CN106301352A - A kind of based on the Anti-radioactive Fault-tolerant circuit design method with door or door with selector - Google Patents
A kind of based on the Anti-radioactive Fault-tolerant circuit design method with door or door with selector Download PDFInfo
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- CN106301352A CN106301352A CN201510252467.XA CN201510252467A CN106301352A CN 106301352 A CN106301352 A CN 106301352A CN 201510252467 A CN201510252467 A CN 201510252467A CN 106301352 A CN106301352 A CN 106301352A
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Abstract
The invention belongs to integrated circuit fields, relate to radiation-resistant circuit design method, be specifically related to a kind of based on the Anti-radioactive Fault-tolerant circuit design method with door or door with selector.The present invention with one with door, one or and one 2 select 1 selector construct one compare voting circuit; then by by the output of the main output of protection circuit and redundancy respectively with compare two input ports of voting circuit and be connected; when being caused its main output different from redundancy output numerical value by protection circuit because of radiation; relatively voting circuit output maintains initial value, will not export by the output valve of the possible mistake of protection circuit.Test result indicate that after tested, the wrong frequency of the present invention and triplication redundancy scheme is the most less and quite, their capability of resistance to radiation is close, but the area of the present invention and the area of power dissipation ratio triplication redundancy scheme and the little comparison of power consumption are many.
Description
Technical field
The invention belongs to integrated circuit fields, relate to radiation-resistant circuit design method, be specifically related to a kind of based on
Door or the Anti-radioactive Fault-tolerant circuit design method of door and selector.
Background technology
Along with the minimizing of process, the integrated circuit in chip is the most easily subject at high-rise space or near-earth spherical space
Affect to heavy particle or proton irradiation and produce mistake.Research display, radiation is if it occur that at circuit node, Ke Nengyin
Play single event transient pulse, change the logic state of circuit node.The improper value conduction that this single event transient pulse causes
It is also possible to the storage that is captured to memorizer.So single event transient pulse can change the logic state of circuit node, may
Cause circuit function mistake.Therefore, the relevant working practice in this area needs to propose to support radiation-resistant circuit design method.
The method for designing of the radiation hardened integrated circuit of prior art mainly comprises multi-mode redundant, error correcting code and radioprotective storage
Unit etc., wherein, multi-mode redundant method, with triplication redundancy technology as representative, uses redundant circuit module and majority voting
The output of circuits mask erroneous circuits module, but this method can bring the biggest area overhead；Error correction code approach is with the Chinese
Plain code is representative, by the check value of calculation code, the position of Wrong localization bit；Radioprotective memory element method with
Double interlock memory element is representative, increases extra transistor and the most stranded on the basis of basic unit of storage structure
Interconnection line, strengthen sensitive nodes capability of resistance to radiation；But error correcting code and radioprotective memory element can bring bigger face
Long-pending expense, and reduce circuit performance.
Based on this, present inventor intends for integrated circuit, propose a kind of based on door or door and selector
Anti-radioactive Fault-tolerant circuit design method.
List of references related to the present invention has:
[1]Baumann R.Soft Errors in Advanced Computer Systems[J],IEEE Transactions on
Device and Materials Reliability,2005,22(3),pp.258-266
[2] Oliveira R., Jagirdar A., Chakraborty T.J.:A TMR Scheme for SEU Mitigation in Scan
Flip-Flops [C], in International Symposium on Quality Electronic Design, 2007, pp.905
–910
[3]Tausch H.J.Simplified Birthday Statistics and Hamming EDAC[J],IEEE Transactions
on Nuclear Science,2009,56(2),pp.474–478
[4]Calin T.,Nicolaidis M.,Velazco R.Upset hardened memory design for submicron
CMOS technology[J],IEEE Transactions on Nuclear Science,1996,43(6),pp.
2874–2878
[5]S.Yang.Logic Synthesis and Optimization Benchmarks User Guide,Research Triangle
Park,NC:Microelectronics Center of North Carolina(MCNC),1991。
Summary of the invention
It is an object of the invention to for integrated circuit, propose one and support radiation-resistant circuit design method, especially a kind of
Based on the Anti-radioactive Fault-tolerant circuit design method with door or door with selector.
