CN106383751A - Improved random access memory self-testing method - Google Patents

Improved random access memory self-testing method Download PDF

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Publication number
CN106383751A
CN106383751A CN201610846177.2A CN201610846177A CN106383751A CN 106383751 A CN106383751 A CN 106383751A CN 201610846177 A CN201610846177 A CN 201610846177A CN 106383751 A CN106383751 A CN 106383751A
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memory
internal memory
test
section
xor
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CN106383751B (en
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江伟
黄鸿
曹辉
刘晓
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Casco Signal Ltd
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Casco Signal Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/0727Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in a storage system, e.g. in a DASD or network based storage system
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1004Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Security & Cryptography (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

The present invention relates to an improved random access memory self-testing method. The method comprises the following steps: step S1, dividing a to-be-tested memory into multiple non-superimposed memory segments; step S2, self-testing each memory segment by using an Abraham algorithm; step S3, obtaining a CRC value of each test data XOR result in the to-be-tested memory in advance; step S4, before starting a memory test, filling the to-be-tested memory with all test data sequentially; step S5, after a test for each memory segment, calculating a CRC value of a data XOR result in a current memory segment for once; and step S6, comparing the CRC value that is calculated online with the CRC value that is calculated in advance, and if the two values are equal, obtaining a conclusion that the current memory segment is not coupled to other memory segments, and continuing a test for a next memory segment, and repeating step S5, and if the two values are different, obtaining a conclusion that coupling exists and terminating the algorithm. Compared with prior art, the method provided by the present invention has the advantages of finding a coupling failure among the memory segments after the test for RAM segments and improving self-testing execution efficiency of RAM, etc.

