CN106226038A - A kind of LED element test device - Google Patents
A kind of LED element test device Download PDFInfo
- Publication number
- CN106226038A CN106226038A CN201610753195.6A CN201610753195A CN106226038A CN 106226038 A CN106226038 A CN 106226038A CN 201610753195 A CN201610753195 A CN 201610753195A CN 106226038 A CN106226038 A CN 106226038A
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- CN
- China
- Prior art keywords
- baffle
- led element
- conductive electrode
- block piece
- base plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a kind of LED element test device, including frame, frame is provided with the base plate of inclination, and parallel the first baffle plate and the second baffle of being provided with of plate upper surface, base plate, the first baffle plate and second baffle surround the transfer passage of inclination；First block piece and the second block piece is telescopic is arranged in second baffle, the first block piece and the second block piece are separated out one section for the TCH test channel testing LED element in transfer passage；Being provided with the first relative conductive electrode and the second conductive electrode in TCH test channel, the first conductive electrode is fixedly mounted on second baffle；Second conductive electrode activity is arranged, adjustable with the spacing of the first conductive electrode.LED element provided by the present invention test device, is extruded with the LED electrode of LED element both sides respectively by the first conductive electrode and the second conductive electrode and contacts realization electrical connection, thus complete test.
Description
Technical field
The invention belongs to LED element technical field of measurement and test, be specifically related to a kind of LED element test device.
Background technology
Semiconductor LED is a kind of important opto-electronic device, and it all has the widest in scientific research and industrial and agricultural production
General application.Though light emitting diode is little, but accurately to measure its every light and a radiation parameter not easy thing.
Existing method of testing, is the welding that the two poles of the earth of single LED lamp carry out wire.Fig. 3 is prior art LED lamp
Structural representation, including LED element 19 and the LED electrode 20 of its both sides, Fig. 4 is the side view of LED element 19, due to LED unit
The size limitation of part own, is welded on wire on LED electrode more difficulty, is often easily damaged LED element itself, to LED unit
Part sample causes waste；Still further aspect is less due to the resistance of LED element own, and the welding kesistance that welding method causes is to it
Impact is relatively big, when carrying out LED test, causes test the data precision the highest.
Summary of the invention
Present invention aim to address the problems referred to above, it is provided that a kind of LED element test device.
For solving above-mentioned technical problem, the technical scheme is that a kind of LED element test device, including for pacifying
Filling the frame of each assembly, frame is provided with the base plate of inclination, and plate upper surface is parallel is provided with the first baffle plate and second baffle, the end
Plate, the first baffle plate and second baffle surround the transfer passage of inclination；First block piece and the second block piece is telescopic is arranged in
Second baffle, the first block piece and the second block piece are separated out one section in transfer passage and lead to for testing the test of LED element
Road；Being provided with the first relative conductive electrode and the second conductive electrode in TCH test channel, the first conductive electrode is fixedly mounted on second
On baffle plate；Second conductive electrode activity is arranged, adjustable with the spacing of the first conductive electrode；Described base plate be provided with length direction with
The chute that second baffle is vertical, second baffle is arranged on base plate by bolt through chute；Described base plate is provided with measurement first
The rule of spacing between baffle plate and second baffle.
Preferably, described second conductive electrode and the 3rd telescopic cylinder are connected.
Preferably, described first block piece is positioned at the downstream of the second block piece along the conveying direction of LED element.
The invention has the beneficial effects as follows:
1, LED element provided by the present invention test device, by the first conductive electrode and the second conductive electrode respectively with
The LED electrode extruding contact of LED element both sides realizes electrical connection, thus completes test, solves in prior art owing to welding is made
The LED element become is damaged and the impact of welding kesistance.
2, second baffle is movably arranged, thus can adjust the width of transfer passage easily, is suitable for different specification size
The test of LED element.
Accompanying drawing explanation
Fig. 1 is the structural representation of LED element of the present invention test device；
Fig. 2 is the side view of transfer passage of the present invention；
Fig. 3 is the structural representation of prior art LED lamp；
Fig. 4 is the side view for LED element.
Description of reference numerals: 1, frame；2, base plate；3, the first baffle plate；4, second baffle；5, transfer passage；6, the first resistance
Block piece；7, the second block piece；8, TCH test channel；9, the first conductive electrode；10, the second conductive electrode；11, the first telescopic cylinder；
12, the second telescopic cylinder；13, the 3rd telescopic cylinder；14, chute；15, feed belt；16, scraping wings；17, the 4th stretches gas
Cylinder；18, rule；19, LED element；20, LED electrode.
