CN106291323A - The chip fast powering-up detection of non-contact IC card and collocation method and device - Google Patents
The chip fast powering-up detection of non-contact IC card and collocation method and device Download PDFInfo
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- CN106291323A CN106291323A CN201610661871.7A CN201610661871A CN106291323A CN 106291323 A CN106291323 A CN 106291323A CN 201610661871 A CN201610661871 A CN 201610661871A CN 106291323 A CN106291323 A CN 106291323A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Abstract
The present invention relates to the detection of chip fast powering-up and the collocation method of a kind of non-contact IC card, comprise: S1, chip power on；Memory cell storage chip configuration information, electro-detection information in electro-detection information and second on first；S2, by control unit control, successively electro-detection information in electro-detection information and second on first in memory element is carried out check checking；S3, at least the operating procedure in S2 is repeated once；S4, by control unit control, the chip configuration information in memory element is loaded into configuration register unit.The invention still further relates to the detection of chip fast powering-up and the configuration device of a kind of non-contact IC card.The present invention can ensure in the case of RF field intensity instability on the correctness of electro-detection, detection of simultaneously avoiding once powering on makes mistakes and is accomplished by first making electricity under chip, the operating process re-powered again, effectively saves the time, is particularly suited for the situation that issued volume is bigger.
Description
Technical field
The present invention relates to the detection of a kind of chip fast powering-up and the method and device of configuration, specifically refer to one and be applicable to non-
Contact Type Ic Card chip fast powering-up detection and configuration method and device, belong to non-contact IC card power on detection technique neck
Territory.
Background technology
The chip power on detection circuit that non-contact IC (Integrated Circuit, integrated circuit) blocks generally comprises control
Unit processed, memory element, and configuration register unit etc..Wherein, the major function of control unit is that the whole chip of generation is each
The control signal of individual work process, the major function of memory element is to provide the memory space needed for chip operation and some cores
The memory space of sheet configuration data, the major function of configuration register unit is that chip is loaded into chip when powering on from memory element
Configuration data.
On chip, electro-detection and configuration are a kind of for checking whether current chip passes through volume production test, and will store
Chip configuration data in the memory unit are loaded into the process of chip configuration register unit.
For non-contact IC card, on chip, electro-detection refers to that chip first can be loaded into number by the ad-hoc location from memory element
According to judging, it is judged that whether chip passes through volume production test, if it is determined that chip passes through volume production test, then can carry
Enter in memory element chip configuration data to configuration register unit, if it is determined that chip not through volume production test, then join
Put register cell and use default value.
But the shortcoming of this mode is, in the hair fastener stage, if non-contact IC is stuck in the mistake moving closer to card reader
Journey carrying out upper electro-detection, due to RF(Radio Frequency, radio frequency) field intensity is faint or unstable, can be likely to cause
The data that electro-detection reads are incorrect, the most likely are mistaken for passing through volume production by the chip tested not over volume production
The chip of test, it is also possible to be mistaken for not testing through volume production by the chip passing through volume production test.If it is desired to again
Carry out electro-detection on chip, then need the operation re-starting lower electricity He powering on, waste the plenty of time.Particularly when issued volume relatively
The when of big, the drawback of this method is especially apparent.
Summary of the invention
It is an object of the invention to provide the detection of chip fast powering-up and collocation method and the dress of a kind of non-contact IC card
Put, it is possible to the correctness of electro-detection on ensureing in the case of RF field intensity instability, avoid once powering on detects simultaneously
Mistake is accomplished by first making electricity under chip, then the operating process re-powered, and effectively saves the time, is particularly suited for issued volume relatively
Big situation.
In order to achieve the above object, the present invention provides the detection of chip fast powering-up and the configuration dress of a kind of non-contact IC card
Put, comprise: control unit；Memory element, it is connected with described control unit, and this memory cell contains chip configuration letter
Breath, electro-detection information in electro-detection information and second on first；Configuration register unit, its respectively with described control unit
And memory element connects；Wherein, by control unit control, successively to electro-detection information on first in memory element and
On two, electro-detection information repeatedly checks checking, after two upper electro-detection information continuous several times are verified, single by controlling
Unit controls, and the chip configuration information in memory element is loaded into configuration register unit.
