CN106405303A - Electronic component test method and test system under high acceleration shock - Google Patents
Electronic component test method and test system under high acceleration shock Download PDFInfo
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- CN106405303A CN106405303A CN201611075685.1A CN201611075685A CN106405303A CN 106405303 A CN106405303 A CN 106405303A CN 201611075685 A CN201611075685 A CN 201611075685A CN 106405303 A CN106405303 A CN 106405303A
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- electronic components
- shock
- measurement jig
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M7/00—Vibration-testing of structures; Shock-testing of structures
- G01M7/08—Shock-testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
The invention discloses an electronic component test method under high acceleration shock. The test method comprises the steps that S10 an even number of electronic component samples are locked in a sample storage tank on a positive cube test fixture; S20 the lower surface of the test fixture is close to the upper surface of a shock table, and the test fixture is locked on the shock table; S30, the shock table, the test fixture locked on the shock table and the electronic component samples locked on the test fixture are dropped down along a lift track from motionless from a preset drop height at the same time, and hit a test bench on the test platform; and high acceleration shock generated by drop hit is transferred to the electronic component samples through the test fixture; and S50 whether each electronic component sample after high acceleration shock is failed or damaged is detected. According to the invention, high acceleration shock of the test fixture can be uniformly transferred to the electronic components to reduce the attenuation and deformation of the test fixture.
Description
Technical field
The present invention relates to electronic components technical field of measurement and test, the survey of electronic components under more particularly to high acceleration shock
Method for testing and test system.
Background technology
Electronic components complete encapsulation after it will usually test to electronic components finished product, such as burn-in test, electricity
Property test, tensile test etc., to guarantee the quality of production and the qualification rate of electronic components finished product.
However, some portable electronic products (such as mobile phone, ipad etc.), it is susceptible to collide or drop；And touching
Produce shock wave when hitting or dropping so that the electronic components within electronic product wreck, and then electronic product is caused
The destructive consequence of unrepairable.Therefore, test of dropping becomes the quality of production and the qualification rate of detection electronic components finished product
One of standard.
At present, the acceleration shock within the test system that drops in prior art only enables 2900G tests (international standard),
The high acceleration shock test more than 2900G cannot be realized.The test system that dropped in using prior art is carried out more than 2900G's
During high acceleration shock test, there is following defect：(1) measurement jig is susceptible to decay and deforms.(2) testing efficiency low,
Test result error is big, and the difference of the high acceleration shock power that each electronic components sample is subject to cannot meet international norm and require
Tolerance.
Content of the invention
The technical scheme that the present invention provides is as follows：
Under a kind of high acceleration shock that the present invention provides, the method for testing of electronic components, comprises the following steps：S10, general
Even number electronic components sample is tightly locked in the sample placing trough on regular cube measurement jig, even number electronic components sample
Product are centrosymmetric setting with regard to the center of described measurement jig；S20, the lower surface of described measurement jig is close to shock testing machine
Upper surface, and described measurement jig is locked on described shock testing machine, the central shaft of described measurement jig coincides with described punching
Hit the central shaft of platform；S30, make described shock testing machine, the measurement jig being tightly locked on described shock testing machine and be tightly locked in described test
Electronic components sample on tool, is dropped downwards by static along fluctuating orbit at default drop height simultaneously, and clashes into
Testing base on described test platform；By described measurement jig to described electronic components sample transmission drop shock when
The high acceleration shock producing；S50, detection complete whether each the electronic components sample after high acceleration shock breaks down or damage
Bad.
Further, also included before described step 10：S01, not tight lock there is the measurement jig of electronic components sample
Lower surface be close to the upper surface of described shock testing machine, and described measurement jig is locked on described shock testing machine, described test
The central shaft of tool coincides with the central shaft of described shock testing machine；S02, the impact acceleration being got according to acceleration transducer
Value, adjusts the drop height of described shock testing machine, and described shock testing machine drops to the pad on described test platform；So that it is described
Shock testing machine along described fluctuating orbit by static drop downwards when, with described testing base clash into produced by tune machine impact plus
Velocity amplitude is located in the range of high acceleration shock.
Further, also included before described step 50：S40, the impact acceleration being got according to acceleration transducer
Value, judges described impact acceleration value whether in default test scope, and described default test scope refers to that the impact of tune machine accelerates
The numerical value that angle value produces in deviation range；When described impact acceleration value is located in described default test scope, under execution
One step S41；S41, the described measurement jig of rotation are so as to another surface is as lower surface；
Repeat step S20～S41, described electronic components sample completes the high acceleration shock of six direction.
