CN106291333A - A kind of circuit board detecting system - Google Patents
A kind of circuit board detecting system Download PDFInfo
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- CN106291333A CN106291333A CN201610885231.4A CN201610885231A CN106291333A CN 106291333 A CN106291333 A CN 106291333A CN 201610885231 A CN201610885231 A CN 201610885231A CN 106291333 A CN106291333 A CN 106291333A
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- circuit board
- under test
- board under
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- bound
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
The present invention provides a kind of circuit board detecting system, by each electrode in region to be bound for circuit board under test is immersed in test solution, utilize the conductive characteristic of test solution, realize the electrode conduction in region to be bound, by sending test voltage to the control unit of circuit board under test, the detection adjacent two interelectrode impedances in circuit board under test region to be bound, and judge that circuit board under test is the most qualified according to the conductivity of the adjacent two interelectrode impedance detection values in circuit board under test region to be bound and test solution；On the one hand, it is no longer necessary to the dedicated test circuit plate mated with circuit board under test can realize quality of circuit board detection, thus reduces circuit board detecting cost；On the other hand, as long as ensureing that each electrode in circuit board under test region to be bound is immersed in test solution the conducting that can realize electrode, it is not necessary to the para-position one by one of each electrode, improve detection efficiency.
Description
Technical field
The present invention relates to Display Technique field, be specifically related to a kind of circuit board detecting system.
Background technology
Along with being widely used, according to this work of SMT (Surface Mount Technology, surface mounting technology) technique
The circuit board product Quality Detection that skill is produced becomes a vital problem.
Circuit board includes: FPCA (Flexible Printed Circuit Assembly, flexible circuit board finished product) and
PCBA (Printed Circuit Board+Assembly, finished printed circuit board product), existing quality of circuit board detection scheme
Special measurement jig (the dedicated test circuit plate i.e. mated with circuit board under test) need to be utilized to realize.Carrying out Quality Detection
Time, each electrode in test circuit board region to be bound needs each electrode para-position one by one with circuit board under test region to be bound, because of
This detection efficiency is low, becomes the bottleneck of Quality Detection.And, the circuit board under test for different model needs to provide corresponding special
Test circuit board, add FPCA and PCBA product quality testing cost.
Therefore, a kind of circuit board detecting system is needed badly to solve above-mentioned technical problem.
Summary of the invention
The present invention is directed to above-mentioned deficiency present in prior art, it is provided that a kind of circuit board detecting system, in order at least portion
Decompose the problem that certainly circuit board detecting cost is high, detection efficiency is low.
The present invention solves above-mentioned technical problem, adopt the following technical scheme that
The present invention provides a kind of circuit board detecting system, including: controller, test solution and hold described test solution
Container, each electrode in circuit board under test region to be bound is immersed in described test solution；
Described controller is connected with the control unit of circuit board under test, for sending test voltage to described control unit,
So that described control unit is according to adjacent two interelectrode impedances in described test voltage detection circuit board under test region to be bound,
And sentence according to adjacent two interelectrode impedance detection values in the conductivity of described test solution and circuit board under test region to be bound
Disconnected circuit board under test is the most qualified.
Preferably, the electrode in described test solution is region not bound with circuit board under test and the inwall of described container
There is the solution of chemical reaction.
Preferably, described volume of a container can house multiple circuit board under test simultaneously.
Preferably, described test voltage includes the first voltage and the second voltage；
Described controller specifically for, send the first voltage signal and the second voltage signal to described control unit so that
Described first voltage signal and the second voltage signal are loaded in circuit board under test region to be bound by described control unit respectively
Each adjacent two electrodes on；Receive the adjacent two interelectrode impedance detection values of each group that described control unit sends, respectively by institute
State each group of adjacent two interelectrode impedance detection values compared with the conductivity of described test solution, and judge according to comparative result
Circuit board under test is the most qualified.
Preferably, described controller specifically for, when the adjacent two interelectrode impedance detection values of least one set are more than described
During the conductivity of test solution, determine described circuit board under test open circuit；When the adjacent two interelectrode impedance detection values of least one set
During less than the conductivity of described test solution, determine the short circuit of described circuit board under test.
