CN106409731A - Nitrogen cooling system of furnace tube, and cooling method for wafer and wafer boat - Google Patents

Nitrogen cooling system of furnace tube, and cooling method for wafer and wafer boat Download PDF

Info

Publication number
CN106409731A
CN106409731A CN201610983199.3A CN201610983199A CN106409731A CN 106409731 A CN106409731 A CN 106409731A CN 201610983199 A CN201610983199 A CN 201610983199A CN 106409731 A CN106409731 A CN 106409731A
Authority
CN
China
Prior art keywords
cooling
nitrogen
cassette
wafer
tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201610983199.3A
Other languages
Chinese (zh)
Other versions
CN106409731B (en
Inventor
祁鹏
王智
苏俊铭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Huali Microelectronics Corp
Original Assignee
Shanghai Huali Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Huali Microelectronics Corp filed Critical Shanghai Huali Microelectronics Corp
Priority to CN201610983199.3A priority Critical patent/CN106409731B/en
Publication of CN106409731A publication Critical patent/CN106409731A/en
Application granted granted Critical
Publication of CN106409731B publication Critical patent/CN106409731B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D9/00Cooling of furnaces or of charges therein
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D9/00Cooling of furnaces or of charges therein
    • F27D2009/0002Cooling of furnaces
    • F27D2009/0005Cooling of furnaces the cooling medium being a gas
    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27FURNACES; KILNS; OVENS; RETORTS
    • F27DDETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
    • F27D9/00Cooling of furnaces or of charges therein
    • F27D2009/0002Cooling of furnaces
    • F27D2009/0005Cooling of furnaces the cooling medium being a gas
    • F27D2009/0008Ways to inject gases against surfaces

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

The invention discloses a nitrogen cooling system of a furnace tube, and a cooling method for a wafer and a wafer boat. The cooling method comprises the steps of: setting two paths of cooling pipelines in the nitrogen cooling system, wherein each path of cooling pipeline adopts a quality flow controller for controlling a nitrogen flow; and setting different nitrogen flows in the two paths of cooling pipelines, so that the nitrogen flow ejected out from each gas outlet of a first cooling pipe for cooling the wafer boat is less than the nitrogen flow ejected out from each gas outlet of a second cooling pipe for cooling the wafer, thus particles generated at the boat foot part of the wafer boat are blown off by the small-flow nitrogen ejected from the first cooling pipe and then blown away by the large-flow nitrogen ejected from the second cooling pipe. Therefore, the wafer boat and the wafer on the wafer boat can be effectively cooled, and the particles at the boat foot part of the wafer boat can be prevented from being blown onto the wafer.

