers by test chart picture point
Bright, it is adjusted the relevant position of each layer test mark version and be fixed.Such assembling mode has more
Defect, first, does not have reference coordinate between each test pattern of same layer test mark version, leads to test mark version
Precision not, the test effect to camera module can be affected, for example test mark version is it is possible that tilt shows
As;Secondly, do not correspond to benchmark between every layer of test mark version, lead to the adjustment between each layer test mark version to be compared
Difficulty, have impact on and tester table is regulated the speed, and this assembling amplification of traditional lamp box can expend relatively
Long reality, in actual operating process, is entered by the time spent by the assembling process to traditional lamp box
Row statistics it is found that traditional lamp box need at least two people to cooperate and expend time of two days can be complete
Become.
Content of the invention
It is an object of the present invention to provide one is used for testing lamp box and its assemble method of camera module, wherein
Each test mark plate of described lamp box is used same basis reference as the foundation of assembling and adjustment, thus ensureing
Precision after assembled for the described lamp box.
It is an object of the present invention to provide one is used for testing lamp box and its assemble method of camera module, wherein
Described basis reference is provided with least one reference pattern, and each described test mark plate is respectively provided with least one test chart
Case, when assembling described lamp box, makes at least one described test pattern of each described test mark plate correspond to
At least one described reference pattern of described basis reference, by such mode, each described test mark plate
Described basis reference consistent, thus ensureing precision after assembled for the described lamp box.
It is an object of the present invention to provide one is used for testing lamp box and its assemble method of camera module, its profit
Mark described test pattern each institute as assembling and the described lamp box of adjustment of plate itself with test each described
State the test mark position of plate and the foundation of gradient, such mode not only can ensure described lamp box in quilt
Precision after assembling, and subsequently can also ensure that survey when testing described camera module using described lamp box
Examination precision.
It is an object of the present invention to provide one is used for testing lamp box and its assemble method of camera module, wherein
During assembling described lamp box, the described basis reference for providing described reference pattern can also be fixed often
Individual described test mark plate, so that each described test mark plate forms a test mark version, thus ensureing each institute
Stating test mark plate is not in position skew or situation about tilting after being adjusted.
It is an object of the present invention to provide one is used for testing lamp box and its assemble method of camera module, wherein
First each described test mark plate is fabricated to described three-dimensional test mark version after the adjustment, then again by multiple institutes
State test mark version to be overlappingly installed on a lamp house casing and form the mode of described lamp box so that the group of described lamp box
The more traditional lamp box of dress efficiency is greatly improved.
It is an object of the present invention to provide one is used for testing lamp box and its assemble method of camera module, wherein
Each described test mark position of plate and gradient are when being determined using the side of same described basis reference
Formula is so that the more traditional lamp box of the packaging efficiency of described lamp box is greatly improved.
It is an object of the present invention to provide one is used for testing lamp box and its assemble method of camera module, wherein
Described assemble method simplifies and optimizes the number of assembling steps of described lamp box, to improve the packaging efficiency of described lamp box.
In order to achieve the above object, the method that the present invention provides an assembling lamp box, wherein said lamp box is used for testing
One camera module, wherein said assemble method includes step:
A () overlappingly arranges multiple test mark plates in a lamp house casing, wherein each institute along depth direction
State test mark plate and be respectively provided with least one test pattern, and the described survey of any one of test mark plate
The described test pattern attempting case test described with others mark plate is not overlapping in described depth direction;With
B () arranges a light and comes from described lamp house casing, and so that the light that described light source produces is passed through described in each
Test mark plate radiation.
According to one embodiment of present invention, in described step (a), further include:
(a.1) multiple test mark plates are overlappingly set, to form a three-dimensional test mark version;With
(a.2) at least one described three-dimensional test mark version is installed in described lamp house casing.
According to another aspect of the present invention, the method that the present invention also provides an assembling lamp box, wherein said lamp box
For testing a camera module, described assemble method includes step:
(A) multiple test mark plates are overlappingly arranged, to form a three-dimensional test mark version;
(B) at least one described three-dimensional test mark version is installed in a lamp house casing;And
(C) setting one light comes from described lamp house casing, and so that the light that described light source produces is passed through described in each
Test mark plate radiation.
According to one embodiment of present invention, described step (C) completed before described step (B), from
And first described light source is arranged at described lamp house casing, then each described three-dimensional test mark version is installed on described lamp
Tank shell.
According to another aspect of the present invention, the method that the present invention also provides an assembling lamp box, wherein said lamp box
For testing a camera module, wherein said assemble method includes step:
I () overlappingly arranges multiple test mark plates in a lamp house casing, wherein each institute along depth direction
State test mark plate and be respectively provided with least one test pattern, and the described survey of any one of test mark plate
The described test pattern attempting case test described with others mark plate is not overlapping in described depth direction;With
(ii) setting one light comes from described lamp house casing, and so that the light that described light source produces is passed through described in each
Test mark plate radiation.
According to one embodiment of present invention, in described step (i), further include step:
There is provided a three-dimensional test mark version, wherein said three-dimensional test mark version is included along described depth direction overlappingly
The multiple described test mark plate of setting;With
At least one described three-dimensional test mark version is installed in described lamp house casing.
According to one embodiment of present invention, in described step (i), further include step:
There is provided a test mark version, wherein said test mark version includes at least one described test mark plate;With
Overlappingly test mark version described in setting at least two is in described lamp house casing.
According to one embodiment of present invention, in the above-mentioned methods, further include step:
There is provided a basis reference, wherein said basis reference includes a reference element and has at least one reference map
Case, each described reference pattern is respectively arranged on the diverse location of described reference element;
One first installation portion is overlappingly set in described reference element, and makes each installation of described first installation portion
Passage corresponds respectively to each described reference pattern;And
Each described test mark plate is respectively arranged at each described installation passage of described first installation portion, and
And make the described test pattern located at test mark plate each described be correspondingly arranged at the described base of described reference element
Quasi- pattern, to form described test mark version.
According to one embodiment of present invention, in the above-mentioned methods, further include step:
There is provided a basis reference, wherein said basis reference includes a reference element and has at least one reference map
Case, each described reference pattern is respectively arranged on the diverse location of described reference element;
It is respectively mounted each described test mark plate in one second installation portion, to form a monomer mark version;And
Each described monomer mark version is respectively arranged at each installation passage of one first installation portion, and make located at
The described test pattern of each described test mark plate is correspondingly arranged at the described reference pattern of described reference element, with
Form described test mark version.