Further, the centrosymmetry degree of described measurement jig is less than 0.5mm.
Further, the flatness of described measurement jig is the hexahedro full symmetric design less than 0.2mm.
Further, the locking torsion that measurement jig described in described step S01/S20 is locked on described shock testing machine is 30N
～50N.
Further, described step S10 further includes：S11, even number electronic components sample is placed on described test
In sample placing trough on tool, the sample placing trough on each surface of described measurement jig can be placed with zero group of 1～4 electronics
Part sample.
Further, described step S10 further includes：S12, by outwardly first device on described electronic components sample
Part is placed on avoidance in the hole, and described avoidance hole is arranged on the bottom land of described sample placing trough.
Further, described step S10 further includes：S13, by described electronic components sample at least through 8 screws
Tightly it is locked in the sample placing trough on described measurement jig, 8 screws are evenly distributed on the week side of boss of each electronic components sample.
Further, when carrying out high acceleration shock test, the metal of preset strength is fabricated to regular cube measurement jig；
And having reinforcement hardness, the anodising of antistatic effect is carried out to the surface of this measurement jig.
The present invention also provides a kind of test system of electronic components under high acceleration shock, including：Regular cube test is controlled
Tool, at least provided with a sample placing trough on each surface of described measurement jig, even number electronic components sample is placed
And be tightly locked in described sample placing trough, even number electronic components are centrosymmetric and set with regard to the center of described measurement jig
Put；With regard to shock testing machine substantially symmetrical about its central axis, the lower surface of described measurement jig is close to the upper surface of described shock testing machine, and described
Measurement jig is locked on described shock testing machine, and the central shaft of described measurement jig coincides with the central shaft of described shock testing machine；Test
Platform, described test platform is provided with for running through the fluctuating orbit being located on shock testing machine, and testing base；Described impact
Platform, the measurement jig being tightly locked on described shock testing machine and the electronic components sample being tightly locked on described measurement jig can edges
Described fluctuating orbit is dropped downwards by static, and strikes against described testing base.
Further, described shock testing machine along described fluctuating orbit by static drop downwards carry out tune machine when, described test put down
Pad for accepting described shock testing machine is provided with platform.
Further, the side wall of described measurement jig offers through wires hole, described through wires hole supplies the company of acceleration transducer
Wiring passes through；Described acceleration transducer be used for obtaining described shock testing machine along described fluctuating orbit by static drop downwards when, with
Described testing base clash into produced by impact acceleration value.
Further, the centrosymmetry degree of described measurement jig is less than 0.5mm.
Further, the flatness of described measurement jig is the hexahedro full symmetric design less than 0.2mm.
Further, the locking torsion that described measurement jig is locked on described shock testing machine is 30N～50N.
Further, the bottom land of described sample placing trough is arranged the avoidance hole of depression inside oriented described measurement jig, institute
State outwardly components and parts on electronic components sample and be located at described avoidance in the hole.
Further, the sample placing trough on each surface of described measurement jig can be placed with 1～4 electronic components sample
Product.
Further, in described sample placing trough, the week side of boss of bottom land residing for electronic components sample is at least evenly arranged with eight
For the screw hole of screw insertion, described electronic components sample is tightly locked in described sample placing trough by described screw.
Further, when carrying out high acceleration shock test, regular cube measurement jig is to be made by the metal of preset strength
Become；And having reinforcement hardness, the anodising of antistatic effect is carried out to the surface of this measurement jig.
Compared with prior art, the method for testing of electronic components and test under a kind of high acceleration shock that the present invention provides
System has the advantages that：
1) in the present invention, electronic components are close to cube measurement jig, the high acceleration shock being subject to measurement jig
Power is evenly transferred on electronic components, reduces decay and the deformation of measurement jig.Even number electronic components centrosymmetry sets
Put so that the difference of high acceleration shock power that each electronic components sample is subject to disclosure satisfy that the tolerance that international norm requires
Value, also improves testing efficiency.
2) in the present invention when testing the high acceleration shock of six direction, for regular cube measurement jig it is only necessary to enter
Row once adjusts machine, namely adjusts drop height, pad；And traditionally, when testing the high acceleration shock in each direction, be respectively required for
Machine to be adjusted is once.Thus, The present invention reduces the tune machine number of times in test process, not only simplify and improve testing efficiency,
Also lifting means mobility and service life, and then saved maintenance cost.
3) in the present invention when testing the high acceleration shock of six direction, the electronic components sample on six direction is subject to
High acceleration shock power difference within 10%, meet the tolerance of international norm requirement；Improve test result data
Accuracy.