Description

A kind of improved random access memory self checking method
Technical field
The present invention relates to a kind of internal memory self checking method, especially relate to a kind of self-inspection of improved random access memory (RAM) Method.
Background technology
Distance between the state of the modern railway transportation industry various signaling system monitoring circuits of dependence and vehicle, vehicle etc., To avoid endangering the generation as collided, overstep the limit.Signaling system error may result in the function forfeiture that it evades harm, therefore to rail The signaling system of road transportation industry has high security requirement.
As a class Safety-Critical System, signaling system must meet multinomial safety specifications, and self-checking is then wherein One of most basic safe practice.
Abraham algorithm is the high coverage internal memory self-checking that IEC61508 recommends, if directly by this technology application In Safety-Critical System, then exist and take the deficiency longer, system real time is poor, the way of IEC61508 suggestion is interior Test (see Fig. 1) paragraph by paragraph after depositing segmentation, but this mode makes algorithm detect that in internal memory, all two internal storage locations couplings are lost The effect of effect (2- coupling was lost efficacy) is almost lost.
In order to solve this problem, the way of current main-stream equipment supplier is to do certain proportion between the internal memory of sectionalization test Superposition (see Fig. 2), but this way is almost no lifted with respect to the mode effect that memory sections are not superimposed, and efficiency but with Internal memory is shown in that the ratio of superposition increases and drastically declines.
Content of the invention
The purpose of the present invention is exactly to provide a kind of improved deposit at random to overcome the defect that above-mentioned prior art exists Take internal memory self checking method, couple inefficacy after having a case that to find RAM sectionalization test between each section of internal memory and improve RAM self-inspection and hold Line efficiency.
The purpose of the present invention can be achieved through the following technical solutions:
A kind of improved random access memory self checking method, comprises the following steps:
Step S1, internal memory to be measured is divided into multiple application heaps not being superimposed;
Step S2, every section of internal memory carries out self-inspection using Abraham algorithm;
Step S3, the crc value of each section of test data XOR result in precalculated internal memory to be measured;
Step S4, before starting MEMTEST, all test datas is inserted internal memory to be measured successively,;
Step S5, after every section of MEMTEST, calculates once the crc value of currently each section of data in EMS memory XOR result;
Step S6, the crc value calculating in crc value and the budget of line computation compares, if identical, thinks this section of internal memory No couple with other internal memories, proceed the test of next section of internal memory, repeat step S5, if difference, think discovery coupling, calculate Method terminates.
In described step S2, each section of internal memory uses different test datas.
Described test data includes 32 or 64.
Crc value in described step S3 is calculated as:Internal memory is divided into three sections, and test data is a, b, c respectively, then calculate CRC(a XOR b XOR c).
Crc value in described step S5 is calculated as:Currently each section of data in EMS memory is a ', b ', c ', then calculate CRC (a ' XOR b’XOR c’).
Compared with prior art, the present invention has advantages below:
1st, Abraham algorithm reads every time 8 data, and this method adopts 32 or 64 bit test data, same memory size, The time having executed an Abraham algorithm can be shortened, improve algorithm performs efficiency;
2nd, without superposition between the internal memory of this method segmentation, shorten the testing time, memory failure can be found more in time;
3rd, this method makes Abraham algorithm test effect and Abraham algorithm for whole section of internal memory for memory sections Test effect is identical.
Brief description
Coupling inefficacy not findable situation when Fig. 1 is not superimposed for memory sections;
Coupling inefficacy not findable situation when Fig. 2 is superimposed for memory sections;
Fig. 3 is the immunity that multibyte test data lost efficacy to 2- coupling;
Fig. 4 is Abraham algorithm application mode flow chart.
Specific embodiment
The present invention is described in detail with specific embodiment below in conjunction with the accompanying drawings.The present embodiment is with technical solution of the present invention Premised on implemented, give detailed embodiment and specific operating process, but protection scope of the present invention be not limited to Following embodiments.
The present invention to realize in terms of improving test data and Abraham algorithm segmentation application mode two.
1st, the improvement of test data:
Algorithm A once reads and writes 1 byte, i.e. 8 bit test data.If the multiple byte of read/write, that is, adopt 32 very To the test data of 64, make provable after a little changing remaining to reach the effect same with algorithm A:In algorithm A, interior deposit receipt Unit be 1 byte, accordingly 4 internal storage locations as an entirety it was demonstrated that method is identical with the effectiveness proof of algorithm A, can To draw the failure mode that can protect 0/1 solidification and 2- coupling between each 4 bytes.But now also needing to detect can between 4 internal storage locations Can coupling, the coupling between only 4 bytes can by byte between test data difference detecting that such as 0x5AA53CC3 is shown in Fig. 3.
For individual character test data, algorithm complex is reduced to 7.5n by 30n, and for double word test data, algorithm is complicated Degree is reduced to about 4n.
2nd, new algorithm segmentation application mode
Step S1, internal memory to be measured is divided into multiple application heaps not being superimposed;
Step S2, every section of internal memory adopts Abraham algorithm, using different test datas (32 or 64);
Step S3, the crc value of each section of test data XOR result in precalculated internal memory to be measured, such as internal memory is divided into three Section, test data is a, b, c respectively, then calculate CRC (a XOR b XOR c);
Step S4, before starting MEMTEST, all test datas is inserted internal memory to be measured successively,;
Step S5, after every section of MEMTEST, calculates once the crc value of currently each section of data in EMS memory XOR result, than As currently each section of data in EMS memory is a ', b ', c ', then calculate CRC (a ' XOR b ' XOR c ');
Step S6, the crc value calculating in crc value and the budget of line computation compares, identical, think this section of internal memory with Other internal memories no couple, and proceed the test of next section of internal memory, repeat step S5, and difference then thinks discovery coupling, and algorithm is eventually Only, see Fig. 4.
Algorithm principle:Because after segmentation, the coupling inefficacy self-inspection shown in Fig. 1 can not find, therefore need to be after the completion of the test of certain section Whether check other section of internal memory by the read-write coupling of this section of internal memory, because the test data of different segmentation is different, once coupling, Check that the data in other segmentations can find, data is more because a segmentation internal memory goes out, and relative efficiency is too low one by one, therefore adopts With crc mode unique to every section of Test data generation, to judge whether coupling occurs with checking whether crc changes, and to utilize The linear feature of crc, CRC (a) XOR CRC (b)=CRC (a XOR b), reduces CRC calculation times, and utilizes xor operation (XOR) shorten the length that crc calculates object, reduce efficiency losses.
Specific example
Scene:Internal memory 1G is had on certain board in certain real-time system, On-line self-diagnosis need to be done to wherein 128M specified memory, due to System has the characteristics that periodicity and real-time, gives the time execution Abraham algorithm of MEMTEST task in a cycle Only enough test 32M internal memory.In the case that available this method only surveys 32M internal memory in each cycle, survey completes oneself of 128M internal memory for 4 times Inspection, its Detection results is identical with the effect once completing 128M MEMTEST using Abraham algorithm A, you can to find to own Internal storage location 0/1 solidification lost efficacy and any two internal storage location coupling lost efficacy.
Realize step as follows:
Step 1, according to above scene, internal memory to be measured is divided into 4 sections first, numbering is seg1, seg2, seg3, seg4;
Step 2, by the use of random number generator generate unduplicated 32 randoms number as test data, the data of generation is divided Become 4 groups, abbreviation data a, b, c, d, they are the test data of seg1, seg2, seg3, seg4 respectively;
Step 3, calculated off line crc=CRC (a XOR b XOR c XOR d), wherein CRC () is that crc calculates function, and Also can use when subsequently online, therefore be realized with look-up table, to improve online computational efficiency, XOR is xor operation;
Step 4, when system starts to call internal memory self-inspection task, back up internal memory 128M to be measured in data to another internal memory Qu Zhong;
Step 5, copy test data a, b, c, d arrive seg1, seg2, seg3, seg4 respectively;
Step 6, to seg1 execute Abraham algorithm;
Step 7, seg1 has been executed with Abraham algorithm after it is assumed that now data is divided in seg1, seg2, seg3, seg4 It is not a ', b ', c ', d ', if internal memory does not have mistake, now a=a ', b=b ', c=c ', d=d ', then have CRC (a ' XOR b ' XOR c ' XOR d ')=crc, wherein crc is that step 3 is good in advance;
Step 8, calculating crc '=CRC (a ' XOR b ' XOR c ' XOR d ');
Whether step 9, to compare crc and crc ' equal:
1) if equal, original back-up data is copied back and surveys in internal memory, tell that Installed System Memory is normal, this cycle is certainly Inspection task terminates, and returns main task, waits the next cycle to call;
2) if unequal, memory abnormal is described, then tells that Installed System Memory is abnormal, return main task;
If the upper cycle memory of step 10 is normal, this periodic system then needs to continue test memory seg2, according to above-mentioned steps 4 ways arriving step 9 execute an Abraham algorithm to seg2 with data b, by that analogy.
The foregoing describe the specific embodiment of the present invention, need technical staff understand Abrahams algorithm, CRC algorithm, The knowledge such as coupling inefficacy, these are merely illustrative of, and protection scope of the present invention is defined by the appended claims.Ability The technical staff in domain, on the premise of the principle without departing substantially from the present invention and essence, can make numerous variations to these embodiments Or modification, but these changes and modification each fall within protection scope of the present invention.
The above, the only specific embodiment of the present invention, but protection scope of the present invention is not limited thereto, and any Those familiar with the art the invention discloses technical scope in, various equivalent modifications can be readily occurred in or replace Change, these modifications or replacement all should be included within the scope of the present invention.Therefore, protection scope of the present invention should be with right The protection domain requiring is defined.