According to one embodiment of present invention, in the above-mentioned methods, further include step:
It is respectively provided with a camera module and described reference element in a tester table, wherein said reference element is located at
The photosensitive path of described camera module;With
Obtained located at the described test pattern of described test mark plate with located at described base by described camera module
The described reference pattern of quasi-element, when described test pattern and the described reference pattern of the acquisition of described camera module
During picture registration, connect described second installation portion and described first installation portion.
According to one embodiment of present invention, in the above-mentioned methods, by the first installation portion described in hot melt gemel connection
With described second installation portion.
According to one embodiment of present invention, located at the described reference pattern of described reference element and located at described survey
The type of the described test pattern of test-object version is consistent.
According to one embodiment of present invention, described test pattern be selected from square, triangle, circle, ellipse,
Cross, the blackboard line shape group to, star composition.
According to another aspect of the present invention, the present invention also provides one for testing the lamp box of camera module, its,
Including:
One lamp house casing;
One light source, described light source is arranged at described lamp house casing;And
Multiple test mark plates, each described test mark plate is arranged at described lamp house casing along depth direction,
Wherein each described test mark plate is respectively provided with least one test pattern, and any one of test mark version
The described test pattern that the described test pattern of layer marks plates with other described tests is in described depth direction not
Overlap, and the light that described light source produces passes through each described test mark plate radiation.
According to one embodiment of present invention, described lamp box also includes at least two first installation portions, and each described
One installation portion is respectively equipped with least one installation passage, and the periphery that plate is marked in each described test is connected to described
The inwall of each described installation passage of formation of the first installation portion, each described first installation portion is overlappingly arranged at
Described lamp house casing.
According to one embodiment of present invention, described lamp box also includes at least two first installation portions and multiple second peace
Dress portion, each described the first installation part is not provided with least one installation passage, and each described test mark plate is respectively
It is arranged at each described second installation portion, each described second installation portion is connected to described first installation portion
Form the inwall of each described installation passage, each described first installation portion is overlappingly arranged at described lamp box shell
Body.
According to one embodiment of present invention, the inwall of described lamp house casing forms at least two supporting tables, each institute
State the first installation part and be not arranged at least one described supporting table.
According to one embodiment of present invention, described lamp box also includes multiple setting elements, and described lamp house casing is also
It is provided with least two placed channels, each described placed channel corresponds respectively to each described supporting table, is arranged at institute
The side wall stating described first installation portion of supporting table corresponds to each described placed channel, the end of described setting element
Extend to the inside of described lamp house casing from the outside of described lamp house casing via described placed channel and hold out against institute
State the first installation portion.
According to one embodiment of present invention, described lamp box also includes one the 3rd installation portion, described 3rd installation portion
Overlappingly it is arranged at described light source, and the side wall of described 3rd installation portion corresponds to described placed channel, described fixed
The end of bit unit extends to described lamp house casing from the outside of described lamp house casing via described placed channel
Inside simultaneously holds out against described 3rd installation portion.
According to one embodiment of present invention, described lamp house casing includes one first supporting part and is arranged at described the
One second supporting part of one supporting part, and the link position in described first supporting part and described second supporting part
Form a support level, each described first installation portion is overlappingly arranged at described first supporting part, described light source
It is arranged at described support level.
According to one embodiment of present invention, described lamp house casing is square or circular.
According to one embodiment of present invention, the interlamellar spacing of adjacent described test mark plate is from described lamp house casing
One end gradually increases to the other end or gradually reduces.
According to one embodiment of present invention, the number of plies of described test mark plate is 2-100.
According to one embodiment of present invention, described test pattern be selected from square, triangle, circle, ellipse,
Cross, the blackboard line shape group to, star composition.
Brief description
Fig. 1 is the cross-sectional schematic of the lamp box of first preferred embodiment according to the present invention.
Fig. 2 is the cross-sectional schematic of the lamp box of second preferred embodiment according to the present invention.
Fig. 3 is the assembling flow path schematic diagram of the lamp box of the above preferred embodiment according to the present invention.
Fig. 4 A to Fig. 4 E is that the assembling process of the lamp box of the above preferred embodiment according to the present invention is illustrated respectively
Figure.
Fig. 5 is the schematic perspective view of the basis reference of the above preferred embodiment according to the present invention.
Fig. 6 is that the basis reference of the above preferred embodiment according to the present invention is arranged at the schematic diagram of tester table.
Fig. 7 A and Fig. 7 B is test mark during the adjustment test mark plate of the above preferred embodiment according to the present invention
Plate and the process schematic of basis reference.
Fig. 8 is the schematic perspective view of the lamp box of the 3rd preferred embodiment according to the present invention.
Fig. 9 is the decomposing schematic representation of the lamp box of the above preferred embodiment according to the present invention.
Figure 10 is the cross-sectional schematic of the above preferred embodiment lamp box according to the present invention.
Figure 11 is that the solid of a variant embodiment of the lamp box of the above preferred embodiment according to the present invention is shown
It is intended to.
Figure 12 is the section view of another variant embodiment of the lamp box of the above preferred embodiment according to the present invention
Schematic diagram.
Figure 13 is the assembling flow path schematic diagram of the lamp box of the above preferred embodiment according to the present invention.
Figure 14 A to Figure 14 G is the assembling process schematic diagram of the above preferred embodiment according to the present invention.
Specific embodiment
Hereinafter describe for disclosing the present invention so that those skilled in the art are capable of the present invention.In below describing
Preferred embodiment be only used as illustrating, it may occur to persons skilled in the art that other obvious modifications.With
The ultimate principle of the present invention defining in lower description can apply to other embodiments, deformation program, improvement side
Case, equivalent and the other technologies scheme without departing from the spirit and scope of the present invention.
It is the lamp box for testing camera module of first preferred embodiment according to the present invention as shown in Figure 1
Structure chart, wherein said lamp box be used for subtest one camera module image quality.Specifically, described
Lamp box includes a lamp house casing 30, a light source 40 and at least one three-dimensional test mark version 100, described light source 40
It is arranged at described lamp house casing 30, each described three-dimensional test mark version 100 is respectively arranged in described lamp house casing
30, and each described three-dimensional test mark version 100 is located at the opticpath of described light source 40, so that described light
The light that source 40 produces illuminates each described three-dimensional test mark version 100.For example in a specific example,
Described light source 40 can be arranged at the top of described lamp house casing 30, so, the light that described light source 40 produces
Line passes through each described three-dimensional test mark version 100 to radiate from top to bottom, to illuminate each described three-dimensional test mark version
100.
