CN106291323B - The chip fast powering-up detection of non-contact IC card and configuration method and device - Google Patents
The chip fast powering-up detection of non-contact IC card and configuration method and device Download PDFInfo
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- CN106291323B CN106291323B CN201610661871.7A CN201610661871A CN106291323B CN 106291323 B CN106291323 B CN 106291323B CN 201610661871 A CN201610661871 A CN 201610661871A CN 106291323 B CN106291323 B CN 106291323B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Abstract
The present invention relates to a kind of detection of the chip fast powering-up of non-contact IC card and configuration methods, and include: S1, chip power on；Memory cell storage chip configuration information, first power on detection information and second power on detection information；S2, it is controlled by control unit, detection information successively is powered on to first in storage unit and second powers on detection information and carry out inspection verifying；S3, at least the operating procedure in S2 is repeated once；S4, it is controlled by control unit, the chip configuration information in storage unit is loaded into configuration register unit.The invention further relates to a kind of detection of the chip fast powering-up of non-contact IC card and configuration devices.The present invention can guarantee the correctness of upper electro-detection in the case where RF field strength is unstable, it avoids needing first to make once powering on detection error simultaneously electric under chip, the operating process re-powered again, effectively saves the time, is particularly suitable for the larger situation of issued volume.
Description
Technical field
The present invention relates to the method and devices, in particular to one kind of a kind of detection of chip fast powering-up and configuration suitable for non-
The chip fast powering-up of Contact Type Ic Card detects and the method and device of configuration, belongs to electro-detection technology on non-contact IC card and leads
Domain.
Background technique
The chip power on detection circuit of non-contact IC (Integrated Circuit, integrated circuit) card generally comprises control
Unit processed, storage unit and configuration register unit etc..Wherein, the major function of control unit is that the entire chip of generation is each
The control signal of a course of work, memory space needed for the major function of storage unit is to provide chip operation and some cores
The memory space of piece configuration data, the major function of configuration register unit are that chip is loaded into chip when powering on from storage unit
Configuration data.
Electro-detection and configuration are a kind of for checking whether current chip has already passed through volume production test on chip, and will storage
Chip configuration data in the memory unit is loaded into the process of chip configuration register unit.
For non-contact IC card, electro-detection refers to that chip first can be loaded into number from the specific position in storage unit on chip
According to being judged, judge whether chip has already passed through volume production test, if it is determined that chip has already passed through volume production test, then can carry
The chip configuration data entered in storage unit is then matched to configuration register unit if it is determined that chip does not pass through volume production test
It sets register cell and uses default value.
But the shortcomings that this mode, is, in the hair fastener stage, if non-contact IC is stuck in the mistake for moving closer to card reader
Electro-detection being carried out in journey, due to RF(Radio Frequency, radio frequency) field strength is faint or unstable, it can be likely to cause
The data that electro-detection is read are incorrect, have both been possible to be mistaken for the chip tested not over volume production to have already passed through volume production in this way
The chip of test, it is also possible to be mistaken for not testing by volume production by the chip for having already passed through volume production test.If it is desired to again
Electro-detection on chip is carried out, then the operation for needing to re-start lower electricity and powering on wastes the plenty of time.Especially when issued volume compared with
When big, the drawbacks of this method, is especially apparent.
Summary of the invention
The purpose of the present invention is to provide a kind of detection of the chip fast powering-up of non-contact IC card and configuration method and dresses
It sets, can guarantee the correctness of upper electro-detection in the case where RF field strength is unstable, while avoiding detecting once powering on
Mistake just needs first to make under chip electric, then the operating process re-powered, effectively saves the time, be particularly suitable for issued volume compared with
Big situation.
In order to achieve the above object, the chip fast powering-up that the present invention provides a kind of non-contact IC card detects and configuration dress
It sets, includes: control unit；Storage unit is connect with the control unit, which contains chip with confidence
Breath, first power on detection information and second power on detection information；Configuration register unit, respectively with the control unit
And storage unit connection；Wherein, it is controlled by control unit, detection information and successively is powered on to first in storage unit
Two, which power on detection information, carries out multiple checks verifying, single by control after two, which power on detection information continuous several times, is verified
Chip configuration information in storage unit is loaded into configuration register unit by member control.
Chip fast powering-up of the present invention detection and configuration device, also include: powering on detection counter, and described
Control unit connection, calculate first and power on detection information and second power on the number that detection information is continuously verified.
