CN106252103A - Thin film capacitor pulse is energized method - Google Patents
Thin film capacitor pulse is energized method Download PDFInfo
- Publication number
- CN106252103A CN106252103A CN201610798533.8A CN201610798533A CN106252103A CN 106252103 A CN106252103 A CN 106252103A CN 201610798533 A CN201610798533 A CN 201610798533A CN 106252103 A CN106252103 A CN 106252103A
- Authority
- CN
- China
- Prior art keywords
- thin film
- film capacitor
- energized
- pulse
- energizing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000003990 capacitor Substances 0.000 title claims abstract description 76
- 239000010409 thin film Substances 0.000 title claims abstract description 71
- 238000000034 method Methods 0.000 title claims abstract description 54
- 210000001367 artery Anatomy 0.000 claims description 2
- 210000003462 vein Anatomy 0.000 claims description 2
- 239000010408 film Substances 0.000 abstract description 39
- 238000011084 recovery Methods 0.000 abstract description 12
- 230000002269 spontaneous effect Effects 0.000 abstract description 11
- 238000007599 discharging Methods 0.000 abstract description 6
- 238000005516 engineering process Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000002474 experimental method Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000004743 Polypropylene Substances 0.000 description 2
- 208000027418 Wounds and injury Diseases 0.000 description 2
- 238000010891 electric arc Methods 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- -1 polypropylene Polymers 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000003985 ceramic capacitor Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 125000004494 ethyl ester group Chemical group 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 208000014674 injury Diseases 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000010445 mica Substances 0.000 description 1
- 229910052618 mica group Inorganic materials 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
- H01G13/00—Apparatus specially adapted for manufacturing capacitors; Processes specially adapted for manufacturing capacitors not provided for in groups H01G4/00 - H01G11/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/33—Thin- or thick-film capacitors
Abstract
This application discloses a kind of thin film capacitor pulse to energize method, including thin film capacitor alternating voltage being carried out pre-process of energizing, alternating voltage process of energizing in advance includes: S1: thin film capacitor is applied first pulse voltage and energizes, then discharging thin film capacitor, the first pulse voltage value is 50～200V；S2: when the total time value energized thin film capacitor and discharge is less than when presetting process time value t, repeat S1；When the total time value energized thin film capacitor and discharge reaches time value t, alternating voltage process of energizing in advance terminates.The thin film capacitor pulse that the application provides is energized method, energized in advance by voltage of increasing exchanges before method energized by existing thin film capacitor, alternating voltage is energized in advance to specifically include and thin film capacitor carries out low pressure is energized and then discharge, the spontaneous recovery point of metallic film can be reduced, reduce the loss amount of the metallic film of 80 90% simultaneously, ensure the capacitance of thin film capacitor.
Description
Technical field
The disclosure relates generally to electronic component technology field, is specifically related to thin film capacitor, particularly relates to thin film capacitor
Pulse is energized method.
Background technology
In society, electric capacity is one of a large amount of electronic components used in electronic equipment, is widely used in circuit
Every straight-through friendship, couple, bypass, filter, the aspect such as the conversion of resonant tank, energy and control.Capacitor packages is also along with science and technology
Development, especially the developing by leaps and bounds of electronic information technology, occur in that the dissimilar capacitor packages being suitable for different field, such as:
Aluminium electrolutic capacitor, tantalum electrolytic capacitor, self-healing type parallel condenser, ceramic capacitor, metalized polypropylene condenser, thin film
Electric capacity, mica capacitor etc..Thin film capacitor is to work as electrode with metal forming, by itself and poly-ethyl ester, polypropylene, polystyrene or poly-carbon
The plastic sheetings such as acid esters, after the overlap of two ends, are wound into the capacitor of the structure of cylindrical shape.It has nonpolarity, insulation impedance
The highest, advantage that frequency characteristic is excellent and dielectric loss is the least etc., it is widely used on analog circuit.