Chip fast powering-up of the present invention detection and configuration device, also comprise: power on detection counter, and it is with described
Control unit connect, calculate the number of times that in electro-detection information and second, electro-detection information is verified continuously on first.
The present invention also provides for the detection of chip fast powering-up and the collocation method of a kind of non-contact IC card, comprises following step
Rapid:
S1, chip power on；Memory cell contains chip configuration information, electro-detection in electro-detection information and second on first
Information；
S2, chip is carried out upper electro-detection, by control unit control, successively to electro-detection information on first in memory element with
And electro-detection information carries out checking checking on second；
S3, at least the operating procedure of the upper electro-detection in S2 is repeated once；
On S4, chip, electro-detection is passed through, and by control unit control, the chip configuration information in memory element is loaded into configuration and deposits
Device unit, chip starts normally to work.
In described S1, on first, in electro-detection information and second, the data length of electro-detection information is respectively 1 byte.
In described S2, specifically comprise the steps of
S21, control unit read electro-detection information on first from memory element；
S22, by control unit control, check that in checking first, the data of electro-detection information are the most correct；As correctly, continue executing with
S23；As incorrect, the count value of the detection counter that powers on is reset, and return execution S21；
S23, control unit read electro-detection information on second from memory element；
S24, by control unit control, check that in checking second, the data of electro-detection information are the most correct；As correctly, continue executing with
S3；As incorrect, the count value of the detection counter that powers on is reset, and return execution S21.
In described S3, specifically comprise the steps of
S31, control unit read count value from the detection counter that powers on；
S32, by control unit control, according to acquired count value, it is judged that electro-detection in electro-detection information and second on first
Information successfully passes the number of times checking checking the most continuously；
Reach number of times set in advance as successfully passed the number of times checking checking continuously, continue executing with S4；
Number of times set in advance is not yet reached, by the counting of the detection counter that powers on as successfully passed the number of times checking checking continuously
Value adds 1, and returns execution S21, repeats S21～S24.
In a preferred embodiment of the invention, in described S3, only the operation to the upper electro-detection of S21～S24 walks
Suddenly repeat once, specifically comprise the steps of
S31, by control unit control, from the detection counter that powers on read count value；
S32, by control unit control, check whether checking count value is 1；If count value is 1, continue executing with S4；Such as count value
It is 0, count value is added 1, and return execution S21, repeat S21～S24.
Wherein, the initial value of the described count value powered in detection counter is 0.
In sum, the chip fast powering-up of non-contact IC card provided by the present invention detects and collocation method and dress
Put, it is possible to the correctness of electro-detection on ensureing in the case of RF field intensity instability, avoid once powering on detects simultaneously
Mistake is accomplished by first making electricity under chip, then the operating process re-powered, and effectively saves the time, is particularly suited for issued volume relatively
Big situation.
Accompanying drawing explanation
Fig. 1 is the detection of chip fast powering-up and the flow chart of collocation method of the non-contact IC card in the present invention；
Fig. 2 is the detection of chip fast powering-up and the structural representation of configuration device of the non-contact IC card in the present invention.
Detailed description of the invention
Below according to Fig. 1～Fig. 2, illustrate presently preferred embodiments of the present invention.
As in figure 2 it is shown, the chip fast powering-up for the non-contact IC card of present invention offer detects and configuration device, bag
Containing: control unit 1, it produces electro-detection and the process control signal of configuration on chip, is the core cell realizing the present invention；Deposit
Storage unit 2, it is connected with described control unit 1, and this memory element 2 internal memory contains chip configuration information, electro-detection on first
Electro-detection information byte1 in information byte0 and second；Configuration register unit 3, its respectively with described control unit 1 with
And memory element 2 connects；Wherein, control unit 1 control, successively to electro-detection information byte0 on first in memory element 2
And electro-detection information byte1 repeatedly checks checking on second, when two upper electro-detection information continuous several times are verified
After, control unit 1 control, the chip configuration information in memory element 2 is loaded into configuration register unit 3, completes chip
Fast powering-up detection and configuration.