4) in the present invention setting of the centrosymmetry degree of measurement jig it is ensured that electronic components sample on six direction
The difference of the high acceleration shock that product are subject to, within 10%, meets the tolerance of international norm requirement.
5) in the present invention flatness setting, can prevent measurement jig produce because of unbalance stress decay and deform, contracting
The service life of short measurement jig.
6) in the present invention lock torsion setting, not only can prevent electronic components from coming off from measurement jig, also may be used
Uniformly transferred to each electronic components with the high acceleration shock power being subject to measurement jig, thus ensureing the electricity on six direction
The difference of the high acceleration shock that sub- spare part sample is subject to is within 10%.
7) 1～24 electronic components can be tested in the present invention simultaneously, not only save testing cost, also greatly improved
Testing efficiency；In addition, also extending the service life of test system.
Brief description
Below by the way of clearly understandable, preferred implementation is described with reference to the drawings, to electricity under a kind of high acceleration shock
The above-mentioned characteristic of the method for testing of sub- spare part and test system, technical characteristic, advantage and its implementation give furtherly
Bright.
Fig. 1 is the schematic flow sheet of the method for testing of electronic components under a kind of high acceleration shock of the present invention；
Fig. 2 is the part schematic flow sheet of the method for testing of electronic components under the high acceleration shock of the present invention；
Fig. 3 is the schematic flow sheet of the method for testing of electronic components under another kind of high acceleration shock of the present invention；
Fig. 4 is the schematic flow sheet of step S10 in the present invention；
Fig. 5 is the structural representation of the test system of electronic components under a kind of high acceleration shock of the present invention；
Fig. 6 is that in the test system of electronic components under a kind of high acceleration shock of the present invention, measurement jig is tightly locked in shock testing machine
On structural representation.
Drawing reference numeral explanation：
10th, electronic components sample, 20, measurement jig, 21, screw, 22, acceleration transducer, 30, shock testing machine, 40, rise
Fall track, 50, testing base, 60, pad.
Specific embodiment
In order to be illustrated more clearly that the embodiment of the present invention or technical scheme of the prior art, brief description will be compareed below
The specific embodiment of the present invention.It should be evident that drawings in the following description are only some embodiments of the present invention, for
For those of ordinary skill in the art, on the premise of not paying creative work, other can also be obtained according to these accompanying drawings
Accompanying drawing, and obtain other embodiments.
For making simplified form, each in figure only schematically show part related to the present invention, and they do not represent
It is as the practical structures of product.In addition, so that simplified form readily appreciates, there is identical structure or function in some in figures
Part, only symbolically depicts one of, or has only marked one of.Herein, " one " not only represents
" only this " is it is also possible to represent the situation of " more than one ".
As shown in figure 1, according to one embodiment of present invention, the test side of electronic components under a kind of high acceleration shock
Method, comprises the following steps：S10, sample even number electronic components sample 10 being tightly locked on regular cube measurement jig 20
In placing trough, even number electronic components sample 10 is centrosymmetric setting with regard to the center of described measurement jig 20；Electronics zero
Assembly sample 10 includes SiP, part, the sample such as PCBA；Described electronic components sample 10 can be two, four, six etc..
The interior thickness of described measurement jig 20 is 10 centimeters, and the specification of described measurement jig 20 is 122*122*122mm.Measurement jig
20 and the fixed screw holes centre-to-centre spacing that drops between platform be 5cm multiple because screw center distance 5cm on the platform that drops.Survey
The diameter of examination tool 20 and the fixed screw holes between platform that drop is 9.2mm, because the standing screw of M8 to be used.
S20, the lower surface of described measurement jig 20 is close to the upper surface of shock testing machine 30, and by described measurement jig 20
It is locked on described shock testing machine 30, the central shaft of described measurement jig 20 coincides with the central shaft of described shock testing machine 30.
S30, make described shock testing machine 30, the measurement jig 20 being tightly locked on described shock testing machine 30 and be tightly locked in described survey
Electronic components sample 10 on examination tool 20, is fallen downwards along fluctuating orbit 40 by static at default drop height simultaneously
Fall, described fluctuating orbit 40 is set to two, and strike against the testing base 50 on described test platform, when not having on test platform
When having setting testing base 50, then shock testing machine 30 strikes against the upper surface of described test platform；By described measurement jig 20 to
Described electronic components sample 10 transmits the high acceleration shock producing when clashing into that drops.