Description

A kind of nitrogen cooling system of boiler tube and the cooling means of wafer and cassette
Technical field
The present invention relates to semiconductor integrated circuit processing technique field, more particularly, to a kind of nitrogen cooling of boiler tube System and method wafer and cassette being cooled down using this system.
Background technology
Integrated circuit continues to develop toward high density direction, on one piece of less and less chip, incorporates increasing So that chip is more and more lower to the tolerance of defect, more smaller size of defects have been increasingly becoming yield killer to assembly.
The defect of integrated circuit is tangible pollution and flaw present on wafer, main inclusion:Foreign matter on wafer is (micro- Dirt, process residues, bad reaction product etc.), graphic defects (the exception imaging that photoetching or etching cause, mechanical scratch Deformation, color exception causing in uneven thickness etc.), chemical contamination (residual chemicals, organic solvent etc.), material defect (lattice defect causing in wafer itself or manufacture process).
Integrated circuit fabrication process is carried out in dust free room, and the main source of defect includes:
1) board equipment:The defect of the aging generation that is in operation with unit exception of part;
2) process:Before technique final optimization pass processing procedure reaction in produced pair product;
3) production environment:Comprise toilet's particle level, humiture, electrostatic degree, content of organics;
4) material itself:Including wafer material, process gas, technique pure water, chemicals;
5) operating personnel:Comprise dust-free clothes, gloves.
Wherein, about 80% defect is to produce in process optimization engineering, and about 15% defect is derived from board equipment, and this A little defect major parts can affect the yield of wafer.
Boiler tube is used for carrying out high-temperature operation to wafer.Many pieces of wafers are loaded on the boat pin in cassette in a horizontal manner, Cassette can preloaded area below boiler tube vertically into boiler tube, make wafer accept technique in boiler tube, and will after technique Wafer is transferred to preloaded area again and is cooled down.The nitrogen cooling system (NBS) of boiler tube is arranged on the preloaded area below boiler tube, For completing to operation but wafer and cassette still in high temperature cool down.
Refer to Fig. 1, Fig. 1 is a kind of nitrogen cooling system structural representation of existing boiler tube.As shown in figure 1, boiler tube Nitrogen cooling system 20 be arranged on preloaded area below boiler tube, and be located at cassette 10 side dropping to during preloaded area. Nitrogen cooling system 20 is provided with a cooling line 23, and cooling line 23 connects air supply system, and vertically sets in its termini in apposition There is the cooling tube 22,25 of two different lengths;Tube wall along each cooling tube 22,25 is respectively equipped with multiple ventholes 21,26, can Nitrogen is sprayed by these ventholes, wafer and cassette 10 are cooled down.One of them shorter cooling tube 22 is used for crystalline substance Boat 10 is cooled down;Another longer cooling tube 25 is used for each layer crystal circle placed in cassette 10 is cooled down.Cooling tube Road 23 is provided with mass flow controller (MFC) 24, for controlling the nitrogen total flow in cooling line.
In above-mentioned existing nitrogen cooling system structure, nitrogen is to flow to two not through same mass flow controller Ejected with the cooling tube of length and by the venthole of varying number on two cooling tubes.Therefore, from shorter cooling tube The nitrogen flow that each venthole ejects will be significantly greater than the nitrogen flow ejecting from each venthole of longer cooling tube.
Wafer can deform in high-temperature operation.After the completion of operation, cassette drops to preloaded area, by above-mentioned nitrogen During air cooling system cooling, wafer will restore to the original state, and rub with the life of cassette boat human hair combing waste and produce particle.
Because the nitrogen flow ejecting from each venthole of shorter cooling tube is more than from longer cooling tube, each goes out The nitrogen flow that pore ejects, thus the particle that the friction of cassette boat foot position produces can be blown on wafer, and be difficult to again by The nitrogen of the relatively low discharge ejecting from longer cooling tube blows away, thus have impact on the yield of wafer.
Accordingly, it would be desirable to improve to existing nitrogen cooling system, to avoid blowing to the particle of boat foot position on wafer.
Content of the invention
It is an object of the invention to the drawbacks described above overcoming prior art to exist, provide a kind of nitrogen cooling system of boiler tube And the cooling means of wafer and cassette, the wafer in cassette can either be cooled down well, can prevent again by cassette boat pin Grain blows on wafer.
For achieving the above object, technical scheme is as follows:
A kind of nitrogen cooling system of boiler tube, is arranged on the preloaded area below boiler tube, and be located at drop to preloaded area When cassette sidepiece, described cassette has some layer crystals circle by boat pin horizontal load, and described nitrogen cooling system includes:
First, second cooling line, it is respectively equipped with mass flow controller;
First, second cooling tube, is respectively perpendicular located at first, second cooling line end, along first, second cooling tube Tube wall is respectively equipped with multiple ventholes, from sidepiece, the wafer cassette and cassette is cooled down respectively for spraying nitrogen;