Thin film capacitor, in manufacturing process, needs its process of energizing.Process of energizing is to be operated in capacitor
The seasoned process of discharge and recharge under nominal value state, is used for detecting reparation capacitor, to ensure that product working status reaches every skill
Art parameter and standard requirement.The process of energizing of existing thin film capacitor typically takes pulse voltage to energize method, and it is specially bag
Include two processes.First process is: the pulse voltage that applying magnitude of voltage persistently rises on thin film capacitor is energized, when executing
The voltage added reaches to enter the second process during 1.1 times of rated capacitor running voltage.Second process is: continue thin-film capacitor
The pulse voltage that on device, applying magnitude of voltage persistently rises is energized, until the voltage applied reaches rated capacitor running voltage
1.5 times, during second, each pulse voltage value rising value is less than pulse voltage value rising value every time during first.But
Can there is weakness in thin film capacitor in manufacturing process, above-mentioned energize in method using on metallic film, it utilizes self-healing property
Feature can repair above-mentioned weakness.But, when metallic film is repaired in above-mentioned spontaneous recovery, the metallic film area that it is destroyed is relatively big, makes
Obtain metallic film loss relatively big, and then cause the capacitance of thin film capacitor to reduce.
Summary of the invention
In view of drawbacks described above of the prior art or deficiency, it is desirable to provide a kind of thin-film capacitor reducing metallic film loss
Device pulse is energized method.
The present invention provides a kind of thin film capacitor pulse to energize method, composes in advance including thin film capacitor is carried out alternating voltage
Can process, alternating voltage process of energizing in advance includes:
S1: thin film capacitor is applied first pulse voltage and energizes, then thin film capacitor is discharged, first
Pulse voltage value is 50～200V；
S2: when the total time value energized thin film capacitor and discharge is less than when presetting process time value t, repeat S1；When
When the total time value energized thin film capacitor and discharge reaches time value t, alternating voltage process of energizing in advance terminates.
The thin film capacitor pulse that the present invention provides is energized method, by increasing before method energized by existing thin film capacitor
Alternating voltage is energized in advance, and the first pulse voltage energized is 50～200V, and less than the rated operational voltage value of thin film capacitor,
Alternating voltage is energized in advance to specifically include and thin film capacitor carries out low pressure is energized and then discharge, it is possible to decrease the spontaneous recovery of metallic film
Point, and reduce the loss amount of the metallic film of 80-90%, ensure the capacitance of thin film capacitor.
Accompanying drawing explanation
By the detailed description that non-limiting example is made made with reference to the following drawings of reading, other of the application
Feature, purpose and advantage will become more apparent upon:
Fig. 1 energizes process chart in advance for the alternating voltage that the embodiment of the present invention provides.
Detailed description of the invention
With embodiment, the application is described in further detail below in conjunction with the accompanying drawings.It is understood that this place is retouched
The specific embodiment stated is used only for explaining related invention, rather than the restriction to this invention.It also should be noted that, in order to
It is easy to describe, accompanying drawing illustrate only and invent relevant part.
It should be noted that in the case of not conflicting, the embodiment in the application and the feature in embodiment can phases
Combination mutually.Describe the application below with reference to the accompanying drawings and in conjunction with the embodiments in detail.
Refer to Fig. 1, the present embodiment provides a kind of thin film capacitor pulse to energize method, exchanges including to thin film capacitor
Voltage carries out pre-process of energizing, and alternating voltage process of energizing in advance includes:
S1: thin film capacitor is applied first pulse voltage and energizes, then thin film capacitor is discharged, first
Pulse voltage value is 50～200V；
S2: when the total time value energized thin film capacitor and discharge is less than when presetting process time value t, repeat S1；When
When the total time value energized thin film capacitor and discharge reaches time value t, alternating voltage process of energizing in advance terminates.