S50, detection complete whether each the electronic components sample 10 after high acceleration shock breaks down or damage；Fault
Or damage detection includes detect electronic components sample 10 on components and parts whether fall off, and/or utilize detecting instrument or
Energising, whether detection electronic components sample 10 is capable of the function of itself, and/or hinders on detection electronic components sample 10
The break-make of anti-value.When no be capable of itself function when, be after having tested the high acceleration shock of six direction, by zero group of electronics
Part carries out Function detection after dismantling from measurement jig 20 down；When detect whether to fall off or resistance value break-make, be to survey
After having tried the high acceleration shock in each direction, come off or the break-make of resistance value is detected.
As shown in Figure 2 and Figure 3, according to one embodiment of present invention, under a kind of high acceleration shock electronic components test
Method, comprises the following steps：Preferably, also include S01, not tight lock has under the measurement jig 20 of electronic components sample 10
The upper surface of described shock testing machine 30 is close on surface, and described measurement jig 20 is locked on described shock testing machine 30, described survey
The central shaft of examination tool 20 coincides with the central shaft of described shock testing machine 30；
Preferably, also include S02, the impact acceleration value getting according to acceleration transducer 22, adjust described impact
The drop height of platform 30, and described shock testing machine 30 drops to the pad 60 on described test platform, adjusting described pad 60 is
The species of finger adjusting gasket 60, quantity, thickness；Described shock testing machine 30 is dropped downwards along described fluctuating orbit 40 by static
When, with described testing base 50 clash into produced by tune machine impact acceleration value be located at high acceleration shock in the range of.Adjusting
During section board, first start examination from relatively low height and adjust, then be stepped up height to reach desired value.During such as target 3000G, typically
First test-run a machine platform height 70cm, collects G-value 2000G；Increase by 5 more every time and arrive 10cm, be finally reached object height and G-value.
S10, even number electronic components sample 10 is tightly locked in the sample placing trough on regular cube measurement jig 20,
Even number electronic components sample 10 is centrosymmetric setting with regard to the center of described measurement jig 20；Electronic components sample 10
Including SiP, part, the sample such as PCBA；Described electronic components sample 10 can be two, four, six etc..Described test is controlled
The interior thickness of tool 20 is 10 centimeters, and the specification of described measurement jig 20 is 122*122*122mm.Measurement jig 20 with drop flat
Fixed screw holes centre-to-centre spacing between platform is the multiple of 5cm, because screw center distance 5cm on the platform that drops.Measurement jig 20 with
The diameter of the fixed screw holes between platform of dropping is 9.2mm, because the standing screw of M8 to be used.
S20, the lower surface of described measurement jig 20 is close to the upper surface of shock testing machine 30, and by described measurement jig 20
It is locked on described shock testing machine 30, the central shaft of described measurement jig 20 coincides with the central shaft of described shock testing machine 30.
S30, make described shock testing machine 30, the measurement jig 20 being tightly locked on described shock testing machine 30 and be tightly locked in described survey
Electronic components sample 10 on examination tool 20, is fallen downwards along fluctuating orbit 40 by static at default drop height simultaneously
Fall, described fluctuating orbit 40 is set to two, and strike against the testing base 50 on described test platform, when not having on test platform
When having setting testing base 50, then shock testing machine 30 strikes against the upper surface of described test platform；By described measurement jig 20 to
Described electronic components sample 10 transmits the high acceleration shock producing when clashing into that drops.
S40, the impact acceleration value being got according to acceleration transducer 22, judge that whether described impact acceleration value exists
In default test scope, described default test scope refers to the numerical value that tune machine impact acceleration value produces in deviation range；Permit
Permitted impact acceleration value in the range of error 10% adjusting machine impact acceleration value；When described impact acceleration value is located at default survey
When in the range of examination, execute next step；
S41, the described measurement jig 20 of rotation are so as to another surface is as lower surface；Repeat step S20～S41, electronics
Spare part sample 10 completes the high acceleration shock of six direction.
S50, detection complete whether each the electronic components sample 10 after high acceleration shock breaks down or damage；Fault
Or damage detection includes detect electronic components sample 10 on components and parts whether fall off, and/or utilize detecting instrument or
Energising, whether detection electronic components sample 10 is capable of the function of itself, and/or hinders on detection electronic components sample 10
The break-make of anti-value.When no be capable of itself function when, be after having tested the high acceleration shock of six direction, by zero group of electronics
Part carries out Function detection after dismantling from measurement jig 20 down；When detect whether to fall off or resistance value break-make, be to survey
After having tried the high acceleration shock in each direction, come off or the break-make of resistance value is detected.
