CN106225919A - Distributed luminosity measuring method based on lock-in amplifier and the system of measurement - Google Patents

Distributed luminosity measuring method based on lock-in amplifier and the system of measurement Download PDF

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Publication number
CN106225919A
CN106225919A CN201610620370.4A CN201610620370A CN106225919A CN 106225919 A CN106225919 A CN 106225919A CN 201610620370 A CN201610620370 A CN 201610620370A CN 106225919 A CN106225919 A CN 106225919A
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CN
China
Prior art keywords
lock
amplifier
signal
light
chopper
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610620370.4A
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Chinese (zh)
Inventor
朱腾飞
钱枫
汪哲弘
慎月强
蔡怡
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HANGZHOU QUALITY TECHNOLOGY SUPERVISION INSPECTION INSTITUTE
Original Assignee
HANGZHOU QUALITY TECHNOLOGY SUPERVISION INSPECTION INSTITUTE
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Publication date
Application filed by HANGZHOU QUALITY TECHNOLOGY SUPERVISION INSPECTION INSTITUTE filed Critical HANGZHOU QUALITY TECHNOLOGY SUPERVISION INSPECTION INSTITUTE
Priority to CN201610620370.4A priority Critical patent/CN106225919A/en
Publication of CN106225919A publication Critical patent/CN106225919A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0295Constructional arrangements for removing other types of optical noise or for performing calibration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources

Abstract

The present invention relates to distributed luminosity measuring method based on lock-in amplifier and measurement system.The measuring method that purpose is to provide should be able to cancelling noise signal disturbing, it is provided that measurement system there is the feature of simple in construction.Technical scheme is: distributed luminosity measuring method based on lock-in amplifier, sequentially includes the following steps: 1) place chopper;2) photodetector is connected to lock-in amplifier;3) lock-in amplifier is connected to computer;4) sample is placed in distribution photometer station to be measured to fix;5) equipment is made to enter duty;6) distribution photometer main axis;7) from noise, faint optical signal is detected;8) distribution photometer is by controlling double freedom turntable real-time motion;9) luminous flux is calculated.Distributed luminosity based on lock-in amplifier measures system, including distribution photometer main frame, photodetector and computer;The front end of photodetector is furnished with chopper, and chopper is connected to manipulator, and system is also configured with lock-in amplifier.