The present invention use one with door, one or and one 2 select 1 selector construct one compare voting circuit；Should
Relatively two inputs of voting circuit are connected with by one main output of protection circuit and a redundancy output respectively；Work as quilt
The main output of protection circuit is identical with redundancy output numerical value, compares voting circuit and exports by the main output numerical value of protection circuit,
But when being caused its main output different from redundancy output numerical value by protection circuit because of radiation, compare voting circuit output and maintain
Initial value, will not export by the output valve of the possible mistake of protection circuit.
Specifically, the present invention's is a kind of based on the Anti-radioactive Fault-tolerant circuit design method bag with door or door with selector
Containing two steps, described in detail separately below.
Step 1: according to circuit structure shown in Fig. 1, uses traditional integrated circuit method for designing design comparison voting circuit,
Circuit structure as shown in Figure 1, design comparison voting circuit, Fig. 1 comprises one and door A1, one or an A2
1 selector M1 is selected with one 2；Being I1 and I2 with the input port of door A1, output port is O, it is achieved logical AND
Circuit function, or the input port of door A2 is I1 and I2, and output port is O, it is achieved logic or circuit function；2
The input port selecting 1 selector M1 is I1 and I2, and output port is O, and selecting port is S；At selector M1
In, when S value is 0, O value is the value of I1；When S is 1, O value is the value of I2；In Fig. 1 with door A1,
Or door A2 and 2 selects 1 selector M1 that traditional integrated circuit method for designing can be used to realize；In Fig. 1, when n1 with
When n2 value is identical, n7 can export n1 value, such as, when n1 Yu n2 is 0, n5 Yu n6 value is all 0, so
Being 0 or 1 regardless of value before n7, selector M1 can export 0, i.e. n7 value will be 0；In like manner, when n1 with
When n2 is 1, n5 Yu n6 value is all 1, so being 0 or 1 regardless of value before n7, selector M1 can be defeated
Go out 1, i.e. n7 value will be 1；In Fig. 1, when n1 from n2 value is different, n7 can maintain before value, such as, when
When n1 Yu n2 is 0, n7 is 0, it is assumed that subsequent time n1 becomes 1 because of radiation from 0, and n2 still remains 0,
Then n5 is 0, and n6 is 1, and owing to before n7, value is 0, selector M1 still can export 0, i.e. n7 value will stay in that
0, will not output error value 1；In like manner, when n1 Yu n2 is 1, n7 is 1, it is assumed that subsequent time n1 is because of radiation
Becoming 0 from 1, n2 still remains 1, then n5 is 0, and n6 is 1, owing to before n7, value is 1, and selector M1
Still can export 1, i.e. n7 value will stay in that 1, will not output error value 0；
Step 2: circuit input end mouth (Fig. 1 will be decided by vote with comparing by the main output of protection circuit respectively with redundancy output
In n1 with n2) be connected,
Wherein, a kind of method of employing is will to be copied into two parts by protection circuit, and portion is main circuit, and another part is superfluous
Remaining circuit, main circuit is identical with the function of redundant circuit；The output of main circuit and redundant circuit respectively with comparison sheet
Certainly circuit input end mouth is connected, as in figure 2 it is shown, in Fig. 2, be main circuit by protection circuit 1, by protection circuit 2
Being redundant circuit, main circuit is identical with redundant circuit function, but circuit structure can identical also can be different；Normally
In the case of, main circuit output is identical with redundant circuit output, compares voting circuit and can export the output valve of main circuit, false
If main circuit causes output error because of radiation, but redundant circuit output keeps correct, then compare voting circuit output n7 still
So can keep the output valve of redundant circuit, i.e. right value；Assume that redundant circuit causes output error because radiating, but main electricity
Road output keeps correct, then compare voting circuit output n7 and still can keep the output valve of main circuit, i.e. right value；
The another kind of method used be by by protection circuit output port connect upper even number (such as 2,4,6,8 ...) individual phase inverter
Constitute redundancy outfan, and by the former output port of protection circuit as main outfan, by main output with redundancy output respectively
It is connected with comparing voting circuit input end mouth, as it is shown on figure 3, in Fig. 3, be n1 by the main output of protection circuit, even
The output n2 connecing two phase inverters is redundancy output, when being caused main output n1 that mistake occurs by protection circuit because of radiation,
This mistake, because the delay action of multiple phase inverters, will not immediately appear in n2, so n2 is still temporarily maintained at correctly
Value；Owing to n1 from n2 value is the most different, compare the right value that voting circuit output n7 the most still can keep original；
If n1 is before wrong inverted device occurs in n2, revert to original right value because radiation effect disappears, then when
When mistake occurs in n2, n1 has reverted to right value；Owing to n1 from n2 value is different, compare voting circuit output n7
Still original right value can be kept；Finally, after n2 also reverts to right value because radiation effect disappears, n1 and n2
It is worth identical, compares voting circuit output n7 and remain in that right value, in Fig. 3, exported n2 institute by protection circuit redundancy
The quantity connecting phase inverter is 2 but it also may be other even numbers, such as 4,6,8 ...；Redundancy exports institute's connection phase inverter
Quantity should ensure that the duration postponing to be more than pulses of radiation that these phase inverters produce, and just can make to compare voting circuit output and protect
Hold right value.