As shown in Figure 2 to 4, according to one embodiment of present invention, under a kind of high acceleration shock electronic components survey
Method for testing, comprises the following steps：
Preferably, the lower surface also include S01, not tight lock being had the measurement jig 20 of electronic components sample 10 is close to
The upper surface of described shock testing machine 30, and described measurement jig 20 is locked on described shock testing machine 30, described measurement jig 20
Central shaft coincides with the central shaft of described shock testing machine 30；
Preferably, also include S02, the impact acceleration value getting according to acceleration transducer 22, adjust described impact
The drop height of platform 30, and described shock testing machine 30 drops to the pad 60 on described test platform, adjusting described pad 60 is
The species of finger adjusting gasket 60, quantity, thickness；Described shock testing machine 30 is dropped downwards along described fluctuating orbit 40 by static
When, with described testing base 50 clash into produced by tune machine impact acceleration value be located at high acceleration shock in the range of.
S10, even number electronic components sample 10 is tightly locked in the sample placing trough on regular cube measurement jig 20,
Even number electronic components sample 10 is centrosymmetric setting with regard to the center of described measurement jig 20；Electronic components sample 10
Including SiP, part, the sample such as PCBA；Described electronic components sample 10 can be two, four, six etc..Described test is controlled
The interior thickness of tool 20 is 10 centimeters, and the specification of described measurement jig 20 is 122*122*122mm.Measurement jig 20 with drop flat
Fixed screw holes centre-to-centre spacing between platform is the multiple of 5cm, because screw center distance 5cm on the platform that drops.Measurement jig 20 with
The diameter of the fixed screw holes between platform of dropping is 9.2mm, because the standing screw of M8 to be used.
Preferably, step S10 further includes：S11, even number electronic components sample 10 is placed on described test controls
In sample placing trough on tool 20, the sample placing trough on described each surface of measurement jig 20 can be placed with 1～4 electronics zero
Assembly sample 10, can test 1～24 electronic components sample 10 simultaneously；When zero group of 4 electronics are placed with each surface
During part sample 10,24 electronic components samples 10 can be tested simultaneously；When 1 electronic components sample is placed with each surface
During product 10,6 electronic components samples 10 can be tested simultaneously；Improve testing efficiency.Or, described measurement jig 20 every
1～4 sample placing trough is provided with individual surface, 1 sample placing trough in each sample placing trough, can be placed.
S12, outwardly components and parts on described electronic components sample 10 are placed on avoidance in the hole, described avoidance hole
It is arranged on the bottom land of described sample placing trough.
S13, the sample described electronic components sample 10 being tightly locked at least through 8 screws 21 on described measurement jig 20
In product placing trough, 8 screws 21 are evenly distributed on the week side of boss of each electronic components sample 10；Described screw 21 can also be 12
Etc..
S20, the lower surface of described measurement jig 20 is close to the upper surface of shock testing machine 30, and by described measurement jig 20
It is locked on described shock testing machine 30, the central shaft of described measurement jig 20 coincides with the central shaft of described shock testing machine 30.
S30, make described shock testing machine 30, the measurement jig 20 being tightly locked on described shock testing machine 30 and be tightly locked in described survey
Electronic components sample 10 on examination tool 20, is fallen downwards along fluctuating orbit 40 by static at default drop height simultaneously
Fall, described fluctuating orbit 40 is set to two, and strike against the testing base 50 on described test platform, when not having on test platform
When having setting testing base 50, then shock testing machine 30 strikes against the upper surface of described test platform；By described measurement jig 20 to
Described electronic components sample 10 transmits the high acceleration shock producing when clashing into that drops.
S40, the impact acceleration value being got according to acceleration transducer 22, judge that whether described impact acceleration value exists
In default test scope, described default test scope refers to the numerical value that tune machine impact acceleration value produces in deviation range；When
When described impact acceleration value is located in default test scope, execute next step；
S41, the described measurement jig 20 of rotation are so as to another surface is as lower surface；Repeat step S20～S41, electronics
Spare part sample 10 completes the high acceleration shock of six direction.
S50, detection complete whether each the electronic components sample 10 after high acceleration shock breaks down or damage；Fault
Or damage detection includes detect electronic components sample 10 on components and parts whether fall off, and/or utilize detecting instrument or
Energising, whether detection electronic components sample 10 is capable of the function of itself, and/or hinders on detection electronic components sample 10
The break-make of anti-value.When no be capable of itself function when, be after having tested the high acceleration shock of six direction, by zero group of electronics
Part carries out Function detection after dismantling from measurement jig 20 down；When detect whether to fall off or resistance value break-make, be to survey
After having tried the high acceleration shock in each direction, come off or the break-make of resistance value is detected.