Wherein, the nitrogen being imported by air supply system, the tune through the respective mass flow controller of first, second cooling line Section, with different setting flux and flow direction first, second cooling tubes, makes the nitrogen stream ejecting from each venthole of the first cooling tube Amount less than the nitrogen flow that ejects from each venthole of the second cooling tube, with the particle that produces in cassette boat foot position by first When the relatively low discharge nitrogen that cooling tube ejects blows off, the larger flow nitrogen being ejected by the second cooling tube is blown away, thus Prevent particle from falling on wafer.
Preferably, described first, second cooling tube is located at the different lateral attitudes of cassette homonymy.
Preferably, described first, second cooling line is respectively provided with one to several, and is respectively equipped with mass flow control Device, each first cooling line is provided with one to several the first cooling tubes, each second cooling line be provided with one to several Two cooling tubes, described first, second cooling tube is arranged in pairs in cassette sidepiece.
Preferably, the length of described second cooling tube be more than the first cooling tube, the venthole on described second cooling tube with In cassette, the position of wafer corresponds.
Preferably, also include a control unit, it connects the mass flow controller on first, second cooling line, use In being set by mass flow controller and adjust the nitrogen flow flowing through in first, second cooling line.
Preferably, also include first, second temperature sensing unit, for sensing the temperature of cassette and wafer respectively, described First, second temperature sensing unit connects control unit respectively.
A kind of wafer and the cooling means of cassette, using the nitrogen cooling system of above-mentioned boiler tube, comprise the following steps:
Step S01:Set the different nitrogen flows flowing through in first, second cooling line;
Step S02:When cassette drops to preloaded area, open nitrogen cooling system, by first, second cooling tube Venthole is cooled down to cassette and wafer injection nitrogen from sidepiece respectively, and makes to eject from each venthole of the first cooling tube Nitrogen flow be less than the nitrogen flow that ejects from each venthole of the second cooling tube, prevent the particle on cassette boat pin from blowing to On wafer;
Step S03:Cassette and wafer are cooled to after design temperature, close nitrogen cooling system, complete to cassette and crystalline substance The cooling of circle.
Preferably, in step S02, make cassette be in rotation status and cooled down.
Preferably, in step S02, the temperature of cassette and wafer is detected, to control cool time.
Preferably, the cassette according to detection and wafer temperature, adjustment makes to flow through first, second cooling in different cooling stages Nitrogen in pipeline has different size of flow, to strengthen cooling effect.
From technique scheme as can be seen that the present invention passes through to arrange two-way cooling line nitrogen cooling system, often Road cooling line is respectively adopted mass flow controller and controls nitrogen flow, and different by arranging in two-way cooling line Nitrogen flow, makes the nitrogen flow ejecting from each venthole of the first cooling tube of cooling cassette be less than from cool wafers The nitrogen flow ejecting in each venthole of second cooling tube, with the particle in the position generation of cassette boat foot by the first cooling tube When the relatively low discharge nitrogen ejecting blows off, the larger flow nitrogen being ejected by the second cooling tube is blown away, thus can either Cool down the wafer in cassette and cassette well, can prevent from blowing to the particle on cassette boat pin on wafer again.
Brief description
Fig. 1 is a kind of nitrogen cooling system structural representation of existing boiler tube;
Fig. 2 is a kind of nitrogen cooling system structural representation of boiler tube of a preferred embodiment of the present invention.
Specific embodiment
Below in conjunction with the accompanying drawings, the specific embodiment of the present invention is described in further detail.
It should be noted that in following specific embodiments, when describing embodiments of the present invention in detail, in order to clear Ground represents the structure of the present invention in order to illustrate, special to the structure in accompanying drawing not according to general scale, and carried out local Amplify, deformation and simplification are processed, therefore, should avoid being understood in this, as limitation of the invention.
In specific embodiment of the invention below, refer to Fig. 2, Fig. 2 is one kind of a preferred embodiment of the present invention The nitrogen cooling system structural representation of boiler tube.As shown in Fig. 2 a kind of nitrogen cooling system 30 of boiler tube of the present invention, setting Preloaded area below boiler tube (figure is slightly), and it is located at cassette 10 sidepiece dropping to during preloaded area.Described cassette passes through boat Pin horizontal load has some layer crystal circles (figure slightly, refers to prior art and understood).
Refer to Fig. 2.Described nitrogen cooling system 30 includes first, second cooling line 33,35, respectively connect first, First, second cooling tube 32,37 of the second cooling line 33,35, and each self installation on first, second cooling line 33,35 The part such as mass flow controller (MFC) 34,36.