Description

Distributed luminosity measuring method based on lock-in amplifier and the system of measurement
Technical field
The present invention relates to a kind of measuring method and system, especially distributed luminosity measuring method and the system of measurement.
Background technology
Distribution photometer is to test various light fixtures, the capital equipment of light source intensity distribution.This equipment passes through swing arm and sample Synchronous axial system, is received the luminous intensity of measured light different directions, is calculated light intensity spatial distribution by photodetector pointwise Data.But existing distribution photometer is when measuring light intensity data, the photodetector of use is to the linear response of light intensity Defect;Especially switching rapidly and when noise jamming at micrometer weak light source, strong and weak light, uncertainty of measurement is very big, light intensity Data easily produce Systematic Errors.This is the key factor affecting luminous intensity distribution measurement accuracy at present.
Summary of the invention
It is an object of the invention to overcome the deficiency of above-mentioned background technology, it is provided that a kind of distributed luminosity based on lock-in amplifier Measuring method and the system of measurement;The measuring method provided should be able to reject the noise signal interference of non-correlation, thus at noise In signal, accurately pickup detects faint measured signal, and the measurement system provided also has simple in construction, practical feature.
Present invention provide the technical scheme that
Distributed luminosity measuring method based on lock-in amplifier, sequentially includes the following steps:
1) placing chopper in photodetector front end, chopper is connected to manipulator, and manipulator reconnects phase-locked amplification Device;Wherein manipulator controls the operating frequency of chopper according to test needs, regulation, and as frequency signal, inputs to lock The reference signal end of phase amplifier;
2) photodetector outfan is connected to the test signal input part of lock-in amplifier, lock-in amplifier is exported Measured signal;
3) signal output part of lock-in amplifier is connected to computer, receives light intensity data for computer;
4) sample (light fixture or light source) is placed in distribution photometer station to be measured to fix, and connects power line;
5) give computer, distribution photometer host supplying power, light measured light;To photodetector, lock-in amplifier, cut Light device is powered, and makes equipment enter duty;
6) distribution photometer main axis, light measured light a direction sent by the reflecting mirror of distribution photometer Reflex to be received by photodetector again after chopper accepts modulation, then export as measured signal;Lock-in amplifier is simultaneously Receive the reference frequency signal coming from chopper and manipulator, and as lock-in amplifier computing reference signal;With reference to letter Number and measured signal be input simultaneously in lock-in amplifier, computer by software collection lock-in amplifier obtain and computing after Photosignal record;
7) lock-in amplifier is by the Integral Processing that is multiplied reference signal x (t), measured signal y (t), suppression The noise of photodetector, makes faint optical signal detect from noise;
8) distribution photometer is by controlling double freedom turntable real-time motion, is not forfeited by the light that light source different directions sends In photodetector, obtained by lock-in amplifier, continuous print light intensity signal I (θ, φ) is measured light difference luminous flat Light distribution on different light emitting angers;
9) light intensity data obtained by is again through the calculating of following luminosity computing formula:
Can calculate by the luminous flux of light-metering, thus realize the accurate measurement to distribution of light sources luminosity.
Described step 6) in the luminous reflectance that sends of measured light a direction accept modulation to chopper, by adjusting chopping the light Device frequency realizes.
Distributed luminosity based on lock-in amplifier measures system, including with double free turntables and the distribution photometer of diaphragm Main frame, for detecting the photodetector of optical signal and to the detection computer that processes of signal;It is characterized in that described The front end of photodetector is furnished with the chopper that the optical signal to the reflection of distribution photometer main frame is modulated, and chopper is connected to Manipulator, described system is also configured with lock-in amplifier, and the reference signal end of lock-in amplifier connects the signal of chopper Input, the reference signal end of lock-in amplifier connects the signal output part of manipulator, the letter after lock-in amplifier computing Number it is delivered to computer.
Described photodetector and chopper are installed in detector carriage.
The invention has the beneficial effects as follows:
The measuring method that the present invention provides, owing to being configured with lock-in amplifier at distribution photometer, eliminates nothing effectively The noise signal of dependency, eliminates the interference of noise signal, thus can accurately pick up faint tested letter in noise signal Number detect, particularly can be to the high-acruracy survey (measured deviation is less than 2%) of low light level distributed luminosity.The survey that the present invention provides Amount system, only adds lock-in amplifier and chopper on the basis of existing equipment, thus simple in construction, practical, especially It is suitable for the detection of faint light.