In other words, described lamp house casing 30 not only forms each described three-dimensional test mark version 100 of carrying and described
One load-carrying unit of light source 40, and described lamp box also forms an end and the environment of four weeks portion all closings,
To prevent described lamp box when participating in the test of described camera module, the extraneous light of described lamp box enters into described
The inside of lamp house casing 30 and disturb the uniform light of described light source 40 radiation, by such mode it is ensured that after
Continue described camera module and be test for accuracy.
Each described three-dimensional test mark version 100 includes the multiple test mark plates along depth direction setting respectively
20, and each described test mark plate 20 is respectively provided with least one test pattern 21, thus so that described
Test pattern 21 forms the scene information of different depth.During described camera module is tested,
Described camera module can capture the light of the information recording each described test pattern 21 of different depth simultaneously
It is translated into image, thus subsequently may determine that described shooting mould according to the imaging contexts of described camera module
The image quality of group is simultaneously adjusted to the relevant parameter of described camera module.
It is noted that the relevant parameter of described three-dimensional test mark version 100 needs according to described camera module
Type is set, the number of plies of described test mark plate 20 of for example described three-dimensional test mark version 100, spacing
And described three-dimensional test mark version 10 is arranged on the position of described lamp house casing 30, each described test mark plate
The parameters such as 20 shape of described test pattern 21, size, position, density are according to being test for described shooting
The type of module is determined.It will also be appreciated that the described test mark plate of described three-dimensional test mark version 100
The number of plies can be 2-100 layer.
Further, the described test pattern 21 of any one of test mark plate 20 and other described tests
The described test pattern 21 of mark plate 20 is not overlappingly arranged along described depth direction, thus in described shooting
When module shoots the image of described lamp box, each described test pattern 21 of each described test mark plate 20 is not
Situation about interfering occurs, to guarantee the measuring accuracy to described camera module.
It is noted that in the described lamp box of the present invention, the shape of described test pattern 21 is unrestricted,
For example described test pattern 21 can select square, triangle, circle, ellipse, cross, blackboard line
Shape group to the figures such as, star composition is that is to say, that the described test pattern of the described lamp box of the present invention
21 shape can be any can be for calculating the icon of the image quality of described camera module, including entity
Icon and by the icon of hue distinguishes.
As shown in figure 1, described three-dimensional test mark version 100 also includes one first installation portion 60, each described survey
Test-object plate 20 is respectively arranged at described first installation portion 60, and described first installation portion 60 is installed on described lamp
Tank shell 30.It is noted that the interlamellar spacing of each described test mark plate 20 described is taken the photograph according to tested
As module test it needs to be determined that.In addition, mark interlamellar spacing and the gradient of plate 20 in each described test
After being determined, each described test can be marked by plate by PUR or other equivalent embodiments
20 are fixed on described first installation portion 60.For example in one of the present invention preferably embodiment, each institute
Stating test mark plate 20 is to be fixed in described first installation portion 60 by way of PUR, and at this
During, when the physical state of glue changes, each described test mark plate 20 is pacified with described first
The gradient of the position in dress portion 60 and each described test mark plate 20 all without shifting, so that it is guaranteed that
Precision after the assembling that is done for the described lamp box.
It is the lamp box for testing camera module of second preferred embodiment according to the present invention as shown in Figure 2
Structure chart, and unlike above preferred embodiment, the described lamp box of second preferred embodiment of the present invention
Each described test mark plate 20 be not set directly at described first installation portion 60.
Specifically, described three-dimensional test mark version 100 includes one first installation portion 60, multiple second installation portion
70 and multiple described test mark plate 20, each described test mark plate 20 be respectively arranged at each described second
Installation portion 70, each described second installation portion 70 is connected to described first installation portion 60, such as at this
In the specific example of bright one, can pass through between described test mark plate 20 and described second installation portion 70
The mode of PUR connects, can also be by heat between described second installation portion 70 and described first installation portion 60
The mode of melten gel connects.
It will be appreciated by those skilled in the art that, after described three-dimensional test mark version 100 is formed, described
The relevant parameter of three-dimensional test mark version 100 is all determined, thus follow-up by each described three-dimensional test mark version
100 are positioned over during described lamp house casing 30 it is no longer necessary to version 100 is marked in test and the described three-dimensional test of adjustment
Relevant parameter, and after described light source 40 is arranged at described lamp house casing 30, form described lamp box.
That is, the described lamp box that the present invention provides, it includes described lamp house casing 30, described light source 40
And at least one described three-dimensional test mark version 100, described light source 40 is arranged at the upper of described lamp house casing 30
Portion, each described three-dimensional test mark version 100 is respectively arranged at the inside of described lamp house casing 30, and each
Described three-dimensional test mark version 100 is located at the opticpath of described light source 40, wherein each described three-dimensional test mark
Version 100 includes the multiple test mark plates 20 along depth direction setting respectively, each described test mark plate
20 are respectively provided with least one test pattern 21, and the described test chart of any one of test mark plate 20
The described test pattern 21 that case 21 marks plates 20 with other described tests is along described depth direction not overlappingly
Setting.
In one of the present invention preferably embodiment, described three-dimensional test mark version 100 also includes described first
Installation portion 60, each described test mark plate 20 is overlappingly arranged at described first installation portion 60 respectively, described
First installation portion 60 is arranged at described lamp house casing 30, to form described lamp box.The present invention another
Preferably in embodiment, described three-dimensional test mark version 100 also includes described first installation portion 60, Duo Gesuo
State the second installation portion 70 and multiple described test mark plate 20, each described test mark plate 20 is respectively provided with
In each described second installation portion 70, each described second installation portion 70 is respectively arranged at described first installation portion
60, described first installation portion 60 is arranged at described item problem 30 of Denging, thus forming described lamp box.
As shown in Fig. 3 to Fig. 7 B, the method that the present invention also provides an assembling lamp box, wherein said assemble method
The packaging efficiency of described lamp box is significantly increased by simplifying and optimizing the number of assembling steps of described lamp box.Root
The factually test result on border, the described assemble method that the present invention provides is by the built-up time of described lamp box by original 2
People completes to shorten to 2 people for 2 days in 1 day 3 hours and completes, and described every after assembly is completed
Precision is also greatly improved, and to be ensured with this in the follow-up test effect to described camera module.
As shown in Fig. 3 and Fig. 4 E, described assemble method comprises the steps.
Step 310:One basis reference 80 is provided, and described basis reference 80 is fixed on a tester table 90.