The present invention also provides a kind of detection of the chip fast powering-up of non-contact IC card and configuration methods, include following step
It is rapid:
S1, chip power on；Memory cell contains chip configuration information, first powers on detection information and second power on
Detection information；
S2, upper electro-detection is carried out to chip, is controlled by control unit, successively electro-detection on first in storage unit is believed
It breath and second powers on detection information and carries out inspection verifying；
S3, at least the operating procedure of the upper electro-detection in S2 is repeated once；
Electro-detection passes through on S4, chip, is controlled by control unit, and the chip configuration information in storage unit is loaded into configuration
Register cell, chip start to work normally.
In the S1, first power on detection information and second power on detection information data length be respectively 1 byte.
In the S2, comprising the following steps:
S21, control unit read first from storage unit and power on detection information；
S22, it is controlled by control unit, whether the data that inspection verifying first powers on detection information are correct；As correct, continuation
Execute S23；As incorrect, the count value for powering on detection counter is reset, and return and execute S21；
S23, control unit read second from storage unit and power on detection information；
S24, it is controlled by control unit, whether the data that inspection verifying second powers on detection information are correct；As correct, continuation
Execute S3；As incorrect, the count value for powering on detection counter is reset, and return and execute S21.
In the S3, comprising the following steps:
S31, control unit read count value from powering in detection counter；
S32, it is controlled by control unit, according to acquired count value, judges that first powers on detection information and second and power on
Detection information continuously successfully passes the number for checking verifying；
It checks that the number of verifying reaches preset number as continuously successfully passed, continues to execute S4；
It checks that preset number has not yet been reached in the number of verifying as continuously successfully passed, detection counter will be powered on
Count value adds 1, and returns and execute S21, repeats a S21~S24.
In a preferred embodiment of the invention, in the S3, only the operation of the upper electro-detection of S21~S24 is walked
Suddenly it repeats once, comprising the following steps:
S31, it is controlled by control unit, reads count value in detection counter from powering on；
S32, it is controlled by control unit, checks whether verifying count value is 1；If count value is 1, S4 is continued to execute；Such as meter
Numerical value is 0, by count value plus 1, and returns and executes S21, repeats a S21~S24.
Wherein, the initial value for powering on the count value in detection counter is 0.
In conclusion the chip fast powering-up detection of non-contact IC card provided by the present invention and configuration method and dress
It sets, can guarantee the correctness of upper electro-detection in the case where RF field strength is unstable, while avoiding detecting once powering on
Mistake just needs first to make under chip electric, then the operating process re-powered, effectively saves the time, be particularly suitable for issued volume compared with
Big situation.
Detailed description of the invention
Fig. 1 is the flow chart of chip the fast powering-up detection and configuration method of the non-contact IC card in the present invention；
Fig. 2 is the structural schematic diagram of chip the fast powering-up detection and configuration device of the non-contact IC card in the present invention.
Specific embodiment
Below according to FIG. 1 to FIG. 2, presently preferred embodiments of the present invention is illustrated.
As shown in Fig. 2, for the chip fast powering-up detection of non-contact IC card provided by the invention and configuration device, packet
Contain: control unit 1 generates the process control signal of electro-detection and configuration on chip, is to realize core of the invention unit；It deposits
Storage unit 2 is connect with the control unit 1, chip configuration information is stored in the storage unit 2, electro-detection on first
Information byte0 and second powers on detection information byte1；Configuration register unit 3, respectively with the control unit 1 with
And storage unit 2 connects；Wherein, it is controlled by control unit 1, detection information byte0 successively is powered on to first in storage unit 2
And second power on detection information byte1 carry out multiple checks verifying, power on detection information continuous several times when two and be verified
Afterwards, it is controlled by control unit 1, the chip configuration information in storage unit 2 is loaded into configuration register unit 3, completes chip
Fast powering-up detection and configuration.
Chip fast powering-up detection of the present invention and configuration device, also include: powering on detection counter 4, with institute
The control unit 1 stated connects, and calculates first and powers on detection information byte0 and second and power on detection information byte1 and continuously verifies
By number.
As shown in Figure 1, including for the chip fast powering-up detection of non-contact IC card provided by the invention and configuration method
Following steps:
S1, chip power on；It is stored with chip configuration information in storage unit 2, first powers on detection information byte0 and
Two power on detection information byte1；
S2, upper electro-detection is carried out to chip, is controlled by control unit 1, successively to electro-detection on first in storage unit 2
Information byte0 and second powers on detection information byte1 and carries out inspection verifying；
S3, at least the operating procedure of the upper electro-detection in S2 is repeated once；
Electro-detection passes through on S4, chip, is controlled by control unit 1, and the chip configuration information loading in storage unit 2 is matched
Register cell is set, chip starts to work normally.