Accompanying drawing explanation
Fig. 1 is the attachment structure schematic diagram of distributed luminosity test system involved by the embodiment of the present invention.
Fig. 2 is the measurement procedure schematic diagram of the embodiment of the present invention.
Figure has: distribution photometer main frame 1, double freedom turntable 2, sample 3, power supply 4, diaphragm 5, light electrical resistivity survey Survey device 6, chopper 7, manipulator 8, lock-in amplifier 9, optical path 10, computer 11, detector carriage 12.
Detailed description of the invention
Further illustrate below in conjunction with embodiment shown in the drawings.
Lock-in amplifier is small-signal phase-sensitive detection device based on correlation detection technology.Coherent detection is frequency-region signal Arrowband processing method, be the measurement of correlation of a kind of integral process.It utilizes correlation properties between signal and external signal, picks Except the noise signal of non-correlation is disturbed, reach accurately to pick up in noise signal to detect faint measured signal purpose.
The distributed luminosity test system using lock-in amplifier includes with lower part:
Distribution photometer main frame is with double free turntables and diaphragm 5, and photodetector is used for detecting optical signal, computer 11 For detection signal is processed;These are all similar with existing distributed luminosity test system.
The improvement of the present invention, one is to be furnished with the chopper that the optical signal to the reflection of distribution photometer main frame is modulated, should Chopper is arranged on the front end of described photodetector;Described photodetector and chopper are mounted in detector carriage. Two is that described system is configured with lock-in amplifier, and the reference signal end of this lock-in amplifier connects chopper and manipulator, The input of lock-in amplifier connects the outfan of photodetector, and the signal after lock-in amplifier computing is delivered to computer.
The measuring method that the present invention provides comprises the following steps (seeing Fig. 2):
1, placing chopper in photodetector front end, chopper connects manipulator, and manipulator reconnects lock-in amplifier. Wherein manipulator controls the operating frequency of chopper according to test needs, regulation, and as frequency signal, inputs to phase-locked putting The reference signal end of big device;
2, photodetector outfan is connected to the test signal input part of lock-in amplifier, lock-in amplifier is exported Measured signal;
3, the signal output part of lock-in amplifier is connected on computer, is used for receiving light intensity data;
4, sample (light fixture or light source) is placed in distribution photometer station to be measured to fix, and connects power line;
5, switch on power to package unit, i.e. give computer, distribution photometer host supplying power, light measured light;To light Electric explorer, lock-in amplifier, chopper are powered, and make equipment enter duty;
6, distribution photometer main axis, luminous reflectance measured light a direction sent by photometric reflecting mirror Received by photodetector again after accepting modulation to chopper, then export as measured signal;Lock-in amplifier receives simultaneously To coming from the reference frequency signal of chopper and manipulator, and as lock-in amplifier computing reference signal;Reference signal and Measured signal is input simultaneously in lock-in amplifier, and computer is by the photoelectricity after the acquisition of software collection lock-in amplifier and computing Signal record.
7, lock-in amplifier uses Theory of correlation detection, by carrying out reference signal x (t), measured signal y (t) Be multiplied Integral Processing, the noise of suppression detector, makes faint optical signal detect from noise;That is:
X (t)=Vs (t)+n1(t)
Y (t)=Vr (t)+n2(t)
R x y ( τ ) = lim T → ∞ 1 2 T ∫ - T T x ( t ) γ ( t - τ ) d t = R S r ( τ ) + R S 2 ( τ ) + R r 1 ( τ ) + R 12 ( τ )
R x y ( τ ) = lim T → ∞ 1 2 T ∫ - T T V s ( t ) * V r ( t - τ ) d t
8, owing to photometer is by controlling turntable real-time motion, the light sent by light source different directions is constantly delivered to visit Surveying in device, it is luminous that continuous print light intensity signal I (θ, φ) that lock-in amplifier obtains is measured light difference luminous flat difference Light distribution on angle;
9, obtained light intensity data is used following luminosity computing formula (conventional public by the signal processing system in computer Formula) calculate:
Thus calculate by the luminous flux of light-metering, it is achieved and the accurate measurement to distribution of light sources luminosity, especially the low light level is distributed The high-acruracy survey of luminosity.
Test concrete example
Choose the standard LED straight tube light source of a low light level.Its luminous flux by certificate of measurement and weight it is known that be 14.02lm.
With conventional this sample of distributed photometer retest 3 times, record luminous flux respectively:
14.93lm, 13.56lm, 14.45lm;
Thus illustrate, measure in case in weak light source maximum conditions, record the linearity of luminous flux array and concordance relatively Difference, the data such as luminous flux, light distribution all cannot ensure accurate reliability.
Use distributed luminosity based on the lock-in amplifier test system that the present invention provides, retest 3 times, record light and lead to Amount is respectively as follows: 14.20lm, 14.26lm, 14.21lm.Compared with sample standard value, deviation < 2%, it was demonstrated that repeated measurement data has There is high concordance.