Preferably, described controller specifically for, when each adjacent two interelectrode resistance values are equal to described test solution
Conductivity time, determine that described circuit board under test is qualified.
Further, described circuit board detecting system also includes signal generator, described signal generator and circuit under test
The control unit of plate is connected, for sending pulse signal to described control unit, so that described pulse is believed by described control unit
Number load on the electrode in circuit board under test region to be bound；
The inwall that electrode in the region to be bound with described circuit board under test of described container is relative is made up of metal material,
And the electrode in region to be bound with described circuit board under test forms electrochemical capacitor；
Described controller is connected with the described inwall of described container, is additionally operable to receive the 3rd electricity that described electrochemical capacitor sends
Pressure signal u, and according to described tertiary voltage signal u and default voltage threshold U, determine the quality etc. of described circuit board under test
Level；Or, receive the tertiary voltage signal u that described electrochemical capacitor sends, determine reception delay time t, and according to described reception
Delay time t and the time threshold T preset, determines the quality grade of described circuit board under test, and described reception delay time t is institute
State the difference that signal generator sends the time of described pulse signal and receives the time of described tertiary voltage signal with described controller.
Further, described circuit board detecting system also includes display device, described display device and described controller phase
Even, for showing waveform or the reception delay time t of described tertiary voltage signal.
Preferably, described controller specifically for, calculate difference DELTA u between tertiary voltage signal u and voltage threshold U,
Δ u=│ u-U │, calculates ratio p, the p=Δ u/U of Δ u Yu U, and according to p and default quality grade threshold value Q determine described in treat
The quality grade of slowdown monitoring circuit plate；Or, difference DELTA t between calculating reception delay time t and time threshold T, Δ t=│ t-T │,
Calculate ratio m, the m=Δ t/T of Δ t Yu T, and determine the product of described circuit board under test according to m and default quality grade threshold value Q
Matter grade.
Preferably, described quality grade threshold value Q at least includes the first quality grade threshold value q1 and the second quality grade threshold value
q2；
Described controller specifically for, as 0≤p < q1, or, 0≤m < during q1, determines the quality of described circuit board under test
Grade is excellent；As q1≤p < q2, or, q1≤m < during q2, determines that the quality grade of described circuit board under test is medium；Work as p
>=q2, or, during m >=q2, determine that the quality grade of described circuit board under test is difference etc..
The present invention is capable of following beneficial effect:
The circuit board detecting system that the present invention provides, by being immersed in survey by each electrode in region to be bound for circuit board under test
In examination solution, utilize the conductive characteristic of test solution, it is achieved the electrode conduction in region to be bound, by the control of circuit board under test
Unit processed sends test voltage, detects the adjacent two interelectrode impedances in circuit board under test region to be bound, and according to circuit under test
Whether adjacent two interelectrode impedance detection values and the conductivity of test solution in plate region to be bound judge circuit board under test
Qualified；On the one hand, it is no longer necessary to the dedicated test circuit plate mated with circuit board under test can realize quality of circuit board detection, from
And reduce circuit board detecting cost；On the other hand, as long as ensureing that each electrode in circuit board under test region to be bound is immersed in test
Solution can realize the conducting of electrode, it is not necessary to the para-position one by one of each electrode, improve detection efficiency.
Accompanying drawing explanation
The structural representation of the circuit board detecting system that Fig. 1 provides for the present invention；
The circuit board detecting system that Fig. 2 provides for the present invention top view when the quality grade of testing circuit plate；
The schematic diagram of the quality grade of the testing circuit plate that Fig. 3 provides for the present invention.
Marginal data:
1, controller 2, container 3, test solution 4, circuit board under test
5, signal generator 41, electrode 42, control unit 21, inwall
Detailed description of the invention
Below in conjunction with the accompanying drawing in the present invention, the technical scheme in the present invention is carried out clear, complete description, aobvious
So, described embodiment is a part of embodiment of the present invention rather than whole embodiments.Based on the enforcement in the present invention
Example, the every other embodiment that those of ordinary skill in the art are obtained on the premise of not making creative work, all belong to
In the scope of protection of the invention.