First, second cooling line 33,35 can be set up in parallel, and is separately installed with first, second cooling line 33,35 Mass flow controller 34,36, for controlling the nitrogen flow size flowing through first, second cooling line 33,35 respectively.Logical Often, nitrogen as cooling cassette and cassette in wafer cooling medium but it is also possible to using other be suitable for cooling medium, this Bright not limited to this.The source of first, second cooling line 33,35 can connect factory service air supply system respectively, also can be in its quality stream Merge after amount controller 34,36 and connect factory service air supply system.
In the end (left-hand end of diagram) of the first cooling line 33 vertically equipped with the first cooling tube 32, along the first cooling tube 32 tube wall is machined with the multiple ventholes 31 being distributed up and down, and venthole 31 is arranged towards cassette 10 direction.Led by air supply system The nitrogen entering, after the Flow-rate adjustment through the first cooling line mass flow controller 34, flows to the first cooling tube 32, then by Each venthole 31 on one cooling tube wall sprays, and from sidepiece, cassette 10 can be cooled down.
Similarly, the second cooling line 35 ending vertical equipped with the second cooling tube 37, along the pipe of the second cooling tube 37 Wall is equally machined with the multiple ventholes 38 being distributed up and down, and each venthole 38 is arranged towards cassette 10 direction, and every with cassette The position of layer crystal circle corresponds.Namely a venthole 38 is responsible for purging one piece of wafer of corresponding layer, and by whole Venthole form the radiation upper and lower uniform cooling air-flow layer of cassette.The nitrogen being imported by air supply system, through the second cooling tube After the Flow-rate adjustment of road mass flow controller 36, flow to the second cooling tube 37, then by each on the second cooling tube wall Venthole 38 sprays, and from sidepiece, the wafer cassette 10 can be cooled down.The distribution density of venthole 31,38 can also enter one Step increaseds or decreases, and this can throughput as needed be configured.
So, the first cooling line 33 and its first cooling tube 32 and the second cooling line 35 and its second cooling tube 37 be just Define the cooling line of two-way independence.
When high-temperature operation in boiler tube for the wafer completes, cassette drops to preloaded area and it needs to cassette and wafer Cooled down.Now, by arranging a control unit (figure is slightly), control unit can be connected on first, second cooling line Mass flow controller flow control is carried out to it.So, by controlling the mass flow control on first, second cooling line Device processed, you can set respectively and adjust the nitrogen flow flowing through in first, second cooling line.
When being cooled down, nitrogen is imported by air supply system, through first, second cooling line each mass flow controller After regulation, in first, second cooling line, first, second cooling tube is flowed to respectively with different setting flows, according to calculating Set flow, the nitrogen flow ejecting from each venthole of the first cooling tube can be made to be less than, and each is given vent to anger from the second cooling tube The nitrogen flow that hole is ejected.So, when wafer is cooled recovery deformation, itself and the position friction of cassette boat foot are produced Even if particle by the first cooling tube eject when blowing off compared with the nitrogen of low discharge with respect to the second cooling tube, also can be by by The nitrogen with respect to the first cooling tube larger flow that two cooling tubes eject blows away immediately, thus can effectively prevent particle from falling Defect is produced on wafer.
Described first, second cooling tube may be provided at the different lateral attitudes of cassette homonymy, so can approximately spray in the same direction Radio-nitrogen gas, action effect during strengthening purging particle.
Described first cooling line can arrange one to several, when it is two or more, every road first cooling line Mass flow controller can be respectively equipped with;Equally, described second cooling line can also arrange one to several, when it is two When above, every road second cooling line can be respectively equipped with mass flow controller.And, every road first cooling line also can be arranged side by side It is provided with one to several the first cooling tubes, every road second cooling line also can be provided with one side by side to several the second cooling tubes.Often One the first cooling tube and second cooling tube partner, and can be looped around cassette sidepiece and be arranged in pairs, so that can be from crystalline substance The whole side of boat is quickly cooled down to cassette and wafer.Should set around cassette sidepiece between each pair first, second cooling tube It is set to asymmetric state, in order to avoid cooling air-flow is concentrated flows to crystal circle center.
When controlling the flow corresponding relation of first, second each venthole of cooling tube, by described second cooling tube Length is set greater than the length of the first cooling tube, can to cool down to all layers of wafer simultaneously.