The centrosymmetry degree of described measurement jig 20 is less than 0.5mm, and the centrosymmetry degree of described measurement jig 20 can be
0.5mm, the centrosymmetry degree of described measurement jig 20 can be 0.3mm, and the centrosymmetry degree of described measurement jig 20 is acceptable
It is 0.1mm, the centrosymmetry degree of described measurement jig 20 can also be 0.05mm.If tool is not symmetric design easily to test
Curve produces impact, causes not up to standard；Thus, the value of symmetry is the smaller the better.
The flatness of described measurement jig 20 is the hexahedro full symmetric design less than 0.2mm, described measurement jig 20
Flatness can be 0.2mm, and the flatness of described measurement jig 20 can be 0.15mm, and the flatness of described measurement jig 20 can
To be 0.1mm, the flatness of described measurement jig 20 can also be 0.06mm.
Measurement jig 20 described in described step S01/S20 be locked at locking torsion on described shock testing machine 30 be 30N～
50N, described clavicle torsion can take 30N, and described clavicle torsion can take 50N, and described clavicle torsion can take 40N, described lock
Bone torsion can take 35N, and described clavicle torsion can take 45N.
Preferably, when carrying out high acceleration shock (more than 2900G) test, the metal of preset strength is fabricated to just cube
Body measurement jig 20；And having reinforcement hardness, the anodising of antistatic effect is carried out to the surface of described measurement jig 20；When
When carrying out low acceleration shock (below 2900G) test, regular cube measurement jig 20 can be made by the metal of preset strength
Become, such as aluminium alloy or rustless steel；Regular cube measurement jig 20 can also be made by the timber of preset strength, example
As chock.
As shown in Figure 5, Figure 6, according to one embodiment of present invention, under a kind of high acceleration shock electronic components test
System, including：Regular cube measurement jig 20, each surface of described measurement jig 20 is placed at least provided with a sample
Groove, even number electronic components sample 10 is placed and is tightly locked in described sample placing trough, and even number electronic components are with regard to institute
The center stating measurement jig 20 is centrosymmetric setting；
With regard to shock testing machine 30 substantially symmetrical about its central axis, the lower surface of described measurement jig 20 is close to the upper of described shock testing machine 30
Surface, and described measurement jig 20 is locked on described shock testing machine 30, the central shaft of described measurement jig 20 coincides with described punching
Hit the central shaft of platform 30；
Test platform, described test platform is provided with for running through the fluctuating orbit 40 being located on shock testing machine 30, and
Testing base 50；Described shock testing machine 30, the measurement jig 20 being tightly locked on described shock testing machine 30 and be tightly locked in described test and control
Electronic components sample 10 on tool 20 can be dropped downwards along described fluctuating orbit 40 by static, and strikes against described testing base
50.
As a kind of way of example, described shock testing machine 30 drop along described fluctuating orbit 40 carry out tune machine when, described
Pad 60 for accepting described shock testing machine 30 is provided with test platform.
As a kind of way of example, the side wall of described measurement jig 20 offers through wires hole, described through wires hole is for adding
The connecting line of velocity sensor 22 passes through；Described acceleration transducer 22 is used for obtaining described shock testing machine 30 along described fluctuating orbit
40 when dropping, with described test platform clash into produced by impact acceleration value.
As a kind of way of example, the centrosymmetry degree of described measurement jig 20 is less than 0.5mm, described measurement jig 20
Centrosymmetry degree can be 0.5mm, the centrosymmetry degree of described measurement jig 20 can be 0.4mm, described measurement jig 20
Centrosymmetry degree can also be 0.2mm, the centrosymmetry degree of described measurement jig 20 can also be 0.15mm.
As a kind of way of example, the flatness of described measurement jig 20 is to set less than the hexahedro full symmetric of 0.2mm
Meter, the flatness of described measurement jig 20 can be 0.2mm, and the flatness of described measurement jig 20 can be 0.16mm, described
The flatness of measurement jig 20 can be 0.12mm, and the flatness of described measurement jig 20 can also be 0.08mm.
As a kind of way of example, the locking torsion that described measurement jig 20 is locked on described shock testing machine 30 is 30N
～50N, described clavicle torsion can take 30N, and described clavicle torsion can take 50N, and described clavicle torsion can take 40N, described
Clavicle torsion can take 38N, and described clavicle torsion can take 48N.
As a kind of way of example, the bottom land of described sample placing trough arranges oriented described measurement jig 20 inner side recessed
Sunken avoidance hole, on described electronic components sample 10, outwardly components and parts are located at described avoidance in the hole.
