CN106449474A - 晶圆片边缘清洗处理装置 - Google Patents

晶圆片边缘清洗处理装置 Download PDF

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Publication number
CN106449474A
CN106449474A CN201610867025.0A CN201610867025A CN106449474A CN 106449474 A CN106449474 A CN 106449474A CN 201610867025 A CN201610867025 A CN 201610867025A CN 106449474 A CN106449474 A CN 106449474A
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China
Prior art keywords
storage passage
liquid storage
chamber
wafer
cleaning
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CN201610867025.0A
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English (en)
Inventor
吕耀安
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WUXI HI-NANO TECHNOLOGY Co Ltd
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WUXI HI-NANO TECHNOLOGY Co Ltd
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Application filed by WUXI HI-NANO TECHNOLOGY Co Ltd filed Critical WUXI HI-NANO TECHNOLOGY Co Ltd
Priority to CN201610867025.0A priority Critical patent/CN106449474A/zh
Publication of CN106449474A publication Critical patent/CN106449474A/zh
Withdrawn legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67057Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

本发明涉及一种晶圆片边缘清洗处理装置,包括箱体,箱体中具有弧形状的储液通道及分别位于储液通道上、下方的清洗腔及废液腔,所述储液通道的内弧侧设有多个与所述清洗腔连通的出液孔,清洗腔中具有与储液通道弯曲方向一致的导向槽,所述储液通道与废液腔之间连通并设置有阀门。本发明专用于晶圆片边缘的清洗处理,采用将晶圆片置入弧形导向槽中,来回滚动的清洗方式,对其便于进行清洗,其操作极为简单,使用方便。

Description

晶圆片边缘清洗处理装置
技术领域
本发明涉及集成电路生产设备领域,特别涉及晶圆片的处理设备。
背景技术
利用传统的清洗设备可以较为便利的清洗晶圆正面和背面的污染,但是晶圆边缘尤其是倒角区的污染常常被忽略或者去除难度较大。
发明内容
针对现有技术存在的上述问题,申请人进行研究及设计,提供一种晶圆片边缘清洗处理装置,专用于晶圆片边缘的清洗处理,其结构合理、使用方便、成本低。
为了解决上述问题,本发明采用如下方案:
一种晶圆片边缘清洗处理装置,包括箱体,箱体中具有弧形状的储液通道及分别位于储液通道上、下方的清洗腔及废液腔,所述储液通道的内弧侧设有多个与所述清洗腔连通的出液孔,清洗腔中具有与储液通道弯曲方向一致的导向槽,所述储液通道与废液腔之间连通并设置有阀门。
本发明的技术效果在于:
本发明专用于晶圆片边缘的清洗处理,采用将晶圆片置入弧形导向槽中,来回滚动的清洗方式,对其便于进行清洗,其操作极为简单,使用方便。
附图说明
图1为本发明的结构示意图。
图中:1、箱体;2、储液通道;3、清洗腔;4、废液腔;5、导向槽;6、晶圆片。
具体实施方式
下面结合附图对本发明的具体实施方式作进一步说明。
如图1所示,本实施例的晶圆片边缘清洗处理装置,包括箱体1,箱体1中具有弧形状的储液通道2及分别位于储液通道2上、下方的清洗腔3及废液腔4,储液通道2的内弧侧设有多个与清洗腔3连通的出液孔,清洗腔3中具有与储液通道2弯曲方向一致的导向槽5,储液通道2与废液腔4之间连通并设置有阀门。使用时,只需将晶圆片6从清洗腔3的一端放入导向槽5中,晶圆片6在弧形导向槽5中来回滚动,由于储液通道2中的清洗液通过出液孔进入清洗腔3的弧形导向槽5中,晶圆片6的边缘处得到清洗。
以上所举实施例为本发明的较佳实施方式,仅用来方便说明本发明,并非对本发明作任何形式上的限制,任何所属技术领域中具有通常知识者,若在不脱离本发明所提技术特征的范围内,利用本发明所揭示技术内容所作出局部改动或修饰的等效实施例,并且未脱离本发明的技术特征内容,均仍属于本发明技术特征的范围内。

Claims (1)

1.一种晶圆片边缘清洗处理装置,其特征在于:包括箱体(1),箱体(1)中具有弧形状的储液通道(2)及分别位于储液通道(2)上、下方的清洗腔(3)及废液腔(4),所述储液通道(2)的内弧侧设有多个与所述清洗腔(3)连通的出液孔,清洗腔(3)中具有与储液通道(2)弯曲方向一致的导向槽(5),所述储液通道(2)与废液腔(4)之间连通并设置有阀门。
CN201610867025.0A 2016-09-29 2016-09-29 晶圆片边缘清洗处理装置 Withdrawn CN106449474A (zh)

Priority Applications (1)

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CN201610867025.0A CN106449474A (zh) 2016-09-29 2016-09-29 晶圆片边缘清洗处理装置

Applications Claiming Priority (1)

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CN201610867025.0A CN106449474A (zh) 2016-09-29 2016-09-29 晶圆片边缘清洗处理装置

Publications (1)

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CN106449474A true CN106449474A (zh) 2017-02-22

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030041879A1 (en) * 1999-03-30 2003-03-06 Redeker Fred C. Wafer edge cleaning method and apparatus
KR20080084187A (ko) * 2007-03-15 2008-09-19 주식회사 하이닉스반도체 반도체 기판의 습식 처리 장치 및 이를 이용한 반도체기판의 습식 처리 방법
US20130152964A1 (en) * 2006-03-15 2013-06-20 Tokyo Electron Limited Substrate cleaning method, substrate cleaning system and program storage medium
CN203437362U (zh) * 2013-08-26 2014-02-19 中芯国际集成电路制造(北京)有限公司 晶圆清洗装置
CN104289486A (zh) * 2014-10-14 2015-01-21 中山市吉尔科研技术服务有限公司 一种用于光学镜片的清洗设备

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030041879A1 (en) * 1999-03-30 2003-03-06 Redeker Fred C. Wafer edge cleaning method and apparatus
US20130152964A1 (en) * 2006-03-15 2013-06-20 Tokyo Electron Limited Substrate cleaning method, substrate cleaning system and program storage medium
KR20080084187A (ko) * 2007-03-15 2008-09-19 주식회사 하이닉스반도체 반도체 기판의 습식 처리 장치 및 이를 이용한 반도체기판의 습식 처리 방법
CN203437362U (zh) * 2013-08-26 2014-02-19 中芯国际集成电路制造(北京)有限公司 晶圆清洗装置
CN104289486A (zh) * 2014-10-14 2015-01-21 中山市吉尔科研技术服务有限公司 一种用于光学镜片的清洗设备

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