First, second temperature sensing unit can also be set, for example, can adopt temperature sensor, for sensing crystalline substance respectively Boat and the surface temperature of wafer.Described first, second temperature sensing unit is respectively connecting to control unit, such control unit Can be according to the cassette of temperature sensor detection and wafer temperature, in different cooling stages, adjustment flows through first, second cooling Nitrogen flow size in pipeline, to strengthen cooling effect.Certainly, still should ensure that the nitrogen flow in the first cooling line is less than Nitrogen flow in second cooling line.
Can also be by installing flap nozzle at venthole additional, thus the angle of nitrogen jet can be converted in cooling procedure Degree, strengthens purging effect.And first, second cooling line can be connected mechanical arm, thus nitrogen can be converted in cooling procedure The distance of gas jet, also can promote purging effect.
With reference to specific embodiment, the present invention is used the nitrogen cooling system of above-mentioned boiler tube a kind of wafer and The cooling means of cassette is described in detail.
Refer to Fig. 2.A kind of wafer of the present invention and the cooling means of cassette, can be using the nitrogen cooling of above-mentioned boiler tube System, and may include following steps:
Step S01:Before cooling starts, stream is set on two mass flow controllers 34,36 respectively by control unit Through the different nitrogen flows in first, second cooling line 33,35, and the nitrogen flow flowing through in the first cooling line 33 is little In flowing through the nitrogen flow in the second cooling line 35.Specifically can be by calculating the nitrogen flow of respective pipeline.
Step S02:Complete high-temperature operation in wafer, when cassette 10 drops to preloaded area or before this default when Between, nitrogen cooling system 30 can be opened by the control menu of control unit or boiler tube board, and cool down by first, second The wafer injection nitrogen that the venthole 31,38 of pipe 32,37 loads respectively from sidepiece is to cassette 10 and cassette 10 is cooled down;Cold Pass through the flow of setting when but, the nitrogen flow ejecting from each venthole 31 of the first cooling tube 32 can be made to be less than from the The nitrogen flow that each venthole 38 of two cooling tubes 37 ejects, thus the particle producing in cassette boat foot position is cooled down by first When the relatively low discharge nitrogen that pipe 32 ejects blows off, the larger flow nitrogen that can be ejected by the second cooling tube 37 is immediately by it Blow away, to prevent the particle on cassette boat pin from blowing on wafer.
Step S03:Cassette and the surface temperature of wafer can constantly be detected by temperature sensor in cooling procedure, control Unit is known and is cooled to after design temperature by cassette and wafer, you can close nitrogen cooling system 30, complete to cassette and The cooling of wafer.
In above-mentioned step S02, cassette 10 can be made to be in rotation status and to be cooled down, so that it is uniformly cooled down, And improve cleaning effect.
Also can be by detecting to the temperature of cassette and wafer, to grasp the state of cooling in time, when controlling cooling Between, improve operating efficiency.
Particularly according to the cassette constantly detecting and wafer temperature, control unit can understand it is in which kind of rank of cooling Section, to be required according to the cooling air quantity of different phase, adjustment makes to flow through in first, second cooling line in different cooling stages Nitrogen there is different size of flow.For example can by cooling procedure be divided into high temperature, in gentle low temperature three phases, in high temperature rank Section wafer deformation amount of recovery is inconspicuous, and flow is excessive can not to produce corresponding cooling and cleaning effect, can suitably reduce nitrogen Flow;Maximum in middle thermophase wafer deformation amount of recovery, nitrogen flow can be increased and strengthen convection effects, to reduce rapidly wafer Temperature simultaneously effectively blows away particle;In cold stage, wafer deformation has substantially been recovered and close to the chilling temperature setting, at this moment can have been subtracted Little nitrogen flow, to save gas consumption.Cooling effect can be further enhanced by the way, and obtain good particle and go Except effect.
In sum, the present invention passes through to arrange two-way cooling line in nitrogen cooling system, and every road cooling line is respectively Nitrogen flow is controlled using mass flow controller, and by arranging different nitrogen flows in two-way cooling line, make from The second cooling tube that the nitrogen flow ejecting in each venthole of the first cooling tube of cooling cassette is less than from cool wafers is every The nitrogen flow ejecting in individual venthole, with the particle that produces in cassette boat foot position by the first cooling tube eject less When flow nitrogen blows off, the larger flow nitrogen being ejected by the second cooling tube is blown away, thus crystalline substance can either be cooled down well Wafer on boat and cassette, can prevent from blowing to the particle on cassette boat pin on wafer again.
Above-described only the preferred embodiments of the present invention, the patent that described embodiment is simultaneously not used to limit the present invention is protected The equivalent structure change that shield scope, the specification of therefore every utilization present invention and accompanying drawing content are made, should be included in the same manner In protection scope of the present invention.