The invention have the advantages that
(1) present invention proposes a kind of by the comparison voting circuit constituted with door or door and selector, when being subject to by protection circuit
When radiation effect causes its main output valve different from redundancy output valve, this voting circuit can maintain original right value, no
Meeting output error value, so that being had Anti-radioactive Fault-tolerant characteristic by protection circuit.
(2) the comparison voting circuit of the present invention only comprise one with door, one or and one 2 select 1 selector, with should
Relatively during voting circuit protection complicated circuit, the additional areas expense of generation is little, and the extra delay brought is short.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of the comparison voting circuit of the present invention.
Fig. 2 be two parts of functions identical by protection circuit with compare the electrical block diagram that voting circuit is connected.
Fig. 3 be a by protection circuit with compare the electrical block diagram that voting circuit is connected.
Detailed description of the invention
Embodiment 1 area, power consumption and capability of resistance to radiation comparative experiments
Test experiments result:
In experiment, realize 6 benchmark test circuit without capability of resistance to radiation initially with traditional standard circuit design method
Bigkey, dsip, S38417, S13207.1, S15850.1, S38584.1 [5], the most again by triplication redundancy scheme and the present invention
Realize these benchmark test circuit respectively, be allowed to that there is capability of resistance to radiation；Different schemes is used to realize these respectively
Benchmark test circuit random radiation 1000 times, the test wrong frequency of gained, area and power consumption meansigma methods such as table 1
Shown in；Area and power consumption in table 1 have passed through normalized, and its numerical value is electricity realized relative to the present invention program
The area on road and the multiple of power consumption；Show from the test experiments result of table 1, the present invention and the mistake of triplication redundancy scheme
Frequency is the most less and suitable, so their capability of resistance to radiation is close, but the area of the present invention and power dissipation ratio three
The area of mould redundancy scheme and the little comparison of power consumption are many.
Table 1 area, power consumption and capability of resistance to radiation compare
| Scheme | Mistake frequency | Area | Power consumption |
| Traditional standard method for designing without capability of resistance to radiation | 256 | 0.95 | 0.88 |
| The radiation-hardened design method of the present invention | 4 | 1 | 1 |
| The radiation-hardened design method of triplication redundancy | 6 | 2.88 | 2.82 |
。
Claims (3)
1. one kind based on the Anti-radioactive Fault-tolerant circuit design method with door or door with selector, it is characterised in that its bag
Include step:
Step 1: according to circuit structure shown in Fig. 1, uses traditional integrated circuit method for designing design comparison voting circuit；
Step 2: by by the output of the main output of protection circuit and redundancy respectively with compare voting circuit input end mouth and be connected.