As a kind of way of example, the sample placing trough on described each surface of measurement jig 20 can be placed with 1～4
Electronic components sample 10, can test 1～24 electronic components sample 10 simultaneously；When 4 electricity are placed with each surface
During sub- spare part sample 10,24 electronic components samples 10 can be tested simultaneously；When 1 electronics zero is placed with each surface
During assembly sample 10,6 electronic components samples 10 can be tested simultaneously；Improve testing efficiency.Or, described measurement jig
1～4 sample placing trough is provided with 20 each surface, 1 sample placing trough in each sample placing trough, can be placed.
As a kind of way of example, in described sample placing trough, the week side of boss of bottom land residing for electronic components sample 10 is at least
It is evenly arranged with eight screw holes supplying screw 21 insertion, described electronic components sample 10 is tightly locked in by described screw 21
In sample placing trough；Described screw hole may be arranged as 12 etc..
As a kind of way of example, when carrying out high acceleration shock (more than 2900G) test, regular cube measurement jig
20 is to be fabricated to by the metal of preset strength；And the surface of this measurement jig carried out have and strengthen hardness, antistatic effect
Anodising.When carrying out low acceleration shock (below 2900G) test, regular cube measurement jig 20 can be by preset strength
Metal be fabricated to, such as aluminium alloy or rustless steel；Regular cube measurement jig 20 can also be by the timber of preset strength
It is made, for example chock.
It should be noted that above-described embodiment all can independent assortment as needed.The above is only the preferred of the present invention
Embodiment it is noted that for those skilled in the art, in the premise without departing from the principle of the invention
Under, some improvements and modifications can also be made, these improvements and modifications also should be regarded as protection scope of the present invention.
Claims (20)
1. under a kind of high acceleration shock the method for testing of electronic components it is characterised in that comprising the following steps：
S10, even number electronic components sample is tightly locked in the sample placing trough on regular cube measurement jig, even number electricity
Sub- spare part sample is centrosymmetric setting with regard to the center of described measurement jig；
S20, the lower surface of described measurement jig is close to the upper surface of shock testing machine, and described measurement jig is locked at described
On shock testing machine, the central shaft of described measurement jig coincides with the central shaft of described shock testing machine；
S30, make described shock testing machine, the measurement jig being tightly locked on described shock testing machine and be tightly locked on described measurement jig
Electronic components sample, is dropped downwards along fluctuating orbit by static at default drop height simultaneously, and strikes against described survey
Testing base on examination platform；The height producing when dropping and clash into the transmission of described electronic components sample by described measurement jig
Acceleration shock；
S50, detection complete whether each the electronic components sample after high acceleration shock breaks down or damage.
2. as claimed in claim 1 under high acceleration shock the method for testing of electronic components it is characterised in that in described step
Also included before 10：
S01, the lower surface that not tight lock is had the measurement jig of electronic components sample are close to the upper surface of described shock testing machine, and
Described measurement jig is locked on described shock testing machine, the central shaft of described measurement jig coincides with the center of described shock testing machine
Axle；
S02, the impact acceleration value being got according to acceleration transducer, adjust the drop height of described shock testing machine, Yi Jisuo
State shock testing machine and drop to the pad on described test platform；Described shock testing machine is dropped downwards along described fluctuating orbit by static
When, with described testing base clash into produced by tune machine impact acceleration value be located at high acceleration shock in the range of.
3. as claimed in claim 2 under high acceleration shock the method for testing of electronic components it is characterised in that in described step
Also included before 50：
Whether S40, the impact acceleration value being got according to acceleration transducer, judge described impact acceleration value in default survey
In the range of examination, described default test scope refers to the numerical value that tune machine impact acceleration value produces in deviation range；
When described impact acceleration value is located in described default test scope, execute next step S41；
S41, the described measurement jig of rotation are so as to another surface is as lower surface；
Repeat step S20～S41, described electronic components sample completes the high acceleration shock of six direction.
4. as claimed in claim 1 under high acceleration shock electronic components method of testing it is characterised in that：Described test is controlled
The centrosymmetry degree of tool is less than 0.5mm.
5. as claimed in claim 1 under high acceleration shock electronic components method of testing it is characterised in that：Described test is controlled
The flatness of tool is the hexahedro full symmetric design less than 0.2mm.
6. as claimed in claim 2 under high acceleration shock electronic components method of testing it is characterised in that：Described step
The locking torsion that measurement jig described in S01/S20 is locked on described shock testing machine is 30N～50N.