Claims (10)

1. a kind of nitrogen cooling system of boiler tube, is arranged on the preloaded area below boiler tube, and positioned at when dropping to preloaded area Cassette sidepiece, described cassette has some layer crystals circle by boat pin horizontal load it is characterised in that described nitrogen cooling system bag Include:
First, second cooling line, it is respectively equipped with mass flow controller;
First, second cooling tube, is respectively perpendicular located at first, second cooling line end, along the tube wall of first, second cooling tube It is respectively equipped with multiple ventholes, from sidepiece, the wafer cassette and cassette is cooled down respectively for spraying nitrogen;
Wherein, the nitrogen being imported by air supply system, the regulation through the respective mass flow controller of first, second cooling line, with Different setting flux and flow direction first, second cooling tubes, makes the nitrogen flow ejecting from each venthole of the first cooling tube little In the nitrogen flow ejecting from each venthole of the second cooling tube, cooled down by first with the particle producing in cassette boat foot position When the relatively low discharge nitrogen that pipe inspection goes out blows off, the larger flow nitrogen being ejected by the second cooling tube is blown away, thus preventing Particle is fallen on wafer.
2. the nitrogen cooling system of boiler tube according to claim 1 is it is characterised in that described first, second cooling tube sets Different lateral attitudes in cassette homonymy.
3. the nitrogen cooling system of boiler tube according to claim 1 is it is characterised in that described first, second cooling line Be respectively provided with one to several, and be respectively equipped with mass flow controller, each first cooling line be provided with one to several One cooling tube, each second cooling line is provided with one to several the second cooling tubes, and described first, second cooling tube is in cassette side Portion is arranged in pairs.
4. the nitrogen cooling system of the boiler tube according to claim 1-3 any one is it is characterised in that described second cools down The length of pipe is more than the first cooling tube, and the venthole on described second cooling tube is corresponded with the position of wafer in cassette.
5., it is characterised in that also including a control unit, it is even for the nitrogen cooling system of boiler tube according to claim 1 Connect the mass flow controller on first, second cooling line, flow through for setting by mass flow controller and adjusting First, the nitrogen flow in the second cooling line.
6. the nitrogen cooling system of boiler tube according to claim 5 is it is characterised in that also include first, second temperature sense Survey unit, for sensing the temperature of cassette and wafer respectively, it is single that described first, second temperature sensing unit connects control respectively Unit.
7. the cooling means of a kind of wafer and cassette, usage right requires the nitrogen cooling system of the boiler tube described in 1-6 any one System is it is characterised in that comprise the following steps:
Step S01:Set the different nitrogen flows flowing through in first, second cooling line;
Step S02:When cassette drops to preloaded area, open nitrogen cooling system, by giving vent to anger of first, second cooling tube Hole is cooled down to cassette and wafer injection nitrogen from sidepiece respectively, and makes the nitrogen ejecting from each venthole of the first cooling tube Throughput is less than the nitrogen flow ejecting from each venthole of the second cooling tube, prevents the particle on cassette boat pin from blowing to wafer On;
Step S03:Cassette and wafer are cooled to after design temperature, close nitrogen cooling system, complete to cassette and wafer Cooling.
8. the cooling means of wafer according to claim 7 and cassette is it is characterised in that in step S02, make cassette be in Rotation status are cooled down.
9. the cooling means of wafer according to claim 7 and cassette is it is characterised in that in step S02, to cassette and crystalline substance The temperature of circle is detected, to control cool time.
10. wafer according to claim 9 and cassette cooling means it is characterised in that according to detection cassette and crystalline substance Circle temperature, adjustment makes the nitrogen flowing through in different cooling stages in first, second cooling line have different size of flow, with Strengthen cooling effect.
CN201610983199.3A 2016-11-09 2016-11-09 A kind of nitrogen cooling system of boiler tube and the cooling means of wafer and cassette Active CN106409731B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610983199.3A CN106409731B (en) 2016-11-09 2016-11-09 A kind of nitrogen cooling system of boiler tube and the cooling means of wafer and cassette

