CN106248539A - A kind of rotary-ferrograph spectral slice photo densitometry analyzes system and method - Google Patents
A kind of rotary-ferrograph spectral slice photo densitometry analyzes system and method Download PDFInfo
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- CN106248539A CN106248539A CN201610842608.8A CN201610842608A CN106248539A CN 106248539 A CN106248539 A CN 106248539A CN 201610842608 A CN201610842608 A CN 201610842608A CN 106248539 A CN106248539 A CN 106248539A
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- 238000005286 illumination Methods 0.000 claims abstract description 9
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- 238000004458 analytical method Methods 0.000 claims description 12
- 230000003287 optical effect Effects 0.000 claims description 11
- 238000007373 indentation Methods 0.000 claims description 8
- 238000005299 abrasion Methods 0.000 claims description 6
- 238000011156 evaluation Methods 0.000 claims description 6
- 229910052710 silicon Inorganic materials 0.000 claims description 5
- 239000010703 silicon Substances 0.000 claims description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 4
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- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 9
- 238000012544 monitoring process Methods 0.000 description 7
- 238000004445 quantitative analysis Methods 0.000 description 6
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- 238000005259 measurement Methods 0.000 description 4
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- 238000004451 qualitative analysis Methods 0.000 description 3
- 208000003464 asthenopia Diseases 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000008187 granular material Substances 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 241000208340 Araliaceae Species 0.000 description 1
- 241000196324 Embryophyta Species 0.000 description 1
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- 241000768494 Polymorphum Species 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/04—Investigating sedimentation of particle suspensions
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/56—Investigating resistance to wear or abrasion
- G01N3/565—Investigating resistance to wear or abrasion of granular or particulate material
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Abstract
The invention discloses a kind of rotary-ferrograph spectral slice photo densitometry and analyze system and method, system includes trinocular microscope, the motorized subject table of band limit switches, motor driver, photoelectric sensor, trans-impedance amplifier, multi-functional board and host computer；Described trinocular microscope includes that light source, object lens, the motorized subject table of band limit switches are arranged between light source and object lens；3rd mesh of trinocular microscope is connected with photoelectric sensor, and the illumination receiving plane of photoelectric sensor is vertical with the 3rd sight road, and the illumination receiving plane of photoelectric sensor is centrally located on the 3rd sight road axis；Photoelectric sensor is connected with multifunction board card through trans-impedance amplifier, and multi-functional board is connected with host computer, motor driver the most respectively, and motor driver is connected with the motorized subject table of band limit switches.The inventive method can measure spectral slice diverse location abrasive particle area coverage percent automatically, alleviates labor intensity of operating staff, improves testing efficiency and test data accuracy.
Description
Technical field
The present invention relates to a kind of rotary-ferrograph spectral slice photo densitometry and analyze system and method, belong to ferrum spectrum and quantitatively divide
Analysis technical field.
Background technology
Ferrograph is widely used in the wear monitoring of all kinds of machine system and judges calmly with Lubricating Oil, it is possible to be used for carrying out
Frotteurism and the research of abrasion mechanism.Therefore, it is to realize machine monitoring of working condition, equipment fault location and microgranule tribology to grind
The important instrument studied carefully.For the analysis method that Spectral Analysis Technology is used, it is broadly divided into method for qualitative analysis and quantitatively divides
Analysis method.Method for qualitative analysis is the method for analyzing iron spectrum of a kind of off-line monitoring, and monitoring personnel fetch oil sample from scene, treated
Rear formation ferrum spectral slice, utilizes ferroscope the wear particle being deposited in ferrum spectral slice is made morphology observation, dimensional measurement and becomes
Point analyze, and determine kind and the composition of wear particle on this basis, it is judged that the wear form of monitored equipment, wear and tear former
Kind of cause, the degree of wear and heavy wear parts etc..Quantitative analysis method is that one both can be carried out, also the most at the scene
The method for analyzing iron spectrum of off-line analysis after can sampling, this analysis method is mainly according to concentration and the wear particle of wear particle
Distribution of sizes the fretting wear state of equipment is analyzed, then recycle function analysis, trend analysis method and Lycoperdon polymorphum Vitt
The methods such as theory carry out monitoring of working condition and fault diagnosis.