Claims (4)

1. distributed luminosity measuring method based on lock-in amplifier, sequentially includes the following steps:
1) placing chopper in photodetector front end, chopper is connected to manipulator, and manipulator reconnects lock-in amplifier;Its Middle manipulator controls the operating frequency of chopper according to test needs, regulation, and as frequency signal, inputs to phase-locked amplification The reference signal end of device;
2) photodetector outfan is connected to the test signal input part of lock-in amplifier, tested to lock-in amplifier output Signal;
3) signal output part of lock-in amplifier is connected to computer, receives light intensity data for computer;
4) sample (light fixture or light source) is placed in distribution photometer station to be measured to fix, and connects power line;
5) give computer, distribution photometer host supplying power, light measured light;To photodetector, lock-in amplifier, chopper Power supply, makes equipment enter duty;
6) distribution photometer main axis, luminous reflectance measured light a direction sent by the reflecting mirror of distribution photometer Received by photodetector again after accepting modulation to chopper, then export as measured signal;Lock-in amplifier receives simultaneously To coming from the reference frequency signal of chopper and manipulator, and as lock-in amplifier computing reference signal;Reference signal and Measured signal is input simultaneously in lock-in amplifier, and computer is by the photoelectricity after the acquisition of software collection lock-in amplifier and computing Signal record;
7) lock-in amplifier is by the Integral Processing that is multiplied reference signal x (t), measured signal y (t), suppresses photoelectricity The noise of detector, makes faint optical signal detect from noise;
8) distribution photometer is by controlling double freedom turntable real-time motion, and the light sent by light source different directions constantly delivers to light In electric explorer, obtained by lock-in amplifier, continuous print light intensity signal I (θ, φ) is measured light difference luminous flat difference Light distribution on light emitting anger;
9) light intensity data obtained by is again through the calculating of following luminosity computing formula:
Can calculate by the luminous flux of light-metering, thus realize the accurate measurement to distribution of light sources luminosity.
Distributed luminosity measuring method based on lock-in amplifier the most according to claim 1, it is characterised in that: described step 6) luminous reflectance that in, measured light a direction sends accepts modulation to chopper, realizes by adjusting chopper frequency.
3. distributed luminosity based on lock-in amplifier measures system, including the distribution photometer master with double free turntables and diaphragm Machine (1), for detecting the photodetector (6) of optical signal and to the detection computer (11) that processes of signal;Its feature It is that the front end of described photodetector is furnished with the chopper (7) that the optical signal to the reflection of distribution photometer main frame is modulated; Chopper is connected to manipulator (8), and described system is also configured with lock-in amplifier (9), the reference signal of lock-in amplifier End connects the signal output part of manipulator, and the input of lock-in amplifier connects the outfan of photodetector, lock-in amplifier Signal after computing is delivered to computer.
Distributed luminosity based on lock-in amplifier the most according to claim 3 measures system, it is characterised in that: described photoelectricity Detector and chopper are installed in detector carriage (12).
CN201610620370.4A 2016-07-29 2016-07-29 Distributed luminosity measuring method based on lock-in amplifier and the system of measurement Pending CN106225919A (en)

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Application Number Priority Date Filing Date Title
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110017896A (en) * 2019-04-03 2019-07-16 大连工业大学 Space photometric distribution method for fast measuring and photometric measuring apparatus
CN112964714A (en) * 2021-02-18 2021-06-15 北京理工大学 Weak infrared radiation degree measuring device and method suitable for low-temperature vacuum cold chamber environment

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH665906A5 (en) * 1983-12-23 1988-06-15 Lmt Lichtmesstechnik Berlin GONIOPHOTOMETER.
CN201170750Y (en) * 2008-02-04 2008-12-24 杭州浙大三色仪器有限公司 Distribution photometer
CN104833419A (en) * 2015-06-05 2015-08-12 哈尔滨工业大学 1-3 micrometer collimated light source radiation illumination measuring instrument
CN205940763U (en) * 2016-07-29 2017-02-08 杭州市质量技术监督检测院 Distribution photometry system based on lock -in amplifier

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH665906A5 (en) * 1983-12-23 1988-06-15 Lmt Lichtmesstechnik Berlin GONIOPHOTOMETER.
CN201170750Y (en) * 2008-02-04 2008-12-24 杭州浙大三色仪器有限公司 Distribution photometer
CN104833419A (en) * 2015-06-05 2015-08-12 哈尔滨工业大学 1-3 micrometer collimated light source radiation illumination measuring instrument
CN205940763U (en) * 2016-07-29 2017-02-08 杭州市质量技术监督检测院 Distribution photometry system based on lock -in amplifier

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
倪凯,牟同升: "《带旋转反光镜的分布光度测试系统》", 《光学仪器》 *
商庆健: "《基于数字锁相放大器的微弱光电信号检测研究》", 《中国优秀硕士学位论文全文数据库信息科技辑》 *
李倩,潘建根: "《用分布光度法实现光通量的精确测量》", 《四直辖市照明科技论坛、长三角照明科技论坛暨上海市照明学2008年年会论文集》 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110017896A (en) * 2019-04-03 2019-07-16 大连工业大学 Space photometric distribution method for fast measuring and photometric measuring apparatus
CN112964714A (en) * 2021-02-18 2021-06-15 北京理工大学 Weak infrared radiation degree measuring device and method suitable for low-temperature vacuum cold chamber environment
CN112964714B (en) * 2021-02-18 2022-03-04 北京理工大学 Weak infrared radiation degree measuring device and method suitable for low-temperature vacuum cold chamber environment

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