Chip fast powering-up of the present invention detection and configuration device, also comprise: power on detection counter 4, itself and institute
The control unit 1 stated connects, and in calculating first, in electro-detection information byte0 and second, electro-detection information byte1 is verified continuously
The number of times passed through.
As it is shown in figure 1, the chip fast powering-up for the non-contact IC card of present invention offer detects and collocation method, comprise
Following steps:
S1, chip power on；Memory element 2 internal memory contains chip configuration information, on first in electro-detection information byte0 and second
Electro-detection information byte1；
S2, chip is carried out upper electro-detection, control unit 1 control, successively to electro-detection information on first in memory element 2
On byte0 and second, electro-detection information byte1 carries out checking checking；
S3, at least the operating procedure of the upper electro-detection in S2 is repeated once；
On S4, chip, electro-detection is passed through, control unit 1 control, and the chip configuration information in memory element 2 is loaded into configuration and posts
Storage unit, chip starts normally to work.
In described S1, the data length difference of electro-detection information byte1 in electro-detection information byte0 and second on first
It is 1 byte.
In described S2, specifically comprise the steps of
S21, control unit 1 read electro-detection information byte0 on first from memory element 2；
S22, controlled by control unit 1, check that in checking first, the data of electro-detection information byte0 are the most correct；As correctly, continue
Continuous execution S23；As incorrect, count value read_cnt of the detection counter 4 that powers on is reset, and return execution S21, need weight
New reading memory element 2 reads electro-detection information byte0 on first；
S23, control unit 1 read electro-detection information byte1 on second from memory element 2；
S24, controlled by control unit 1, check that in checking second, the data of electro-detection information byte1 are the most correct；As correctly, continue
Continuous execution S3；As incorrect, count value read_cnt of the detection counter 4 that powers on is reset, and return execution S21, need weight
New reading memory element 2 reads electro-detection information byte0 on first.
Wherein, the effect of count value read_cnt of detection counter 4 of powering on is the upper electro-detection Information Authentications of record two
Correct number of times, no matter electro-detection information byte1 in electro-detection information byte0 or second on first, as long as wherein there being one
Validation failure, count value read_cnt will be by clear 0.
In described S3, specifically comprise the steps of
S31, control unit 1 read count value read_cnt from the detection counter 4 that powers on；
S32, controlled by control unit 1, according to the value of acquired count value read_cnt, it is judged that electro-detection information on first
On byte0 and second, electro-detection information byte1 successfully passes the number of times checking checking the most continuously；
Reach number of times set in advance as successfully passed the number of times checking checking continuously, continue executing with S4；
Number of times set in advance is not yet reached, by the meter of detection counter 4 that powers on as successfully passed the number of times checking checking continuously
Numerical value read_cnt adds 1, and returns execution S21, repeats S21～S24.
In a preferred embodiment of the invention, it is contemplated that the accuracy of upper electro-detection and the efficiency of upper electro-detection,
In described S3, it is only necessary to the operating procedure of the upper electro-detection of S21～S24 is repeated once, namely needs first
In upper electro-detection information byte0 and second, electro-detection information byte1 repeats twice inspection checking；Specifically comprise following step
Rapid:
S31, controlled by control unit 1, from the detection counter 4 that powers on, read count value read_cnt；
S32, controlled by control unit 1, check whether checking count value read_cnt is 1；
If count value read_cnt is 1, illustrate on first in electro-detection information byte0 and second before electro-detection information byte1
Successfully pass inspection checking once, this time successfully pass inspection checking, the most operation to S21～S24 for second time
Step repeats once, continues executing with S4；
If count value read_cnt is 0, illustrate on first in electro-detection information byte0 and second before electro-detection information byte1
Not yet successfully passing inspection checking, this is to successfully pass inspection checking for the first time, and i.e. current the operation to S21～S24 walks
Rapid execution once, needs to repeat execution once；Therefore, count value read_cnt of the detection counter 4 that powers on is added 1, and returns
Receipt row S21, repeats S21～S24.
Wherein, the initial value of described count value read_cnt powered in detection counter 4 is 0.