Ferrograph is broadly divided into online ferrograph and off-line type ferrograph, and online ferrograph is mounted directly and sets at the scene
In standby circulating oil system, it is provided that about online reading and the percentage ratio of big abrasive particle of abrasive dust density in fluid, and off-line type
Ferrograph need to gather oil sample from field apparatus, sends laboratory back to and is operated these instruments by professional and be analyzed.Although
Wire type ferrograph has advantages such as real-time, quick, easy, but due to equipment fretting wear state and the complexity of change thereof, with
And analysis result is inevitably affected by the many factors such as working condition, working environment, thus it is difficult to ensure that result
Stability and comparability.Off-line type ferrograph is broadly divided into direct-reading ferrograph, analyzing ferrogram machine, rotary-ferrograph
Deng.Analyzing ferrogram machine and rotary-ferrograph can examine under a microscope the pattern of research abrasive particle and by photo densitometry instrument
Measure abrasive particle area coverage percent in spectral slice, both may be used for qualitative analysis and can be used for quantitative analysis, and direct-reading ferrum
Spectrometer is only capable of measuring the quantity of abrasive particle and the distribution of sizes of approximation thereof, i.e. may be only used for quantitative analysis, therefore analyzing ferrogram machine
More extensive than direct-reading ferrograph with rotary-ferrograph range of application.
When using traditional photo densitometry instrument to measure abrasive particle area coverage percent in a rotary-ferrograph spectral slice,
Operator need the most manually regulate microscope carrier and observe field positions, when observing visual field by microscope ocular
Move to read abrasive particle area coverage percent in visual field during position to be measured.Manually regulation and eye-observation can produce artificially
Error, the long visual fatigue that can produce of eye-observation, reduces observed efficiency simultaneously.It is generally completed a rotary-ferrograph spectral slice
Measurement, use traditional photo densitometry instrument to need artificial to find 24 field positions in spectral slice, workload is big, measures the time
Long.Moreover, traditional photo densitometry instrument can only carry out the measurement of abrasive particle area coverage percent, and follow-up based on abrasive particle
The various quantitative targets that area coverage percent draws remain a need for manually calculating.To sum up, tradition photo densitometry instrument can not
Meet the requirement of rotary-ferrograph spectral slice quantitative analysis.
Summary of the invention
The technical problem to be solved is: provide a kind of rotary-ferrograph spectral slice photo densitometry to analyze system
And method, can automatically measure spectral slice diverse location abrasive particle area coverage percent, alleviate labor intensity of operating staff, improve
Testing efficiency and test data accuracy.
The present invention solves above-mentioned technical problem by the following technical solutions:
A kind of rotary-ferrograph spectral slice photo densitometry analyzes system, including trinocular microscope, band limit switches
Motorized subject table, motor driver, photoelectric sensor, trans-impedance amplifier, multi-functional board and host computer；Described three mesh are micro-
Mirror includes that light source, object lens, the motorized subject table of band limit switches are arranged between light source and object lens；The 3rd of trinocular microscope
Mesh is connected with photoelectric sensor, and the illumination receiving plane of photoelectric sensor is vertical with the 3rd sight road, and the illumination of photoelectric sensor
Receiving plane is centrally located on the 3rd sight road axis；Photoelectric sensor is connected with multifunction board card through trans-impedance amplifier, multi-functional
Board is connected with host computer, motor driver the most respectively, and motor driver is connected with the motorized subject table of band limit switches.
As a kind of scheme further of present system, the motorized subject table of described band limit switches is provided with for solid
Determining the square indentations of rotary-ferrograph spectral slice, square indentations side is provided with groove breach.
As a kind of preferred version of present system, described light source is light emitting diode.
As a kind of preferred version of present system, described photoelectric sensor is silicon cell.
As a kind of preferred version of present system, the motorized subject table of described band limit switches is driven by motor,
Motor is motor or servomotor.
A kind of rotary-ferrograph spectral slice photo densitometry analyzes method, comprises the steps:
Step 1, system of analyzing rotary-ferrograph spectral slice photo densitometry carries out zeroing and adjusts one calibration operation；
Step 2, is placed in rotary-ferrograph spectral slice to be measured in square indentations, by the electronic loading of PC control
Platform moves along the visual field displacement path of trinocular microscope, records simultaneously and store abrasive particle area coverage hundred in trinocular microscope visual field
Mark and field of view center are away from spectral slice centre distance；
Step 3, obtains the index value analyzed for photo densitometry according to abrasive particle area coverage percent；
Step 4, is drawn the trend curve figure that index changed with the sampling time, is entered mechanical wear situation by three-value evaluation
Row judges.