Thin-film capacitor during fabrication, metallic film can produce weakness, under voltage effect, is short-circuited at this weakness
Phenomenon, gives big short circuit current the metal level in weakness neighboring area again simultaneously simultaneously and the bigger short circuit current of generation
Evaporate, form open circuit, thus eliminate weakness.Energize voltage ratio of energizing in method of existing thin film capacitor is relatively big, works as capacitor
When internal weakness punctures formation short circuit, in very short time, form electric arc, make local temperature and pressure steeply rise, metal
Layer explosive vaporization, spontaneous recovery increasing radius, electric arc is pulled off, and forms one at dielectric surface and loses metal-plated centered by breakdown point
The border circular areas of layer, this loss amount resulting in metallic film is bigger.In order to overcome existing thin film capacitor to energize method to gold
Belong to the problems such as thin film injury is big, the present embodiment is composed in advance by voltage of increasing exchanges before method energized by existing thin film capacitor
Can, thin film capacitor is carried out pre-energizing.In energizing in advance, the first pulse voltage value is 50～200V, and this magnitude of voltage is less than general
Rated operational voltage value 450V of thin film capacitor, alternating voltage energizes in advance and specifically includes: input primary voltage value is relatively low
Thin film capacitor is energized by the first pulse voltage, then discharges, it is judged that energize and whether summation time of discharging is less than pre-
If processing time value t.When less than time value t, repeat step S1, judge that the summation time energized and discharge is the least the most again
In time value t.If being also less than time value t, then continue to repeat S1, until energizing and summation time of discharging is more than or equal to the time
During value t, process of energizing in advance terminates.Wherein time value t is to arrange in advance, refers to start from energizing in advance to energizing in advance end
Energize and summation discharge time.This process can utilize the self-healing property of thin film to repair weakness, reduces spontaneous recovery point, and gold
The loss amount belonging to thin film is less.And after end of energizing in advance, when the method that metallic film uses existing high voltage to energize is energized,
Owing on metallic film, major part weakness has been struck off, now, high voltage will not carry out substantial amounts of reparation to metallic film, enters
And metallic film loss amount is reduced in a large number.The thin film capacitor pulse that the present embodiment provides is energized method, it is possible to decrease metal
The spontaneous recovery point of thin film, reduces the loss amount of the metallic film of 80-90% simultaneously, has ensured the capacitance of thin film capacitor.
Preferably, in S1, the time of energizing is 0.1～2s.
In the present embodiment, the first pulse voltage is 0.1～2s to the thin film capacitor time of energizing, it is ensured that fully profit
With the self-healing property of metallic film, repair more weakness as much as possible, and then realize reducing metallic film loss amount.When the first arteries and veins
Rush voltage thin film capacitor is energized the time more than 2s time, owing to the time of energizing is longer, affect the self-healing property of thin film, and then make
The region of the weakness that must close on suffers from destroying and causing new weakness, and such development is gone down may result in thin film and repeatedly punctured
So that the even spontaneous recovery of self-healing recovery time lengthening was lost efficacy at weakness.
It addition, learn that after applicant's lot of experiments the first pulse voltage is 1.1s to the thin film capacitor time of energizing
Time, on metallic film, vulnerability fixes is effective, and the loss amount of metallic film can reduce by 72%.
Preferably, in S1, discharge time is 10～200ms.
In the present embodiment, discharging after rear film capacitor of energizing, discharge time is 10～200ms, it is possible to make
The spontaneous recovery obtaining metallic film is effective, and metallic film loss amount is less.Time between upon discharging less than 10ms, owing to the time is shorter,
Metallic film evaporation splash degree is relatively low, and part weakness can be caused cannot to complete spontaneous recovery reparation, still exists, at later stage big voltage
Bigger metallic film loss will be produced when energizing.Time between upon discharging more than 200ms, owing to the time is longer, metallic film
Cool time extends, and causes weakness enclosure region to be also subject to destroy and cause new weakness, increases the loss amount of metallic film.
It addition, learn after applicant's lot of experiments when discharge time is 100ms, to vulnerability fixes effect on metallic film
Good, the loss amount of metallic film can reduce by 76%.
Preferably, in S2, time value t is 4.5-6s.
In the present embodiment, operation of energizing in advance includes in one minor cycle the time of energizing 0.1～2s and discharge time
10～200ms, the multiple of its summation should be between 4.5-6s, and namely alternating voltage composes the treatable time in advance is 4.5-6s
Between, it is possible to the spontaneous recovery making metallic film is effective, and metallic film loss amount is less.When alternating voltage is composed treatable in advance
Between more than 6s, its spontaneous recovery repairing effect has almost no change, and so may result in the wasting of resources.When alternating voltage is energized process in advance
Time more than 4.5s, owing to the time is shorter, it is difficult to ensure vulnerability fixes effect on metallic film, so may result in the later stage
Big voltage will produce bigger metallic film loss when energizing.
It addition, after applicant's lot of experiments alternating voltage composes the treatable time when being 5s, in advance on metallic film
Vulnerability fixes is effective, and the loss amount of metallic film can reduce by 80%.
Applicants have discovered that, when in S1, the time of energizing is 0.1～2s, in S1, discharge time is 10～200ms, the time in S1
Value t is 4.5-6s, when in S1, the first pulse voltage value is 110V, effective to vulnerability fixes on metallic film, metallic film
Loss amount can reduce 80%-90%.Especially in S1, the time of energizing is 1.1s, and in S1, discharge time is 100ms, time value in S2
T is 5s, when the first pulse voltage value is 110V in S1, vulnerability fixes effect on metallic film is reached optimal, metallic film
Loss amount can reduce by 90%.