In the S1, first powers on the data length difference that detection information byte0 and second powers on detection information byte1
For 1 byte.
In the S2, comprising the following steps:
S21, control unit 1 read first from storage unit 2 and power on detection information byte0；
S22, it is controlled by control unit 1, whether the data that inspection verifying first powers on detection information byte0 are correct；As just
Really, S23 is continued to execute；As incorrect, the count value read_cnt for powering on detection counter 4 is reset, and return and execute S21,
It needs to re-read reading first in storage unit 2 and powers on detection information byte0；
S23, control unit 1 read second from storage unit 2 and power on detection information byte1；
S24, it is controlled by control unit 1, whether the data that inspection verifying second powers on detection information byte1 are correct；As just
Really, S3 is continued to execute；As incorrect, the count value read_cnt for powering on detection counter 4 reset, and return and execute S21, needed
It re-reads reading first in storage unit 2 and powers on detection information byte0.
Wherein, the effect for powering on the count value read_cnt of detection counter 4 is that record two powers on detection information verifying
No matter correct number first powers on detection information byte0 or second and powers on detection information byte1, as long as wherein there is one
Validation failure, count value read_cnt will be by clear 0.
In the S3, comprising the following steps:
S31, control unit 1 from power in detection counter 4 read count value read_cnt；
S32, it is controlled by control unit 1, according to the value of acquired count value read_cnt, judges that electro-detection is believed on first
Breath byte0 and second powers on detection information byte1 and continuously successfully passes the number for checking verifying；
It checks that the number of verifying reaches preset number as continuously successfully passed, continues to execute S4；
It checks that preset number has not yet been reached in the number of verifying as continuously successfully passed, detection counter 4 will be powered on
Count value read_cnt add 1, and return execute S21, repeat a S21~S24.
In a preferred embodiment of the invention, it is contemplated that the accuracy of upper electro-detection and the efficiency of upper electro-detection,
In the S3, it is only necessary to repeat once, that is, be needed to first to the operating procedure of the upper electro-detection of S21~S24
It powers on detection information byte0 and second and powers on detection information byte1 and repeat to check verifying twice；It specifically include following step
It is rapid:
S31, it is controlled by control unit 1, reads count value read_cnt in detection counter 4 from powering on；
S32, it is controlled by control unit 1, checks whether verifying count value read_cnt is 1；
If count value read_cnt is 1, illustrate that first powers on detection information byte0 and second and power on detection information byte1
It is primary that inspection verifying has been successfully passed before, this time to successfully pass inspection verifying for the second time, i.e., to S21~S24's
Operating procedure repeats once, continues to execute S4；
If count value read_cnt is 0, illustrate that first powers on detection information byte0 and second and power on detection information byte1
Inspection verifying is not yet successfully passed before, this time to successfully pass inspection verifying for the first time, i.e., at present only to the behaviour of S21~S24
Make step to execute once, it is primary to need to repeat execution；Therefore, the count value read_cnt for powering on detection counter 4 is added 1,
And return and execute S21, repeat a S21~S24.
Wherein, the initial value for powering on the count value read_cnt in detection counter 4 is 0.
Electro-detection letter on detection information byte0 and second is powered on from can be seen that first in the above-mentioned description of this invention
After breath byte1 needs at least successfully pass inspection verifying twice in succession, it just will be considered that electro-detection has passed through, and after
Continuous the step of entering chip configuration.As long as can guarantee to be into chip configuration step in this way, illustrate electro-detection
Passed through, shows that chip has already passed through volume production test, also indicate that chip comes into the state of steady operation, RF can be non-
Contact Type Ic Card provides stable energy.
In the hair fastener stage, during chip moves closer to card reader, the case where malfunctioning is detected in the event of powering on,
I.e. first powers on the case where detection that detection information byte0 and/or second powers on detection information byte1 does not meet desired value, that
The count value for powering on detection counter must be reset and returned to S2, restart to power on detecting step, until at least connecting
It is continuous to pass twice through electro-detection.
Below by way of a specific embodiment, method that the present invention will be described in detail.