During assembling described lamp box, described basis reference 80 is assembling and adjusts each described test mark plate
20 foundation, that is, the determination of each parameter of described three-dimensional test mark version 100 and adjustment are with same institute
State basis reference 80 as the foundation determining and adjust, by such mode, ensure that each is described vertical
The concordance of body examination test-object version 100.Described basis reference 80 includes a reference element 81 and has at least one base
Quasi- pattern 82, each described reference pattern 82 is located at the diverse location of described reference element 81, as Fig. 5 institute
Show.Preferably, each described reference pattern 82 is separate, that is, between each described reference pattern 82
It is not in situation about interfering.The type of described reference element 81 and material can be unrestricted,
In of the present invention preferably embodiment, described reference element 81 may be implemented as a square gold
Belong to piece, such as steel disc, described reference pattern 82 can be located at described reference element in the way of laser incising casting
81 it is to be understood that described reference pattern 82 can also be printed on described reference element 81.This area
Technical staff it is understood that located at the described reference pattern 82 of described reference element 81 with located at described
The type of described test pattern 21 of test mark plate 20 and consistent size, thus in assembling and adjust each institute
When stating position and the gradient that plate 20 is marked in test, located at the described test pattern of described test mark plate 20
21 can be overlapped with the described reference pattern 82 located at described reference element 81.It will also be appreciated that
During assembling described lamp box, only when the pattern of described camera module, located at described test mark plate 20
Described test pattern 21 and overlap located at the described reference pattern 82 of described reference element 81, can be true
The position of fixed described test mark plate 20 and gradient.
It is noted that the position that described reference pattern 82 is located obtains by after optical computing,
That is, the position that described reference pattern 82 is located is theoretical position.In addition, it is permissible to assemble described lamp box
Described tester table 90 is carried out, described tester table 90 is lamp box test described in later use and adjustment institute
State the test equipment of the relevant parameter of camera module.Specifically, when assembling described lamp box, described test machine
One described camera module can be fixed on platform 90, and described basis reference 80 is fixed on described test machine
Platform 90, as shown in Figure 6.Preferably, described basis reference 80 can be fixed to described test by alignment pin
On board 90, to prevent when assembling described lamp box, the phenomenon of displacement in described basis reference 80.
Step 320:Described test mark plate 20 is fixed on described second installation portion 70, to form a monomer
Mark version 150, such as Fig. 4 A.It is noted that in described test mark plate 20 and described second installation portion 70
Between can be fixed by PUR, to avoid in fixation described test mark plate 20 and described second installation portion
The phenomenon of mutual dislocation, when 70, occurs between described test mark plate 20 and described second installation portion 70.
It is noted that described step 310 and described step 320 do not have order difference that is to say, that institute
State step 320 to complete between described step 310, thus being initially formed described monomer mark version 150, so
After re-form described basis reference 80, and described basis reference 80 is fixed on described tester table 90.
Step 330:Described first installation portion 60 is fixed on the described reference element 81 of described basis reference 80,
As Fig. 4 B.In the present invention for the mode that described first installation portion 60 is fixed on described reference element 81
Unrestricted, such as, in a specific embodiment, described first installation portion 60 can pass through alignment pin
Mode be fixed in described reference element 81, with ensure assemble described lamp box when, described first installation portion
60 is not in the phenomenon of displacement, thus not only facilitating described first installation portion 60 from described benchmark follow-up
Element 81 disassembles, and will not destroy appointing in described first installation portion 60 and described reference element 81
What one, the precision of this described lamp box being subsequently formed for guarantee is very effective.
Step 340:Described monomer mark version 150 is put into described first installation portion 60, such as Fig. 4 C.
Step 350:By adjusting position and the gradient of described monomer mark version 150, make described camera module
Pattern, located at the described test mark described test pattern 21 of the plate 20 and institute located at described reference element 81
State reference pattern 82 to overlap, thus, the relevant parameter of described monomer mark version 150 is determined.And repeat to hold
Row described step 340 and described step 350, so that multiple described monomer mark version 150 is all put into described the
One installation portion 60, and determine the interlamellar spacing of adjacent described test mark plate 20, as shown in figures 7 a and 7b.
Step 360:Will be fixing to the described monomer mark version 150 after adjustment and described first installation portion 60, with shape
Become described three-dimensional test mark version 100.It is noted that the described monomer in described three-dimensional test mark version 100
Can be fixed by PUR between described second installation portion 70 of mark version 150 and described first installation portion 60,
To avoid in fixing described second installation portion 70 and described first installation portion 60, described three-dimensional test mark version
100 parameter changes, such as during the physical state of PUR changes, described three-dimensional test mark
Be not in displacement and situation about tilting between each described monomer mark version 150 of version 100, by such side
Formula is it is ensured that precision after assembled for the described lamp box.
Step 370:At least one described three-dimensional test mark version 100 is fixed on described lamp house casing 30, such as schemes
4D.It will be appreciated by those skilled in the art that, in described step 360, described three-dimensional test mark version
100 parameter is determined, thus in described step 370, described three-dimensional test mark version 100 is fixed on institute
The process stating lamp house casing 30 does not need to readjust the parameter of described three-dimensional test mark version 100 again, by this
The mode of sample, can be significantly increased the packaging efficiency of described lamp box.In addition, described three-dimensional test mark version
100 is unrestricted with the fixed form of described lamp house casing 30, such as in a specific example, permissible
Will be fixing with described lamp house casing 30 for described three-dimensional test mark version 100 by way of screw locks, Ke Yili
Solution, this mode is only the description of an illustrative, is not intended to limit present disclosure and scope.
Step 380:Described light source 40 is arranged at described lamp house casing 30, to form described lamp box, and
The light that described light source 40 produces passes through each described three-dimensional test mark version 100 to radiate, to illuminate described in each
Three-dimensional test mark version 100, such as Fig. 4 E.
It is noted that the order of described step 370 and described step 380 is unrestricted, thus at this
In another bright embodiment, described step 380 can also complete between described step 370, thus first
Described light source 40 is arranged at described lamp house casing 30, more described three-dimensional test mark version 100 is installed on described
Lamp house casing 30, to form described lamp box.
Thus, the method that the present invention provides an assembling lamp box, wherein said assemble method comprises the steps:
(A) multiple test mark plates 20 are overlappingly arranged, to form a three-dimensional test mark version 100;
(B) at least one described three-dimensional test mark version 100 is installed in a lamp house casing 30;And
(C) light source 40 is set in described lamp house casing 30, and so that the light that described light source 40 produces is passed through
Each described test mark plate 20 radiates.
It is noted that in another preferred embodiment of the present invention, described step (C) is described
Complete before step (B), thus first described light source 40 is arranged at described lamp house casing 30, then by each
Described three-dimensional test mark version 100 is installed on described lamp house casing 30.