As a kind of preferred version of the inventive method, concretely comprising the following steps of described step 1:
11) open light source, light source voltage is transferred in advance about 4 volts, observe spectral slice abrasive particle with 10 × object lens and focus on, then
It is converted into 40 × object lens observe spectral slice abrasive particle and focus on；
12) trinocular microscope visual field is moved to the clean place not having abrasive particle in spectral slice, adjust microscopes optical path and make light enter
Enter the 3rd mesh, and the numeral of display on system host computer is adjusted to 0.000；
13) adjusting microscopes optical path makes light can not enter the 3rd mesh, and the numeral of display on system host computer is adjusted to
1.000；
14) the black and white optical filter that shading rate is 50% is covered on light light hole, and regulate the voltage of light source, make system
On host computer, the numeral of display is 0.500；
15) take out black and white optical filter, if the numeral of display is not 0.000 on system host computer, then continue system upper
On machine, the numeral of display is adjusted to 0.000；
16) repeat 14), 15) make photo densitometry analyze system meet 13 simultaneously) and 14) requirement, then photo densitometry
Analysis system calibration is complete.
As a kind of preferred version of the inventive method, concretely comprising the following steps of described step 2:
21) the blank rotary-ferrograph spectral slice being decorated with two crossed diagonal is lain in groove, seen by eyepiece
Examine diagonal cross point i.e. spectral slice center, move horizontally object stage and make cross point be positioned at field of view center, determine the most electronic loading
The position of platform is zero point；
22) with motorized subject table be positioned at zero point time spectral slice center for microscopic fields of view displacement initial point, with 45 ° as interval angles
Being distributed 8 microscopic fields of view straight-line displacement paths, every displacement path starts from initial point, finally beyond spectral slice outer shroud at 3mm；
23) visual field selects any one paths automatically to reset after initial point moves to terminal, records simultaneously and stores
In trinocular microscope visual field, abrasive particle area coverage percent and field of view center are away from spectral slice centre distance, during reset, do not calculate visual field
Interior abrasive particle area coverage percent；
24) interval angles is to carry out identical action on next paths of 45 ° in the clockwise direction, completes 8 not
After the movement on path, motorized subject table automatically resets and stops.
As concretely comprising the following steps of a kind of preferred version of the inventive method, described step 3 and step 4:
31) abrasive particle area coverage percent and the field of view center data away from spectral slice centre distance in trinocular microscope visual field
In, extracting field of view center respectively is 4.5mm-6.5mm, 8.5mm-10.5mm, 13.5mm-15.5mm tri-away from spectral slice centre distance
Abrasive particle area coverage percent maximum in interval, using these 3 maximum as spectral slice internal ring abrasive particle area coverage hundred
Mark, medium ring abrasive particle area coverage percent, outer shroud abrasive particle area coverage percent；
32) after the movement completing 8 visual field displacement paths, calculate and store spectral slice internal ring abrasive particle area coverage percent
Meansigma methods AL, spectral slice medium ring abrasive particle area coverage percent meansigma methods AM, spectral slice outer shroud abrasive particle area coverage percent meansigma methods
AS, wear particle concentration AL+AM+AS, abrasion earthquake intensity index [AL+(AM+AS)][AL-(AM+AS)]；
33) wear particle concentration of same machinery position oil sample, abrasion earthquake intensity index are drawn with the trend song changed sample time
Line chart, arranges " attention ", " warning ", " fault " 3 critical lines according to three-value evaluation, judges the wear condition of machinery.
The present invention uses above technical scheme compared with prior art, has following technical effect that
Rotary-ferrograph spectral slice photo densitometry of the present invention analyzes system and method, can automatically measure spectral slice diverse location
Abrasive particle area coverage percent, alleviates operator's workload, reduces measurement error, can deposit test data easily
Store up, process and show, and can select different test data are patterned display by user, facilitate user quickly to divide
Analysis and prediction.
Accompanying drawing explanation
Fig. 1 is the structural representation that rotary-ferrograph spectral slice photo densitometry of the present invention analyzes system.