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610983199.3A CN106409731B (en) 2016-11-09 2016-11-09 A kind of nitrogen cooling system of boiler tube and the cooling means of wafer and cassette

Publications (2)

Publication Number Publication Date
CN106409731A true CN106409731A (en) 2017-02-15
CN106409731B CN106409731B (en) 2019-02-01

Family

ID=58015581

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610983199.3A Active CN106409731B (en) 2016-11-09 2016-11-09 A kind of nitrogen cooling system of boiler tube and the cooling means of wafer and cassette

Country Status (1)

Country Link
CN (1) CN106409731B (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110246791A (en) * 2019-05-20 2019-09-17 武汉新芯集成电路制造有限公司 A kind of wafer handler goes deimpurity equipment and goes deimpurity method
CN110739244A (en) * 2018-07-20 2020-01-31 东京毅力科创株式会社 Heat treatment apparatus and heat treatment method
CN110864810A (en) * 2019-11-19 2020-03-06 上海华力微电子有限公司 Furnace tube wafer boat temperature detection equipment and furnace tube wafer boat temperature monitoring method
CN111834247A (en) * 2019-04-23 2020-10-27 北京北方华创微电子装备有限公司 Cooling device and semiconductor processing equipment
CN112349631A (en) * 2020-11-04 2021-02-09 长江存储科技有限责任公司 Gas transmission pipeline and semiconductor machine
CN114383426A (en) * 2022-01-18 2022-04-22 长鑫存储技术有限公司 Cooling device, cooling system and diffusion furnace tube device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001068425A (en) * 1999-08-31 2001-03-16 Hitachi Kokusai Electric Inc Method and device for semiconductor thermal process
KR20050015879A (en) * 2003-08-11 2005-02-21 삼성전자주식회사 wafer unloading system of heat setting machine
JP2006279055A (en) * 2006-04-24 2006-10-12 Hitachi Kokusai Electric Inc Semiconductor manufacturing device
CN103673582A (en) * 2013-12-31 2014-03-26 北京七星华创电子股份有限公司 Method for controlling temperature of load area in boat-descending process of vertical furnace equipment