In one of the present invention preferably embodiment, described step (A) further includes:
There is provided a basis reference 80, wherein said basis reference 80 includes a reference element 81 and has at least
One reference pattern 82, each described reference pattern 82 is respectively arranged on described reference element 81;
One first installation portion 60 is fixed on described reference element 81;And
Each described test mark plate 20 is arranged at described first installation portion 60 along depth direction, and makes to set
In each described test mark test pattern 21 of plate 20 and the described reference map located at described reference element 81
Case 82 is corresponding, to form described three-dimensional test mark version 100.
The present invention another preferably in embodiment, described step (A) further includes:
There is provided a basis reference 80, wherein said basis reference 80 includes a reference element 81 and has at least
One reference pattern 82, each described reference pattern 82 is respectively arranged on described reference element 81;
Make a monomer mark version 150, wherein said monomer mark version 150 includes one second installation portion 70 and fixes
Described test mark plate 20 in described second installation portion 70;
One first installation portion 60 is fixed on described reference element 81;And
Each described monomer mark version 150 is arranged at described first installation portion 60 along depth direction, and makes to set
In each described test mark test pattern 21 of plate 20 and the described reference map located at described reference element 81
Case 82 is corresponding, to form described three-dimensional test mark version.
Further, in the above-mentioned methods, a camera module and described reference element 81 are individually fixed in one
Tester table 90, when pattern and the test pattern located at test mark plate 20 each described of described camera module
21 and the described reference pattern 82 located at described reference element 81 when overlapping, fixing described second installation portion
70 and described first installation portion 60, to form described three-dimensional test mark version 100.Further, above-mentioned
In method, by fixing described second installation portion 70 of PUR and described first installation portion 60.
It is noted that the method that the present invention also provides an assembling lamp box, wherein said assemble method include as
Lower step:
A () overlappingly arranges multiple test mark plates 20 in a lamp house casing 30 along depth direction, wherein
Each described test mark plate 20 is respectively provided with least one test pattern 21, and any one of test mark
The described test pattern 21 of plate 20 marks the described test pattern 21 of plates 20 in institute with other described tests
State depth direction not overlapping;With
B () arranges a light source 40 in described lamp house casing 30, and so that the light that described light source 40 produces is passed through
Each described test mark plate 20 radiates.
Further, in described step (a), further include:
(a.1) multiple test mark plates 20 are overlappingly set, to form a three-dimensional test mark version 100;With
(a.2) at least one described three-dimensional test mark version 100 is installed in described lamp house casing 20.
It is the 3rd preferred embodiment according to the present invention as shown in Fig. 8 to Figure 10 for testing camera module
Lamp box, wherein said lamp box include a lamp house casing 30A, a light source 40A and at least two test mark versions 110A,
Each described test mark version 110A is overlappingly arranged at described lamp house casing 30A, thus each described test mark
Version 110A forms three-dimensional test mark version 100A, and described light source 40A is arranged at described lamp house casing 30A,
And each described test mark version 110A is respectively positioned on the opticpath of described light source 40A.For example the present invention's
In one specific example, each described test mark version 110A is overlappingly arranged at described lamp house casing 30A's
Inside, described light source 40A is arranged at the end of described lamp house casing 30A, thus described light source 40A produces
Uniform light can sequentially pass through at least a portion radiation of each described test mark version 110A, every to illuminate
This part of individual described test mark version 110A.
Further, each described test mark version 110A includes at least one test mark plate 20A, described in each
Test mark plate 20A is respectively provided with least one test pattern 21A, in camera module described in follow-up test,
The uniform light that described light source 40A produces passes through each described test mark plate of described test mark version 110A
20A radiates.
It is noted that described test mark version 110A each described test mark plate 20A be in same
In horizontal plane, thus when each described test mark version 110A is overlappingly arranged to form described three-dimensional test mark version
During 100A, described three-dimensional test mark version 100A includes the multiple test mark plates along depth direction setting
20A, each described test mark plate 20A is respectively provided with least one described test pattern 21A, and arbitrary
The institute of the described test pattern 21A of layer described test mark plate 20A and other described test mark plate 20A
State test pattern 21A not overlapping in described depth direction.That is, every layer of described test mark plate 20A
Described test pattern 21A be not in situation about interfering when described camera module is tested, thus
Guarantee the reliability of the test result of described camera module.
In the described lamp box of the present invention, the quantity of the described test mark plate 20A of described test mark version 110A
Unrestricted, the quantity of for example described test mark version 20 can be one, two, three, four or more
Multiple.It will be appreciated by those skilled in the art that, each the described survey upper disclosing in the example of the present invention
The quantity of the described test mark plate 20A of test-object version 110A is four, and the description of its being only for example property,
Do not constitute the restriction to present disclosure and scope.
Each described test mark version 110A respectively further comprises one first installation portion 60A and at least one second installation portion
70A, described first installation portion 60A is provided with least one installation passage 61A, each described test mark plate 20A
It is respectively arranged in each described second installation portion 70A, each described second installation portion 70A is respectively arranged in institute
State each described installation passage 61A of the first installation portion 60A.It is noted that when described test mark version
After layer 20A is installed on described second installation portion 70A, described test mark plate 20A and described second installs
Portion 70A can form monomer mark version 150A.It will be appreciated by those skilled in the art that, described second
Installation portion 70A can be around the periphery setting of described test mark plate 20A or described second installation
Portion 70A is symmetrically disposed on the both sides of described test mark plate 20A.
It is noted that can pass through between described test mark plate 20A and described second installation portion 70A
PUR links together, and described second installation portion 70A is being installed on described first installation portion 60A
Described installation passage 61A, and determine described test mark version 110A parameter after it is also possible to pass through PUR
Described second installation portion 70A is connected to described installation passage 61A of formation of described first installation portion 60A
Inwall.It is understood that PUR has the ability of rapid link, and the physical state in PUR is sent out
Relative position during changing, between described second installation portion 70A and described first installation portion 60A
Also will not change, so that it is guaranteed that the precision of described lamp box after assembling.
Each described test mark version 110A is overlappingly fixed on described lamp house casing 30A, as shown in Figure 9.