Fig. 2 is rotary-ferrograph spectral slice of the present invention and microscopic fields of view displacement path schematic diagram.
Fig. 3 is motorized subject table groove and breach schematic diagram in the present invention；Wherein, (a) is top view, and (b) is side view.
Fig. 4 is that schematic diagram is chosen in tradition photo densitometry instrument position of 8 observation visual fields on spectral slice each wear particle deposition ring；
Wherein, (a) is internal ring, and (b) is medium ring, and (c) is outer shroud.
Fig. 5 is the flow chart that PC control motorized subject table of the present invention moves along microscopic fields of view displacement path.
Fig. 6 is the flow chart that rotary-ferrograph spectral slice photo densitometry of the present invention analyzes method.
Wherein, 1-trinocular microscope；2-light source；3-motorized subject table；4-rotary-ferrograph spectral slice；5-photoelectric sensing
Device；6-trans-impedance amplifier；The multi-functional board of 7-；8-host computer；9-motor driver；10-wear particle deposition ring internal ring；11-abrasive particle
Deposition ring medium ring；12-wear particle deposition ring outer shroud；13-microscopic fields of view displacement path；14-groove；15-groove breach；16-shows
Micro mirror observation visual field.
Detailed description of the invention
Embodiments of the present invention are described below in detail, and the example of described embodiment is shown in the drawings, the most ad initio
Represent same or similar element to same or similar label eventually or there is the element of same or like function.Below by ginseng
The embodiment examining accompanying drawing description is exemplary, is only used for explaining the present invention, and is not construed as limiting the claims.
As it is shown in figure 1, one rotary-ferrograph spectral slice photo densitometry of the present invention analyzes system, including trinocular microscope
1, light source 2, motorized subject table 3, photoelectric sensor 5, trans-impedance amplifier 6, multi-functional board 7, host computer 8, motor driver 9；
Light source 2 is light emitting diode, and the light of generation is monochromatic light, and light intensity is controlled；Motorized subject table 3 is driven by motor, and motor is stepping
Motor or servomotor；Motorized subject table 3 is provided with limit switch, prevents motorized subject table 3 displacement break bounds；Motorized subject table
3 are provided with square indentations 14, and for fixing rotary ferrograph spectral slice 4, groove 14 side is provided with breach 15 for gripping spectral slice
4；Photoelectric sensor 5 is arranged in gauge head, and gauge head is connected with the 3rd mesh of trinocular microscope 1 by trip bolt；Photoelectric sensing
Device 5 is silicon cell, and the intensity of illumination being subject to is linear with the photoelectric current of generation；Silicon cell illumination receiving plane is with micro-
Mirror the 3rd sight road is vertical, and silicon cell illumination receiving plane is centrally located on the axis of trinocular microscope 1 the 3rd sight road；Many
Functional cards 7 is not only electric machine controller, and is trans-impedance amplifier 6 output signal harvester；Trans-impedance amplifier 6 input is even
Connecing photoelectric sensor 5 the two poles of the earth, outfan connects multi-functional board 7 input end of analog signal mouth；Multi-functional board 7 passes through data wire
It is connected to host computer 8.
As in figure 2 it is shown, the planar transparent sheet glass that rotary-ferrograph spectral slice 4 is 55mm × 55mm × 0.2mm, according to rotation
The design of rotatable ferrograph magnetic head magnetic circuit, after notation, abrasive particle can form three concentric circular abrasive particle deposition ring in spectral slice 4, heavy
The center of circle of long-pending ring and the center superposition of square spectral slice 4.The radial width of three wear particle deposition rings is 1mm, straight outside internal ring 10
Footpath is 12mm, and medium ring 11 outside diameter is 20mm, and outer shroud 12 outside diameter is 30mm.Because the magnetic line of force be from spectral slice 4 center to
Surrounding distributes, and diminishes successively to outer shroud 12 magnetic field force size from internal ring 10, therefore the abrasive particle chi of deposition on three wear particle deposition rings
Very little internal ring 10 grit size that is distributed as is maximum, and medium ring 11 takes second place, and outer shroud 12 is minimum.