Below in conjunction with accompanying drawing 1, the solution of the present invention is described in detail.
The embodiment of the present invention provides a kind of circuit board detecting system, is used for testing whether wiring board product quality to be measured closes
Lattice.As it is shown in figure 1, circuit board under test 4 includes binding region and unbundling region, binding is provided with electrode 41 in region, to be measured
Circuit board 4 is connected with the non-display area binding of display floater by the electrode 41 in binding region, the unbundling of circuit board under test 4
Being provided with control unit 42 (i.e. control chip) in district, control unit 42 is connected with each electrode 41 in binding region respectively.?
In the embodiment of the present invention, circuit board under test 4 is FPCA or PCBA.
Described circuit board detecting system includes: controller 1, container 2 and test solution 3, and test solution 3 is contained in container 2
In.Can house at least one circuit board under test 4 in container 2, each electrode 41 in circuit board under test region to be bound is immersed in survey
In examination solution 3, i.e. each electrode 41 in circuit board under test region to be bound is positioned at below the liquid level of test solution 3.
Controller 1 is connected with the control unit 42 of circuit board under test 4, for sending test voltage to control unit 42, with
Make control unit 42 according to impedance between adjacent two electrodes 41 in described test voltage detection circuit board under test region to be bound, and
In conductivity according to test solution 3 and circuit board under test region to be bound, the impedance detection value between adjacent two electrodes 41 judges to treat
Slowdown monitoring circuit plate 4 is the most qualified.
Concrete, circuit board under test 4 is provided with jack interface, controller 1 passes through data wire and this jack interface and treats
Slowdown monitoring circuit plate 4 connects, thus is connected with control unit 42.
The present invention, by being immersed in test solution by each electrode in region to be bound for circuit board under test, utilizes test molten
The conductive characteristic of liquid, it is achieved the electrode conduction in region to be bound, and by sending test electricity to the control unit of circuit board under test
Pressure, adjacent two interelectrode impedances in detection circuit board under test region to be bound, according in circuit board under test region to be bound
The conductivity of adjacent two interelectrode impedance detection values and test solution judges that circuit board under test is the most qualified；On the one hand, no longer
Need the dedicated test circuit plate mated with circuit board under test can realize quality of circuit board detection, thus reduce circuit board detecting
Cost；On the other hand, as long as ensureing that each electrode in circuit board under test region to be bound is immersed in test solution can realize electricity
The conducting of pole, it is not necessary to each electrode para-position one by one, improves detection efficiency.
Without damage in order to ensure the product quality of circuit board under test, test solution 3 is selected and is not waited to tie up with circuit board under test
Determine the solution of the inwall generation chemical reaction of the electrode 41 in region and container 2.Such as, test solution can be NaCl solution,
Certainly, skilled person will appreciate that, test solution 3 is not limited to NaCl solution, any region not bound with circuit board under test
In electrode 41 and the solution of inwall generation chemical reaction of container 2, and conductivity meets the solution of testing requirement all at this
Within bright protection domain.
It should be noted that the conductivity of test solution 3 can be adjusted according to detection needs and arrange, such as, can
By changing the concentration of test solution 3, proportioning realization, before described circuit board detecting system starts, first to measure survey
The conductivity of examination solution 3, and is stored in measurement result in controller 1, in order to follow-up sentence as circuit board under test product quality
Disconnected foundation.
Preferably, the volume of container 2 can house multiple circuit board under test 4 simultaneously, say, that multiple circuit board under test
Electrode in the region to be bound of 4 can be contained in container 2 simultaneously, thus detects while realizing multiple circuit board.At this
In inventive embodiments, as it is shown in figure 1, container 2 can house 3 circuit board under test simultaneously.By the volume of container 2 is arranged foot
Enough big, multiple circuit board under test 4 can be housed simultaneously, thus realize multiple circuit board synchronous detecting, improve detection effect further
Rate, is greatly decreased the detection time.