Specifically, after each described test mark version 110A is produced and completes, can be by two described test marks
Version 110A is overlappingly fixed on described lamp house casing 30A, and the number of plies of described test mark version 110A can be
2-100 layer, for example in a preferred embodiment of the invention, the number of plies of described test mark version 110A can
To be 5 layers.The inwall of described lamp house casing 30A extends to form at least two supporting tables 31A, described in each
The both sides of test mark version 100 can be arranged at each described supporting table 31A, to be propped up by described supporting table 31A
Support.Preferably, to be also provided with least two placed channel 32A described to be communicated in for described lamp house casing 30A
Lamp house casing 30A's is inside and outside, and each described placed channel 32A corresponds respectively to each described support
Platform 31A, after described test mark version 110A is arranged at described supporting table 31A, described test mark version 110A
Side wall correspond to described placed channel 32A, an end of described setting element 120A can be from described lamp
The outside of tank shell 30A passes through described placed channel 32A to hold out against described test mark version 110A, thus by institute
State test mark version 120 and be fixed on described lamp house casing 30A.This area just seem personnel it is understood that
The inwall for forming described placed channel 32A of described setting element 30 and described lamp house casing 30A has
Intermeshing helicitic texture.
Described lamp box also includes one the 3rd installation portion 130A, is arranged at described lamp house casing in described light source 40A
After 30A, described 3rd installation portion 130A is covered in described light source 40A, and described light source 40A is fixed
In described lamp house casing 30A.Preferably, the side wall of described 3rd installation portion 130A corresponds to described lamp box shell
One end of the described placed channel 32A of body 30A, described setting element 120A is from described lamp house casing
The outside of 30A passes through described placed channel 32A to hold out against described 3rd installation portion 130A, thus preventing described
3rd installation portion 130A shifts or comes off, to guarantee described light source 40A parallel to described test mark version
110A, thus the uniform light that described light source 40A produces can be each passed through each described test mark version 110A
Each described test mark plate 20A, with equably illuminate each described test mark plate 20A.
Further, described lamp box also includes a shading element 140A, and described shading element 140A is arranged at
Described 3rd installation portion 130A, and described shading element 140A and described test mark version 110A be located at respectively
The both sides of described light source 40A, thus described shading element 140A prevents the light that described light source 40A produces
From the opposite side radiation of described test mark version 110A, and described shading element 140A also prevents described lamp box
Outside light enters into the inside of described lamp box to disturb the uniform light that described light source 40A produces, thus really
Protect the reliability of described lamp box.
Described lamp house casing 30A includes one first supporting part 33A and one second supporting part 34A, and described second
Supporting part 34A is arranged at the end of described first supporting part 33A, and described first supporting part 33A and institute
State the middle overlapping of axles of the second supporting part 34A, described first supporting part 33A is used for fixing each described test mark
Version 110A, described second supporting part 34A are used for fixing described light source 40A.More specifically, described first
Supporting part 33A forms each described supporting table 31A, for each described test mark version 110A is arranged at institute
State the first supporting part 33A, the size of described second supporting part 34A is more than the chi of described first supporting part 33A
Very little, thus the link position in described first supporting part 33A and described second supporting part 34A forms a support
Step 35A, described light source 40A is arranged at described support level 35A.
It is noted that the shape of described lamp house casing 30A can be unrestricted, in the present invention such as Fig. 8
To Figure 10 this preferably in embodiment, the shape of described lamp house casing 30A is square, for example square
Shape or rectangle.The present invention another preferably in embodiment, as shown in figure 11, described lamp box
The shape of housing 30A is circular, such as circular or ellipse.
It is a variant embodiment of the above preferred embodiment according to the present invention as shown in figure 12, and above-mentioned
Unlike preferred embodiment, the described test mark plate 20A of described test mark version 110A is not connected to institute
State the second installation portion 70A, but described test mark plate 20A is directly connected in described first installation portion 60A
Described installation passage 61A of formation inwall, and described test mark plate 20A and described first installation portion
The inwall of described installation passage 61A of formation of 60A can be linked together by way of PUR.
As shown in Figure 13 to Figure 14 E, the method that the present invention also provides an assembling lamp box, wherein said assembling side
Method comprises the steps.
Step 1310:One basis reference 80A is provided, and described basis reference 80A is fixed on a test machine
Platform 90A, as shown in Figure 14 A.During assembling described lamp box, described basis reference 80A is assembling
With the foundation adjusting each described test mark plate 20A.Described basis reference 80A includes a reference element 81A
With there is at least one reference pattern 82A, each described reference pattern 82A is located at described reference element 81A's
Diverse location.During making described basis reference 80A, first pass through optical computing and determine each institute
State the position in described reference element 81A for the reference pattern 82A, then by each by way of laser incising is cast
Described reference pattern 82A carves casting in the relevant position of described reference element 81A it is to be understood that described
Reference pattern 82A can also be printed on described reference element 81A.Preferably, each described reference pattern
82A is separate, is not in situation about interfering between each described reference pattern 82A.
The type of described reference element 81A and material can be unrestricted, preferably implement for one in the present invention
In mode, described reference element 81A may be implemented as a square sheet metal, such as steel disc.Ability
The technical staff in domain is it is understood that located at the described reference pattern 82A of described reference element 81A and set
In the type of described test pattern 21A and the consistent size of described test mark plate 20A, thus in assembling and
When adjusting position and the gradient that plate 20A is marked in each described test, located at described test mark plate 20A's
Described test pattern 21A can be overlapped with the described reference pattern 82A located at described reference element 81A.Also
It is understood that during assembling described lamp box, only when the pattern of described camera module, located at institute
State the test mark described test pattern 21A of plate 20A and the described reference map located at described reference element 81A
Case 82A overlaps, and can determine position and the gradient of described test mark plate 20A.
As shown in Figure 14B, described tester table 90A includes at least one alignment pin 91A, described basis reference
The described reference element 81A of 80A is provided with least one first positioning through hole 811, and described tester table 90A's is every
Individual described alignment pin 91A be each passed through and be held in described reference element 81A's and each described first positioning
Through hole 811, thus described basis reference 80A is fixed on described tester table 90A, by such mode,
Can prevent during assembling described lamp box, the phenomenon of displacement in described basis reference 80A.
Step 1320, described test mark plate 20A is fixed on described second installation portion 70A, to form one
Monomer mark version 150A, as shown in Figure 14 C.It is noted that in described test mark plate 20A and described
Can be fixed by PUR between second installation portion 70A, to avoid in fixation described test mark plate 20A
During with described second installation portion 70A, go out between described test mark plate 20A and described second installation portion 70A
The phenomenon of existing mutual dislocation.
It is noted that described step 1310 and described step 1320 there is no order difference that is to say, that
Described step 1320 can also complete between described step 1310, thus being initially formed described monomer mark version
150A, then re-forms described basis reference 80A, and described basis reference 80A is fixed on described test
Board 90A.