S1, chip power on；It is stored with chip configuration information in storage unit 2, first powers on detection information byte0 and
Two power on detection information byte1；Wherein, first to power on detection information byte0 be 8 16 system number 5A, electro-detection letter on second
Breath byte1 is 8 16 system number A5；
S2, upper electro-detection is carried out to chip, is controlled by control unit 1, successively to electro-detection on first in storage unit 2
Information byte0 and second powers on detection information byte1 and carries out inspection verifying；
S21, control unit 1 read first from storage unit 2 and power on detection information byte0；
S22, controlled by control unit 1, check verifying first power on detection information byte0 data whether be 8 16 into
Number 5A processed；If so, continuing to execute S23；If not, the count value read_cnt for powering on detection counter 4 is reset, and return to execution
S21；
S23, control unit 1 read second from storage unit 2 and power on detection information byte1；
S24, controlled by control unit 1, check verifying second power on detection information byte1 data whether be 8 16 into
Number A5 processed；If so, continuing to execute S3；If not, the count value read_cnt for powering on detection counter 4 is reset, and return to execution
S21；
S3, the operating procedure of the upper electro-detection in S2 is repeated once；
S31, it is controlled by control unit 1, reads count value read_cnt in detection counter 4 from powering on；
S32, it is controlled by control unit 1, checks whether verifying count value read_cnt is 1；
If count value read_cnt is 1, illustrate that first powers on detection information byte0 and second and power on detection information byte1
It has successfully passed inspection verifying twice, has continued to execute S4；
If count value read_cnt is 0, illustrate that first powers on detection information byte0 and second and power on detection information byte1
It is primary only to successfully pass inspection verifying, it is primary to need to repeat inspection verifying；Therefore, the count value of detection counter 4 will be powered on
Read_cnt adds 1, and returns and execute S21, repeats a S21~S24.
Electro-detection passes through on S4, chip, is controlled by control unit 1, and the chip configuration information loading in storage unit 2 is matched
Register cell is set, chip starts to work normally.
In conclusion the chip fast powering-up detection of non-contact IC card provided by the present invention and configuration method and dress
It sets, has the advantages that when chip is during moving closer to card reader, or the situation unstable in RF field strength
Under, by upper electro-detection at least twice in succession, to guarantee the correctness of electro-detection on non-contact IC card, while also avoiding
Because certain is once powered on during detection compares caused by RF field strength is unstable, since one of them powers on detection information error, need
First to make electricity under chip, then the operating process re-powered.In this case, the present invention is by powering on detection counter
Count value re-starts electro-detection method after resetting, carries out the behaviour that lower electricity re-powers again without additional chip
Make, effectively saves the time.Especially when issued volume is larger, beneficial effects of the present invention are more obvious.
It is discussed in detail although the contents of the present invention have passed through above preferred embodiment, but it should be appreciated that above-mentioned
Description is not considered as limitation of the present invention.After those skilled in the art have read above content, for of the invention
A variety of modifications and substitutions all will be apparent.Therefore, protection scope of the present invention should be limited to the appended claims.
Claims (5)
1. a kind of chip fast powering-up of non-contact IC card detects and configuration method, which is characterized in that use non-contact IC
The chip fast powering-up detection of card and configuration device are realized；
The chip fast powering-up detection of the non-contact IC card and configuration device include: control unit (1)；Storage unit (2),
It connect with the control unit (1)；Configuration register unit (3), respectively with the control unit (1) and storage
Unit (2) connection；Detection counter (4) are powered on, are connect with the control unit (1)；
The chip fast powering-up detection of the non-contact IC card and configuration method comprise the steps of:
S1, chip power on；It is stored with chip configuration information in storage unit (2), first powers on detection information and second powers on
Detection information；
S2, upper electro-detection is carried out to chip, is controlled by control unit (1), successively to electro-detection on first in storage unit (2)
It information and second powers on detection information and carries out inspection verifying；
S3, at least the operating procedure of the upper electro-detection in S2 is repeated once；
Electro-detection passes through on S4, chip, is controlled by control unit (1), and the chip configuration information loading in storage unit (2) is matched
Register cell is set, chip starts to work normally；
In the S2, comprising the following steps:
S21, control unit (1) read first from storage unit (2) and power on detection information；
S22, it is controlled by control unit (1), whether the data that inspection verifying first powers on detection information are correct；As correct, continuation
Execute S23；As incorrect, the count value for powering on detection counter (4) is reset, and return and execute S21；
S23, control unit (1) read second from storage unit (2) and power on detection information；
S24, it is controlled by control unit (1), whether the data that inspection verifying second powers on detection information are correct；As correct, continuation
Execute S3；As incorrect, the count value for powering on detection counter (4) is reset, and return and execute S21.
2. the chip fast powering-up of non-contact IC card as described in claim 1 detects and configuration method, which is characterized in that institute
In the S1 stated, first power on detection information and second power on detection information data length be respectively 1 byte.