As shown in (a) and (b) of Fig. 3, microscope motorized subject table 3 center is provided with 55.2mm × 55.2mm × 1mm
Square indentations 14, be used for fixing spectral slice 4；Groove 14 bottom centre's through hole cross section is 35mm × 35mm, both can make groove
Bottom 14, spectral slice is formed effectively support, the observation to wear particle deposition ring will not be hindered again, and spectral slice 4 will not be allowed from groove 14 end
The situation that portion's through hole falls down occurs；Groove 14 side is provided with breach 15 for gripping spectral slice 4.
8 visual fields 16 such as (a) of Fig. 4 that rotary-ferrograph spectral slice 4 internal ring is observed by tradition photo densitometry instrument
Shown in, 8 visual fields 16 being observed spectral slice 4 medium ring are as shown in (b) of Fig. 4, and 8 that are observed spectral slice 4 outer shroud regard
Field 16 is as shown in (c) of Fig. 4.The inner side of internal ring 10 is the place that heavy wear granule deposition probability is maximum, therefore in internal ring 10
Side is chosen 8 symmetric field and is observed；The inner side of medium ring 11 is friction polymer, various oxide, the non-ferric of weak ferromagnetism
The place that the wear particle deposition probabilities such as metallic particles are maximum, therefore inside medium ring 11, choose 8 symmetric field be observed；Outward
The outside of ring 12 is the place that corrosive wear granule deposition probability is maximum, therefore chooses 8 symmetric field outside outer shroud 12 and carry out
Observation.
Include as it is shown in figure 5, control the microscope motorized subject table 3 movement on horizontal two-dimension direction by host computer 8
Following steps:
1) the blank rotary-ferrograph spectral slice 4 being decorated with two crossed diagonal is lain in groove 15, pass through eyepiece
Observe diagonal cross point, move horizontally object stage 3 and make cross point be positioned at field of view center, determine the position of now motorized subject table 3
It is set to zero point；
2) as in figure 2 it is shown, with microscope motorized subject table 3 be positioned at zero point time spectral slice 4 center former for microscopic fields of view displacement
Point, is distributed 8 microscopic fields of view straight-line displacement paths 13 with 45 ° for interval angles, and every displacement path starts from initial point, finally
Beyond spectral slice 4 outer shroud at 3mm；
3) visual field resets on right direction path after initial point moves to terminal automatically, and is spaced in the clockwise direction
Angle is to move on next paths of 45 °；
4) after the displacement completed on 8 different paths, motorized subject table 3 automatically resets and stops.
As shown in Figure 6, host computer 8 measures abrasive particle area coverage percent, calculates ferrum spectrum quantitative target numerical value and stores, painting
Go out the trend curve figure that quantitative analysis index changes with the sampling time, according to quantitative analysis index value and wear trend to machinery
Wear condition judges, specifically includes following steps:
1) system of analyzing photo densitometry carries out zeroing and adjusts one operation；
2) spectral slice 4 to be measured is put into object stage groove 14, when forward moves on displacement path in visual field, show in real time
Distance away from spectral slice center of abrasive particle area coverage percent and field of view center also draws spectrum position curve；
3) extracting field of view center respectively is 4.5mm-6.5mm, 8.5mm-10.5mm, 13.5mm-away from spectral slice 4 centre distance
Abrasive particle area coverage percent maximum in tri-intervals of 15.5mm, 3 maximum are respectively spectral slice 4 internal ring abrasive particle coverage rate
Long-pending percent, medium ring abrasive particle area coverage percent, outer shroud abrasive particle area coverage percent；
4) after all of 24 maximum are extracted, the abrasive particle that spectral slice 4 internal ring 8 different visual fields are calculated and be shown covers
Lid area percent meansigma methods AL, abrasive particle area coverage percent meansigma methods A of 8 different visual fields of spectral slice medium ringM, spectral slice outer shroud 8
Abrasive particle area coverage percent meansigma methods A of individual different visual fieldS, wear particle concentration AL+AM+AS, abrasion earthquake intensity index [AL+(AM+
AS)][AL-(AM+AS)]；
5) input sample names and sample time above-mentioned quantitative target stored；
6) for all samples of same title, extract same quantitative target and make its trend song with change sample time
Line chart；
7) " attention ", " warning ", " fault " 3 critical lines are set according to three-value evaluation, make the user can be with simple, intuitive
Plant equipment is carried out status monitoring.