Step 1330:Described first installation portion 60A is overlappingly placed and is fixed on described basis reference 80A
Described reference element 81A, as shown in fig. 14d.It is noted that described first installation portion 60A sets
There are at least one second placed channel 62A, each described second placed channel 62A of described first installation portion 60A
Corresponding with each described installation passage 61A of reference element 81A each described respectively, thus in described step
In rapid 1330, each described alignment pin 91A of described tester table 90A also cross and be held in described base
Each described first placed channel 811A of quasi-element 81A and described first installation portion 60A each described
Two placed channel 62A.
Step 1340:By described monomer mark version 150A be installed on described first installation portion 60A each described in
In installation passage 61A, to form described test mark version 110A, as shown in fig. 14e.Specifically, work as institute
State after the first installation portion 60A is overlappingly fixed on described reference element 81A, described first installation portion
Described installation passage 61A of each of 60A correspond to located at described reference element 81A each described with reference to figure
Case 82, described monomer mark version 150A is placed on described installation passage 61A of described first installation portion 60A,
And adjust the position of described monomer mark version 150A and described first installation portion 60A, so that located at described test mark
The described test pattern 21A of plate 20A and described reference pattern 82 weight located at described reference element 81A
Close, subsequently connect the described installation passage of formation of described monomer mark version 150A and described first installation portion 60A
The inwall of 61A.
Step 1350:Test mark version 110A described at least two is fixed on described lamp house casing 30A, such as schemes
Shown in 14F.According to the type of tested described camera module, the interlamellar spacing of adjacent described test mark version 110A
Difference, such as in one of the present invention preferably embodiment, the interlayer of adjacent described test mark version 110A
Gradually increase to the other end away from the one end from described lamp house casing 30A or reduce.
Step 1360:Described light source 40A is arranged at described lamp house casing 30A, to form described lamp box,
And the light that described light source 40A produces passes through each described three-dimensional test mark version 100A radiation, every to illuminate
Individual described three-dimensional test mark version 100A, as shown in figure 14g.
It is noted that the method that the present invention also provides an assembling lamp box, wherein said assemble method include as
Lower step:
I () overlappingly arranges multiple test mark plate 20A in a lamp house casing 30A along depth direction, its
In each described test mark plate 20A be respectively provided with least one test pattern 21A, and any one of
The described test of the described test pattern 21A of test mark plate 20A and other described test mark plate 20A
Pattern 21A is not overlapping in described depth direction;With
(ii) a light source 40A is set in described lamp house casing 30A, and makes the light of described light source 40A generation
Through test mark plate 20A radiation each described.
Further, include step in described step (i):
There is provided test mark version 110A, wherein said test mark version 110A includes at least one described test mark version
Layer 20A;With
Overlappingly test mark version 110A described in setting at least two is in described lamp house casing 30A.
In one of the present invention preferably embodiment, include step in the above-mentioned methods:
There is provided basis reference 80A, wherein said basis reference 80A includes a reference element 81A and has
At least one reference pattern 82A, each described reference pattern 82A is respectively arranged on described reference element 81A not
Same position;
One first installation portion 60A is overlappingly set in described reference element 80, and makes described first installation portion 60A
Each installation passage 61A correspond respectively to each described reference pattern 82A;And
Each described test mark plate 20A is respectively arranged at each described peace of described first installation portion 60A
Dress passage 61A, and so that the described test pattern 21A correspondence located at test mark plate 20A each described is set
In the described reference pattern 82A of described reference element 81A, to form described test mark version 110A.
The present invention another preferably in embodiment, further include step in said method:
There is provided basis reference 80A, wherein said basis reference 80A includes a reference element 81A and has
At least one reference pattern 82A, each described reference pattern 82A is respectively arranged on described reference element 81A not
Same position;
It is respectively mounted each described test mark plate 20A in one second installation portion 70A, to form a monomer mark
Version 150A;And
Each described monomer mark version 150A is respectively arranged at each installation passage of one first installation portion 60A
61A, and it is described so that the described test pattern 21A marking plate 20A located at test each described is correspondingly arranged at
The described reference pattern 82A of reference element 81A, to form described test mark version 110A.
Further, include step in the above-mentioned methods:
It is respectively provided with a camera module and described reference element 81A in a tester table 90A, wherein said base
Quasi-element 81A is located at the photosensitive path of described camera module;With
Obtained by described camera module and mark the described test pattern 21A of plate 20A located at described test and set
In the described reference pattern 82A of described reference element 81A, the described test chart obtaining when described camera module
During the picture registration of case 21A and described reference pattern 82A, connect described second installation portion 70A and described the
One installation portion 60A.
It should be understood by those skilled in the art that the embodiments of the invention shown in foregoing description and accompanying drawing are only used as
Illustrate and be not intended to limit the present invention.The purpose of the present invention is completely and be effectively realized.The function of the present invention and
Structural principle has been shown in an embodiment and has been illustrated, without departing under described principle, embodiments of the present invention
Can there is any deformation or change.
Claims (20)
1. one is used for testing the lamp box of camera module it is characterised in that including:
One lamp house casing;
One light source, described light source is arranged at described lamp house casing;And
Multiple test mark plates, each described test mark plate be arranged at described lamp house casing along depth direction, wherein each
Described test mark plate is respectively provided with least one test pattern, and the described test pattern of any one of test mark plate
The described test pattern of test mark plate described with others is not overlapping in described depth direction, and the light that described light source produces
Line passes through each described test mark plate radiation.
2. lamp box according to claim 1, also includes at least two first installation portions, each described the first installation part
It is not provided with least one installation passage, the formation that the periphery that plate is marked in each described test is connected to described first installation portion is every
The inwall of individual described installation passage, each described first installation portion is overlappingly arranged at described lamp house casing.
3. lamp box according to claim 1, also includes at least two first installation portions and multiple second installation portion, each
Described the first installation part is not provided with least one installation passage, each described test mark plate be respectively arranged at each described second
Installation portion, each described second installation portion is connected to the interior of each described installation passage of formation of described first installation portion
Wall, each described first installation portion is overlappingly arranged at described lamp house casing.
4. lamp box according to claim 3, the inwall of wherein said lamp house casing forms at least two supporting tables, each
Described the first installation part is not arranged at least one described supporting table.
5. lamp box according to claim 4, also includes multiple setting elements, and described lamp house casing is additionally provided with least two
Placed channel, each described placed channel corresponds respectively to each described supporting table, is arranged at described the first of described supporting table
The side wall of installation portion corresponds to each described placed channel, and the end of described setting element is from the outside of described lamp house casing via institute
State placed channel to extend to the inside of described lamp house casing and hold out against described first installation portion.