3. the chip fast powering-up of non-contact IC card as described in claim 1 detects and configuration method, which is characterized in that institute
In the S3 stated, comprising the following steps:
Detection counter (4) is middle to read count value from powering on for S31, control unit (1)；
S32, it is controlled by control unit (1), according to acquired count value, judges that first powers on electric-examination on detection information and second
Measurement information continuously successfully passes the number for checking verifying；
It checks that the number of verifying reaches preset number as continuously successfully passed, continues to execute S4；
It checks that preset number has not yet been reached in the number of verifying as continuously successfully passed, detection counter (4) will be powered on
Count value adds 1, and returns and execute S21, repeats a S21~S24.
4. the chip fast powering-up of non-contact IC card as claimed in claim 3 detects and configuration method, which is characterized in that institute
In the S3 stated, only the operating procedure of the upper electro-detection of S21~S24 is repeated once, comprising the following steps:
S31, it is controlled by control unit (1), reads count value in detection counter (4) from powering on；
S32, it is controlled by control unit (1), checks whether verifying count value is 1；If count value is 1, S4 is continued to execute；As counted
Value is 0, by count value plus 1, and returns and executes S21, repeats a S21~S24.
5. the chip fast powering-up of non-contact IC card as claimed in claim 4 detects and configuration method, which is characterized in that institute
It is 0 that states, which powers on the initial value of the count value in detection counter (4),.
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Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1627091A (en) * | 2003-12-10 | 2005-06-15 | 松下电器产业株式会社 | Semiconductor integrated circuit verification method and test pattern preparation method |
| CN1684380A (en) * | 2004-04-16 | 2005-10-19 | 华为技术有限公司 | Verifying device special for integrated circuit function |
| CN1841079A (en) * | 2005-03-28 | 2006-10-04 | 大唐移动通信设备有限公司 | Detection method for configuration of programmable logic device |
| US7412635B1 (en) * | 2004-10-01 | 2008-08-12 | Xilinx, Inc. | Utilizing multiple bitstreams to avoid localized defects in partially defective programmable integrated circuits |
| US7529993B1 (en) * | 2006-06-08 | 2009-05-05 | Xilinx, Inc. | Method of selectively programming integrated circuits to compensate for process variations and/or mask revisions |
| CN101458971A (en) * | 2008-12-02 | 2009-06-17 | 炬力集成电路设计有限公司 | Test system and method for built-in memory |
| CN104123167A (en) * | 2014-08-06 | 2014-10-29 | 无锡中微爱芯电子有限公司 | MCU electrification starting method with configuration word self-inspection function and self-inspection method |
| CN105093094A (en) * | 2015-09-16 | 2015-11-25 | 中国人民解放军国防科学技术大学 | Automatic chip power-on reliability detection device and detection method |
| CN105824388A (en) * | 2016-04-05 | 2016-08-03 | 浪潮电子信息产业股份有限公司 | Power-on/off detection method, device and system |
-
2016
- 2016-08-12 CN CN201610661871.7A patent/CN106291323B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1627091A (en) * | 2003-12-10 | 2005-06-15 | 松下电器产业株式会社 | Semiconductor integrated circuit verification method and test pattern preparation method |
| CN1684380A (en) * | 2004-04-16 | 2005-10-19 | 华为技术有限公司 | Verifying device special for integrated circuit function |
| US7412635B1 (en) * | 2004-10-01 | 2008-08-12 | Xilinx, Inc. | Utilizing multiple bitstreams to avoid localized defects in partially defective programmable integrated circuits |
| CN1841079A (en) * | 2005-03-28 | 2006-10-04 | 大唐移动通信设备有限公司 | Detection method for configuration of programmable logic device |
| US7529993B1 (en) * | 2006-06-08 | 2009-05-05 | Xilinx, Inc. | Method of selectively programming integrated circuits to compensate for process variations and/or mask revisions |
| CN101458971A (en) * | 2008-12-02 | 2009-06-17 | 炬力集成电路设计有限公司 | Test system and method for built-in memory |
| CN104123167A (en) * | 2014-08-06 | 2014-10-29 | 无锡中微爱芯电子有限公司 | MCU electrification starting method with configuration word self-inspection function and self-inspection method |
| CN105093094A (en) * | 2015-09-16 | 2015-11-25 | 中国人民解放军国防科学技术大学 | Automatic chip power-on reliability detection device and detection method |
| CN105824388A (en) * | 2016-04-05 | 2016-08-03 | 浪潮电子信息产业股份有限公司 | Power-on/off detection method, device and system |
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