Wherein, zeroing adjusts one to include following operation:
1) open microscopic transmission light source, light source voltage is transferred in advance about 4 volts, observe spectral slice abrasive particle also with 10 × object lens
Focus on, be then converted into 40 × object lens and observe spectral slice abrasive particle and focus on；
2) visual field is moved to the clean place not having abrasive particle in spectral slice, then microscopes optical path stick is pulled out, make light
Enter gauge head, click on photo densitometry and analyze " zeroing " button on system guidance panel, make the numeral on digital display screen be
0.000；
3) stick is pushed, make light can not enter gauge head, click on photo densitometry and analyze on system guidance panel
" tune one " button, making the numeral on digital display screen is 1.000；
4) the black and white optical filter that shading rate is 50% is covered on the transmission light light hole of Microscope base, regulate transmission light
The voltage-regulation knob in source, making the numeral on digital display screen is 0.500；
5) take out black and white optical filter, if the numeral on digital display screen is not 0.000, then continue on clicking operation panel
" return to zero " button, and making the numeral on digital display screen is 0.000；
6) repeat 4), 5) make photo densitometry analyze system meet 3 simultaneously) and 4) requirement, then system calibration is complete.
Wherein, in abrasive particle area coverage percent refers to microscopic visual field, abrasive particle area coverage accounts for whole visual field area
Percentage ratio.
If only considering data acquisition time, tradition photo densitometry instrument completes the abrasive particle area coverage percentage of 24 visual fields
Number is measured at least needs 12 minutes, and rotary-ferrograph spectral slice photo densitometry of the present invention is analyzed system and completed position, 8 visual fields
The abrasive particle area coverage percent moving path was measured less than 4 minutes, saves the data acquisition time of nearly 70%, solves simultaneously
The visual fatigue problem that operator produce because of long-time observation.It addition, tradition photo densitometry instrument is complete in DATA REASONING
After, in addition it is also necessary to operator calculate other quantitative parameters according to abrasive particle area coverage percent, and rotary-ferrograph of the present invention
Spectral slice photo densitometry is analyzed system and is the most automatically calculated other quantitative parameters during data acquisition.Meanwhile, the present invention
After data acquisition, analysis, input sample names and sample time quantitative parameter stored；For same title
All samples, extract same quantitative parameter and make its trend curve figure with change sample time, by three-value evaluation to machinery
Equipment carries out status monitoring, simple, intuitive.
Above example is only the technological thought that the present invention is described, it is impossible to limit protection scope of the present invention with this, every
The technological thought proposed according to the present invention, any change done on the basis of technical scheme, each fall within scope
Within.
Claims (9)
1. a rotary-ferrograph spectral slice photo densitometry analyzes system, it is characterised in that include trinocular microscope, carry limited
The motorized subject table of bit switch, motor driver, photoelectric sensor, trans-impedance amplifier, multi-functional board and host computer；Described
Trinocular microscope includes that light source, object lens, the motorized subject table of band limit switches are arranged between light source and object lens；Three mesh are micro-
3rd mesh of mirror is connected with photoelectric sensor, and the illumination receiving plane of photoelectric sensor is vertical with the 3rd sight road, and photoelectric sensing
The illumination receiving plane of device is centrally located on the 3rd sight road axis；Photoelectric sensor links with multifunction board through trans-impedance amplifier
Connecing, multi-functional board is connected with host computer, motor driver the most respectively, motor driver and the electronic loading of band limit switches
Platform connects.
The most according to claim 1 rotary-ferrograph spectral slice photo densitometry analyze system, it is characterised in that described with
The motorized subject table of limit switch is provided with the square indentations for fixing rotary ferrograph spectral slice, and square indentations side sets
Fluted breach.
The most according to claim 2, rotary-ferrograph spectral slice photo densitometry analyzes system, it is characterised in that described light source
For light emitting diode.
The most according to claim 2, rotary-ferrograph spectral slice photo densitometry analyzes system, it is characterised in that described photoelectricity
Sensor is silicon cell.
The most according to claim 2 rotary-ferrograph spectral slice photo densitometry analyze system, it is characterised in that described with
The motorized subject table of limit switch is driven by motor, and motor is motor or servomotor.