7. under the high acceleration shock as described in any one in claim 1～6 electronic components method of testing, its feature exists
In described step S10 further includes：
S11, even number electronic components sample is placed in the sample placing trough on described measurement jig, described measurement jig
Sample placing trough on each surface can be placed with 1～4 electronic components sample.
8. as claimed in claim 7 under high acceleration shock the method for testing of electronic components it is characterised in that described step
S10 further includes：
S12, outwardly components and parts on described electronic components sample are placed on avoidance in the hole, described avoidance hole is arranged on
The bottom land of described sample placing trough.
9. as claimed in claim 7 under high acceleration shock the method for testing of electronic components it is characterised in that described step
S10 further includes：
S13, the sample placing trough described electronic components sample being tightly locked at least through 8 screws on described measurement jig
Interior, 8 screws are evenly distributed on the week side of boss of each electronic components sample.
10. under the high acceleration shock as described in any one in claim 1～6 electronic components method of testing, its feature
It is：When carrying out high acceleration shock test, the metal of preset strength is fabricated to regular cube measurement jig；And to this test
The surface of tool carries out thering is reinforcement hardness, the anodising of antistatic effect.
Under a kind of 11. high acceleration shock, the test system of electronic components is it is characterised in that include：
Regular cube measurement jig, at least provided with a sample placing trough, even number on each surface of described measurement jig
Electronic components sample is placed and is tightly locked in described sample placing trough, and even number electronic components are with regard to described measurement jig
Center is centrosymmetric setting；
With regard to shock testing machine substantially symmetrical about its central axis, the lower surface of described measurement jig is close to the upper surface of described shock testing machine, and institute
State measurement jig to be locked on described shock testing machine, the central shaft of described measurement jig coincides with the central shaft of described shock testing machine；
Test platform, described test platform is provided with for running through the fluctuating orbit being located on shock testing machine, and testing base；
Described shock testing machine, the measurement jig being tightly locked on described shock testing machine and be tightly locked in the electronic components on described measurement jig
Sample can be dropped downwards along described fluctuating orbit by static, and strikes against described testing base.
12. as claimed in claim 11 under high acceleration shock electronic components test system it is characterised in that：In described punching
Hit platform along described fluctuating orbit by static drop downwards carry out tune machine when, described test platform is provided with for accepting described punching
Hit the pad of platform.
13. as claimed in claim 11 under high acceleration shock electronic components test system it is characterised in that：Described test
Through wires hole is offered on the side wall of tool, described through wires hole supplies the connecting line of acceleration transducer to pass through；Described acceleration sensing
Device be used for obtaining described shock testing machine along described fluctuating orbit by static drop downwards when, occur to clash into described testing base and produced
Raw impact acceleration value.
14. as claimed in claim 11 under high acceleration shock electronic components test system it is characterised in that：Described test
The centrosymmetry degree of tool is less than 0.5mm.
15. as claimed in claim 11 under high acceleration shock electronic components test system it is characterised in that：Described test
The flatness of tool is the hexahedro full symmetric design less than 0.2mm.
16. as claimed in claim 11 under high acceleration shock electronic components test system it is characterised in that：Described test
The locking torsion that tool is locked on described shock testing machine is 30N～50N.
17. as described in claim 11 under high acceleration shock electronic components test system it is characterised in that：Described sample
The avoidance hole of depression inside oriented described measurement jig is arranged on the bottom land of product placing trough, on described electronic components sample outwards
The components and parts protruding are located at described avoidance in the hole.
The test system of electronic components under high acceleration shock as described in any one in 18. such as claim 11～17, it is special
Levy and be：Sample placing trough on each surface of described measurement jig can be placed with 1～4 electronic components sample.
19. as claimed in claim 18 under high acceleration shock electronic components test system it is characterised in that：Described sample
The week side of boss of bottom land residing for electronic components sample in placing trough is at least evenly arranged with eight screw holes supplying screw insertion, described
Electronic components sample is tightly locked in described sample placing trough by described screw.
The test system of electronic components under high acceleration shock as described in any one in 20. such as claim 11～17, it is special
Levy and be：When carrying out high acceleration shock test, regular cube measurement jig is to be fabricated to by the metal of preset strength；And to this
The surface of measurement jig carries out thering is reinforcement hardness, the anodising of antistatic effect.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201611075685.1A CN106405303A (en) | 2016-11-30 | 2016-11-30 | Electronic component test method and test system under high acceleration shock |
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| CN201611075685.1A CN106405303A (en) | 2016-11-30 | 2016-11-30 | Electronic component test method and test system under high acceleration shock |
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Application publication date: 20170215 |