CN106405363A - Device used for testing LED components - Google Patents
Device used for testing LED components Download PDFInfo
- Publication number
- CN106405363A CN106405363A CN201610754056.5A CN201610754056A CN106405363A CN 106405363 A CN106405363 A CN 106405363A CN 201610754056 A CN201610754056 A CN 201610754056A CN 106405363 A CN106405363 A CN 106405363A
- Authority
- CN
- China
- Prior art keywords
- conductive electrode
- led element
- block piece
- baffle
- base plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a device used for testing LED components. The device comprises a frame, wherein the frame is provided with an inclined base plate, an upper surface of the base plate is parallelly equipped with a first baffle plate and a second baffle plate, the base plate, the first baffle plate and the second baffle plate circle to form an inclined conveying channel, a first blocking member and a second blocking member are arranged at the second baffle plate in a telescopic penetration mode, the conveying channel is separated by the first blocking member and the second blocking member to form a test channel segment, the test channel is internally provided with a first conductive electrode and a second conductive electrode oppositely, the first conductive electrode is fixedly mounted on the second baffle plate, the second conductive electrode is movably arranged, and an interval of the first conductive electrode and the second conductive electrode is adjustable. The device is advantaged in that the first conductive electrode and the second conductive electrode are respectively in extrusion contact with LED electrodes at two sides of the LED components to realize electrical connection, so tests are accomplished, through setting a conveying belt and scraping wings, disqualified LED components after tests can be screened out.
Description
Technical field
The invention belongs to LED element technical field of measurement and test is and in particular to a kind of device for testing LED element.
Background technology
Semiconductor LED is a kind of important opto-electronic device, and it all has very wide in scientific research and industrial and agricultural production
General application.Though light emitting diode is little, to accurately measure its every light and a radiation parameter not easy thing.
Existing method of testing, is the welding that the two poles of the earth of single LED lamp are entered row conductor.Fig. 3 is prior art LED lamp
Structural representation, including the LED electrode 20 of LED element 19 and its both sides, Fig. 4 is the side view of LED element 19, due to LED unit
Part size limitation itself, wire is welded on LED electrode more difficult, is often easily damaged LED element itself, to LED unit
Part sample causes waste；Still further aspect is less due to LED element resistance itself, and the welding kesistance that welding method causes is to it
Impact is larger, when carrying out LED test, causes test data accuracy not high.
Content of the invention
Present invention aim to address the problems referred to above, provide a kind of device for testing LED element.
For solving above-mentioned technical problem, the technical scheme is that：A kind of device for testing LED element, including
For installing the frame of each assembly, frame is provided with the base plate of inclination, and plate upper surface is parallel to be provided with first baffle and second
Baffle plate, base plate, first baffle and second baffle surround the transfer passage of inclination；First block piece and the second block piece are telescopic
It is arranged in second baffle, the first block piece and the second block piece are separated out one section for testing LED element in transfer passage
TCH test channel；It is provided with the first relative conductive electrode and the second conductive electrode, the first conductive electrode fixed installation in TCH test channel
On second baffle；Second conductive electrode activity setting, adjustable with the spacing of the first conductive electrode；Described transfer passage initial
End is connected with feeding mechanism, and the end of transfer passage is connected with the initiating terminal of feed belt；The side of described feed belt initiating terminal
Face is provided with scraping wings, and scraping wings is connected with the 4th telescopic cylinder.
Preferably, described first block piece is connected with the first telescopic cylinder, and the second block piece is connected with the second telescopic cylinder.
Preferably, described first block piece along LED element conveying direction be located at the second block piece downstream.
The invention has the beneficial effects as follows：
1st, the device for testing LED element provided by the present invention, by the first conductive electrode and the second conductive electrode
Contact realization electrical connection with the extruding of the LED electrode of LED element both sides respectively, thus completing to test, in solution prior art due to
Weld the LED element damage causing and the impact of welding kesistance.
2nd, pass through to arrange feed belt and scraping wings, the LED element after test can be sorted out, by test failure
LED element screens.
Brief description
Fig. 1 is the structural representation of the device that the present invention is used for testing LED element；
Fig. 2 is the side view of transfer passage of the present invention；
Fig. 3 is the structural representation of prior art LED lamp；
Fig. 4 is the side view for LED element.