Below in conjunction with Fig. 1, the work process of the circuit board detecting system of the present invention is elaborated.
Controller 1 includes the first voltage and the second voltage to the test voltage that control unit 42 sends, and the first voltage is high
Voltage, the second voltage is low-voltage.
Controller 1 specifically for, send the first voltage signal and the second voltage signal to control unit 42, so that controlling single
It is each adjacent that described first voltage signal and the second voltage signal are loaded in circuit board under test region to be bound by unit 42 respectively
On two electrodes 41；Impedance detection value between each adjacent two electrodes 41 that reception control unit 42 sends, respectively by described each adjacent
Two interelectrode impedance detection values are compared with the conductivity of test solution 3, and judge that circuit board under test is according to comparative result
No qualified.
It is to say, the first voltage signal and the second voltage signal are loaded by the control unit 42 of circuit board under test 4 respectively
On each adjacent two electrodes 41 in circuit board under test region to be bound, in described adjacent two electrodes 41, an electrode 41 adds
Carry the first voltage signal (i.e. high-voltage signal), another electrode 41 loads the second voltage signal (i.e. low-voltage signal), will be to be measured
Each electrode 41 in circuit board region to be bound is divided into multiple groups and detects.Each due in circuit board under test region to be bound
Electrode 41 is immersed in below the liquid level of test solution 3, and each electrode 41 can turn in test solution 3, so, and control unit 42
I.e. can detect that the impedance between adjacent two electrodes 41.The described impedance detection value that control unit 42 is sent by controller 1 is with default
The conductivity of test solution 3 compare, and can judge that circuit board under test is the most qualified according to comparative result.
Concrete, when each adjacent two interelectrode resistance values are equal to the conductivity of test solution 3, i.e. each group is adjacent
When impedance detection value between two electrodes 41 is all equal with test solution 3 conductivity, described circuit board under test is qualified.Work as least one set
When resistance value between adjacent two electrodes 41 and test solution 3 conductivity do not wait, circuit board under test 4 is defective.
Further, in embodiments of the present invention, when controller 1 judges that circuit board under test 4 is defective, additionally it is possible to sentence
Break and underproof reason.Concrete, controller 1 is specifically for, the impedance detection value when between adjacent two electrodes 41 of least one set
During more than the conductivity of test solution 3, determine circuit board under test 4 open circuit；When the adjacent two interelectrode impedance detection of least one set
When value is less than the conductivity of test solution 3, determine circuit board under test 4 short circuit.
Further, qualified circuit board can also be done further by the circuit board detecting system that the embodiment of the present invention provides
Detection, to determine the product quality grade of qualified circuit board.
Shown in Fig. 2 and Fig. 3, described circuit board detecting system also includes signal generator 5, signal generator 5 with treat
The control unit 42 of slowdown monitoring circuit plate 4 is connected, for sending pulse signal to control unit 42, so that control unit 42 is by described arteries and veins
Rush on signal loading electrode 41 in circuit board under test region to be bound.
The inwall 21 that electrode 41 in the region to be bound with circuit board under test of container 2 is relative is made up of metal material, and
Electrode 41 in region to be bound with circuit board under test forms electrochemical capacitor (as shown in phantom in Figure 2).
Controller 1 is connected with the inwall 21 of container 2, is additionally operable to receive the tertiary voltage signal u that described electrochemical capacitor sends,
And according to described tertiary voltage signal u and default voltage threshold U, determine the quality grade of circuit board under test 4；Or, receive
The tertiary voltage signal u that described electrochemical capacitor sends, determines the reception delay time t of tertiary voltage signal, and prolongs according to reception
Time time t and preset time threshold T, determine the quality grade of circuit board under test 4.
It should be noted that in embodiments of the present invention, the pulse signal that signal generator 5 produces is square-wave signal.When
When electrode 41 in circuit board under test binding region is immersed in test solution 3, the inwall 21 of container 2 is bound with circuit board under test
Electrode 41 in region is oppositely arranged, and the two forms electrochemical capacitor.The pulse signal that signal generator 5 produces is carried in electricity to be measured
On electrode 41 (i.e. a pole plate of electrochemical capacitor) in road plate binding region, at the inwall 21 of container 2, (i.e. electrochemical capacitor is another
One pole plate) upper generation tertiary voltage signal, tertiary voltage signal is sent to controller 1.Controller 1 can be according to the 3rd electricity
Pressure signal determines the quality grade of circuit board under test 4.
