CN103454057A - Test method of shock resistance in LCDs - Google Patents

Test method of shock resistance in LCDs Download PDF

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Publication number
CN103454057A
CN103454057A CN 201210175100 CN201210175100A CN103454057A CN 103454057 A CN103454057 A CN 103454057A CN 201210175100 CN201210175100 CN 201210175100 CN 201210175100 A CN201210175100 A CN 201210175100A CN 103454057 A CN103454057 A CN 103454057A
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China
Prior art keywords
specimen
impact
sine wave
lcd
testing according
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Pending
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CN 201210175100
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Chinese (zh)
Inventor
周明杰
王永清
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Oceans King Lighting Science and Technology Co Ltd
Shenzhen Oceans King Lighting Science and Technology Co Ltd
Oceans King Dongguan Lighting Technology Co Ltd
Shenzhen Oceans King Lighting Engineering Co Ltd
Original Assignee
Oceans King Lighting Science and Technology Co Ltd
Oceans King Dongguan Lighting Technology Co Ltd
Shenzhen Oceans King Lighting Engineering Co Ltd
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Application filed by Oceans King Lighting Science and Technology Co Ltd, Oceans King Dongguan Lighting Technology Co Ltd, Shenzhen Oceans King Lighting Engineering Co Ltd filed Critical Oceans King Lighting Science and Technology Co Ltd
Priority to CN 201210175100 priority Critical patent/CN103454057A/en
Publication of CN103454057A publication Critical patent/CN103454057A/en
Pending legal-status Critical Current

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Abstract

A test method of shock resistance in LCDs includes the steps of a, pretreating a test sample and adjusting energy of half-sine wave shock applied by an impact bench; b, applying half-sine wave shock to one of +/-X, +/-Y and +/-Z axes in rectangular axes of the test sample; c, detecting whether the test sample is abnormal or not; if not entering the step d; d, judging whether the energy of half-sine wave shock reaches a limit or not; if yes, entering the step e; if not, increasing the energy of the half-sine wave shock, and returning to the step b. The test method has the advantages that half-sine wave shocks of different energies are applied in different axial directions to the LCDs, whether the parts of each LCD are defective or not in design is judged according to whether display statuses of the LCD and the structure of the parts of the LCD are abnormal or not, and accordingly the failure limit of the LCD can be tested and designers can be assisted in finding out the weakness in shock resistance of the LCD.