Description of reference numerals：1st, frame；2nd, base plate；3rd, first baffle；4th, second baffle；5th, transfer passage；6th, the first resistance
Block piece；7th, the second block piece；8th, TCH test channel；9th, the first conductive electrode；10th, the second conductive electrode；11st, the first telescopic cylinder；
12nd, the second telescopic cylinder；13rd, the 3rd telescopic cylinder；14th, chute；15th, feed belt；16th, scraping wings；17th, the 4th flexible gas
Cylinder；18th, rule；19th, LED element；20th, LED electrode.
Specific embodiment
The present invention is described further with specific embodiment below in conjunction with the accompanying drawings：
As depicted in figs. 1 and 2, a kind of device for testing LED element of the present invention, including for installing each assembly
Frame 1, frame 1 is provided with the base plate 2 of inclination, and base plate 2 upper surface is parallel to be provided with first baffle 3 and second baffle 4, base plate 2,
First baffle 3 and second baffle 4 surround the transfer passage 5 of inclination；The initiating terminal of transfer passage 5 is connected with feeding mechanism, conveying
The end of passage 5 is connected with the initiating terminal of feed belt 15.
First block piece 6 and the second block piece 7 is telescopic is arranged in second baffle 4, in the present embodiment, the first stop
Part 6 is connected with the first telescopic cylinder 11, and the second block piece 7 is connected with the second telescopic cylinder 12, and the first block piece 6 is along LED unit
The conveying direction of part is located at the downstream of the second block piece 7.
First block piece 6 and the second block piece 7 are separated out one section of test for testing LED element in transfer passage 5
Passage 8；It is provided with the first relative conductive electrode 9 and the second conductive electrode 10, the first conductive electrode 9 and second in TCH test channel 8
Conductive electrode 10 is all connected with wire.First conductive electrode 9 is fixedly mounted on second baffle 4；Second conductive electrode 10 activity
Setting, specifically, the second conductive electrode 10 is connected with the 3rd telescopic cylinder 13, thus the second conductive electrode 10 and the first conductive electricity
The spacing of pole 9 is adjustable.
So that the attitude that LED element enters transfer passage is after feeding mechanism arranges LED element in an orderly manner：LED electrode
Relative with first baffle 3 and second baffle 4 respectively.During original state, the first block piece 6 stretches out, and the second block piece 7 is retracted,
In the presence of gravity, LED element enters TCH test channel 8 along transfer passage, and now the second block piece 7 stretches out so that LED element
Position is fixed in TCH test channel.Second conductive electrode 10, under the driving of the 3rd telescopic cylinder 13, stretches out default distance, the
Two conductive electrodes 10 apply certain dynamics to LED element so that the LED electrode of LED element both sides is conductive with first electric respectively
Pole 9 and the second conductive electrode 10 make electrical contact with, and are now tested according to conventional meanses.After the completion of test, the first block piece 6 contracts
Return, under gravity, LED element enters feed belt along transfer passage.After LED element discharges TCH test channel, the
One block piece 6 stretches out again, and the second block piece 7 is retracted so that next LED element enters TCH test channel.Repeat the above steps,
LED element can be completed endlessly test.
Abnormal and cannot find in order to prevent LED element from testing appearance in TCH test channel 8, the second conductive electrode 10 with
The relative one side of LED element is provided with pressure transducer, thus when the second conductive electrode 10 stretches out extruding LED element, if pressure
Power exceeds preset range, just sends warning, reminds staff to check.If the second conductive electrode 10 stretches out default distance
Afterwards, pressure is less than preset range, also can send warning.
Because the species of the LED element in current industry is various, specification has multiple, for various sizes of LED unit
Part is tested, and needs to adjust the width of transfer passage, is easy to LED element and glides by preset posture, therefore second baffle 4 is set to can
Activity, specifically, base plate 2 is provided with the length direction two parallel chutes 14 vertical with second baffle 4, and bolt passes through to be slided
Second baffle 4 is installed on a base plate 2 by groove 14, and base plate 2 is provided with the quarter of spacing between measurement first baffle 3 and second baffle 4
Degree chi 18.When needing the width adjusting transfer passage, the position that only need to unclamp the mobile second baffle of bolt and bolt is to rule
Upper corresponding position, then retorque, fixing second baffle.