Claims (5)

1. a kind of improved random access memory self checking method is it is characterised in that comprise the following steps:
Step S1, internal memory to be measured is divided into multiple application heaps not being superimposed;
Step S2, every section of internal memory carries out self-inspection using Abraham algorithm;
Step S3, the crc value of each section of test data XOR result in precalculated internal memory to be measured;
Step S4, before starting MEMTEST, all test datas is inserted internal memory to be measured successively;
Step S5, after every section of MEMTEST, calculates once the crc value of currently each section of data in EMS memory XOR result;
Step S6, the crc value calculating in crc value and the budget of line computation compares, if identical, think this section of internal memory and its He no couples internal memory, proceeds the test of next section of internal memory, repeat step S5, if difference, thinks discovery coupling, algorithm is eventually Only.
2. a kind of improved random access memory self checking method according to claim 1 is it is characterised in that described step In S2, each section of internal memory uses different test datas.
3. a kind of improved random access memory self checking method according to claim 2 is it is characterised in that described test Data includes 32 or 64.
4. a kind of improved random access memory self checking method according to claim 1 is it is characterised in that described step Crc value in S3 is calculated as:Internal memory is divided into three sections, and test data is a, b, c respectively, then calculate CRC (a XOR b XOR c).
5. a kind of improved random access memory self checking method according to claim 1 is it is characterised in that described step Crc value in S5 is calculated as:Currently each section of data in EMS memory is a ', b ', c ', then calculate CRC (a ' XOR b ' XOR c ').
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107943611A (en) * 2017-11-08 2018-04-20 天津国芯科技有限公司 A kind of quick control device for producing CRC
CN108153611A (en) * 2018-01-10 2018-06-12 芜湖美的厨卫电器制造有限公司 Fault self-detection method, fault self-checking device, microcontroller and readable storage medium storing program for executing

Citations (3)

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Publication number Priority date Publication date Assignee Title
CN1677576A (en) * 2005-02-01 2005-10-05 苏州超锐微电子有限公司 Method for realizing memory data check using look-up function instruction
CN1920783A (en) * 2005-08-24 2007-02-28 英业达股份有限公司 Method of testing memory
CN104346289A (en) * 2013-07-30 2015-02-11 联发科技股份有限公司 Table lookup apparatus and related table lookup method thereof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1677576A (en) * 2005-02-01 2005-10-05 苏州超锐微电子有限公司 Method for realizing memory data check using look-up function instruction
CN1920783A (en) * 2005-08-24 2007-02-28 英业达股份有限公司 Method of testing memory
CN104346289A (en) * 2013-07-30 2015-02-11 联发科技股份有限公司 Table lookup apparatus and related table lookup method thereof

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107943611A (en) * 2017-11-08 2018-04-20 天津国芯科技有限公司 A kind of quick control device for producing CRC
CN107943611B (en) * 2017-11-08 2021-04-13 天津国芯科技有限公司 Control device for quickly generating CRC
CN108153611A (en) * 2018-01-10 2018-06-12 芜湖美的厨卫电器制造有限公司 Fault self-detection method, fault self-checking device, microcontroller and readable storage medium storing program for executing
CN108153611B (en) * 2018-01-10 2021-02-23 芜湖美的厨卫电器制造有限公司 Fault self-checking method, fault self-checking device, microcontroller and readable storage medium

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