6. a rotary-ferrograph spectral slice photo densitometry analyzes method, it is characterised in that comprise the steps:
Step 1, system of analyzing rotary-ferrograph spectral slice photo densitometry carries out zeroing and adjusts one calibration operation；
Step 2, is placed in rotary-ferrograph spectral slice to be measured in square indentations, by PC control motorized subject table edge
The visual field displacement path of trinocular microscope moves, and records simultaneously and store abrasive particle area coverage percent in trinocular microscope visual field
With field of view center away from spectral slice centre distance；
Step 3, obtains the index value analyzed for photo densitometry according to abrasive particle area coverage percent；
Step 4, is drawn the trend curve figure that index changed with the sampling time, is sentenced mechanical wear situation by three-value evaluation
Disconnected.
The most according to claim 6, rotary-ferrograph spectral slice photo densitometry analyzes method, it is characterised in that described step
1 concretely comprise the following steps:
11) open light source, light source voltage is transferred in advance about 4 volts, observe spectral slice abrasive particle with 10 × object lens and focus on, then changing
40 × object lens are become to observe spectral slice abrasive particle and focus on；
12) trinocular microscope visual field is moved to not have in spectral slice the clean place of abrasive particle, adjust microscopes optical path and make light enter the
Three mesh, and the numeral of display on system host computer is adjusted to 0.000；
13) adjusting microscopes optical path makes light can not enter the 3rd mesh, and the numeral of display on system host computer is adjusted to
1.000；
14) the black and white optical filter that shading rate is 50% is covered on light light hole, and regulate the voltage of light source, make system upper
On machine, the numeral of display is 0.500；
15) take out black and white optical filter, if the numeral of display is not 0.000 on system host computer, then continue on system host computer
The numeral of display is adjusted to 0.000；
16) repeat 14), 15) make photo densitometry analyze system meet 13 simultaneously) and 14) requirement, then photo densitometry analysis
System calibration is complete.
The most according to claim 6, rotary-ferrograph spectral slice photo densitometry analyzes method, it is characterised in that described step
2 concretely comprise the following steps:
21) lying in groove by the blank rotary-ferrograph spectral slice being decorated with two crossed diagonal, it is right to be observed by eyepiece
Linea angulata cross point i.e. spectral slice center, moves horizontally object stage and makes cross point be positioned at field of view center, determines now motorized subject table
Position is zero point；
22) with motorized subject table be positioned at zero point time spectral slice center for microscopic fields of view displacement initial point, with 45 ° for interval angles be distributed
Going out 8 microscopic fields of view straight-line displacement paths, every displacement path starts from initial point, finally beyond spectral slice outer shroud at 3mm；
23) visual field selects any one paths automatically to reset after initial point moves to terminal, records simultaneously and store three mesh
In microscopic fields of view, abrasive particle area coverage percent and field of view center are away from spectral slice centre distance, during reset, grind in not calculating visual field
Grain area coverage percent；
24) interval angles is to carry out identical action on next paths of 45 ° in the clockwise direction, does not goes the same way completing 8
After movement on footpath, motorized subject table automatically resets and stops.
The most according to claim 6, rotary-ferrograph spectral slice photo densitometry analyzes method, it is characterised in that described step
3 and the concretely comprising the following steps of step 4:
31) in trinocular microscope visual field abrasive particle area coverage percent and the field of view center data away from spectral slice centre distance,
Extracting field of view center respectively is tri-districts of 4.5mm-6.5mm, 8.5mm-10.5mm, 13.5mm-15.5mm away from spectral slice centre distance
Interior abrasive particle area coverage percent maximum, using these 3 maximum as spectral slice internal ring abrasive particle area coverage percentage
Number, medium ring abrasive particle area coverage percent, outer shroud abrasive particle area coverage percent；
32) after the movement completing 8 visual field displacement paths, calculate and store spectral slice internal ring abrasive particle area coverage percent average
ValueA L , spectral slice medium ring abrasive particle area coverage percent meansigma methodsA M , spectral slice outer shroud abrasive particle area coverage percent meansigma methodsA S , mill
Grain concentrationA L +A M +A S , abrasion earthquake intensity index [A L +(A M +A S )][A L -(A M +A S )]；
33) wear particle concentration of same machinery position oil sample, abrasion earthquake intensity index are drawn with the trend curve figure changed sample time,
" attention ", " warning ", " fault " 3 critical lines are set according to three-value evaluation, the wear condition of machinery is judged.
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