Further, described circuit board detecting system can also include display device (not illustrating in figure), display device with
Controller 1 is connected, for showing waveform or the reception delay time t of described tertiary voltage signal.The reception delay time, t referred to,
Signal generator 5 sends the difference that time of described pulse signal receives the time of described tertiary voltage signal with controller 1.Display
Device can be oscillograph.
Concrete, it being preset with voltage threshold U or time threshold T in controller 1, voltage threshold U is that signal generator 5 produces
The maximum voltage value of pulse signal.Time threshold T can be by the side being averaged the testing result of multiple circuit board under test
Formula determines, in order to ensure the accuracy of detection, generally, time threshold T is the detection knot of the circuit board under test according to more than 30
The most calculated.
Controller 1 can judge the quality grade of circuit board under test 4 by any one in following 2 kinds of modes:
1, according to tertiary voltage signal u and default voltage threshold U, the quality grade of described circuit board under test is determined.
2, according to reception delay time t and default time threshold T, the quality grade of described circuit board under test is determined.
Individually below above two being judged, the scheme of the quality grade of circuit board under test 4 is described in detail.
For scheme 1, controller 1 specifically for, calculate the difference between tertiary voltage signal u and voltage threshold U
Δ u, Δ u=│ u-U │, calculate ratio p, the p=Δ u/U of Δ u Yu U, and determine according to p and default quality grade threshold value Q and treat
The quality grade of slowdown monitoring circuit plate 4.
Concrete, quality grade threshold value Q is preset in controller 1, at least includes the first quality grade threshold value q1 and second
Quality grade threshold value q2, q1 < q2.The size of q1 and q2 can be carried out certainly according to the requirement standard of the circuit board product quality of user
Row is arranged, and user is the highest to the requirement of circuit board product quality, then the value of q1 and q2 is the least, and user is to circuit board product quality
Requirement the lowest, then the value of q1 and q2 is the biggest.Generally, q1 could be arranged to 3%-5%, q2 and may be configured as 8%-10%.
Controller 1 specifically for, when 0≤p < during q1, determines that the quality grade of circuit board under test 4 is excellent；When q1≤p <
During q2, determine that the quality grade of circuit board under test 4 is medium；As p >=q2, determine that the quality grade of circuit board under test 4 is for poor
Deng.
It is to say, p is the least, illustrate that the size of tertiary voltage signal and voltage threshold U are closer to, the product of circuit board under test
Product quality is the highest.
It should be noted that the quantity of quality grade threshold value Q can determine according to actual needs, quality grade threshold value Q
Quantity is the most, then product quality grade classification is the most careful.
For scheme 2, controller 1 specifically for, calculate the difference between reception delay time t and time threshold T
Δ t, Δ t=│ t-T │, calculate ratio m, the m=Δ t/T of Δ t Yu T, and determine circuit under test according to m and quality grade threshold value Q
The quality grade of plate 4.
Controller 1 specifically for, when 0≤m < during q1, determines that the quality grade of circuit board under test 4 is excellent；When q1≤m <
During q2, determine that the quality grade of circuit board under test is medium；As m >=q2, determine that the quality grade of circuit board under test 4 is for poor
Deng.
The present invention is not only able to detect that circuit board is the most qualified by circuit kit plate detecting system, additionally it is possible to detect
The quality grade of qualified circuit board, reduces testing cost further.