Electro-detection letter in electro-detection information byte0 and second from the above-mentioned description of this invention it can be seen that on first
Breath byte1 need the most double successfully pass inspection checking after, just will be considered that electro-detection has passed through, and continue
The continuous step entering into chip configuration.As long as so ensure that and enter into chip configuration step, just the upper electro-detection of explanation is
Through passing through, showing that chip passes through volume production test, also indicate that chip comes into the state of steady operation, RF field can be non-
Contact Type Ic Card provides stable energy.
In the hair fastener stage, during chip moves closer to card reader, situation about makeing mistakes in the event of the detection that powers on,
On i.e. first, in electro-detection information byte0 and/or second, the detection of electro-detection information byte1 does not meets the situation of desired value, that
The count value of the detection counter that powers on must being reset and return to S2, restarting the detecting step that powers on, until at least connecting
Continue and pass twice through electro-detection.
Below by way of a specific embodiment, describe the inventive method in detail.
S1, chip power on；Memory element 2 internal memory contains chip configuration information, electro-detection information byte0 and on first
Electro-detection information byte1 on two；Wherein, on first, electro-detection information byte0 is 8 16 system number 5A, electro-detection letter on second
Breath byte1 is 8 16 system number A5；
S2, chip is carried out upper electro-detection, control unit 1 control, successively to electro-detection information on first in memory element 2
On byte0 and second, electro-detection information byte1 carries out checking checking；
S21, control unit 1 read electro-detection information byte0 on first from memory element 2；
S22, controlled by control unit 1, check in checking first, whether the data of electro-detection information byte0 are 8 16 system numbers
5A；In this way, S23 is continued executing with；As no, count value read_cnt of the detection counter 4 that powers on is reset, and return execution S21；
S23, control unit 1 read electro-detection information byte1 on second from memory element 2；
S24, controlled by control unit 1, check in checking second, whether the data of electro-detection information byte1 are 8 16 system numbers
A5；In this way, S3 is continued executing with；As no, count value read_cnt of the detection counter 4 that powers on is reset, and return execution S21；
S3, operating procedure to the upper electro-detection in S2 repeat once；
S31, controlled by control unit 1, from the detection counter 4 that powers on, read count value read_cnt；
S32, controlled by control unit 1, check whether checking count value read_cnt is 1；
If count value read_cnt is 1, illustrate on first that in electro-detection information byte0 and second, electro-detection information byte1 is
Successfully pass inspection checking twice, continue executing with S4；
If count value read_cnt is 0, illustrate that on first, in electro-detection information byte0 and second, electro-detection information byte1 only becomes
Merit is verified once by inspection, needs to repeat inspection checking once；Therefore, by count value read_ of detection counter 4 that powers on
Cnt adds 1, and returns execution S21, repeats S21～S24.
On S4, chip, electro-detection is passed through, control unit 1 control, and is loaded into by the chip configuration information in memory element 2 and joins
Putting register cell, chip starts normally to work.
In sum, the chip fast powering-up of non-contact IC card provided by the present invention detects and collocation method and dress
Put, have the advantages that when chip is during moving closer to card reader, or the situation in RF field intensity instability
Under, by the most double upper electro-detection, thus ensure the correctness of electro-detection on non-contact IC card, also avoid simultaneously
Because RF field intensity instability cause certain once power in detection comparison, owing to one of them on, electro-detection information is made mistakes, need
First to make electricity under chip, then the operating process re-powered.In this case, the present invention is by the detection counter that powers on
Count value re-starts the method for electro-detection after resetting, carry out, from without extra chip, the behaviour that lower electricity re-powers again
Make, effectively save the time.Particularly when issued volume is bigger when, beneficial effects of the present invention becomes apparent from.
Although present disclosure has been made to be discussed in detail by above preferred embodiment, but it should be appreciated that above-mentioned
Description is not considered as limitation of the present invention.After those skilled in the art have read foregoing, for the present invention's
Multiple amendment and replacement all will be apparent from.Therefore, protection scope of the present invention should be limited to the appended claims.