6. lamp box according to claim 5, also includes one the 3rd installation portion, and described 3rd installation portion is overlappingly arranged
In described light source, and the side wall of described 3rd installation portion corresponds to described placed channel, and the end of described setting element is from described
The outside of lamp house casing extends to the inside of described lamp house casing via described placed channel and holds out against described 3rd installation portion.
7. lamp box according to claim 3, wherein said lamp house casing includes one first supporting part and is arranged at described
One second supporting part of the first supporting part, and the link position in described first supporting part and described second supporting part forms one
Support level, each described first installation portion is overlappingly arranged at described first supporting part, and described light source is arranged at described support
Step.
8. lamp box according to claim 3, wherein said lamp house casing is square or circular.
9. the lamp box according to claim 1 or 3, the interlamellar spacing of wherein adjacent described test mark plate is from described lamp box
One end of housing gradually increases to the other end or gradually reduces.
10. the lamp box according to claim 1 or 3, the number of plies of wherein said test mark plate is 2-100.
11. lamp boxes according to claim 1 or 3, wherein said test pattern be selected from square, triangle, circle,
Ellipse, cross, the blackboard line shape group to, star composition.
The method of 12. 1 assembling lamp boxes, wherein said lamp box is used for test one camera module it is characterised in that including step:
I () overlappingly arranges multiple test mark plates in a lamp house casing, wherein each described test mark along depth direction
Plate is respectively provided with least one test pattern, and the described test pattern of any one of test mark plate and other institutes
The described test pattern stating test mark plate is not overlapping in described depth direction;With
(ii) setting one light comes from described lamp house casing, and makes the light that described light source produces pass through each described test mark version
Layer radiation.
13. assemble methods according to claim 12, wherein in described step (i), further include step:
One three-dimensional test mark version is provided, wherein said three-dimensional test mark version include along described depth direction overlappingly arrange many
Individual described test mark plate;With
At least one described three-dimensional test mark version is installed in described lamp house casing.
14. assemble methods according to claim 12, wherein in described step (i), further include step:
There is provided a test mark version, wherein said test mark version includes at least one described test mark plate;With
Overlappingly test mark version described in setting at least two is in described lamp house casing.
15. assemble methods according to claim 14, wherein in the above-mentioned methods, further include step:
There is provided a basis reference, wherein said basis reference includes a reference element and has at least one reference pattern, each institute
State the diverse location that reference pattern is respectively arranged on described reference element;
One first installation portion is overlappingly set in described reference element, and makes each installation passage of described first installation portion respectively
Corresponding to reference pattern each described;And
Each described test mark plate is respectively arranged at each described installation passage of described first installation portion, and make located at
The described test pattern of each described test mark plate is correspondingly arranged at the described reference pattern of described reference element, described to be formed
Test mark version.
16. assemble methods according to claim 14, wherein in the above-mentioned methods, further include step:
There is provided a basis reference, wherein said basis reference includes a reference element and has at least one reference pattern, each institute
State the diverse location that reference pattern is respectively arranged on described reference element;
It is respectively mounted each described test mark plate in one second installation portion, to form a monomer mark version;And
Each described monomer mark version is respectively arranged at each installation passage of one first installation portion, and makes located at described in each
The described test pattern of test mark plate is correspondingly arranged at the described reference pattern of described reference element, to form described test mark
Version.
17. assemble methods according to claim 16, wherein in the above-mentioned methods, further include step:
It is respectively provided with a camera module and described reference element in a tester table, wherein said reference element is located at described shooting
The photosensitive path of module;With
Obtained located at the described test pattern of described test mark plate with located at described reference element by described camera module
Described reference pattern, when the described test pattern that described camera module obtains and the picture registration of described reference pattern, connects
Described second installation portion and described first installation portion.
18. assemble methods according to claim 17, wherein in the above-mentioned methods, by described in hot melt gemel connection
One installation portion and described second installation portion.
19. assemble methods according to claim 17, wherein located at described reference element described reference pattern with set
Consistent in the type of the described test pattern of described test mark version.
20. assemble methods according to claim 17, wherein said test pattern be selected from square, triangle, circle,
Ellipse, cross, the blackboard line shape group to, star composition.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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CN201510515014.1A CN106468852B (en) | 2015-08-20 | 2015-08-20 | For testing the lamp box and its assemble method of camera module |
PCT/CN2015/091014 WO2016050195A1 (en) | 2014-09-30 | 2015-09-29 | Light box, stereo test chart, and adjustment device and application thereof |
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CN201510515014.1A CN106468852B (en) | 2015-08-20 | 2015-08-20 | For testing the lamp box and its assemble method of camera module |
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1862305A (en) * | 2005-05-13 | 2006-11-15 | 信统科技股份有限公司 | Image sensing module multi-point focusing detecting method and apparatus thereof |
US20100020180A1 (en) * | 2008-07-23 | 2010-01-28 | Salvador Imaging, Inc.(a Delaware Corporation) | Alignment metrology and resolution measurement system for imaging arrays |
CN203444234U (en) * | 2013-06-29 | 2014-02-19 | 歌尔声学股份有限公司 | Lens testing device |
CN104793458A (en) * | 2014-01-20 | 2015-07-22 | 宁波舜宇光电信息有限公司 | Method and system for focusing multi-camera module based on near-infrared environment |
CN104811692A (en) * | 2015-04-09 | 2015-07-29 | 南昌欧菲光电技术有限公司 | Picture for testing shooting die set and method thereof |
-
2015
- 2015-08-20 CN CN201510515014.1A patent/CN106468852B/en active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1862305A (en) * | 2005-05-13 | 2006-11-15 | 信统科技股份有限公司 | Image sensing module multi-point focusing detecting method and apparatus thereof |
US20100020180A1 (en) * | 2008-07-23 | 2010-01-28 | Salvador Imaging, Inc.(a Delaware Corporation) | Alignment metrology and resolution measurement system for imaging arrays |
CN203444234U (en) * | 2013-06-29 | 2014-02-19 | 歌尔声学股份有限公司 | Lens testing device |
CN104793458A (en) * | 2014-01-20 | 2015-07-22 | 宁波舜宇光电信息有限公司 | Method and system for focusing multi-camera module based on near-infrared environment |
CN104811692A (en) * | 2015-04-09 | 2015-07-29 | 南昌欧菲光电技术有限公司 | Picture for testing shooting die set and method thereof |
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