CN106226615A - A kind of electronic equipment automatization test system - Google Patents
A kind of electronic equipment automatization test system Download PDFInfo
- Publication number
- CN106226615A CN106226615A CN201610521647.8A CN201610521647A CN106226615A CN 106226615 A CN106226615 A CN 106226615A CN 201610521647 A CN201610521647 A CN 201610521647A CN 106226615 A CN106226615 A CN 106226615A
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- CN
- China
- Prior art keywords
- module
- test system
- electronic equipment
- processing class
- class board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Monitoring And Testing Of Exchanges (AREA)
Abstract
The present invention relates to a kind of electronic equipment automatization test system, it uses the Auto-Test System platform of the trunk mixed structure of PXI, GPIB, is configured with instrument and slave displays such as digital multimeter, digital oscilloscope, signal generator, programme-controlled dc power, testing source, A/D and D/A module, numeral I/O module, matrix switch module and serial interface module;Wherein testing source is for from grinding module, and for providing specific pumping signal to some signal processing class board, slave display is for the output test of some image processing class board;Present system can effectively reduce the skill set requirements to maintainer, shortens maintenance time, reduces maintenance support cost, has certain promotional value.
Description
Technical field
The invention belongs to automatic test field, be specifically related to a kind of electronic equipment automatization test system.
Background technology
Along with the progress of science and technology, the complexity of electronic equipment improves day by day, causes the difficulty of its maintenance support to add
Greatly, it once breaks down, and can solve problem though on-the-spot by the way of changing spare part, and fault board is had to depot repair
Or sending technical staff to go to field maintenance, the maintenance support cycle is long, life cycle management maintenance cost is high.
Summary of the invention
Technical problem: the problem existed for above-mentioned prior art, the present invention provides a kind of electronic equipment automatic test
System.
Technical scheme: the present invention relates to a kind of electronic equipment automatization test system, it uses PXI, GPIB trunk mixed
The Auto-Test System platform built, is configured with digital multimeter, digital oscilloscope, signal generator, programme-controlled dc power, survey
The instruments such as trial signal source, A/D and D/A module, numeral I/O module, matrix switch module and serial interface module and a pair show
Show device;Wherein testing source is for from grinding module, and for providing specific pumping signal to some signal processing class board, pair is aobvious
Show that device is tested for the output of some image processing class board.
The method have the advantages that
1, present system can effectively reduce the skill set requirements to maintainer, shortens maintenance time, reduces maintenance support cost.
2, the present invention efficiently solves the testing and diagnosing problem of certain electronic equipment, has certain promotional value.
Accompanying drawing explanation
Fig. 1 is the system principle diagram of the present invention.
Fig. 2 is bus communication schematic diagram of the present invention.
Fig. 3 is input equipment fault tree schematic diagram in the present invention.
Detailed description of the invention
Below in conjunction with the accompanying drawings and embodiment further illustrates technical scheme.
As it is shown in figure 1, a kind of electronic equipment automatization test system, it uses the automatic of the trunk mixed structure of PXI, GPIB
Testing system platform, be configured with digital multimeter, digital oscilloscope, signal generator, programme-controlled dc power, testing source,
Instrument and slave displays such as A/D and D/A module, numeral I/O module, matrix switch module and serial interface module;Wherein
Testing source is for from grinding module, and for providing specific pumping signal to some signal processing class board, slave display is used for
The output test of some image processing class board.
As in figure 2 it is shown, the industry control primary module on interface adapter uses PCM3362N computer module, module has attached symbol
Close ISA and the pci bus of PC/104Plus specification, can directly communicate with isa bus and pci bus awaiting board card.
As it is shown on figure 3, according to testing requirement, whole test program comprises functional test and fault diagnosis two parts;Function
Part of detecting is for the fault detect of testing component, and fault diagnosis part is used for diagnosing, positioning fault zone;Functional test part
Use automated testing method, automatically call test resource and test, reduce artificial intervention as far as possible, to improve test speed
Degree;Fault diagnosis part uses fault diagnosis expert system based on FTA;Its operation principle is fault diagnosis
Knowledge is shown by the formal intuition of fault tree, is then passed through collecting and refine that to be converted into test software platform concrete
Diagnotor;During test, system guides operator progressively to carry out deeply by the way of human-computer interaction interface exchanges with operator
Diagnosis, finally positions failure cause.
Claims (1)
1. an electronic equipment automatization test system, it is characterised in that: it uses the automatic of the trunk mixed structure of PXI, GPIB
Testing system platform, be configured with digital multimeter, digital oscilloscope, signal generator, programme-controlled dc power, testing source,
Instrument and slave displays such as A/D and D/A module, numeral I/O module, matrix switch module and serial interface module;Wherein
Testing source is for from grinding module, and for providing specific pumping signal to some signal processing class board, slave display is used for
The output test of some image processing class board.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610521647.8A CN106226615A (en) | 2016-07-05 | 2016-07-05 | A kind of electronic equipment automatization test system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610521647.8A CN106226615A (en) | 2016-07-05 | 2016-07-05 | A kind of electronic equipment automatization test system |
Publications (1)
Publication Number | Publication Date |
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CN106226615A true CN106226615A (en) | 2016-12-14 |
Family
ID=57519142
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201610521647.8A Pending CN106226615A (en) | 2016-07-05 | 2016-07-05 | A kind of electronic equipment automatization test system |
Country Status (1)
Country | Link |
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CN (1) | CN106226615A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108776295A (en) * | 2018-06-06 | 2018-11-09 | 北京中航科电测控技术股份有限公司 | A kind of efficient ETAP automatization test systems |
CN109188249A (en) * | 2018-09-27 | 2019-01-11 | 国核自仪系统工程有限公司 | Nuclear power station security level I&C system board automatic testing equipment |
-
2016
- 2016-07-05 CN CN201610521647.8A patent/CN106226615A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108776295A (en) * | 2018-06-06 | 2018-11-09 | 北京中航科电测控技术股份有限公司 | A kind of efficient ETAP automatization test systems |
CN109188249A (en) * | 2018-09-27 | 2019-01-11 | 国核自仪系统工程有限公司 | Nuclear power station security level I&C system board automatic testing equipment |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20161214 |
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WD01 | Invention patent application deemed withdrawn after publication |