Description

A kind of LCD impact resistance method of testing
Technical field
The present invention relates to a kind of LCD impact resistance method of testing, relate in particular to multiaxis to LCD impact resistance method of testing.
Background technology
Along with the LCD application is more and more extensive, the demand of LCD is also increasing, but thereby the transportation package technology of LCD is not caught up with the development of demand and is caused LCD to be easy to due to the environmental disruption that is hit in production, carrying and transportation, cause unnecessary loss to enterprise, or even cause client's loss.The deviser solves the above problems and just needs a kind ofly can test out LCD the experience a shock limit of destroying the shock resistance weakness method of testing wherein of knowing LCD, so that can carry out effectively design prevention from design.
The method of testing of prior art is that the cushion pad that impacts podium level and laying by adjustment is controlled impact velocity and duration, although prior art simply can only be measured the breaking limit of LCD, can not help the deviser to find out the shock proof weakness of LCD.
Summary of the invention
The technical problem to be solved in the present invention is to overcome the deficiency that above-mentioned prior art exists, and proposes a kind of LCD impact resistance method of testing, can not measure the problem of the shock proof weakness of LCD to solve LCD impact resistance method of testing of the prior art.
For solving the problems of the technologies described above, the present invention proposes a kind of LCD impact resistance method of testing, and this method of testing comprises: step a. carries out the impact energy of the pre-service half-sine wave impact that also adjusting impact board discharges to preset value to specimen; Step b. to the rectangular axes ± X of specimen, ± Y and ± in axially one of six of Z axially imposes half-sine wave and impacts; Whether step c detects specimen and occurs extremely entering if not steps d; Steps d. judge whether value of reaching capacity of impact energy that half-sine wave impacts, if, enter step e, if not, the impact energy that increases the half-sine wave impact is also got back to step b; Step e. judges whether six of specimen axially all tested and pass through, and if not, changes specimen and accepts the axial of half-sine wave impact and get back to step a, if judge that specimen is qualified.
Preferably, in step c, if enter step g, step g is direct logging test results.
Preferably, the preset value of step a is 140G/2ms.
Preferably, the ultimate value that the ultimate value of steps d can be born for impacting platform.
Preferably, the ultimate value that the impact platform can bear is 300G/2ms.
Preferably, the pre-service of step a comprises specimen is fixed on and impacts on platform, makes specimen in normal operating conditions and records the picture quality situation of specimen.
Preferably, the detection specimen of step c specifically comprises:
Specimen is carried out the picture quality inspection and/or specimen is taken apart inner components performance and tautness inspection.
Preferably, the test result of step g specifically comprises test process and failure phenomenon.
The concrete steps of the intensity that preferably, the increase half-sine wave of steps d is impacted are to increase the impact energy of half-sine wave impact with the amplitude of variation of 20G/2ms.
Compared with prior art, beneficial effect of the present invention comprises: the present invention is by the different half-sine waves of using different impact energys on axially, impacting LCD is impacted, with the demonstration situation of LCD and each several part structure whether occur extremely judging this position whether exist design defect to realize can measure LCD breaking limit can help again the deviser to find out the effect of the shock proof weakness of LCD.
The accompanying drawing explanation
The process flow diagram of the LCD impact resistance method of testing that Fig. 1 is the embodiment of the present invention.
The structural representation of the impact board that Fig. 2 is the embodiment of the present invention.
Embodiment
In order to further illustrate principle of the present invention and structure, existing by reference to the accompanying drawings to a preferred embodiment of the present invention will be described in detail.
Refer to Fig. 1, the invention provides a kind of LCD impact resistance method of testing, the method comprises
Step a: specimen is carried out to the impact energy of the pre-service half-sine wave impact that also adjusting impact board discharges to preset value;
The pre-service of step a comprises specimen is fixed on and impacts on platform, makes specimen in normal operating conditions and records the picture quality situation of specimen.The preset value of step a is 140G/2ms.
The purpose of step a be at first recorded the duty of the sample before test convenient with test after the sample situation compare, regulate impact energy the carrying out that extremely suitable preset value can conveniently be tested and the validity of guaranteeing follow-up test, too high preset value may directly wash out specimen, the shock resistance limit of knowing sample that can't be relatively accurate, and too low preset value may additionally increase a large amount of testing times, produce unnecessary waste.In the present embodiment, preset value is 140G/2ms, and in other embodiments, preset value can be set other numerical value for according to the difference of specimen.
Step b: to the rectangular axes ± X of specimen, ± Y and ± in axially one of six of Z axially imposes half-sine wave and impacts.
The purpose of step b is the collision phenomenon in transportation by half-sine wave shock simulation specimen, and the impact resistance of sample is tested.
Step c: detect specimen and whether occur extremely; If enter step g; If not, enter steps d.
The detection specimen of step c specifically comprises: specimen is carried out the picture quality inspection and/or specimen is taken apart inner components performance and tautness inspection.
Whether the quality status recorded in the picture quality of the sample after the purpose of step c is accept to impact and step a compares with judgement sample and has occurred extremely after accepting to impact, whether the inner body that reexamines sample occurs because of impacting to become flexible, and can judge whether occur extremely to sample under this impact energy more comprehensively.
Step g: direct logging test results.
The test result of step g specifically comprises test process and failure phenomenon.
The purpose of step g is to occur when abnormal after sample test process and failure phenomenon record when sample, thereby the designer can conveniently find out the weak link on sample structure by the data analysis to record, with the modification on being designed, make the shock resistance of product improve, for example: find after accept impacting that screw occurs loosening, the designer just can change the modes such as model that fixed form changes screw into other fixed forms or replacing screw and solve fault of construction.
Steps d: judge whether value of reaching capacity of impact energy that half-sine wave impacts, if, enter step e, if not, the impact energy that increases the half-sine wave impact is also got back to step b.
The purpose of steps d is, impact energy by continuous increase half-sine wave, make repeatedly impact energy after test reach the shock resistance limit of sample, so repeatedly continual increase impact energy can be so that when appearance be abnormal, and the error between the shock resistance limit of impact energy and sample can not surpass the value that impact energy once increase.In the present embodiment, the concrete steps that increase the intensity of half-sine wave impact are to increase the impact energy of half-sine wave impact with the amplitude of variation of 20G/2ms, select the purpose of 20G/2ms to be that the amplitude of this increase can too littlely not cause additionally repeatedly testing the shock resistance limit that just can reach sample, also not too large and cause error excessive.
In the present embodiment, the ultimate value that ultimate value can be born for impacting platform, the ultimate value that the impact platform can bear is 300G/2ms.In other embodiments, according to dissimilar impact platform, the size of ultimate value also can be different, for example, and ultimate value also can be stipulated a concrete numerical value voluntarily: the impact energy bumped in usual transportation is generally 250G/2ms can be decided to be 280G/2ms by ultimate value.
Step e: axially whether all test and pass through for six that judge specimen, if not, change specimen and accept the axial of half-sine wave impact and get back to step a, if judge that specimen is qualified.
When the impact that the purpose of step e is to have accepted on axially at when specimen ultimate value does not have abnormal, prove that this specimen has met requirement on this is axial, but the impact energy that while upwards giving with identical impact due to disalignment, part bears is not identical, so may cause originally not occurring that abnormal part goes wrong when disalignment upwards applies impact.
Because the LCD plate is generally rectangular parallelepiped, rectangular axes ± X, ± Y and ± six of Z axially can more comprehensively simulate various impacts in transit, so, after these six axial shock-testings are all passed through, judgement sample is qualified.
Refer to Fig. 2, impacting board comprises snubber assembly 1, suspension apparatus 2 and impacts platform 3, specimen 4 is fixed on impacts on platform 3, suspender 2 will impact platform 3 and be suspended on snubber assembly 1 level altitude place, top, during test, suspender 2 unclamps and impacts platform 3, impacts platform freely falling body and snubber assembly 1 collision to specimen generation impact.
Specimen 4 is that specimen 3 is accepted the one side of impacting with impacting the one side that platform 3 contact, change direction that specimen accepts to impact and only specimen 4 need to be changed to one and get final product towards retightening on impact platform 3.
In the present embodiment, 140G in 140G/2ms refers to and impacts platform 3 contact the acceleration that while producing impact, the impact platform is received with snubber assembly 1 be 140 acceleration of gravity, 2ms refers to the surge time 2ms that impacts platform 3 and snubber assembly 1, by theorem of momentum, just can calculate and impact the impulsive force produced.Amplitude of variation increase with 20G/2ms refers to 140G/2ms, 160G/2ms, the such mode of 180G/2ms, 200G/2ms increases.And this increase mode, thereby be snubber assembly 1 by using unlike material, change the thickness of snubber assembly 1 and/or increase suspender 2 and hang the height that impacts platforms 3 and make and impact the initial velocity that platform 3 contact with snubber assembly 1 under identical surge time and become greatly, the acceleration when impacting like this platform 3 and contacting with snubber assembly 1 will increase.
In sum, the present invention is by the different half-sine waves of using different impact energys on axially, impacting LCD is impacted, with the demonstration situation of LCD and each several part structure whether occur extremely judging this position whether exist design defect to realize can measure LCD breaking limit can help again the deviser to find out the effect of the shock proof weakness of LCD.
The foregoing is only better possible embodiments of the present invention, not limit the scope of the invention.Every equivalent structure or conversion of equivalent flow process that utilizes instructions of the present invention and accompanying drawing content to do, or directly or indirectly be used in other relevant technical fields, all in like manner be included in scope of patent protection of the present invention.

Claims (9)

1. a LCD impact resistance method of testing, is characterized in that, this method of testing comprises:
Step a. carries out the impact energy of the pre-service half-sine wave impact that also adjusting impact board discharges to preset value to described specimen;
Step b. to the rectangular axes ± X of described specimen, ± Y and ± in axially one of six of Z axially imposes described half-sine wave and impacts;
Whether step c detects described specimen and occurs extremely if not, entering steps d;
Steps d. judge whether value of reaching capacity of impact energy that described half-sine wave impacts, if, enter step e, if not, increase the impact energy of described half-sine wave impact and get back to step b;
Step e. judges whether six of described specimen axially all tested and pass through, and if not, changes described specimen and accepts the axial of half-sine wave impact and get back to step a, if judge that specimen is qualified.
2. method of testing according to claim 1, is characterized in that, in described step c, if enter step g, described step g is direct logging test results.
3. method of testing according to claim 1, is characterized in that, the preset value of described step a is 140G/2ms.
4. method of testing according to claim 1, is characterized in that, the ultimate value of described steps d is the ultimate value that described impact platform can bear.
5. method of testing according to claim 4, is characterized in that, the ultimate value that described impact platform can bear is 300G/2ms.
6. method of testing according to claim 1, is characterized in that, the pre-service of described step a comprises specimen is fixed on and impacts on platform, makes described specimen in normal operating conditions and record the picture quality situation of specimen.
7. method of testing according to claim 2, is characterized in that, the described specimen of the detection of described step c specifically comprises:
Specimen is carried out the picture quality inspection and/or specimen is taken apart inner components performance and tautness inspection.
8. method of testing according to claim 7, is characterized in that, the test result of described step g specifically comprises test process and failure phenomenon.
9. method of testing according to claim 1, is characterized in that, the concrete steps of the intensity that the described half-sine wave of the increase of described steps d is impacted increase for the amplitude of variation with 20G/2ms the impact energy that described half-sine wave is impacted.
CN 201210175100 2012-05-30 2012-05-30 Test method of shock resistance in LCDs Pending CN103454057A (en)

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Application Number Priority Date Filing Date Title
CN 201210175100 CN103454057A (en) 2012-05-30 2012-05-30 Test method of shock resistance in LCDs

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111157374A (en) * 2019-12-31 2020-05-15 同济大学 Semi-sinusoidal impact test method for evaluating performance of energy absorption pad with porous structure of automobile battery
CN112683478A (en) * 2020-12-29 2021-04-20 江苏奥斯汀光电科技股份有限公司 Device and method for detecting impact effect of vehicle-mounted liquid crystal display

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111157374A (en) * 2019-12-31 2020-05-15 同济大学 Semi-sinusoidal impact test method for evaluating performance of energy absorption pad with porous structure of automobile battery
CN112683478A (en) * 2020-12-29 2021-04-20 江苏奥斯汀光电科技股份有限公司 Device and method for detecting impact effect of vehicle-mounted liquid crystal display

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Application publication date: 20131218