Electrode in region to be bound for FPCA or PCBA circuit board is immersed in the middle of test solution by the present invention, is surveyed by allotment
The examination concentration of solution, proportioning adjust the conductivity of test solution, and are passed through test to the control unit of FPCA or PCBA circuit board
Voltage signal, i.e. can detect that FPCA's or PCBA is the most qualified.Compare existing measurement jig, the circuit board detecting of the present invention
System has the advantage that
During detection, only test solution need to be immersed in the region to be bound of circuit board under test, it is not necessary to para-position, improve detection
Efficiency；Can once test multiple circuit board, improve detection efficiency further；Except can with testing circuit plate the most qualified in addition to,
Voltage or the reception delay of test signal can also be received by detection, detect the quality grade of qualified circuit board；This detection
System is applicable to the detection of the circuit board of various model, it is not necessary to for the special test electricity of the circuit board fabrication coupling of every kind of model
Road plate, reduces testing cost.
It is understood that the principle that is intended to be merely illustrative of the present of embodiment of above and the exemplary enforcement that uses
Mode, but the invention is not limited in this.For those skilled in the art, in the essence without departing from the present invention
In the case of god and essence, can make various modification and improvement, these modification and improvement are also considered as protection scope of the present invention.
Claims (10)
1. a circuit board detecting system, it is characterised in that including: controller, test solution and to be used for holding described test molten
The container of liquid, each electrode in circuit board under test region to be bound is immersed in described test solution；
Described controller is connected with the control unit of circuit board under test, for sending test voltage to described control unit, so that
Described control unit is according to adjacent two interelectrode impedances in described test voltage detection circuit board under test region to be bound, and root
Judge to treat according to two interelectrode impedance detection values adjacent in the conductivity of described test solution and circuit board under test region to be bound
Slowdown monitoring circuit plate is the most qualified.
2. circuit board detecting system as claimed in claim 1, it is characterised in that described test solution be not with circuit board under test
Electrode in region to be bound and the solution of the inwall generation chemical reaction of described container.
3. circuit board detecting system as claimed in claim 1, it is characterised in that described volume of a container can house many simultaneously
Individual circuit board under test.
4. the circuit board detecting system as described in any one of claim 1-3, it is characterised in that described test voltage includes first
Voltage and the second voltage；
Described controller specifically for, send the first voltage signal and the second voltage signal to described control unit, so that described
It is each that described first voltage signal and the second voltage signal are loaded in circuit board under test region to be bound by control unit respectively
On adjacent two electrodes；Receive that described control unit sends each organizes adjacent two interelectrode impedance detection values, respectively by described respectively
Organize adjacent two interelectrode impedance detection values compared with the conductivity of described test solution, and judge according to comparative result to be measured
Circuit board is the most qualified.
5. circuit board detecting system as claimed in claim 4, it is characterised in that described controller specifically for, when at least one
When organizing the conductivity that adjacent two interelectrode impedance detection values are more than described test solution, determine described circuit board under test open circuit；
When the adjacent two interelectrode impedance detection values of least one set are less than the conductivity of described test solution, determine described circuit under test
Plate short circuit.
6. circuit board detecting system as claimed in claim 4, it is characterised in that described controller specifically for, when each adjacent
When two interelectrode resistance values are equal to the conductivity of described test solution, determine that described circuit board under test is qualified.
7. circuit board detecting system as claimed in claim 6, it is characterised in that also include that signal generator, described signal are sent out
Raw device is connected with the control unit of circuit board under test, for sending pulse signal to described control unit, controls list so that described
Described pulse signal is loaded on the electrode in circuit board under test region to be bound by unit；
The inwall that electrode in the region to be bound with described circuit board under test of described container is relative is made up of metal material, and with
Electrode in described circuit board under test region to be bound forms electrochemical capacitor；
Described controller is connected with the described inwall of described container, is additionally operable to receive the tertiary voltage letter that described electrochemical capacitor sends
Number u, and according to described tertiary voltage signal u and the voltage threshold U that presets, determine the quality grade of described circuit board under test；Or
Person, receives the tertiary voltage signal u that described electrochemical capacitor sends, determines reception delay time t, and during according to described reception delay
Between t and preset time threshold T, determine the quality grade of described circuit board under test, described reception delay time t is described signal
Generator sends the time of described pulse signal and the difference of the time of the described controller described tertiary voltage signal of reception.
8. circuit board detecting system as claimed in claim 7, it is characterised in that also include display device, described display device
It is connected with described controller, for showing waveform or the reception delay time t of described tertiary voltage signal.
9. circuit board detecting system as claimed in claim 7, it is characterised in that described controller specifically for, calculate the 3rd
Difference DELTA u between voltage signal u and voltage threshold U, Δ u=│ u-U │, calculate ratio p, the p=Δ u/U of Δ u Yu U, and root
The quality grade of described circuit board under test is determined according to p and default quality grade threshold value Q；Or, calculate reception delay time t and
Difference DELTA t between time threshold T, Δ t=│ t-T │, calculate ratio m, the m=Δ t/T of Δ t Yu T, and according to m and default
Quality grade threshold value Q determines the quality grade of described circuit board under test.
10. circuit board detecting system as claimed in claim 9, it is characterised in that described quality grade threshold value Q at least includes the
One quality grade threshold value q1 and the second quality grade threshold value q2；
Described controller specifically for, as 0≤p < q1, or, 0≤m < during q1, determines the quality grade of described circuit board under test
For excellent；As q1≤p < q2, or, q1≤m < during q2, determines that the quality grade of described circuit board under test is medium；As p >=q2,
Or, during m >=q2, determine that the quality grade of described circuit board under test is difference etc..
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|---|---|---|---|
| CN201610885231.4A CN106291333B (en) | 2016-10-10 | 2016-10-10 | A kind of circuit board detecting system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610885231.4A CN106291333B (en) | 2016-10-10 | 2016-10-10 | A kind of circuit board detecting system |
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| CN106291333A true CN106291333A (en) | 2017-01-04 |
| CN106291333B CN106291333B (en) | 2019-06-14 |
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| CN201610885231.4A Expired - Fee Related CN106291333B (en) | 2016-10-10 | 2016-10-10 | A kind of circuit board detecting system |
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| CN106908971A (en) * | 2017-04-28 | 2017-06-30 | 南京中电熊猫平板显示科技有限公司 | The binding blocking apparatus and its binding hold-up interception method of liquid crystal display panel |
| CN107607858A (en) * | 2017-09-22 | 2018-01-19 | 信利光电股份有限公司 | Determination method, system, device and the readable storage medium storing program for executing of module open-circuit position |
| CN109164311A (en) * | 2018-07-13 | 2019-01-08 | 智车优行科技（上海）有限公司 | Fault detection method and device, electronic equipment |
| CN110596616A (en) * | 2019-10-12 | 2019-12-20 | 上海泽丰半导体科技有限公司 | Power supply impedance test method and circuit board |
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| CN113917309A (en) * | 2021-08-24 | 2022-01-11 | 北京电子工程总体研究所 | Method and system for detecting whether tooling for measuring delay time of circuit board is qualified |
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| CN106908971A (en) * | 2017-04-28 | 2017-06-30 | 南京中电熊猫平板显示科技有限公司 | The binding blocking apparatus and its binding hold-up interception method of liquid crystal display panel |
| CN106908971B (en) * | 2017-04-28 | 2019-02-01 | 南京中电熊猫平板显示科技有限公司 | The binding blocking apparatus and its binding hold-up interception method of liquid crystal display panel |
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| CN109164311A (en) * | 2018-07-13 | 2019-01-08 | 智车优行科技（上海）有限公司 | Fault detection method and device, electronic equipment |
| CN110596616A (en) * | 2019-10-12 | 2019-12-20 | 上海泽丰半导体科技有限公司 | Power supply impedance test method and circuit board |
| CN112666223A (en) * | 2019-12-19 | 2021-04-16 | 深圳硅基仿生科技有限公司 | Electrode aging test device |
| CN113917309A (en) * | 2021-08-24 | 2022-01-11 | 北京电子工程总体研究所 | Method and system for detecting whether tooling for measuring delay time of circuit board is qualified |
| CN113917309B (en) * | 2021-08-24 | 2024-05-24 | 北京电子工程总体研究所 | Method and system for detecting whether tool for measuring delay time of circuit board is qualified or not |
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