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001068425A (en) * 1999-08-31 2001-03-16 Hitachi Kokusai Electric Inc Method and device for semiconductor thermal process
KR20050015879A (en) * 2003-08-11 2005-02-21 삼성전자주식회사 wafer unloading system of heat setting machine
JP2006279055A (en) * 2006-04-24 2006-10-12 Hitachi Kokusai Electric Inc Semiconductor manufacturing device
CN103673582A (en) * 2013-12-31 2014-03-26 北京七星华创电子股份有限公司 Method for controlling temperature of load area in boat-descending process of vertical furnace equipment

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110739244A (en) * 2018-07-20 2020-01-31 东京毅力科创株式会社 Heat treatment apparatus and heat treatment method
CN110739244B (en) * 2018-07-20 2024-05-24 东京毅力科创株式会社 Heat treatment apparatus and heat treatment method
CN111834247A (en) * 2019-04-23 2020-10-27 北京北方华创微电子装备有限公司 Cooling device and semiconductor processing equipment
CN111834247B (en) * 2019-04-23 2023-09-08 北京北方华创微电子装备有限公司 Cooling device and semiconductor processing equipment
CN110246791A (en) * 2019-05-20 2019-09-17 武汉新芯集成电路制造有限公司 A kind of wafer handler goes deimpurity equipment and goes deimpurity method
CN110864810A (en) * 2019-11-19 2020-03-06 上海华力微电子有限公司 Furnace tube wafer boat temperature detection equipment and furnace tube wafer boat temperature monitoring method
CN112349631A (en) * 2020-11-04 2021-02-09 长江存储科技有限责任公司 Gas transmission pipeline and semiconductor machine
CN114383426A (en) * 2022-01-18 2022-04-22 长鑫存储技术有限公司 Cooling device, cooling system and diffusion furnace tube device

Also Published As

Publication number Publication date
CN106409731B (en) 2019-02-01

Similar Documents

Publication Publication Date Title
CN106409731A (en) Nitrogen cooling system of furnace tube, and cooling method for wafer and wafer boat
CN108074840A (en) Substrate board treatment, substrate processing method using same and storage medium
US20200156121A1 (en) Freeze cleaning apparatus
CN108022861A (en) Substrate board treatment, substrate processing method using same and storage medium
KR102143208B1 (en) Load Port Module and Load Purge Purge System Having Air Curtain Unit
CN106816398A (en) Semiconductor processing equipment
US20160059277A1 (en) Apparatus and methods for substrate processing and manufacturing integrated circuit devices
CN108028193A (en) Substrate board treatment and substrate processing method using same
CN103639151B (en) The apparatus and method of cleaning photo masks plate
CN205816330U (en) A kind of mask cleaning device
US20190308223A1 (en) Cleaning liquid supplying system, substrate processing apparatus and substrate processing system
KR101759877B1 (en) Wafer polishing chamber and wafer polishing system including the same
JP2016127107A (en) Substrate processing apparatus, substrate processing method and storage medium
US8286674B2 (en) Gas filling apparatus
TWM592161U (en) IC test classifier with clean mechanism
CN103021904A (en) Wafer scrubber apparatus and wafer scrubber method
JP7462977B2 (en) Purge Control System
KR20080072275A (en) Ashing apparatus for fabricating semiconductor device and operating method there of
CN105632895A (en) Method for reducing spherical particle defects in chemical cleaning technology
CN105742215A (en) Furnace tube, wafer cooling method and automatic crystal boat cleaning method
TWI689970B (en) Substrate processing device, substrate processing method and memory medium
TWI823134B (en) Load port and methods of operation
TWI828030B (en) Stocker system and controlling method
KR20180078886A (en) Substrate unloading method of substrate processing apparatus
TWI842245B (en) Cutting device and method for manufacturing cut product

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant