CN106404168B - A kind of method for obtaining laser power meter different wave length correction factor - Google Patents
A kind of method for obtaining laser power meter different wave length correction factor Download PDFInfo
- Publication number
- CN106404168B CN106404168B CN201610859483.XA CN201610859483A CN106404168B CN 106404168 B CN106404168 B CN 106404168B CN 201610859483 A CN201610859483 A CN 201610859483A CN 106404168 B CN106404168 B CN 106404168B
- Authority
- CN
- China
- Prior art keywords
- power meter
- correction factor
- laser
- calibrated
- wavelength
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012937 correction Methods 0.000 title claims abstract description 16
- 238000000034 method Methods 0.000 title claims abstract description 10
- 238000005259 measurement Methods 0.000 claims abstract description 14
- 238000001228 spectrum Methods 0.000 claims abstract description 5
- 230000003595 spectral effect Effects 0.000 claims description 5
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 230000007812 deficiency Effects 0.000 abstract description 2
- 238000011160 research Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000003796 beauty Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0295—Constructional arrangements for removing other types of optical noise or for performing calibration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
Abstract
This patent discloses a kind of method for obtaining laser power meter different wave length correction factor.By measuring the correction factor under a certain wavelength of power meter, and measurement power meter detector spectrum response curve is combined, to obtain the correction factor of power meter under different wave length, the power accurate measurement of various wavelength lasers in its respective range can be used for.The beneficial effects of the invention are as follows：The project achievement in research provides a kind of method for obtaining correction factor under different light sources for laser power meter using unit, reduces its calibration amount at different wavelengths, reduces calibration cost；Avoid and be only used for the limitation for being calibrated wavelength, the working range that expansion of laser light power meter accurately measures；The limited deficiency of calibration lasing light emitter number is compensate for, the accurate measurement for new wavelength laser source provides possibility, and it is significant to accurately measure field in laser power.
Description
Technical field
This patent is a kind of method for obtaining laser power meter different wave length correction factor, is mainly used in gauge check field
With strict field of precision measurement.Especially in the very high ophthalmology laser of laser power accuracy requirement, beauty laser, military affairs
In laser and laser precision machining field, in the measurement process to laser power, the calibration measurement of laser power meter is very heavy
Will.
Background technology
Laser power meter is the instrument for measuring laser source power.Before accurately measuring, metering inspection is typically arrived
Survey department calibrates to power meter, to ensure the accuracy of testing result.Typically to the stabilized lasers source of a certain wavelength, use
Reference power meter measured value and the ratio between power meter measured value is calibrated, as the correction factor for being calibrated power meter.With this by school
When power meter measures other laser source powers of the wavelength, measurement result should be multiplied by correction factor, just can obtain this lasing light emitter
Calibration power value.Response of the detector of laser power meter to different wave length laser is different, therefore, under a certain wavelength
Correction factor obtained by calibration, it is only used for measuring the power measurement in the wavelength laser source.And it is used for multi-wavelength's Laser Measuring
The power meter of amount, it should multiple wavelength are calibrated, draw the correction factor under different wave length.And this is difficult to accomplish, a side
Face is due to experiment condition limitation, the laser of a lasing light emitter generally one to two kinds of wavelength of output, typically calibrates laser power meter
Standard set-up can not possibly be equipped with many lasing light emitters.On the other hand, the consigner for being calibrated instrument can also be caused very big
Financial burden.
The content of the invention
In view of the above problems, the invention provides a kind of method for obtaining laser power meter different wave length correction factor.It is logical
The adjusted coefficient K crossed under the measurement a certain wavelength of power meterλm, and measurement power meter detector spectrum response curve S (λ) is combined, come
Obtain the adjusted coefficient K of power meter under different wave lengthλn=Kλm×S(λm)/S(λn), it can be used for various in its respective range
The power accurate measurement of wavelength laser.
The beneficial effects of the invention are as follows：The project achievement in research provides a kind of acquisition difference for laser power meter using unit
The method of correction factor under light source, its calibration amount at different wavelengths is reduced, reduce calibration cost；Avoiding to use
In the working range that the limitation for being calibrated wavelength, expansion of laser light power meter accurately measure；It compensate for calibration lasing light emitter number
Limited deficiency, the accurate measurement for new wavelength laser source provide possibility, had in the laser power field of accurately measuring
Significance.
Brief description of the drawings
Fig. 1 is laser power meter correction factor detection method schematic block diagram at a particular wavelength.(101. stabilized lasers sources
102. standard laser power meter 103. is calibrated laser power meter)
Fig. 2 is the measuring method schematic block diagram of laser power meter detector spectral response curve.(the stable light of 201. wide spectrums
The standard detector 204. of 202. monochromator of source 203. is calibrated laser power meter detector)
Fig. 3 is a kind of detector spectral response curve for being calibrated laser power meter.
Embodiment
1st, as shown in figure 1, measuring same stabilized lasers source, reference power meter indicating value and the power meter indicating value phase being calibrated
Than acquisition is calibrated adjusted coefficient K of the power meter under the wavelength light sourceλm=PλmReference power meter indicating value/PλmIt is calibrated power
Count indicating value；
2nd, as shown in Fig. 2 wide spectrum stabilized light source is by monochromator output different wave length monochromatic light, respectively measurement standard spy
Survey device and be calibrated the output current value of the detector of power meter at different wavelengths, acquisition is calibrated power meter detector not
Spectral response curve S (λ)=I (λ) under co-wavelength is by school output current/I (λ) standard output electric current；
3rd, found on spectral response curve as shown in Figure 3 in 1st step and surveyed wavelength points λm, then the laser power meter exist
Adjusted coefficient K under other wavelengthλn=Kλm×S(λm)/S(λn)。
Claims (1)
1. a kind of method for obtaining laser power meter different wave length correction factor, including：(1) same stabilized lasers source, mark are measured
For quasi- power meter indicating value compared with the power meter indicating value being calibrated, acquisition is calibrated correction factor of the power meter under the wavelength light source
Kλm=Pλ m reference power meter indicating values/Pλ m are calibrated power meter indicating value；(2) wide spectrum stabilized light source is by monochromator output different wave length monochromatic light, difference
Measurement standard detector is calibrated power meter with being calibrated the output current value of the detector of power meter at different wavelengths, acquisition
Relative spectral response curve S (the λ)=I (λ) of detector at different wavelengthsBy school output current/I(λ)Standard output electric current；(3) laser power
Count the adjusted coefficient K under other wavelengthλn=Kλm×S(λm)/S(λn)。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610859483.XA CN106404168B (en) | 2016-09-29 | 2016-09-29 | A kind of method for obtaining laser power meter different wave length correction factor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610859483.XA CN106404168B (en) | 2016-09-29 | 2016-09-29 | A kind of method for obtaining laser power meter different wave length correction factor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106404168A CN106404168A (en) | 2017-02-15 |
| CN106404168B true CN106404168B (en) | 2018-01-23 |
Family
ID=58015604
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610859483.XA Expired - Fee Related CN106404168B (en) | 2016-09-29 | 2016-09-29 | A kind of method for obtaining laser power meter different wave length correction factor |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106404168B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106840391B (en) * | 2017-02-17 | 2019-03-26 | 中国人民解放军92493部队计量测试中心 | Broadband, large range laser power meter calibrating installation |
| CN108132097A (en) * | 2017-12-18 | 2018-06-08 | 北京泊菲莱科技有限公司 | A kind of detector probe, light power meter and optical power measurement method |
| CN112082737B (en) * | 2020-08-24 | 2022-06-24 | 中国电子科技集团公司第四十一研究所 | Terahertz pulse laser energy calibration device and method |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0600636A1 (en) * | 1992-11-19 | 1994-06-08 | Varian Associates, Inc. | Self-calibrated power meter |
| JPH11241946A (en) * | 1998-02-24 | 1999-09-07 | Miyachi Technos Corp | Laser output measuring device |
| JP2002048642A (en) * | 2000-08-01 | 2002-02-15 | Fujitsu Quantum Devices Ltd | Optical power measuring method and device |
| CN102353446A (en) * | 2011-07-08 | 2012-02-15 | 西安炬光科技有限公司 | Method and system for testing power of pulsing laser |
| JP2013171007A (en) * | 2012-02-22 | 2013-09-02 | Hioki Ee Corp | Optical power meter |
| CN105813344B (en) * | 2015-01-03 | 2018-02-06 | 珠海天启技术有限公司 | The optical power control system and control method of a kind of optical module |
| CN104836613A (en) * | 2015-05-13 | 2015-08-12 | 四川华拓光通信股份有限公司 | Method for calibrating receiving end optical power of optical module |
| CN105737977A (en) * | 2016-04-15 | 2016-07-06 | 博创科技股份有限公司 | Wide-range optical power meter |
-
2016
- 2016-09-29 CN CN201610859483.XA patent/CN106404168B/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN106404168A (en) | 2017-02-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Mondelain et al. | Broadband and highly sensitive comb-assisted cavity ring down spectroscopy of CO near 1.57 µm with sub-MHz frequency accuracy | |
| CN106404168B (en) | A kind of method for obtaining laser power meter different wave length correction factor | |
| WO2014106940A1 (en) | Gas absorption spectroscopy device and gas absorption spectroscopy method | |
| CN102384761B (en) | Method for calibrating absolute spectral response ratio of photoelectric detector | |
| EP2400284A2 (en) | Optical fiber temperature distribution measuring device | |
| EP3133380B1 (en) | Photodetector output correction method used for spectroscopic analyzer or spectroscope, spectroscopic analyzer or spectroscope using this method and program for spectroscopic analyzer or spectroscope instructing this method | |
| JP6863831B2 (en) | Calculation method of calculation formula for output correction of photodetector and output correction method of photodetector | |
| Hult et al. | Two-line atomic fluorescence flame thermometry using diode lasers | |
| CN108844641A (en) | A kind of combination unit and its wavelength measurement method for measuring laser absolute wavelength | |
| JP2017026506A5 (en) | ||
| TWI247464B (en) | Method and apparatus for measuring bandwidth of an optical spectrum output of a very small wavelength very narrow bandwidth high power laser | |
| Urabe et al. | Absorption spectroscopy using interference between optical frequency comb and single-wavelength laser | |
| JP4633103B2 (en) | Optical frequency measurement method and apparatus | |
| CN105004707B (en) | The online Raman spectrometer spectrogram standardized method of ccd array | |
| Weng et al. | Optical-fiber frequency domain interferometer with nanometer resolution and centimeter measuring range | |
| CN210464664U (en) | Full-waveband blank-window-free wavelength standard light source | |
| JPH0572039A (en) | Correcting method for spectrum of fluorescence spectrophotometer and fluorescence spectrophotometer with spectrum correcting function | |
| Kuvaldin et al. | Wide-range calibration of optical radiation power meters | |
| Zong | Wavelength calibration method for spectroradiometers with picometer uncertainties | |
| US20240044710A1 (en) | Deterioration evaluation method of line sensor, spectrum measurement device, and computer readable medium | |
| Alayli et al. | Compensation of the thermal influence on a high accuracy optical fibre displacement sensor | |
| Masi et al. | A compact system for measurement of absorbance of light | |
| Vasilyan et al. | Generation of static and dynamic small calibration forces and their measurements by electromagnetic force compensation balance | |
| Swann et al. | Accuracy limits for simple molecular absorption based wavelength references | |
| JP2013160651A (en) | Line spectrometric measurement apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB03 | Change of inventor or designer information | ||
| CB03 | Change of inventor or designer information |
Inventor after: Jia Yaqing Inventor after: Chen Chi Inventor after: Sun Xianglin Inventor after: Zhang Jianliang Inventor after: Cui Lei Inventor before: Jia Yaqing Inventor before: Sun Xianglin Inventor before: Zhang Jianliang Inventor before: Cui Lei |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180123 Termination date: 20190929 |