Above description is only the preferred embodiment of the application and the explanation to institute's application technology principle.People in the art
Member should be appreciated that invention scope involved in the application, however it is not limited to the technology of the particular combination of above-mentioned technical characteristic
Scheme, also should contain in the case of without departing from described inventive concept simultaneously, above-mentioned technical characteristic or its equivalent feature carry out
Combination in any and other technical scheme of being formed.Such as features described above has similar merit with (but not limited to) disclosed herein
The technical scheme that the technical characteristic of energy is replaced mutually and formed.
Claims (8)
1. a thin film capacitor pulse is energized method, it is characterised in that include described thin film capacitor is carried out alternating voltage
Energizing in advance process, the process of energizing in advance of described alternating voltage includes:
S1: described thin film capacitor is applied first pulse voltage and energizes, then described thin film capacitor is discharged,
Described first pulse voltage value is 50～200V；
S2: when the total time value energized described thin film capacitor and discharge is less than when presetting process time value t, repeat S1；When
When the total time value energized thin film capacitor and discharge reaches described time value t, the process of energizing in advance of described alternating voltage terminates.
Thin film capacitor pulse the most according to claim 1 is energized method, it is characterised in that in described S1, the time of energizing is
0.1～2s.
Thin film capacitor pulse the most according to claim 2 is energized method, it is characterised in that in described S1, the time of energizing is
1.1s。
Thin film capacitor pulse the most according to claim 1 and 2 is energized method, it is characterised in that in described S1 during electric discharge
Between be 10～200ms.
Thin film capacitor pulse the most according to claim 4 is energized method, it is characterised in that in described S1, discharge time is
100ms。
Thin film capacitor pulse the most according to claim 1 and 2 is energized method, it is characterised in that time value t in described S2
For 4.5-6s.
Thin film capacitor pulse the most according to claim 6 is energized method, it is characterised in that in described S2, time value t is
5s。
Thin film capacitor pulse the most according to claim 1 and 2 is energized method, it is characterised in that the first arteries and veins in described S1
Rushing magnitude of voltage is 110V.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610798533.8A CN106252103B (en) | 2016-08-31 | 2016-08-31 | Thin film capacitor pulse is energized method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610798533.8A CN106252103B (en) | 2016-08-31 | 2016-08-31 | Thin film capacitor pulse is energized method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106252103A true CN106252103A (en) | 2016-12-21 |
| CN106252103B CN106252103B (en) | 2018-03-27 |
Family
ID=58081102
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610798533.8A Active CN106252103B (en) | 2016-08-31 | 2016-08-31 | Thin film capacitor pulse is energized method |
Country Status (1)
| Country | Link |
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| CN (1) | CN106252103B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111768984A (en) * | 2020-06-28 | 2020-10-13 | 盐城市康威电子有限公司 | High-efficiency automatic detection and energization method for capacitor |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04332111A (en) * | 1991-05-07 | 1992-11-19 | Matsushita Electric Ind Co Ltd | Lamination-type film capacitor and its manufacture |
| CN102468060A (en) * | 2010-11-11 | 2012-05-23 | 汕头高新区松田实业有限公司 | Enabling apparatus of film capacitor production line |
| CN104485235A (en) * | 2014-12-11 | 2015-04-01 | 铜陵市启动电子制造有限责任公司 | Energizing charging clamp for thin-film capacitors |
-
2016
- 2016-08-31 CN CN201610798533.8A patent/CN106252103B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04332111A (en) * | 1991-05-07 | 1992-11-19 | Matsushita Electric Ind Co Ltd | Lamination-type film capacitor and its manufacture |
| CN102468060A (en) * | 2010-11-11 | 2012-05-23 | 汕头高新区松田实业有限公司 | Enabling apparatus of film capacitor production line |
| CN104485235A (en) * | 2014-12-11 | 2015-04-01 | 铜陵市启动电子制造有限责任公司 | Energizing charging clamp for thin-film capacitors |
Non-Patent Citations (1)
| Title |
|---|
| 于凌宇等: "电容器用分切赋能新装置工作原理与应用效果", 《电子元器件应用》 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111768984A (en) * | 2020-06-28 | 2020-10-13 | 盐城市康威电子有限公司 | High-efficiency automatic detection and energization method for capacitor |
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| Publication number | Publication date |
|---|---|
| CN106252103B (en) | 2018-03-27 |
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