Detailed description of the invention
The present invention is described further with specific embodiment below in conjunction with the accompanying drawings:
As depicted in figs. 1 and 2, a kind of LED element test device of the present invention, including the frame 1 for installing each assembly,
Frame 1 is provided with the base plate 2 of inclination, and base plate 2 upper surface is parallel is provided with the first baffle plate 3 and second baffle 4, base plate 2, first gear
Plate 3 and second baffle 4 surround the transfer passage 5 of inclination；The initiating terminal of transfer passage 5 is connected with feeding mechanism, transfer passage 5
End is connected with the initiating terminal of feed belt 15.
First block piece 6 and the telescopic second baffle 4 that is arranged in of the second block piece 7, in the present embodiment, first stops
Part 6 is connected with the first telescopic cylinder 11, and the second block piece 7 is connected with the second telescopic cylinder 12, and the first block piece 6 is along LED unit
The conveying direction of part is positioned at the downstream of the second block piece 7.
First block piece 6 and the second block piece 7 are separated out one section for the test testing LED element in transfer passage 5
Passage 8；The first relative conductive electrode 9 and the second conductive electrode 10, the first conductive electrode 9 and second it is provided with in TCH test channel 8
Conductive electrode 10 is all connected with wire.First conductive electrode 9 is fixedly mounted on second baffle 4；Second conductive electrode 10 is movable
Arranging, concrete, the second conductive electrode 10 is connected with the 3rd telescopic cylinder 13, thus the second conductive electrode 10 and the first conduction electricity
The spacing of pole 9 is adjustable.
After feeding mechanism arranges LED element in an orderly manner so that LED element enters the attitude of transfer passage and is: LED electrode
Relative with the first baffle plate 3 and second baffle 4 respectively.During original state, the first block piece 6 stretches out, and the second block piece 7 is retracted,
Under the effect of gravity, LED element enters TCH test channel 8 along transfer passage, and now the second block piece 7 stretches out so that LED element
Position is fixed in TCH test channel.Second conductive electrode 10, under the driving of the 3rd telescopic cylinder 13, stretches out default distance, the
Two conductive electrodes 10 apply certain dynamics to LED element so that the LED electrode of LED element both sides is electric with the first conduction respectively
Pole 9 and the second conductive electrode 10 make electrical contact with, and now test according to conventional means.After having tested, the first block piece 6 contracts
Returning, under gravity, LED element enters feed belt along transfer passage.After LED element discharges TCH test channel, the
One block piece 6 stretches out again, and the second block piece 7 is retracted so that next LED element enters TCH test channel.Repeat the above steps,
LED element can be completed test endlessly.
Abnormal and cannot find in order to prevent LED element from testing appearance in TCH test channel 8, the second conductive electrode 10 with
The relative one side of LED element is provided with pressure transducer, thus when the second conductive electrode 10 stretches out extruding LED element, if pressure
Power exceeds preset range, just sends warning, reminds staff to check.If the second conductive electrode 10 stretches out default distance
After, pressure is less than preset range, also can send warning.
Of a great variety due to the LED element in current industry, specification has multiple, for various sizes of LED unit
Part is tested, and needs to adjust the width of transfer passage, it is simple to LED element glides by preset posture, therefore be set to by second baffle 4 can
Movable, concrete, base plate 2 is provided with two parallel chutes 14 that length direction is vertical with second baffle 4, and bolt is through sliding
Second baffle 4 is installed on a base plate 2 by groove 14, and base plate 2 is provided with measures the quarter of spacing between the first baffle plate 3 and second baffle 4
Degree chi 18.When needing the width adjusting transfer passage, only need to unclamp bolt moves the position of second baffle and bolt to rule
Upper corresponding position, then retorque, fixing second baffle.
In order to further the LED element of test failure be screened, it is provided with in the side of feed belt 15 initiating terminal
Scraping wings 16, scraping wings 16 is connected with the 4th telescopic cylinder 17.When LED element test failure in TCH test channel, pusher
Inappropriate LED element can be released feed belt by plate 16.It should be noted that the Synchronization Control of pushing course can be according to work
Needing of making selects different modes to realize, and such as arranges the infrared sensor monitoring situation that puts in place of LED element and passes through
PLC system realizes.
Those of ordinary skill in the art it will be appreciated that embodiment described here be to aid in reader understanding this
Bright principle, it should be understood that protection scope of the present invention is not limited to such special statement and embodiment.This area
It is each that those of ordinary skill can make various other without departing from essence of the present invention according to these technology disclosed by the invention enlightenment
Planting concrete deformation and combination, these deform and combine the most within the scope of the present invention.