In order to screen the LED element of test failure further, it is provided with the side of feed belt 15 initiating terminal
Scraping wings 16, scraping wings 16 is connected with the 4th telescopic cylinder 17.When the LED element test failure in TCH test channel, pusher
Inappropriate LED element can be released feed belt by plate 16.It should be noted that the Synchronization Control of pushing course can be according to work
Needing of making selects different modes to realize, and such as the situation and passing through of putting in place of LED element monitored by setting infrared sensor
PLC system is realized.
Those of ordinary skill in the art will be appreciated that, embodiment described here is to aid in reader and understands this
Bright principle is it should be understood that protection scope of the present invention is not limited to such special statement and embodiment.This area
Those of ordinary skill can make various other each without departing from present invention essence according to these technology disclosed by the invention enlightenment
Plant concrete deformation and combine, these deform and combine still within the scope of the present invention.
Claims (3)
1. a kind of device for testing LED element it is characterised in that：Including the frame (1) for installing each assembly, frame
(1) it is provided with the base plate (2) of inclination, base plate (2) upper surface is parallel to be provided with first baffle (3) and second baffle (4), base plate
(2), first baffle (3) and second baffle (4) surround the transfer passage (5) of inclination；First block piece (6) and the second block piece
(7) telescopic be arranged in second baffle (4), the first block piece (6) and the second block piece (7) separate in transfer passage (5)
Go out one section of TCH test channel (8) for testing LED element；It is provided with relative the first conductive electrode (9) and in TCH test channel (8)
Two conductive electrodes (10), the first conductive electrode (9) is fixedly mounted on second baffle (4)；Second conductive electrode (10) activity sets
Put, adjustable with the spacing of the first conductive electrode (9)；
The initiating terminal of described transfer passage (5) is connected with feeding mechanism, and the end of transfer passage (5) is risen with feed belt (15)
Top is connected；The side of described feed belt (15) initiating terminal is provided with scraping wings (16), scraping wings (16) and the 4th telescopic cylinder
(17) it is connected.
2. the device for testing LED element according to claim 1 it is characterised in that：Described first block piece (6) with
First telescopic cylinder (11) is connected, and the second block piece (7) is connected with the second telescopic cylinder (12).
3. the device for testing LED element according to claim 1 it is characterised in that：Described first block piece (6) is suitable
The conveying direction LED element is located at the downstream of the second block piece (7).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610754056.5A CN106405363A (en) | 2016-08-29 | 2016-08-29 | Device used for testing LED components |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610754056.5A CN106405363A (en) | 2016-08-29 | 2016-08-29 | Device used for testing LED components |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106405363A true CN106405363A (en) | 2017-02-15 |
Family
ID=58003021
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610754056.5A Withdrawn CN106405363A (en) | 2016-08-29 | 2016-08-29 | Device used for testing LED components |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106405363A (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201268511Y (en) * | 2008-06-27 | 2009-07-08 | 格兰达技术（深圳）有限公司 | Transfer mechanism and conveying feeding apparatus using the same |
| CN202421374U (en) * | 2011-12-27 | 2012-09-05 | 赣州市超越精密电子有限公司 | Three-in-one slope automatic test machine |
| CN202631690U (en) * | 2012-06-13 | 2012-12-26 | 京东方科技集团股份有限公司 | Light-emitting diode (LED) element test device |
| US20150316604A1 (en) * | 2014-04-30 | 2015-11-05 | Kla-Tencor Corporation | Light-emitting device test systems |
-
2016
- 2016-08-29 CN CN201610754056.5A patent/CN106405363A/en not_active Withdrawn
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201268511Y (en) * | 2008-06-27 | 2009-07-08 | 格兰达技术（深圳）有限公司 | Transfer mechanism and conveying feeding apparatus using the same |
| CN202421374U (en) * | 2011-12-27 | 2012-09-05 | 赣州市超越精密电子有限公司 | Three-in-one slope automatic test machine |
| CN202631690U (en) * | 2012-06-13 | 2012-12-26 | 京东方科技集团股份有限公司 | Light-emitting diode (LED) element test device |
| US20150316604A1 (en) * | 2014-04-30 | 2015-11-05 | Kla-Tencor Corporation | Light-emitting device test systems |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20170215 |
|
| WW01 | Invention patent application withdrawn after publication |