Claims (8)
1. the chip fast powering-up of a non-contact IC card detects and configuration device, it is characterised in that comprise:
Control unit (1)；
Memory element (2), it is connected with described control unit (1)；This memory element (2) internal memory contain chip configuration information,
Electro-detection information in electro-detection information and second on first；
Configuration register unit (3), it is connected with described control unit (1) and memory element (2) respectively；
Wherein, control unit (1) control, successively electro-detection information and second on first in memory element (2) is powered on
Detection information repeatedly checks checking, after two upper electro-detection information continuous several times are verified, control unit (1) controls
System, is loaded into configuration register unit (3) by the chip configuration information in memory element (2).
2. the chip fast powering-up of non-contact IC card as claimed in claim 1 detects and configuration device, it is characterised in that also
Comprising: the detection counter that powers on (4), it is connected with described control unit (1), calculates electro-detection information and second on first
The number of times that upper electro-detection information is verified continuously.
3. the chip fast powering-up of a non-contact IC card detects and collocation method, it is characterised in that use such as claim 1
～the device according to any one of 2 realizes, comprise the steps of
S1, chip power on；Memory element (2) internal memory contains chip configuration information, electro-detection information and second powers on first
Detection information；
S2, chip is carried out upper electro-detection, control unit (1) control, successively to electro-detection on first in memory element (2)
In information and second, electro-detection information carries out checking checking；
S3, at least the operating procedure of the upper electro-detection in S2 is repeated once；
On S4, chip, electro-detection is passed through, control unit (1) control, and is loaded into by the chip configuration information in memory element (2) and joins
Putting register cell, chip starts normally to work.
4. the chip fast powering-up of non-contact IC card as claimed in claim 3 detects and collocation method, it is characterised in that institute
In the S1 stated, on first, in electro-detection information and second, the data length of electro-detection information is respectively 1 byte.
5. the chip fast powering-up of non-contact IC card as claimed in claim 3 detects and collocation method, it is characterised in that institute
In the S2 stated, specifically comprise the steps of
S21, control unit (1) read electro-detection information on first from memory element (2)；
S22, controlled by control unit (1), check that in checking first, the data of electro-detection information are the most correct；As correctly, continue
Perform S23；As incorrect, the count value of the detection counter (4) that will power on resets, and returns execution S21；
S23, control unit (1) read electro-detection information on second from memory element (2)；
S24, controlled by control unit (1), check that in checking second, the data of electro-detection information are the most correct；As correctly, continue
Perform S3；As incorrect, the count value of the detection counter (4) that will power on resets, and returns execution S21.
6. the chip fast powering-up of non-contact IC card as claimed in claim 5 detects and collocation method, it is characterised in that institute
In the S3 stated, specifically comprise the steps of
S31, control unit (1) read count value from the detection counter that powers on (4)；
S32, by control unit (1) control, according to acquired count value, it is judged that electric-examination in electro-detection information and second on first
Measurement information successfully passes the number of times checking checking the most continuously；
Reach number of times set in advance as successfully passed the number of times checking checking continuously, continue executing with S4；
Not yet reaching number of times set in advance as successfully passed the number of times checking checking continuously, will power on detection counter (4)
Count value adds 1, and returns execution S21, repeats S21～S24.
7. the chip fast powering-up of non-contact IC card as claimed in claim 6 detects and collocation method, it is characterised in that institute
In the S3 stated, only the operating procedure of the upper electro-detection of S21～S24 is repeated once, specifically comprise the steps of
S31, by control unit (1) control, from the detection counter that powers on (4) reading count value；
S32, by control unit (1) control, check checking count value whether be 1；If count value is 1, continue executing with S4；Such as counting
Value is 0, adds 1 by count value, and returns execution S21, repeats S21～S24.
8. the chip fast powering-up of non-contact IC card as claimed in claim 7 detects and collocation method, it is characterised in that institute
The initial value of the count value in the detection counter that powers on (4) stated is 0.
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| CN201610661871.7A CN106291323B (en) | 2016-08-12 | 2016-08-12 | The chip fast powering-up detection of non-contact IC card and configuration method and device |
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| CN201610661871.7A CN106291323B (en) | 2016-08-12 | 2016-08-12 | The chip fast powering-up detection of non-contact IC card and configuration method and device |
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| CN106291323B (en) | 2019-05-17 |
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