2. the method as described in claim 1, it is characterised in that described step 1) in, circuit as shown in Figure 1
Structure, design comparison voting circuit；Circuit structure shown in described Fig. 1 comprise one with door A1, one or an A2 and
Selecting 1 selector M1 for one 2, be I1 and I2 with the input port of door A1, output port is O, it is achieved logical AND electricity
Road function, or the input port of door A2 is I1 and I2, and output port is O, it is achieved logic or circuit function, and 2 select 1
The input port of selector M1 is I1 and I2, and output port is O, and selecting port is S, in selector M1,
When S value is 0, O value is the value of I1；When S is 1, O value is the value of I2；In Fig. 1, when voting is more electric
When road input n1 and n2 value is identical, voting comparison circuit outfan n7 can export n1 value, when voting comparison circuit
When input n1 and n2 value is different, voting comparison circuit outfan n7 can maintain value in the past.
3. the method as described in claim 1, it is characterised in that described step 2) in, including:
A kind of method is will to be copied into two parts by protection circuit, and portion is main circuit, and another part is redundant circuit, main electricity
Road is identical with the function of redundant circuit, the output of main circuit and redundant circuit respectively with compare voting circuit input end
Mouth is connected, as in figure 2 it is shown, wherein, is main circuit by protection circuit 1, is redundant circuit by protection circuit 2, main
Circuit is identical with redundant circuit function, and circuit structure can be identical or different；Under normal circumstances, main circuit output
Identical with redundant circuit output, compare voting circuit and can export the output valve of main circuit, it is assumed that main circuit causes because of radiation
Output error, but redundant circuit output keeps correct, then compare voting circuit output n7 and still can keep redundant circuit
Output valve, i.e. right value；Assume that redundant circuit causes output error because of radiation, but main circuit output keeps correct, then
Relatively voting circuit output n7 still can keep the output valve of main circuit, i.e. right value；
Another kind of method is to be connected even number of inverters composition redundancy outfan by protection circuit output port, and quilt
The former output port of protection circuit as main outfan, by main output and redundancy output respectively with compare voting circuit input end
Mouth is connected, as it is shown on figure 3, wherein, is n1 by the main output of protection circuit, connects the output n2 of two phase inverters
It is redundancy output, when being caused main output n1 or redundancy output n2 that mistake occurs by protection circuit because of radiation, comparison sheet
Certainly circuit output n7 remains in that right value；By protection circuit redundancy output n2 connect the quantity of phase inverter be 2 or
It is other even numbers；The delay that phase inverter described in the quantitative commitments of redundancy output institute connection phase inverter produces is more than pulses of radiation
Duration, make to compare voting circuit output and keep right value.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201510252467.XA CN106301352B (en) | 2015-05-18 | 2015-05-18 | A kind of Anti-radioactive Fault-tolerant circuit design method based on door or door and selector |
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| CN201510252467.XA CN106301352B (en) | 2015-05-18 | 2015-05-18 | A kind of Anti-radioactive Fault-tolerant circuit design method based on door or door and selector |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2756577C1 (en) * | 2020-12-18 | 2021-10-01 | Федеральное государственное бюджетное учреждение "Национальный исследовательский центр "Курчатовский институт" | Method for indirect measurement of fault tolerance of irradiated test digital microcircuits, built by method for constant redundancy, and functional structure of test microcircuit intended for implementation of this method |
| CN113721135A (en) * | 2021-07-22 | 2021-11-30 | 南京航空航天大学 | SRAM type FPGA fault online fault tolerance method |
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Patent Citations (6)
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| US20090230988A1 (en) * | 2004-12-01 | 2009-09-17 | Koninklijke Philips Electronics, N.V. | Electronic device having logic circuitry and method for designing logic circuitry |
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| CN101901176A (en) * | 2010-07-22 | 2010-12-01 | 北京交通大学 | Redundant clock system |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| RU2756577C1 (en) * | 2020-12-18 | 2021-10-01 | Федеральное государственное бюджетное учреждение "Национальный исследовательский центр "Курчатовский институт" | Method for indirect measurement of fault tolerance of irradiated test digital microcircuits, built by method for constant redundancy, and functional structure of test microcircuit intended for implementation of this method |
| CN113721135A (en) * | 2021-07-22 | 2021-11-30 | 南京航空航天大学 | SRAM type FPGA fault online fault tolerance method |
| CN113721135B (en) * | 2021-07-22 | 2022-05-13 | 南京航空航天大学 | SRAM type FPGA fault online fault tolerance method |
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