Claims (3)
1. a LED element test device, it is characterised in that: including the frame (1) for installing each assembly, frame sets on (1)
There is the base plate (2) of inclination, parallel the first baffle plate (3) and the second baffle (4) of being provided with of base plate (2) upper surface, base plate (2), first
Baffle plate (3) and second baffle (4) surround the transfer passage (5) of inclination；First block piece (6) and the second block piece (7) are scalable
Be arranged in second baffle (4), the first block piece (6) and the second block piece (7) be separated out in transfer passage (5) one section for
The TCH test channel (8) of test LED element；Relative the first conductive electrode (9) and the second conductive electrode it is provided with in TCH test channel (8)
(10), the first conductive electrode (9) is fixedly mounted on second baffle (4)；Second conductive electrode (10) is movable to be arranged, and leads with first
The spacing of electricity electrode (9) is adjustable；
Described base plate (2) is provided with the chute (14) that length direction is vertical with second baffle (4), bolt through chute (14) by the
Two baffle plates (4) are arranged on base plate (2)；
Described base plate (2) is provided with measures the rule (18) of spacing between the first baffle plate (3) and second baffle (4).
LED element the most according to claim 1 test device, it is characterised in that: described second conductive electrode (10) and the
Three telescopic cylinders (13) are connected.
LED element the most according to claim 1 test device, it is characterised in that: described first block piece (6) is along LED
The conveying direction of element is positioned at the downstream of the second block piece (7).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610753195.6A CN106226038A (en) | 2016-08-29 | 2016-08-29 | A kind of LED element test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610753195.6A CN106226038A (en) | 2016-08-29 | 2016-08-29 | A kind of LED element test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106226038A true CN106226038A (en) | 2016-12-14 |
Family
ID=58071183
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610753195.6A Pending CN106226038A (en) | 2016-08-29 | 2016-08-29 | A kind of LED element test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106226038A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109186688A (en) * | 2018-11-02 | 2019-01-11 | 魏国艳 | Detection box for testing LED lamp |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070164729A1 (en) * | 2006-01-16 | 2007-07-19 | Ingenia Holdings (Uk) Limited | Verification of Performance Attributes of Packaged Integrated Circuits |
| CN201268511Y (en) * | 2008-06-27 | 2009-07-08 | 格兰达技术（深圳）有限公司 | Transfer mechanism and conveying feeding apparatus using the same |
| CN202421374U (en) * | 2011-12-27 | 2012-09-05 | 赣州市超越精密电子有限公司 | Three-in-one slope automatic test machine |
| CN202631690U (en) * | 2012-06-13 | 2012-12-26 | 京东方科技集团股份有限公司 | Light-emitting diode (LED) element test device |
| CN202693747U (en) * | 2012-07-18 | 2013-01-23 | 京东方科技集团股份有限公司 | Testing platform for LED (light emitting diode) element |
| US20150057961A1 (en) * | 2012-05-07 | 2015-02-26 | Flextronics Ap, Llc. | Universal device multi-function test apparatus |
-
2016
- 2016-08-29 CN CN201610753195.6A patent/CN106226038A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070164729A1 (en) * | 2006-01-16 | 2007-07-19 | Ingenia Holdings (Uk) Limited | Verification of Performance Attributes of Packaged Integrated Circuits |
| CN201268511Y (en) * | 2008-06-27 | 2009-07-08 | 格兰达技术（深圳）有限公司 | Transfer mechanism and conveying feeding apparatus using the same |
| CN202421374U (en) * | 2011-12-27 | 2012-09-05 | 赣州市超越精密电子有限公司 | Three-in-one slope automatic test machine |
| US20150057961A1 (en) * | 2012-05-07 | 2015-02-26 | Flextronics Ap, Llc. | Universal device multi-function test apparatus |
| CN202631690U (en) * | 2012-06-13 | 2012-12-26 | 京东方科技集团股份有限公司 | Light-emitting diode (LED) element test device |
| CN202693747U (en) * | 2012-07-18 | 2013-01-23 | 京东方科技集团股份有限公司 | Testing platform for LED (light emitting diode) element |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109186688A (en) * | 2018-11-02 | 2019-01-11 | 魏国艳 | Detection box for testing LED lamp |
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| C06 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
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| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20161214 |
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| RJ01 | Rejection of invention patent application after publication |